CN101216518A - Y wave-guide half-wave voltage test method - Google Patents
Y wave-guide half-wave voltage test method Download PDFInfo
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- CN101216518A CN101216518A CNA2007101737848A CN200710173784A CN101216518A CN 101216518 A CN101216518 A CN 101216518A CN A2007101737848 A CNA2007101737848 A CN A2007101737848A CN 200710173784 A CN200710173784 A CN 200710173784A CN 101216518 A CN101216518 A CN 101216518A
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Abstract
The invention relates to a half-wave voltage measurement method of Y waveguide, which adopts a programmable logic device chip FPGA as a data processing system, wherein a D/A conversion chip can convert periodical digital signals emitted from the FPGA into analog and then transmit to the Y-waveguide through post-amplification, thus modulating a fiber interferometer. An A/D conversion chip can convert analog signals that are outputted by a detected and amplified into digital signals and transmit the digital signals to the FPGA when each clock comes. Through data treatment of the FPGA, the last locked modulation gain value forms a linear relationship with half-wave voltage of the Y waveguide, so that the half-wave voltage values of the current Y waveguide. The invention has the advantages of high integrity of the entire system, full solid-state, good stability, fast and accurate half-wave voltage tracing as the temperature changes, instant achievement of larger integration depth, high half-wave voltage measurement accuracy over 10<-3>, in real-time recording of temperature change curve corresponding thereto, large half-wave voltage measurement range and easy achievement of soft start.
Description
Technical field
The present invention relates to measurement, test class, specifically be a kind of fast and have a half-wave voltage method of testing of the Y waveguide of soft start function, this method can test the Y optical waveguide in whole range of temperature the half-wave voltage value and write down corresponding temperature variation curve, be adapted at all and need test Y waveguide half-wave voltage temperature variation curve or use occasions of Y waveguide to use.
Background technology
Y waveguide claims the lithium niobate integrated light guide again, is the Pockels effect of utilizing electro-optic crystal, and the refractive index that changes waveguide by extra electric field realizes phase modulation (PM).Half-wave voltage characterizes the phase modulation (PM) ability of modulator, is one of most important performance index of Y waveguide.But because variation of temperature, the half-wave voltage value can be drifted about thereupon, and then causes the voltage-phase ratio to change.And some variation of temperature always take place in the occasion of generally using Y waveguide, and the temperature variation curve of testing effectively in the whole temperature range becomes very necessary.Usually lithium niobate integrated light guide producer only provides half-wave voltage value and the waveform slope under the normal temperature, and this is a matched curve, and the half-wave voltage under the actual temperature variation changes the performance that waveform can be understood each temperature spot of device better.And the error signal that the mode of traditional sawtooth wave modulation and pi/2 modulation produces when adopting 2 π being resetted is carried out integration and is accurately found current half-wave voltage value, needs integral process of length like this, and is subjected to the interference of other closed loops easily.Along with the variation of Y waveguide product, the product of various half-wave voltages arises, owing to be subjected to the restriction that the back discharge is pressed, its test specification often was only limited in the very little scope in the past.Usually the half-wave voltage tester can only be tested a Y waveguide after once powering on, then need to re-power after the outage and just can obtain test result after making it stablize closed loop once more if test another Y waveguide, and light source certain decline can occur after closing as a precise part repeatedly lighting in this process, and when a plurality of Y waveguide of test, may need continuous several times switch electricity, this will lose the life-span of whole test system greatly.In present test environment, often adopt single-chip microcomputer or digital signal processor (DSP) to control whole loop as acp chip, in practical operation, find to want to coordinate the unusual difficulty of sequential relationship between the modulation and demodulation, because speed is slower, also can't remove to control more at a high speed A/D modulus conversion chip and D/A analog-digital chip on the one hand.The program executive mode of traditional single-chip microcomputer or DSP all is that order is carried out, can not in a time, handle two things simultaneously, so often will when also not handling a task, interrupt doing another thing, and be subjected to the restriction of maximum operation frequency, determined it can only use under the low speed test environment.
Summary of the invention
The objective of the invention is according to above-mentioned the deficiencies in the prior art part, a kind of half-wave voltage method of testing of Y waveguide is provided, this method adopts programmable logic device (PLD) chip FPGA as data handling system, can test the half-wave voltage change curve under the total temperature condition, bigger half-wave voltage test specification and test result accurately can be provided, and can realize repeatedly measuring and the soft starting mode that need not to cut off the power supply.The program executive mode of FPGA is complete parallel, and all tasks can be carried out together simultaneously, and this to need the situation of high-speed synchronous modulation be richly endowed by nature for resembling the test of Y waveguide half-wave voltage.
