CN101553910B - Sealing material and mounting method using the sealing material - Google Patents
Sealing material and mounting method using the sealing material Download PDFInfo
- Publication number
- CN101553910B CN101553910B CN2007800446398A CN200780044639A CN101553910B CN 101553910 B CN101553910 B CN 101553910B CN 2007800446398 A CN2007800446398 A CN 2007800446398A CN 200780044639 A CN200780044639 A CN 200780044639A CN 101553910 B CN101553910 B CN 101553910B
- Authority
- CN
- China
- Prior art keywords
- encapsulant
- temperature
- electronic unit
- substrate
- circuit substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16225—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32225—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
- H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P20/00—Technologies relating to chemical industry
- Y02P20/50—Improvements relating to the production of bulk chemicals
- Y02P20/582—Recycling of unreacted starting or intermediate materials
Landscapes
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
Abstract
The invention provides a sealing material, which has a sealing characteristic of highly reliably sealing a bonding section, an electronic component and/or a semiconductor device with a low stress and a suitable repairing characteristic that permits only the electronic component and/or the semiconductor device to be easily repaired when the electronic component and/or the semiconductor device is judged nonconforming, for mounting the relatively brittle electronic component and/or the semiconductor device on a circuit board. The sealing material includes at least (a) a thermal curing resin component and (b) a curing agent component. A cured material obtained by heating has a glass transition temperature (Tg) within a temperature range of -80 DEG C or higher but not higher than 50 DEG C.
Description
Technical field
The present invention relates to be equipped with the material of electrode engagement portion sealing of the circuit substrate of electronic unit.
Background technology
In recent years, for miniaturization, lightweight, high performance and the high speed of realizing electronic instrument, require the circuit substrate of electronic instrument can carry out high-density installation.Therefore, require electronic unit of on circuit substrate, installing and semiconductor device miniaturization, slimming, high speed, multiterminal that comprises chip part, CSP (chip size packages body) IC etc.Consequently, the mechanical strength of electronic unit and/or semiconductor device itself descends, and the device that mechanical stress that reply applies on these devices and variations in temperature ability are more fragile increases.And, being accompanied by the realization of high-density installation, the cost that the single cost of electronic unit and/or semiconductor device and each piece have been installed the circuit substrate of electronic unit etc. increases.
As the method that electronic unit and/or semiconductor device are installed on circuit substrate; The following method of general employing: the assigned position on circuit substrate disposes electronic unit and/or semiconductor device with the mode of corresponding respectively electrode contact; And welding material or electrically conductive adhesive be provided between the electrode that should connect; And put it in reflow soldering etc.; Engage between the electrode with electronic unit and/or semiconductor device and circuit substrate, with this bonding operation in or before and after it, utilize resin between interior electronic unit and/or semiconductor device and circuit substrate, to seal around will comprising the junction surface.Also can be under the situation even this is resin-sealed in being exposed to the how wet environment of thermal cycle or high temperature bonding and be fixed in circuit substrate and can protect the junction surface between electronic unit and/or semiconductor device and the circuit substrate with high reliability with electronic unit and/or semiconductor device, be very important therefore.
In patent documentation 1 (focusing on paragraph 0032), disclosing the reliability that the circuit substrate of electronic unit has been installed when guaranteeing to be exposed to thermal cycle is that purpose uses the electronic unit adhering part of low elastic modulus to relax the invention of the thermal stress between electronic unit and circuit board.This patent documentation is conceived to use the low elastic modulus electronic unit adhering part of this invention can relax this thermal stress effectively because of the different phenomenons that when being exposed to thermal cycle, can produce thermal stress with the thermal coefficient of expansion of circuit substrate of the thermal coefficient of expansion of semiconductor chip.
Usually, in the assembling procedure of electric equipment products, carry out inspection or test (below be called inspection etc.) in assembling stage, make great efforts to find not meet the article of required specification, the defective item of being found is got rid of from its assembling procedure in each.The article that are identified as qualified product through this inspection etc. are sent to next step assembling procedure, make electric equipment products.When the circuit substrate that electronic unit and/or semiconductor device have been installed (below be also referred to as mounted circuit substrate) is identified as when being defective item; Because electronic unit and/or semiconductor device and mounted circuit substrate cost separately are higher; Therefore if directly should mounted circuit substrate integral body discard; Then can cause the end prod cost to rise; Also can cause the quantity of industrial waste to increase, therefore consider producers and consumers and the burden that environment is caused, not preferred.
For the mounted circuit substrate that is identified as defective item; What have causes electronic unit and/or semiconductor device to damage because of comprising thermal process at interior a variety of causes; And when on a circuit substrate, a lot of electronic units and/or semiconductor device being installed; When wherein one or several electronic units and/or semiconductor device defective (or against regulation specification) and other electronic units and/or semiconductor device and circuit substrate itself when not impaired; If can easily only will be identified as the electronic unit and/or the semiconductor device of defective (or defective item) pulls down from this mounted circuit substrate; Replace normal electronic unit and/or semiconductor device are installed, then can effectively utilize the remainder of mounted circuit substrate.Therefore; From the mounted circuit substrate that is identified as defective item, only take off underproof electronic unit and/or semiconductor device; Reclaim other electronic units that kept required function and/or semiconductor device and circuit substrate and/or utilize (recycle) can not only realize cost cutting again the substrate that reclaims etc., also meet and economize on resources in recent years and the requirements of the times of zero discharge (environmental protection).Among the present invention, with at least one recovery in circuit substrate, electronic unit and the semiconductor device (also these being called substrate etc.) and/or utilize again and be called with " reparations " such as substrates.
For example; Following invention is disclosed in patent documentation 2 and patent documentation 3: through installing with encapsulation process after the inspection carried out when finding in mounted a plurality of electronic units and/or semiconductor device, to have or several defective, use resin to seal substrate utilized again will be identified as underproof electronic unit and/or semiconductor device reparation with reparation property.
In patent documentation 4, propose to residue in the higher adhesive of the further coating strength of resin of circuit substrate and used the method for pulling down with after the plate heating of peeling off.In addition, in patent documentation 5, proposed to remove the method for resin residual on the substrate with milling cutter.
