CN101170643A - Image pickup apparatus and correction method - Google Patents
Image pickup apparatus and correction method Download PDFInfo
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- CN101170643A CN101170643A CNA2007101637498A CN200710163749A CN101170643A CN 101170643 A CN101170643 A CN 101170643A CN A2007101637498 A CNA2007101637498 A CN A2007101637498A CN 200710163749 A CN200710163749 A CN 200710163749A CN 101170643 A CN101170643 A CN 101170643A
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Abstract
The present invention provides a camera shooting apparatus and a correction method. The image camera shooting apparatus includes an image sensor provided with a plurality of pixels each having a photoelectric converter that receives light from an object and converts the received light to a signal; a semiconductor region to which the signal from the photoelectric converter is transferred; a transfer unit that transfers the signal of the photoelectric converter to the semiconductor region; a readout unit that reads out a signal from the semiconductor region; and a correction unit that corrects a first signal read out from the photoelectric converter, based on a second signal obtained by reading out the signal accumulated in the semiconductor region.
Description
Technical field
The present invention relates to a kind of picture pick-up device and bearing calibration, relate more specifically to a kind of technology that is used for proofreading and correct the output of defect pixel in noise that imageing sensor produces and the imageing sensor at the picture pick-up device that has used imageing sensor.
Background technology
Up to now, the picture pick-up device such as digital camera and video camera is used widely, and these picture pick-up devices use the imageing sensor such as CCD or CMOS.Especially recent years, the number of pixels of imageing sensor increases with the improvement in performance of digital camera.
Although known factor such as temperature can cause these imageing sensors to produce dark current, this dark current also depends on environment for use, exposure period or the like.Therefore, known a kind of technology, it carries out image by the imageing sensor that is right after crested before or after real image is caught operation and catches, and deducts the image (optics picture black) that obtained (for example, referring to TOHKEMY 2003-333435 background technology part) from the image of having caught.Therefore, by from the subject image, deducting the optics picture black, owing to reduced the tiny flaw in the dark current component and the influence of fixed pattern noise, thereby improved picture quality.
A kind of method is disclosed in addition, wherein applied gain, so that after during the solid state image sensor manufacturing, from the optics picture black, extracting fixed pattern noise, the storage fixed pattern noise, and solid state image sensor changes (for example, referring to TOHKEMY 2003-018475) in response to the temperature that is obtained by temperature sensor measurement in the picture pick-up device.Adopt this method,, the subject of catching is carried out image rectification, thereby eliminated the caused side effect of temperature dependency of fixed pattern noise by deducting the fixed pattern noise that has applied gain according to temperature change.
Relate to the treatment for correcting that discloses among the TOHKEMY 2003-333435 that from the optics picture black, deducts operation, can reduce the fixed pattern noise on the screen and the influence of two-dimentional dark current inequality.Yet the imageing sensor that utilizes crested carries out image and catches and can obtain the optics picture black catching with real image in the identical electric charge accumulated phase of operation.Therefore, shutter when catching image discharges time lag to be increased, and when carrying out consecutive image when catching, and the interval between first and second frames increases owing to obtaining the time that the optics picture black spent.Especially under slow shutter speed, may miss the opportunity of shooting.
The method that discloses in TOHKEMY 2003-018475 number attempts to eliminate the influence that temperature change brings in the picture pick-up device, because what measure is not that the temperature of real image transducer and the Temperature Distribution on the screen change and depend on imageing sensor, so can't carry out high-precision correction.
On the other hand, for solid state image sensor, the defect pixel that occurs during known manufacturing is handled is a factor that reduces picture quality and output is reduced.Because eliminating defect pixel fully has difficulties, usually, known neighbor by the use defect pixel carries out interpolation and improves picture quality.
Disclosed a kind of method in known " background technology " such as TOHKEMY 2003-333435, this method is the technology that is used for the signal output of correct defective pixels.At first comprise by under the predetermined condition when solid state image sensor dispatches from the factory exposure solid state image sensor in the standard charge accumulated phase and the output valve obtained is determined defect pixel such as, this method.Information such as the output level about defect pixel that obtain this moment, position are stored, and when carrying out image when catching, based on the stored information of the output level of defect pixel, position etc., use the output level of the neighbor of defect pixel that interpolation is carried out in the output of defect pixel.
Further, proposed following technology and be used for the situation of taking with slow shutter speed.At first, before real image is caught, obtain the optics picture black, will be in or surpass the predetermined output level of exporting and from the optics picture black, extract and store as defect pixel.With respect to the image of catching acquisition by real image the defect pixel that has extracted is proofreaied and correct then.Pixel except the defect pixel that has extracted is carried out so-called black refinement (thinning), from the output level of the respective pixel of catching acquisition by real image, to deduct the output level of pixel in the optics picture black.Even the output level of the defect pixel that produces when taking with respect to slow-speed shutter speed like this increases, also allow to proofread and correct, thereby image deterioration is minimized and can not cause system crash (for example, referring to TOHKEMY 2001-028713).
A kind of technology has also been proposed, the a plurality of correction data sections that comprise the output that is provided for correct defective pixels, and after the optimal data of shooting condition that uses basis such as photosensitivity and electric charge accumulated phase and the selection of the shooting environmental such as temperature is selected, proofread and correct the image of catching.(for example, referring to TOHKEMY 2003-333435).
