CN101576517B - Method for deep space X fluorescence analysis - Google Patents
Method for deep space X fluorescence analysis Download PDFInfo
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- CN101576517B CN101576517B CN 200810106009 CN200810106009A CN101576517B CN 101576517 B CN101576517 B CN 101576517B CN 200810106009 CN200810106009 CN 200810106009 CN 200810106009 A CN200810106009 A CN 200810106009A CN 101576517 B CN101576517 B CN 101576517B
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Abstract
The invention discloses a method for deep-space X fluorescence analysis, which relates to X fluorescence analysis technology and uses simulative standard sample for quantitative analysis of fluorescent data of deep space planets when no actual standard sample is available. Combining with a Monte CarLo method and a fundamental parameter method, the method comprises the following steps: using x-rays, measured by a solar monitor, radiated from the sun at different times as an excitation energy spectra; adopting a geant2 software package to simulate the fluorescence spectra of different samples byusing the Monte CarLo method; performing the iterative computation of fluorescence energy spectra measured in orbit and a standard energy spectrum obtained by simulation by using programs complied on the basis of the fundamental parameter method; and meshing data according to ephemeris data and field coverage design of a probe to obtain the distribution data of elements of the planets. The method of the invention avoids carrying a standard sample, but uses the Monte CarLo simulation method to obtain a simulative standard sample energy spectrum conveniently and accurately. The fundamental para meter method is an accurate computational method. The accurate distribution data of the elements of the planets can be obtained by combining the Monte CarLo method and the fundamental parameter method.
Description
Technical field
The present invention relates to the xrf analysis technical field, is a kind of method for deep space X fluorescence analysis, and this method has realized deep space is not had the component distributing measurement of atmosphere planet.
Background technology
At present, the xrf analysis method is mainly used in the quantitative test of ground surface element.Its analytic process mainly adopts fundamental parameters method, needs to adopt standard model and unknown sample to carry out power spectrum relatively.Abroad repeatedly task has also adopted the xrf analysis method, and the method for employing is for to carry out linear fit to element peak intensity ratio.The CE-1 satellite of China has carried the X spectral fluorometer, intend moon elemental composition is analyzed, but this subtask is not carried standard specimen, therefore can't directly use fundamental parameters method, and peak intensity is very bigger than the resultant error that fitting method provides.
Summary of the invention
The objective of the invention is to disclose a kind of method for deep space X fluorescence analysis, use Monte Carlo simulation method and fundamental parameters method the deep space planet is carried out the elemental composition analysis, and data are carried out grid dividing, obtain the element distributed data of planet.
For achieving the above object, technical solution of the present invention is:
A kind of method for deep space X fluorescence analysis can the fluorescence data to the deep space planet carry out quantitative test under the condition of actual standard specimen having; The solar X-ray radiant-energy spectrum that it measures at different times at sun monitor, the angle scalar number is according to carrying out angularity correction before the utilization satellites transmits, power spectrum after the correction is as the excitation spectrum of fluorescence, utilization Geant4 software package carries out Monte Carlo fluorescence simulation to the sample of principal component, employing is composed the fluorescence power spectrum that simulation obtains based on the fundamental parameters method written program as standard model, the fluorescence power spectrum that measures planetary surface with the X ray spectrometer is carried out interative computation, obtain the element quantitative result of planetary surface, according to the visual field design of satellite orbit data and detector the fluorescence data of measuring is carried out grid dividing again, obtain the space distribution information of planet elemental composition.
Described analytical approach, it is described to carry out angularity correction, be to monitor activation energy spectrum---solar X-ray radiant-energy spectrum with a sun monitor, and calibrate data according to probe angle before the emission solar X-ray radiant-energy spectrum of measuring is carried out angle modification, overcome the measuring error that angle causes, obtain real solar X-ray radiant-energy spectrum, so that simulate accurately and quantitative test.
The invention has the beneficial effects as follows, need not to carry standard model, used the Monte Carlo simulation method, can make things convenient for and the standard model power spectrum that obtains exactly simulating.And basic parameter application in the past shows that it is a kind of accurate method of calculation.Two kinds of method combinations can obtain the information that planet element very accurately distributes.
Embodiment
The present invention is a kind of method for deep space X fluorescence analysis, utilization sun monitor is measured the solar radiation X-ray energy spectrum at different times---and be activation energy spectrum, simulate the fluorescence power spectrum of the lunar rock sample of different compositions at the activation energy spectrum of measuring by the geant4 software package that can freely obtain, the fluorescence power spectrum that simulation obtains can be used as the standard power spectrum and is conveniently used in the further analysis.
