CN101149339A - Fixed metal tungsten or tantalum platform graphite furnace atomic absorption photometer for standard-free analysis - Google Patents

Abstract

The graphite furnace atomic absorption photometer is composed by the tungsten-tantalum graphite pipe used for non-standard analysis. The experiment character m0exp does not change under nitric acid and perchloric acid. It advances the best experiment character m0exp* as the non-standard analysis standard. The different atomic temperature m0cal,m0exp* of 62 elements in HGA and THGA graphite furnace are listed in Table 1. The integral absorption QA is linearized to QA0, Table 2 lists the different reversible value Ar, the QA,0 corresponding to the bending coefficient beta. The offset coefficient k of every instrument is equal to m0exp*/m0exp; the Ar and beta are determined by the standard liquid in Table 4,5,6. the detected element m is used the basal formula 35,36,37.

Description

No standard analysis is with fixed metal tungsten or tantalum platform graphite furnace atomic absorption photometer

The patent No. of using the present inventor to propose is ZL96103243X, fixedly patent No. G01N21/31 " fixed metal tungsten or tantalum platform-graphite tube and fixing means thereof " is set up fixed metal tungsten (or tantalum) platform-graphite tube (being called for short WTaPGT) be used to not have standard analysis former to use WTaPGT is basis of the present invention in absorbing spectrophotometer (being called for short GAAS), this is because various organic and inorganic material, biological, geology and environmental sample all need use nitric acid and perchloric acid (to contain silicon sample, need HF acid) prepare, but nitric acid and perchloric acid corrosion tradition steady temperature platform technology (STPF) employed hot Jie's graphite-pipe (PGT) and hot Jie's graphite platform (PGPL) make test feature amount (m ₀Exp) constantly descend, use m 50～100 times ₀Exp drops to half that have only when beginning and is less than, and in this case, can not use no standard analytical process fully.Has only the WTaPGT of use containing high concentration nitric acid and perchloric acid, at scope in serviceable life, m ₀The exp value is protected the constant (m of mark ₀Exp is defined as corresponding integration and absorbs Q _ABe 0.0044 o'clock corresponding amount of element pg to be measured).So just might use no standard analytical process directly to measure complex fluid and solid sample.Have in the periodic table in addition twenties kinds of elements (particularly Sr, Ba, U, B, 15 rare earth element) can and graphite-pipe give birth to or carbonide, produce serious matrix effect and memory effect, make analyze take place difficult.Use these elements of WTaPGT post analysis the same, can use the various complex samples of similar analysis condition analysis, enlarged the element range of application of GFAAS with other tens elements.

1986 and nineteen ninety B, V.L ' VOV etc. (spectrochimica Acta 41B (10), 1043-1053 (1986) and 45B (7) 633-655 (1990)) propose with theory characteristic amount m ₀Cal is a standard, and being used for commodity GFAAS does not have standard analysis.Propose, use formula 1. with the AC magnetic field Zeeman background deduction technology PE Zeeman of PE company 5000 type graphite furnace atomic absorption photometers and HGA 500 type graphite furnaces with steady temperature platform-graphite tube

$m_0\left(\mathrm{cal}\right)\left(\mathrm{pg}\right)=5.08\×{10}^{-13}[\mathrm{MD\Δ}{\tilde{v}}_D/H(\mathrm{\α},\mathrm{\ω}=0.72\mathrm{\α}){\mathrm{\γ}}^{,}\mathrm{\δf}]\×[(Z\left(T\right)/[\mathrm{gexp}(-E/\mathrm{kT})]\×[r^2/l^2\left]\right]$ ①

Or m 1. ₀The characteristic quantity that cal (pg) goes out for Theoretical Calculation, M are atoms of elements amount (g/m to be measured ₀L), D is atom coefficient of diffusion (cm in Ar gas ²/ s),

Doppler width (cm for ultimate analysis line λ (nm) ^-1),

$\mathrm{\Δ}{\tilde{v}}_D(\mathrm{cm}-1)=\frac{7.16}{\mathrm{\λ}\left(\mathrm{nm}\right)}\sqrt{\frac{T\left(k\right)}{M(g/\mathrm{mol})}}$ ②

H (α, ω=0.72 α) is the Voigt integration, and α is the damping constant

$\mathrm{\α}=\sqrt{\ln 2}\mathrm{\Δ}{v}_L/\mathrm{\Δ}{v}_D.$ ③

Δ v _LBe analytical line and Lorentg width, can be by measuring.L ' vov obtains α=kT by measuring ^-1.24. D.V.Posener (Aust.J.phys. 12, 184 (1959)) and H (α, ω=0.72 α) when once tabulation illustrates different α value. testing the α value scope of measuring according to L ' vov with graphite furnace is 0.58-0.93 (62 elements), and corresponding H (α, ω=0.72 α) is abbreviated as 0.53-0.37

Log H＝Log(Hα ^k)-klogα＝[log(Hα ^k)-k Log k _α]+1.2klogT⑤

At this moment (H α ^k) value is 0.361 ± 0.00406 (1.1%), k=0.70

5. this up-to-date style can be reduced to

log H＝[log 0.361-0.70 log k _α]+0.84 logT⑥

α value scope is 0.40-0.56, and the H scope is 0.636-0.54

At this moment (H α ^k) value is 0.355 ± 0.0089 (2.5%) k=2/3

5. formula can be reduced to log H=[log 0.355-2/3 log k _α]+0.84 logT 7.

When α value scope was 0.26-0.38, the H scope was 0.743-0.65

At this moment (H α ^k) value is 0.360 ± 0.0094 (2.6%) k=0.57

5. formula can be reduced to log H=[log 0.360-0.57 log k _α]+0.684 logT 8.

α value scope is 0.176-0.19, when the H scope is 0.818-0.800,

At this moment (H α ^k) value is 0.356, k=0.48

5. formula can be reduced to log H=[log 0.356-0.48 log k _α]+0.576 logT 9.

The α value is 0.11, and H is 0.87 o'clock,

5. formula can be reduced to log H=[log 0.354-0.4 log k _α]+0.492 logT 10.

Many elements are because there is hyperfine structure (hfs) in the analytical line that nuclear spin and isotopic element lamp produce, and this have the analytical line of hfs more many than the analytical line light absorption value decline of no hfs, thereby introduce the correction coefficient γ that has hfs to exist ₀' if the hfs that proofreaies and correct has the component of n, strength ratio is b1, b2......bn, $\underset{1}{\overset{n}{\mathrm{\Σ}}}\mathrm{bi}=1.$

${{\mathrm{\γ}}_0}^{,}=\underset{1}{\overset{n}{\mathrm{\Σ}}}\mathrm{bi}\×\underset{1}{\overset{n}{\mathrm{\Σ}}}\mathrm{bi}\left[\underset{-\∞}{\overset{+\∞}{\∫}}H(\mathrm{\α},{\mathrm{\ω}}_j)\mathrm{\φi}\left(v\right)\mathrm{dv}\right]/\left[H(\mathrm{\α},{\mathrm{\ω}}_s=0.72\mathrm{\α})\right]---\left(11\right)$

φ i is (v) defeated wide for emission line Doppler.

${\mathrm{\ω}}_j=2\sqrt{\ln 2}(v-v_j+\mathrm{\Δ}{v}_s)/\mathrm{\Δ}{v}_D---\left(12\right)$

Δ V _DBeing the defeated exterior feature of the Doppler that absorbs line. can obtain according to formula

γ’(T+ΔT)＝γ’(T)+(dγ’/dT)ΔT (13)

If monochromator bandwidth Delta lambda _mHave other analytical lines to enter, introduce correction coefficient δ this moment, uses enough little Δ λ _m, other analytical lines are entered, therefore, δ=100.f is the oscillator strength of analytical line, can find g by the spectrum handbook _iAnd E _iBe in the statistical weight and the energy level of low energy line for analytical line.If low-lying level has the n energy level,

$Z\left(T\right)=\underset{1}{\overset{n}{\mathrm{\Σ}}}{g}_i\exp (-E_i/\mathrm{kT})$

g _iExp (E _i/ kT)/Z (T) represents analysis LineThe atomicity of the i energy level in the low-lying level accounts for the ratio of total atom number.This value can be found and be calculated by Moore handbook (Atomic Energy Levels, NBS, Washington, Vol 1,1949, Vol 2,1952, Vol 3,1957 for Ch.E, Moore).

R and l are graphite-pipe inside radius and length, and l=28mm uses hot Jie's coating graphite-pipe when using the HGA500 graphite furnace, and r=2.95mm uses full coating graphite tube r=3.0mm.

1. formula can be reduced to

m ₀cal(pg)＝K·C(T) (14)

Or K=[0.508 * (r in (14) ²/ l ²)] * [M/ δ f] (15)

Or C (T)=[D Δ V in (14) _D/ H (α, ω=0.72 α)]/[γ ' (gexp (E _i/ kT)/Z (T))] (16)

((D Δ V _D)/H (α, ω=0.72 α))=A * T ^BBe log ((D Δ V _D)/H (α, ω=0.72 α))=logA+BlogT (17)

log A＝log K _D+log K _ΔVD-[log(H _α ^k)-Klogk _α] (18)

B＝n+0.5-1.2k (19)

1. L ' vov obtains Ag, Al, As, Ba, Be, Bi, Ca, Cd, Co, Ct, Cs, Cu, Fe according to formula, Ga, Ge, Hg, In, Ki, Mg, Mn, Mo, Na, Ni, P, Pb, Pd, Rb, Sb, Se, Si, Sn, Sr, Te, Ti, Tl, V, Zn, 39 elements m when a certain best atomization temperature ₀Cal (pg) value.Obtain in the best of this atomization temperature with pure water solution again and test (pg) characteristic quantity m ₀Exp ^*Compare, W, (document is W.Frech andD.C.Baxter:spectrochimica Acta 3. for Frech etc. 45B(8) 867-886 (1990)) introduce atomization efficiency ε _A' ε _A'=m ₀Cal/m ₀Exp ^*(20)

But the m that obtains ₀Cal/m ₀Exp ^*=ε _A' be 0.09 to Ba, Er 0.12, and Eu 0.23, and Sr 0.32, and Ti 0.31, Cs0.46, Rb 0.49.Ca 0.46, Li 0.54, and Ge 0.69, and Yb 0.68

The m that 32 elements are arranged ₀Cal/m ₀Exp mean value is 0.85 ± 0.10, therefore according to L ' vov experimental result, uses m ₀It is too big that cal calculated characteristics amount is used to not have the standard analysis error, and can not be used to set up commercialization does not have the graphite furnace atomic absorption photometer that standard analysis is used.

The present invention steps a great step and is to use optimum test feature amount m ₀Exp ^*Replace traditional theory characteristic amount m ₀Cal is as the basis of no standard analysis.According to work such as W.Frech and formula (20) to low temperature element ε _A' atomization efficiency is m at very wide atomization temperature near 1.00 ₀Cal=m ₀Exp ^*Centering temperature element is at high-temperature region ε _A' near 1.00, even and high temperature element temperature up to 3200K also less than 1.00.Therefore optimum test feature amount is not an arbitrary value, but tight and m ₀Cal value hook.Promptly use pure element solution to ask m ₀The exp value, under same atomization temperature, centering high temperature element is different with improver with matrix modifier, just can obtain best m ₀Erp ^*Value.Be ε _A' good more near 1.00 more.For this to ε _AThe high temperature element of '＜1.00, also needing is to calculate m ₀The cal value is sought best improver and concentration, makes ε _A' reach maximal value and could determine accurate m ₀Exp ^*Usually analyze to be used in the commodity graphite furnace.Atomization temperature is selected to be absolutely necessary in usual the analysis.1. different matrix is used different atomization temperatures, is that improver is an improver than without Pd with Pd for example, looks different ashing temperature of element and atomization temperature and improves hundreds of degree.2. improve the favourable raising atomization efficiency of atomization temperature, sensitivity reduces matrix and disturbs and its bulk effect, and this is favourable aspect.3. improve atomization temperature and increase considerably background absorption, background absorption＞2.0 o'clock, Zeemam button background can not effectively be deducted, and when background was big, the baseline noise of Zeemam button background increased, and detection limit descends significantly.4. centering high temperature element improves atomizing temperature and increases graphite-pipe thermal radiation baseline noise, and detection limit descends significantly.5. to the high temperature element, improve atomization temperature, graphite-pipe descends serviceable life significantly.Therefore vast experiment makes the user usually select the very big atomization temperature of difference for use to same element in different matrix.L ' vov calculates and measures the m of 39 elements at single atomization temperature ₀Cal and m ₀Exp ^*Value is not satisfy far away to make the commercial requirement of no standard analysis.One of emphasis of the present invention is 1. to have calculated 62 elements to (19) according to formula temperature to occur from atomization and add 200～300K, to the 3000K of low temperature element, and middle temperature element 3100K, high temperature element 3200K is every 100K calculating-m ₀The cal value, list in table 1. (HGA graphite furnace) accurately measure and be fit to the m that the commodity graphite furnace is used to not have standard analysis ₀Exp ^*Must satisfy following requirement: 1. use pure element solution preparation standard.

2. select for use matrix modifier and concentration to make atomization efficiency ε _A' be the bigger the better.

3. use D ₂Lamp is buckled the background instrument, more than the wavelength 340nm, uses the single beam instrument.Use Z.PM, during GFAAS, the Q when measuring no magnetic field _AValue.

4. m ₀The exp value differs greatly with hollow cathode lamp quality difference and lamp current variation, to some hyperfine structures (hfs) difference, and big (the Δ v of component distance _Spl) greater than 0.4cm ^-1Element, big lamp current causes self-priming greatly to influence m ₀Exp ^*Value comprises Cu324.8nm, Bi 306.8nm, and Bi 223.1nm, Co 240.7nm, Hg 253.7nm, In303.9nm, Li 670.8nm, Pb 283.3nm etc. are (spectrochimica Acta such as example B.V.L ' vov with Cu324.8nm 47B(6) 843-854 (1952)) with PE25000 and Z3030, STPF technology T (K)=2400 ℃+200K=2600K, slit 0.70nm is as the criterion with identical Cu standard with equal conditions, and trying to achieve Zeenm instrument feature is m _zExp ^*The poorest PE (1) number commodity lamp (25mA) 13.8pg is preferably Russian commodity lamp LT-1 (10mA) 6.3pg, differs 2.2 times.Select for use in equal lamp-current condition when buying empty cathode modulation, same instrument can obtain lamp energy maximum.A large amount of experiments of present inventor show, using dutycycle is that 1 to 5 the pulse power is obtaining best test feature value m under the experiment condition on an equal basis easily than common power ₀Exp ^*, be example with as above Cu 324.8nm, we are with exchanging Zeeman deduction background instrument WFX-IG2 with non-ferrous metal research institute's lamp (lamp current 2mA) m _zExp is improved to 4.4pg, and deduction exchanges Zeeman absorptance (R _{Z, AM}=0.705), getting to the end, test feature is m ₀Exp ^*Value (3.10pg) (240 ℃+200=2600K atomization temperature). obviously be better than L ' vov PE 25000 type continuous current lamp power supplys.This can explain that also L ' vov obtains the m of 32 elements with continuous current lamp power supply ₀Cal/m ₀Exp mean value 0.85 ± 0.10 present inventor just was extensive use of 1: 5 dutycycle power supply from 1978, with integration absorption measurement method (Q _AValue), the WFD-Y3 of patent fixed metal tungsten (or tantalum) platform-graphite tube (WTaPGT) present inventor and Beijing second optical instrument factory's cooperation research and development, WFX-IE D ₂Background deduction GFAAS.The ZM-1 of present inventor and optical instrument factory, Suzhou cooperation research and development, the permanent magnetic field Zeeman background deduction GFAAS of ZMII and WFX-Z type.Quote with use Guangdong Province's analytical test exchange Zeeman background deduction GFAAS, the m that obtains with WFX-1G2 with the APZ of second optical instrument factory, Beijing development ₀Cal/m ₀Exp ^*More near 1.00, therefore measure the m of 62 elements than L ' vov measured value at table 1 ₀Exp ^*Quote the m of present inventor in the exhausted major part of different temperatures value with 1 to 5 dutycycle power supply gained ₀Exp ^*Value.Promptly use dutycycle 1 to 5 lamp power supply, lamp current is selected extremely important, is guaranteeing to obtain best m ₀Exp ^*Use big as far as possible lamp current under the value prerequisite, low to guarantee its noise, make signal to noise ratio (S/N ratio) high analyte detection limit good.

Wavelength is lower than 230.0nm element such as As 193.8nm Se 196.0, and Zn 213.9, P213.6, Sb217.6, Te214.3, Bi223.1 and Cd 228.8nm promptly use the hollow cloudy plate lamp of dutycycle 1 to 5, and the baseline noise is big, signal to noise ratio (S/N ratio) is low, and it is low to analyze detection limit, also has influence on the m that chooses ₀Exp can not reach best m ₀Exp ^*, at this moment the present inventor uses patent Lowe type high-intensity lamp just to obtain m easily ₀Exp ^*Value.

6. the slit bandwidth is selected, and to Ni 232.0nm, Co 240.7, and Fe 248.3, and Mn 279.5 elements such as grade use above the 0.2nm bandwidth to cause m ₀Exp rises 30% and 60%, unfavorablely obtains best m ₀Exp ^*Value.L ' vov at the 0.2nm of closer 20 elements and 2nm to m ₀The exp influence, conclusion is that no standard analysis is selected for use best m ₀Exp ^*, preferably use 0.2nm, have only minority to be lower than the 230nm element, particularly As 193.7 and Se 196.0nm promptly use high strength not have plate discharge lamp (EDL), or the total institute of non-ferrous metal patent high-power lamps obtains best m ₀Exp ^*, at this moment better with 0.7nm.

7. most elements use inventor's patent WTa PGT than the easier m that obtains of graphite platform-graphite tube in the widely used STPF technology of commodity graphite furnace in 62 elements ₀Exp ^*Value, so 62 ms of element under different temperatures in the table 1 ₀Exp ^*Exhausted major part is taken from patent graphite-pipe (WTa PGT).Have in the periodic table twenties kinds of elements (B, U waits element for particularly 15 elements and Sr, Ba) can and graphite platform and graphite-pipe generate carbonide, produce serious matrix effect and memory effect, make analyze produce difficult.Use patent WTa PGT analyze these elements can with the various complex samples of other dozens of element similar analysis, enlarged the ultimate analysis scope of no standard analytical process.

8. Os, Ir, Ru, Rh, Pt, Mo, V, Ti, the full coating graphite tube of the most handy internal diameter 6.0mm (TPGT) in the HGA graphite furnace+complete hot Jie's graphite platform.Because ordinary hot Jie stone clarinet (PGT) internal diameter is 5.9mm, 1. by formula

(m ₀cal(TPGT)/m ₀cal(PGT))＝(m ₀exp ^*(TPGT)/m ₀exp ^*(PGT))＝1.034

Above-mentioned element needn't be used TPGT with the still available PGT of THGA graphite furnace.

To the Na that has in the air, K, Ca, Mg, element determinations such as Zn need be placed on ultra-clean chamber with the GFAAS instrument and just can obtain correct m ₀Exp ^*, needing permanent improver in addition, 5mg/mlZr+4mg/ml+Ir+10mg/ml tartrate is in 1%v/v HNO ₃

By above 9 requirements, in showing 1., list 62 elements at the m of HGA graphite furnace superintendent 28mm inside radius 2.95mm hot Jie's coating graphite-pipe under different temperatures ₀Cal, ε _A'=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*The value, temperature value press L ' vov (formula 1.) T (℃)+200=T (K), low temperature element (adding the Pd improver) temperature (T occurs from atomization _Ap)+200 are to 3000K, and middle temperature element gets T _Ap+ 200 to 3100K, the high temperature element T _Ap+ 100 to 3200K, get a numerical value every 100K.Table is 1. also simultaneously to going out permanent magnetic field Zeeman background deduction absorptance R _{Z, Pm}With alternating magnetic field Zeeman background deduction absorptance R _{Z, AM}, the characteristic quantity m that permanent magnetic field ZeemanGFAAS instrument obtains _zExp calculates m by formula (22) ₀Exp, i.e. m ₀Exp=m _zExp.R _{Z, PM}(22) the characteristic quantity m that tries to achieve of alternating magnetic field Zeeman GFAAS instrument _zExp calculates m by formula (23) ₀Exp, i.e. m ₀Exp=m _zExp.R _{Z, AM}(23)

Use m in no standard analysis ₀Exp ^*Replace m ₀Cal is a revolutionary breakthrough as the standard transmission of quantity value.Make each Tianwan businessman's product graphite furnace instrument in the laboratory utilize the m of table 1 ₀Exp ^*Data become the transmission of quantity value instrument that is equivalent to standard substance, break away from miscellaneous standard substance.M in the table one ₀Exp ^*Also can be used as check since produced the STPF technology in 1978, present inventor and nearly 30 years domestic and foreign literatures, the variety of issue that produces at the commodity in use graphite furnace.Use departs from the coefficient of deviation K=(m of best test feature amount ₀Exp ^*/ m ₀Exp) (24).Obtain following brief conclusion; 1. PE company introduces the STPF technology the earliest under L ' vov helps, and PE company accounts for the world market occupation rate more than 50, delivers document on the document; Use the document of PE company instrument to surpass 2/3rds.No laying a foundation property of the standard law article that L ' vov delivered in 86 and 90 years is 39 element m relatively ₀Cal and m ₀The exp value is just in time used PEZ 5000, alternating magnetic field Zeeman deduction background instrument.But the twin-beam instruments design thought of PE company is too much used lens, catoptron and semi-permeable mirror, cause hollow cathode light heavy losses, the baseline noise is increased, and signal to noise ratio (S/N ratio) descends, and detection limit descends, to the above element of wavelength 350nm, because graphite-pipe heat radiation noise increases, situation more changes, to the following element of wavelength 230nm, because lens and catoptron, the semi-permeable mirror light energy losses is more serious.Therefore the user is using PE company instrument, in order to improve the hollow cathode lamp energy, reduce noise, improve signal to noise ratio (S/N ratio) and be forced to use high lamp current, high lamp current meets ropy lamp again and must cause lamp emission line self-priming to broaden, it is bimodal self-priming seriously to occur, meet serious analytical element of hfs structure such as Cu 324.8 again, Bi 306.8, and Bi 223.1, Co 240.7, Hg 253.7, and In 303.9, and Li 670.8, Pb 283.3, Tl 276.7, and Mn 279.5, and Os 290.9, elements such as Sn 286.3nm exchange the characteristic quantity m that Zeeman detains the background instrument _zExp differs up to 2.2 times (Cu 324.8nm).