The object of the invention realizes being finished by following technical scheme:
A kind of half-wave voltage method of testing of Y waveguide, comprise fibre ring interferometer, A/D modulus conversion chip and D/A analog-digital chip, it is characterized in that this method adopts programmable logic device (PLD) chip FPGA as data handling system, wherein the D/A conversion chip is converted to analog quantity to the periodic digital signal that FPGA provides, give Y waveguide through level amplification later, fibre optic interferometer is modulated, the A/D conversion chip when each clock arrives being that digital quantity is given FPGA after the detector output through the analog signal conversion of having amplified, carry out data processing through FPGA, with linear relationship of half-wave voltage formation of value and the Y waveguide of the modulation gain of locking at last, can obtain current according to this relation by the half-wave voltage value of Y waveguide.
This method communicates the collection that realizes temperature by chip temperature with standard difference 485 serial modes and FPGA, be put into chip temperature and tested Y waveguide in the test environment together, and chip temperature is close to Y waveguide, in whole variation of temperature process real-time temperature value is passed to FPGA, FPGA is presented at temperature value and half-wave voltage value on the liquid crystal display.
Be connected with soft start switch on the chip FPGA, to realize the soft start of whole test system.
Advantage of the present invention is, total system integrated level height, can realize all solid state, good stability, half-wave voltage is followed the tracks of rapidly, accurately when the Y waveguide temperature variation, has just realized the bigger integration degree of depth in moment, finds accurate half-wave voltage value, its precision reaches 10
-3More than, and energy real time record temperature variation curve is corresponding with it, the half-wave voltage test specification is big, can realize soft start, has avoided the degeneration of light source after repeatedly powering on, and has prolonged the serviceable life of instrument.
Description of drawings
Fig. 1 is Y waveguide half-wave voltage test philosophy figure of the present invention;
Fig. 2 is an embodiment of the invention fibre ring interferometer synoptic diagram;
Fig. 3 is the full temperature loop test of an embodiment of the invention Y waveguide half-wave voltage curve map;
Fig. 4 is the full temperature test of embodiment of the invention Y waveguide half-wave voltage matched curve;
Embodiment
Feature of the present invention and other correlated characteristic are described in further detail by embodiment below in conjunction with accompanying drawing, so that technician's of the same trade understanding:
The amplifier that the half-wave voltage method of testing of the described Y waveguide of present embodiment has adopted a fibre ring interferometer and a cover to have accurate analog/digital conversion and big voltage output range constitutes, restart replacement hardware electrifying startup with programmed control, follow the tracks of the variation of Y waveguide half-wave voltage fast with four attitude modulation systems, the collection of temperature is by chip temperature and communicating with standard difference 485 serial modes and FPGA, by the mode of primary module by RS485 all data is sent to host computer.
As shown in Figure 1, the whole test system that present embodiment relates to is made up of light path and circuit two parts, the principle of light path utilization fibre ring interferometer, the light of 1310nm wavelength at first is provided by light source 1, by 2*2 coupling mechanism 2 light is delivered to tested Y waveguide 3, simultaneously the light of being returned by Y waveguide 3 is guided into photo-detector 5.The output branch of Y waveguide 3 is connected in the enough fiber optic loop of length 4, this moment is after adding a modulation signal after being amplified by back discharge road 12 on two input ends of Y waveguide, will in this fibre ring interferometer, produce the interference of light phenomenon, just can detect optical path difference under the corresponding angular velocity under the effect of Sagnac effect at detector 5 ends.The signal of detector 5 outputs is small signals, amplifies by prime small-signal is amplified to suitable size, simultaneously signal is carried out filtering 6, removes the outer noise of band.A/D conversion chip 7 is a digital quantity with analog signal conversion at high speed, FPGA8 is the core of whole digital display circuit, behind the digital quantity that obtains exporting as FPGA8 signal is carried out demodulation by A/D conversion chip 7, two sampled values of semiperiod of being separated by this moment are subtracted each other the gain error amount of the system of providing, in order accurately to carry out digital closed loop, FPGA8 carries out repeatedly integration to this gain error amount, at this moment many noise signals are smoothed, useful signal is extracted in the process of this integration gradually, and the precision of whole test system just has been enhanced several times in this place.The gain error amount has sent auxiliary D/A10 to after having passed through enough integrations, changes the modulation gain of main D/A11 by it.Next cycle carries out integration output to the gain error amount that still occurs after compensation last time again, realize like this Y waveguide half-wave voltage from motion tracking, in case half-wave voltage is along with variation