The output level of some defect pixels cause by dark current and the degree that alters a great deal of the output level of these defect pixels on depend on temperature and electric charge accumulated phase.By the output level of the caused defect pixel of dark current along with dark current increases because of the increase that higher temperature and longer time exposure (slower shutter speed) cause.
When the defect pixel charges accumulated reached the pixel saturation level through the dark current increase, the defect pixel that influenced by above-mentioned dark current can cause following phenomenon.That is to say that the output that surpasses the pixel saturation level of a few percent can leak into neighbor.Therefore, as shown in figure 10, the height that it is unnecessary that the output level of neighbor becomes has formed criss-cross defect pixel zone.In Figure 10, (n n) represents by the caused defect pixel of dark current coordinate, and shows the increase of the output level of the pixel that is adjacent in horizontal and vertical position, that is, show coordinate as the result of electric charge seepage (n-1, n), (n+1, n), (n, n-1) and (n, n+1).
Method according to above-mentioned TOHKEMY 2001-028713 disclosure, has the optics picture black of the charge accumulation time identical to extract defect pixel, so be extended because before the reality shooting, need the time to obtain from beginning to indicate the shutter of making a video recording the reality execution shooting to discharge time lag with actual shooting.Especially must be enough to allow electric charge leak under the situation of neighbor slowly in shutter speed, shutter discharges time lag and becomes very long.Yet, discharge time lag if attempt to shorten shutter, the neighbor of electric charge that can not extract seepage, and can't proofread and correct.
In addition, when attempting adopting such as TOHKEMY 2003-333435 number disclosed bearing calibration to the criss-cross defect pixel zone that dark current as shown in figure 10 causes, then following point can appear.Promptly, because temperature and electric charge accumulated phase are depended in the change of output level, so, all need to keep the information of whether neighbor being proofreaied and correct for each defect pixel under every kind of situation, and the address information of defect pixel, and need be used to store the memory capacity of this data.
In addition, proposed a kind of motion in recent years, it utilizes the signal that has leaked into the unsteady diffusion of cmos sensor (FD) part to calculate saturated output, and has enlarged dynamic range (for example, referring to TOHKEMY 2006-222762).Yet, this method does not mean that and is used to prevent deterioration in image quality, because can not judgement having leaked into the signal of FD part is by saturated the causing that light caused from subject, still by noise-like signal caused saturated causing such as the dark current of defect pixel.
Summary of the invention
The present invention has considered above-mentioned situation, can proofread and correct uneven dark output on the screen, inhomogeneous such as the dark current in the picture signal, and under the saturated situation of defect pixel, need not to increase just image signal correction correctly of any special equipment, and it is shorter to keep shutter to discharge time lag.
According to the present invention, by providing a kind of picture pick-up device to reach above-mentioned target, this picture pick-up device comprises: imageing sensor, wherein be provided with a plurality of pixels, each pixel has: optical-electrical converter, and the light that receives from subject also is converted to signal with received light, semiconductor regions, reception is from the signal of described optical-electrical converter transmission, and transmission unit will be transferred to described semiconductor regions by the signal that described optical-electrical converter was changed; And sensing element, from described semiconductor regions read output signal; And correcting unit, based on by being accumulated in the secondary signal that the signal in the described semiconductor regions obtains during the signal accumulation that reads out in described optical-electrical converter, proofread and correct first signal of reading from described optical-electrical converter.
According to the present invention, also by a kind of bearing calibration is provided, be used to proofread and correct the signal that obtains from the imageing sensor that is provided with a plurality of pixels, each pixel has: optical-electrical converter receives and is converted to signal from the light of subject and with the light that is received; Semiconductor regions receives from the signal of described optical-electrical converter transmission; Transmission unit, the signal that described optical-electrical converter was changed is transferred to described semiconductor regions; And sensing element, from described semiconductor regions read output signal, described method comprises: first reading step, read first signal from described optical-electrical converter; Second reading step was read the secondary signal that is accumulated in the described semiconductor regions before described first reading step; And aligning step, proofread and correct described first signal based on described secondary signal.
According to the present invention, also by a kind of picture pick-up device is provided, comprise: imageing sensor, wherein be provided with a plurality of pixels, each pixel has: optical-electrical converter, and the light that receives from subject also is converted to signal with received light, semiconductor regions, reception is from the signal of described optical-electrical converter transmission, and transmission unit will be transferred to described semiconductor regions by the signal that described optical-electrical converter was changed; And sensing element, from described semiconductor regions read output signal; The saturation charge computing unit based on first signal that obtains by the signal that flows to described semiconductor regions during the signal accumulation that reads out in described optical-electrical converter, calculates the saturation charge of described optical-electrical converter; And correcting unit, result of calculation according to described saturation charge computing unit, the secondary signal that correction is read from the optical-electrical converter of following pixel, described pixel with comprise that to be calculated the pixel of optical-electrical converter of saturation charge by described saturation charge unit adjacent.
According to the present invention, also by a kind of bearing calibration is provided, be used to proofread and correct the signal that obtains from the imageing sensor that is provided with a plurality of pixels, each pixel has: optical-electrical converter receives and is converted to signal from object light and with the light that is received; Semiconductor regions receives from the signal of described optical-electrical converter transmission; Transmission unit, the signal that described optical-electrical converter was changed is transferred to described semiconductor regions; And sensing element, from described semiconductor regions read output signal, comprise: the saturation charge calculation procedure, based on first signal that obtains by the signal that flows to described semiconductor regions during the signal accumulation that reads out in described optical-electrical converter, calculate the saturation charge of described optical-electrical converter; And aligning step, result of calculation according to described saturation charge calculation procedure, the secondary signal that correction is read from the optical-electrical converter of following pixel, described pixel with comprise that to be calculated the pixel of optical-electrical converter of saturation charge by saturated described quantity of electric charge step adjacent.
