CN101420650A - Test control method - Google Patents
Test control method Download PDFInfo
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- CN101420650A CN101420650A CNA2007101241306A CN200710124130A CN101420650A CN 101420650 A CN101420650 A CN 101420650A CN A2007101241306 A CNA2007101241306 A CN A2007101241306A CN 200710124130 A CN200710124130 A CN 200710124130A CN 101420650 A CN101420650 A CN 101420650A
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- 238000012360 testing method Methods 0.000 title claims abstract description 139
- 238000000034 method Methods 0.000 title claims abstract description 40
- 238000009826 distribution Methods 0.000 claims abstract description 12
- 239000011159 matrix material Substances 0.000 claims description 21
- 230000002950 deficient Effects 0.000 claims description 11
- 230000003993 interaction Effects 0.000 claims description 7
- 230000004044 response Effects 0.000 claims description 6
- 230000035945 sensitivity Effects 0.000 claims description 6
- 238000004519 manufacturing process Methods 0.000 abstract description 12
- 230000002159 abnormal effect Effects 0.000 abstract description 9
- 238000003860 storage Methods 0.000 abstract 1
- 238000012544 monitoring process Methods 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
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Abstract
The invention discloses a test control method which comprises the following steps: a test control center is equipped with a memory which comprises at least two memory cells, and the memory cells are corresponding to at least two test sub-items of a product on each working position in an one-to-one manner; the test control center respectively tests various sub-items of the product on each working position, and counts the number of the disqualified test sub-items on each working position in the corresponding memory cells; and the test control center obtains the disqualified distribution of the various test sub-items of the product on each working position according to a storage result of the memory. By adopting the method, a user can timely discover the abnormal conditions of the product in a manufacturing process and in a test process, and further finds out the reason for the abnormal conditions; and the method is convenient for the user to monitor the manufacturing process and the test process of the product.
Description
Technical field
The present invention relates to a kind of test control method.
Background technology
When audio product is tested, generally all need microphone, loud speaker and other sub-projects to test respectively, and judge according to the test result of these sub-projects whether audio product is qualified to audio product.Sometimes,, also can be provided with a plurality of stations simultaneously, on each station, carry out the test of each sub-project of audio product respectively in order to enhance productivity.Yet the test control method of existing audio product can't obtain the bad distribution and the yield situation of audio product.This makes the user be difficult to find in time the abnormal conditions that audio product occurs in manufacture process and test process and further finds out the reason that abnormal conditions occur.So just can't realize the manufacture process of audio product and the monitoring of test process.
Summary of the invention
The present invention is exactly in order to overcome above deficiency, to have proposed a kind of test control method, can in time understanding the abnormal conditions of product in manufacture process and test process appearance by this test control method, and is convenient to the manufacture process of product and the monitoring of test process.
Technical problem of the present invention is solved by following technical scheme: a kind of test control method is characterized in that: comprise the steps:
A. test control center disposes a memory, comprises at least two memory cell in the described memory, and at least two test sub-projects of the product on described memory cell and each station are corresponding one by one;
B. test control center is tested respectively each test sub-project of the product on each station, and the underproof test sub-project number on each station is counted in the corresponding memory cell of test sub-project with this station;
C. test control center is obtained the defective distribution of respectively testing sub-project of product on each station according to the event memory of memory.
Preferably, also comprise the steps: the defective distribution of respectively testing sub-project of product on each station is presented on the human-computer interaction interface after the described step C.
Described memory cell is the matrix stores mode, and its row element is test sub-project or station, and its column element should be station or test sub-project mutually.
Also comprise the steps:
D. set first counter and second counter, test control center is obtained the product quantity of being tested and is counted first counter, and to obtain test result be qualified product quantity and count second counter;
E. test control center calculates the yield of product according to the count results of described first counter and second counter.
Also comprise the steps: that test control center sets lot number to product before the described step D, among the described step D, product quantity of being tested and qualified product quantity that described first counter and second counter count are the product of same lot number.
Also comprise the steps: the yield of product is presented on the human-computer interaction interface after the described step e.
Described product is an acoustic product, and described test sub-project comprises microphone test, loud speaker test.
Described microphone test comprises sensitivity test and frequency response test, and described loud speaker comprises harmonic distortion test, sensitivity test and frequency response test.
The beneficial effect that the present invention is compared with the prior art is: can obtain the defective distribution of respectively testing sub-project of product on each station, the yield distribution of product by method of the present invention, the user can in time find the abnormal conditions that product occurs and further find out the reason that abnormal conditions occur, make things convenient for the user to the manufacture process of product and the monitoring of test process in manufacture process and test process.
Description of drawings
Fig. 1 is the flow chart of the specific embodiment of the invention.
Embodiment
Also in conjunction with the accompanying drawings the present invention is described in further details below by concrete execution mode.