Patent documentation 1: Japanese Patent Laid is opened the 2000-154361 communique
Patent documentation 2: japanese patent laid-open 10-107095 communique
Patent documentation 3: japanese patent laid-open 10-209342 communique
Patent documentation 4: japanese patent laid-open 5-109838 communique
Patent documentation 5: japanese patent laid-open 6-5664 communique
Summary of the invention
In patent documentation 1, in the invention disclosed,, use the electronic unit adhering part of low elastic modulus in order to relax the thermal stress that between electronic unit and circuit board, produces.Present inventors etc. can also prevent the electronic unit of fragilityization and/or peeling off and the crack of semiconductor device in order when applying heat or mechanical stress from the outside, to prevent peeling off with the crack of junction surface, have carried out all discussions.Its result finds: opposite with invention disclosed in the patent documentation 1; When using the high resin of modulus of elasticity in the sealing; The electronic unit and/or the thermal stress and/or the mechanical stress of semiconductor device that put on after the sealing diminish, and can prevent effectively to peel off or the crack at gluing and electronic unit and/or semiconductor device place.
When consider repairing property, according to invention disclosed in patent documentation 2 and the patent documentation 3, when repairing, be heated to the temperature of welding material or electrically conductive adhesive fusion, make encapsulant softening after, shear, pull down electronic unit.At this moment,, therefore when the operation of pulling down electronic unit, must apply big stress, consequently, make the impaired ratio of the substrate of preparatory recovery higher because the adhesiveness of these encapsulants is high.In addition, the adhesiveness of this encapsulant is high, is difficult to remove fully from substrate through aforesaid operations, for new electronic unit is installed, the operation of removing residual sealing resin must be arranged above that, and is very unfavorable.
Invention according to patent documentation 4 and patent documentation 5; When carrying out the reparation operation; Must apply bigger mechanical stress to electronic unit and/or semiconductor device, therefore the same with patent documentation 3 with patent documentation 2, the substrate that makes preparatory recovery impaired ratio when reparation is operated is higher.
The application accomplishes in order to solve above-mentioned existing technical problem; One of its purpose is to provide, possess when fragile electronic unit and/or semiconductor device are installed can be under low stress with the encapsulant of its junction surface and electronic unit and/or this characteristic of semiconductor device sealing.This encapsulant more preferably possesses desirable reparation property, is identified as the electronic unit and/or the semiconductor device reparation of defective item after can easily only will sealing.
Another purpose of the application is to provide, and use has concurrently can be in the invention of this characteristic of low stress lower seal with the method for encapsulant Laian County electronic parts that compares this characteristic of easy repair and/or semiconductor device.
Another purpose of the application is to provide, and use has concurrently can be in the invention of this characteristic of low stress lower seal with the attachment structure of encapsulant Laian County electronic parts that compares this characteristic of easy repair and/or semiconductor device.
The application's the 1st invention provides a kind of encapsulant; It is characterized in that; It contains (a) thermosetting resin composition at least and reaches (b) its curing agent component; Said thermosetting resin composition is one or more the resin combination that is selected from the group of composition epoxy resin, polyurethane resin composition, phenol resin composition and acrylic acid resin composition, wherein, heating and solidfied material in the temperature range more than one 80 ℃, below 50 ℃, have vitrification point (Tg).
In the present invention, from the aspect of characteristics such as moisture absorption, thermal expansivity and cure shrinkage property, (a) thermosetting resin composition preferred epoxy composition.In addition, said thermosetting resin composition is characterised in that, does not contain organic silicones.
Epoxy resin component of the present invention can use various epoxy resin components commonly used.As preferred epoxy resin component; Can enumerate the above multi-functional epoxy resin of two senses, for example bisphenol-type epoxy resin (bisphenol A type epoxy resin, bisphenol f type epoxy resin, bisphenol-A D type epoxy resin), phenolic resin varnish type epoxy resin (linear phenolic resin varnish type epoxy resin, cresols phenolic resin varnish type epoxy resin), naphthalene type epoxy resin, biphenyl type epoxy resin, Cyclopeutadiene type epoxy resin etc.These epoxy resin can be used as two or more mixtures and use.About epoxy resin, can select according to viscosity and rerum natura, most preferably in multi-functional epoxy resin, contain 10～100% ratios, the particularly bisphenol A type epoxy resin of 50～100% ratios.In above-mentioned epoxy resin, can suitably add one or more the modified epoxy in the group that is selected from glue denaturation loop epoxy resins (polyisoprene modified epoxy resin, polychlorobutadiene modified epoxy, polybutadiene-modified epoxy resin etc.) and polyurethane modified epoxy resin and dimer acid modified epoxy resin etc.
In above-mentioned multi-functional epoxy resin, can add the monofunctional epoxy resin as (d) reactive diluent composition (claiming the crosslink density conditioning agent again) in the ratio about 0～30 weight %, preferred 0～20 weight % (being the weight % in the total epoxy).As this monofunctional epoxy resin, having 1 epoxy radicals in the preferred molecule and having carbon number is 6～28 alkyl.The carbon number of alkyl for example can be more than 8, more than 10 or more than 12.In addition, the carbon number of alkyl for example can be below 26, below 24, below 22.Thus, can use at least a resin in alkyl glycidyl base ether, fatty acid glycidyl ester and the alkylphenol glycidyl ether that is selected from carbon number with above-mentioned scope.Preferred C
6～C
28Alkyl glycidyl base ether can use two or more monofunctional epoxy mixed with resin.
In addition, as (d) reactive diluent composition, in addition, can also use one or more the compound that is selected from the group that constitutes by monoepoxide, diepoxide, triepoxides, polyalcohol, polymercaptan, polycarboxylic acids and polyurethane.
As (b) curing agent component that the present invention uses, can adopt to be applicable to the curing agent that used (a) thermosetting resin composition is solidified.When with above-mentioned epoxy resin during as (a) thermosetting resin composition, the preferred compound that is selected from the group that is made up of amines, imidazolium compounds, modified amine compound, modified imidazole compound, polyphenolic substance and sulfur-containing compound that uses is as (b) curing agent component.
As amines, for example can enumerate aromatic polyamines such as aliphatic polyamine, m-phenylene diamine (MPD), diaminodiphenyl-methane such as dicyandiamide, diethylenetriamine, triethylene tetramine, diethylamino propyl group amine, IPD, Meng alkene diamines alicyclic polyamines such as (menthenediamine) and polyamide etc.
As imidazolium compounds, for example can enumerate glyoxal ethyline, 2-ethyl-4-methylimidazole, 2-phenylimidazole etc.
As the modified amine compound, can be set forth in addition amines on the epoxy compounds and epoxy compounds polyamines addition product of obtaining etc., as the modified imidazole compound, can be set forth in addition imidazolium compounds on the epoxy compounds and imidazoles addition product of obtaining etc.