has taken place temperature, total system will find current half-wave voltage value rapidly by closed loop.Why can realize following the tracks of fast most important reason in this method of testing is to have adopted four attitude modulation techniques, this technology has been placed on 2 π/3 with modulation point, 4 π/3,-2 π/3, on the point of-4 π/3 four, can can both detect the gain error amount in each cycle by the system that makes is modulated in these four working points, shorten the required time of closed loop greatly, make the bandwidth of whole test bigger.Traditional pi/2 closed-loop fashion will be by introducing angular velocity, make it when 2 π reset, detect the gain error amount, like this must be after enough number of resets the degree of depth of whole integration could satisfy the requirement of closed loop, introduce angular velocity smaller cause resetting slow or situation that temperature variation is fast under just can not truly reflect current half-wave voltage situation of change.Whole test system has also been introduced the real-time detection of temperature, be put into chip temperature and tested Y waveguide in the test environment together, and chip temperature is close to Y waveguide, in whole variation of temperature process real-time temperature value is passed to FPGA8, FPGA8 is presented at temperature value and half-wave voltage value on the liquid crystal display.By standard difference 485 serial modes 14 these two values are sent to host computer simultaneously.In order to strengthen the half-wave voltage test specification of present embodiment method of testing, the supply voltage on the back discharge road 12 of main D/A is set at ± 15V.In order to realize soft start, avoid wearing out of the degeneration of light source after repeatedly powering on and other elements on FPGA8, to be connected a soft start switch 9, in case press soft start switch 9, whole procedure enters and restarts order, variable initialize in all software modules is also closed whole closed loop at this moment, just can change tested waveguide this moment, after pressing soft start switch 9 once more, just again all registers are decontroled, provided four attitude modulation waveforms driving total system again and enter closed loop once more through program after the time-delay of 10ms.
The performance test and the detection case of present embodiment Y waveguide half-wave voltage method of testing are as follows: tested object is the Y waveguide that domestic certain company produces, recognize that its half-wave voltage value is 3.662V (22 ℃) in particular product performance parameters, the half-wave voltage of (40 ℃～+ 60 ℃) changes in the 0.2V in the whole temperature range.Adopt the present embodiment method, tested integrated light guide is put into high-low temperature chamber, carry out changing (℃ change to-40 ℃ from normal temperature+22 earlier, and then change to+60 ℃, revert to normal temperature at last again) with the temperature changing speed of 3 ℃ of per minutes from-40 ℃ to+60 ℃ temperature cycles.Fig. 3 has shown the full temperature loop test of Y waveguide half-wave voltage curve.We can see the change curve of temperature curve and half-wave voltage simultaneously from curve, and the ordinate on the left side is a temperature, and the right is a half-wave voltage.The variation range of half-wave voltage is from 3.765V to 3.598V, changed 0.167V, half-wave voltage under the normal temperature is 3.666V, the parameter unanimity that fundamental sum producer provides, and can find that from waveform the half-wave voltage of Y waveguide and temperature are negative correlation, the complications of waveform and shake have illustrated that also Y waveguide is not linear fully in the process of temperature variation, can only express with the curve of a match, Fig. 4 is the full temperature test of the half-wave voltage matched curve that utilizes another Y waveguide that the restarting function of instrument records once more, the equation of matched curve can be drawn by software, the slight change that half-wave voltage takes place on each temperature spot can also be found in the waveform.
Principle of the present invention is: by Y waveguide fibre ring interferometer is carried out the modulation of four attitudes, at the detector end light signal is become electric signal, the pectination ripple will appear in this moment, when angular velocity is introduced, the working point is moved, output be one with modulated square wave with frequently square-wave signal.During the change in gain of modulation channels, produce an error signal that is twice in eigenfrequency.Two sampled values of semiperiod of being separated by this moment are subtracted each other the gain error amount of the system of providing, by produce suitable gain closed loop compensate just can offset since Y waveguide because half-wave voltage that temperature variation produced changes, and the closed loop amount after this moment system's closed loop just can obtain accurate half-wave voltage value by converting.System is closed loop constantly, in case temperature variation, the closed loop amount is adapted to the most correct value automatically.In case press soft start switch, whole procedure enters and restarts order, and the variable initialize in all software modules is also closed whole closed loop at this moment; Meanwhile, temperature sensor converts real-time temperature amount to digital quantity and is transferred to primary module by standard difference 485 serial modes, has realized the synchronous acquisition of half-wave voltage and temperature like this.