As shown in Figure 1, a kind of test control method of audio product comprises the steps:
The first step: test control center disposes a memory, comprises at least two memory cell in the described memory, and at least two test sub-projects of the audio product on described memory cell and each station are corresponding one by one.Described memory cell is the matrix stores mode, and the row element of matrix is that station, column element are the test sub-project in this embodiment.Obviously, also can make the row element of matrix is station for test sub-project, column element.Described test sub-project comprises microphone test, loud speaker test and other sub-projects, and described station has one at least.
Second step: test control center is tested respectively each test sub-project of the audio product on each station, and the underproof test sub-project number on each station is counted in the corresponding memory cell of test sub-project with this station.For example: the test result of first test sub-project (being assumed to be the microphone test) on first station counts in first row, first row of matrix, the test result of on first station the 3rd test sub-project (being assumed to be the loud speaker test) counts in first row the 3rd row of matrix, and the test result of the 3rd test sub-project on second station counts in second row the 3rd row of matrix ....Described microphone test comprises sensitivity test and frequency response test, and described loud speaker comprises harmonic distortion test, sensitivity test and frequency response test.
For convenience, the user can set a basis matrix A earlier, and before first round test, the value of this basis matrix A is zero, promptly
Finish to take turns and to obtain the test matrix B that the underproof test sub-project array on each station becomes after the test, suppose
With test matrix B and basis matrix A addition, and deposit in the memory.Can reduce operand by above-mentioned matrix stores mode, and make test result clearer.
Carry out take turns when testing if desired more, can with N (N〉0, N is a natural number) test matrix of wheel is as the basis matrix of N+1 wheel, needed after this moment, the test of N+1 wheel finished just to deposit in the memory after the test matrix addition with the test matrix of epicycle (N+1 wheel) and previous round.
The 3rd step: test control center is obtained the defective distribution of respectively testing sub-project of audio product on each station according to the event memory of memory.For example: the tertial value of first row of test matrix B is the number of non-compliances of the 3rd test of first station sub-project, and the value of second row, first row is the number of non-compliances of first test sub-project of second station ....
The 4th step: the defective distribution of respectively testing sub-project of audio product on each station is presented on the human-computer interaction interface.In this embodiment, directly test matrix is presented on the human-computer interaction interface, and test matrix is carried out marking explanation (physical significance to the row, column element describes).The user can understand the defective distribution of respectively testing sub-project of audio product on each station very intuitively like this, and in time understands the abnormal conditions that audio product occurs and further find out the reason that abnormal conditions occur in manufacture process and test process according to described defective distribution.For example: when the number of non-compliances of the 3rd row (corresponding with loud speaker test) was a lot, the user can recognize that the testing equipment that unusual or loud speaker may appear in the manufacture process of loud speaker may occur unusually.When the number of non-compliances of second row (corresponding with second station) when a lot, the user can recognize that the testing equipment of second station may occur unusually.
The test control method of above-mentioned audio product also can comprise the steps:
The 5th step: set first counter and second counter, test control center is obtained the audio product quantity of being tested and is counted first counter, obtains test result and is the audio product quantity of qualified (all test sub-projects are all qualified) and count second counter.
The 6th step: test control center calculates the yield of product according to the count results of described first counter and second counter.The count results of the count results of yield=second counter/first counter.
The 7th step: the yield of audio product is presented on the human-computer interaction interface.This can make things convenient for the user to check.
Before above-mentioned the 5th step, test control center is set lot number to product, and in described the 5th step, product quantity of being tested and qualified product quantity that described first counter and second counter count are the product of same lot number.The user can if the yield of the product of the pairing lot number of a certain feature is very low, illustrate that then there is defective in it according to different lot numbers of feature-set such as the source of product, manufacture process, manufacturing times, makes things convenient for the user that defective products is reviewed.
Above-mentioned the 5th step to the 7th step can carried out before the first step also and can carry out after the 4th step.
This embodiment is that example describes with the acoustic product, and obvious method and system of the present invention also goes for other products.
Above content be in conjunction with concrete preferred implementation to further describing that the present invention did, can not assert that concrete enforcement of the present invention is confined to these explanations.For the general technical staff of the technical field of the invention, without departing from the inventive concept of the premise, can also make some simple deduction or replace, all should be considered as belonging to protection scope of the present invention.
Claims (8)
1. a test control method is characterized in that: comprise the steps:
A. test control center disposes a memory, comprises at least two memory cell in the described memory, and at least two test sub-projects of the product on described memory cell and each station are corresponding one by one;
B. test control center is tested respectively each test sub-project of the product on each station, and the underproof test sub-project number on each station is counted in the corresponding memory cell of test sub-project with this station;
C. test control center is obtained the defective distribution of respectively testing sub-project of product on each station according to the event memory of memory.