In these curing agent, be preferred for the potentiality curing agent in the epoxy resin of 1 fluidity.In addition, though the potentiality curing agent be meant under this potentiality curing agent and state that epoxy resin mixes, adopting near the temperature curing during the normal temperature can not carry out in fact, just begin the curing agent that solidifies during temperature more than being heated to set point of temperature.As used for epoxy resin potentiality curing agent, known have a modified amine compounds curing agent.
Consider to repair under the situation of property special, use the modified amine of 5～95 weight % of curing agent total weight, preferred and with the dicyandiamide of 95～5 weight % of curing agent total weight.
Usually, the blending amount of curing agent is 3～60 weight portions with respect to epoxy resin 100 weight portions, is preferably 5～40 weight portions.
In addition; The form of encapsulant of the present invention can be the form of the 1 liquid type that all mixes of constituent before use, also can be before use (a) thermosetting resin composition and (b) curing agent component to be preserved respectively and the form of the 2 liquid types that in use their mixed.The form of above-mentioned encapsulant can be confirmed according to (a) thermosetting resin composition and (b) composition of curing agent component based on technical merit well known by persons skilled in the art.
Encapsulant of the present invention can use one or more the compound that is selected from the group that aluminium oxide, silicon dioxide, aluminium oxide, boron nitride, aluminium nitride, silicon nitride, magnesia, magnesium silicate, talcum powder, calcium carbonate and calcium hydroxide etc. constitutes as (c) insulating properties filler composition.Blending insulating properties filler composition mainly is in order to bring into play the effect of control coefficient of thermal expansion, flowability, adhesivity.Blending insulating properties filler composition is also in order to bring into play the effect of regulating viscosity and flowability and/or making its appropriatenessization.Encapsulant of the present invention can further contain additive as required.Such additive has curing accelerator (polyamines etc.), dyestuff, pigment etc.
Encapsulant after the curing of the present invention preferably has more than-80 ℃, according to circumstances for example is the vitrification point (Tg) more than-70 ℃, more than-60 ℃, more than-50 ℃, more than-40 ℃, more than-30 ℃, more than-20 ℃, more than-10 ℃.In addition, the encapsulant after the curing of the present invention preferably has below 100 ℃, according to circumstances for example is the vitrification point (Tg) below 90 ℃, below 80 ℃, below 70 ℃, below 60 ℃, below 50 ℃, below 40 ℃, below 30 ℃, below 20 ℃, below 10 ℃, below 0 ℃.
In addition; One of mode of encapsulant after the curing of the present invention is characterised in that; Said encapsulant has the storage elastic modulus more than the 500MPa under the temperature that is lower than vitrification point (Tg) side, and under the temperature that is higher than vitrification point (Tg) side, has the storage elastic modulus below the 200MPa.
The preferred implementation of the encapsulant after the curing of the present invention is characterised in that the storage elastic modulus that under the temperature that is lower than vitrification point (Tg) side, has is more than the 800MPa.
The preferred implementation of the encapsulant after the curing of the present invention is characterised in that the storage elastic modulus that under the temperature that is lower than vitrification point (Tg) side, has is more than the 1GPa.
The preferred implementation of the encapsulant after the curing of the present invention is characterised in that the storage elastic modulus that under the temperature that is higher than vitrification point (Tg) side, has is below the 50MPa.
Preferred embodiment being characterised in that of encapsulant after the curing of the present invention, the storage elastic modulus that under the temperature that is higher than vitrification point (Tg) side, has is below the 10MPa.
One of mode of encapsulant of the present invention is characterised in that; Has above-mentioned composition; And when measuring storage elastic modulus (E) while heating up in the temperature range of the vitrifying point of the encapsulant after comprising curing (Tg), the variation of storage elastic modulus (Δ E) shows below 30MPa/ ℃ with ratio (Δ E)/(the Δ T) of variations in temperature (Δ T), the value of the scope more than the 0.5MPa/ ℃.The ratio of the variation of this storage elastic modulus (Δ E/ Δ T) (below, be also referred to as the rate of change of storage elastic modulus in this manual) be preferably below 10MPa/ ℃, be preferably especially below 1MPa/ ℃.In addition, the rate of change of storage elastic modulus is preferably more than 20MPa/ ℃ sometimes, more than the for example 25MPa/ ℃.When the rate of change of storage elastic modulus is in this scope; As if being abscissa with the temperature, being the value that ordinate is drawn the storage elastic modulus of measuring corresponding to the temperature rising (E) with the storage elastic modulus, obtain having the slowly figure of the slope of decline of straight line to high temperature side from low temperature side.In the figure, the rate of change of storage elastic modulus can be represented with the slope of straight line.For example; When after using encapsulant on substrate, electronic unit to be installed, needing to repair; Operate as follows: be heated to set point of temperature and make anchor clamps such as trowel and will contact as the encapsulant of the electronic part encapsulation of object and the boundary vicinity of substrate, with encapsulant from strippable substrate.When this repairs operation; If encapsulant is the encapsulant of the so slow slope of demonstration of the present invention, then can not apply big stress at short notice, promptly can not apply impulsive force or excessive power; With required minimum degree size try hard to recommend the pressure anchor clamps, can be with encapsulant from strippable substrate.Therefore, if use encapsulant of the present invention, then so-called wood destruction can not take place, can encapsulant be separated with substrate with the mode of so-called interfacial failure when repairing operation.Therefore, can under the situation of wounded substrate and/or electronic unit and/or semiconductor device they not reclaimed in fact only sacrificing encapsulant.After the substrate that so reclaims in fact with no damage etc. is handled as required, can recycle (or utilizing again).If the rate of change of storage elastic modulus surpasses 30MPa/ ℃, then can't give full play to this characteristic of low stress lower seal.On the other hand, if the rate of change of storage elastic modulus is lower than 0.5MPa/ ℃, then the reliability as the rubber-like encapsulant is not enough.
Fig. 2 representes the figure with respect to the rate of change (Δ E/ Δ T) of the storage elastic modulus of said temperature variation.This figure is depicted as the value that in the temperature range that contains vitrifying point (Tg), shows 0.8MPa/ ℃ (Δ E/ Δ T).This temperature range that comprises vitrifying point (Tg) in other words can be expressed as the temperature range that comprises vitrifying point (Tg), refers to that promptly to be lower than vitrifying point (Tg) side temperature and to be higher than between vitrifying point (Tg) the side temperature be the temperature of scope.
When use had the encapsulant of above-mentioned characteristic, the encapsulant that covers the junction surface of circuit substrate and electronic unit and/or semiconductor device at least kept higher adhesive strength (0.5kg/mm for example under the practicality serviceability temperature
2), thereby can the junction surface be sealed well.On the other hand, after sealing, when for example being heated to about 220 ℃,, thereby can easily separate from circuit substrate being attached to as the electronic unit of repairing object and/or the encapsulant of semiconductor device because encapsulant is fully softening.Therefore, the sealing material can show desirable reparation property after sealing.
