CN101290330B - Circuit testing device - Google Patents

Abstract

The invention discloses a circuit testing device for testing an element to be tested. The circuit testing device comprises an accurate measurement module, a signal converting module and a microprocessor, wherein, the accurate measurement module is coupled with the element to be tested and is used for providing a test signal and receiving a measure signal generated according to the test signal; the signal converting module is coupled with the accurate measurement module and is used for receiving the measure signal and converting the measure signal according to a preset way as well as generating a signal measure result; and the microprocessor is coupled with the accurate measurement module and the signal converting module and is used for determining the testing result of the element to be tested according to the signal measure result. The circuit testing device brings convenience of test to a user, increases the speed of test and improves the efficiency of test further.

Description

Circuit test device

Technical field

The present invention provides a kind of circuit test device, refers to a kind of decibel (decibel, dB) Zhi circuit test device of measuring element to be tested especially.

Background technology

Along with the progress of science and technology, integrated circuit (Integrated Circuit, function IC) from strength to strength, its importance also hurriedly increases with day.Except the IC of the IC of simple Analog signals and simple processing digital signal, industry is also developed the multiple IC that has digital signal and analog signal processing ability concurrently successively, and this kind IC generally can be described as mixed-signal IC.No matter and be digital signal IC, simulating signal IC or mixed-signal IC, quality during in order to ensure the IC shipment, after finishing manufacture process, generally all can carry out test to each IC, manufacturer can be according to the result who IC is carried out test, decide this IC whether qualified, and judge whether this IC to be supplied to the manufacturer in downstream according to this.

With common now IC volume production test mode is example, generally is to use logic tester (Logic tester) to be used as the testing tool of IC before dispatching from the factory.Yet, as the decibel (decibel that wants test I C, when dB) being worth, because general logic tester does not have the function of direct test I C decibel value, therefore after must using logic tester to measure the output voltage of IC earlier, at the pairing decibel value of this output voltage that converts voluntarily by the user, could judge that so this IC is for being worth test or failure (Fail) by (Pass) decibel (dB).Yet, by user convert voluntarily output voltage values and decibel value, not only can consume the tediously long test duration, reduce the speed of test, more can bring the user greatly inconvenience.

Summary of the invention

Therefore, one of purpose of the present invention is to provide a kind of test structure that promotes the test convenience and promote test speed, to solve the problem that known technology was faced.

The invention provides a kind of circuit test device, be used for testing an element to be tested, this circuit test device include one accurately measure module (Precision MeasureUnit, PMU), a signal conversion module and a microprocessor.Accurately measure module and be coupled to this element to be tested, accurately measuring module is to be used to provide a test signal, and receives the measurement signal according to this test signal produced.Signal conversion module is coupled to this and accurately measures module, and signal conversion module is carried out conversion of signals according to a predetermined way to this measurement signal in order to receive this measurement signal, produces a measuring signal result.Microprocessor is coupled to this and accurately measures module and this signal conversion module, and microprocessor is in order to decide the test result of this element to be tested according to this measuring signal result; Wherein this predetermined way is that this measurement signal that will have voltage level values is converted to the measuring signal result with decibel value.

Circuit test device of the present invention, this predetermined way are according to following formula this measurement signal to be carried out conversion of signals, produce this measuring signal result:

Wherein dB is measuring signal result's decibel (dB) value, and Vi is the voltage level values of test signal, and Vo is the voltage level values of measurement signal.

Circuit test device of the present invention, this predetermined way are according to comparison list (look-up table), and this measurement signal is carried out conversion of signals, produce this measuring signal result.

Circuit test device of the present invention, this signal conversion module are to utilize the mode of looking into this table of comparisons, and this measurement signal is carried out conversion of signals, produce this measuring signal result.

Circuit test device of the present invention, this circuit test device comprises a memory storage in addition, is coupled to this signal conversion module, in order to store this table of comparisons.

Circuit test device of the present invention, this memory storage be a static RAM (Static Random Access Memory, SRAM).

Circuit test device of the present invention, this circuit test device includes a working storage in addition, is coupled to this microprocessor, in order to store this test result.

Circuit test device of the present invention, this circuit test device are a logic tester.

Circuit test device of the present invention, this element to be tested be an integrated circuit (Integrated Circuit, IC).

Circuit test device of the present invention, this circuit test device comprises a display module in addition, in order to show the test result of this element to be tested.

Circuit test device of the present invention not only can bring the convenience of test for the user, more can promote the speed of test, further promotes testing efficiency.

Description of drawings

Fig. 1 is the synoptic diagram of circuit test device of the present invention.

Fig. 2 carries out the testing procedure process flow diagram of element to be tested for circuit test device of the present invention.