Because this fatal shortcoming.The m that delivered with PE company instrument in nearly 30 years ₀Exp and the corresponding k value that obtains are much smaller than 1.00, and most data are between 0.5～1.0.This is an adverse factors to using PE company to be used to not have standard analysis.In order to overcome this factor, and L ' vov (B.V.L ' vov, SpectrochimicaActa 54B(11) 1637-1646 (1999)) proposition had once been summed up with Sullivan type high-intensity lamp (the commodity lamp that Australian Patent is arranged at present) or Lowe type high-intensity lamp (Wu Ting being arranged at present according to No. 7698 (on February 12nd, 1988) the total institute of non-ferrous metal commodity high-intensity lamps of patent) and has been made Sullivan type lamp be used for measuring Na, Sr, Ba, Au, Zn, Cu, Ni, Co, As, Sn, Al, Cr, elements such as Se, use these two kinds of high-intensity lamps after, K=1.00, PE company instrument just can be used to not have standard analysis reliably.

Another kind of way is the designed APZ type of Guangdong Province's analytical test and buckles background GFAAS with the WFX-1G2 type alternating magnetic field plug scape of Beijing second optical instrument factory joint production.These two kinds of instruments have only two lens owing to use the single beam instrument, and light energy losses is little.Use 1 to 5 duty cycle pulse power supply to improve empty positive plate lamp energy and be not easy to cause self-priming.Measuring Cd, As, Bi, Ni, Co, Mn, Pb, Cu, Cr, Au, Eu, V, it is m that Mo, Ba, Rb all can obtain K=1.00 ₀Exp=m ₀Exp ^*The result.If therefore in PE company, the lamp power supply is transformed into the pulse power supply light source of dutycycle 1 to 5, removing unnecessary catoptron, lens and semi-permeable mirror only stay the simplest two lens, as APZ type and WFX-IG2 type, are favourable to no standard analysis.

(2) the Zeeman deduction background of constant magnetic field GFAAS of Hitachi, Ltd's product is to use and is only second to the second largest GFAAS supplier of PE company.The present inventor just made the 170-70 of Hitachi as far back as 1977, use the Z8000 of Hitachi type later on again.The present inventor as far back as 1978 and nineteen eighty-two in ZMI that cyclisation was developed and the permanent magnetic field ZGFAAS of ZMII type, 1984 also and Suzhou 267 factories develop WFX-Z type perseverance magnetic field ZGFAAS jointly.The present inventor early than 1981 with regard to system measurement the permanent magnetic field Zeemcm absorptance R of 62 years elements _{Z, Pm}List in table 1.Summing up the m that uses 62 elements that Hitachi, Ltd records on nearly 30 years present inventors and the document ₀The exp value is found; 1. to low temperature and middle temperature element, being easy to obtain K=1.00 is m ₀Exp=m ₀Exp ^*2. even low high temperature element of centering temperature and high temperature element are with light-operated and 3000 ℃ of absorptance Q that (3200K) obtains _A/ A _PMuch larger than 1, even to more than 5.The atomization efficiency difference causes K＜1.0, to high temperature element even K＜0.5.This mainly is that the graphite furnace calandria of Hitachi's instruments design is too huge, and thermal capacity is big, so that the low Q that causes of heating rate _A/ A _PMuch larger than 1.0 and K much smaller than 1.0.Because it is many near half that middle high temperature element accounts for 62 elements.Therefore when the graphite furnace of existing Hitachi, Ltd was with no standard analysis, analytical element was very limited.In order to make permanent magnetic field ZGFAAS can be suitable for all 62 elements, the present inventor proposes another patented invention, it is too huge that promptly " no standard analysis is laterally heated graphite furnace with permanent magnetic field plug scape atomic absorption photometer " overcome the graphite furnace calandria of Hitachi's instruments design fully, the big shortcoming of thermal capacity.Use laterally heating graphite furnace in addition, avoid analytical element to cause the big and extra graphite-pipe central temperature that increases of needs of memory effect with the elimination memory effect in the cooling of graphite-pipe two water-cooled ends.Also eliminate matrix and be condensate in the absorption of two water-cooled ends increase matrix background, matrix disturbs and matrix effect.

3. Variam company alternating magnetic field ZGFAAS and the D of GBC company ₂Lamp is buckled background GFAAS, is to be only second to PE company the third-largest supplier of Hitachi, Ltd.But owing to use the long 28mm graphite-pipe of inside radius 2.5mm than the long 28mm of general HGA graphite-pipe inside radius 2.95mm, the graphite-pipe capacity is little 1.56 times, and promptly sampling volume is little about one times.

The formula of pressing is [m 1. ₀Cal (Varian, GBC)/m ₀Cal (HGA)]=[m ₀Exp ^*(Varian.GBC)/m ₀Exp ^*(HGA)]=0.901 but from measuring [the m of 30 multielements ₀Exp ^*(Varian.GBC)/m ₀Exp ^*(HGA)]=0.677 times error is less than 10%, therefore table 1. in (m ₀Exp ^*) HGA * 0.677 times, get final product m ₀Exp ^*(Varian, GBC), Varin is similar with Hitachi, Ltd with the major defect of GBC company instrument, owing to use the low little graphite-pipe power supply of volume of power, the high temperature element has Q equally in therefore analyzing _A/ A _PShortcoming greater than 1.If use high-power depressor instead, power doubles, then Q _A/ A _PShortcoming greater than 1 can solve.

4. second optical instrument factory, Beijing design with D ₂It is main instrument WFD-Y3 that lamp is buckled background, WFX-1B, WFX-1D, WFX-IE, WFX-110,120,130 and with the WFX-IF2B2 of self-priming atomic absorption button background, all D ₂Lamp is buckled the WFD-Y3 that background series instrument is the common development of inventor 1973-1975 and north two smooth factories, WFX-IB, and WFX-IE has improved robotization remodeling WFX-110,120,130 recently.Owing to use the single beam system of simple two lens, therefore to the m of 62 elements ₀Exp all can reach m ₀Exp ^*Be K=1.00, be mainly derived from the inventor and be close on vicennial data from 1978.Promptly list in the m in the table 1 ₀Exp ^*Data, shortcoming are D ₂Lamp is buckled background and is used for the big numerous and diverse sample determination of background absorption, and the background deduction reliability is difficult to guarantee.Self-priming absorbs the button background and does not have a versatility, and element over half is difficult to use self-absorption button background, and particularly the above element of wavelength 350mm can not be used D ₂Lamp is buckled background, can not be with self-absorption button background.When therefore the commercial apparatus of north two smooth factories production was used to not have standard analysis, greatest problem was not produce Zeeman button background instrument.

5. investigate the m that uses 62 element gained the numerous and diverse sample of STPF technical Analysis on the document in the last thirty years from no standard analysis angle ₀The exp value, and investigate the m that the inventor uses 62 element gained in the numerous and diverse sample of STPF technical Analysis in early days ₀The exp value is with m in the table 1 ₀Exp ^*Compare most of K＜1.00, bad situation even K＜0.50.Causing K is the non-selected correct matrix modifier and the amount of matrix modifier much smaller than 1.00 reasons, and matrix interference and matrix effect are very serious.But since introducing Pd and Pd+Mg improver, particularly the general improver 0.5/mg/ml Pd+1mg/ml Zr+10mg/ml tartrate of present inventor's proposition is in 1%v/v HNO ₃After, it is m that present inventor's discovery 62 elements in the Analysis of Complex environmental sample are easy to reach K=1.00 ₀Exp=m ₀Exp ^*, every use 5mg Pd+3mg mg is to the low temperature element on the document, and also being easy to reach K=1.00 is m ₀Exp=m ₀Exp ^*Nearly ten years extensively also fine with the permanent improver effect of W+Ir, and equally also being easy to reach K=1.00 is m ₀Exp=m ₀Exp ^*Therefore want the commodity in use instrument in no standard analysis, general improver and permanent improver use and are absolutely necessary.

Frech in 1993 and L ' vov (Frech W, L ' vov B.V.Spctrochimica Acta 48B, 1371 (1993)) propose graphite-pipe two end band caps (end cap) and laterally heat graphite furnace (THGA) and be used for vertical alternating magnetic field plug deduction GFAAS, the typical case has PE4100ZL, 5100ZL, models such as A Analyst 600,800.Heating two ends do not have water-cooled owing to use laterally, and whole graphite-pipe evenly is heated to identical atomization temperature when therefore heating.Because matrix does not condense to two ends when not having two end water-cooleds, cause background absorption excessive, make the background deduction difficulty, also can reduce base interference and matrix effect that the condensation matrix causes, be used in combination the m of general matrix modifier and permanent matrix modifier 62 elements in the Analysis of Complex element again ₀Exp, the easier K=1.00 that makes, m ₀Exp=m ₀Exp ^*Satisfy no standard analysis requirement.Centering high-temperature analysis element also is difficult for being condensate in two end water-cooleds partly in addition, causes Q _A/ A _PIncrease, even cause memory effect.For example analyze Mo with the HGA graphite furnace, V, Ti, Os, even elements such as B up to 3000 ℃ atomization fully still under long 20 seconds atomization conditions, be forced to use complete hot Jie's graphite-pipe, and can not use platform.But (2700K) was equivalent to warm element condition in the HGA graphite-pipe is measured in a large number less than 8 seconds after using THGA stone clarinet, after atomization temperature descends, the advantage of bringing is that noise is little, signal to noise ratio (S/N ratio) improves, thereby improves high temperature element determination detection limit, and bigger advantage is to have improved graphite-pipe serviceable life.At 3000 ℃ of 20s of HGA graphite-pipe, the life-span is less than 100 even 50 times, but can bring up to 200～500 times with 2500 ℃ of 8 second life-spans, improves five to ten times.Because background absorption reduces, disturb minimizing with matrix effect and matrix, extensively directly measure low content and trace element in the complicated solid sample over past ten years with the THGA graphite furnace, exempt time-consuming, loaded down with trivial details molten sample formality, also improved sensitivity for analysis and detection limit, make no standard analysis use more expansion, be all liq, solid sample all can directly enter graphite furnace to carry out accurately and reliably measuring, and this is only the real revolutionary character in the analytical chemistry field and breaks through.

A large amount of ZGFAAS instruments of producing band THGA graphite furnaces are all appts manufacturer main targets, and users are transformed into the ZGFAAS instrument of band THGA graphite furnace with existing GFAAS instrument, make every this instrument all can be by table m 1. ₀Exp ^*Data become the standard metering instrument, become the standard of instruments material effect of transmitting standard value, can also need not molten sample as directly liquid and solid complex sample being entered graphite furnace accurately and reliably, need not separation determination wherein low content and trace element.1. table lists file names with 62 m that element obtains when using the THGA graphite furnace when different temperatures ₀Cal, ε _A'=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value.L ' vov in 1996 (B.V.L ' vov Fresenius J Aual Chem 355, 222-226 (1996)) and point out the m of end capTHGA ₀Cal calculates can not be simply with formula 1., and computing formula has research, m ₀Exp ^*Therefore work is carried out very little, also has to be determinedly, and emphasis of the present invention is 62 ms of element under different atomization temperatures when obtaining with end cap THGA ₀Cal and m ₀Exp ^*Value.It is internal diameter 5.9mm that HGA graphite furnace and THGA graphite furnace use same internal diameter PGT, but the length difference, and HGA is with the long graphite-pipe of 28mm, and THGA 18mm graphite-pipe is by 1. (m of formula ₀Cal (THGA)/(m ₀Cal) HGA)=(28 ²/ 18 ²)=2.42 times

Because L ' vov has proposed formula and 1. not necessarily has been applicable to end cal THGT, therefore whether 2.42 times correctly need indirectly by (m ₀Exp ^*(THGA)/(m ₀Exp ^*) HGA) experiment value determines.When using the HGA graphite furnace from show 1., 62 elements obtain the ε of element in the high-temperature region under different temperatures _A'=m ₀Cal/m ₀Exp ^*Near 1.00, promptly at the (m that accurately measures under the condition of high-temperature region under the same atomization temperature ₀Exp ^*) the THGA value and and table one in (m under the same atomization temperature ₀Exp ^*) the HGA value compares, and at this moment (m should be arranged ₀Exp ^*(THGA)/(m ₀Exp ^*) HGA)=(m ₀Cal (THGA)/(m ₀Cal) high-temperature region (m HGA) ₀Exp ^*) the THGA value takes from 62 elements of THGA on THGA data that all documents of 1993-2006 deliver, the 4100ZL of PE company, the 5100ZL instructions, the G.Schlemmer (AtomicSpectroscopy of PE company 17(1) 15-21 (1996) delivers end cap THGA data, comprises Ag, Al, As, Au, Be, Bi, Cd, Co, Cr, Cu, Fe, Ga, Ge, In, Ir, Mg, Mn, Ni, Re, Pb, Pd, Pt, Rh, Sb, Se, Si, Sn, Te, Ti, V.30 individual element, curved and the m of ZGFAAS measured in B:V.L ' vov series article with end cap THGA _z(by Rz, AM is by being counted as m for the exp value ₀Exp ^*Value), comprise Ni, Pb, Al, Se, Bi, V, Mn, Cu, Cd, Ag, As, Zn, Co, Fe, Sb, Au, Cr, Tl, Sn, Be, Mn21 element, and Edit by k.w.Jackson; Electrothermal Atomization for Atomic AbsorptionSpectrometry, Wiley lists the m of 62 elements of THGA in p184-185 (1999) one books ₀The exp value.

Guangxi Inst. of Chemical Engineering's " the vertical AC magnetic field Zeeman AAS of ALZ type instrument " test report (on November 10th, 1991) has been measured the Cd of THGA, Se, As, Ni, Co, Mn, Pb, Mo, Cu, Ag, Ba, Cr12 element.V.Krivan etc. measure with THGA in nearly ten years that harmonic component and trace element comprise Li.Na, K.Cu, Mg, Ca, Zn, Cd, Al, Si, Pb, Cr, Mn, Fe, Co, elements such as Ni in the fixed sample.[(the m of 62 elements ₀Exp ^*) _THGA]/[(m ₀Exp ^*) _HGA]=2.75 times=[(m ₀Cal) _THGA]/[(m ₀Cal) _HGA]

Error is no more than 10%.That therefore lists in the table 1 uses the THGA graphite-pipe at each atomization temperature (m ₀Cal) THGA is the (m that obtains with the HGA graphite furnace that lists in the table 1 ₀Cal) HGA multiply by 2.75 times.

62 m that element obtains at each atomization temperature with the THGA graphite furnace ₀Exp ^*Then take from the 1993-2006 document.When summing up document, find owing to used the Pd+Mg improver to the low temperature element mostly with the THGA graphite furnace later in 1993, middle high temperature element Zr is an improver, or the permanent improver of widely-used W+Zr, when therefore summing up with THGA graphite furnace mensuration complex fluid or solid sample direct injected, be easy to obtain K=1.00, i.e. m ₀Exp=m ₀Exp ^*Therefore in the table 1,62 ms of element under different temperatures that obtain with THGA ₀Exp ^*Value is easily, than the m that obtains the HGA graphite furnace ₀Exp ^*Value is easier.

The fundamental formular of no standard analytical process (25) is m=Q _{A, 0}(m ₀Exp ^*/ 0.0044) (25)

M is an element quality to be measured, and unit is pg, surpasses 1000pg and then uses ng, Q _{A, 0}Be the integration absorption value Q that measures _ATry to achieve Q through linearization process _{A, 0}After having determined sampling Graphite Furnace Atomic temperature T ℃ (T (K)=T ℃+200), just can obtain m from table 1 ₀Exp ^*Value.Use when exchanging Zeeman deduction background instrument ZGFAAS, Z, the fundamental formular of AMGFAAS (26) is

m＝Q _A，0((m ₀exp ^*(AM))/0.0044)＝Q _A，0(m ₀exp ^*/0.0044 R _Z，AM) (26)

When using permanent magnetic field to detain background instrument ZGFAAS, Z, the fundamental formular of PMGFAAS (27) is

m＝Q _A，0((m ₀exp ^*(PM))/0.0044)＝Q _A，0(m ₀exp ^*/0.0044 R _Z，PM) (27)

It is crooked not using its typical curve of GFAAS and the analytic curve of Zeeman deduction background technology, Gilmudinov etc. point out that (A.K.Gilmudinov et al:Spectiochimica Acta47B (9) 1075-1095 (1992)) graphite furnace curved is mainly caused by three factors, 1. the radiant light α I of non-atomic absorption line in hyperfine structure of analytical line (hfs) and lamp emission line self-priming and the slit bandwidth ₀(I ₀Be lamp emission line light intensity) interact.2. garden, graphite-pipe sample holes center xsect skewness up and down.3. graphite-pipe length (28mm) atomic concentration skewness.The result causes the graphite furnace curve at Q _AValue is above just beginning bending, when element to be measured is that m is m more than 0.1 or 0.2 ₀Exp ^*In the time of 1000-3000 times, curve reaches plateau value Ar (Q _AValue).After using the Zeeman deduction background technology, the degree of crook aggravation is when element to be measured is that m is m _zExp ^*In the time of 1000 to 3000 times, platform not only appears in curve, and the atomic absorption peak occurs bimodal, and m continues to increase Q _ADescend on the contrary, the curve counter-rotating occurs, Ar (Q _AValue) be the curve rollback point.

Usually only at Q _AQ is just arranged below the value 0.1 or 0.2 _{A, 0}=Q _A, surpass 0.1～0.2 value, if curved is obtained Q without linearization _{A, 0}Value can't be used no standard analysis fundamental formular (25) (26) and (27).But how from the graphite furnace curve of bending, to find from Q _AObtain Q through linearization _{A, 0}, but be very difficult.The present inventor is early than being engaged in this work in 1978.Utilize formula (28) α ^*=(10 ^Ar+0.01-1) ^-1(28)

Q when the Ar value obtains the typical curve counter-rotating for permanent magnetic field or alternating magnetic field Zeeman deduction background _AValue.To single beam or D ₂Lamp is buckled background instrument and single beam instrument α=(10 ^Ar+0.01-1) ^-1, α I ₀The empty cloudy plate lamp radiant light or the bandwidth that enter for the slit bandwidth enter adjacent threads.And can not simply be classified as α I at plug scape button background instrument ₀, therefore the situation complexity uses formula (28) instead.0.01 introduce is to prevent to cause the not property confirmed of calculating easily near the calculating of Ar value the time, but when practical application, Q _AAt this moment range of application should also can be simplified and use α less than the 0.9Ar value ^*=(10 ^Ar-1) ^-1(29).If consider above-mentioned Gilmudinov work, curved is not just caused by the Ar value of formula (28) merely.Also to consider atom skewness in graphite-pipe, the bending that spectral line hfs structure and lamp emission line self-priming etc. causes.B.V.L ' vov and (B, V.L ' vov et al; SpectrochimicaB.V.et al; Spectrochimica Acta 51B (6) 609-6 18 (1996) introduces tortuosity factor β, proposition formula (30)

$Q_A=\log \frac{1+\mathrm{\α}*}{10-\frac{(1+\mathrm{\α}*)Q_{A,0}}{(1-\mathrm{\β}{Q}_{A,0})+\mathrm{\α}*}}---\left(30\right)$

(1+ α) is normalization coefficient, and purpose makes different α ^*Value is at Q _AValue obtains Q below 0.1-0.2 _A=Q _{A, 0}Directly with formula (29), (4) obtain Q through linearization _{A, 0}Be difficult and infeasible.Another emphasis of the present invention is to calculate each Q by formula (29) (30) _AAt different A _rValue (from 0.8-7.0 interval 0.1) different beta value (0.39 ,-0.27 ,-0.14,0.00,0.10,0.24,0.39 seven value) correspondence obtains Q _A.0Value. list in table 2..A _rValue is gone into .Q by four houses 5 _AValue be 0.1 or 0.2. work as Q _A(x) be three figure place (Q _A＜1.000) or four figures (Q _A＞1.000), β (y) does not drop on seven β values for one digit number (β (y)＜0.10) or two figure places (β (y)＞0.10). and available formula (5) (6) (7) is calculated by interpolation method.

Q _A.0(x，β(L))＝Q _A，0(L，β(L))+(Q _A(x)-Q _A(L))/(Q _A(H)-Q _A(L))(Q _A，0(H，β(L))-

-Q _A，0(L，β(L)) (31)

Q _A，0(x，β(H))＝Q _A，0(L，β(H))+(Q _A(x)-Q _A(L))/(Q _A(H)-Q _A(L))(Q _A，0(H，β(H))-

-Q _A，0(L，β(H))) (32)

Q _A，0(x，β(y))＝Q _A，0(x，β(L))+(β(y)-β(L))/(β(H)-β(L))(Q _A，0(x，β(H))-Q _A，0(x，β(L)))(33)

L represents low value in the formula (31) (32) (33), and H represents high value.

Use table 2 and formula (31), (32), (33), at Ar=0.8-7.0, β=-0.40 is to 0.39, Q _AArbitrary Q from 0.1 to 0.9Ar _AValue all can be tried to achieve Q through linearization process _{A, 0}Value.Q _AAt 0.1 following Q _A=Q _{A, 0}Error is below 1%.Q _ADuring＞0.9Ar, be example with β=-0.40; The Q that try to achieve Ar＞1.80, linearization _{A, 0}Compare Q _AGo out 5 times greatly, so therefore the corresponding amplification of analytical error limits Q more than 5 times _A＜0.9Ar is the consideration for actual application value.

The present inventor has obtained the Ar and the β value of present inventor's all 62 element typical curves since 1978 with table 2 and formula (31), (32), (33).Use instrument to comprise the D of PE company ₂Lamp, alternating magnetic field Zeeman detains background; Hitachi, Ltd's permanent magnetic field Zeeman button background, Beijing second D of optical instrument factory ₂Lamp is buckled the background instrument, and we make permanent magnetic field Zeeman button background instrument by oneself, Suzhou 267 factories permanent magnetic field Zeeman button background instrument, Guangdong Province's analytical test APZ of institute alternating magnetic field button background instrument, Tianjin, island D ₂Lamp is buckled the background instrument, GB CD ₂Lamp is buckled the background instrument, more than is HGA graphite furnace instrument.Also have in addition PE4100ZLTHGA graphite furnace and Guangxi chemical industry metallurgical the typical curve of homemade THGA graphite furnace.Ar value and β value have also been collected with the typical curve that has calculated the HGA graphite furnace that on the 1978-2006 document, can find and THGA graphite furnace.List in table 3, because the Ar and the β value of each instrument differ greatly, table 3 is only listed possible range when row Ar value, and same β value also differs greatly, and what table 3 was listed is possible range.As can be seen from Table 3:

1. Ar and instrument relation is very big, D ₂The Ar value of lamp background deduction is higher 1.2 to 1.5 times than the Ar value of Zeeman background deduction instrument, but for data reliability, we would rather detain the background instrument with the less Zeeman of Ar value.

2. the element such as the Cu324.7 of fine structure and hyperfine structure complexity, Ag328.1, Li670.7, Hg253.7, In303.9, Tl276.7, P213.6, Bi306.7, Bi223.1, Cs852.1, Mn279.5, Rb780.0, Sn286.3 etc. use empty cloudy plate lamp, or lamp is of poor quality, or lamp current is too big, all causes Ar to descend significantly, the Ar of Zeeman button background even less than 0.8, but use electrodeless discharge lamp (EDL), have covered with gold leaf to belong to total institute patent high-intensity lamp (Lowe type), or the dutycycle used of domestic equipment is 1: 5 pulse power supply lamp that Ar value rises to 2-5 and doubly looks and do not have plain difference.