With reference to the accompanying drawings, more features of the present invention will display from the explanation of following exemplary embodiments.
Description of drawings
Fig. 1 is the block diagram that illustrates according to the picture pick-up device structure of first embodiment of the invention;
Fig. 2 is the circuit diagram that mainly illustrates according to the configuration of a pixel of the imageing sensor of the first embodiment of the present invention;
(A) among Fig. 3 and (B) cutaway view of expressing according to the summary of the electromotive force of the pixel of the first embodiment of the present invention and element is shown;
Fig. 4 is the sequential chart that is used to drive imageing sensor according to the first embodiment of the present invention;
Fig. 5 is the flow chart that is used to illustrate according to the processing of the noise correction signal of the first embodiment of the present invention;
Fig. 6 is the flow chart that is used to illustrate the processing of noise correction signal according to a second embodiment of the present invention;
Fig. 7 is the sequential chart that is used for driving at the electric charge accumulation period imageing sensor according to a second embodiment of the present invention;
Fig. 8 is the flow chart that is used to illustrate according to the correct defective pixels Signal Processing of third embodiment of the invention;
Fig. 9 is the flow chart that is used to illustrate according to the correct defective pixels Signal Processing of fourth embodiment of the invention; And
Figure 10 illustrates because of the saturated of defect pixel and causes electric charge to leak into the example of neighbor.
Embodiment
To describe the preferred embodiments of the present invention with reference to the accompanying drawings in detail.
First embodiment
Fig. 1 is the block diagram as the illustrative configurations of the digital still camera of picture pick-up device that illustrates according to first embodiment of the invention.
In Fig. 1, Reference numeral 51 is illustrated in the camera lens that forms subject optics image on the imageing sensor 55, and Reference numeral 52 expressions are used to regulate the aperture that passes through the light quantity of camera lens 51.Aperture 52 is by 63 controls of aperture controller.Reference numeral 54 expression has limited the spatial frequency that incides the light on the imageing sensor 55 or the filter of wavelength, and Reference numeral 55 expressions will be the imageing sensor of electronic image signal through the subject optics image transitions of camera lens 51 formation.Reference numeral 56 expressions are to carrying out simulation process and analog-to-digital AFE (analog front end) from the picture signal of imageing sensor 55 outputs.AFE (analog front end) 56 is formed by the amplifier 58 of correlated-double-sampling (CDS) circuit 57, conditioning signal gain and with the analog to digital converter 59 of analog signal digital.Reference numeral 60 expression digital signal processors, it carries out various types of corrections to the DID from AFE (analog front end) 56 outputs, and compressing image data.
Fig. 2 shows the circuit of a pixel of the imageing sensor 55 of the configuration with cmos sensor shown here.
In Fig. 2, Reference numeral 1 expression is connected to the photodiode (PD) of diffusion (FD) part 3 of floating via change over switch 2.FD part 3 is connected to power line 5, and power line 5 provides resetting voltage via reset switch 4.FD part 3 forms the grid of field-effect transistor (FET) 6.The drain electrode of FET6 is connected to assigned voltage, and source electrode is connected to vertical output line 8 via selector switch 7.Said elements constitutes pixel 9.Have the formation that a plurality of pixels of similar configuration are embarked on journey along vertical output line 8, constituting row 10, and area transducer is made of a plurality of row with analog structure of horizontal arrangement.
Be connected to each vertical output line 8 to constant-current supply 11 of major general, and the voltage of vertical output line 8 is determined by the electric charge of the FD part 3 of selected pixel.Capacitor 12 is connected to each vertical output line 8 as the memory that is used for interim storage pixel output via switch 13, and capacitor 14 connects as being used for storing the memory of saturated output via switch 15 temporarily.Capacitor 12 and 14 is connected respectively to sense wire 16 via switch 13 and 15, and reads the pixel output that is stored in capacitor 12 and 14 via output amplifier 17 from sense wire 16.
Fig. 3 (A) is the schematic diagram that the cross-sectional configurations of the PD1 of pixel 9 shown in Figure 2 and FD part 3 is shown, and Fig. 3 (B) illustrates the summary of the electromotive force of element when saturated and expresses.Note, will be attached with identical Reference numeral corresponding to the same composition element of Fig. 2.
In Fig. 3 (A), the diffusion region of Reference numeral 21 expression PD1, the gate electrode of Reference numeral 22 expression change over switches 2, Reference numeral 3 expressions are floated and are spread (FD) partly (semi conductor diffusion zone territory), photomask opening on the Reference numeral 19 expression PD1, and the photomask on the Reference numeral 18 expression FD parts 3.Reference numeral 8 expression vertical signal lines, and Reference numeral 5 expression power lines.Shown in Fig. 3 (B), when saturated, the electric charge that produces among the PD1 leaks into FD part 3.
Fig. 4 illustrates the sequential chart from the different pulse output of timing generator 65.With reference to figure 4, will be described below operation.