Encapsulant of the present invention is characterised in that; The temperature T of the low temperature side that is lower than vitrifying point (Tg) 1 time; Show the modulus of elasticity that 100MPa is above; The preferred modulus of elasticity that shows that 500MPa is above, the further preferred modulus of elasticity that shows that 800MPa is above more preferably shows the modulus of elasticity that 1GPa is above.The characteristic of encapsulant of the present invention also is, the temperature T that is higher than vitrifying point (Tg) side 2 times, shows the modulus of elasticity below the 200MPa, preferably shows the modulus of elasticity below the 50MPa, the further preferred modulus of elasticity that shows below the 10MPa.In the temperature range of vitrifying point (Tg) side and high temperature side, the encapsulant of the present invention with above-mentioned modulus of elasticity can show desirable sealing characteristics.In addition, encapsulant of the present invention can also show desirable reparation property.The material that shows modulus of elasticity, shows greater than the modulus of elasticity of 10MPa for 2 times in the temperature T that is higher than vitrifying point (Tg) side the temperature T that is lower than vitrifying point (Tg) side 1 time less than 100MPa; Its undercapacity, the sealing characteristics that can't obtain having enough reliabilities.
For example; Be higher than 50 ℃, the upper limit side temperature (for example temperature T 2) of this temperature range and be lower than 200 ℃ when measuring lower limit side temperature (for example temperature T 1) with respect to the temperature range of the rate of change (Δ E/ Δ T) of the storage elastic modulus of variations in temperature; When changing below the 10MPa of value under the temperature T 2 of high temperature side more than the 100MPa of the modulus of elasticity of encapsulant under the temperature T 1 of low temperature side, excessive for ideal value of the present invention with respect to the value of the rate of change (Δ E/ Δ T) of the storage elastic modulus of variations in temperature.When use had the encapsulant of this specific character, near vitrifying point (Tg), elastic modulus change was too rapid, therefore can't realize the sealing under the low stress, caused the possibility of damage to improve to parts.
When the vitrifying point (Tg) that after curing, shows below 100 ℃, its encapsulant shows excellent repairing property under the exfoliation temperature of grafting material.For example, when using Sn-3Ag-0.5Cu class Pb-free solder material or electrically conductive adhesive, under promptly about 220 ℃ of the fusing point of this soldering tin material, encapsulant is fully softening, can easily peel off.
As stated, when fragile electronic unit and/or semiconductor device are installed, can with its junction surface simultaneously with electronic unit and/or semiconductor device this in the low stress lower seal.In addition, if be heated to the temperature that grafting material peels off, the fusing point that is generally grafting material, then encapsulant is fully softening and peel off easily, can when removing encapsulant, pull down electronic unit and/or semiconductor device.
The application's the 2nd invention provides a kind of method that electronic unit is installed on substrate, its encapsulant of inventing with the 1st of the application is with the electrode of circuit substrate and to sealing between the junction surface of the electrode of the electronic unit of should electrode and installing and/or semiconductor device and foregoing circuit substrate and electronic unit and/or the semiconductor device.This installation method specifically comprises following operation: (i) configuration of the assigned position on circuit substrate electronic unit, the operation of formation conductivity connecting portion; (ii) to above-mentioned conductivity connecting portion and the operation of arbitrary encapsulant of the invention described above is provided on every side; And the operation that (iii) aforesaid substrate is heated.
The application also provides the following method that electronic unit is installed on substrate, it is characterized in that comprising following operation: (i) configuration of the assigned position on substrate electronic unit, the operation of formation conductivity connecting portion; (ii) to above-mentioned conductivity connecting portion and the operation of the encapsulant that contains compositions of thermosetting resin is provided on every side; Provide the back temperature T 1 of curing to heat up while the vitrifying point that is lower than sealing material cured thing (Tg); Measure storage elastic modulus (E), storage elastic modulus (Δ E) is with respect to the variation ratio (Δ E/ Δ T) of variations in temperature (Δ T) operation at the encapsulant of 0.5MPa/ ℃～30MPa/ ℃ scope; And the operation that (iii) aforesaid substrate is heated.
The 3rd invention about the application provides a kind of assembling structure; This assembling structure be the assigned position on circuit substrate configuration electronic unit and and this circuit substrate and the corresponding electrode of this electronic unit between form that the conductivity connecting portion forms at circuit substrate the assembling structure of electronic unit is installed; Wherein, said conductivity connecting portion around and between electronic unit and the circuit substrate by the encapsulant sealing of first invention.
Because the encapsulant of the application's invention is being used in when circuit substrate is installed relatively more fragile electronic unit and/or semiconductor device; This junction surface and electronic unit and/or semiconductor device show can be in the characteristic that is sealed than quilt low stress play, and can show good initial stage sealing characteristics and durable sealing characteristics.On the other hand, even the sealing material also can show the characteristic (reparation property) that is fit to reparation after sealing.If use the sealing material, junction surface and electronic unit and/or the semiconductor device that then can be in a long time will be installed on electronic unit and/or semiconductor device on the circuit substrate with low stress are sealed on this substrate.Thus, can significantly lower the damage of parts in sealing process and the damage of the parts that cause by applying temperature cycles etc., can atraumatic in fact generation.In addition, as required, with its junction surface and electronic unit and/or semiconductor device sealing and the encapsulant after solidifying through being heated to the above temperature of vitrifying point (Tg), can more easily be pulled down, promptly keeping desirable reparation property.
The encapsulant Laian County electronic parts of the 1st invention and/or the method for semiconductor device are promptly used in the 2nd invention according to the application, can implement the sealing of junction surface and electronic unit and/or semiconductor device with lower stress.Therefore, can prevent in sealing process parts equivalent damage and in fact because of applying the damage of parts that temperature cycles causes etc., Laian County's electronic parts and/or semiconductor device.In addition, after sealing, can also carry out excellent repairing.
Promptly use about the application's the 3rd invention the 1st invention encapsulant sealing installation the attachment structure of electronic unit and/or semiconductor device; Its junction surface and electronic unit and/or semiconductor device are owing to than being sealed under the low stress, therefore can prevent the damage in fabrication stage and use in fact.Through than the low stress lower seal, can show good initial stage sealing characteristics and durable sealing characteristics.Thus, can prevent the damage of parts etc. in sealing process in fact and, can obtain having installed the attachment structure of electronic unit and/or semiconductor device because of applying the damage of parts that temperature cycles causes etc.In addition, after sealing, can also carry out excellent repairing.
