CN101551426A - Method for enhancing conversion precision between hot resistance and temperature of device aging screening machine - Google Patents

Abstract

The invention discloses a method for enhancing conversion precision between hot resistance and a temperature of a device aging screening machine. The method is used for enhancing the conversion precision between the hot resistance and the temperature. The conversion between the temperature and the hot resistance adopts a linear interpolation method between two temperatures differing by one unit. The method adopts the linear interpolation method to enable the resistance and the temperatures to have one-to-one correspondence between the temperatures differing by one unit, thereby enhancing the conversion precision between the hot resistance and the temperature and enabling the operation for screening aged devices to be more accurate.

Description

A kind of method that improves conversion precision between hot resistance and temperature of device aging screening machine

Technical field

The present invention relates to a kind of conversion method that improves thermal resistance and temperature, relate in particular to a kind of method that improves conversion precision between hot resistance and temperature of device aging screening machine.

Technical background

Device ageing screening lathe is an Electronic Control production production run in enormous quantities, is used for various devices are carried out the equipment of burn-in screen.

When the thermal resistance of device ageing screening lathe and temperature are changed, the method that employing is tabled look-up can be changed, and is that temperature with a unit is inquired about but table look-up, two temperature that differ 1 ℃ of interval, how can improve precision, be problem demanding prompt solution of the present invention.

Summary of the invention

The objective of the invention is to overcome the defective of prior art, and a kind of method that improves conversion precision between hot resistance and temperature of device aging screening machine is provided, it can carry out improving conversion accuracy in thermal resistance and the temperature transition process tabling look-up.

The technical scheme that realizes above-mentioned purpose is: a kind of method that improves conversion precision between hot resistance and temperature of device aging screening machine, be used to improve the conversion accuracy between thermal resistance and the temperature, wherein, between two temperature that differ a unit, linear interpolation method is adopted in the conversion of temperature and thermal resistance.

The method of above-mentioned raising conversion precision between hot resistance and temperature of device aging screening machine, wherein, the described linear interpolation method that applies to the conversion of temperature and thermal resistance may further comprise the steps:

Step S1, sampling, the resistance R of sampling thermal resistance;

Step S2, ordering, the resistance R of the thermal resistance that sampling is obtained sorts from small to large by form;

Step S3 searches for the first time, and is promptly relatively big or small, finds Rn≤R≤R then _N+1The position, wherein, the resistance during Rn representation temperature Tn, R _N+1Representation temperature T _N+1The time resistance, n is a positive integer;

Step S4 searches for the second time, and is promptly further relatively big or small, finds then $R_N+\frac{K(R_{n+1}-R_n)}{10}\≤R\≤R_n+\frac{(K+1)(R_{n+1}-R_n)}{10}$ The position, wherein, K is the positive integer less than 10;

Step S5, R converts temperature to resistance, promptly according to obtaining resistance R among the step S4, converts it to temperature T,

The method of above-mentioned raising conversion precision between hot resistance and temperature of device aging screening machine, wherein, the temperature interval of a described unit is 1 ℃.

The invention has the beneficial effects as follows: the present invention has adopted linear interpolation method to make resistance corresponding one by one with temperature between the temperature interval of a unit, like this, has improved the thermoelectric group of conversion accuracy with temperature, makes that the device aging screening is more accurate.

Description of drawings

Fig. 1 is a process flow diagram of the present invention;

Fig. 2 is the process flow diagram of one embodiment of the invention.

Embodiment

The invention will be further described below in conjunction with accompanying drawing.

See also Fig. 1, there is shown a kind of method that improves conversion precision between hot resistance and temperature of device aging screening machine of the present invention, be used to improve the conversion accuracy between thermal resistance and the temperature, between two temperature that differ a unit, linear interpolation method is adopted in the conversion of temperature and thermal resistance, and the temperature interval of a unit is 1 ℃.

The present invention includes following steps:

Step S1, sampling, the resistance R of sampling thermal resistance;

Step S2, ordering, the resistance R of the thermal resistance that sampling is obtained sorts from small to large by form;

Step S3 searches for the first time, and is promptly relatively big or small, finds Rn≤R≤R then _N+1The position, wherein, the resistance during Rn representation temperature Tn, R _N+1Representation temperature T _N+1The time resistance, n is a positive integer;

Step S4 searches for the second time, and is promptly further relatively big or small, finds then $R_N+\frac{K(R_{n+1}-R_n)}{10}\≤R\≤R_n+\frac{(K+1)(R_{n+1}-R_n)}{10}$ The position, wherein, K is the positive integer less than 10;

Step S5, R converts temperature to resistance, promptly according to obtaining resistance R among the step S4, converts it to temperature T,

See also Fig. 2, there is shown the process flow diagram of an embodiment.

Above embodiment is only for the usefulness that the present invention is described, but not limiting the scope of the invention.Relevant those skilled in the art under the situation that does not break away from the spirit and scope of the present invention, can also make various conversion or modification, and the technical scheme that all are equal to also should belong within the category of the present invention's protection, is limited by each claim.

Claims (3)

1. a method that improves conversion precision between hot resistance and temperature of device aging screening machine is used to improve the conversion accuracy between thermal resistance and the temperature, it is characterized in that, between two temperature that differ a unit, linear interpolation method is adopted in the conversion of temperature and thermal resistance.

2. the method for raising conversion precision between hot resistance and temperature of device aging screening machine according to claim 1 is characterized in that, the described linear interpolation method that applies to the conversion of temperature and thermal resistance may further comprise the steps:

Step S1, sampling, the resistance R of sampling thermal resistance;

Step S2, ordering, the resistance R of the thermal resistance that sampling is obtained sorts from small to large by form;

Step S3 searches for the first time, and is promptly relatively big or small, finds Rn≤R≤R then _N+1The position, wherein, the resistance during Rn representation temperature Tn, R _N+1Representation temperature T _N+1The time resistance, n is a positive integer;

Step S4 searches for the second time, and is promptly further relatively big or small, finds then $R_N+\frac{K(R_{n+1}-R_n)}{10}\≤R\≤R_n+\frac{(K+1)(R_{n+1}-R_n)}{10}$ The position, wherein, K is the positive integer less than 10;

Step S5, R converts temperature to resistance, promptly according to obtaining resistance R among the step S4, converts it to temperature T,

3. the method for raising conversion precision between hot resistance and temperature of device aging screening machine according to claim 1 is characterized in that, the temperature interval of a described unit is 1 ℃.

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