When selecting specific pixel, be set to high level by strobe pulse φ SEL, can open the selector switch 7 of pixel to be selected.Because FD part 3 is made up of the diffusion region that is similar to as the PD1 of public optical-electrical converter, so the electron hole pair that this moment, stray light and the heat by incident produced composition light signal electric charge.Therefore, FD part 3 is equivalent to carry out work as optical-electrical converter.Therefore in FD part 3, produce signal charge by a little light radiation that device and circuit produced in the picture pick-up device and heat, and get up by these caused by factors electric charge (noise component(s)) accumulations.Therefore, preferably, FD part 3 constitutes the characteristic that has near the characteristic that is used to produce electric charge when the PD1 crested.
Therefore before the electric charge of PD1 transmits via transmitting switch 2, by FET6 the electric charge (noise component(s)) that is accumulated in the FD part 3 is carried out the charge/voltage conversion, and will output to vertical output line 8 corresponding to the voltage of electric charge.Be set to high level by memory pulse φ M2, and in this state switch 15 be connected to vertical output line 8, will be stored in the capacitor 14 temporarily corresponding to the voltage of the electric charge of the noise component(s) of having read.
Then, be set to high level, FD part 3 reset to the resetting voltage of regulation, and open reset switch 4 by reset pulse φ RES.Then, be set to high level with unlatching transmitting switch 2 by transmission pulse φ TX, and the electric charge (optical component) that will be accumulated among the PD1 reads into FD part 3.The electric charge that reads into the optical component of FD part 3 carries out the charge/voltage conversion by FET6, and the voltage of correspondence is outputed to vertical output line 8.Be set to high level by memory pulse φ M1, and in this state switch 13 be connected to vertical output line 8, will be stored in the capacitor 12 temporarily corresponding to the voltage of the electric charge of optical component.
Then, be set to high level, switch 13 is connected to sense wire 16, will output to sense wire 16 corresponding to the interim stored voltage of the electric charge of optical component, and export as light signal via output amplifier 17 by read pulse φ R1.Further, be set to high level by read pulse φ R2 then, switch 15 is connected to sense wire 16, will output to sense wire 16 corresponding to the voltage of the electric charge of noise component(s), and export as noise signal via output amplifier 17.
Therefore, to be converted to numerical data from the optics and the noise signal of imageing sensor 55 output by analog to digital converter 59, then with numerical data as being sent to digital signal processor 60 among Fig. 1 based on the optics output image of light signal with based on illustrate noise level and the regional noise image of noise signal.
Handle below with reference to the dark output calibration that the digital signal processor 60 among flowchart text first embodiment of Fig. 5 carries out.
Because the picture element flaw difference that each pixel produces between FD part 3 and the PD1, handle so carry out intermediate value in 5 * 5 pixel coverages on noise image in step S101, the noise of having eliminated each pixel also only extracts by the screen inequality in the caused noise image of dark output.Then, in step S102, the photosensitivity difference and the strength difference that have when between PD1 and the FD part 3 dark current taking place in order to proofread and correct carry out gain calibration.Because FD part 3 for PD1 photosensitivity more and have more dark current incident, so the level of noise image reduces.Then, in step S103, from the optics output image, deduct the noise image of having proofreaied and correct, finish dark output calibration.
According to above-mentioned processing, because under the situation that does not obtain the optics picture black, proofread and correct, so obtain real image usually and two required electric charge accumulated phase of optics picture black can be reduced to an electric charge accumulated phase.
When will being described below, carries out in digital still camera sensing image the operation of above-mentioned treatment for correcting.
Mains switch open that (not shown) has been opened the power supply of main power source, control system and such as the power supply of the shooting interlock circuit of AFE (analog front end) 56.
Then, in order to control exposure, system's Controlled CPU 61 is opened aperture 52 fully via aperture controller 63.After via AFE (analog front end) 56 conversions, the picture signal by imageing sensor 55 outputs in this state is imported into digital signal processor 60.System's Controlled CPU 61 is carried out exposure calculating based on these data.Utilize the result of this photometry to judge brightness, and system's Controlled CPU 61 is according to the brilliance control aperture of judging 52.
Then, from the picture signal of imageing sensor 55 outputs, extract high fdrequency component, and calculate acutance by system's Controlled CPU 61.Then, after driving camera lens 51, calculate acutance once more, and judge whether subject is focused on (whether acutance maximizes).If do not conclude subject is focused on, after driving camera lens 51, calculate acutance once more so.Repeat this control till the acutance maximization, and after the acutance maximization (after confirming subject to be focused on), adopt the electronic shutter function of imageing sensor 55 to start and finish above-mentioned actual exposure.Then, sequentially export optics output image and noise image.The picture signal of imageing sensor 55 output carries out being digitized after noise reduction, amplification and the analog-to-digital conversion such as the correlated-double-sampling that is undertaken by AFE (analog front end) 56.
After carrying out above-mentioned processing, digital image signal is write video memory 62 by system's Controlled CPU 61 by digital signal processor 60.Then, under the control of system's Controlled CPU 61, be stored in view data in the video memory 62 and be recorded in via record interface 68 on the removable recording medium 69 such as semiconductor memory.The view data of having caught in addition, also is presented on the display unit 67 such as LCD via display interface device 66.The view data of having caught alternatively, can be directly inputted to computer 71 grades and carry out image processing via external interface 70.
Second embodiment
Next the second embodiment of the present invention will be described.
As situation about occurring at defect pixel, under the situation of dark current greater than the dark current that produces at PD1 that FD part 3 produces, when taking with slow-speed shutter speed, the electric charge of noise component(s) will cause that FD part 3 is saturated, and this becomes a problem.In a second embodiment explanation is used for ways of addressing this issue.