3. serious to self-priming low temperature element such as Li, Na, K, Rb, Cs, Cu, Ag, Au, Zn, Cd, Hg, Ga, In, Tl, Sn, Pb, P, As, Sb, Bi, Se, Te, and warm element partly, when empty cloudy plate lamp current was big, the Ar value declined to a great extent, even Ar＜0.8, this partly element preferably use the EDL lamp, or Lowe type high-intensity lamp also can use pulse power supply but dutycycle must not be above 1: 5.The cloudy plate lamp of the comparable sky of Ar value improves 2-5 doubly.

4. to gentle high temperature element among the overwhelming majority, can use empty cloudy plate lamp, the Ar value is about about 1.5, but uses pulse power supply dutycycle 1 to 5, even 1 to 10, the Ar value can improve 3-4 times, Ar＞7.0.

5. the Ar value is low more, and the β value is high more, is example with Zn213.9 and Cd 228.8, and using the cloudy plate lamp of common sky β value is+0.10, and uses EDL, or Lowe type high-intensity lamp, or the power supply of 1 to 5 duty cycle pulse, and β drops to-0.27.

6. the β value of each element is relevant very big, and minimum β=-0.40 is Be 234.9, and the highest β=+ 0.39 is Al309.2.

7. the β value of most elements is distributed between-0.10 to+0.10.Because the Ar of each element and β value be with instrument in 62 elements, lamp, lamp current, slot variation is quite big, therefore needs correction often.In addition correction coefficient K=(m ₀Exp ^*/ m ₀Exp) (34)

Be subjected to the lamp power supply mode, characteristic of a navigation light amount, lamp current, the slit influence is quite big, and for example Cu 324.7, and the K value changes from 0.51 to 1.00 and differs nearly one times, so the K value also needs to proofread and correct.Another emphasis of the present invention is to proofread and correct Ar, β and K value.After introducing correction coefficient K, the basic calculating formula of no standard analytical process changes over (35), (36), (37) promptly: m=Q _{A, 0}(m ₀Exp/0.0044)=Q _{A, 0}/ K * (m ₀Exp ^*/ 0.0044) (35)

m＝Q _A，0((m ₀exp(AM))/0.0044)＝Q _A，0/K×(m ₀exp ^*/0.0044 R _Z，AM) (36)

m＝Q _A，0((m ₀exp(PM))/0.0044)＝Q _A，0/K×(m ₀exp ^*/0.0044 R _Z，PM) (37)

In formula (35), (36) and (37), be converted into formula (25), (26) and (27) during as K=1.00.Unfortunately in most cases fundamental formular (35), (36) and (37) should be used in usual analysis in K＜1.00 therefore, accurately measure K, β and Ar value need the standard solution of 62 element individual element content of a cover, and the standard solution of identity element must be available from two units, the Q that obtains _AValue consistent (being in the error range) could assert that concentration of standard solution is accurately and reliably.Must contain matrix modifier in the standard solution.The most frequently used matrix modifier is 0.5mg/mlPd, and suitable unit have Li, Na, K, Rb, Cs, Cu, Ag, Au, Be, Mg, Ca, Sr, Ba, Zn, Cd, Hg, Al, Ga, In, Tl, Si, Ge, Sn, Pb, P, As, Sb, Bi, Te, Cr, Mn, Fe, Co, 35 elements such as Ni.The improver of high temperature element was 1mg/ml Zr during another one was fit to, and preferably convergent improvement agent lmg/ml Zr+0.5mg/ml Pd can be used for removing Pd, Pt, Ru, Rh, all 56 elements beyond the Ir, Os.Matrix modifier also comprises 10mg/ml tartrate+1%v/VHNO in addition ₃, its effect is a 1. stabilized matrix improver 0.5mg/ml Pd+1mg/ml Zr solution, stabilized matrix and trivalent and quadrivalent element are also wanted in unlikely generation precipitation or absorption, and unlikely generation precipitation or absorption, concentration content produces change.

Occur bimodal element during 2. to part atomization, behind the adding tartrate, also can disappear, improve and analyze reappearance and reliability bimodal.To a part of element such as Cd, Zn, Cu, Mn, Pb, Ag, Na, K, elements such as Mg use general improver, 0.5mg/ml Pd+1 mg/ml Zr+10mg/ml tartrate+0.10%v/v HNO ₃Can not use because the improver empty is too big, should consider to use permanent improver, 5mg/mlZr+4mg/ml Ir+10mg/ml tartrate+0.10%v/v HNO ₃50 μ l are improver, at 160 ℃ of 40s, and 1300 ℃ of 25s, 2400 ℃ of 10s, atomization under the condition includes Zr 250 μ g+200 μ g Ir and forever stays in the graphite-pipe, plays permanent improver effect, as long as a sample or standard solution can be analyzed.Under 2400 ℃ of (2600K) 10s conditions, permanent improver can keep up to 1300 times.But must point out that permanent improver is not so good as the Pd+Zr improver as the effect of improver.To each root graphite-pipe, different elements, different atomization temperatures, different samples once add permanent improver access times and alter a great deal, and need to use Q _A＜0.15 pure solution standard monitoring when obtaining the variation of K value greater than error range, needs to add for the second time permanent improver, analyzes reliability with assurance, for example add once for 200 times, or 300 times adds once.Measure Mo, V during Ti,, can not use because memory is remorse serious with fixed metal tungsten (or tantalum) platform-graphite tube, and the most handy coating graphite tube adds full pyrolytic graphite platform.Because B in the graphite platform, Ca, Sr is blank high, and the required atomization temperature of Os atomization is the highest in 62 elements, and B, Ca, Sr, Os also are to use full coating graphite tube+full pyrolytic graphite platform good.Zn, Mg, Na, K content in surrounding air changes high, measures Zn, and Na, K, Mg preferably are placed on the sampling Graphite Furnace Atomic extinction photometer in the ultra-clean chamber and work.

Table 4 and table 5 are listed respectively, the standard solution degree (ng/ml) that permanent magnetic field and alternating magnetic field Zeeman button background HGA graphite furnace use, and table 6 is listed the concentration of standard solution (ng/ml) that alternating magnetic field Zeeman button background THGA graphite furnace uses.Table 4,5,6 is also listed 62 elements and is being demarcated the temperature T of using (K), T (℃)=T (K)-200.When using 10 μ l sample introductions, the 1. corresponding Q of number solution _{A, 0}=0.044 ± 10%, 2. number Q _{A, 0}=0.132 ± 10%, 3. number Q _{A, 0}=0.44 ± 10%, 4. number Q _{A, 0}=1.32 ± 10%, 5. number Q _{A, 0}=4.4 ± 10%, 6. number Q _{A, 0}1. number and 2.=13.2 ± 10%, number solution is mainly used in and measures and monitoring K=m ₀Exp ^*/ m ₀Exp.3. 4. 5. number solution be mainly used in and measure the β value, 5. 6. number be used to measure the Ar value.

Usually Ar value and β variation is very little, because of Ar and β depend primarily on instrument, and lamp and lamp power supply, lamp power supply and slit width needn't often be demarcated.Have only the K value often to need to demarcate; Need when (a) matrix changes to demarcate, demarcate use 1. number and 2. number liquid add 1. number and 2. number liquid of 10 μ l with matrix sample, obtain the K value with standard addition method.(b) graphite-pipe uses the later stage, and the K value changed when promptly graphite-pipe blew soon, and the low temperature element is demarcated once for per 200 times usually, and middle temperature element is demarcated once for 100 times, and the high temperature element is demarcated once for 50 times.

Demarcated K, after Ar and the β value, it is just fairly simple directly to measure in complex fluid or the fixed sample Elements C to be measured with no standard analytical process.1. directly with the complex fluid sample feeding, sample size V _In(μ l) or complicated solid sample direct injected, sample size m _In(mg) in graphite-pipe.2. configure atomization temperature T (℃), press T (K)=T (℃)+200, utilize table 1 to obtain m ₀Exp ^*Value.3. use table 4 in advance, 5 or 6 1. demarcated K, Ar and β value to 6. number liquid.4. atomization obtains Q _AValue is obtained Q with table 2 and formula (31), (32), (33) through linearization _{A, 0}5. visual equipment is different tries to achieve element m to be measured (pg) value with formula (35), (36), (37).6. constituent content C presses formula (38) in the complex fluid sample

C＝m/V _in[(pg/μl)×(ng/ml)×(μg/l] (38)

During the complexity direct solid sample introduction, constituent content C is by formula (39)

C＝m/m _in[(pg/mg)×(ng/g)×(μg/kg)] (39)

No standard analytical process is directly measured complex fluid or solid sample, break away from often use in the common inorganic analysis time-consuming, the molten sample that difficulty is loaded down with trivial details, separate formality and determination step, also can break away from and separate reagent blank and the purification reagent place that formality and determination step bring at molten sample and need numerous and diverse time-consuming step.Use the m of table 1 ₀Exp ^*With demarcation K, β, the Ar method is looked different commercial apparatuss with fundamental formular (35), (36), (37).Each Tianwan businessman's product instrument also is available as the standard metering instrument simultaneously, as balance in the gravimetric method, and various capacity measuring instruments in the volumetric method.Also has the various standard model function of quantity simultaneously, as the standard tool for transmitting.At domain of inorganic chemistry is great revolutionary the breakthrough.

Table 1 is 62 ms of element under different temperatures T (K) 1. ₀Cal, ε _A'=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value

(1) (1) Li 670.8nm R z，PM＝0.38 R z，AM＝0.88
											HGA	T(K)	1600	1700	1800	1900	2000	2100	2200	2300
m 0cal.pg	0.181	0.201	0.221	0.242	0.263	0.286	0.309	0.333
										ε A’％		0.35	1.36	2.10	3.21	4.89	7.45	11.2	17.0
m 0exp *，pg	51.7	14.8	10.5	7.53	5.38	3.84	2.76	1.96
										THGA		T(K)	1600	1700	1800	1900	2000	2100	2200	2300
m 0cal.pg	0.498	0.553	0.608	0.666	0.723	0.787	0.850	0.916
											ε A’％	2.10	3.21	4.89	7.45	11.2	17.0	25.7	38.3
m 0exp *，pg	23.7	17.2	12.4	8.91	6.46	4.63	3.31	2.39
											HGA	T(K)	2400	2500	2600	2700	2800	2900	3000	3100
m 0cal.pg	0.360	0.383	0.409	0.436	0.464	0.492	0.521	0.552
										ε A’％		25.7	38.3	45.9	56.0	59.6	63.4	67.1	71.1
m 0exp *，pg	1.400	1.000	0.891	0.779	0.779	0.779	0.779	0.779
										THGA		T(K)	2400	2500	2600	2700	2800	2900	3000	3100
m 0cal.pg	0.990	1.053	1.125	1.199	1.276	1.352	1.433	1.518
											ε A’％	45.9	56.0	59.8	63.8	67.9	72.0	76.2	80.7
m 0exp *，pg	1.92	1.88	1.88	1.88	1.88	1.88	1.88	1.88
											(1) (2) Na 589.0 R z，PM＝0.46 R z，AM＝0.95
HGA	T(K)	1500	1600	1700	1800	1900	2000	2100	2200
											m 0cal.pg	0.233	0.256	0.280	0.303	0.321	0.355	0.381	0.408
	ε A’％	9.9	15.5	29.5	43.6	72.8	80.5	81.0	81.6
											m 0exp *，pg	2.35	1.65	0.950	0.695	0.441	0.441	0.470	0.500
	THGA	T(K)	1500	1600	1700	1800	1900	2000	2100	2200
m 0cal.pg											0.641	0.704	0.770	0.835	0.883	0.976	1.048	1.122
		ε A’％	20.3	34.5	55.0	68.4	77.5	85.6	91.9	98.4
m 0exp *，pg											3.16	2.04	1.40	1.22	1.14	1.14	1.14	1.14
		HGA	T(K)	2300	2400	2500	2600	2700	2800	2900										3000
m 0cal.pg	0.426										0.464	0.493	0.522	0.552	0.582	0.613	0.645
			ε A’％	85.2	92.8	98.6	100	100	100	100									100
m 0exp *，pg	0.500										0.500	0.500	0.522	0.552	0.580	0.613	0.645
			THGA	T(K)	2300	2400	2500	2600	2600	2800									2900	3000
m 0cal.pg	1.172	1.276									1.356	1.436	1.436	1.601	1.686	1.774
				ε A’％	100	100	100	100	100	100								100	100
m 0exp *，pg	1.172	1.276									1.356	1.436	1.436	1.601	1.686	1.774

Table 1 is 62 ms of element under different temperatures T (K) 2. ₀Cal, ε _A'=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value

(1) (3) K766.5nm R z，PM＝0.52 R z，AM＝0.91
											HGA	T(K)	1500	1600	1700	1800	1900	2000	2100	2200
m 0cal.pg	0.411	0.441	0.471	0.502	0.534	0.565	0.597	0.630
										ε A’％		7.9	25.1	65.1	88.1	93.8	99.3	100	100
m 0exp *，pg	5.20	1.76	0.723	0.570	0.570	0.570	0.597	0.630
										THGA		T(K)	1500	1600	1700	1800	1900	2000	2100	2200
m 0cal.pg	1.130	1.213	1.295	1.381	1.469	1.554	1.642	1.733
											ε A’％	25	65	93.8	100	100	100	100	100
m 0exp *，pg	4.52	1.866	1.381	1.381	1.469	1.554	1.642	1.733
											HGA	T(K)	2300	2400	2500	2600	2700	2800	2900	3000
m 0cal.pg	0.662	0.695	0.728	0.759	0.796	0.931	0.864	0.899
										εA’％		100	100	100	100	100	100	100	100
m 0exp *，pg	0.662	0.695	0.728	0.759	0.796	0.831	0.864	0.899
										THGA		T(K)	2300	2400	2500	2600	2700	2800	2900	3000
m 0cal.pg	1.821	1.911	2.002	2.087	2.189	2.285	2.376	2.472
											ε A’％	100	100	100	100	100	100	100	100
m 0exp *，pg	1.821	1.911	2.002	2.087	2.189	2.285	2.376	2.472
											(1) (4) Rb 780.0nm R z，PM＝0.44 R z，AM＝0.90
HGA	T(K)	1500	1600	1700	1800	1900	2000	2100	2200
											m 0cal.pg	0.81	0.81	0.96	1.03	1.11	1.19	1.28	1.37
	ε A’％	5.9	5.9	60.6	79.2	85.4	91.7	98.5	100
											m 0exp *，pg	13.7	13.7	1.58	1.30	1.30	1.30	1.30	1.37
	THGA	T(K)	1500	1500	1700	1800	1900	2000	2100	2200
m 0cal.pg											2.23	2.23	2.64	2.83	3.05	3.27	3.52	3.77
		ε A’％	18	18	85	91	98	100	100	100
m 0exp *，pg											12.4	12.4	3.11	3.11	3.11	3.27	3.52	3.77
		HGA	T(K)	2300	2300	2500	2600	2700	2800	2900										3000
m 0cal.pg	1.46										1.46	1.66	1.76	1.87	1.99	210	2.23
			ε A’％	100	100	100	100	100	100	100									100
m 0exp *，pg	1.46										1.46	1.66	1.76	1.87	1.99	210	2.23
			THGA	T(K)	2300	2300	2500	2600	2700	2800									2900	3000
m 0cal.pg	4.02	4.02									4.57	4.84	5.14	5.47	5.78	6.13
				ε A’％	100	100	100	100	100	100								100	100
m 0exp *，pg	4.02	4.02									4.57	4.84	5.14	5.47	5.78	6.13

Table 1 is 62 ms of element under different temperatures T (K) 3. ₀Cal, ε _A'=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value

(1) (5) CS 852.1nm R z，PM＝0.40 R z，AM＝0.90
											HGA	T(K)	1500	1600	1700	1800	1900	2000	2100	2200
m 0cal.pg	1.55	1.66	1.78	1.90	2.02	2.14	2.27	2.30
										ε A’％		3.0	12.1	34.0	46.7	49.6	52.6	57.8	58.7
m 0exp *，pg	51.7	13.7	5.24	4.07	4.07	4.07	4.07	4.07
										THGA		T(K)	1500	1600	1700	1800	2000	2000	2100	2200
m 0cal.pg	4.26	4.57	4.90	5.23	5.89	5.89	6.24	6.57
											ε A’％	12.1	34.0	45.4	46.7	52.6	52.6	57.8	58.7
m 0exp *，pg	35.2	13.4	10.8	10.8	10.8	10.8	10.8	10.8
											HGA	T(K)	2300	2400	2500	2600	2700	2800	2900	3000
m 0cal.pg	2.52	2.65	2.79	2.92	3.06	3.20	3.34	34.9
										ε A’％		61.9	65.1	98.6	71.7	75.2	78.6	82.1	85.7
m 0exp *，pg	4.07	4.07	4.07	4.07	4.07	4.07	4.07	4.07
										THGA		T(K)	2300	2400	2500	2600	2700	2700	2900	3000
m 0cal.pg	6.93	7.29	7.67	8.03	8.42	8.42	9.19	9.60
											ε A’％	61.9	65.1	68.6	71.7	75.2	75.2	82.1	8.57
m 0exp *，pg	10.8	10.8	10.8	10.8	10.8	10.8	10.8	10.8
											(2) (1) Cu 324.8nm R z，PM＝0.355 R z，AM＝0.51-0.55
HGA	T(K)	1600	1700	1800	1900	2000	2100	2200	2300
											m 0cal.pg	0.952	1.058	1.171	1.288	1.410	1.538	1.669	1.805
	ε A’％	0.93	13.0	22.5	37.1	42.9	49.6	53.8	58.2
											m 0exp *，pg	102	8.14	5.20	3.47	3.29	3.10	3.10	3.10
	THGA	T(K)	1600	1700	1800	1900	2000	2100	2200	2300
m 0cal.pg											2.62	2.91	3.22	3.54	3.88	4.23	4.59	4.96
		ε A’％	2.0	3.0	52	85	100	100	100	100
m 0exp *，pg											93.6	9.70	6.19	4.16	3.88	4.23	4.59	4.96
		HGA	T(K)	2400	2500	2600	2700	2800	2900	3000										3100
m 0cal.pg	1.951										2.097	2.253	2.416	2.583	2.755	2.932	3.117
			ε A’％	62.9	67.6	72.7	77.9	83.3	88.9	94.5									100
m 0exp *，pg	3.10										3.10	3.10	3.10	3.10	3.10	3.10	3.117
			THGA	T(K)	2400	2500	2600	2700	2800	2900									3000	3100
m 0cal.pg	5.37	5.77									6.20	6.64	7.10	7.58	8.06	8.57
				ε A’％	100	100	100	100	100	100								100	100
m 0exp *，pg	5.37	5.77									6.20	6.64	7.10	7.58	8.06	8.57

Table 1 is 62 ms of element under different temperatures T (K) 4. ₀Cal, ε _A'=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value

(2) (2) Ag 328.1nm R z，PM＝0.40 R z，AM＝0.91
											HGA	T(K)	1500	1600	1700	1800	1900	2000	2100	2200
m 0cal.pg	0.639	0.708	0.781	0.857	0.937	1.018	1.101	1.187
										ε A’％		100	100	100	100	100	100	100	100
m 0exp *，pg	0.639	0.708	0.781	0.857	0.937	1.018	1.101	1.187
										THGA		T(K)	1500	1600	1700	1800	1900	2000	2100	2200
m 0cal.pg	1.76	1.95	2.15	2.36	2.58	2.80	3.03	3.26
											ε A’％	100	100	100	100	100	100	100	100
m 0exp *，pg	1.76	1.95	2.15	2.36	2.58	2.80	3.03	3.26
											HGA	T(K)	2300	2400	2500	2600	2700	2800	2900	3000
m 0cal.pg	1.276	1.368	1.463	1.563	1.662	1.764	1.870	1.978
										ε A’％		100	100	100	100	100	100	100	100
m 0exp *，pg	1.276	1.368	1.463	1.562	1.662	1.764	1.870	1.978
										THGA		T(K)	2300	2400	2500	2600	2700	2800	2900	3000
m 00cal.pg	3.51	3.76	4.02	4.30	4.57	4.85	5.14	5.44
											ε A’％	100	100	100	100	100	100	100	100
m 0exp *，pg	3.51	3.76	4.02	4.30	4.57	4.85	5.14	5.44
											(2) (3) Au 242.8nm R z，PM＝0.56 R z，AM＝0.804
HGA	T(K)	1500	1600	1700	1800	1900	2000	2100	2200
											m 0cal.pg	2.92	3.25	3.60	3.98	4.36	4.76	5.18	5.61
	ε A’％	49.1	53.6	58.3	63.2	67.9	72.0	76.9	81.7
											m 0exp *，pg	5.95	6.06	6.18	6.30	6.42	6.61	6.74	6.87
	THGA	T(K)	1500	1600	1700	1800	1900	2000	2100	2200
m 0cal.pg											8.03	8.94	9.90	11.0	12.0	13.1	14.3	15.4
		ε A’％	77.8	84.9	91.6	97.3	100	100	100	100
m 0exp *，pg											10.3	10.5	10.8	11.3	12.0	13.1	14.3	15.4
		HGA	T(K)	2300	2400	2500	2600	2700	2800	2900										3000
m 0cal.pg	6.06										6.53	6.87	7.54	8.09	8.65	9.01	9.85
			ε A’％	86.6	92.9	96.5	100	100	100	100									100
m 0exp *，pg	7.00										7.03	7.36	7.54	8.09	8.65	9.01	9.85
			THGA	T(K)	2300	2400	2500	2600	2700	2800									2900	3000
m 0cal.pg	16.7	18.0									18.9	20.7	22.3	23.8	24.8	27.1
				ε A’％	100	100	100	100	100	100								100	100
m 0exp *，pg	16.7	18.0									18.9	20.7	22.3	23.8	24.8	27.1

Table 1 is 62 ms of element under different temperatures T (K) 5. ₀Cal, ε _A'=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value