Therefore, in the assembling procedure of electric equipment products, according to the results such as inspection in various assembling stage, qualified product are sent to next assembling procedure and make electric equipment products, and defective item is then repaired.When encapsulant of the present invention is used in the assembling procedure of above-mentioned electric equipment products; For qualified product, even after sealing, also can keep the sealing of continuation, for defective item with low stress; Then repair with comparalive ease, can bring into play and presentation opposite effect effect.
Description of drawings
Fig. 1 is the sketch map that is illustrated in the state that semiconductor chip has been installed on the circuit substrate.
Fig. 2 is is abscissa with the temperature, be the variation (Δ E) that ordinate is drawn with storage elastic modulus E with respect to the storage elastic modulus of variations in temperature (Δ T).
(symbol description)
1 semiconductor chip
2 soldering tin materials or electrically conductive adhesive ball
3 soldering tin materials or electrically conductive adhesive
4 encapsulants
5 pads
6 substrates
Embodiment
Below, the sketch map of reference preferred implementation of the present invention is that Fig. 1 describes.
< sealing and fitting operation >
Fig. 1 schematically representes to install semiconductor device 1 and the epoxy glass substrate 6 that is used to install this semiconductor device 1.Be provided with solder ball (electrode) 2 at semiconductor device 1, on circuit substrate 6, be provided with pad (electrode) 5 accordingly with each electrode.Solder ball (electrode) 2 of semiconductor device 1 side engages through scolding tin 3 with pad (electrode) 5 of circuit substrate 6 sides, forms to be electrically connected.Between based on the junction surface of scolding tin 3 and circuit substrate on every side 6 and semiconductor device 1, use encapsulant 4 with sealing between junction surface and circuit substrate on every side 6 and the semiconductor device 1.
Concrete fitting operation is following.Electrode on the epoxy glass substrate of the thick 1.6mm that has implemented wiring; Coating tin cream (Senju Metal Industry Co., Ltd, M705-221BM5-K), implementing packaging body, electrode footpath (diameter) that chip size is 13mm * 13mm through Reflow Soldering is that spacing 0.8mm, carrier substrate are the CSP of aluminium oxide for 0.5mm, electrode.
Then, around the junction surface of CSP and circuit substrate, be coated with compositions of thermosetting resin, then, be warming up to 150 ℃ then, heated 60 minutes, compositions of thermosetting resin is fully solidified 80 ℃ of heating 30 minutes down with distributor.In this process, the compositions of thermosetting resin after the heating is owing to have enough flowabilities before curing, therefore the also space between porous to CSP and the circuit substrate.If further heating, then under the state that the insulating properties filler slightly sinks, compositions of thermosetting resin reaches curing, therefore, sealing between CSP and the circuit substrate is obtained desired CSP assembling structure.The Tg of the solidfied material that obtains is 40 ℃.
(1) initial stage sealing characteristics: carry out the evaluation of initial stage sealing characteristics as follows.Compositions of thermosetting resin curing has been accomplished the CSP assembling structure of the sealing at junction surface, observed sealing through perusal and/or through microscopic examination, whether inspection produces anomalies such as crack on the surface of CSP.100 test pieces are checked, are zero (qualified) with the average evaluation of no abnormal test piece, are △ with the average evaluation of finding 1～3 unusual test piece, with finding that the average evaluation of unusual test piece is * (defective) more than 4.
(2) durable sealing characteristics: carry out the evaluation (so-called thermal cycling test) of durable sealing characteristics as follows.Use thermal cycling test machine (ETAC corporate system, according to JISC60068), the initial stage sealing characteristics is be evaluated as zero CSP assembling structure and carries out temperature cycling test, this temperature cycling test was a circulation with-40 ℃ * 30 minutes～+ 85 ℃ * 30 minutes.When reaching the period of regulation, the energizing test of the sample that makes an experiment, affirmation CSP is electrically connected with substrate.To be evaluated as zero (qualified) at the test piece of 1000 above time energisings of circulation, will reach 1000 circulation cause broken strings etc. and cold test piece is evaluated as * (defective).After state embodiment the semiconductor element mounting structure surpass 1000 circulation times all be evaluated as qualified.
(3) assay method of the vitrifying point (Tg) of the encapsulant after the curing and storage elastic modulus E ' is following: (ITI instrumentation system is driven Co., Ltd.'s system to use the Measurement of Dynamic Viscoelasticity device; DVA-200), in the test piece size: longitudinal size 20mm, lateral dimension 5mm, height dimension 1mm, programming rate: 10 ℃/minute, stretch mode, 10Hz, measure under the condition of static load automatically.With loss elastic modulus E " maximum temperature as vitrifying point (Tg).
The characteristic of embodiment 11～embodiment 21 that the modulus of elasticity when being conceived to temperature and being set at each temperature of-40 ℃, 25 ℃ and 80 ℃ makes an experiment and each encapsulant of comparative example 3～comparative example 4 is as shown in table 1.
[table 1]
< repairing operation >
To using encapsulant of the present invention the assembling structure reparation property evaluation of CSP has been installed.From 100 of the CSP assembling structures that carried out above-mentioned fitting operation, randomly draw 10 CSP assembling structures, the adsorption tool in that the upper face pushing of CSP can be heated heats adsorption tool 1 minute to 250 ℃.Then, between CSP and circuit substrate, insert metallic and separate with bar (separate and use anchor clamps), when mentioning CSP, encapsulant is fully softening, encapsulant is ruptured also easily pull down CSP.
The expoxy glass circuit substrate of pulling down behind the CSP is placed on the heating plate; When about 100 ℃ are incubated down; Use solvent (the for example first industrial system PS-1 of drugmaker, LOCTITE corporate system 7360 etc.) to make the encapsulant swelling that remains on the expoxy glass circuit substrate, scrape off with plastics system scraper.In addition, adopt scolding tin to absorb and remove the soldering tin material that residues on the expoxy glass circuit substrate with litzendraht wire.
Each 10 of assembling structures to each embodiment have been implemented to repair operation, in arbitrary embodiment, all can scrape off operation and utilize the scolding tin absorption to remove operation with the soldering tin material of litzendraht wire with the interior encapsulant of scraper that utilizes smoothly continuously at 5 minutes.Therefore, this reparation operation has enough practicality.
In addition,, also can use far infra-red heater etc. to heat, replace placing on the heating plate in about 100 ℃ of operations of insulation down about above-mentioned reparation operation.
