CN101526585B - Automatic switching test system and method - Google Patents
Automatic switching test system and method Download PDFInfo
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- CN101526585B CN101526585B CN200810026689XA CN200810026689A CN101526585B CN 101526585 B CN101526585 B CN 101526585B CN 200810026689X A CN200810026689X A CN 200810026689XA CN 200810026689 A CN200810026689 A CN 200810026689A CN 101526585 B CN101526585 B CN 101526585B
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Abstract
The invention relates to an automatic switching test system, which can be widely applied in switching tests of electronic products of power equipment, the automatic switching test system comprises a processing module, a display module, a power control module, a reset control module and a switching control module, wherein the processing module is used for setting test parameters, receiving, storing and monitoring test information of objects to be tested in real time, and the automatic switching test system is used for controlling the test state of the tested objects; the display module is used for providing an interface for setting the test parameters, and the display module is used for displaying the test information set by the system; the power control module comprises a DC power control module and an AC power control module; the reset control module is used for resetting all counting circuits of the system to zero before the test; and the switching control module comprises a switching-on control module and a switching-off control module. The automatic switching test system can effectively improve the reliability of test results and the simplification of control equipment, and the test time is shortened greatly.
Description
[technical field]
The present invention relates to a kind of on-off testing system and method, and particularly relate to a kind of automatic switching test system and method.
[background technology]
A lot of relevant electronic products, as radio cassette player, televisor, video tape recorder, digital camera etc., and present personal computer, workstation, server, portable computer and computer peripheral or the like, all power-supply device must be arranged, and have power supply just to have the power switch parts, thereby we can utilize power switch moment of opening power to impact that product caused, carry out the strength test of product " ON/OFF " machine, no matter be that exploitation at new product relates to the stage, error correction stages or product quality reliability aspect all are very important test events, especially at present the machine open/close strength test of digital electronic product such as personal computer, necessary test especially, can the discovery system potential problem during each assembly coupling in power supply degree of stability and the BIOS initialization system: the work schedule of each IC of motherboard for example; The rising of time pulse, decline and shape thereof, accuracy and interference etc. all can influence the working stability degree of product.
Therefore, can succeed in developing and avoid the potential problem of product smoothly in order to make new product, prior art is at the mode of this switch loop test, be that hardware and software are separately independently carried out, proving installation on the hardware is one-side setting on time and switch number of times, and can't learn out-of-service time and failpoint.Partly come by independently divided because of software test, increased already on its time more than one times, the method has also been ignored the mutual relationship between the software and hardware switching on and shutting down simultaneously, will cause the possible potential failure factor of part can't be tested to come out.Though the device of testing simultaneously in conjunction with software and hardware was arranged afterwards,, had increased system complexity and inconvenience in the use because of need come the gauge tap machine by other another main frame.
Therefore, be necessary to provide a kind of automatic switching test system and method in fact, this automatic switching test system and method not only system equipment are simple, and testing efficiency is higher simultaneously, test result reliability is high.
[summary of the invention]
In view of this problem, the object of the present invention is to provide a kind of automatic switching test system and method, this automatic switching test system and method can improve testing efficiency and reliability of testing result greatly, and system equipment is simple.
For achieving the above object, the invention provides a kind of automatic switching test system, this automatic switching test system comprises an object under test, and this object under test is used to store a counting control program, and automatic switching test system is except object under test, and it also comprises:
Decoding module, this decoding module intercoms mutually with object under test, is used for the detecting information of object under test feedback is deciphered, and transmits this decoding information and give a processing module;
Processing module, it is used to be provided with test parameter, receives, stores and monitor in real time the detecting information of object under test, and the test mode of control object under test, and the detecting information that this processing module transmission receives is given a display module;
Display module, it is used to provide the test parameter interface is set, and the detecting information set of display system;
Energy supply control module, it comprises an AC power control module, this AC power control module is used to carry out the test of ac power supply system, and this energy supply control module and a control module that resets intercoms mutually;
The control module that resets, this control module that resets intercoms mutually with processing module, before being used for test, all counting circuits of system being reset make zero; And this control module that resets intercoms mutually with a switching on and shutting down control module;
The switching on and shutting down control module, it comprises a start control module and a shutdown control module, and this start control module is used to control the boot action of object under test, and the shutdown control module is used to control the shutdown action of object under test;
Wherein, described object under test is the switching on and shutting down electronic equipment with power-supply device;
Wherein, the described counting control program that is stored in object under test is used for storing the detecting information of the each switching on and shutting down of test process, so that commissioning staff's reference;
Wherein, described decoding module communicates by USB interface and object under test;
Wherein, described processing module is the CPLD single-chip that writes control program;
Wherein, described energy supply control module also comprises a direct current energy supply control module, and this direct supply control module is used to carry out the test of DC power-supply system;
Wherein, described display module is provided with display units such as switching on and shutting down time, switching on and shutting down number of times, test duration;
Wherein, each display unit on the described display module all can independently use 0 to 9 circulating digital switch;
Wherein, the test duration on the described display module can be set at 99 hours 59 minutes, but configuration switch machine number of times is 9999 times, meets long test jobs.