(3) (1) Be 234.8nm R z，PM＝0.62 R z，AM＝0.65
											HGA	T(K)	1600	1700	1800	1900	2000	2100	2200	2300
m 0cal.pg	0.149	0.166	0.183	0.200	0.219	0.238	0.257	0.278
										ε A’％		7.5	16.8	24.3	35.7	44.2	50.3	56.7	63.9
m 0exp *，pg	1.98	0.990	0.754	0.560	0.495	0.473	0.453	0.435
										THGA		T(K)	1600	1700	1800	1900	2000	2100	2200	2300
m 0cal.pg	0.410	0.457	0.503	0.550	0.602	0.655	0.770	0.765
											ε A’％	11	25	36	54	66	75	85	90
m 0exp *，pg	3.737	1.828	1.397	1.019	0.903	0.873	0.831	0.850
											HGA	T(K)	2400	2500	2600	2700	2800	2900	3000	3100
m 0cal.pg	0.299	0.321	0.343	0.366	0.388	0.413	0.438	0.464
										ε A’％		69.5	73.3	79.8	83.5	88.2	92.8	96.7	100
m 0exp *，pg	0.430	0.438	0.430	0.438	0.440	0.445	0.453	0.464
										THGA		T(K)	2400	2500	2600	2700	2800	2900	3000	3100
m 0cal.pg	0.822	0.883	0.943	1.007	1.067	1.136	1.205	1.276
											ε A’％	95.0	98.1	100	100	100	100	100	100
m 0exp *，pg	0.866	0.900	0.943	1.007	1.067	1.136	1.205	1.276
											(3) (2) Mg 285.2nm R z，PM＝0.81 R z，AM＝0.91
HGA	T(K)	1600	1700	1800	1900	2000	2100	2200	2300
											m 0cal.pg	0.163	0.178	0.194	0.211	0.227	0.245	0.263	0.281
	ε A’％	1.4	4.5	10.1	18.0	29.0	38.9	50.0	69.0
											m 0exp *，pg	11.6	3.95	1.92	1.172	0.783	0.630	0.526	0.407
	THGA	T(K)	1600	1700	1800	1900	2000	2100	2200	2300
m 0cal.pg											0.448	0.490	0.534	0.580	0.624	0.674	0.723	0.773
		ε A’％	3.6	11.6	26.0	46.3	74.6	100	100	100
m 0exp *，pg											12.4	4.22	2.054	1.253	0.836	0.674	0.723	0.773
		HGA	T(K)	2400	2500	2600	2700	2800	2900	3000										3100
m 0cal.pg	0.299										0.318	0.338	0.358	0.378	0.399	0.420	0.441
			ε A’％	100	100	100	100	100	100	100									100
m 0exp *，pg	0.299										0.318	0.338	0.358	0.378	0.399	0.420	0.441
			THGA	T(K)	2400	2500	2600	2700	2800	2900									3000	3100
m 0cal.pg	0.822	0.847									0.930	0.985	1.040	1.097	1.155	1.213
				ε A’％	100	100	100	100	100	100								100	100
m 0exp *，pg	0.822	0.847									0.930	0.985	1.040	1.097	1.155	1.213

Table 1 is 62 ms of element under different temperatures T (K) 6. ₀Cal, ε _A'=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value

(3) (3) Ca 422.7nm R z，PM＝0.94 R z，AM＝0.95
											HGA	T(K)	1900	2000	2100	2200	2300	2400	2500
m 0cal.pg	0.162	0.174	0.186	0.198	0.212	0.227	0.239
										ε A’％		15.7	19.2	25.1	32.4	41.1	44.8	47.9
m 0exp *，pg	1.035	0.905	0.741	0.611	0.516	0.507	0.499
										THGA		T(K)	1900	2000	2100	2200	2300	2400	2500
m 0cal.pg	0.446	0.479	0.512	0.505	0.583	0.624	0.657
											ε A’％	25.0	33.6	41.2	45.6	50.7	56.4	70.0
m 0exp *，pg	1.784	1.447	1.242	1.196	1.150	1.106	0.938
											HGA	T(K)	2600	2700	2800	2900	3000	3100	3200
m 0cal.pg	0.252	0.266	0.281	0.295	0.310	0.325	0.341
										ε A’％		50.5	53.3	56.3	59.1	62.1	65.1	68.3
m 0exp *，pg	0.499	0.499	0.499	0.499	0.499	0.499	0.499
										THGA		T(K)	2700	2700	2800	3000	3000	3100	3200
m 0cal.pg	0.732	0.732	0.773	0.853	0.853	0.894	0.938
											ε A’％	78.0	78.0	82.4	90.9	90.9	95.3	100
m 0exp *，pg	0.938	0.938	0.938	0.938	0.938	9.938	0.938
											(3) (4) Sr 460.7nm R z，PM＝0.98 R z，AM＝0.98
HGA	T(K)	1900	2000	2100	2200	2300	2400	2800
											m 0cal.pg	0.202	0.216	0.231	0.246	0.262	0.271	0.293
	ε A’％	10.8	15.4	18.9	22.2	28.6	36.5	41.0
											m 0exp *，pg	1.875	1.401	1.224	1.109	0.917	0.742	0.715
	THGA	T(K)	1900	2000	2100	2200	2300	2400	2500
m 0cal.pg											0.556	0.594	0.635	0.677	0.721	0.745	0.806
		ε A’％	14.5	19.6	25.2	2.32	36.8	39.2	44.0
m 0exp *，pg											3.84	3.03	2.52	2.04	1.96	1.90	1.83
		HGA	T(K)	2600	2700	2800	2900	3000	3100	3200
m 0cal.pg	0.309										0.326	0.341	0.360	0.378	0.397	0.417
			ε A’％	44.6	48.9	51.1	54.0	56.7	59.5	62.5
m 0exp *，pg	0.693										0.667	0.667	0.667	0.667	0.667	0.667
			THGA	T(K)	2600	2700	2700	2800	3100	3100									3200
m 0cal.pg	0.850	0.897									0.897	0.938	1.092	1.092	1.147
				ε A’％	46.4	48.9	48.9	51.1	59.5	59.5								62.5
m 0exp *，pg	1.83	1.83									1.83	1.83	1.83	1.83	1.83

Table 1 is 62 ms of element under different temperatures T (K) 7. ₀Cal, ε _A'=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value

(3) (5) Ba 553.5nm R z，PM＝0.96 R z，AM＝0.98
											HGA	T(K)	2200	2300	2400	2500	2600	2700
m 0cal.pg	0.397	0.420	0.420	0.468	0.494	0.526
										ε A’％		4.45	6.75	6.75	11.5	17.3	18.4
m 0exp *，pg	8.92	6.22	6.22	4.07	2.85	2.85
										THGA		T(K)	2200	2300	2400	2500	2600	2700
m 0cal.pg	1.092	1.155	1.1551.218	1.287	1.359	1.447
											ε A’％	8.7	11.6	11.615.5	16.4	17.3	18.4
m 0exp *，pg	12.55	9.92	7.84	7.84	7.84	7.84
											HGA	T(K)	2800	2900	3000	3100	3200
m 0cal.pg	0.557	0.592	0.628	0.666	0.708
										ε A’％		19.5	20.8	22.0	23.4	24.8
m 0exp *，pg	2.82	2.85	2.85	2.85	2.85
										THGA		T(K)	2800	2900	3000	3100	3200
m 0cal.pg	1.532.	1.628	1.727	1.832	1.947
											ε A’％	19.5	20.8	22.0	23.4	24.8
m 0exp *，pg	7.84	7.84	7.84	7.84	7.84
											(4) (1) Zn 213.9nm R z，PM＝0.84 R z，AM＝0.88
HGA	T(K)	1300	1400	1500	1600	1700	1800	1900	2000	2100
											m 0cal.pg	0.226	0.252	0.281	0.305	0.333	0.363	0.392	0.423	0.454
	ε A’％	100	100	100	100	100	100	100	100	100
											m 0exp *，pg	0.226	0.252	0.281	0.305	0.333	0.363	0.392	0.423	0.454
	THGA	T(K)	1300	1400	1500	1600	1700	1800	1900	2000											2100
m 0cal.pg											0.487	0.543	0.606	0.657	0.718	0.782	0.845	0.912	0.978
		ε A’％	100	100	100	100	100	100	100	100										100
m 0exp *，pg											0.487	0.546	0.606	0.657	0.718	0.782	0.845	0.912	0.978
		HGA	T(K)	2200	2300	2400	2500	2600	27010	2800										2900	3000
m 0cal.pg	0.486										0.519	0.553	0.587	0.622	0.658	0.695	0.732	0.770
			ε A’％	100	100	100	100	100	100	100									100	100
m 0exp *，pg	0.486										0.519	0.553	0.587	0.622	0.658	0.695	0.732	0.770
			THGA	T(K)	2200	2300	2400	2500	2600	2700									2800	2900	3000
m 0cal.pg	1.047	1.118									1.192	1.265	1.340	1.418	1.498	1.577	1.659
				ε A’％	100	100	100	100	100	100								100	100	100
m 0exp *，pg	1.047	1.118									1.192	1.265	1.340	1.418	1.498	1.577	1.659

Table 1 is 62 ms of element under different temperatures T (K) 8. ₀Cal, ε _A'=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value

(4) (2) Cd 228.8nm R z，PM＝0.789 R z，AM＝0.833
											HGA	T(K)	1300	1400	1500	1600	1700	1800	1900	2000	2100
m 0cal.pg	0.300	0.331	0.363	0.396	0.429	0.464	0.499	0.534	0.570
										ε A’％		79.3	89.2	100	100	100	100	100	100	100
m 0exp *，pg	0.378	0.371	0.363	0.396	0.429	0.464	0.499	0.534	0.570
										THGA		T(K)	1300	1400	1500	1600	1700	1800	1900	2000	2100
m 0cal.pg	0.647	0.713	0.782	0.853	0.924	1.000	1.075	1.151	1.228
											ε A’％	100	100	100	100	100	100	100	100	100
m 0exp *，pg	0.647	0.713	0.782	0.853	0.924	1.000	1.075	1.151	1.228
											HGA	T(K)	2200	2300	2400	2500	2600	2700	2800	2900	3000
m 0cal.pg	0.607	0.644	0.682	0.720	0.759	0.799	0.839	0.879	0.920
										ε A’％		100	100	100	100	100	100	100	100	100
m 0exp *，pg	0.607	0.644	0.682	0.720	0.729	0.799	0.839	0.879	0.920
										THGA		T(K)	2200	2300	2400	2500	2600	2700	2800	2900	3000
m 0cal.pg	1.308	1.388	1.470	1.550	1.636	1.722	1.808	1.894	1.953
											ε A’％	100	100	100	100	100	100	100	100	100
m 0exp *，pg	1.308	1.388	1.470	1.550	1.636	1.722	1.808	1.894	1.983
											(4) (3) Hg 253.6nm R z，PM＝0.70 R z，AM＝0.70
HGA	T(K)	1300	1400	1500	1600	1700	1800	1900	2000	2100
											m 0cal.pg	62	69	77	85	94	103	113	123	134
	ε A’％	100	100	100	100	100	100	100	100	100
											m 0exp *，pg	62	69	77	85	94	103	113	123	134
	THGA	T(K)	1300	1400	1500	1600	1700	1800	1900	2000											2100
m 0cal.pg											134	149	166	184	202	222	243	265	288
		ε A’％	100	100	100	100	100	160	100	100										100
m 0exp *，pg											134	149	166	184	202	222	243	265	288
		HGA	T(K)	2200	2300	2400	2500	2600	2700	2800										2900	3000
m 0cal.pg	145										157	169	182	195	210	225	240	257
			ε A’％	100	100	100	100	100	100	100									100	100
m 0exp *，pg	145										157	169	182	195	210	225	240	257
			THGA	T(K)	2200	2300	2400	2500	2600	2700									2800	2900	3000
m 0cal.pg	312	338									364	392	421	452	484	518	554
				ε A’％	100	100	100	100	100	100								100	100	100
m 0exp *，pg	312	338									364	392	421	452	484	518	554

Table 1 is 62 ms of element under different temperatures T (K) 9. ₀Cal, ε _A'=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value

(5) (1) Al309.3nm R z，PM＝0.75 R z，AM＝0.90
											HGA	T(K)	1800	1900	2000	2100	2200	2300	2400
m 0cal.pg	3.38	3.69	4.01	4.34	4.67	5.03	5.38
										ε A’％		1.7	7.0	12.9	21.2	35.0	51.7	73.7
m 0exp *，pg	1.99	52.7	31.1	20.5	13.3	9.72	7.30
										THGA		T(K)	1800	1900	2000	2100	2200	2300	2400
m 0cal.pg	9.30	10.2	11.0	11.9	12.8	13.8	14.8
											ε A’％	7.2	13.2	21.8	36.4	53.5	76.8	82.2
m 0exp *，pg	130	76.7	50.5	32.8	24.8	18.0	18.0
											HGA	T(K)	2500	2600	2700	2800	2900	3000	3100
m 0cal.pg	5.76	6.13	6.51	6.92	7.32	7.74	8.17
										ε A’％		78.9	84.0	89.2	94.5	100	100	100
m 0exp *，pg	7.30	7.30	7.31	7.32	7.32	7.74	8.17
										THGA		T(K)	2500	2600	2700	2800	2900	3000	3100
m 0cal.pg	15.8	16.9	18.0	19.0	20.1	21.3	22.5
											ε A’％	88.0	93.5	100	100	100	100	100
m 0exp *，pg	18.0	18.0	18.0	19.0	20.1	21.3	22.5
											(5) (2) Ga 287.4nm R z，PM＝0.70 R z，AM＝0.70
HGA	T(K)	1500	1600	1700	1800	1900	2000	2100	2200	2300
											m 0cal.pg	3.07	3.48	3.93	4.39	4.88	5.52	5.93	6.49	7.07
	ε A’％	1.9	5.0	7.6	10.7	15.2	24.3	35.9	49.4	61.4
											m 0exp *，pg	162	69.6	21.7	41.0	32.1	22.7	16.5	13.1	11.5
	THGA	T(K)	1500	1600	1700	1800	1900	2000	2100	2200											2300
m 0cal.pg											8.44	9.57	10.8	12.1	13.4	15.2	16.3	17.9	19.4
		ε A’％	3.8	6.8	9.6	13.0	19.1	27.8	34.6	44.4										61.4
m 0exp *，pg											222	141	112	92.8	70.3	54.6	47.1	40.2	31.7
		HGA	T(K)	2400	2500	2600	2700	2800	2900	3000										3100
m 0cal.pg	7.66										8.29	8.95	9.61	10.3	11.0	11.7	12.5
			ε A’％	71.6	79.0	86.9	95.1	100	100	100									100
m 0exp *，pg	10.7										10.5	10.3	10.1	10.3	11.0	11.7	12.5
			THGA	T(K)	2400	2500	2600	2700	2800	2900									3000	3100
m 0cal.pg	21.1	22.8									24.6	26.4	28.3	30.3	32.3	34.4
				ε A’％	72.4	78.6	85.9	93.2	100	100								100	100
m 0exp *，pg	29.1	29.0									28.6	28.3	28.3	30.3	32.3	34.4

Table 1 is 62 ms of element under different temperatures T (K) 10. ₀Cal, ε _A'=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value

(5) (3) In 303.9nm R z，PM＝0.82 R z，AM＝0.91
											HGA	T(K)	1300	1400	1500	1600	1700	1800	1900	2000	2100
m 0cal.pg	3.36	3.78	4.22	4.69	5.19	5.70	6.30	6.80	7.40
										ε A’％		2.8	6.1	13.4	29.7	5.16	69.6	83.1	88.1	94.2
m 0exp *，pg	1200	62.0	31.5	15.8	10.1	8.19	7.58	7.72	7.82
										THGA		T(K)	1300	1400	1500	1600	1700	1800	1900	2000	2100
m 0cal.pg	8.24	10.4	11.6	12.9	14.3	15.7	17.3	18.7	20.4
											ε A’％	4.9	13.1	29.1	46.3	64.3	73.3	87.5	93.0	100
m 0exp *，pg	189	79.4	39.9	27.9	23.2	21.4	19.8	20.1	20.4
											HGA	T(K)	2200	2300	2400	2500	2600	2700	2800	2900	3000
m 0cal.pg	8.00	8.70	9.40	10.0	10.8	11.5	12.3	13.0	13.8
										ε A’％		100	100	100	100	100	100	100	100	100
m 0exp *，pg	8.00	8.70	9.40	10.0	10.8	11.5	12.3	13.0	13.8
										THGA		T(K)	2200	2300	2400	2500	2600	2700	2800	2900	3000
m 0cal.pg	22.0	23.9	25.9	27.5	29.7	31.6	33.8	35.8	38.0
											ε A’％	100	100	100	100	100	100	100	100	100
m 0exp *，pg	22.0	23.9	25.9	27.5	29.7	31.6	33.8	35.8	38.0
											(5) (4) Tl276.8nm R z，PM＝0.56 R z，AM＝0.66
HGA	T(K)	1300	1400	1500	1600	1700	1800	1900	2000	2100
											m 0cal.pg	6.1	6.7	7.2	7.7	8.3	8.9	9.4	10.0	10.6
	ε A’％	56	79	91	100	100	100	100	100	100
											m 0exp *，pg	10.9	8.5	7.9	7.7	8.3	8.9	9.4	10.0	10.6
	THGA	T(K)	1300	1400	1500	1600	1700	1800	1900	2000											2100
m 0cal.pg											16.8	18.4	19.8	21.2	22.8	24.5	25.9	27.5	29.2
		ε A’％	68	89	100	100	100	100	100	100										100
m 0exp *，pg											24.7	20.7	19.8	21.2	22.8	24.5	25.9	27.5	29.2
		HGA	T(K)	2200	2300	2400	2500	2600	2700	2800										2900	3000
m 0cal.pg	11.2										11.8	12.5	13.1	13.8	14.5	15.2	15.8	16.6
			ε A’％	100	100	100	100	100	100	100									100	100
m 0exp *，pg	11.2										11.8	12.5	13.1	13.8	14.5	15.2	15.8	16.6
			THGA	T(K)	2200	2300	2400	2500	2600	2700									2800	2900	3000
m 0cal.pg	30.8	32.5									34.4	36.0	38.0	39.9	41.8	43.5	45.7
				ε A’％	100	100	100	100	100	100								100	100	100
m 0exp *，pg	30.8	32.5									3.44	34.4	380	39.9	41.8	43.5	45.7

(11) 62 ms of element under different temperatures T (K) of table 1 ₀Cal, ε _A'=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value

(6) (1) Ge 265.1nm R z，PM＝0.82 R z，AM＝0.91
											HGA	T(K)	2300	2400	2500	2600	2700
m 0cal.pg	8.1	8.6	9.0	9.6	10.1
										ε A’％		5.8	18.1	30.1	41.5	59.2
m 0exp *，pg	140	47.5	29.9	23.1	17.1
										THGA		T(K)	2300	2400	2500	2600	2700
m 0cal.pg	22.3	23.7	24.8	26.4	27.8
											ε A’％	17.5	28.3	38.8	53.5	76.4
m 0exp *，pg	127	83.7	63.9	49.3	36.4
											HGA	T(K)	2800	2900	3000	3100	3200
m 0cal.pg	10.6	11.1	11.6	12.2	12.6
										ε A’％		69.3	77.8	87.1	91.7	94.7
m 0exp *，pg	15.3	14.3	13.3	13.3	13.3
										THGA		T(K)	2800	2900	3000	3100	3200
m 0cal.pg	29.2	30.5	31.9	33.6	34.7
											ε A’％	82.5	87.1	91.9	96.8	100
m 0exp *，pg	35.4	35.0	34.7	34.7	34.7
											(6) (2) Si 251.6nm R z，PM＝0.94 R z，AM＝0.98
HGA	T(K)	2300	240	2500	2600	2700
											m 0cal.pg	9.5	10.2	10.9	11.6	12.3
	ε A’％	20.1	34.6	57.1	68.6	82.5
											m 0exp *，pg	47.3	29.5	19.1	16.9	14.9
	THGA	T(K)	2300	2400	2500	2600	2700
m 0cal.pg											261	28.1	30.0	31.9	33.8
		ε A’％	28.1	51.6	67.1	74.2	82.5
m 0exp *，pg											92.9	24.5	44.7	43.0	41.0
		HGA	T(K)	2800	2900	3000	3100	3200
m 0cal.pg	13.0										13.8	14.6	15.4	16.3
			ε A’％	86.7	91.4	95.4	100	100
m 0exp *，pg	15.0										15.1	15.3	15.4	16.3
			THGA	T(K)	2800	2900	3000	3100	3200
m 0cal.pg	35.8	38.0									40.2	42.4	44.8
				ε A’％	86.7	91.4	95.4	100	100
m 0exp *，pg	41.3	41.6									42.1	42.4	44.8

(12) 62 ms of element under different temperatures T (K) of table 1 ₀Cal, ε _A'=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value

(6) (3) Sn 286.3nm R z，PM＝0.97 R z，AM＝0.98
											HGA	T(K)	1500	1600	1700	1800	1900	2000	2100	2200	2300
m 0cal.pg	3.01	3.90	4.59	5.36	6.25	7.19	8.22	9.39	10.7
										ε A’％		2.3	11.0	21.0	25.5	31.1	35.8	41.3	47.2	53.9
m 0exp *，pg	131	35.5	21.9	21.0	20.2	20.1	19.9	19.9	19.8
										THGA		T(K)	1500	1600	1700	1800	1900	2000	2100	2200	2300
m 0cal.pg	8.3	10.7	12.6	14.7	17.2	19.8	22.6	25.8	29.4
											ε A’％	6.0	17.2	25.2	29.4	34.4	39.6	45.2	51.6	58.8
m 0exp *，pg	138	62.2	50.0	50.0	50.0	50.0	50.0	20.0	50.0
											HGA	T(K)	2400	2500	2600	2700	2800	2900	3000	3100
m 0cal.pg	12.0	13.5	15.2	17.0	18.8	20.8	23.8	26.1
										ε A’％		60.7	67.5	74.0	83.0	92.4	100	100	100
m 0exp *，pg	19.8	20.0	20.54	20.5	20.3	20.8	23.8	26.1
										THGA		T(K)	2400	2500	2600	2700	2800	2900	3000	3100
m 0cal.pg	33.0	37.2	41.7	46.7	51.7	57.1	63.3	68.8
											ε A’％	66.0	744.4	83.4	93.4	100	100	100	100
m 0exp *，pg	50.0	50.0	50.0	50.0	51.7	57.1	63.3	68.8
											(6) (4) Pb 283.3nm R z，PM＝0.90 R z，AM＝0.91
HGA	T(K)	1300	1400	1500	1600	1700	1800	1900	2000	2100
											m 0cal.pg	4.36	4.81	5.28	5.77	6.30	6.80	7.40	7.90	8.60
	ε A’％	15.0	42.0	56.8	62.7	38.5	73.9	80.4	85.9	93.5
											m 0exp *，pg	29.1	11.4	9.3	9.2	9.2	9.2	9.2	9.2	9.2
	THGA	T(K)	1300	1400	1500	1600	1700	1800	1900	2000											2100
m 0cal.pg											12.0	13.2	14.5	15.9	17.3	18.7	20.4	21.7	23.7
		ε A’％	36.0	52.5	80.0	100	100	100	100	100										100
m 0exp *，pg											33.3	25.1	18.1	15.9	17.3	18.7	20.4	21.7	23.7
		HGA	T(K)	2200	2300	2400	2500	2600	2700	2800										2900	3000
m 0cal.pg	9.20										9.90	10.6	11.4	12.2	13.1	14.0	15.0	16.0
			ε A’％	93.9	93.4	93.8	93.6	93.8	93.5	100									100	100
m 0exp *，pg	9.8										10.6	11.3	12.2	13.0	14.0	14.0	15.0	16.0
			THGA	T(K)	2200	2300	2400	2500	2600	2700									2800	2900	3000
m 0cal.pg	25.3	27.2									29.2	31.4	33.6	36.0	38.5	41.3	44.0
				ε A’％	100	100	100	100	100	100								100	100	100
m 0exp *，pg	25.3	27.2									29.2	31.4	33.6	36.0	38.5	41.3	44.0

