CN101498768A - All-purpose tester for stroboscopic lamp - Google Patents
All-purpose tester for stroboscopic lamp Download PDFInfo
- Publication number
- CN101498768A CN101498768A CNA2008101364599A CN200810136459A CN101498768A CN 101498768 A CN101498768 A CN 101498768A CN A2008101364599 A CNA2008101364599 A CN A2008101364599A CN 200810136459 A CN200810136459 A CN 200810136459A CN 101498768 A CN101498768 A CN 101498768A
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- circuit
- signal
- counting
- chip microcomputer
- single chip
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Abstract
The invention relates to an integrated testing instrument of a stroboscopic lamp, which is characterized in that a single chip microcomputer system is used as a control and data processing center to receive corresponding signals; a wave shaping circuit transmits a signal of a tested product after being conditioned to a number/frequency metering circuit; the number/frequency metering circuit transmits the digital quantity to the single chip microcomputer system; after processing the data, the single chip microcomputer system transmits a standard signal to the number-frequency metering circuit; and a built-in power supply provides working power supply to each member. The invention has favorable flexibility of man-machine conversation interface and multi-purpose detection, and improves the original measuring precision and sensitivity.
Description
Technical field
The present invention relates to a kind of tester, relate in particular to a kind of all-purpose tester for stroboscopic lamp.
Background technology
The preceding detection of often need installing in the internal field of Airborne Lighting System equipment, the member of being badly in need of special test equipment has, navigation flashlamp control enclosure, stroboscopic lamp control enclosure, multiple model members such as power source conversion box.Need multiple common apparatus during with Pretesting, what signal measurement adopted is pointer-type table and indivedual nixie display, and measuring error is big, adopts the switch transition circuit in a large number, because frequent the use, cause the switch loose contact, cause testing result uncertain, and owing to adopt some test event of multiple common apparatus also must just can finish by external optional equipment, testing apparatus is many, use loaded down with trivial detailsly, place to disperse, the inconvenience management with safeguard.
Summary of the invention
The object of the present invention is to provide a kind of all-purpose tester for stroboscopic lamp, its integrated application measuring technology and computer technology, make test macro reach high precision, high sensitivity, realize multi-functional real-time testing, make test process reach robotization and intellectuality.
The present invention is achieved like this, it comprises Single Chip Microcomputer (SCM) system, standard frequency generation circuit, counting/meter frequency circuit, shaping circuit, power supply, display circuit, test product, it is characterized in that with the Single Chip Microcomputer (SCM) system being control and data processing centre (DPC), by controlling various circuit, receive corresponding signal, the signal of shaping circuit after with the signal condition of test product sends counting/meter frequency circuit to, counting/meter frequency circuit sends digital quantity to Single Chip Microcomputer (SCM) system again, after Data in Single-Chip Computer System is handled, on display circuit, show measured data, standard frequency generation circuit produces standard signal, send standard signal to counting/meter frequency circuit, as counting/meter frequency circuit standard count signal, built-in power provides working power for every member.
Technical indicator of the present invention is respectively: temporal resolution: 1 millisecond; Time test scope: 0-----1 hour; Frequency measurement scope: 0--------2MHz; Dutycycle: 0---100%.
Advantage of the present invention is: can make things convenient for the test pictures that intuitively enters multiple model member correspondence, has the dirigibility that good man-machine dialog interface and multi-usage detect, improve original measuring precision and sensitivity, thereby also guaranteed the reliability and the accuracy of testing.
Description of drawings
Fig. 1 is a principle of work synoptic diagram of the present invention.
Fig. 2 is the circuit diagram of pulse shaping circuit of the present invention.
Fig. 3 is the circuit diagram of standard frequency generation circuit of the present invention.
Single Chip Microcomputer (SCM) system 2, standard frequency generation circuit 3, counting/meter frequency circuit 4, shaping circuit 5, power supply 6, display circuit 7, test product in the drawings, 1,
Embodiment
As Fig. 1, Fig. 2, shown in Figure 3, the present invention is achieved like this, it comprises Single Chip Microcomputer (SCM) system 1, standard frequency generation circuit 2, counting/meter frequency circuit 3, shaping circuit 4, power supply 5, display circuit 6, test product 7, it is characterized in that with Single Chip Microcomputer (SCM) system 1 be control and data processing centre (DPC), by controlling various circuit, receive corresponding signal, the signal of shaping circuit 4 after with the signal condition of test product 7 sends counting/meter frequency circuit 3 to, counting/meter frequency circuit 3 sends digital quantity to Single Chip Microcomputer (SCM) system 1 again, after Single Chip Microcomputer (SCM) system 1 data processing, on display circuit 6, show measured data, standard frequency generation circuit 2 produces standard signal, send standard signal to counting/meter frequency circuit 3, as counting/meter frequency circuit 3 standard count signals, built-in power 5 provides working power for every member.