Monitor activation energy spectrum---solar X-ray radiant-energy spectrum with a sun monitor, and calibrate data according to probe angle before the emission solar X-ray radiant-energy spectrum of measuring is carried out angle modification, overcome the measuring error that angle causes, obtain real solar X-ray radiant-energy spectrum, so that simulate accurately and quantitative test.
The present invention has used P.118 middle a kind of theoretical method---the fundamental parameters method program of introducing of " X-ray fluorescence spectra analysis " book based on works such as Ji Ang that this case applicant writes, the lunar rock fluorescence power spectrum that simulation obtains is carried out interative computation as the planetary surface power spectrum of standard power spectrum and the measurement of X spectrometer, thereby obtain the elemental abundance data.Again according to the angular response of the satellite detector field of view that the angle calibration obtains before the track of the moon and emission, employing space lattice division methods obtains the spatial distribution data information of moon elemental composition.
Claims (2)
1. method for deep space X fluorescence analysis can the fluorescence data to the deep space planet carry out quantitative test under the condition of actual standard specimen having; It is characterized by: the solar X-ray radiant-energy spectrum that measures at different times at sun monitor, the angle scalar number is according to carrying out angularity correction before the utilization satellites transmits, power spectrum after the correction is as the excitation spectrum of fluorescence, utilization Geant4 software package carries out Monte Carlo fluorescence simulation to the sample of principal component, employing is composed the fluorescence power spectrum that simulation obtains based on the fundamental parameters method written program as standard model, the fluorescence power spectrum that measures planetary surface with the X ray spectrometer is carried out interative computation, obtain the element quantitative result of planetary surface, according to the visual field design of satellite orbit data and detector the fluorescence data of measuring is carried out grid dividing again, obtain the space distribution information of planet elemental composition.
2. analytical approach according to claim 1, it is characterized in that: describedly carry out angularity correction, be to monitor activation energy spectrum---solar X-ray radiant-energy spectrum with a sun monitor, and calibrate data according to probe angle before the emission solar X-ray radiant-energy spectrum of measuring is carried out angle modification, overcome the measuring error that angle causes, obtain real solar X-ray radiant-energy spectrum, so that simulate accurately and quantitative test.
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CN 200810106009 CN101576517B (en) | 2008-05-07 | 2008-05-07 | Method for deep space X fluorescence analysis |
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CN101576517B true CN101576517B (en) | 2011-06-15 |
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CN104706320B (en) * | 2014-11-14 | 2017-02-22 | 华中科技大学 | Fluorescent diffusion optical cross-sectional image reestablishing method based on dfMC model |
CN104535599B (en) * | 2014-12-01 | 2017-06-06 | 中国科学院高能物理研究所 | A kind of X ray excited fluorescent probe of space active |
Citations (2)
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CN101038169A (en) * | 2007-02-13 | 2007-09-19 | 北京空间飞行器总体设计部 | Navigation satellite autonomous navigation system and method based on X-ray pulsar |
CN101038261A (en) * | 2006-03-17 | 2007-09-19 | 中国辐射防护研究院 | Method for calibrating passive efficiency of high-purity germanium detector |
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Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
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CN101038261A (en) * | 2006-03-17 | 2007-09-19 | 中国辐射防护研究院 | Method for calibrating passive efficiency of high-purity germanium detector |
CN101038169A (en) * | 2007-02-13 | 2007-09-19 | 北京空间飞行器总体设计部 | Navigation satellite autonomous navigation system and method based on X-ray pulsar |
Non-Patent Citations (4)
Title |
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崔兴柱等.基本参数法在X射线荧光能谱分析中的应用.《第十三届全国核电子学与核探测技术学术年会论文集(上册)》.2006,第310-314页. * |
张家宇等.嫦娥一号卫星X射线谱仪能量响应矩阵的计算.《核电子学与探测技术》.2007,第27卷(第4期),第651-653页. * |
曹雪蕾等.嫦娥一号卫星X射线谱仪的性能模拟.《核电子学与探测技术》.2007,第27卷(第5期),第813-816页. * |
王焕玉等.空间X射线成像谱仪系统及其软件研制.《核电子学与探测技术》.2008,第28卷(第2期),第215-218,222页. * |
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