Embodiment

See also Fig. 1, Fig. 1 is the synoptic diagram of circuit test device of the present invention.As shown in Figure 1, circuit test device 10 of the present invention is used for testing an element 12 to be tested, in an embodiment, circuit test device 10 of the present invention is to be a logic tester, and element 12 to be tested can be the integrated circuit to be tested that is arranged on the element circuitry plate to be tested (DUT board) 14 (Integrated Circuit, IC).Circuit test device 10 includes one and accurately measures module (Precision Measure Unit, PMU) 110, one signal conversion module 120 and a microprocessor 130.Accurately measure module 110 and be coupled to element 12 to be tested, accurately measure module 110 and be used to provide a test signal S _T, and receive according to this test signal S _TA measurement signal S who is produced _MSignal conversion module 120 is coupled to accurate measurement module 110, and signal conversion module 120 is in order to receive this measurement signal S _M, according to a predetermined way to measurement signal S _MCarry out conversion of signals, produce measuring signal S as a result _RMicroprocessor 130 is coupled to accurate measurement module 110 and signal conversion module 120, and microprocessor 130 is in order to according to measuring signal S as a result _RDecide the test result of element 12 to be tested.In an embodiment, predetermined way is to have the measurement signal S of voltage level values _M, be converted to measuring signal S as a result with decibel (db) value _R

Wherein, test signal S _TBe to be an input voltage, measurement signal S _MBe for element to be tested 12 according to the corresponding output voltage that input voltage produced, and measuring signal S as a result _RIt then is decibel (dB) value of output voltage being changed according to this predetermined way.Below explanation signal conversion module 120 utilizes this predetermined way with measurement signal S _MBe converted to measuring signal S as a result _RAction.In an embodiment, predetermined way is with measurement signal S according to following formula _MCarry out conversion of signals, produce measuring signal S as a result _R:

$\mathrm{dB}=20{\log }_{10}\frac{\mathrm{Vo}}{\mathrm{Vi}},$

Wherein dB is a decibel value, and Vi is test signal S _TVoltage level values (input voltage), and Vo is measurement signal S _MVoltage level values (output voltage).Because Vi value (input voltage) is the test signal S that accurately measures module amount 110 inputs element 12 to be tested when beginning to test _TVoltage level values, so the Vi value is known.And Vo value (output voltage) is to be measurement signal S _MVoltage level values, therefore through after the conversion of above-mentioned formula, can learn the decibel value (dB) of element 12 to be tested, and further carry out the judgement of element to be tested by (Pass) or failure (Fail) according to resulting decibel value (dB).

Conversion according to above-mentioned formula, when the test of the default element to be tested of user is carried out the scope restriction by the condition of (Pass) for utilizing decibel (dB) value, because the value of decibel (dB) value for setting up on their own, therefore decibel value (dB) is known, as long as according to above-mentioned formula, the known Vi value of substitution again, can obtain the Vo value scope that meets the restriction of decibel (dB) value scope, utilize again whereby and accurately measure the magnitude measure that module 110 is carried out actual Vo value, judge further whether actual Vo value falls between the Vo value scope that meets the restriction of dB value scope, can learn that element to be tested is for passing through (Pass) or failure (Fail).

The act concrete instance is described further, and decibel (dB) the value scope of passing through the test of decibel (dB) value that the user sets element 12 to be tested is 20 decibels～40 decibels, and imports the test signal S of element 12 to be tested _TVoltage level values (input voltage) Vi be 10mV, with above-mentioned decibel (dB) value and Vi value substitution formula $\mathrm{dB}=20{\log }_{10}\frac{\mathrm{Vo}}{\mathrm{Vi}},$ Can obtain measurement signal S _MThe scope of voltage level values (output voltage) Vo should be between being between 100mV～1000mV, then, utilize accurately to measure module amount 110 and survey actual Vo value, as if measurement signal S _MVo is between 100mV～1000mV for actual voltage level values (actual output voltage), then represents element 12 to be tested by (Pass) test, otherwise, then represent 12 failures (fail) of tape test element, not by test.Opposite, the test of presetting element to be tested as the user is measurement signal S by condition _MMagnitude of voltage (Vo) time, utilize above-mentioned formula conversion can formulate the scope of decibel (dB) value of element to be tested by test.

In addition, also dB value, Vo value and the Vi value of above-mentioned formula can be stored in advance in the comparison list (look-up table), signal conversion module 120 is utilized the mode of tabling look-up again, with measurement signal S _MCarry out conversion of signals, produce measuring signal S as a result _RAnd circuit test device 10 includes a memory storage in addition, is coupled to this signal conversion module (not shown), in order to store the above-mentioned table of comparisons.In an embodiment, memory storage (not shown) be can be a static RAM (Static Random AccessMemory, SRAM).In addition, circuit test device 10 can comprise a display module (not shown) in addition, in order to show the test result of element 12 to be tested.