Note, because the configuration of basic device is similar to the basic device of the explanation configuration referring to figs. 1 to 3 among first embodiment, so will omit explanation the basic device configuration.
Fig. 6 is the flow chart that is used to illustrate according to the processing of the noise correction signal of second embodiment.In a second embodiment, in the electric charge accumulated phase, repeatedly from FD part 3, read the electric charge of noise component(s) at interval with official hour, then that it is added together.
At first, after whole screens of reset image transducer 55, in step S201, judge whether to reach the time (whether having passed through the official hour section) of reading noise image, if reached the time of reading noise image, handle so and be advanced into step S202, read noise image therein.
Figure 7 illustrates drive imageing sensor 55 this moment in step S202 sequential chart.
When selecting specific pixel, be set to high level by strobe pulse φ SEL, can open the selector switch 7 of pixel to be selected.Because FD part 3 is made up of the diffusion region that is similar to PD1, this diffusion region is conventional optical-electrical converter, by the stray light of above-mentioned incident and the electron hole pair of heat generation composition light signal electric charge.Therefore, FD part 3 is equivalent to carry out work as optical-electrical converter.Therefore, a spot of light emission and the heat that produce by device in the picture pick-up device and circuit produce signal charge in FD part 3, and the electric charge (noise component(s)) that these factors cause is accumulated.
Therefore before the electric charge of PD1 transmits via transmitting switch 2, by FET6 the electric charge (noise component(s)) that is accumulated in the FD part 3 is carried out the charge/voltage conversion, and will output to vertical output line 8 corresponding to the voltage of this electric charge.By memory pulse φ M2 is set is high level, and in this state switch 15 is connected to vertical output line 8, is temporarily stored in the capacitor 14 corresponding to the voltage of the electric charge of the noise component(s) of reading.
Then, be high level by reset pulse φ RES is set, FD part 3 is reset to the resetting voltage of regulation, open reset switch 4.Then, be high level by read pulse φ R2 is set, switch 15 is connected to sense wire 16, and will outputs to sense wire 16 corresponding to the voltage of the electric charge of noise component(s), export as noise signal via output amplifier 17 then.
Therefore, be converted to numerical data by analog to digital converter 59, and numerical data is sent to digital signal processor 60 among Fig. 1 as noise level and regional noise image are shown from the noise signal of imageing sensor 55 output.
When in step S202 in a manner described during the output noise image, because still there is not noise image to need to add, so if this is to read for the first time noise image, in step S203, noise image is stored in so in the digital signal processor 60 and does not further handle.This processing is advanced into step S204 then, checks in this step whether the electric charge accumulated phase that is provided with finishes.If the electric charge accumulated phase does not finish, this processing turns back to step S201 so, and having waited for official hour section (up to judging "Yes" at step S201) afterwards, as described in reference to figure 7, reads noise image in step S202.In step S203, the noise image that will read before second circulation is added in the noise image that is stored in the digital signal processor 60.After the plus noise image, handle being advanced into step S204.At this moment,, handle so and be advanced into step S205 if the electric charge accumulated phase finishes, if but the electric charge accumulated phase does not finish, handle turning back to step S201 and repeating above-mentioned processing so.
In step S205, read the electric charge accumulated phase and finish electric charge afterwards.Because this process is similar to the described sequential chart of Fig. 4 among first embodiment, in the explanation of this omission to it.Yet, in a second embodiment, because in step S202 and step S203, read noise image at interval, so the electric charge accumulated phase of noise image is different from the electric charge accumulated phase of the optics output image of reading in step S205 with official hour.
Therefore, in the step S205 of second embodiment, the noise image of having read is added in the noise image that is stored in the digital signal processor 60, to obtain last noise image.Based on optics output image and thus obtained noise image, will in digital signal processor 60, carry out noise compensation operation with reference to figure 5 explanations.
According to above-mentioned second embodiment, because in the electric charge accumulated phase, repeatedly read noise signal, take place saturatedly so can prevent to have the electric charge of noise component(s) in the FD part 3 of long electric charge accumulated phase, will take place saturated during intensity that the dark current intensity that produces in FD part 3 produces in greater than PD1.
Notice that in the present embodiment the signal path by being used in the output noise signal is identical with the signal path that is used to export light signal, reduced easy sensitivity, thereby can obtain fabulous picture signal such as the noise of extraneous noise.
In addition, although in the present embodiment noise image has been carried out the intermediate value processing, in not having the transducer of defect pixel, needn't carry out intermediate value and handle.In this case, can proofread and correct the fixed pattern noise that each pixel produces by the noise image that only carried out gain calibration being subtracted handle.
Handle although in 5 * 5 pixel coverages, carry out intermediate value, can change in order to obtain this scope of better pictures.
The 3rd embodiment
Below the third embodiment of the present invention will be described.
Notice that because the configuration of the basic device among the 3rd embodiment is similar to the configuration of the basic device shown in Fig. 1 to 3 among first embodiment, and the driving sequential of imageing sensor is similar to driving sequential shown in Figure 4, so omitted the explanation to these contents.
The result's of the conduct pulsed drive shown in Figure 4 of imageing sensor 55 output optics and noise signal are converted to numerical data by analog to digital converter 59, then with numerical data as based on the optics output image of light signal with send to the digital signal processor 60 of Fig. 1 based on noise signal noise level and regional noise image being shown.