For reaching above-mentioned purpose, the present invention also provides a kind of method of testing of automatic switching, and this method for auto opening and closing comprises step:
A stores a counting control program under arbitrary catalogue of object under test,
B carries out this counting control program, and inserts the execution time and carry out number of times, waits and runs through for the first time initial on time, and object under test shuts down automatically;
C is by automatic switching test system configuration switch machine time and switching on and shutting down number of times;
The d system begins test, and all counting circuits of the control module that resets reset system are zero, and by start control module start counting, when the start control module counts up to setting-up time, sends a noble potential to processing module;
The e processing module receives this noble potential, and the start control module is counted once, and processing module sends a control signal to the shutdown control module simultaneously;
After f shutdown control module is received and closed machine control signal, carry out the shutdown of control object under test, and by shutdown control module start counting, when waiting unused time that counts up to setting, the shutdown control module sends an electronegative potential to processing module;
The g processing module receives this electronegative potential, and the shutdown control module is counted once, and processing module sends a control signal to the start control module simultaneously;
H is loop test according to this, and when carrying out the switching on and shutting down number of times of setting, processing module is sent a noble potential and given the start control module, and object under test is in open state, and counting control program and display module show test results;
Wherein, the described counting control program that is stored on the object under test provides an operation interface to the tester, and the tester can set test parameter and replacement test parameter by this operation interface.
Automatic switching test system provided by the invention can improve testing efficiency and reliability of testing result greatly, and system equipment is simple.
For making structure of the present invention and function thereof there are further understanding, cooperate diagram to be described in detail as follows now:
[description of drawings]
Fig. 1 is the system block diagrams of a preferred embodiment of the present invention;
Fig. 2 is the circuit block diagram of a preferred embodiment of the present invention;
Fig. 3 is the physical circuit figure of configuration switch machine time of the present invention;
Fig. 4 sets the physical circuit figure of test duration for the present invention;
Fig. 5 shows the physical circuit figure of actual testing time for the present invention;
Fig. 6 is the process flow diagram of the concrete test of a preferred embodiment of the present invention.
[embodiment]
Fig. 1 is the system block diagrams of a preferred embodiment of the present invention, this automatic switching test system 10 comprises an object under test 20, this object under test 20 is for having the switching on and shutting down electronic equipment of power-supply device, in present embodiment, this object under test 20 can be a notebook, this object under test 20 is used to store a counting control program, this counting control program is used for storing the detecting information of the each switching on and shutting down of test process, so that commissioning staff's reference, and this counting control program provides an operation interface to the tester, the tester can set test parameter and replacement test parameter by this operation interface, this automatic switching test system 10 also comprises a decoding module 101 except object under test 20, in present embodiment, this decoding module 101 is communicated by letter with object under test 20 by USB interface, be used for the detecting information of object under test 20 feedbacks is deciphered, and transmit this decoding information and give a processing module 102; This processing module 102 is used to be provided with test parameter, receives, stores and monitor in real time the detecting information of object under test 20, and the test mode of control object under test 20, and the detecting information that this processing module 102 transmits reception is given a display module 103; This display module 103 is used to provide and the test parameter interface is set, display units such as these test parameters include the switching on and shutting down time, switching on and shutting down number of times, test duration; And be used for the detecting information that display system is set; In addition, described processing module 102 also can intercom mutually with a switching on and shutting down control module 104, this switching on and shutting down control module 104 comprises a start control module 105 and a shutdown control module 106, this start control module 105 is used to control the boot action of object under test 20, and shutdown control module 106 is used to control the shutdown action of object under test 20; And this switching on and shutting down control module 104 also is connected with the control module 30 that resets, before this control module 30 that resets is used for test, the counting circuit replacement that system is all is made zero, this control module 30 that resets connects an energy supply control module 107, this energy supply control module 107 comprises a direct current energy supply control module 108 and an AC power control module 109, this direct supply control module 108 is used to carry out the test of DC power-supply system, and AC power control module 109 is used to carry out the test of ac power supply system.