(13) 62 ms of element under different temperatures T (K) of table 1 ₀Cal, ε _A'=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value

(7) (1) P 213.6nm R z，PM＝0.70 R z，AM＝0.70
											HGA	T(K)	2300	2400	2500	2600	2700	2800
m 0cal.ng	0.63	0.83	1.10	1.44	1.89	2.46
										ε A’％		4.0	20.0	35.5	46.5	61.0	79.4
m 0exp *，ng	15.8	4.16	3.10	3.10	3.10	3.10
										THGA		T(K)	2300	2400	2500	2600	2700	2800
m 0cal.ng	1.73	2.29	3.02	3.96	5.19	6.77
											ε A’％	10.0	26.5	35.0	46.0	60.0	78.0
m 0exp *，ng	17.3	8.65	8.62	8.62	8.64	8.74
											HGA	T(K)	2850	2900	3000	3100	3200
m 0cal.ng	2.81	3.21	4.16	5.41	7.00
										ε A’％		90.6	100	100	100	100
m 0exp *，ng	3.10	3.21	4.16	5.41	7.00
										THGA		T(K)	2850	2900	3000	3100	3200
m 0cal.ng	7.74	8.83	11.45	14.89	19.24
											ε A’％	87.9	100	100	100	100
m 0exp *，ng	8.80	8.83	11.45	14.89	19.24
											(7) (2) As 193.7nm R z，PM＝0.52 R z，AM＝0.89
HGA	T(K)	1800	1900	2000	2100	2200	2300	2400
											m 0cal.pg	4.58	8.835.02	5.47	5.94	6.42	6.92	7.49
	ε A’％	12.0	32.5	46.0	54.4	59.1	64.1	71.3
											m 0exp *，pg	38.2	15.5	11.9	10.9	10.9	10.8	10.5
	THGA	T(K)	1800	1900	2000	2100	2200	2300	2400
m 0cal.pg											12.6	13.8	15.0	16.3	17.7	19.0	20.6
		ε A’％	31.1	54.8	62.9	70.3	83.5	100	100
m 0exp *，pg											40.5	25.2	24.2	23.2	21.2	19.0	20.6
		HGA	T(K)	2500	2600	2700	2800	2900	3000	3100
m 0cal.pg	7.97										8.52	9.10	9.68	10.3	10.9	11.6
			ε A’％	77.4	79.9	85.0	90.0	95.1	100	100
m 0exp *，pg	10.3										10.7	10.7	10.8	10.8	10.9	11.6
			THGA	T(K)	2500	2600	2700	2800	2900	3000									3100
m 0cal.pg	21.9	23.4									25.0	26.6	28.3	30.0	31.8
				ε A’％	100	100	100	100	100	100								100
m 0exp *，pg	21.9	23.4									25.0	26.6	28.3	30.0	31.8

(14) 62 ms of element under different temperatures T (K) of table 1 ₀Cal, ε _A'=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value

(7) (3) Sb 217.6nm R z，PM＝0.54 R z，AM＝0.95
											HGA	T(K)	1400	1500	1600	1700	1800	1900	2000	2100	2200
m 0cal.pg	4.6	5.2	5.7	6.3	7.1	7.7	8.2	8.9	9.7
										ε A’％		5.0	15.0	24.7	40.8	67.0	72.5	77.4	84.0	91.9
m 0exp *，pg	92	34.7	23.1	15.4	10.6	10.6	10.6	10.6	10.6
										THGA		T(K)	1400	1500	1600	1700	1900	1900	2000	2100	2200
m 0cal.pg	12.7	14.3	15.7	17.3	21.2	21.2	22.6	24.5	26.7
											ε A’％	15.0	25.2	36.3	56.8	100	100	100	100	100
m 0exp *，pg	84.7	56.7	43.3	30.5	21.2	21.2	22.6	24.5	26.7
											HGA	T(K)	2300	2400	2500	2600	2800	2800	2900	3000
m 0cal.pg	10.4	11.1	11.9	12.7	14.5	14.5	15.4	16.3
										ε A’％		91.3	91.8	92.0	91.6	91.6	91.6	91.8	91.6
m 0exp *，pg	11.4	12.1	12.9	13.9	15.8	15.8	16.8	17.8
										THGA		T(K)	2300	2400	2500	2600	2800	2800	2900	3000
m 0cal.pg	28.6	30.5	32.7	34.9	39.9	39.9	42.4	44.8
											ε A’％	100	100	100	100	100	100	100	100
m 0exp *，pg	28.6	30.5	32.7	34.9	39.9	39.9	42.4	44.8
											(7) (4) Bi 306.8nm R z，PM＝0.144 R z，AM＝0.70
HGA	T(K)	1300	1400	1500	1600	1700	1800	1900	2000	2100
											m 0cal.pg	9.2	10.2	11.2	12.3	13.4	14.5	15.7	17.0	18.2
	ε A’％	5.4	17.0	38.0	58.3	63.2	69.0	74.8	81.0	87.5
											m 0exp *，pg	184	61.0	29.5	21.0	21.0	21.0	21.0	21.0	21.0
	THGA	T(K)	1300	1400	1500	1600	1700	1800	1900	2000											2100
m 0cal.pg											25.3	28.1	30.8	33.8	36.9	39.9	43.2	46.8	50.1
		ε A’％	16.0	37.1	61.6	67.6	73.8	79.8	86.4	93.6										100
m 0exp *，pg											158	75.7	50.6	50.0	50.0	50.0	50.0	50.0	50.1
		HGA	T(K)	2200	2300	2400	2500	2600	2700	2800										2900	3000
m 0cal.pg	19.6										20.9	22.4	23.9	25.5	27.1	28.7	30.4	32.3
			ε A’％	93.3	100	100	100	100	100	100									100	100
m 0exp *，pg	21.0										20.9	22.4	23.9	25.5	27.1	28.7	30.9	32.3
			THGA	T(K)	2200	2300	2400	2500	2600	2700									2800	2900	3000
m 0cal.pg	53.9	57.5									61.6	65.7	70.1	74.5	78.9	83.6	88.8
				ε A’％	100	100	100	100	100	100								100	100	100
m 0exp *，pg	53.9	57.5									61.6	65.7	70.1	74.5	78.9	83.6	88.8

(15) 62 ms of element under different temperatures T (K) of table 1 ₀Cal, ε _A'=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value

(8) (1) Se 196.0nm R z，PM＝0.52 R z，AM＝0.88
											HGA	T(K)	1600	1700	1800	1900	2000	2100	2200	2300
m 0cal.pg	4.4	4.9	5.5	6.3	7.3	7.3	8.0	8.7
										ε A’％		3.1	7.3	26.8	42.0	67.3	67.3	75.5	80.4
m 0exp *，pg	142	67.1	20.5	15.0	10.8	10.8	10.8	10.8
										THGA		T(K)	1600	1700	1800	1900	2200	2100	2200	2300
m 0cal.pg	12.1	13.5	15.1	17.3	22.0	20.1	22.0	23.9
											ε A’％	6.8	23.5	38.1	52.0	82.7	70.5	82.7	89.5
m 0exp *，pg	177	57.5	39.6	33.3	26.6	28.5	26.6	26.6
											HGA	T(K)	2400	2500	2600	2700	3000	2900	3000
m 0cal.pg	9.4	10.2	10.9	11.8	14.5	13.5	14.5
										ε A’％		87.2	94.4	100	100	100	100	100
m 0exp *，pg	10.8	10.8	10.9	11.8	14.5	13.5	14.5
										THGA		T(K)	2400	2500	2600	2700	3000	2900	3000
m 0cal.pg	25.9	28.1	30.0	32.5	39.9	37.1	39.9
											ε A’％	97.3	100	100	100	100	100	100
m 0exp *，pg	26.6	28.1	30.0	32.5	39.9	37.1	39.9
											(8) (2) Te 214.3nm R z，PM＝0.42 R z，AM＝0.93
HGA	T(K)	1300	1400	1500	1600	1700	1800	1900	2100
											m 0cal.pg	3.8	4.3	4.8	5.3	5.9	6.4	7.1	8.3
	ε A’％	18	25	35	50	56.2	62.1	67.6	81.4
											m 0exp *，pg	21.1	17.2	13.7	10.6	10.4	10.4	10.4	10.4
	THGA	T(K)	1300	1400	1500	1600	1700	1800	1900	2100
m 0cal.pg											10.5	11.8	12.4	14.6	16.2	17.1	19.5	22.8
		ε A’％	25.0	39.0	42.9	50.5	56.1	59.2	67.2	79.4
m 0exp *，pg											42.0	30.3	28.9	28.9	28.9	28.9	28.9	28.9
		HGA	T(K)	2200	2300	2400	2500	2600	2800	2800										3000
m 0cal.pg	8.9										9.8	10.5	11.3	12.1	13.8	13.8	15.6
			ε A’％	85.6	94.2	100	100	100	100	100									100
m 0exp *，pg	10.4										10.4	10.5	11.3	12.1	13.8	13.8	15.6
			THGA	T(K)	2200	2300	2400	2500	2600	2800									2800	3000
m 0cal.pg	24.5	27.0									28.9	31.1	33.3	38.0	38.0	42.9
				ε A’％	84.8	93.1	100	100	100	100								100	100
m 0exp *，pg	28.9	28.9									28.9	31.1	33.3	38.0	38.0	42.9

(16) 62 ms of element under different temperatures T (K) of table 1 ₀Cal, ε _A'=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value

(9) (1) Cr 357.9nm R z，PM＝0.44 R z，AM＝0.88
											HGA	T(K)	1900	2000	2100	2200	2300	2400	2500
m 0cal.pg	0.841	0.922	1.007	1.095	1.186	1.293	1.384
										ε A’％		4.2	9.9	13.8	26.6	31.7	38.4	47.9
m 0exp *，pg	19.9	9.35	6.73	4.11	3.74	3.37	2.89
										THGA		T(K)	1900	2000	2100	2200	2300	2400	2500
m 0cal.pg	2.31	2.54	2.77	3.01	3.26	3.56	3.81
											ε A’％	10.4	25.1	3.83	52.1	62.1	100	100
m 0exp *，pg	22.2	10.1	7.23	5.78	2.25	3.56	3.81
											HGA	T(K)	2600	2700	2800	2900	3000	3100
m 0cal.pg	1.494	1.605	1.723	1.847	1.980	2.11
										ε A’％		62.2	76.1	82.1	57.5	94.0	100
m 0eexp *，pg	2.40	2.11	2.11	2.11	2.11	2.11
										THGA		T(K)	2600	2700	2800	2900	3000	3100
m 0cal.pg	4.11	4.41	4.74	5.08	5.45	5.81
											ε A’％	100	100	100	100	100	100
m 0exp *，pg	4.11	4.41	4.74	5.08	5.45	5.81
											(9) (2) Mn 279.5nm R z，PM＝0.46 R z，AM＝0.91
HGA	T(K)	1600	1700	1800	1900	2000	2100	2200	2300
											m 0cal.pg	0.744	0.813	0.884	0.960	1.034	1.110	1.190	1.267
	ε A’％	8.0	13.0	26.0	48.0	67.1	78.7	84.4	89.9
											m 0exp *，pg	9.26	6.24	3.40	2.00	1.54	1.41	1.41	1.41
	THGA	T(K)	1600	1700	1800	1900	2000	2100	2200	2300
m 0cal.pg											2.05	2.24	2.43	2.64	2.84	3.05	3.27	3.48
		ε A’％	20	33	65	100	100	100	100	100
m 0exp *，pg											10.25	6.79	3.74	2.64	2.84	3.05	3.27	3.48
		HGA	T(K)	2400	2500	2600	2700	2800	2900	3000										3100
m 0cal.pg	1.348										1.43	1.51	1.59	1.68	1.76	1.85	1.94
			ε A’％	95.6	100	100	100	100	100	100									100
m 0exp *，pg	1.41										1.43	1.51	1.59	1.68	1.76	1.85	1.94
			THGA	T(K)	2400	2500	2600	2700	2800	2900									3000	3100
m 0cal.pg	3.71	3.93									4.15	4.38	4.62	4.85	5.09	5.34
				ε A’％	100	100	100	100	100	100								100	100100
m 0exp *，pg	3.71	3.93									4.15	4.38	4.62	4.85	5.09	5.34

(17) 62 ms of element under different temperatures T (K) of table 1 ₀Cal, ε _A'=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value

(9) (3) Fe 248.3nm R z，PM＝0.68 R z，AM＝0.92
											HGA	T(K)	1600	1700	1800	1900	2000	2100	2200	2300
m 0cal.pg	1.16	1.31	1.48	1.65	1.83	2.01	2.20	2.40
										ε A’％		2.24	5.95	9.3	14.1	22.0	28.1	39.0	49.9
m 0exp *，pg	51.8	22.0	16.0	11.7	8.30	7.15	5.64	4.81
										THGA		T(K)	166	1700	1800	1900	2000	2100	2200	2300
m 0cal.pg	3.19	3.60	4.07	4.54	5.03	5.53	6.05	6.60
											ε A’％	4.5	11.9	18.6	28.2	44.0	56.2	78.0	100
m 0exp *，pg	70.9	30.2	21.9	16.1	11.4	9.84	7.74	6.60
											HGA	T(K)	2400	2500	2600	2700	2800	2900	3000	3100
m 0cal.pg	2.61	2.83	3.05	3.28	3.53	3.78	4.05	4.32
										ε A’％		74.6	81.8	89.5	95.3	100	100	100	100
m 0exp *，pg	3.50	3.46	3.46	3.44	3.53	3.78	4.05	4.32
										THGA		T(K)	2400	2600	2600	2700	2800	2900	3000	3100
m 0cal.pg	7.18	8.39	8.39	9.02	9.71	10.4	11.1	11.9
											ε A’％	100	100	100	100	100	100	100	100
m 0exp *，pg	7.18	8.39	8.39	9.02	9.71	10.4	11.1	11.9
											(9) (4) C 0240.7nm R z，PM＝0.91 R z，AM＝0.95
HGA	T(K)	1600	1700	1800	1900	2000	2100	2200	2300
											m 0cal.pg	1.37	1.56	1.77	2.00	2.25	2.52	2.80	3.10
	ε A’％	2.02	4.97	7.6	12.5	17.6	24.2	35.0	46.1
											m 0exp *，pg	67.7	31.4	23.2	16.0	12.8	10.4	8.00	6.72
	THGA	T(K)	1600	1700	1800	1900	2000	2100	2200	2300
m 0cal.pg											3.77	4.29	4.87	5.50	6.19	6.93	7.70	8.53
		ε A’％	3.3	8.4	12.7	20.9	29.4	40.4	58.5	77
m 0exp *，pg											114	51.1	38.3	26.3	21.1	17.2	13.2	11.1
		HGA	T(K)	2400	2500	2600	2700	2800	2900	3000										3100
m 0cal.pg	3.42										3.75	4.11	4.47	4.67	5.28	5.70	6.16
			ε A’％	59.8	69.4	85.6	93.1	97.3	100	100									100
m 0exp *，pg	5.72										5.40	4.80	4.80	4.80	5.28	5.70	6.16
			THGA	T(K)	2400	2500	2600	2700	280	2900									3000	3100
m 0cal.pg	9.35	10.3									11.3	12.3	12.8	14.5	15.7	16.9
				ε A’％	100	100	100	100	100	100								100	100
m 0exp *，pg	9.35	10.3									11.3	12.3	12.8	14.5	15.7	16.9

(18) 62 ms of element under different temperatures T (K) of table 1 ₀Cal, ε _A'=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value

(9) (5) Ni 232.0nm R z，PM＝0.91 R z，AM＝0.91
											HGA	T(K)	1600	1700	1800	1900	2000	2100	2200	2300
m 0cal.pg	2.16	2.43	2.74	3.07	3.42	3.78	4.17	4.58
										ε A’％		1.47	4.0	5.9	9.9	14.9	21.8	32.1	42.0
m 0exp *，pg	147	60.7	46.3	30.9	20.9	17.3	13.0	10.9
										THGA		T(K)	1600	1700	1800	1900	2000	2100	2200	2300
m 0cal.pg	5.9	6.7	7.5	8.4	9.4	10.4	11.5	12.6
											ε A’％	3.0	5.3	7.8	13.2	19.8	29.0	42.7	55.9
m 0exp *，pg	197	126	96	63.6	47.5	35.9	26.9	22.5
											HGA	T(K)	2400	2500	2600	2700	2800	2900	3000	3100
m 0cal.pg	5.05	5.47	5.92	6.41	6.94	7.45	8.02	8.60
										ε A’％		54.9	73.0	81.0	89.9	100	100	100	100
m 0exp *，pg	9.2	7.49	7.31	7.13	6.94	7.45	8.02	8.60
										THGA		T(K)	2400	2500	2600	2700	2800	2900	3000	3100
m 0cal.pg	13.9	15.0	16.3	17.6	19.1	20.5	22.1	23.7
											ε A’％	92.0	100	100	100	100	100	100	100
m 0exp *，pg	15.1	15.0	16.3	17.6	19.1	20.5	22.1	23.7
											(10) (1) Pd 246.7nm R z，PM＝0.91 R z，AM＝0.91
HGA	T(K)	1800	1900	2000	2100	2200	2300	2400
											m 0cal.pg	6.18	6.80	7.50	8.27	9.0	9.9	10.8
	ε A’％	3.29	6.83	15.9	36.9	48.9	64.3	71.3
											m 0exp *，pg	188	99.5	47.2	22.4	18.5	15.4	15.4
	THGA	T(K)	1800	1900	2000	2100	2200	2300	2400
m 0cal.pg											17.0	18.7	20.3	24.1	24.9	27.2	29.8
		ε A’％	9.2	19.7	47.5	65.8	83.6	91.0	100
m 0exp *，pg											185	94.8	43.4	36.6	29.8	29.8	29.8
		HGA	T(K)	2500	2600	2700	2800	2900	3000	3100
m 0cal.pg	11.8										12.9	14.1	15.4	16.9	18.6	20.2
			ε A’％	77.4	84.2	92.0	100	100	100	100
m 0exp *，pg	15.4										15.4	15.4	1.54	16.9	18.6	20.2
			THGA	T(K)	2500	2600	2700	2800	2900	3000									3100
m 0cal.pg	32.6	35.6									38.8	42.2	46.4	51.1	55.6
				ε A’％	100	100	100	100	100	100								100
m 0exp *，pg	32.6	35.6									38.8	42.2	46.4	51.1	55.6

(19) 62 ms of element under different temperatures T (K) of table 1 ₀Cal, ε _A'=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value

(10) (2) Pt 265.9nm R z，PM＝0.80 R z，AM＝0.80
													HGA	T(K)	2200	2300	2400	2500	2600	2700	2800	2900	3000	3100	3200
m 0cal.pg	38.1	41.6	45.1	48.1	52.4	57.5	60.5	64.6	68.8	74.2	77.6
												ε A’％		5.89	12.3	27.8	59.8	80.6	88.5	91.7	97.9	100	100	100
m 0exp *，pg	647	339	162	81.5	65.0	65.0	66.0	66.0	68.8	74.2	77.6
												THGA		T(K)	2200	2300	2400	2500	2600	2700	2800	2900	3000	3100	3200
m 0cal.pg	105	114	124	132	144	158	166	178	189	204	213
													ε A’％	14.0	31.7	70.5	82.7	100	100	100	100	100	100	100
m 0exp *，pg	751	360	176	160	144	158	166	178	189	189	213
													(10) (3) Rh 343.5nm R z，PM＝0.54 R z，AM＝0.98
HGA	T(K)	2200	2300	2400	2500	2600	2700	2800	2900	3000	3100	3200
													m 0cal.pg	545	6.01	6.60	7.20	7.84	8.53	9.25	9.99	10.8	11.6	12.5
	ε A’％	5.48	11.3	24.6	57.8	78.5	85.8	93.0	100	100	100	100
													m 0exp *，pg	99.4	53.2	26.8	12.5	9.99	9.94	9.95	9.99	10.8	11.6	12.5
	THGA	T(K)	2200	2300	2400	2500	2600	2700	2800	2900	3000	3100													3200
m 0cal.pg													15.0	16.5	18.1	19.8	21.6	23.5	25.4	27.5	29.7	31.9	34.4
		ε A’％	13.2	28.5	67.0	91.7	100	100	100	100	100	100												100
m 0exp *，pg													114	57.8	27.0	21.6	21.6	23.5	25.4	27.5	29.7	31.9	34.0
		(10) (4) Ru 349.9nm R z，PM＝0.85 R z，AM＝0.90
HGA	T(K)														2200	2300	2400	2500	2600	2700	2800	2900	3000	3100	3200
		m 0cal.pg	10.7	11.8	12.9	14.1	15.4	16.7	18.2	19.6	21.2	22.8	24.6
	ε A’％													3.07	6.35	13.8	32.6	4.38	47.4	51.7	55.7	60.2	64.8	69.9
		m 0exp *，pg	349	186	93.4	43.4	34.0	34.0	34.0	34.0	34.0	34.0	34.0
	THGA													T(K)	2200	2300	2400	2500	2600	2700	2800	3000	3100	3100	3200
m 0cal.pg		29.4	32.5	35.5	38.8	42.4	45.9	50.1	58.3	62.7	62.7	67.7
													ε A’％	7.0	15.5	36.4	50.7	55.4	60.0	65.5	76.2	82.0	82.0	88.5
m 0exp *，pg		420	210	97.4	76.5	76.5	76.5	76.5	76.5	76.5	76.5	76.5
													(10) (5) Ir 264.0nm R z，PM＝0.91 R z，AM＝0.96
HGA	T(K)	2400	2500	2600	2700	2800	2900	3000	3100	3200
													m 0cal.pg	29.0	31.5	34.2	37.1	40.2	43.2	46.6	50.3	54.3
	ε A’％	7.4	15.9	34.2	74.2	85.5	92.3	100	100	100
													m 0exp *，pg	392	198	100	50.0	47.0	46.8	46.6	50.3	54.3
	THGA	T(K)	2400	2500	2600	2700	2800	2900	3000	3100	3200
m 0cal.pg													80	87	94	102	111	119	128	138	149
		ε A’％	13.8	34.1	73.4	79.7	86.7	93.0	100	100	100
m 0exp *，pg													578	255	128	128	128	128	128	138	149

(20) 62 ms of element under different temperatures T (K) of table 1 ₀Cal, ε _{A '}=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value