Below with reference to the treatment for correcting of in the digital signal processor 60 among flowchart text the 3rd embodiment of Fig. 8 the defect pixel signal being carried out.
At first, in step S11, from noise image, detect saturated pixel, judge further whether adjacent pixels is saturated.Detect saturated pixel in such a way: each noise signal value of noise image and the preset value of this noise image or the average signal value of this noise image are compared, and the noise signal value is judged as saturated pixel greater than the pixel of preset value or average signal value.Yet, the invention is not restricted to this detection saturated pixel method, also can utilize known method to detect saturated pixel.
If neighbor is saturated, so because subject becomes clear, to produce pixel saturated so judge, EP (end of program) and need not further processing.This is because spread through camera lens 51 with such as optical filter 54 backs of low pass filter from the light of subject, can not be a pixel by the size from the caused zone of saturation of light of subject like this.What on the contrary, the dark current of defect pixel caused saturatedly is isolated to single pixel.Therefore, can by the size of zone of saturation judge saturated be cause by defect pixel or cause by light from subject.
If judging saturated pixel in step S11 isolates, or in other words, saturated pixel is non-conterminous, handle so and be advanced into step S12, the noise signal level that deducts each saturated pixel in this step from the light signal adjacent to the pixel of saturated pixel the optics output image multiply by the signal level of regulation ratio " a ".When making the dark current of defect pixel saturated by long-term charge accumulation, regulation ratio " a " equals to leak into the ratio of the supersaturation output level of neighbor.Under the situation that has a saturated pixel, it is caused by the dark current of defect pixel can judging saturated, rather than caused, and will have significant difference between the signal level of the signal level of supposition defect pixel and neighbor by the brightness of subject.This correction can obtain the actual optical signal adjacent to the pixel of defect pixel, and can prevent deterioration in image quality.
Then, handle to be advanced into step S13, the saturated pixel of judging isolation in this step is a defect pixel, and utilizes the light signal of the neighbor of same color that the light signal of defect pixel in the optics output image is carried out interpolation, and after this, processing finishes.
Like this can be under the saturated situation of defect pixel, the light signal of defect pixel and neighbor is carried out suitable correction.
Note, judge in the step S11 of Fig. 8 in the 3rd embodiment whether saturated pixel is defect pixel, and this judgement can be used for dynamic range expanded.For example, if saturated pixel is not a defect pixel, can come dynamic range expanded by the noise signal that adds saturated pixel to light signal so.
The 4th embodiment
The fourth embodiment of the present invention is described below with reference to the accompanying drawings.
Notice that because the configuration of the basic device among the 4th embodiment is similar to the configuration of the basic device shown in Fig. 1 to 3 among first embodiment, and the driving sequential of imageing sensor is similar to driving sequential shown in Figure 4, so omitted the explanation to these contents.
Fig. 9 is the flow chart that is used for illustrating the processing of proofreading and correct by 60 pairs of defect pixel signals of digital signal processor of Fig. 1 in fourth embodiment of the invention.
At first, in step S21,, read the address that is pre-stored in the defect pixel in the memory (not shown) such as disclosed as TOHKEMY 2003-333435.Yet, in the 4th embodiment,, there is no need to store output level so if stored the address of defect pixel.Then, handle and be advanced into step S22, basis judges corresponding to the level of the noise signal of the pixel in the noise image of the address of the defect pixel of being read whether defect pixel is saturated in this step.Note, can utilize with similar methods when detecting saturated pixel among the step S11 of Fig. 8 and judge.
If defect pixel unsaturation in step S22, judging does not so have saturation signal to leak in the neighbor, and processing is advanced into step S24 and need not to proofread and correct neighbor.If judge defect pixel in step S22 is saturated pixel, handle so and be advanced into step S23, the noise signal level that deducts each defect pixel in this step from the light signal adjacent to the pixel of defect pixel the optics output image multiply by the signal level of regulation ratio " a ".When making the dark current of defect pixel saturated by long-term charge accumulation, regulation ratio " a " equals to leak into the ratio of the supersaturation output level of neighbor.If defect pixel is saturated, suppose between the signal level of the signal level of defect pixel and neighbor to have significant difference.This correction can obtain the actual optical signal adjacent to the pixel of saturated pixel, and can prevent deterioration in image quality.
Then, processing procedure enters step S24, utilizes the light signal of the neighbor of same color that the light signal of defect pixel in the optics output image is carried out interpolation in this step, and after this, processing finishes.
Though saturation signal may change according to imaging environment is different to the value of neighbor seepage, will it be assumed to constant.
Other embodiment
Notice that the present invention can be applied to a kind of by the system of multiple device (for example, picture pick-up device, interface arrangement, computer etc.) composition or the equipment of being made up of single assembly (for example, picture pick-up device).If be made of a plurality of equipment, the optical output signal of picture pick-up device AFE (analog front end) 56 output and noise signal need not just further to handle and can output to outer computer 71 so, and externally carry out Fig. 5,6 in the computer 71,8 and 9 processing.
In addition,, utilize the computer of this system or equipment that the program code that is provided is provided, carry out this program code then, can realize the present invention by directly or indirectly providing the software program of realizing the foregoing description function to system or equipment.In this case, as long as this system or equipment has the function of this program, the mode of realization just needn't depend on program.
Therefore, because function of the present invention is by computer realization, so the program code that is installed in the computer also can be realized the present invention.In other words, claim of the present invention has also covered in order to realize the computer program of function of the present invention.