See also Fig. 2, Fig. 3 and shown in Figure 4, Fig. 2 is the circuit block diagram of a preferred embodiment of the present invention, it comprises a configuration switch machine time circuit 501, test duration initialization circuit 502, testing time display circuit 503 and power circuit 504, wherein configuration switch machine time circuit 501 comprises a CPLD chip U4, the model of this chip U4 is EPM7128SLC84-10, and this chip U4 is provided with some power pins (V1～V8) and grounding pin (G1～G8), wherein power pins (series connection of V1～V8) one safety apparatus RP1 respectively with first input pin (01～08) and second input pin (09～16) electric connection of chip U4, and first input pin (01～08) and second input pin (09～16) time set button (SW1～SW4) that also connects some ground connection respectively; And (SW1～SW4) is used to set the unused time to the time set button, (also connect the 3rd input pin (17～24) and the 4th input pin (24～31) of a safety apparatus RP2 and chip U4 of V1～V8) electrically connects described power pins, time set button (the SW5～SW8) that the 3rd input pin (17～24) and the 4th input pin (25～32) are also connected some ground connection respectively, (SW5～SW8) is used to set the on time to this time set button, described chip U4 also is provided with the first output pin (a～h) and second output pin (W1～W4), and (resistance R 0 of all connecting of a～h) connects the end of a display chip U6 to first output pin, (the NPN type triode of all connecting of W1～W4) is connected with the other end of display chip U6 second output pin, in addition, described chip U4 also is provided with function pin (35～39).
Wherein, above-mentioned pin 37 series connection one ground connection replacement button SW21, this replacement button SW21 is used for configuration switch machine time circuit 501 is resetted, and should a replacement button SW21 direct earth capacitance C1 in parallel, the other end of this direct earth capacitance C1 resistance R 1 of connecting, this resistance R 1 connected system power Vcc-5V;
Wherein, above-mentioned pin 38 series connection one shift knob SW22, and this shift knob SW22 direct earth capacitance C2 in parallel, the other end of the direct earth capacitance C2 resistance R 2 of connecting, this resistance R 2 connected system power Vcc-5V;
Wherein, above-mentioned pin 35, pin 36 and pin 39 all are connected with test duration initialization circuit 502, and the pin 39 crystal oscillator U2 that also connects, this crystal oscillator U2 connected system power Vcc-5V.
Described test duration initialization circuit 502 comprises a CPLD chip U5, the model of this chip U5 also is EPM7128SLC84-10, and this chip U5 is provided with the some power pins (grounding pin of V1～V8) (G1～G8), wherein power pins (series connection of V1～V8) one safety apparatus RP4 respectively with first input pin (01～08) and second input pin (09～116) electric connection of chip U5, and first input pin (01～08) and second input pin (09～16) time set button (SW9～SW12) that also connects some ground connection respectively; (SW9～SW12) is used to set the test duration to this time set button, chip U5 also is provided with the first output pin (a～h) and second output pin (W1～W4), and (resistance R 9 of all connecting of a～h) connects the end of display chip U7 to first output pin, (the NPN type triode of all connecting of W1～W4) is connected with the other end of display chip U7 second output pin, in addition, described chip U5 also is provided with function pin (35～39), wherein pin 35, pin 36, pin 38 and pin 39 respectively with the pin 35 of chip U4, pin 36, pin 38, pin 39 is connected; In addition, function pin 37 series connection one ground connection replacement button SW23, this replacement button SW23 is used for test duration initialization circuit 502 is resetted, and should a replacement button SW23 direct earth capacitance C3 in parallel, the other end of this direct earth capacitance C3 resistance R 3 of connecting, this resistance R 3 connected system power Vcc-5V.