(11) (1) Os 290.9nm R z，PM＝0.46 R z，AM＝0.87
											HGA	T(K)		3000	3100	3200
m 0cal.pg		40.0	43.1	46.4
										ε A’％			5.9	8.5	13.6
m 0exp *，pg		680	510	340
										THGA		T(K)	2900	3000	3100	3200
m 0cal.pg	102	110	119	128
											ε A’％	6.1	8.8	14.2	22.7
m 0exp *，pg	1670	1250	838	564
											(11) (2) B 249.8nm R z，PM＝0.57 R z，AM＝0.67
HGA	T(K)	2500	2600	2700	2800	2900	3000	3100	3200
											m 0cal.pg	16.3	17.6	18.9	20.2	21.6	23.0	24.4	25.9
	ε A’％	5.6	9.3	15.0	21.0	22.7	24.2	25.7	27.3
											m 0exp *，pg	289	190	126	96	95	95	95	95
	THGA	T(K)	2500	2600	2700	2800	2900	3000	3100	3200
m 0cal.pg											44.8	48.4	52.0	55.6	59.4	63.3	67.1	71.2
		ε A’％	11.5	18.1	27.4	29.3	31.3	33.3	35.3	37.5
m 0exp *，pg											390	267	190	190	190	190	190	190
		(12) (1) Sc 391.2nm R z，PM＝0.88 R z，AM＝0.96
HGA	T(K)												2500	2600	2700	2800	2900	3000	3100	3200
		m 0cal.pg	1.120	1.174	1.228	1.283	1.337	1.391	1.453	1.519
	ε A’％											1.3	10.7	18.9	19.7	20.6	21.4	22.4	23.4
		m 0exp *，pg	88	11.0	6.50	6.50	6.50	6.50	6.50	6.50
	THGA											T(K)	2500	2600	2700	2800	2900	3000	3100	3200
m 0cal.pg		3.08	3.23	3.38	3.53	3.68	3.83	4.00	4.18
											ε A’％	8.8	18.0	18.9	19.7	20.6	21.4	22.4	23.4
m 0exp *，pg		35.0	17.9	17.9	17.9	17.9	17.9	17.9	17.9
											(12) (2) Y 410.2nm R z，PM＝0.75 R z，AM＝0.88
HGA	T(K)	2500	2600	2700	2800	2900	3000	3100	3200
											m 0cal.pg	4.60	4.81	5.03	5.23	5.45	5.66	589	6.16
	ε A’％	3.03	6.56	14.8	15.3	16.0	16.6	17.3	18.1
											m 0exp *，pg	146.7	73.3	33.0	33.0	33.0	33.0	33.0	33.0
	THGA	T(K)	2500	2600	2700	2800	2900	3000	3100	3200
m 0cal.pg											12.7	13.2	13.8	14.4	15.0	15.6	16.2	16.9
		ε A’％	6.3	14.6	14.8	15.3	16.0	16.6	17.3	18.1
m 0exp *，pg											201	90.8	90.8	90.8	90.8	90.8	90.8	90.8

(21) 62 ms of element under different temperatures T (K) of table 1 ₀Cal, ε _{A '}=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value

(12) (3) La 550.1nm R z，PM＝0.94 R z，AM＝0.96
											HGA	T(K)	2500	2600	2700	2800	2900	3000	3100	3200
m 0cal.pg	50.3	54.8	59.7	65.0	70.3	75.9	82.1	88.4
										ε A’％		1.14	2.5	15.2	11.8	12.8	13.8	14.9	16.1
m 0exp *，pg	4430	2180	1400	550	550	550	550	550
										THGA		T(K)	2500	2600	2700	2800	2900	3000	3100	3200
m 0cal.pg	138	151	164	179	193	209	226	243
											ε A’％	2.8	5.4	10.8	11.8	12.8	13.8	14.9	16.1
m 0exp *，pg	4900	2800	1513	1513	1513	1513	1513	1513
											(12) (4) Le 463.2nm R z，PM＝0.65 R z，AM＝0.80
HGA	T(K)	2500	2600	2700	2800	2900	3000	3100	3200
											m 0cal.ng	1.546	1.653	1.77	1.90	2.04	3.19	2.30	2.43
	ε A’％	4.2	9.0	17.7	19.0	10.0	2.19	23.0	10.0
											m 0exp *，ng	36.7	18.3	10.0	10.0	20.4	10.0	10.0	3200
	THGA	T(K)	2500	2600	2700	2800	2900	3000	3100	6.68
m 0cal.ng											4.24	4.55	4.88	5.22	5.61	6.01	6.32	24.3
		ε A’％	8.1	16.5	17.7	19.0	20.4	21.9	23.0	27.5
m 0exp *，ng											52.0	27.5	27.5	27.5	27.5	27.5	27.5
		(12) (5) Pr 495.1nm R z，PM＝0.75 R z，AM＝0.94
HGA	T(K)												2500	2600	2700	2800	2900	3000	3100	3200
		m 0cal.pg	51.9	55.5	59.3	63.4	67.5	71.7	75.9	80.2
	ε A’％											1.5	3.5	7.4	12.7	13.6	14.3	15.2	16.0
		m 0exp *，pg	3385	1600	500	500	500	200	500	500
	THGA											T(K)	2500	2600	2700	2800	2900	3000	3100	3200
m 0cal.pg		143	153	163	174	186	197	209	221
											ε A’％	3.25	6.95	11.9	12.7	13.6	14.3	15.2	16.0
m 0exp *，pg		4400	2200	1375	1375	1375	1375	1375	1375
											(12) (6) Nd 463.4 R z，PM＝0.80 R z，AM＝0.93
HGA	T(K)	2500	2600	2700	2800	2900	3000	3100	3200
											m 0cal.pg	32.6	35.0	37.5	40.0	42.7	45.4	48.0	51.0
	ε A’％	6.15	10.0	13.4	14.3	15.3	16.2	17.1	18.2
											m 0exp *，pg	548	350	280	280	280	280	280	280
	THGA	T(K)	2500	2600	2700	2800	2900	3000	3100	3200
m 0cal.pg											89.7	96.3	103	110	117	125	132	140
		ε A’％	9.0	12.5	13.4	14.3	15.3	16.2	17.1	18.2
m 0exp *，pg											1000	770	770	770	770	770	770	770

(22) 62 ms of element under different temperatures T (K) of table 1 ₀Cal, ε _{A '}=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value

(12) (7) Sm 429.7nm R z，PM＝0.84 R z，AM＝0.941
													HGA	T(K)	2300	2400	2500	2600	2700	2800	2900	3000	3100	3200
m 0cal.pg	108	106	104	103	102	101	101	101	101	101
												ε A’％		11.7	27.9	51.4	73.4	100	100	100	100	100	100
m 0exp *，pg	917	379	202	140	102	101	101	101	101	101
												THGA		T(K)	2300	2400	2500	2600	2700	2800	3000	3100	3100	3200
m 0cal.pg	296	290	285	283	281	279	279	278	278	278
													ε A’％	27.9	52.7	73.1	100	100	100	100	100	100	100
m 0exp *，pg	1060	550	390	283	281	279	279	278	278	278
													(12) (8) Eu 459.4nm R z，PM＝0.61 R z，AM＝0.96
HGA	T(K)	2200	2300	2400	2500	2600	2700	2800	2900	3000	3100	3200
													m 0cal.pg	3.70	3.88	4.06	4.25	4.44	4.62	4.84	5.01	5.21	5.41	5.61
	εA’％	4.03	9.35	19.7	47.0	71.5	88.9	94.7	100	100	100	100
													m 0exp *，pg	94.8	41.5	20.6	9.02	6.21	5.21	5.11	5.01	5.41	5.41	5.0
	THGA	T(K)	2200	2300	2400	2500	2600	2700	2800	2900	3100	3100													3200
m 0cal.pg													10.2	10.7	12.8	11.7	12.2	12.7	13.2	13.8	14.9	14.9	15.4
		ε A’％	8.95	19.0	53.1	71.8	82.4	88.9	94.3	100	100	100												100
m 0exp *，pg													114	56.2	24.1	16.3	14.8	14.3	14.0	13.8	14.9	14.9
		(12) (9) Gd 407.9nm R z，PM＝0.52 R z，AM＝0.80
HGA	T(K)														2500	2600	2700	2800	2900	3000	3100	3200
		m 0cal.pg	142	149	156	163	171	179	186	193
	ε A’％													3.86	9.8	19.8	26.8	28.1	29.3	30.5	31.7
		m 0exp *，pg	3667	1517	786	610	610	610	610	610
	THGA													T(K)	2500	2600	2700	2800	2900	3000	3100	3200
m 0cal.pg		389	409	428	449	471	492	512	531
													ε A’％	9.26	18.6	25.5	26.8	28.1	29.3	30.5	31.7
m 0exp *，pg		4200	2200	1678	1678	1678	1678	1978	1678
													(12) (10) Tb 432.6nm R z，PM＝0.82 R z，AM＝0.88
HGA	T(K)	2500	2600	2700	2800	2900	3000	3100	3200
													m 0cal.pg	13.7	14.6	15.5	16.4	17.3	18.3	19.3	20.4
	ε A’％	1.81	4.14	9.17	14.9	15.8	16.7	17.6	18.5
													m 0exp *，pg	759	352	169	110	110	100	1.0	110
	THGA	T(K)	2500	2600	2700	2800	2900	3000	3100	3200
m 0cal.pg													37.8	40.1	42.6	45.1	47.7	50.4	53.2	56.0
		ε A’％	3.9	8.6	14.1	14.9	15.8	16.7	17.6	18.5
m 0exp *，pg													466	303	303	303	303	303	303

(23) 62 ms of element under different temperatures T (K) of table 1 ₀Cal, ε _{A '}=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value

(12) (11) Dy 421.2nm R z，PM＝0.72 R z，AM＝0.89
													HGA	T(K)	2300	2400	2500	2600	2700	2800	2900	3000	3100	3200
m 0cal.pg	2.78	2.92	3.09	3.26	3.42	3.61	3.79	3.97	4.17	4.36
												ε A’％		2.93	6.74	17.6	18.5	19.5	20.5	21.5	22.6	23.7	24.8
m 0exp *，pg	91.7	41.9	17.0	17.0	17.0	17.0	17.0	17.0	17.0	17.0
												THGA		T(K)	2300	2400	2500	2600	2700	2800	2900	3000	3100	3200
m 0cal.pg	7.65	8.03	8.50	8.97	9.43	9.93	10.4	10.9	11.5	12.0
													ε A’％	8.7	22.6	23.9	25.2	26.5	27.9	29.3	30.7	32.2	33.7
m 0exp *，pg	87.7	35.6	35.6	35.6	35.6	35.6	35.6	35.6	35.6	55.6
													(12) (12) Ho 410.4nm R z，PM＝0.94 R z，AM＝0.96
HGA	T(K)	2300	2400	2500	2600	2700	2800	2900	3000	3100	3200
													m 0cal.pg	3.05	3.22	3.39	3.58	3.76	3.94	4.14	45.3	4.74	4.96
	ε A’％	2.93	7.08	18.2	19.2	20.2	21.2	22.3	24.4	25.5	26.7
													m 0exp *，pg	101	440	18.0	18.0	18.0	18.0	18.0	18.0	18.0	18.0
	THGA	T(K)	2300	2400	2500	2600	2800	2800	2900	2900	3100	3200
m 0cal.pg													8.39	8.86	9.32	9.85	10.8	10.8	11.4	11.4	13.0	13.6
		ε A’％	9.2	23.6	24.9	26.3	28.9	28.9	30.4	30.4	34.8	36.4
m 0exp *，pg													91.6	37.5	37.5	37.5	37.5	37.5	37.5	37.5	37.5	37.5
		(12) (13) Er 400.8nm R z，PM＝0.91 R z，AM＝0.96
HGA	T(K)														2300	2400	2500	2600	2700	2800	2900	3000	3100	3200
		m 0cal.pg	2.44	2.58	2.72	2.86	3.01	3.16	3.32	3.49	3.66	3.83
	ε A’％													2.27	5.75	15.5	16.3	17.1	18.0	18.9	19.8	20.8	21.8
		m 0exp *，pg	111	46.4	17.6	17.6	17.6	17.6	17.6	17.6	17.6	17.6
	THGA													T(K)	2300	2400	2500	2600	2700	2800	2900	3000	3100	3200
m 0cal.pg		6.71	7.10	7.48	7.87	8.44	8.69	9.13	9.60	10.1	10.5
													ε A’％	6.45	18.0	19.0	20.0	21.4	22.1	23.2	24.4	25.6	26.7
m 0exp *，pg		104	39.4	39.4	39.4	39.4	39.4	39.4	39.4	39.4	39.4
													(12) (14) Tm 371.8nm R z，PM＝0.91 R z，AM＝0.96
HGA	T(K)	2200	2300	2400	2500	2600	2700	2800	2900	3000	3100	3200
													m 0cal.pg	2.10	2.24	2.39	2.53	2.68	2.84	3.00	3.16	3.33	3.50	3.68
	ε A’％	6.7	22.9	60.5	81.6	86.5	91.6	96.8	100	100	100	100
													m 0exp *，pg	31.4	9.78	3.95	3.10	3.10	3.10	3.10	3.16	3.33	3.50	3.68
	THGA	T(K)	2200	2300	2400	2500	2600	2700	2800	2900	3000	3100													3200
m 0cal.pg													5.78	6.16	6.57	6.96	7.37	7.81	8.25	8.69	9.16	9.63	10.1
		ε A’％	18.1	56.7	77.0	81.6	86.5	91.6	9.55	100	100	100												100
m 0exp *，pg													32.0	10.9	8.53	8.53	8.53	8.53	8.64	8.69	9.16	9.63	10.1

(24) 62 ms of element under different temperatures T (K) of table 1 ₀Cal, ε _{A '}=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value

(12) (15) Yb 398.8nm R z，PM＝0.94 R z，AM＝0.96
													HGA	T(K)	2000	2100	2200	2300	2400	2500	2600
m 0cal.pg	0.717	0.753	0.789	0.825	0.861	0.897	0.34
												ε A’％		2.6	9.6	38.3	75.0	80.8	83.8	89.5
m 0exp *，pg	27.5	7.86	2.056	1.100	1.065	1.070	1.043
												THGA		T(K)	2000	2100	2200	2300	2400	2500	2600
m 0cal.pg	19.7	2.07	2.17	2.27	2.37	2.47	2.57
													ε A’％	34.1	71.9	75.3	78.8	82.2	85.7	89.2
m 0exp *，pg	5.78	2.88	2.88	2.88	2.88	2.88	2.88
													HGA	T(K)	2700	2800	2900	3000	3100	3200
m 0cal.pg	0.970	1.007	1.043	1.079	1.115	1.151
												ε A’％		93.0	96.5	100	100	100	100
m 0exp *，pg	1.043	1.078	1.043	1.079	1.115	1.151
												THGA		T(K)	2700	2800	2900	3000	3100	3200
m 0cal.pg	2.67	2.77	2.87	2.97	3.07	3.17
													ε A’％	92.6	96.1	100	100	100	100
m 0exp *，pg	2.88	2.88	2.87	2.97	3.07	3.17
													(12) (16) Lu 336.0nm R z，PM＝0.94 R z，AM＝0.96
HGA	T(K)	2500	2600	2700	2800	2900	3000	3100	3200
													m 0cal.pg	90.6	92.3	93.5	95.3	97.1	98.9	101	101
	ε A’％	5.35	11.5	25.5	38.1	50.1	51.0	52.1	53.0
													m 0exp *，pg	1692	800	367	250	194	194	194	194
	THGA	T(K)	2500	2600	2700	2800	2900	3000	3100	3200
m 0cal.pg													249	254	257	262	267	272	278	283
		ε A’％	12.3	25.1	37.4	49.1	50.1	51.0	52.1	53.0
m 0exp *，pg													2030	1010	688	534	534	534	534	534
		(12) (17) U 358.5nm R z，PM＝0.49 R z，AM＝0.92
HGA	T(K)														2500	2600	2700	2800	2900	3000	3100	3200
		m 0cal.pg	612	657	704	754	809	860	912	967
	ε A’％													8.35	21.2	50.9	76.8	91.9	100	100	100
		m 0exp *，pg	7333	3100	1384	982	880	860	912	967
	THGA													T(K)	2500	2600	2700	2800	2900	3000	3100	3200
m 0cal.pg		1683	1807	1936	2074	2225	2365	2508	2659
													ε A’％	23.4	54.4	78.2	93.0	100	100	100	100
m 0exp *，pg		7192	3322	2476	2230	2225	2365	2508	2659

(25) 62 ms of element under different temperatures T (K) of table 1 ₀Cal, ε _{A '}=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value

(13) (1) i365.35nm R z，PM＝0.96 R z，AM＝0.96
													HGA	T(K)	2500	2600	2700	2800	2900	3000	3100	3200
m 0cal.pg	19.5	20.9	22.5	24.2	25.8	27.7	29.6	31.7
												ε A’％		7.77	17.8	42.5	67.0	81.4	92.3	98.7	100
m 0exp *，pg	251	117	51.2	36.1	31.7	30.0	30.0	31.7
												THGA		T(K)	2500	2600	2700	2800	2900	3000	3100	3200
m 0cal.pg	53.6	57.5	61.9	66.6	71.0	76.2	81.4	87.2
													ε A’％	79.8	85.6	92.1	100	100	100	100	100
m 0exp *，pg	67.2	67.2	67.2	66.6	71.0	76.2	81.4	87.2
													(13) (2) V 318.5nm R z，PM＝0.70 R z，AM＝0.92
HGA	T(K)	2500	2600	2700	2800	2900	3000	3100	3200
													m 0cal.pg	11.5	12.4	13.3	14.2	15.2	16.3	17.4	18.5
	ε A’％	8.4	18.0	38.6	53.8	67.6	93.7	100	100
													m 0exp *，pg	137	68.9	34.4	26.4	22.5	17.4	17.4	18.5
	THGA	T(K)	2500	2600	2700	2800	2900	3000	3100	3200
m 0cal.pg													31.6	34.1	36.6	39.1	41.8	44.8	47.8	50.9
		ε A’％	92.7	100	100	100	100	100	100	100
m 0exp *，pg													34.1	34.1	36.6	39.1	41.8	44.8	47.8	50.9
		(12) (3) Mo 313.3nm R z，PM＝0.42 R z，AM＝0.98
HGA	T(K)														2500	2600	2700	2800	2900	3000	3100	3200
		m 0cal.pg	3.35	3.59	3.84	4.09	4.36	4.63	4.91	5.19
	ε A’％													5.93	14.4	42.5	70.6	78.1	83.0	88.0	93.0
		m 0exp *，pg	56.5	25.0	9.04	5.79	5.40	5.40	5.40	5.40
	THGA													T(K)	2500	2600	2700	2800	2900	3000	3100	3200
m 0cal.pg		9.21	9.87	10.6	11.2	12.0	12.7	13.5	14.3
													ε A’％	76.8	82.3	88.3	93.3	100	100	100	100
m 0exp *，pg		12.0	12.0	12.0	12.0	12.0	12.7	13.5	14.3

(26) 62 ms of element under different temperatures T (K) of table 1 ₀Cal, ε _{A '}=m ₀Cal/m ₀Exp ^*, m ₀Exp ^*Value

(7) (4) Bi 223.1nm R z，PM＝0.275 R z，AM＝0.60
													HGA	T(K)	1300	1400	1500	1600	1700	1800	1900	2000	2100
m 0cal.pg	29.7	3.30	3.62	3.98	4.34	4.69	5.08	5.50	5.89
												ε A’％		5.4	17.0	38.0	49.6	63.2	69.0	74.8	81.0	87.5
m 0exp *，pg	59.5	19.4	9.55	8.03	6.80	6.80	6.80	6.80	6.80
												THGA		T(K)	1300	1400	1500	1600	1700	1800	1900	2000	2100
m 0cal.pg	8.19	9.09	9.97	10.9	11.9	12.9	14.0	15.1	16.2
													ε A’％	16.0	37.1	61.6	67.6	73.8	79.8	86.4	93.6	100
m 0exp *，pg	51.1	24.5	16.2	16.2	16.2	16.2	16.2	16.2	16.2
													HGA	T(K)	2200	2300	2400	2500	2600	2700	2800	2900	3000
m 0cal.pg	6.34	6.80	7.25	7.73	8.25	8.77	9.29	9.84	10.5
												ε A’％		93.3	100	100	100	100	100	100	100	100
m 0exp *，pg	6.80	6.80	7.25	7.73	8.25	8.77	9.29	9.84	10.5
												THGA		T(K)	2200	2300	2400	2500	2600	2700	2800	2900	3000
m 0cal.pg	17.4	18.6	19.9	21.3	22.7	24.1	25.5	27.1	28.7
													ε A’％	100	100	100	100	100	100	100	100	100
m 0exp *，pg	17.4	18.6	19.9	21.3	22.7	24.1	25.5	27.1	28.7
													(9) (1) Cr 359.3nm R z，PM＝0.61 R z，AM＝0.95
HGA	T(K)	1900	2000	2100	2200	2300	2400	2500
													m 0cal.pg	0.841	0.922	1.007	1.095	1.186	1.293	1.384
	ε A’％	4.2	9.9	13.8	26.6	31.7	38.4	47.9
													m 0exp *，pg	19.9	9.35	6.73	4.11	3.74	3.37	2.89
	THGA	T(K)	190	2000	2100	2200	2300	2400	2500
m 0cal.pg													2.31	2.54	2.77	3.01	3.26	3.56	3.81
		ε A’％	10.4	25.1	38.3	52.1	62.1	100	100
m 0exp *，pg													22.2	10.1	7.23	5.78	5.25	3.56	3.81
		HGA	T(K)	2600	2700	2800	2900	3000	3100
m 0cal.pg	1.494												1.605	1.723	1.847	1.980	2.11
			ε A’％	62.2	76.1	82.7	87.5	94.0	100
m 0exp *，pg	2.40												2.11	2.11	2.11	2.11	2.11
			THGA	T(K)	2600	2700	2800	2900	3000	3100
m 0cal.pg	4.11	4.41											4.74	5.08	5.45	5.81
				ε A’％	100	100	100	100	100	100
m 0exp *，pg	4.11	4.41											4.74	5.08	5.45	5.81