In another embodiment, circuit test device 10 includes a working storage in addition, be coupled to this microprocessor (not shown), in order to stores test results, when circuit test device 10 is tested a plurality of element 12 to be tested between the while, can earlier the test result of each element to be tested be deposited in earlier in the working storage (not shown), up to whole elements to be tested 12 is all tested finish after, again test result is taken out and to learn that each element to be tested is respectively by (Pass) or failure (Fail) in these a plurality of elements 12 to be tested, can save the time of test by this kind test mode, and improve testing efficiency.

See also Fig. 1 and Fig. 2, Fig. 2 carries out the testing procedure process flow diagram of element to be tested for circuit test device of the present invention.When as shown in Figures 1 and 2, circuit test device 10 carries out element to be tested 12 tests is to comprise the following step:

S50: test beginning;

S52: accurately measure module 110 a test signal S is provided _T, then accurately measure module 110 and receive element 12 to be tested according to this test signal S _TA measurement signal S who is produced _M

S54: signal conversion module 120 receives this measurement signal S _MAfter, according to a predetermined way to this measurement signal S _MCarry out conversion of signals, produce measuring signal S as a result _R

S56: microprocessor 130 is according to this measuring signal S as a result _RDecide the test result of element 12 to be tested;

S58: end of test (EOT).

In each embodiment of the present invention, owing to used signal conversion module that the measurement signal that element to be tested produced is converted to the measuring signal result, so follow-up only need use through the resulting measuring signal result of conversion of signals, can judge that whether element to be tested passes through test, reaches the purpose of test element to be tested.Compared to known technology must by the user voluntarily the converted measurement signal carry out the test structure that conversion of signals is the measuring signal result, the test structure of various embodiments of the present invention not only can bring the convenience of test for the user, more can promote the speed of test, further promote testing efficiency, these all are the characteristics that the present invention is better than known technology.

The above only is preferred embodiment of the present invention; so it is not in order to limit scope of the present invention; any personnel that are familiar with this technology; without departing from the spirit and scope of the present invention; can do further improvement and variation on this basis, so the scope that claims were defined that protection scope of the present invention is worked as with the application is as the criterion.

Being simply described as follows of symbol in the accompanying drawing:

10: circuit test device

12: element to be tested

14: element circuitry plate to be tested

110: accurately measure module

120: signal conversion module

130: microprocessor

ST: test signal

SM: measurement signal

SR: measuring signal result

S50～S58: step

Claims (10)

1. a circuit test device is characterized in that, is used for testing an element to be tested, and this circuit test device includes:

One accurately measures module, is coupled to this element to be tested, is used to provide a test signal, and receives the measurement signal according to this test signal produced;

One signal conversion module is coupled to this and accurately measures module, in order to receive this measurement signal, according to a predetermined way this measurement signal is carried out conversion of signals, produces a measuring signal result; And

One microprocessor is coupled to this and accurately measures module and this signal conversion module, in order to decide the test result of this element to be tested according to this measuring signal result;

Wherein, this predetermined way is that this measurement signal that will have voltage level values is converted to the measuring signal result with decibel value.

2. circuit test device according to claim 1 is characterized in that, this predetermined way is according to following formula this measurement signal to be carried out conversion of signals, produces this measuring signal result:

$\mathrm{dB}=20{\log }_{10}\frac{\mathrm{Vo}}{\mathrm{Vi}},$

Wherein dB is measuring signal result's a decibel value, and Vi is the voltage level values of test signal, and Vo is the voltage level values of measurement signal.

3. circuit test device according to claim 1 is characterized in that this predetermined way is according to comparison list, and this measurement signal is carried out conversion of signals, produces this measuring signal result.

4. circuit test device according to claim 3 is characterized in that, this signal conversion module is to utilize the mode of looking into this table of comparisons, and this measurement signal is carried out conversion of signals, produces this measuring signal result.

5. circuit test device according to claim 3 is characterized in that this circuit test device comprises a memory storage in addition, is coupled to this signal conversion module, in order to store this table of comparisons.

6. circuit test device according to claim 5 is characterized in that, this memory storage is a static RAM.

7. circuit test device according to claim 1 is characterized in that this circuit test device includes a working storage in addition, is coupled to this microprocessor, in order to store this test result.

8. circuit test device according to claim 1 is characterized in that, this circuit test device is a logic tester.

9. circuit test device according to claim 1 is characterized in that, this element to be tested is an integrated circuit.

10. circuit test device according to claim 1 is characterized in that this circuit test device comprises a display module in addition, in order to show the test result of this element to be tested.

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