Be coated with soldering paste once more having pulled down as stated on the expoxy glass circuit substrate of CSP, new CSP is installed.In addition, at this moment, also can be at new CSP side printing soldering paste.
Same with above-mentioned fitting operation, around the junction surface of CSP, be coated with compositions of thermosetting resin and carry out heat treated, compositions of thermosetting resin is solidified, obtain the CSP assembling structure.For carrying out CSP after repairing as stated the assembling structure that obtains is installed,, is electrically connected reliably, and in thermal cycling test, also demonstrate excellent specific property identical when not repairing with same without the assembling structure of repairing.
[embodiment 1]
With (a) as bisphenol A type epoxy resin 100 weight portions of thermosetting resin composition, corresponding (b) mixes preparation encapsulant as alumina filled dose 0.10 weight portion of 50% average grain diameter, the 5 μ m of insulating properties filler composition, (d) as alkyl glycidyl base ether 10 weight portions of reactive diluent (cross-linking regulator) composition and curing accelerator 1 weight portion that is fit to the combination of above-mentioned thermosetting resin composition and curing agent component as dicyandiamide 8 weight portions of curing agent component, (c) therewith.Firm mixed viscosity is 28000mPas.
The encapsulant that obtains is solidified under the condition of above-mentioned seal operation, measure the vitrifying point (Tg) and the storage elastic modulus E of the encapsulant after solidifying.Vitrifying point (Tg) is 2.8 ℃.
In addition, from temperature T 1 (50 ℃) be warming up to temperature T 2 (200 ℃) on one side, measure storage elastic modulus E on one side, be abscissa with the temperature, draw as ordinate to use the storage elastic modulus E shown in the logarithmic scale, obtain S oxbow figure as shown in Figure 2.Promptly; In temperature province below temperature T 1 (50 ℃) and the temperature province more than the temperature T 2 (200 ℃); With respect to variation of temperature; Storage elastic modulus E in fact changes, from temperature T 1 (50 ℃) in the temperature province that comprises vitrifying point (Tg) the temperature T 2 (200 ℃), as shown in the figure have a bigger variation.
[embodiment 2-embodiment 11]
In embodiment 2～embodiment 11, adopt (a) bisphenol A type epoxy resin as the thermosetting resin composition.As in this corresponding (b) curing agent component; In embodiment 6 and embodiment 8, adopt and use mercaptan; In embodiment 2, embodiment 3, embodiment 19～embodiment 11, use amine, in embodiment 4 and embodiment 7, use acid anhydrides, in embodiment 5, use phenol.(c) insulating properties filler composition is identical with embodiment 1 with (d) reactive diluent (cross-linking regulator) composition.
After making the encapsulant curing of each embodiment that obtains, likewise measure vitrifying point (Tg) and storage elastic modulus E with embodiment 1.The result is as shown in table 1.In arbitrary embodiment, solidfied material has vitrifying point (Tg) in the temperature range more than-80 ℃, below 50 ℃.
[comparative example]
In comparative example 1 and comparative example 2; Use (a) as the bisphenol A type epoxy resin of thermosetting resin composition, as the acid anhydrides of corresponding (b) curing agent component, (c) insulating properties filler composition is identical with embodiment 1 with (d) reactive diluent (cross-linking regulator) composition.The vitrifying point of solidfied material (Tg) is 164 ℃ in comparative example 1, be 90 ℃ in comparative example 2.
Use the sealing material to seal and fitting operation, find the crack to occur at CSP more than 5 in 100 test pieces.Therefore, not obtaining can practical initial stage sealing characteristics.Due to the shrinkage stress of the encapsulant when thinking by curing is big.
Use Reflow Soldering simulator (リ Off ロ one シ ミ ユ レ one タ) (button A Zhi company (core-s company) system) to observe to be used to the curing process and subsequent the refrigerating work procedure of the encapsulant of making each assembling structure that embodiment 1～embodiment 11 and comparative example 1～comparative example 2 obtain.In this operation; The encapsulant of not finding embodiment 1～embodiment 11 has unusually, but the encapsulant of finding comparative example 1～comparative example 2 be warming up to 150 ℃ (curing process) back is being lower than its vitrifying point (Tg) in the refrigerating work procedure of room temperature (about 25 ℃) cooling temperature promptly under near the temperature 30 ℃ the surface of CSP produce the crack.
Think this be because; The encapsulant of embodiment 1～embodiment 11 all has vitrifying point (Tg) in-80 ℃～50 ℃ scope; Therefore under most of in fact temperature of the temperature range that sealing material occurrence temperature changes; The sealing material can keep so-called rubbery state, on the other hand, because the encapsulant of comparative example 1～comparative example 2 has vitrifying point (Tg) in the scope more than 50 ℃; The zone of the temperature range side that therefore changes in sealing material occurrence temperature, the sealing material exists with vitreousness.Promptly; The encapsulant that solidifies through heating is in refrigerating work procedure; Encapsulant self is the state of maintenance and CSP and the firm driving fit of circuit substrate also; Their integral body is shunk together; But the encapsulant of comparative example 1～comparative example 2 is vitreousness in the temperature range that is lower than vitrifying point (Tg), and the encapsulant of CSP, circuit substrate and vitreousness is in order to shrink with intrinsic separately coefficient of linear expansion and to produce distortion, and the minimum CSP (electronic unit and/or semiconductor device) of intensity can not bear this distortion and breakage takes place.
In addition; Can also think because carry out durable sealing characteristics test further causing the repeatedly distortion of thermal cycle repeatedly; Therefore the influence of distortion enlarges, and in the assembling structure of embodiment 1～embodiment 3 and comparative example 1～comparative example 2, CSP is damaged because of thermal cycling test.Therefore; The encapsulant of various embodiments of the present invention since be the temperature range of rubbery state wide, be the low encapsulant of vitrifying point (Tg), therefore when being used for the assembling procedure of the electric equipment products that defective item need repair, for qualified product; Even after sealing, also can keep the durable sealing of electronic unit and/or semiconductor device; For defective item, can relatively easily repair on the other hand, can bring into play effect with the presentation adverse effect.
(embodiment 12～21)
The characteristic of each encapsulant of embodiment 12～21 and comparative example 3～4 of test that is conceived to temperature T 1 is set at the rate of change Δ E/ Δ T of 50 ℃, storage elastic modulus E ' when temperature T 2 is set at 200 ℃ and storage elastic modulus is shown in table 2.