In this case, as long as this system or equipment has the function of this program, just can be with such as object code, carry out this program by the program of interpreter execution or the arbitrary form that offers the script data of operating system.
Can be used for providing the example of the storage medium of this program to be: floppy disk, hard disk, CD, magneto optical disk, MO dish, CD-ROM, CD-R, CD-RW, tape, Nonvolatile memory card, ROM and DVD (DVD-ROM, DVD-R).
As the method that is used to provide program, client computer can use the browser of client computer to be connected to network address on the internet, and the automatic installation compressed file of computer program of the present invention or this program can be downloaded on the recording medium such as hard disk.Further, can be divided into a plurality of files and provide program of the present invention by the program code that will form program from the mode of different these files of website, download.In other words, WWW (World Wide Web (WWW)) server of downloading by computer realization functional programs file of the present invention to the multi-user is also covered by claim of the present invention.
Also might on such as the storage medium of CD-ROM, encrypt and store program of the present invention, distribute this storage medium to the user, the user who allows to satisfy some necessary condition via the internet from the website download decryption key information, and because program is installed in the subscriber computer, so allow these users encrypted program to be decrypted by the use key information.
Realize the situation according to the above-mentioned functions of these embodiment except that carry out the program read by computer, operation operating system on computers etc. can be carried out the processing of all or part of reality, so that can handle the function that realizes the foregoing description by this.
In addition, when the program of reading from storage medium is written in the function expansion card that inserts the computer or be written in the memory in the functional expansion unit that is connected to computer, be installed in C PU on function expansion card or the functional expansion unit etc. and can carry out the processing of all or part of reality, so that can handle the function that realizes the foregoing description by this.
Although the present invention is illustrated with reference to exemplary embodiments, should be appreciated that the scope of the invention is not limited to disclosed exemplary embodiments.The scope of claims will meet the wideest explanation, so that comprise all modifications, equivalent structure and equivalent function.
Claims (22)
1. picture pick-up device comprises:
Imageing sensor wherein is provided with a plurality of pixels, and each pixel has:
Optical-electrical converter, the light that receives from subject also is converted to signal with received light,
Semiconductor regions receives from the signal of described optical-electrical converter transmission,
Transmission unit will be transferred to described semiconductor regions by the signal that described optical-electrical converter was changed, and
Sensing element is from described semiconductor regions read output signal; And
Correcting unit based on by being accumulated in the secondary signal that the signal in the described semiconductor regions obtains during the signal accumulation that reads out in described optical-electrical converter, is proofreaied and correct first signal of reading from described optical-electrical converter.
2. picture pick-up device according to claim 1 is characterized in that
During the signal accumulation of described sensing element in described optical-electrical converter, repeatedly read out in the signal of accumulating in the described semiconductor regions, and
The signal that described correcting unit is repeatedly read by addition calculates described secondary signal.
3. picture pick-up device according to claim 1 and 2 is characterized in that, described correcting unit deducts the signal that becomes predetermined ratio with described secondary signal from described first signal.
4. picture pick-up device according to claim 1 and 2 also comprises reset unit, the signal of the described semiconductor regions that is used to reset,
Wherein said first signal is after the signal of described semiconductor regions has resetted, the signal of being read from described optical-electrical converter by described transmission unit and described sensing element.
5. picture pick-up device according to claim 1 and 2 is characterized in that, described correcting unit carried out intermediate value to described secondary signal before proofreading and correct handles.
6. bearing calibration is used to proofread and correct the signal that obtains from the imageing sensor that is provided with a plurality of pixels, and each pixel has: optical-electrical converter receives and is converted to signal from the light of subject and with the light that is received; Semiconductor regions receives from the signal of described optical-electrical converter transmission; Transmission unit, the signal that described optical-electrical converter was changed is transferred to described semiconductor regions; And sensing element, from described semiconductor regions read output signal, described method comprises:
First reading step is read first signal from described optical-electrical converter;
Second reading step was read the secondary signal that is accumulated in the described semiconductor regions before described first reading step; And
Aligning step is proofreaied and correct described first signal based on described secondary signal.
7. bearing calibration according to claim 6 is characterized in that
In described second reading step, in described optical-electrical converter, repeatedly read the signal of accumulating in the described semiconductor regions during the signal accumulation, and
In described aligning step, calculate described secondary signal by being added in the signal of reading in described second reading step mutually.
8. according to claim 6 or 7 described bearing calibrations, it is characterized in that, wherein in described aligning step, from described first signal, deduct the signal that becomes predetermined ratio with described secondary signal.
9. according to claim 6 or 7 described bearing calibrations, it is characterized in that, also comprise the reset process of the signal of the described semiconductor regions that resets,
Wherein, in described first reading step, described first signal is after the signal of described semiconductor regions has resetted, and is read from described optical-electrical converter by described transmission unit and described sensing element.
10. according to claim 6 or 7 described bearing calibrations, it is characterized in that, also be included in described aligning step and before described secondary signal carried out the step that intermediate value is handled.
11. a picture pick-up device comprises:
Imageing sensor wherein is provided with a plurality of pixels, and each pixel has:
Optical-electrical converter, the light that receives from subject also is converted to signal with received light,
Semiconductor regions receives from the signal of described optical-electrical converter transmission,
Transmission unit will be transferred to described semiconductor regions by the signal that described optical-electrical converter was changed, and
Sensing element is from described semiconductor regions read output signal;
The saturation charge computing unit based on first signal that obtains by the signal that flows to described semiconductor regions during the signal accumulation that reads out in described optical-electrical converter, calculates the saturation charge of described optical-electrical converter; And
Correcting unit, result of calculation according to described saturation charge computing unit, the secondary signal that correction is read from the optical-electrical converter of following pixel, described pixel with comprise that to be calculated the pixel of optical-electrical converter of saturation charge by described saturation charge unit adjacent.