Table 2 (1); From recording Q AValue obtains Q through linearization process A，0
															A r	βQ A	0.100	0.200	0.300	0.400	0.500	0.600	0.700	0.800	0.900	1.000	1.100	1.200	1.300
0.8	-0.40 -0.27 -0.14 0.00 0.10 0.24 0.39	0.107 0.105 0.104 0.102 0.101 0.100 0.098	0.231 0.224 0.218 0.210 0.206 0.201 0.195	0.377 0.360 0.345 0.325 0.317 0.303 0.293	0.558 0.522 0.490 0.446 0.430 0.410 0.383	0.800 0.744 0.669 0.591 0.568 0.530 0.491	1.215 1.015 0.902 0.798 0.728 0.663 0.604	1.846 1.520 1.301 1.081 0.943 0.839 0.752	2.372 2.006 1.655 1.355 1.078 1.002 0.860
															0.9	-0.40 -0.27 -0.14 0.00 0.10 0.24 0.39	0.106 0.105 0.103 0.102 0.101 0.099 0.098	0.227 0.220 0.215 0.208 0.203 0.198 0.192	0.366 0.350 0.336 0.321 0.309 0.299 0.288	0.527 0.496 0.471 0.443 0.419 0.403 0.382	0.765 0.711 0.641 0.577 0.542 0.515 0.474	1.070 0.944 0.856 0.767 0.703 3.647 0.551	1.587 1.352 1.126 0.930 0.888 0.809 0.649	2.146 1.860 1.550 1.235 1.026 0.950 0.822
1.0	-0.40 -0.27 -0.14 0.00 0.10 0.24 0.139	0.106 0.104 0.103 0.101 0.100 0.099 0.098	0.225 0.217 0.213 0.206 0.202 0.197 0.191	0.362 0.346 0.331 0.315 0.295 0.296 0.288	0.519 0.496 0.470 0.436 0.419 0.396 0.388	0.729 0.669 0.614 0.577 0.543 0.499 0.488	0.925 0.871 0.810 0.734 0.678 0.630 0.589	1.397 1.184 1.057 0.955 0.838 0.779 0.693	1.918 1.703 1.443 1.215 0.974 0.897 0.784																2.648 2.114 1.683 1.366 1.194 1.029 0.938
										1.1					-0.40 -0.27 -0.14 0.00 0.10 0.24 0.39	0.105 0.104 0.103 0.101 0.100 0.099 0.097	0.223 0.217 0.211 0.205 0.201 0.195 0.189	0.357 0.341 0.327 01311 0.302 0.291 0.277	0.510 0.479 0.451 0.424 0.406 0.389 0.361	0.692 0.648 0.587 0.537 0.513 0.483 0.444	0.902 0.817 0.740 0.670 0.624 0.578 0.529	1.260 1.040 0.915 0.811 0.751 0.683 0.618	1.704 1.309 1.131 0.977 0.922 0.845 0.746	2.246 1.735 1.535 1.251 1.104 0.965 0.883		3.758 2.499 1.919 1.599 1.308 1.091 0.947
1.2	-0.40 -0.27 -0.14 0.00 0.10 0.24 0.39	0.105 0.104 0.102 0.101 0.100 0.098 0.097	0.223 0.216 0.210 0.204 0.200 0.194 0.188	0.354 0.338 0.324 0.309 0.300 0.288 0.274	0.503 0.473 0.445 0.418 0.402 0.383 0.356	0.678 0.626 0.576 0.533 0.506 0.468 0.436	0.880 0.795 0.720 0.678 0.612 0.565 0.515	1.143 0.993 0.881 0.785 0.738 0.656 0.603	1.492 1.117 1.021 0.893 0.869 0.793 0.710		1.961 1.565 1.381 1.140 0.010 0.900 0.828														3.017 1.230 1.606 1.318 1.161 1.019 0.883		4.361 3.067 2.477 1.624 1.319 1.092 0.916
										1.3		-0.40 -0.27 -0.14 0.00 0.10 0.24 0.39			0.105 0.103 0.102 0.101 0.100 0.098 0.096	0.221 0.215 0.208 0.203 0.199 0.194 0.187	0.351 0.336 0.321 0.309 0.298 0.284 0.270	0.496 0.467 0.440 0.413 0.397 0.377 0.356	0.664 0.611 0.566 0.525 0.498 0.453 0.435	0.860 0.774 0.702 0.640 0.600 0.555 0.512	1.095 0.959 0.853 0.762 0.707 0.643 0.587	1.389 1.177 1.021 0.893 0.817 0.744 0.673	1.779 1.476 1.216 1.040 0.934 0.835 0.763	2.344 1.794 1.458 11309 1.079 0.941 0.823		3.361 2.316 1.777 1.521 1.251 1,066 0.916		5.667 3.368 2.431 1.745 1.493 1.242 1.041
1.4	-0.40 -0.27 -0.14 0.00 0.10 0.24 0,39	0.105 0.103 0.102 0.101 0.100 0.098 0.096	0.221 0.214 0.208 0.202 0.198 0.193 0.187	0.349 0.334 0.32a 0.306 0.296 0.284 0.271	0.492 0.463 0.437 0.411 0.394 0.374 0.354	0.658 0.604 0.561 0.514 0.494 0.457 0.431	0.845 0.756 0.692 0.632 0.591 0.551 0.506	1.092 0.939 0/836 0.759 0.697 0.637 0.578	1349 1142 0.984 0.872 0.805 0.721 0.651		1.685 1.407 1.165 1.006 0.913 0.811 0.723		2200 1.680 1.377 1.155 1.028 0.907 0.796												2846 2.093 1.632 1.332 1.164 1.039 0.875		3988 2.672 1.973 1.547 1.335 1.142 0.966		6219 3.672 2.507 1.842 1.560 1.284 1.079

Table 2 (2); From recording Q AValue obtains Q through linearization process A，0
																	A r	βQ A	0.200	0.300	0.400	0.500	0.600	0.700	0.800	0.900	1.000	1.100	1.200	1.300	1.400	1.500	1.700
1.5	-0.40-0.27-0.14 0.00 0.10 0.24 0.39	0.220 0.212 0.208 0.201 0.197 0.193 0.187	0.348 0.332 0.317 0.305 0.295 0.283 0.271	0.489 0.460 0.434 0.408 0.393 0.372 0.352	0.649 0.598 0.555 0.515 0.489 0.462 0.428	0.831 0.747 0.683 0.624 0.587 0.546 0.498	1.044 0.920 0.821 0/736 0.686 0.627 0.571	1.294 1.117 0.958 0.854 0.787 0.709 0.637	1.606 1.339 1.133 0.978 0.891 0.800 0.708	2.001 1.589 1.320 1.112 1.000 0.889 0.776	2.547 1.914 1.534 1.264 1.157 0.982 0.845	3.422 2.347 1.793 1.436 1.259 1.082 0.919	4.889 2.979 2.151 1.656 1.420 1.193 1.004	8.203 4.238 2.682 1.954 1.644 1.341 1.119
																	1.6	-0.40-0.27-0.14 0.00 0.10 0.24 0.39	0.220 0.212 0.207 0.201 0.197 0.192 0.186	0.346 0.331 0.317 0.303 0.294 0.282 0.271	0.487 0.458 0.432 0.407 0.391 0.371 0.350	0.644 0.594 0.551 0.511 0.487 0.457 0.426	0.823 0.742 0.678 0.618 0.583 0.541 0.498	1.029 0.908 0.815 0.729 0.679 0.628 0.567	1.273 1.092 0.950 0.843 0.777 0.707 0.634	1.563 1.313 1.113 0.961 0.878 0.790 0.699	1.925 1.547 1.294 1.087 0.977 0.874 0.763	2.397 1.826 1.510 1.225 1.090 0.961 0.828	3.174 2.183 1.728 1.375 1.206 1.041 0.899	4.032 2.680 1.987 1.553 1.346 1.172 0.967	5.927 3455 2.363 1.773 1.512 1.314 1.050
1.7	-0.40-0.27-0.14 0.00 0.10 0.24 0.39	0.217 0.213 0.207 0.201 0.197 0.192 0.185	0.339 0.327 0.315 0.303 0.294 0281 0.268	0.484 0.448 0.427 0.405 0.389 0.367 0.347	0.640 0.590 0.547 0.509 0.482 0.454 0.424	0.815 0.737 0.674 0.614 0.578 0.536 0.495	1.015 0.897 0.799 0.722 0.673 0.616 0.563	1.249 1.075 0.942 0.833 0.768 0.695 0.628	1.524 1.273 1.090 0.946 0.865 0.722 0.691	1.857 1.497 1.253 1.065 0.963 0.857 0.752	2.276 1.756 1.466 1.190 1.066 0.929 0.807	3.022 2.067 1.695 1.329 1.174 1.010 0.874	3.498 2.548 1.923 1.493 1.297 1.102 0.940	3.973 3.029 2.151 1.656 1.420 1.193 1.005																		7.324 3.983 2.544 1.878 1.579 1.299 1.084
															1.8		-0.40-0.27-0.14 0.00 0.10 0,24 0.39	0.217 0.212 0.207 0.201 0.197 0.192 0.185	0.345 0.326 0.315 0.302 0.293 0.282 0.267	0.483 0.447 0.427 0.403 0.388 0.366 0.348	0.637 0.586 0.543 0.507 0.482 0.448 0.423	0.809 0.733 0.661 0.611 0.576 0.533 0.494	1.007 0.890 0.802 0.715 0.668 0.611 0.560	1.236 1.065 0.934 0.823 0.761 0.690 0.624	1.503 1.257 1,079 0.933 0.855 0.766 0.685	1.818 1.473 1,236 1.047 0.944 0.841 0.744	2 284 1.518 1.405 1.163 1.052 0.917 0.803	2.790 2.003 1.648 1.283 1.154 0.994 0.885	3.575 2.405 1.849 1.441 1.264 1.077 0.934	4.359 2.807 2.049 1.598 1.374 1.159 0.982	6.443 3.552 2.205 1.796 1.670 1.264 1.066		11.26 5.402 2.766 2.363 1.836 1.491 1.227
1.9	-0.40-0.27-0.14 0.00 0.10 0.24 0.39	0.216 0.211 0.206 0.200 0.196 0.191 0.185	0.339 0.326 0.314 0.302 0.293 0.281 0.267	0.481 0.446 0.426 0.403 0.388 0.366 0.348	0.635 0.585 0.552 0.506 0.479 0.466 0.422	0.804 0.729 0.659 0.609 0.574 0.530 0.492	1.000 0.883 0.780 0.712 0.664 0.607 0.557	1.223 1.068 0.920 0.818 0.755 0.683 0.620	1.482 1.241 1.069 0.925 0.846 0.759 0.680	1.795 1.450 1.219 1.038 0.933 0.832 0.738	2.210 1.701 1.402 1.153 1.034 0.906 0.793	2.636 1.951 1.585 1.267 1.135 0.980 0.848	3.311 2.321 1.767 1.390 1.240 1.056 0.905	3.986 2.690 1.948 1.512 1.345 1.132 0.962		5.621 3.261 2.250 1.646 1.465 1.216 1.023																9.581 4.816 2.989 2.107 1.743 1.416 1.158
															A r		βQ A	0.300	0.400	0.500	0.600	0.700	0.800	0.900	1.000	1.200	1.400	1.600	1.800	2.000
2.0	-0.40-0.27-0.14 0.00 0.10 0.24 0.39	0.337 0.326 0.314 0.301 0.292 0.280 0.266	0.480 0.446 0.425 0.402 0.387 0.364 0.340	0.632 0.583 0.540 0.504 0.480 0.445 0.421	0.799 0.724 0.657 0.607 0.571 0.528 0.490	0.993 0.876 0.776 0.708 0.660 0.604 0.554	1.211 1.047 0.918 0.812 0.750 0.691 0.616	1.463 1.284 1.059 0.917 0.837 0.753 0.674	1.754 1.428 1.204 1.028 0.932 0.823 0.731	2.529 1.904 1.527 1.251 1.117 0.966 0.837	3.981 2.530 1.906 1.561 1.309 1.110 0.938	6.362 3.537 2.399 1.793 1.537 1.263 1.056	10.62 5.400 3.155 2.192 1.798 1.455 1.184

Table 2 3., from recording Q _AValue gets Q through linearization process _{A, 0}

Table 2 4., from recording Q _AValue gets Q through linearization process _{A, 0}

Table 2 5., from recording Q _AValue gets Q through linearization process _{A, 0}

Table 2 6., from recording Q _AValue gets Q through linearization process _{A, 0}

Ar	BQ A	0.800	1.00	1.20	1.40	1.60	1.80	2.00	2.20	2.40	2.60	2.80	3.00	3.20	3.40	3.60
																	3.8	-0.40	1.198	1.670	2.314	3.236	4.479	6.564	11.33
-0.27	1.020	1.366	1.769	2.181	2.833	2.535	4.474	5.662	7.323	9.549	12.48
																-0.14		0.901	1.161	1.436	1.726	2.018	2.335	2.815	3.234	3.694	3.242	4.808	5.458	6.388	7.350
0.00	0.801	1.001	1.201	1.402	1.603	1.809	2.016	2.224	2.440	2.668	2.892	3.136	3.594	3.923
																0.10		0.734	0.905	1.068	1.223	1.374	1.494	1.655	1.786	1.920	2.098	2.236	2.340	2.545	2.992
0.24	0.670	0.808	0.931	1.049	1.159	1.262	1.355	1.450	1.534	1.635	1.727	1.810	1.910	2.088
																0.39		0.609	0.719	0.817	0.907	0.986	1.059	1.137	1.194	1.244	1.312	1.358	1.411	1.484	1.573
3.9	-0.4	1.177	1.669	2.312	3.216	4.468	6.524	11.22
																-0.27	1.019	1.355	1.767	2.178	2.832	3.523	4.424	5.572	7.224	9.269	12.24
	-0.14	0.900	1.160	1.435	1.724	2.017	2.330	2.807	3.217	3.669	3.189	4.749	5.389	6.221	2.159
																0.00	0.800	1.001	1.201	1.401	1.602	1.808	2.009	2.219	2.430	2.647	2.878	3.089	3.516	3.722
	0.10	0.734	0.905	1.068	1.222	1.373	1.492	1.652	1.779	1.909	2.080	2.216	2.310	2.486	2.795
																0.24	0.670	0.808	0.930	1.048	1.158	1.261	1.352	1.447	1.530	1.629	1.716	1.794	1.886	2.014
	0.39	0.609	0.719	0.817	0.906	0.985	1.058	1.134	1.192	1.241	1.306	1.353	1.401	1.471	1.550
																4.0 to 7.0	-0.4	1.177	1.669	2.310	3.196	4.457	6.494	11.11
-0.27	1.019	1.365	1.765	2.176	2.831	3.513	4.374	5.483	6.913	8.993	11.96
																	-0.14	0.900	1.160	1.434	1.722	2.016	2.325	2.793	3.200	3.645	4.137	4.689	5.182	6.005	6.549	7.348
0.00	0.800	1.000	1.200	1.401	1.601	1.807	2.008	2.209	2.410	2.612	2.814	3.016	3.218	3.420	3.628
																	0.10	0.734	0.905	1.068	1.222	0.372	1.490	1.649	1.772	1.898	2.028	2.159	2.280	2.431	2.537	2.641
0.24	0.670	0.808	0.930	1.048	1.158	1.260	1.351	1.444	1.526	1.611	1.696	1.762	1.827	1.879	1.949
																	0.39	0.609	0.719	0.817	0.900	0.985	1.058	1.131	1.188	1.232	1.276	1.320	1.364	1.408	1.452	1.489
β/	3.80	4.00	4.20	4.40	4.60	4.80	5.00	5.20	5.40	5.60	5.80	6.00	6.20	6.40	6.60
																	-0.4
-0.27
																	-0.14	8.265	9.349	10.67	12.37	14.41	16.46
0.00	3.835	4.056	4.326	4.596	4.866	5.100	5.300	5.500	5.700	5.900	6.100	6.300	6.500	6.700	6.900
																	0.10	2.746	2.851	2.961	3.053	3.146	3.236	3.328	3.420	3.511	3.600	3.689	3.778	3.863	3.955	4.044
0.24	1.990	2.033	2.076	2.119	2.162	2.205	2.248	2.291	2.334	2.377	2.420	2.463	2.506	2.549	2.592
																	0.39	1.526	1.560	1.594	1.617	1.640	1.663	1.686	1.709	1.732	1.755	1.778	1.801	1.824	1.849	1.870

Table 3,1., 62 elements are with reference to Ar value and β value

Wavelength	The Ar value			The β value
							nm	HGA(D 2)	HGA(Z)	THGA(Z)	HGA(D 2)	HGA(Z)	THGA(Z)
Li 670.8	2.0-4.0	1.5-3.0	1.5-3.0	-0.2-0.0	-0.20-0.0	-0.20-0.0
							Na 589.0	2.0-4.0	1.5-3.0	1.5-3.0	-0.14-0.0	0.14-0.0	0.14-0.0
K 766.5	2.0-40	1.5-3.0	1.5-3.0	-0.07-0.0	-0.07-0.0	-0.07-0.0
							Rb 780.0	2.0-4.0	1.5-3.0	1.5-3.0	-0.07-0.0	-0.07-0.0	-0.07-0.0
Cs 852.1	2.0-4.0	1.5-3.0	1.5-3.0	-0.07-0.0	-0.07-0.0	-0.07-0.0
							Cu 324.7	1.7-3.5	0.8-3.2	0.8-3.2	-0.07-0.0	-0.07-0.0	-0.07-0.12
Ag 328.1	1.7-4.0	1.0-2.5	1.6-2.5	-0.40-0.27	-0.27-0.0	-0.27-+0.05
							Au 242.7	1.7-4.0	1.0-2.5	1.6-2.5	-0.14-0.0	-0.27-0.0	-0.27-+0.05
Be 234.8	1.2-3.0	0.8-2.5	0.8-2.5	-0.14-0.0	-0.40--0.27	-0.40--0.27
							Mg 285.2	2.5-5.0	1.5-4.0	1.5-4.0	-0.14-0.0	-0.14-0.0	-0.14-0.0
Ca 422.7	2.5-5.0	1.5-4.0	1.5-4.0	-0.14-0.0	-0.14-0.0	-0.14-0.0
							Sr 460.7	2.5-5.0	1.5-4.0	1.5-4.0	-0.14-+0.00	-0.14-0.0	-0.14-0.0
Ba 553.5	2.5-5.0	1.5-4.0	1.5-4.0	-0.14-+0.00	-0.14-0.0	-0.14-0.0
							Zn 213.9	2.5-3.0	0.8-2.5	0.8-2.5	-0.14-0.10	-0.27--0.07	-0.14-+0.10
Cd 228.8	2.5-3.0	0.8-2.5	0.8-2.5	-0.14-0.10	-0.27--0.07	-0.14-+0.10
							Hg 253.7	1.3-2.0	0.5-1.7	0.5-1.7	-0.27-0.0	-0.27--0.0	-0.27--0.0
Al 309.2	1.5-2.5	0.8-2.0	0.8-2.0	0.18-0.39	+0.18-+0.39	+0.18-+0.39
							Ga 287.4	1.5-3.0	1.0-2.5	1.0-2.5	-0.07-0.05	-0.07-+0.05	-0.07-+0.05
In 303.9	1.0-2.5	0.8-2.0	0.8-2.0	-0.14-0.05	-0.14-+0.05	-0.14-+0.05
							Tl 276.7	1.0-2.5	0.8-2.0	0.8-2.0	0.0-0.8	0.0-+0.08	0.0-+0.08
Ge 265.1	2.0-3.5	1.5-3.0	1.5-3.0	-0.07-+0.08	-0.07-+0.08	-0.07-+0.08
							Si 251.6	2.0-3.5	1.5-3.0	1.5-3.0	-0.07-+0.08	-0.07-+0.08	-0.07-+0.08
Sn 286.3	2.0-4.0	1.7-3.5	1.7-3.5	-0.14--0.27	-0.14--0.27	-0.14--0.27
							Pb 283.3	2.0-4.0	1.7-3.5	1.7-3.5	0.0-+0.18	-0.27-+0.18	-0.27-+0.15
P 213.6 **	1.0-2.5	0.8-2.0	0.8-2.0	-0.27-0.0	-0.27-0.0	-0.27-0.0
							As 193.7	2.0-3.5	1.5-3.0	1.5-3.0	-0.27-+0.09	-0.27-+0.09	-0.27-+0.09
Sb 217.6	1.5-2.5	1.0-2.0	1.0-2.0	0.0-+0.08	0.0-+0.08	0.0-+0.08
							Bi 223.1	2.0-3.5	1.5-3.0	1.5-3.0	-0.05-+0.15	-0.05-+0.15	-0.05-+0.15
Bi 306.8	2.0-3.5	1.5-3.0	1.5-3.0	-0.05-+0.15	-0.05-+0.15	-0.05-+0.15
							Se 196.0	1.5-2.5	1.0-2.0	1.0-2.0	0.0-+0.18	-0.14-+0.18	-0.14-+0.18
Te 214.3	2.0-3.0	1.5-2.5	1.5-2.5	-0.14-+0.05	-0.14-+0.05	-0.14-+0.05
							Cr 357.9	2.5-5.0	1.5-4.0	1.5-4.0	-0.07-+0.05	-0.07-+0.05	-0.07-+0.05
Mn 279.5	2.5-5.0	1.5-4.0	1.5-4.0	-0.20-+0.05	-0.20-+0.15	-0.20-+0.15
							Fe 248.3	1.5-3.0	1.0-2.5	1.0-2.5	-0.20-0.0	0.27-0.0	-0.27-+0.06
Co 240.7	1.5-3.0	1.0-2.5	1.0-2.5	-0.20-0.0	-0.27-0.0	-0.27-+0.08
							Ni 232.0	1.0-2.5	0.8-2.0	0.8-2.0	-0.27-0.0	-0.27-0.0	-0.27-+0.17

Table 3,2., 62 elements are with reference to Ar value and β value

Wavelength	The Ar value			The β value
							nm	HGA(D 2)	HGA(Z)	THGA(Z)	HGA(D 2)	HGA(Z)	THGA(Z)
Pd 247.6	1.2-3.0	0.8-2.5	0.8-2.5	-0.05-+0.08	-0.05-+0.08	-0.05-+0.08
							Pt 265.9	1.2-3.0	0.8-2.5	0.8-2.5	-0.05-+0.08	-0.05-+0.08	-0.05-+0.08
Rt 265.9	1.2-3.0	0.8-2.5	0.8-2.5	-0.05-+0.08	-0.05-+0.08	-0.05-+0.08
							Ru 349.9	1.2-3.0	0.8-2.5	0.8-2.5	-0.05-+0.08	-0.05-+0.08	-0.05-+0.08
Ir 264.0	1.2-3.0	0.8-2.5	0.8-2.5	-0.05-+0.08	-0.05-+0.08	-0.05-+0.08
							Ds 290.9	2.0-5.0	2.0-4.0	2.0-4.0	0.0-0.20	0.0--0.20	0.0--0.20
B 249.8	1.0-2.0	0.8-1.5	0.8-1.8	0.0-0.20	0.0--0.20	0.0--0.20
							Sc 391.2	2.0-5.0	2.0-4.0	2.0-4.0	0.0-0.20	0.0--0.20	0.0--0.20
Y 410.2	2.0-5.0	2.0-4.0	2.0-4.0	0.0-0.20	0.0--0.20	0.0--0.20
							Ca 550.1	2.0-5.0	2.0-4.0	2.0-4.0	0.0-0.20	0.0--0.20	0.0--0.20
Ce 463.2	2.0-5.0	2.0-4.0	2.0-4.0	0.0-0.20	0.0--0.20	0.0--0.20
							Pr 495.1	2.0-5.0	2.0-4.0	2.0-4.0	0.0-0.20	0.0--0.20	0.0--0.20
Nd 463.4	2.0-5.0	2.0-4.0	2.0-4.0	0.0-0.20	0.0--0.20	0.0--0.20
							Sm 429.7	2.0-5.0	2.0-4.0	2.0-4.0	0.0-0.20	0.0--0.20	0.0--0.20
Eu 459.4	2.0-5.0	2.0-4.0	2.0-4.0	0.0-0.20	0.0--0.20	0.0--0.20
							Gd 407.9	2.0-5.0	2.0-4.0	2.0-4.0	0.0-0.20	0.0--0.20	0.0--0.20
Tb 432.6	2.0-5.0	2.0-4.0	2.0-4.0	0.0-0.20	0.0--0.20	0.0--0.20
							Dy 421.2	2.0-5.0	2.0-4.0	2.0-4.0	0.0-0.20	0.0--0.20	0.0--0.20
Ho 410.4	2.0-5.0	2.0-4.0	2.0-4.0	0.0-0.20	0.0--0.20	0.0--0.20
							Er 400.8	2.0-5.0	2.0-4.0	2.0-4.0	0.0-0.20	0.0--0.20	0.0--0.20
Tm 371.8	2.0-5.0	2.0-4.0	2.0-4.0	0.0-0.20	0.0--0.20	0.0--0.20
							Yb 398.8	2.0-5.0	2.0-4.0	2.0-4.0	0.0-0.20	0.0--0.20	0.0--0.20
Lu 336.0	2.0-5.0	2.0-4.0	2.0-4.0	0.0-0.20	0.0--0.20	0.0--0.20
							U 358.5	2.0-5.0	2.0-4.0	2.0-4.0	0.0-0.20	0.0--0.20	0.0--0.20
Ti 365.4	2.5-5.0	2.0-5.0	2.0-5.0	-0.05-0.0	-0.05-+0.08	-0.05-+0.08
							V 318.5	2.5-5.0	2.0-5.0	2.0-5.0	-0.05-0.0	-0.05-+0.15	-0.05-+0.15
Mo 313.3	2.5-5.0	2.0-5.0	2.0-5.0	-0.05-0.0	-0.05-+0.08	-0.05-+0.08