[table 2]
< repairing operation >
To using encapsulant of the present invention the assembling structure reparation property evaluation of CSP has been installed.From 100 of the CSP assembling structures that carried out above-mentioned fitting operation, randomly draw 10 CSP assembling structures, the adsorption tool in that the upper face pushing of CSP can be heated heats adsorption tool 1 minute to 250 ℃.Then, between CSP and circuit substrate, insert metallic and separate with bar (separate and use anchor clamps), when mentioning CSP, encapsulant is fully softening, encapsulant is ruptured also easily pull down CSP.
The expoxy glass circuit substrate of pulling down behind the CSP is placed on the heating plate; When about 100 ℃ are incubated down; Use solvent (the for example first industrial system PS-1 of drugmaker, LOCTITE corporate system 7360 etc.) to make the encapsulant swelling that remains on the expoxy glass circuit substrate, scrape off with plastics system scraper.In addition, adopt scolding tin to absorb and remove the soldering tin material that residues on the expoxy glass circuit substrate with litzendraht wire.
Each 10 of assembling structures to each embodiment have been implemented to repair operation, in arbitrary embodiment, all can scrape off operation and utilize the scolding tin absorption to remove operation with the soldering tin material of litzendraht wire with the interior encapsulant of scraper that utilizes smoothly continuously at 5 minutes.Therefore, this reparation operation has enough practicality.
In addition,, also can use far infra-red heater etc. to heat, replace placing on the heating plate in about 100 ℃ of operations of insulation down about above-mentioned reparation operation.
Be coated with soldering paste once more having pulled down as stated on the expoxy glass circuit substrate of CSP, new CSP is installed.In addition, at this moment, also can be at new CSP side printing soldering paste.
Same with above-mentioned fitting operation, around the junction surface of CSP, be coated with compositions of thermosetting resin and carry out heat treated, compositions of thermosetting resin is solidified, obtain the CSP assembling structure.For carrying out CSP after repairing as stated the assembling structure that obtains is installed,, is electrically connected reliably, and in thermal cycling test, also demonstrate excellent specific property identical when not repairing with same without the assembling structure of repairing.
[embodiment 12]
With (a) as bisphenol A type epoxy resin 100 weight portions of thermosetting resin composition, corresponding (b) mixes preparation encapsulant as alumina filled dose 0.10 weight portion of 50% average grain diameter, the 5 μ m of insulating properties filler composition, (d) as alkyl glycidyl base ether 10 weight portions of reactive diluent (cross-linking regulator) composition and curing accelerator 1 weight portion that is fit to the combination of above-mentioned thermosetting resin composition and curing agent component as dicyandiamide 8 weight portions of curing agent component, (c) therewith.Firm mixed viscosity is 28000mPas.
The encapsulant that obtains is solidified under the condition of above-mentioned seal operation, measure the vitrifying point (Tg) and the storage elastic modulus E of the encapsulant after solidifying.Vitrifying point (Tg) is-48 ℃.Be warming up to temperature T 2 (200 ℃) from temperature T 1 (50 ℃) on one side,, be abscissa with the temperature, draw as ordinate, obtain S oxbow figure as shown in Figure 2 to use the storage elastic modulus E shown in the logarithmic scale Yi Bian measure storage elastic modulus E.Promptly; In temperature province below temperature T 1 (50 ℃) and the temperature province more than the temperature T 2 (200 ℃); With respect to variation of temperature; Storage elastic modulus E in fact changes, from temperature T 1 (50 ℃) in the temperature province that comprises vitrifying point (Tg) the temperature T 2 (200 ℃), as shown in the figure have a bigger variation.Corresponding near the tangent slope this figure flex point, be 0.8 with respect to the rate of change (Δ E/ Δ T) of the storage elastic modulus of variations in temperature.
[embodiment 13-embodiment 21]
In embodiment 13～embodiment 15 and embodiment 17, adopt (a) as the bisphenol A type epoxy resin of thermosetting resin composition, (b) as the dicyandiamide of curing agent component and the combination of modified amine.(c) insulating properties filler composition is identical with embodiment 11 with (d) reactive diluent (cross-linking regulator) composition.
In embodiment 16, embodiment 19 and embodiment 21, adopt (a) as the bisphenol f type epoxy resin of thermosetting resin composition, (b) as the dicyandiamide of curing agent component and the combination of modified amine.(c) insulating properties filler composition is identical with embodiment 1 with (d) reactive diluent (cross-linking regulator) composition.
In embodiment 18 and embodiment 20, adopt (a) thermosetting resin composition with (b) as the polyurethanes resin combination of curing agent component.(c) insulating properties filler composition is identical with embodiment 11.
After making the encapsulant curing of each embodiment that obtains, likewise measure vitrifying point (Tg) and storage elastic modulus E with embodiment 11.The result is as shown in table 2.In arbitrary embodiment, with respect to the rate of change (Δ E/ Δ T) of the storage elastic modulus of variations in temperature all in the scope of 0.5MPa/ ℃～30MPa/ ℃.
[comparative example]
As shown in table 1, the encapsulant of comparative example 3 has 150 ℃ vitrifying point (Tg) after curing, and near the rate of change of vitrifying point (Tg), measuring (Δ E/ Δ T) with respect to the storage elastic modulus of variations in temperature is 33MPa/ ℃.
Use the sealing material to seal and fitting operation, find the crack to occur at CSP more than 5 in 10 test pieces.Therefore, not obtaining can practical initial stage sealing characteristics.Due to the shrinkage stress of the encapsulant when thinking by curing is big.
As shown in table 1, the encapsulant of comparative example 4 has 160 ℃ vitrifying point (Tg) after curing, and near the rate of change of vitrifying point (Tg), measuring (Δ E/ Δ T) with respect to the storage elastic modulus of variations in temperature is 40MPa/ ℃.
Use the sealing material to seal and fitting operation, find the crack to occur at CSP more than 6 in 10 test pieces.Therefore, not obtaining can practical initial stage sealing characteristics.Think by near the Tg with respect to the rate of change (Δ E/ Δ T) of the storage elastic modulus of variations in temperature excessive due to.
Claims (9)
1. an encapsulant is characterized in that,
It contains (a) thermosetting resin composition at least and reaches (b) its curing agent component; Said thermosetting resin composition is more than one the resin combination that is selected from the group of composition epoxy resin, polyurethane resin composition, phenol resin composition and acrylic acid resin composition; Wherein
The solidfied material that heats and get has vitrification point Tg in the temperature range more than-80 ℃, below 50 ℃,
Said encapsulant has the storage elastic modulus more than the 500MPa under the temperature that is lower than vitrification point Tg side, and under the temperature that is higher than vitrification point Tg side, has the storage elastic modulus below the 200MPa.
2. encapsulant according to claim 1 is characterized in that,
Said thermosetting resin composition does not contain organic silicones.