See also shown in Figure 5, Fig. 5 shows the physical circuit figure of actual testing time for the present invention, it comprises a chip U8, in present embodiment, this chip U8 is the MCS-51 process chip, chip U8 is provided with a power pins 40 and the grounding pin 20 of a connected system power Vcc-5V, and (the I/O port of the P10～P17) resistance R 9 of all connecting of this chip U8, described resistance R 9 all connects a positive-negative-positive triode and is connected with the end of a display chip U7,12 pins of chip U8,13 pins, 10 pins and 11 pins connect a ground connection positive-negative-positive triode respectively and are connected with the other end of display chip U7, in addition, 18 pins of chip U8 are as the input end series capacitance C7 of outside oscillator signal, C8 connects an optically-coupled trigger U10, and a crystal oscillator M1 and capacitor C 7 are arranged, the C8 parallel connection, in addition, 9 pins of the described chip U8 ground connection replacement button SW24 that connects, this replacement button SW24 is used for testing time display circuit 503 is resetted, an and electrochemical capacitor C4 should replacement button SW24 in parallel, the other end of this ground connection electrochemical capacitor C4 stake resistance R5 that connects, and 17 pins of the described chip U8 resistance R 17 of connecting connects an optically-coupled trigger U10, and this optically-coupled trigger U10 connects a USB interface.
See also shown in Figure 6ly, Fig. 6 is the process flow diagram of the concrete test of a preferred embodiment of the present invention, and its concrete steps are as follows:
Automatic switch machine test macro of the present invention compared with prior art possesses following advantage:
1. control program is write in CPLD and the single-chip, need not re-use another main frame and control, effectively promote the reliability of test result and the simplification of control appliance.
2. improve before for need separately carrying out in the test of hardware and software, so that the testing time significantly reduces and greatly promotes reliability between hardware and software.
Claims (11)
1. automatic switching test system, be applied to have in the switching on and shutting down test of electronic product of power-supply device, this automatic switching test system comprises an object under test, this object under test is used to store a counting control program, and automatic switching test system is characterized in that except object under test: this automatic switching test system also comprises:
Decoding module, this decoding module intercoms mutually with object under test, is used for the detecting information of object under test feedback is deciphered, and transmits this decoding information and give a processing module;
Processing module, it is used to be provided with test parameter, receives, stores and monitor in real time the detecting information of object under test, and the test mode of control object under test, and the detecting information that this processing module transmission receives is given a display module;
Display module, it is used to provide the test parameter interface is set, and the detecting information set of display system;
Energy supply control module, it comprises an AC power control module, this AC power control module is used to carry out the test of ac power supply system, and this energy supply control module and a control module that resets intercoms mutually;
The control module that resets, this control module that resets intercoms mutually with processing module, before it is used for test, all counting circuits of system is reset make zero; And this control module that resets is communicated by letter with a switching on and shutting down control module;
The switching on and shutting down control module, it comprises a start control module and a shutdown control module, and this start control module is used to control the boot action of object under test, and the shutdown control module is used to control the shutdown action of object under test.
2. automatic switching test system as claimed in claim 1 is characterized in that: described object under test is the switching on and shutting down electronic equipment with power-supply device.
3. automatic switching test system as claimed in claim 1 is characterized in that: the described counting control program that is stored in object under test is used for storing the detecting information of the each switching on and shutting down of test process, so that commissioning staff's reference.
4. automatic switching test system as claimed in claim 1 is characterized in that: described decoding module can communicate by USB interface and object under test.
5. automatic switching test system as claimed in claim 1 is characterized in that: described energy supply control module also comprises a direct current energy supply control module, and this direct supply control module is used to carry out the test of DC power-supply system.
6. automatic switching test system as claimed in claim 1 is characterized in that: described processing module is CPLD and the single-chip that writes control program.
7. automatic switching test system as claimed in claim 1 is characterized in that: described display module is provided with switching on and shutting down time, switching on and shutting down number of times, the display unit of test duration.
8. automatic switching test system as claimed in claim 4 is characterized in that: each display unit on the described display module all can independently use 0 to 9 circulating digital switch.
9. automatic switching test system as claimed in claim 4 is characterized in that: the test duration on the described display module can be set at 99 hours 59 minutes, but configuration switch machine number of times is 9999 times, meets long test jobs.