Claims (3)
1. the half-wave voltage method of testing of a Y waveguide, comprise fibre ring interferometer, A/D modulus conversion chip and D/A analog-digital chip, it is characterized in that this method adopts programmable logic device (PLD) chip FPGA as data handling system, wherein the D/A conversion chip is converted to analog quantity to the periodic digital signal that FPGA provides, give Y waveguide through level amplification later, fibre optic interferometer is modulated, the A/D conversion chip when each clock arrives being that digital quantity is given FPGA after the detector output through the analog signal conversion of having amplified, carry out data processing through FPGA, with linear relationship of half-wave voltage formation of value and the Y waveguide of the modulation gain of locking at last, can obtain current according to this relation by the half-wave voltage value of Y waveguide.
2. the half-wave voltage method of testing of a kind of Y waveguide according to claim 1, it is characterized in that this method communicates the collection that realizes temperature by chip temperature with standard difference 485 serial modes and FPGA, be put into chip temperature and tested Y waveguide in the test environment together, and chip temperature is close to Y waveguide, in whole variation of temperature process real-time temperature value is passed to FPGA, FPGA is presented at temperature value and half-wave voltage value on the liquid crystal display.
3. the half-wave voltage method of testing of a kind of Y waveguide according to claim 1 is characterized in that being connected with soft start switch on the chip FPGA, to realize the soft start of whole test system.
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| CNA2007101737848A CN101216518A (en) | 2007-12-29 | 2007-12-29 | Y wave-guide half-wave voltage test method |
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| CNA2007101737848A CN101216518A (en) | 2007-12-29 | 2007-12-29 | Y wave-guide half-wave voltage test method |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104049162A (en) * | 2014-06-12 | 2014-09-17 | 吉林大学 | Device and method for testing noise tolerance characteristic of driving voltage of waveguide optical switch |
| CN104132798A (en) * | 2014-07-25 | 2014-11-05 | 国家电网公司 | Y-waveguide integrated optics phase modulator modulation factor measurement device and method |
| CN105486962A (en) * | 2016-01-26 | 2016-04-13 | 云南电网有限责任公司电力科学研究院 | Electric light crystal half-wave electric field and corresponding characteristic measuring apparatus and method |
| CN112415791A (en) * | 2020-11-18 | 2021-02-26 | 中国人民解放军战略支援部队航天工程大学 | Method for quickly and accurately selecting optimal modulation point of crystal electro-optic modulation |
| CN115808557A (en) * | 2023-02-03 | 2023-03-17 | 福建玻尔光电科技有限责任公司 | Y waveguide half-wave voltage measurement system and method based on high-stability frequency multiplication filtering |
-
2007
- 2007-12-29 CN CNA2007101737848A patent/CN101216518A/en active Pending
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104049162A (en) * | 2014-06-12 | 2014-09-17 | 吉林大学 | Device and method for testing noise tolerance characteristic of driving voltage of waveguide optical switch |
| CN104049162B (en) * | 2014-06-12 | 2017-02-01 | 吉林大学 | Device and method for testing noise tolerance characteristic of driving voltage of waveguide optical switch |
| CN104132798A (en) * | 2014-07-25 | 2014-11-05 | 国家电网公司 | Y-waveguide integrated optics phase modulator modulation factor measurement device and method |
| CN104132798B (en) * | 2014-07-25 | 2016-09-21 | 国家电网公司 | A kind of Y waveguide integrated optic phase modulator index of modulation measurement apparatus and method |
| CN105486962A (en) * | 2016-01-26 | 2016-04-13 | 云南电网有限责任公司电力科学研究院 | Electric light crystal half-wave electric field and corresponding characteristic measuring apparatus and method |
| CN112415791A (en) * | 2020-11-18 | 2021-02-26 | 中国人民解放军战略支援部队航天工程大学 | Method for quickly and accurately selecting optimal modulation point of crystal electro-optic modulation |
| CN112415791B (en) * | 2020-11-18 | 2023-06-13 | 中国人民解放军战略支援部队航天工程大学 | Method for quickly and accurately selecting optimal modulation point of crystal electro-optic modulation |
| CN115808557A (en) * | 2023-02-03 | 2023-03-17 | 福建玻尔光电科技有限责任公司 | Y waveguide half-wave voltage measurement system and method based on high-stability frequency multiplication filtering |
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