CN101399218B - Method for producing amorphous silicon isolated by deep groove - Google Patents

Method for producing amorphous silicon isolated by deep groove Download PDF

Info

Publication number
CN101399218B
CN101399218B CN200710094108A CN200710094108A CN101399218B CN 101399218 B CN101399218 B CN 101399218B CN 200710094108 A CN200710094108 A CN 200710094108A CN 200710094108 A CN200710094108 A CN 200710094108A CN 101399218 B CN101399218 B CN 101399218B
Authority
CN
China
Prior art keywords
amorphous silicon
preparation
oxygen
deep trouth
deposition
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN200710094108A
Other languages
Chinese (zh)
Other versions
CN101399218A (en
Inventor
王剑敏
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shanghai Huahong Grace Semiconductor Manufacturing Corp
Original Assignee
Shanghai Hua Hong NEC Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanghai Hua Hong NEC Electronics Co Ltd filed Critical Shanghai Hua Hong NEC Electronics Co Ltd
Priority to CN200710094108A priority Critical patent/CN101399218B/en
Publication of CN101399218A publication Critical patent/CN101399218A/en
Application granted granted Critical
Publication of CN101399218B publication Critical patent/CN101399218B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Chemical Vapour Deposition (AREA)
  • Formation Of Insulating Films (AREA)

Abstract

The invention discloses a preparation method of deep trench isolated amorphous silicon. The method comprises the following steps which are continuously carried out in deposition equipment: a first layer of amorphous silicon is deposited on a deep trench; gas pipelines and the deposition equipment are cleaned by nitrogen purging, afterward, a gaseous mixture of oxygen and argon is pumped into the equipment for purging, so that the surface of the first layer of amorphous silicon is oxidized to form silicon dioxide; a second layer of amorphous silicon is deposited on the silicon dioxide, thus finishing filling the deep trench. In the method, the stress brought from depositing the second layer of amorphous silicon is relieved by forming the silicon dioxide on the surface of the first layer of amorphous silicon; furthermore, the whole process is continuously carried out in the same deposition equipment, so that the total process time is relatively short; therefore, the production capacity of the deep trench isolated amorphous silicon technology is improved. The method is applicable for filling processes of deep trench isolated amorphous silicon in semiconductor preparations.