In the foregoing description because of pulse signal is disturbed, so add pulse shaping circuit:
Pulse shaping circuit is made up of resistance, electric capacity, photoelectricity coupling isolator, and using photoelectricity coupling isolator is because it has good primary and secondary isolation effect, and secondary wire is damaged and can not influenced primary wire.It is elementary to send photoelectricity coupling isolator O3 to behind the filter circuit of the pulse signal XH-3 of input through U27, U37, C4 composition, and through the coupling of isolator, secondary pulse signal is through being transferred to next link after the filtering again.
In the foregoing description since counting/meter frequency circuit import need use standard frequency to make the standard meter of counter the time, so need standard frequency generation circuit:
Form the generation circuit of 100KHz frequency by U10A, R4, U10B, Y2, C7, R6, U10C, U10D, R8, the standard frequency that this circuit is produced through 100 frequency divisions after, be defeated by the counting end of counting/meter frequency circuit, as timing signal.
Claims (1)
1, a kind of all-purpose tester for stroboscopic lamp, it comprises Single Chip Microcomputer (SCM) system, standard frequency generation circuit, counting/meter frequency circuit, shaping circuit, power supply, display circuit, test product, it is characterized in that with the Single Chip Microcomputer (SCM) system being control and data processing centre (DPC), by controlling various circuit, receive corresponding signal, the signal of shaping circuit after with the signal condition of test product sends counting/meter frequency circuit to, counting/meter frequency circuit sends digital quantity to Single Chip Microcomputer (SCM) system again, after Data in Single-Chip Computer System is handled, on display circuit, show measured data, standard frequency generation circuit produces standard signal, send standard signal to counting/meter frequency circuit, as counting/meter frequency circuit standard count signal, built-in power provides working power for every member.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA2008101364599A CN101498768A (en) | 2008-12-15 | 2008-12-15 | All-purpose tester for stroboscopic lamp |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA2008101364599A CN101498768A (en) | 2008-12-15 | 2008-12-15 | All-purpose tester for stroboscopic lamp |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN101498768A true CN101498768A (en) | 2009-08-05 |
Family
ID=40945925
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNA2008101364599A Pending CN101498768A (en) | 2008-12-15 | 2008-12-15 | All-purpose tester for stroboscopic lamp |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN101498768A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102692562A (en) * | 2011-03-25 | 2012-09-26 | 海洋王照明科技股份有限公司 | Circuit used for testing flash frequency and method thereof |
| CN102692561A (en) * | 2011-03-25 | 2012-09-26 | 海洋王照明科技股份有限公司 | Flash frequency test circuit and test method thereof |
| CN105445677A (en) * | 2015-11-13 | 2016-03-30 | 广州市鸿利光电股份有限公司 | Detection method and device for light source stroboflash |
| CN106556507A (en) * | 2015-09-24 | 2017-04-05 | 锦丰科技（深圳）有限公司 | A kind of equipment and its detection method of detection automobile IPL mass |
| CN114167477A (en) * | 2021-12-08 | 2022-03-11 | 电子科技大学 | Stroboscopic detection system based on thin film detector and design and manufacturing method |
-
2008
- 2008-12-15 CN CNA2008101364599A patent/CN101498768A/en active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102692562A (en) * | 2011-03-25 | 2012-09-26 | 海洋王照明科技股份有限公司 | Circuit used for testing flash frequency and method thereof |
| CN102692561A (en) * | 2011-03-25 | 2012-09-26 | 海洋王照明科技股份有限公司 | Flash frequency test circuit and test method thereof |
| CN102692561B (en) * | 2011-03-25 | 2016-05-18 | 海洋王照明科技股份有限公司 | Flashing rate test circuit and method of testing thereof |
| CN106556507A (en) * | 2015-09-24 | 2017-04-05 | 锦丰科技（深圳）有限公司 | A kind of equipment and its detection method of detection automobile IPL mass |
| CN105445677A (en) * | 2015-11-13 | 2016-03-30 | 广州市鸿利光电股份有限公司 | Detection method and device for light source stroboflash |
| CN114167477A (en) * | 2021-12-08 | 2022-03-11 | 电子科技大学 | Stroboscopic detection system based on thin film detector and design and manufacturing method |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C02 | Deemed withdrawal of patent application after publication (patent law 2001) | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Open date: 20090805 |