CN101201777A - Test system for capacitance type input mechanism - Google Patents
Test system for capacitance type input mechanism Download PDFInfo
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- CN101201777A CN101201777A CNA2006101678046A CN200610167804A CN101201777A CN 101201777 A CN101201777 A CN 101201777A CN A2006101678046 A CNA2006101678046 A CN A2006101678046A CN 200610167804 A CN200610167804 A CN 200610167804A CN 101201777 A CN101201777 A CN 101201777A
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Abstract
The invention provides a test system of a capacitive input device, which is used for testing the capacitive input device. The test system comprises a single chip, a display module and memory; wherein, the single chip is used for receiving a control signal output by a control module and responding to the control signal for outputting a test signal; the display module can respond to the test signal and display the test information that is corresponding to the test signal; the test information can be recorded in the memory. By adopting the test device provided by the invention, the unit under test can be tested quickly; the operation is simple and the test equipment is simplified.
Description
Technical field
The present invention relates to a kind of switch test device, particularly about a kind of test macro of capacitance type input mechanism.
Background technology
Keyboard be the most frequently used also be topmost input equipment, by keyboard, English alphabet, numeral, punctuation mark etc. can be input in the computing machine, thereby give an order, import data etc. to computing machine.
Conventional keyboard has two kinds of mechanical type button and capacitance keys.The mechanical type keyboard is adopted the earliest structure, the principle of general metalloid touch switch makes contact conducting or disconnection, most of cheap mechanical keyboard adopts the copper sheet spring as resilient material, copper sheet is easy to break, easily follow the string, service time one, long then failure rate raise, and was eliminated substantially now, the substitute is capacitance keyboard.
Capacitance keyboard is based on the keyboard of capacitance-type switch, and principle is to see through the variation that the interelectrode distance of key change produces electric capacity, the temporary transient condition that allows oscillating impulse to pass through that forms.This in theory switch is contactless contactless, and rate of wear is minimum even can ignore, and does not also have the problem of loose contact, and it is little to have a noise, controls feel easily, can produce high-quality keyboard, but manufacturing process is than complicated in mechanical structure.
Because capacitance keyboard has above-mentioned advantage, and can reduce thickness, increase texture, therefore the trend that replaces conventional keyboard gradually arranged.With mobile computer, design has the button of some periphery inputs mostly, for example controls the operation push-button of multimedia, and if these buttons can improve the texture of mobile computer integral body with capacitance keyboard.
And the convenience in order to produce, can above-mentioned button is produced in modular mode, yet problem be, though modular mode production and assembly are convenient, but but very not convenient in test.Because this device is a periphery of computing machine, therefore when test, must design class can test like the tool of computing machine or with area of computer aided, so not only increase testing cost, also increase the degree of difficulty in the test.
Summary of the invention
In view of this, the object of the present invention is to provide a kind of proving installation of capacitance type input mechanism, capacitance keyboard adopts modular mode to produce the test difficulty that is caused in the prior art to solve, the problem that testing cost is high.
For achieving the above object, the present invention proposes a kind of test macro of capacitance type input mechanism, in order to test a capacitance type input mechanism, this input media has a more than one capacitance-type switch and a control module at least, this control module receives a switching signal of this capacitance-type switch, wherein, this proving installation includes:
One single-chip in order to receiving a control signal of this control module output, and responds this control signal to export a test signal;
One display module shows a detecting information corresponding to this test signal by the control of this single-chip to respond this test signal; And
One internal memory is controlled to store this detecting information corresponding to this test signal by this single-chip.
The test macro of above-mentioned capacitance type input mechanism wherein, more includes a bus, in order to connect this control module and this single-chip.
The test macro of above-mentioned capacitance type input mechanism, wherein, this bus is an internal integrate circuit bus.
The test macro of above-mentioned capacitance type input mechanism, wherein, this input media more includes an indicating module, is controlled to show the on off state corresponding to this capacitance-type switch by this control module.