Description

The preparation method of amorphous silicon isolated by deep groove
Technical field
The present invention relates to a kind of preparation method of amorphous silicon isolated by deep groove.
Background technology
Deep trouth (being deep trench) at Bipolar or BiCMOS device is isolated in the making, adopts amorphous silicon as filling spacer medium usually.Because amorphous silicon need be deposited to certain thickness (10k
Figure G2007100941081D00011
-20k
Figure G2007100941081D00012
), so that deep trouth is filled up, but a deposit of amorphous silicon is too thick, will apply very large stress to silicon chip, is easy to like this cause the false sheet in goods or the stove because stress is excessive and cracked.Common method is that the amorphous silicon that deep trouth is filled is divided into twice deposit now, it is the amorphous silicon of a half thickness of the whole thickness of first deposit, come out of the stove then, under the normal temperature situation, place the regular hour, to eliminate certain stress, second half the amorphous silicon of thickness of deposit more subsequently, an overall deposit of stress ratio is little in the prepared like this amorphous silicon layer.But because whole deposition process is divided into twice, need comes out of the stove and go into stove again, and,, influence the production capacity for preparing amorphous silicon isolated by deep groove so greatly the expensive time again with being extracted into the needed pressure of si deposition in the body of heater.
Summary of the invention
The technical problem to be solved in the present invention provides a kind of preparation method of amorphous silicon isolated by deep groove, and it can shorten the time of si deposition.
For solving the problems of the technologies described above, the preparation method of amorphous silicon isolated by deep groove of the present invention is included in and carries out following steps in the si deposition equipment continuously:
(1) deposit ground floor amorphous silicon on deep trouth;
(2) purge purge gas pipeline and described deposition apparatus with nitrogen, afterwards the mist of aerating oxygen and argon gas purges in described equipment, makes the oxidation of ground floor amorphous silicon surfaces form silicon dioxide;
(3) deposit second layer amorphous silicon on the silicon dioxide that step (2) forms.
Another preparation method of the present invention promptly uses laughing gas (N in above-mentioned steps (2) 2O) mist of replace oxygen and argon gas.
Preparation method of the present invention is divided into twice deposit with the deep trouth amorphous silicon, in twice deposit, add oxidation step gas purging process, it is first deposit ground floor amorphous silicon, silane in the gas piping is purged clean with nitrogen earlier, the mist of aerating oxygen and argon gas or laughing gas in deposition apparatus then, make the surface oxidation of amorphous silicon form silicon dioxide, silicon dioxide can be alleviated the stress that amorphous silicon is brought when growing for the second time, and the stress that can avoid amorphous silicon isolated by deep groove one secondary growth to cause is excessive.This method is simple, and can utilize conventional device to carry out, and need not increase any attachment device.In addition, because oxidizing gas purges and si deposition is carried out in same equipment continuously, so the entire process time is shorter relatively.
Description of drawings
The present invention is further detailed explanation below in conjunction with accompanying drawing and embodiment:
Fig. 1 is preparation method's flow chart of the present invention;
Fig. 2 a is the structural representation after the ground floor si deposition in the preparation flow of the present invention;
Fig. 2 b is the structural representation after silicon dioxide forms in the preparation of the present invention;
Fig. 2 c is the structural representation after the second layer si deposition in the preparation of the present invention.
Embodiment
Preparation method of the present invention, in si deposition equipment, finish continuously, amorphous silicon isolated by deep groove is divided into the deposit (see figure 1) twice, in twice deposit, keep temperature-resistant in the deposition apparatus, add a step nitrogen and an oxygen blow process, the whole deep trouth of elder generation's deposit is filled 40%~60% thickness (being deposit ground floor amorphous silicon) of the whole thickness of needed amorphous silicon, with the residual reacting gas in the gas piping (for example, silane) purge totally with nitrogen, the mist of aerating oxygen and argon gas in deposition apparatus then, make the surface of ground floor amorphous silicon form silicon dioxide, the stress that this layer silicon dioxide is brought in the time of alleviating second layer si deposition.Twice deposition process of the present invention and the purge in twice deposition process are carried out in same deposition apparatus continuously, the deposition apparatus temperature the when temperature of deposition apparatus remains with si deposition identical (being about 500~600 degree).In the oxygen that adopts and the mist of argon gas, the molar percentage of oxygen is between 1%~2%.In concrete the enforcement, also can use N 2O gas replaces the mist of oxygen and argon gas.
Fig. 2 a to Fig. 2 c is the silicon chip cross section structure schematic diagram in preparation method's process of the present invention, before carrying out the amorphous silicon filling, be coated with silicon dioxide around the deep trouth earlier, the ground floor si deposition (is seen Fig. 2 a), after deposit is intact, is kept temperature-resistant in the deposition apparatus on silicon dioxide, feeding nitrogen earlier purges with the silane gas in the purge gas pipeline, the mist of back aerating oxygen and argon gas purges deposition apparatus, makes the amorphous silicon of silicon chip surface be oxidized to silicon dioxide (seeing Fig. 2 b), is about 50
Figure G2007100941081D00031
~100
Figure G2007100941081D00032
In same equipment, carry out second layer si deposition at last to fill whole deep trouth (seeing Fig. 2 c).Si deposition equipment recited above can be the boiler tube in the LPCVD technology, also can be that other is used for the equipment of si deposition.
In concrete enforcement, the flow that the mist of oxygen and argon gas can be purged is 500sccm~1500sccm (a standard state ml/min), deposition apparatus pressure in the purge is controlled to be between 0.1Torr~1Torr (holder), and purge time is controlled to be 30s~240s.

Claims (8)

1. the preparation method of an amorphous silicon isolated by deep groove is used for amorphous silicon is filled into deep trouth, it is characterized in that, is included in to carry out following steps in the si deposition equipment continuously:
(1) deposit ground floor amorphous silicon on deep trouth;
(2) purge purge gas pipeline and described deposition apparatus with nitrogen, afterwards the mist of aerating oxygen and argon gas purges in described equipment, makes the oxidation of ground floor amorphous silicon surfaces form silicon dioxide;
(3) deposit second layer amorphous silicon on the silicon dioxide that step (2) forms is finished the filling of described deep trouth.
2. according to the described preparation method of claim 1, it is characterized in that: the device temperature of the deposition apparatus temperature the when mist of described oxygen and argon gas purges during with si deposition is identical.
3. according to the described preparation method of claim 2, it is characterized in that: the flow of the mist of described oxygen and argon gas is 500sccm~1500sccm, pressure during described oxygen blow in the deposition apparatus is 0.1~1 holder, and the time that the mist of described oxygen and argon gas purges is 30 seconds~240 seconds.
4. according to the described preparation method of claim 1, it is characterized in that: the thickness of the silicon dioxide that forms in the described step (2) is
5. according to the described preparation method of claim 1, it is characterized in that: the thickness of described ground floor amorphous silicon be described deep trouth fill needed amorphous silicon thickness 40%~60%.
6. according to the described preparation method of claim 1, it is characterized in that: in the mist of described oxygen and argon gas, the mole percent level of oxygen is 1%~2%.
7. the preparation method of an amorphous silicon isolated by deep groove is used for amorphous silicon is filled into deep trouth, it is characterized in that, is included in to carry out following steps in the si deposition equipment continuously:
(1) in deposition apparatus, deposit ground floor amorphous silicon on deep trouth;
(2) purge purge gas pipeline and described deposition apparatus with nitrogen, the back feeds N in described equipment 2O purges, and makes the oxidation of ground floor amorphous silicon surfaces form silicon dioxide;
(3) deposit second layer amorphous silicon on the silicon dioxide that step (2) forms is finished the filling of described deep trouth.
8. according to the described preparation method of claim 7, it is characterized in that: the thickness of described ground floor amorphous silicon be described deep trouth fill needed amorphous silicon thickness 40%~60%.
CN200710094108A 2007-09-28 2007-09-28 Method for producing amorphous silicon isolated by deep groove Active CN101399218B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN200710094108A CN101399218B (en) 2007-09-28 2007-09-28 Method for producing amorphous silicon isolated by deep groove

