CN101286535A - pn结MgxZn1-xO薄膜日盲区紫外探测器件 - Google Patents

pn结MgxZn1-xO薄膜日盲区紫外探测器件 Download PDF

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CN101286535A
CN101286535A CNA2008100507839A CN200810050783A CN101286535A CN 101286535 A CN101286535 A CN 101286535A CN A2008100507839 A CNA2008100507839 A CN A2008100507839A CN 200810050783 A CN200810050783 A CN 200810050783A CN 101286535 A CN101286535 A CN 101286535A
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刘全生
张希艳
柏朝晖
王晓春
卢利平
米晓云
王能利
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Changchun University of Science and Technology
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Changchun University of Science and Technology
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Abstract

pn结MgxZn1-xO薄膜日盲区紫外探测器件属于光电探测技术领域。现有技术采用MgxZn1-xO薄膜作为光电转换器件,其光谱响应度有待提高;而虽然pn结MgxZn1-xO薄膜因pn结的雪崩作用而具有很高的转换效率,但只是被用做电光转换器件。本发明采用pn结MgxZn1-xO薄膜,底部电极介于衬底与pn结MgxZn1-xO薄膜之间,偏置电压电极、信号电压电极位于pn结MgxZn1-xO薄膜上表面且相离,偏置电压电极与底部电极为pn结MgxZn1-xO薄膜提供偏置电压,信号电压电极与底部电极将pn结MgxZn1-xO薄膜产生的信号电压输出。该方案应用于200~300nm紫外导弹尾焰探测、紫外告警、化学火焰探测等领域。