10. method for testing automatically powering on and off is applied to have in the switching on and shutting down test of electronic product of power-supply device, and it is characterized in that: this method for testing automatically powering on and off may further comprise the steps:
A stores a counting control program under arbitrary catalogue of object under test,
B carries out this counting control program, and inserts the execution time and carry out number of times, waits and runs through for the first time initial on time, and object under test shuts down automatically;
C is by automatic switching test system configuration switch machine time and switching on and shutting down number of times;
The d system begins test, and all counting circuits of the control module that resets reset system are zero, and by start control module start counting, when the start control module counts up to setting-up time, sends a noble potential to processing module;
The e processing module receives this noble potential, and the start control module is counted once, and processing module sends a control signal to the shutdown control module simultaneously;
After f shutdown control module is received and closed machine control signal, carry out the shutdown of control object under test, and by shutdown control module start counting, when waiting unused time that counts up to setting, the shutdown control module sends an electronegative potential to processing module;
The g processing module receives this electronegative potential, and the shutdown control module is counted once, and processing module sends a control signal to the start control module simultaneously;
H is loop test according to this, and when carrying out the switching on and shutting down number of times of setting, processing module is sent a noble potential and given the start control module, and object under test is in open state, and counting control program and display module show test results.
11. method for testing automatically powering on and off as claimed in claim 10, it is characterized in that: the described counting control program that is stored on the object under test provides an operation interface to the tester, and the tester can set test parameter and replacement test parameter by this operation interface.
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| CN200810026689XA CN101526585B (en) | 2008-03-07 | 2008-03-07 | Automatic switching test system and method |
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| CN200810026689XA CN101526585B (en) | 2008-03-07 | 2008-03-07 | Automatic switching test system and method |
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| CN101526585A CN101526585A (en) | 2009-09-09 |
| CN101526585B true CN101526585B (en) | 2011-02-16 |
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| CN200810026689XA Expired - Fee Related CN101526585B (en) | 2008-03-07 | 2008-03-07 | Automatic switching test system and method |
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Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102375766B (en) * | 2010-08-16 | 2016-05-18 | 中山市云创知识产权服务有限公司 | The on-off test device of electronic installation and method |
| CN102446127A (en) * | 2010-10-11 | 2012-05-09 | 鸿富锦精密工业（深圳）有限公司 | Power supply device and method for testing on/off of computer motherboard |
| CN102479120A (en) * | 2010-11-22 | 2012-05-30 | 鸿富锦精密工业（深圳）有限公司 | Startup/shutdown test system and startup/shutdown test method |
| CN102937928A (en) * | 2011-08-16 | 2013-02-20 | 鸿富锦精密工业（深圳）有限公司 | Main board sleeping and waking device |
| CN102520370B (en) * | 2011-12-31 | 2015-02-18 | 曙光信息产业股份有限公司 | Server switching power supply testing method and server switching power supply testing device |
| CN102681872A (en) * | 2012-05-14 | 2012-09-19 | 江苏中科梦兰电子科技有限公司 | Automatic cold boot method of notebook computer |
| CN103970627B (en) * | 2013-02-06 | 2017-08-22 | 深圳市杰和科技发展有限公司 | A kind of computer power supply automatic switch test system and method |
| CN104897984A (en) * | 2013-05-22 | 2015-09-09 | 江苏省电力公司常州供电公司 | Backup power automatic switching device intelligent calibration system with convenient operation |
| CN103455399A (en) * | 2013-09-25 | 2013-12-18 | 浪潮电子信息产业股份有限公司 | Multichannel server on-off fatigue testing method based on single-chip microcomputer |
| CN107632219B (en) * | 2017-10-11 | 2019-12-27 | 四川九州电子科技股份有限公司 | Automatic startup and shutdown test system and test method thereof |
| CN109726059B (en) * | 2019-01-02 | 2022-07-29 | 浪潮商用机器有限公司 | Server test system |
| CN111665412A (en) * | 2019-12-11 | 2020-09-15 | 重庆芯讯通无线科技有限公司 | Method and system for testing aging of module on/off |
| CN113127279B (en) * | 2021-04-09 | 2023-11-28 | 上海探寻信息技术有限公司 | Device and method for testing cyclic startup and shutdown and storage medium |
| CN113360332B (en) * | 2021-07-15 | 2022-05-17 | 杭州雾联科技有限公司 | Testing device of power supply control system |
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| CN1355435A (en) * | 2000-12-01 | 2002-06-26 | 英业达股份有限公司 | Autoamtic on-off tester |
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| CN1355435A (en) * | 2000-12-01 | 2002-06-26 | 英业达股份有限公司 | Autoamtic on-off tester |
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