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN200710094108A CN101399218B (en) 2007-09-28 2007-09-28 Method for producing amorphous silicon isolated by deep groove

Publications (2)

Publication Number Publication Date
CN101399218A CN101399218A (en) 2009-04-01
CN101399218B true CN101399218B (en) 2010-05-26

Family

ID=40517654

Family Applications (1)

Application Number Title Priority Date Filing Date
CN200710094108A Active CN101399218B (en) 2007-09-28 2007-09-28 Method for producing amorphous silicon isolated by deep groove

Country Status (1)

Country Link
CN (1) CN101399218B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103035515B (en) * 2012-07-18 2015-10-14 上海华虹宏力半导体制造有限公司 The fill method of groove
CN113921379A (en) * 2021-09-29 2022-01-11 上海华虹宏力半导体制造有限公司 Method for forming resonator cavity film

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5888876A (en) * 1996-04-09 1999-03-30 Kabushiki Kaisha Toshiba Deep trench filling method using silicon film deposition and silicon migration
US5897360A (en) * 1996-10-21 1999-04-27 Nec Corporation Manufacturing method of semiconductor integrated circuit

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5888876A (en) * 1996-04-09 1999-03-30 Kabushiki Kaisha Toshiba Deep trench filling method using silicon film deposition and silicon migration
US5897360A (en) * 1996-10-21 1999-04-27 Nec Corporation Manufacturing method of semiconductor integrated circuit

Also Published As

Publication number Publication date
CN101399218A (en) 2009-04-01

Similar Documents

Publication Publication Date Title
TWI534289B (en) A carbonaceous material coated with tantalum carbide and a method for producing the same
CN103031530B (en) The forming method of thin film and film formation device
JP6585551B2 (en) Semiconductor device manufacturing method, substrate processing apparatus, and program
JP4758354B2 (en) Method for forming a silicon carbide layer on a substrate
US7621998B2 (en) Single crystalline gallium nitride thick film having reduced bending deformation
CA2678488C (en) Method of producing a group iii nitride crystal
US7754286B2 (en) Method of forming a silicon dioxide film
JP2000353821A (en) Nitride semiconductor device and manufacture thereof
CN112647055B (en) Chemical vapor deposition method for preparing silicon carbide composite coating on monocrystalline silicon or polycrystalline silicon
JP6920082B2 (en) Semiconductor device manufacturing methods, substrate processing devices and programs
CN109148643B (en) Method for solving problem of efficiency reduction of PERC battery in ALD mode after electric injection or light injection
JP2008308355A (en) Method for manufacturing carbon nanotube
CN101399218B (en) Method for producing amorphous silicon isolated by deep groove
JP6546872B2 (en) Semiconductor device manufacturing method, substrate processing apparatus, and program
CN112851387B (en) Method for preparing silicon carbide coating on surface of carbon-carbon composite material
JP5854112B2 (en) Thin film forming method and film forming apparatus
CN104233457B (en) method for producing a Group III nitride semiconductor crystal and method for producing a GaN substrate
KR101971547B1 (en) Metal Layer Fabrication Method for Semiconductor Device
CN103346071A (en) Method for preparing InN semiconductor device containing SiNx inserted layer
WO2003100828A2 (en) Method of depositing an oxide film by chemical vapor deposition
CN107749394B (en) Preparation method of silicon nitride film
CN112095090A (en) Preparation method of silicon-based heterojunction solar cell and preparation method of gradient silicon-oxygen passivation layer
JP5906930B2 (en) Glass tube and manufacturing method thereof
TW201011119A (en) Graphite protection film and production method thereof
CN101192603A (en) Shallow groove structure and its filling method

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
ASS Succession or assignment of patent right

Owner name: SHANGHAI HUAHONG GRACE SEMICONDUCTOR MANUFACTURING

Free format text: FORMER OWNER: HUAHONG NEC ELECTRONICS CO LTD, SHANGHAI

Effective date: 20140108

C41 Transfer of patent application or patent right or utility model
COR Change of bibliographic data

Free format text: CORRECT: ADDRESS; FROM: 201206 PUDONG NEW AREA, SHANGHAI TO: 201203 PUDONG NEW AREA, SHANGHAI

TR01 Transfer of patent right

Effective date of registration: 20140108

Address after: 201203 Shanghai city Zuchongzhi road Pudong New Area Zhangjiang hi tech Park No. 1399

Patentee after: Shanghai Huahong Grace Semiconductor Manufacturing Corporation

Address before: 201206 Jinqiao Road, Pudong New Area Jinqiao Export Processing Zone, Shanghai, 1188

Patentee before: Shanghai Huahong NEC Electronics Co., Ltd.