Description

pn结MgxZn1-xO薄膜日盲区紫外探测器件
技术领域
本发明涉及一种采用II-VI族宽带隙半导体光电功能材料MgxZn1-xO薄膜制作的日盲区紫外探测器件,属于光电探测技术领域。
背景技术
日盲区(200~300nm)紫外探测避开了太阳这一最强大的自然光源造成的复杂的背景干扰,虚假信号少,能够实现更为精确的紫外探测,应用于导弹尾焰探测、紫外告警、化学火焰探测等领域。
MgxZn1-xO薄膜作为一种半导体光电功能材料能将极微弱的紫外辐射转换成电信号,MgxZn1-xO随着Mg组分含量的变化,其带隙在3.3~7.8eV之间连续变化,对应的波长范围覆盖日盲区,能够实现日盲区紫外光电转换,被用作日盲区紫外探测装置中的光电转换器件。专利号为US 7,132,668B2的一篇题为“基于MgZnO的紫外探测器件”的专利文献公开了一种方案,见图1所示,所述的紫外探测器件由衬底1、缓冲层2、MgxZn1-xO薄膜3以及两个电极4组成,缓冲层2介于衬底1和MgxZn1-xO薄膜3之间,两个电极4相离附着于MgxZn1-xO薄膜3上表面。其衬底1采用c-Al2O3,为了使衬底1与MgxZn1-xO薄膜3晶格匹配,在其间生长缓冲层2,两个电极4为叉指状。该方案MgxZn1-xO薄膜3采用Mg0.34Zn0.66O薄膜,膜厚为0.1~1.0μm,紫外响应波段150~400nm,用0.1μW、308nm紫外光照射,在加于两个电极4之间的偏压为5V的条件下,暗电流约为40nA,光谱响应度高达1200A/W。
在台湾中华大学网站(http://www.mee.chu.edu.tw/)上发表了一篇题为“ZnO系列发光二极管的发光特性”的文章,在其制作的发光二极管的方案中采用了pn结MgxZn1-xO薄膜。通常的MgxZn1-xO为n型,当掺入氮等杂质,则为p型,在n型MgxZn1-xO薄膜与p型MgxZn1-xO薄膜之间形成pn结,构成一个pn结MgxZn1-xO薄膜。由于pn结具有雪崩效应,当为pn结MgxZn1-xO薄膜提供较小的电流,就可以获得较强的发光。该方案利用的是MgxZn1-xO薄膜的电光转换功能。
发明内容
已知技术采用MgxZn1-xO薄膜作为紫外探测器件,尤其采用了叉指状电极,明显提高了150~400nm紫外探测的光谱响应度。已知技术中的pn结MgxZn1-xO薄膜虽然转换效率大幅度提高,但是,该方案利用的是MgxZn1-xO薄膜的电光转换功能。为了进一步提高以MgxZn1-xO薄膜为光电转换器件的紫外探测装置的探测精确性,或者说进一步提高MgxZn1-xO薄膜光电转换器件的光谱响应度,以及使得pn结MgxZn1-xO薄膜的具有雪崩效应的光电转换功能得以在紫外探测领域应用,我们发明了一种pn结MgxZn1-xO薄膜日盲区紫外探测器件。
本发明是这样实现的,见图2所示,pn结MgxZn1-xO薄膜日盲区紫外探测器件由衬底、生长于衬底上的MgxZn1-xO薄膜和为MgxZn1-xO薄膜提供偏置电压的电极组成,其特征在于,MgxZn1-xO薄膜为pn结MgxZn1-xO薄膜5,底部电极6介于衬底7与pn结MgxZn1-xO薄膜5之间,偏置电压电极8、信号电压电极9位于pn结MgxZn1-xO薄膜5上表面且相离,偏置电压电极8与底部电极6为pn结MgxZn1-xO薄膜5提供偏置电压V,信号电压电极9与底部电极6将pn结MgxZn1-xO薄膜5产生的信号电流A输出。
当将pn结MgxZn1-xO薄膜5偏置在接近雪崩的偏压下,如5V,即使λ=200~300nm的光信号hυ微弱,其所激发的少量光生载流子(电子)通过接近雪崩的强场区时,由于碰撞电离而数量倍增,因而得到一个很强的信号电压,作为紫外探测装置中的光电转换器件,其光谱响应度与采用MgxZn1-xO薄膜的方案相比,将至少高一个数量级,并且上升时间和下降时间缩短,响应迅速,光电转换效率显著提高。
附图说明
图1是已知技术基于MgZnO的紫外探测器件结构示意图。图2是本发明pn结MgxZn1-xO薄膜日盲区紫外探测器件结构示意图,该图兼作摘要附图。
具体实施方式
下面具体介绍本发明,见图2所示,pn结MgxZn1-xO薄膜日盲区紫外探测器件由衬底、生长于衬底上的MgxZn1-xO薄膜和为MgxZn1-xO薄膜提供偏置电压的电极组成。衬底7选用ZnO陶瓷或者MgO陶瓷,以与MgxZn1-xO薄膜实现晶格匹配,省去缓冲层,简化器件结构。MgxZn1-xO薄膜为pn结MgxZn1-xO薄膜5。为了将光谱响应范围限定在日盲区紫外波长λ=200~300nm范围,确定x=0.1~0.8。p型MgxZn1-xO薄膜采用掺氮(N)的方式实现。底部电极6介于衬底7与pn结MgxZn1-xO薄膜5之间。偏置电压电极8、信号电压电极9位于pn结MgxZn1-xO薄膜5上表面且相离。偏置电压电极8与底部电极6为pn结MgxZn1-xO薄膜5提供偏置电压V,V=0~10V。信号电压电极9与底部电极6将pn结MgxZn1-xO薄膜5产生的信号电流A输出。底部电极6、偏置电压电极8、信号电压电极9材质为Ag或者In。
现举例说明本发明,为制备日盲区270nm响应的紫外探测器件,衬底为10×10mmZnO陶瓷。底部电极6、偏置电压电极8、信号电压电极9材质为In。偏置电压电极8、信号电压电极9呈条状,宽度为3mm,间距为4mm。在偏置电压电极8与底部电极6之间施加的偏压V=5V。p型MgxZn1-xO薄膜采用掺氮的方式实现。取x=0.4,则获得pn结Mg0.4Zn0.6O薄膜。

Claims (5)

1、一种pn结MgxZn1-xO薄膜日盲区紫外探测器件,由衬底、生长于衬底上的MgxZn1-xO薄膜和为MgxZn1-xO薄膜提供偏置电压的电极组成,其特征在手,MgxZn1-xO薄膜为pn结MgxZn1-xO薄膜(5),底部电极(6)介于衬底(7)与pn结MgxZn1-xO薄膜(5)之间,偏置电压电极(8)、信号电压电极(9)位于pn结MgxZn1-xO薄膜(5)上表面且相离,偏置电压电极(8)与底部电极(6)为pn结MgxZn1-xO薄膜(5)提供偏置电压(V),信号电压电极(9)与底部电极(6)将pn结MgxZn1-xO薄膜(5)产生的信号电流(A)输出。
2、根据权利要求1所述的日盲区紫外探测器件,其特征在于,衬底(7)选用ZnO陶瓷或者MgO陶瓷。
3、根据权利要求1所述的日盲区紫外探测器件,其特征在于,pn结MgxZn1-xO薄膜(5)x=0.1~0.8。
4、根据权利要求1所述的日盲区紫外探测器件,其特征在于,偏置电压(V)为0~10V。
5、根据权利要求1所述的日盲区紫外探测器件,其特征在于,底部电极(6)、偏置电压电极(8)、信号电压电极(9)材质为Ag或者In。
CNA2008100507839A 2008-06-04 2008-06-04 pn结MgxZn1-xO薄膜日盲区紫外探测器件 Pending CN101286535A (zh)

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