The test macro of above-mentioned capacitance type input mechanism, wherein, this display module is made up of more than one light emitting diode.
Proving installation provided by the present invention can be tested determinand fast, operates simple and easyly, and can simplify testing apparatus, economizes testing cost, need not to use a computer as Test Host, can save the computer booting time when the test beginning.
Above about content of the present invention explanation and the explanation of following embodiment in order to demonstration with explain spirit of the present invention and principle, and provide claim of the present invention further to explain.
Description of drawings
Fig. 1 is the system block diagrams of capacitance switch proving installation provided by the present invention;
Fig. 2 is the Application Example synoptic diagram with capacitance switch.
Wherein, Reference numeral:
100 input medias, 110 capacitance-type switchs
120 control modules, 130 indicating modules
110a first sensor 110b second sensor
110c the 3rd sensor 110d four-sensor
140 buses, 210 single-chips
220 display modules, 230 internal memories
The 111a first input field 111b second input field
111c the 3rd input field
Embodiment
With reference to figure 1, be the system block diagrams of the test macro of capacitance type input mechanism provided by the present invention.Capacitance switch shown in the figure is in order to test an input media 100, and input media 100 has a more than one capacitance-type switch 110 and a control module 120 at least.Control module 120 is in order to the state of supervision capacitance-type switch 110, and reception is corresponding to a switching signal of the on off state of capacitance-type switch 110.Input media 100 more can include an indicating module 130, is controlled to show the on off state corresponding to capacitance-type switch 110 by control module 120.
In an exemplary embodiment, capacitance-type switch 110 includes a plurality of sensors, for example be respectively first sensor 110a, the second sensor 110b, the 3rd sensor 110c and four-sensor 110d, it constitutes a touch-control sensing district, and wherein the position of sensor can be arranged in according to the situation of reality.In addition, number of sensors is not in order to limit applicable number of sensors only for illustrating in the present embodiment.
In an exemplary embodiment, indicating module 130 is made up of more than one light emitting diode.
Proving installation 200 provided by the present invention is made up of a single-chip 210, display module 220 and internal memory 230.
When the on off state of the capacitance-type switch 110 that control module 120 is monitored changed, control module 120 can be sent corresponding control signal.210 of single-chips are in order to the control signal that receives control module 120 and export a test signal, and this test signal is promptly represented the test result of input media 100.Display module 220 shows detecting information corresponding to test signal by single-chip 210 control with the response test signal.For the result of test, can be by an internal memory 230 records, it is controlled to store the detecting information corresponding to test signal by single-chip 210.Internal memory 230 can be selected the random access memory of temporary transient storage data for use, but the hard drives of perhaps permanent storage data.
The embodiment of this input media 100, with reference to figure 2, for being applied to the capacitance type input mechanism of mobile computer, as shown in the figure, this input media has the first input field 111a, the second input field 111b, the 3rd input field 111c in order to the size of control volume, and first input field 111a representative is loud with the volume adjustment, second input field 111b representative is adjusted little sound with volume, and the 3rd input field 111c representative is quiet.When operation, the user only need touch corresponding input field, can make computing machine carry out corresponding operation.
The process of test below is described.Because in fact input media 100 can be designed to the form of a module, so that therefore whether assembling and manufacturing also can only be tested this module and can operate normally when producing.Therefore, in one embodiment, the proving installation 200 that is provided among Fig. 1 can be arranged in the tool, test for production line.
When testing, input media 100 as in the tool with proving installation 200, because input media 100 has a bus 140, is connected with proving installation 200 by this bus 140.Then, touch capacitor type switch 110, so that capacitance-type switch produces the variation of on off state, when control module 120 detected this switch change, exportable control signal was in order to do the state that makes indicating module 130 indications corresponding to switch.For example, be example with the embodiment of Fig. 2, when the touching first input field 111a, light corresponding to the pilot lamp of this state.Control module 120 is also given single-chip 210 with control signal, and when capacitance-type switch 110 normal operations, control signal can be expressed as normally, and display module 220 can show " normally " so, and the test result of " normally " is recorded in the internal memory 230.