2. test control method according to claim 1 is characterized in that: also comprise the steps: the defective distribution of respectively testing sub-project of product on each station is presented on the human-computer interaction interface after the described step C.
3. test control method according to claim 1 is characterized in that: described memory cell is the matrix stores mode, and its row element is test sub-project or station, and its column element should be station or test sub-project mutually.
4. according to the arbitrary described test control method of claim 1-3, it is characterized in that: also comprise the steps:
D. set first counter and second counter, test control center is obtained the product quantity of being tested and is counted first counter, and to obtain test result be qualified product quantity and count second counter;
E. test control center calculates the yield of product according to the count results of described first counter and second counter.
5. test control method according to claim 4, it is characterized in that: also comprise the steps: that test control center sets lot number to product before the described step D, among the described step D, product quantity of being tested and qualified product quantity that described first counter and second counter count are the product of same lot number.
6. test control method according to claim 4 is characterized in that: also comprise the steps: the yield of product is presented on the human-computer interaction interface after the described step e.
7. test control method according to claim 4 is characterized in that: described product is an acoustic product, and described test sub-project comprises microphone test, loud speaker test.
8. test control method according to claim 7 is characterized in that: described microphone test comprises sensitivity test and frequency response test, and described loud speaker comprises harmonic distortion test, sensitivity test and frequency response test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200710124130A CN101420650B (en) | 2007-10-24 | 2007-10-24 | Test control method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN200710124130A CN101420650B (en) | 2007-10-24 | 2007-10-24 | Test control method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101420650A true CN101420650A (en) | 2009-04-29 |
| CN101420650B CN101420650B (en) | 2012-10-17 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN200710124130A Expired - Fee Related CN101420650B (en) | 2007-10-24 | 2007-10-24 | Test control method |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106155854A (en) * | 2015-04-01 | 2016-11-23 | 神讯电脑(昆山)有限公司 | Functional test monitoring system and method |
| CN106325230A (en) * | 2015-07-03 | 2017-01-11 | 神讯电脑(昆山)有限公司 | Capacity monitoring system and method |
| CN108462932A (en) * | 2018-02-09 | 2018-08-28 | 北京云狐时代科技有限公司 | A kind of audio testing method of equipment, apparatus and system |
| CN110062321A (en) * | 2019-04-26 | 2019-07-26 | 北京百度网讯科技有限公司 | Test method, test host computer and the test fixture of intelligent sound |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE4319764C2 (en) * | 1993-06-15 | 2000-11-30 | Sennheiser Electronic | Measuring method for determining the variables characterizing a microphone, such as frequency response and directional behavior |
| CA2187472A1 (en) * | 1995-10-17 | 1997-04-18 | Frank S. Cheng | System and method for testing communications devices |
| DE19730716A1 (en) * | 1996-10-21 | 1998-04-23 | Fraunhofer Ges Forschung | Triggering a measurement procedure for quality assessment of audio and / or speech signals |
| CN1756444B (en) * | 2004-09-30 | 2011-09-28 | 富迪科技股份有限公司 | Self detection and correction method for electroacoustic system |
-
2007
- 2007-10-24 CN CN200710124130A patent/CN101420650B/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106155854A (en) * | 2015-04-01 | 2016-11-23 | 神讯电脑(昆山)有限公司 | Functional test monitoring system and method |
| CN106325230A (en) * | 2015-07-03 | 2017-01-11 | 神讯电脑(昆山)有限公司 | Capacity monitoring system and method |
| CN108462932A (en) * | 2018-02-09 | 2018-08-28 | 北京云狐时代科技有限公司 | A kind of audio testing method of equipment, apparatus and system |
| CN110062321A (en) * | 2019-04-26 | 2019-07-26 | 北京百度网讯科技有限公司 | Test method, test host computer and the test fixture of intelligent sound |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101420650B (en) | 2012-10-17 |
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Effective date of registration: 20191209 Address after: 314300 No. 18 Jinping Road, Qinshan street, Haiyan County, Zhejiang, Jiaxing Patentee after: ZHEJIANG YICHEN HARDWARE Corp. Address before: 518119 BYD Industrial Park, Yanan Road, Kwai Chung Town, Longgang District, Guangdong, Shenzhen Patentee before: BYD Co.,Ltd. |
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| CP01 | Change in the name or title of a patent holder | ||
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Address after: 314300 No.18, Jinping Road, Qinshan street, Haiyan County, Jiaxing City, Zhejiang Province Patentee after: Yichen hardware (Zhejiang) Co.,Ltd. Address before: 314300 No.18, Jinping Road, Qinshan street, Haiyan County, Jiaxing City, Zhejiang Province Patentee before: ZHEJIANG YICHEN HARDWARE Corp. |
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| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20121017 |