3. encapsulant according to claim 1 is characterized in that,
The storage elastic modulus that said encapsulant is had under the temperature that is lower than vitrification point Tg side is more than 800MPa.
4. encapsulant according to claim 1 is characterized in that,
The storage elastic modulus that said encapsulant is had under the temperature that is higher than vitrification point Tg side is below 50MPa.
5. encapsulant according to claim 1 is characterized in that,
The storage elastic modulus that said encapsulant is had under the temperature that is higher than vitrification point Tg side is below 10MPa.
6. encapsulant according to claim 1 is characterized in that,
The vitrification point Tg of said encapsulant is in-50 ℃～10 ℃ temperature range.
7. one kind is installed on the method for substrate with electronic unit, it is characterized in that, comprising:
(i) configuration of the assigned position on circuit substrate electronic unit, the operation of formation conductivity connecting portion;
(ii) to said conductivity connecting portion and the operation of each described encapsulant in the claim 1～6 is provided on every side; And
The operation that (iii) said substrate is heated.
8. a restorative procedure is characterized in that,
Through will under the situation of necessity, being heated to set point of temperature by the mounted substrate that the described method of claim 7 obtains; And with the boundary vicinity pushing of anchor clamps to substrate and encapsulant; Thereby make substantive interfacial failure taking place between substrate and the encapsulant, thus encapsulant and/or electronic unit is pulled down from substrate.
9. an assembling structure is characterized in that,
It is the assigned position on circuit substrate configuration electronic unit and and this circuit substrate and the corresponding electrode of this electronic unit between form that the conductivity connecting portion forms at circuit substrate the assembling structure of electronic unit is installed, wherein,
Around the said conductivity connecting portion and the space between electronic unit and the circuit substrate is by each described encapsulant sealing in the claim 1～6.
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006326819 | 2006-12-04 | ||
| JP326819/2006 | 2006-12-04 | ||
| JP331733/2006 | 2006-12-08 | ||
| JP2006331733 | 2006-12-08 | ||
| PCT/JP2007/073332 WO2008069179A1 (en) | 2006-12-04 | 2007-12-03 | Sealing material and mounting method using the sealing material |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101553910A CN101553910A (en) | 2009-10-07 |
| CN101553910B true CN101553910B (en) | 2012-03-28 |
Family
ID=41157091
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2007800446398A Expired - Fee Related CN101553910B (en) | 2006-12-04 | 2007-12-03 | Sealing material and mounting method using the sealing material |
| CN2007800446294A Expired - Fee Related CN101553909B (en) | 2006-12-04 | 2007-12-03 | Sealing material and mounting method using the sealing material |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2007800446294A Expired - Fee Related CN101553909B (en) | 2006-12-04 | 2007-12-03 | Sealing material and mounting method using the sealing material |
Country Status (1)
| Country | Link |
|---|---|
| CN (2) | CN101553910B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013172005A (en) * | 2012-02-21 | 2013-09-02 | Sumitomo Electric Ind Ltd | Repair cutter and restoration method |
| CN112752783B (en) * | 2019-08-21 | 2022-08-02 | 纳美仕有限公司 | Epoxy resin composition |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002343838A (en) * | 2001-05-14 | 2002-11-29 | Nec Corp | Semiconductor chip, method for removing the same and semiconductor device |
| JP2003246838A (en) * | 2002-02-27 | 2003-09-05 | Arakawa Chem Ind Co Ltd | Epoxy resin composition, resin composition and resin for electronic material, coating agent and process for preparing cured film of coating agent |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4706955B2 (en) * | 2004-12-24 | 2011-06-22 | 荒川化学工業株式会社 | Methoxy group-containing silane-modified fluorine-containing epoxy resin, epoxy resin composition, cured product, and method for producing the same |
-
2007
- 2007-12-03 CN CN2007800446398A patent/CN101553910B/en not_active Expired - Fee Related
- 2007-12-03 CN CN2007800446294A patent/CN101553909B/en not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002343838A (en) * | 2001-05-14 | 2002-11-29 | Nec Corp | Semiconductor chip, method for removing the same and semiconductor device |
| JP2003246838A (en) * | 2002-02-27 | 2003-09-05 | Arakawa Chem Ind Co Ltd | Epoxy resin composition, resin composition and resin for electronic material, coating agent and process for preparing cured film of coating agent |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101553910A (en) | 2009-10-07 |
| CN101553909B (en) | 2011-08-17 |
| CN101553909A (en) | 2009-10-07 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP5143020B2 (en) | Sealing material and mounting structure | |
| CN102086364A (en) | Conductive silver paste for microelectronic packaging and preparation method thereof | |
| WO2011158412A1 (en) | Package structure, method for manufacturing same, and method for repairing package structure | |
| WO1998028788A1 (en) | Manufacture of semiconductor device | |
| WO2005108459A1 (en) | Liquid epoxy resin composition | |
| JP4994743B2 (en) | Film adhesive and method of manufacturing semiconductor package using the same | |
| KR102455429B1 (en) | Method for manufacturing flip chip package, flip chip package, and resin composition for pre-application type underfills | |
| WO2004059721A1 (en) | Electronic component unit | |
| CN100479124C (en) | Semiconductor device | |
| CN101553910B (en) | Sealing material and mounting method using the sealing material | |
| KR20120027191A (en) | Epoxy resin composite | |
| KR101253107B1 (en) | Film like adhesive for attaching semiconductor element, semiconductor device using the same, and method for manufacturing the semiconductor device | |
| JP2000302841A (en) | Epoxy resin composition | |
| JP5493327B2 (en) | Resin composition for sealing filling, semiconductor device and method for manufacturing the same | |
| JP4865406B2 (en) | Semiconductor element mounting structure | |
| EP1153980B1 (en) | Epoxy resin composition | |
| CN104559882B (en) | A kind of liquid crystal type epoxy underfill and preparation method thereof | |
| Liu et al. | New developments in single pass reflow encapsulant for flip chip application | |
| JP2009246026A (en) | Paste-like adhesive, and method of manufacturing substrate incorporating electronic components using the same | |
| JP2004238634A (en) | Adhesive, adhesive member, wiring board having adhesive member and used for packaging semiconductor, and semiconductor device using the board | |
| JP2008305898A (en) | Sealing structure of electronic component | |
| JP2006328246A (en) | Epoxy resin composition, semiconductor device and its manufacturing method | |
| JPH1140931A (en) | Circuit board | |
| JPH1140929A (en) | Circuit board | |
| JP2008135794A (en) | Semiconductor device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20120328 Termination date: 20161203 |