According to proving installation provided by the present invention, can test determinand fast, operate simple and easyly, and can simplify testing apparatus, economize testing cost, need not to use a computer as Test Host, can save the computer booting time when the test beginning.
Certainly; the present invention also can have other various embodiments; under the situation that does not deviate from spirit of the present invention and essence thereof; being familiar with those of ordinary skill in the art ought can make various corresponding changes and distortion according to the present invention, but these corresponding changes and distortion all should belong to the protection domain of the appended claim of the present invention.
Claims (5)
1. the test macro of a capacitance type input mechanism, in order to test a capacitance type input mechanism, this input media has a more than one capacitance-type switch and a control module at least, and this control module receives a switching signal of this capacitance-type switch, it is characterized in that this proving installation includes:
One single-chip in order to receiving a control signal of this control module output, and responds this control signal to export a test signal;
One display module shows a detecting information corresponding to this test signal by the control of this single-chip to respond this test signal; And
One internal memory is controlled to store this detecting information corresponding to this test signal by this single-chip.
2. the test macro of capacitance type input mechanism according to claim 1 is characterized in that, more includes a bus, in order to connect this control module and this single-chip.
3. the test macro of capacitance type input mechanism according to claim 2 is characterized in that, this bus is an internal integrate circuit bus.
4. the test macro of capacitance type input mechanism according to claim 1 is characterized in that, this input media more includes an indicating module, is controlled to show the on off state corresponding to this capacitance-type switch by this control module.
5. the test macro of capacitance type input mechanism according to claim 4 is characterized in that, this display module is made up of more than one light emitting diode.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA2006101678046A CN101201777A (en) | 2006-12-14 | 2006-12-14 | Test system for capacitance type input mechanism |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNA2006101678046A CN101201777A (en) | 2006-12-14 | 2006-12-14 | Test system for capacitance type input mechanism |
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| Publication Number | Publication Date |
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| CN101201777A true CN101201777A (en) | 2008-06-18 |
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| Application Number | Title | Priority Date | Filing Date |
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| CNA2006101678046A Pending CN101201777A (en) | 2006-12-14 | 2006-12-14 | Test system for capacitance type input mechanism |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102281049A (en) * | 2010-06-10 | 2011-12-14 | 博西华电器（江苏）有限公司 | Calibration system and method of touch key |
| CN102944836A (en) * | 2012-11-23 | 2013-02-27 | 广州市天艺电子有限公司 | Musical keyboard test system |
| CN102967776A (en) * | 2011-08-31 | 2013-03-13 | 金宝电子工业股份有限公司 | Test system and method associated with capacitive sensing touch input device |
| CN106471742A (en) * | 2014-07-16 | 2017-03-01 | Vega格里沙贝两合公司 | There is the field apparatus of input block |
-
2006
- 2006-12-14 CN CNA2006101678046A patent/CN101201777A/en active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102281049A (en) * | 2010-06-10 | 2011-12-14 | 博西华电器（江苏）有限公司 | Calibration system and method of touch key |
| CN102281049B (en) * | 2010-06-10 | 2016-07-13 | 博西华电器（江苏）有限公司 | The calibration system of touch-key and calibration steps |
| CN102967776A (en) * | 2011-08-31 | 2013-03-13 | 金宝电子工业股份有限公司 | Test system and method associated with capacitive sensing touch input device |
| CN102944836A (en) * | 2012-11-23 | 2013-02-27 | 广州市天艺电子有限公司 | Musical keyboard test system |
| CN106471742A (en) * | 2014-07-16 | 2017-03-01 | Vega格里沙贝两合公司 | There is the field apparatus of input block |
| CN106471742B (en) * | 2014-07-16 | 2020-03-24 | Vega格里沙贝两合公司 | Field device with input unit |
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