12. picture pick-up device according to claim 11, it is characterized in that, also comprise saturated pixel zone computing unit, it is according to the result of calculation of described saturation charge computing unit, detection comprises the pixel of the optical-electrical converter that is calculated saturation charge, calculate the size in saturated pixel zone then
Wherein, default if the size in described saturated pixel zone is less than or equal to, then described correcting unit is according to the regulation ratio adjustment of the saturation charge described secondary signal from reading adjacent to the described optical-electrical converter of the pixel in described saturated pixel zone.
13. picture pick-up device according to claim 11 is characterized in that, also comprises the defect pixel position storage unit, the position of its pre-stored defect pixel,
Wherein, described saturation charge computing unit calculates the saturation charge of the described optical-electrical converter of the defect pixel that is stored in the position in the described defect pixel position storage unit, and
Described correcting unit is according to the regulation ratio of the saturation charge of the described optical-electrical converter of described defect pixel, to proofreading and correct from the described secondary signal of reading adjacent to the described optical-electrical converter of the pixel of described defect pixel.
14. picture pick-up device according to claim 11 is characterized in that, described correcting unit deducts the signal that becomes predetermined ratio with the signal of saturation charge from the described secondary signal that the described optical-electrical converter of described neighbor is read.
15. picture pick-up device according to claim 11 is characterized in that, also comprises reset unit, the signal of its described semiconductor regions that resets,
Wherein, described secondary signal is after the signal of described semiconductor regions has resetted, the signal of being read from described optical-electrical converter by described transmission unit and described sensing element.
16. picture pick-up device according to claim 12, it is characterized in that, also comprise addition unit, if the size in the saturated pixel zone that is calculated by described saturated pixel zone computing unit surpasses described pre-set dimension, then to each pixel, described addition unit addition is from described first and second signals of described saturated pixel zone output.
17. a bearing calibration is used to proofread and correct the signal that obtains from the imageing sensor that is provided with a plurality of pixels, each pixel has: optical-electrical converter receives and is converted to signal from object light and with the light that is received; Semiconductor regions receives from the signal of described optical-electrical converter transmission; Transmission unit, the signal that described optical-electrical converter was changed is transferred to described semiconductor regions; And sensing element, from described semiconductor regions read output signal, comprising:
The saturation charge calculation procedure based on first signal that obtains by the signal that flows to described semiconductor regions during the signal accumulation that reads out in described optical-electrical converter, is calculated the saturation charge of described optical-electrical converter; And
Aligning step, result of calculation according to described saturation charge calculation procedure, the secondary signal that correction is read from the optical-electrical converter of following pixel, described pixel with comprise that to be calculated the pixel of optical-electrical converter of saturation charge by saturated described quantity of electric charge step adjacent.
18. bearing calibration according to claim 17, it is characterized in that, also comprise saturated pixel zone calculation procedure, it is according to the result of calculation of described saturation charge calculation procedure, detection comprises the pixel of the optical-electrical converter that is calculated saturation charge, calculate the size in saturated pixel zone then
Wherein, in described aligning step, if the size in described saturated pixel zone is less than or equal to pre-set dimension, then according to the predetermined ratio that become with saturation charge, to proofreading and correct from the described secondary signal of reading adjacent to the optical-electrical converter of the pixel in described saturated pixel zone.
19. bearing calibration according to claim 17 is characterized in that, also comprises reading step, it reads defect pixel from the defect pixel position storage unit of pre-stored defect pixel position position,
Wherein, in described saturation charge calculation procedure, calculate the saturation charge of the optical-electrical converter of the defect pixel of the position of read-out position in described reading step, and
In described aligning step, according to the regulation ratio of the saturation charge of the described optical-electrical converter of described defect pixel, to proofreading and correct from the described secondary signal of reading adjacent to the optical-electrical converter of the pixel of described defect pixel.
20. bearing calibration according to claim 17 is characterized in that, in described aligning step, deducts the signal that becomes predetermined ratio with saturation charge from the described secondary signal that the optical-electrical converter of described neighbor is read.
21. bearing calibration according to claim 17 is characterized in that, also comprises the reset process of the signal of the semiconductor regions that resets,
Wherein, described secondary signal is after the signal of semiconductor regions has resetted, the signal of being read from optical-electrical converter by transmission unit and sensing element.
22. bearing calibration according to claim 18, it is characterized in that, also comprise the addition step, if the size in the saturated pixel zone that is calculated by saturated pixel zone calculation procedure surpasses described pre-set dimension, then to each pixel, addition is from described first signal and the described secondary signal of the zone output of described saturated pixel in the described addition step.
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| JP2006291718 | 2006-10-26 | ||
| JP2006291715A JP5013811B2 (en) | 2006-10-26 | 2006-10-26 | Imaging apparatus and correction method |
| JP2006291715 | 2006-10-26 |
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Also Published As
| Publication number | Publication date |
|---|---|
| JP5013811B2 (en) | 2012-08-29 |
| CN100546343C (en) | 2009-09-30 |
| JP2008109501A (en) | 2008-05-08 |
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