Table 4,1., the volumetric solution concentration ng/ml that permanent magnetic field Zeeman button background HGA graphite furnace uses

Wavelength	Temperature	m 0cal	m 0exp *	R Z，PM	m zexp *	Solution concentration ng/ml ( **μg/ml)
												nm	T(K)	pg	pg	pg	①	②	③	④	⑤	⑥
Li 670.8	2700	0.360	1.40		0.38	3.68	3.70	111	37.0	111	370												1110
				Na 589.0								2200	0.400	0.500	0.46	1.09	1.10	3.30	11.0	33.0	100	330
K 766.5	2100	0.597	0.597		0.52	1.15	1.20	3.60	12.0	36.0	120												360
				Rb 780.0								2100	1.28	1.30	0.44	2.95	3.00	9.00	30.0	90.0	300	900
Cs 852.1	2200	2.30	4.07		0.40	10.2	10.0	30.0	100	300	1000												3000
				Cu 324.7								2400	1.95	3.10	0.353	8.8	9.0	27.0	90	270	900	2700
Ag 328.1	2000	1.018	1.018		0.40	2.55	2.60	7.80	26.0	78.0	260												780
				Au 242.7								2400	6.53	7.03	0.56	12.6	13.0	39.0	130	390	1300	3900
Be 234.8	2700	0.366	0.438		0.62	0.71	0.70	2.10	7.00	21.0	70.0												210
				Mg 285.2								2500	0.318	0.318	0.81	0.393	0.40	1.20	4.00	12.0	10.0	120
Ca 422.7	2800	0.499	0.499		0.94	0.53	0.50	1.50	5.00	15.0	50.0												150
				Sr 460.7								2800	0.667	0.667	0.98	0.68	0.70	2.10	7.00	210	70.0	210
Ba 553.5	2900	2.85	2.85		0.96	2.97	3.00	9.00	30.0	93.0	300												900
				Zn 213.9								2000	0.423	0.423	0.84	0.504	0.50	1.50	5.00	15.0	50.0	150
Cd 228.8	1800	0.464	0.464		0.789	0.588	0.60	1.80	6.00	18.0	60.0												180
				Hg 253.7 **								1400	69	69	0.70	98.6	0.10	0.30	1.00	3.00	10.0	30.0
Al 309.2	2600	7.30	7.30		0.75	9.73	10.0	30.0	100	300	1000												3000
				Ga 287.4								2700	10.33	10.33	0.71	14.5	15.0	45.0	150	450	1500	4500
In 303.9	2300	8.70	8.70		0.82	10.6	10.0	30.0	100	300	1000												3000
				Tl 276.7								2000	10.0	10.0	0.56	17.9	18.0	54.0	180	540	1800	5400
Ge 265.1	2800	15.4	15.4		0.82	18.8	19.0	57.0	190	570	1900												5700
				Si 251.6								2700	14.9	14.9	0.94	15.9	16.0	18.0	160	480	1600	4800
Sn 286.3	2500	20.2	20.2		0.97	20.8	20.0	60.0	200	600	2000												6000
				Pb 283.3								2100	9.2	9.2	0.90	10.2	10.0	30.0	100	300	100	3000
P 213.6 **	2850	3190	3190		0.70	4560	46.0	13.8	46	138	460												1380
				As 193.7								2500	10.6	10.6	0.52	20.4	20.0	60.0	200	600	2000	6000
Sb 217.6	2600	13.9	13.9		0.54	25.7	25.0	75.0	250	750	2500												7500
				Bi 223.1								2100	6.80	6.80	0.275	24.7	25.0	75.0	250	750	2500	7500
Se 196.0	2400	10.8	10.8		0.52	20.8	20.0	60.0	200	600	2000												6000
				Te 214.3								2300	10.4	10.4	0.42	24.8	25.0	75.0	250	750	2500	7500
Cr 357.9	2700	2.11	2.11		0.44	4.8	5.00	15.0	50.0	150	500												1500
				Mn 279.5								2500	1.43	1.43	0.46	3.11	3.00	9.0	30.0	90.0	300	900
Fe 248.3	2600	3.46	3.46		0.68	5.09	5.00	15.0	50.0	150	500												1500
				Co 240.7								2600	5.40	5.40	0.91	5.93	6.00	18.0	60.0	180	600	1800
Ni 232.0	2600	7.31	7.31		0.91	8.03	8.00	24.0	80	240	800												2400

Table 4,2., the volumetric solution concentration ng/ml that permanent magnetic field Zeeman button background HGA graphite furnace uses

Wavelength	Temperature	m 0cal	m 0exp *	R Z，PM	m zexp *	Solution concentration ag/ml ( **μg/ml)
												nm	T(K)	pg	pg	pg	①	②	③	④	⑤	⑥
Pd 247.6	2800	15.4	15.4		0.91	16.9	17.0	51.0	170	510	1700												5100
				Pt 265.9								2900	64.6	66.0	0.80	82.5	80.0	240	800	2400	8000	24000
Rh 343.5	2900	9.99	9.99		0.54	18.5	19.0	57.0	190	570	1900												5700
				Ru 349.9								2900	19.6	34.0	0.85	40.0	40.0	120	400	1200	4000	12000
Ir 264.0	2900	43.2	46.8		0.91	51.4	50.0	150	500	1500	5000												15000
				Os 290.9 **								3200	46.4	340	0.46	739	0.70	2.1	7.00	31.0	70.0	210
B 249.8 **	3000	23.0	95.0		0.57	167	0.17	0.51	1.70	5.10	17.0												51.0
				Sc 391.2								3000	1.391	6.50	0.88	7.4	7.5	22.5	75.0	225	750	2250
Y 410.2	3000	5.66	33.0		0.85	44	44.0	132	440	1320	4400												13200
				La 550.1 **								3000	75.9	550	0.44	1250	1.30	3.90	13.0	39.0	130	390
Ce 463.2 **	3000	3190	10000		0.45	22000	22.0	66.0	220	660	220												6600
				Pr 495.1 **								3000	71.7	500	0.62	806	0.80	2.40	8.00	24.0	80.0	240
Nd 463.2 **	3000	45.4	280		0.80	350	0.35	1.05	3.50	10.5	35.0												105
				Sm 429.7 **								3000	101	101	0.84	120	0.12	0.36	1.20	3.60	12.0	36.0
Eu 459.4	2800	4.84	5.21		0.61	8.54	9.0	27.0	90	270	900												2700
				Gd 407.9 **								3000	179	610	0.52	1170	1.20	3.60	12.0	36.0	120	360
Tb 432.6 **	3000	18.3	1.0		0.82	134	0.13	0.39	1.30	3.90	13.0												39.0
				Dy 421.2 **								3000	3.97	17.0	0.72	23.6	24.0	72.0	240	720	2400	7200
Ho 521.2	3000	4.53	18.0		0.94	19.1	20.0	60.0	200	600	2000												6000
				Er 400.8								3000	3.49	17.6	0.91	19.3	20.0	60.0	200	600	2000	6000
Tm 371.8	2800	3.00	3.14		0.91	3.45	3.50	10.5	35.0	105	350												1050
				Yb 398.8								2700	0.970	1.043	0.94	1.12	1.10	3.30	11.0	33.0	110	330
Lu 336.0 **	3000	98.9	194		0.94	206	0.20	0.60	2.00	6.00	20.0												60.0
				U 358.5 **								3000	860	860	0.49	1760	1.80	5.40	18.0	54.0	180	540
Ti 365.4	3000	27.7	31.7		0.96	33.0	33.0	99.0	330	990	3300												9900
				V 318.5								3000	16.3	18.0	0.70	25.7	26.0	78.0	260	780	2600	7800
Mo 313.3	3000	4.63	5.40		0.42	12.9	13.0	39.0	130	390	1300												3900

Table 5,1., the volumetric solution concentration ng/ml that alternating magnetic field Zeeman button background HGA graphite furnace uses

Wavelength	Temperature	m 0cal	m 0exp *		m zexp *	Solution concentration ng/ml ( **μg/ml)
												nm	T(K)	pg	pg	R Z，PM	pg	①	②	③	④	⑤	⑥
Li 670.8	2700	0.360	1.40	0.88	1.59	1.50	4.50	15.0	45.0	150	450
												Na 589.0	2200	0.400	0.500	0.95	5.3	5.00	15.0	50.0	150	500	1500
K 766.5	2100	0.597	0.597	0.91	0.656	0.60	1.80	6.00	18.0	60.0	1800
												Rb 780.0	2100	1.28	1.30	0.96	1.35	1.30	3.90	13.0	39.0	130	390
Cs 852.1	2200	2.30	4.07	0.90	4.5	4.50	13.5	45.0	135	450	1350
												Cu 324.7	2400	1.95	3.10	0.53	5.85	6.00	18.0	60.0	180	600	1800
Ag 328.1	2000	1.018	1.018	0.91	1.12	1.10	3.30	11.0	33.0	110	330
												Au 242.7	2400	6.53	7.03	0.804	8.74	9.00	27.0	90.0	270	90.0	2700
Be 234.8	2700	0.366	0.438	0.65	0.674	0.70	2.10	7.00	21.0	70.0	210
												Mg 285.2	2500	0.318	0.318	0.91	0.35	0.35	1.05	3.50	10.5	35.0	105
Ca 422.7	2800	0.281	0.499	0.95	0.525	0.50	1.50	5.00	15.0	50.0	150
												Sr 460.7	2800	0.341	0.667	098	0.68	0.70	2.10	7.00	21.0	70.0	210
Ba 553.5	2900	0.592	2.85	0.98	2.91	3.00	9.00	30.0	90.0	300	900
												Zn 213.9	2000	0.423	0.423	0.88	0.481	0.50	1.50	5.00	15.0	50.0	150
Cd 228.8	1800	0.454	0.464	0.833	0.557	0.55	1.65	5.50	16.5	55.0	165
												Hg 253.7 **	1400	69	69	0.70	101	0.100	0.300	1.00	3.00	10.0	30.0
Al 309.2	2600	6.13	7.30	0.90	8.1	8.00	24.0	80.0	240	800	2400
												Ga 287.4	2700	9.61	10.33	0.79	13.1	13.0	39.0	130	390	1300	3900
In 303.9	2300	8.70	8.70	0.96	9.1	9.00	27.0	90.0	270	900	2700
												Tl 276.7	2000	10.0	10.0	0.66	15.1	15.0	45.0	150	450	1500	4500
Ge 265.1	2800	10.6	15.4	0.91	16.9	17.0	51.0	170	510	1700	5100
												Si 251.6	2700	12.3	14.9	0.98	15.2	15.0	45.0	150	450	1500	4500
Sn 286.3	2500	13.5	20.2	0.98	20.6	20.0	60.0	200	600	2000	6000
												Pb 283.3	2100	8.6	9.2	0.91	10.1	10.0	30.0	100	300	1000	3000
P 213.6 **	2850	2810	3190	0.70	4560	4.5	13.5	45.0	135	450	1350
												As 193.7	2500	7.97	10.6	0.89	11.9	12.0	36.0	120	360	1200	3600
Sb 217.6	2600	12.7	13.9	0.95	14.6	15.0	45.0	150	450	1500	4500
												Bi 223.1	2100	5.89	6.80	0.60	11.3	11.0	33.0	110	330	1100	3300
Bi 306.8	2100	18.2	21.0	0.70	30	30.0	90.0	300	900	3000	9000
												Se 196.0	2400	9.4	10.8	0.88	12.3	12.0	36.0	120	360	1200	3600
Te 214.3	2300	9.8	10.4	0.93	11.2	11.0	33.0	110	330	1100	3300
												Cr 357.9	2700	1.605	2.11	0.88	2.4	2.50	7.50	25.0	75.0	2500	750
Mn 279.5	2500	1.43	1.43	0.91	1.57	1.50	4.50	15.0	45.0	1500	450
												Fe 248.3	2600	3.05	3.46	0.92	3.76	3.70	11.10	37.0	111	370	1110
Co 240.7	2600	4.11	5.40	0.95	5.68	6.00	18.0	60.0	180	600	1800
												Ni 232.0	2600	5.92	7.31	0.91	8.03	8.00	24.0	80.0	240	800	2400

Table 5,2., the volumetric solution concentration ng/ml that alternating magnetic field Zeeman button background HGA graphite furnace uses

Wavelength	Temperature	m 0cal	m 0exp *	R Z，PM	m zexp *	Solution concentration ng/ml ( **μg/ml)
												nm	T(K)	pg	pg	pg	①	②	③	④	⑤	⑥
Pd 247.6	2800	15.4	15.4		0.91	16.9	17.0	5.10	170	510	1700
				Pt 265.9								2900	64.6	66.0	0.80	82.5	80.0	240	800	2400	8000	24000
Rh 343.5	2900	9.99	9.99		0.98	10.2	10.0	30.0	100	300	1000												3000
				Ru 349.9								2900	19.6	34.0	0.90	37.8	38.0	114	380	1140	3800	11400
Ir 264.0	2900	43.2	46.8		0.96	48.8	50.0	150	500	1500	5000												15000
				Os 290.9 **								3200	46.4	340	0.87	390	0.40	1.20	4.00	12.0	40.0	120
B 249.8 **	3000	23.0	95.0		0.61	156	0.15	0.45	1.50	4.50	15.0												45.0
				Sc 391.2								3000	1.391	6.50	0.96	6.8	7.00	21.0	70.0	210	700	2100
Y 410.2	3000	5.66	33.0		0.88	37.5	37.0	1.1	370	1110	3700												11100
				La 550.1 **								3000	75.9	550	0.96	573	0.60	1.80	6.00	18.0	60.0	180
Ce 463.2 **	3000	2190	10000		0.80	12500	13.0	39.0	130	390	1300												3900
				Pr 495.1 **								3000	71.7	500	0.94	532	0.50	1.50	5.00	15.0	50.0	150
Nd 463.4 **	3000	45.4	280		0.93	301	0.30	0.90	3.00	9.00	30.0												90.0
				Sm 429.7 **								3000	101	101	0.94	107	0.10	0.30	1.00	3.00	10.0	30.0
Eu 459.4	2800	4.84	5.21		0.96	5.43	5.50	16.5	55.0	165	550												1650
				Gd 407.9 **								3000	179	610	0.80	763	0.80	2.40	8.00	24.0	80.0	240
Tb 432.6 **	3000	18.3	110		0.88	125	0.12	0.36	1.20	3.60	12.0												36.0
				Dy 421.2								3000	3.97	17.0	0.89	19.1	20.0	60.0	200	600	2000	6000
Ho 410.4	3000	4.53	18.0		0.96	18.8	19.0	57.0	190	570	1900												5700
				Er 400.8								3000	3.49	17.6	0.96	18.3	18.0	54.0	180	540	1800	5400
Tm 371.8	2800	3.00	3.14		0.96	3.27	3.30	9.90	33.0	99.0	330												990
				Y 6398.8								2700	0.970	10.043	0.96	1.09	1.10	3.30	11.0	33.0	110	330
Lu 336.0 **	3000	98.9	194		0.96	202	0.20	0.60	2.00	6.00	20.0												60.0
				U 358.5 **								3000	860	860	0.92	935	1.00	3.00	10.0	30.0	100	300
Ti 365.4	3000	27.7	31.7		0.96	33	33.0	99.0	330	990	3300												9900
				V 318.5								3000	16.3	18.0	0.92	19.6	20.0	60.0	200	600	2000	6000
Mo 313.3	3000	4.63	5.40		0.98	5.5	5.50	16.5	55.0	165	550												1650

Table 6,1., the volumetric solution concentration ng/ml that alternating magnetic field Zeeman button background THGA graphite furnace uses

Wavelength	Temperature	m 0cal	m 0exp *	R Z，PM	m zexp *	Solution concentration ng/ml ( **μg/ml)
												nm	T(K)	pg	pg	pg	①	②	③	④	⑤	⑥
Li 670.8	2400	1.20	1.88		0.88	2.14	2.00	6.00	20.0	60.0	200												600
				Na 589.0								1900	0.883	1.14	0.95	1.20	1.20	3.60	12.0	36.0	120	360
K 766.5	1800	1.38	1.38		0.91	1.52	1.50	4.50	15.0	45.0	150												450
				Rb 780.0								1800	2.83	3.11	0.96	3.24	3.00	9.00	30.0	90.0	300	900
Cs 852.1	1900	5.56	10.8		0.90	12.0	12.00	36.0	120	360	1200												3600
				Cu 324.7								2200	4.59	4.59	0.53	8.66	9.00	27.0	90.0	270	900	2700
Ag 328.1	1900	2.58	2.58		0.911	2.84	3.00	9.00	30.0	90.0	300												900
				Au 242.7								2200	15.4	15.4	0.804	19.2	20.0	60.0	200	600	2000	6000
Be 234.8	2500	0.883	0.900		0.65	1.38	1.40	4.20	14.0	42.0	140												420
				Mg 285.2								2300	0.773	0.773	0.91	0.85	0.90	2.70	9.0	27.0	90	270
Ca 422.7	2600	0.693	0.938		0.95	1.01	1.00	3.00	10.0	30.0	100												300
				Sr 460.7								2600	0.850	1.83	0.98	1.87	2.00	6.00	20.0	60.0	200	600
Ba 553.5	2600	1.359	7.84		0.98	8.00	8.00	24.0	80.0	24.0	800												2400
				Zn 213.9								1900	0.845	0.845	0.88	0.96	1.00	3.00	10.0	30.0	100	300
Cd 228.8	1600	0.853	0.853		0.833	1.02	1.00	3.00	10.0	30.0	100												300
				Hg 253.7 **								1300	134	134	0.70	191	0.20	0.60	2.00	6.00	20.0	60.0
Al 309.2	2500	15.8	18.0		0.90	20.0	20.0	60.0	200	600	2000												6000
				Ga 287.4								2500	22.8	29.0	0.79	36.7	37.0	111	370	1110	3700	11100
In 303.9	2200	22.0	22.0		0.96	22.9	23.0	69.0	230	690	2300												6900
				Tl 276.7								1900	25.9	25.9	0.66	39.2	40.0	120	400	1200	4000	12000
Ge 265.2	2600	26.4	49.3		0.91	54.2	54.0	162	540	1620	5400												16200
				Si 251.6								2600	31.9	43.0	0.98	43.8	44.0	132	440	1320	4400	13200
Sn 286.3	2400	33.0	50.0		0.98	51.0	50.0	150	500	1500	5000												15000
				Pb 283.3								1900	20.4	20.4	0.91	22.4	22.0	66.0	220	660	2200	6600
P 213.6 **	2600	3960	8620		0.70	12310	12.0	36.0	120	360	1200												3600
				As 193.7								2400	20.6	23.2	0.89	26.1	25.0	75.0	250	750	2500	7500
Sb 217.6	2400	30.5	30.5		0.95	32.1	32.0	96.0	320	960	3200												9600
				Bi 223.1								2000	15.1	16.2	0.60	27.0	27.0	81.0	270	810	2700	8100
Bi 306.8	2000	46.8	50.0		0.70	71.4	70.0	210	700	2100	7000												21000
				Se 196.0								2200	22.0	26.6	0.88	30.2	30.0	90.0	300	900	3000	9000
Te 214.3	2200	24.5	28.9		0.93	31.1	30.0	90.0	300	900	3000												9000
				Cr 357.9								2500	3.81	4.11	0.88	4.67	4.7	14.1	47.0	141	470	1410
Mn 279.5	2300	3.48	3.48		0.91	3.82	4.00	12.0	40.0	120	400												1200
				Fe 248.3								2500	7.78	7.78	0.92	8.46	8.00	24.0	80.0	240	800	2400
Co 240.7	2500	10.3	10.3		0.95	10.8	11.0	33.0	110	330	1100												3300
				Ni 232.0								2600	15.0	15.0	0.91	16.5	16.0	48.0	160	480	1600	4800

Table 6,2., the volumetric solution concentration ng/ml that alternating magnetic field Zeeman button background THGA graphite furnace uses

Wavelength	Temperature	m 0cal	m 0exp *	R Z，PM	m zexp *	Solution concentration ng/ml ( **μg/ml)
												nm	T(K)	pg	pg	pg	①	②	③	④	⑤	⑥
Pd 247.6	2500	35.6	35.6		0.91	39.1	40.0	120	400	1200	4000												12000
				Pt 265.9 **								2600	144	144	0.80	180	0.18	0.54	1.80	5.40	18.00	54.0
Rh 343.5	2600	21.6	21.6		0.98	22.0	22.0	66.0	220	660	2200												6600
				Ru 349.9 **								2600	42.4	76.5	0.90	85.0	0.090	0.27	0.90	2.70	9.0	27.0
Ir 264.0 **	2600	94	128		0.96	133	0.13	0.39	1.30	3.90	13.0												39.0
				Os 290.9 **								3100	119	838	0.87	963	1.00	3.00	10.0	30.0	100	300
B 249.8 **	2700	52.0	190		0.61	311	0.30	0.90	3.00	9.00	30.0												90.0
				Sc 391.2								2700	3.38	17.9	0.96	18.6	20.0	60.0	200	600	2000	6000
Y 410.2	2700	13.8	90.8		0.88	103	0.10	0.30	1.00	3.00	10.0												30.0
				La 550.1 **								2700	164	1513	0.96	1576	1.60	4.80	16.0	48.0	160	480
Ce 463.2 **	2700	4880	27500		0.80	34400	35.0	105	350	1050	3500												10500
				Pr 495.1 **								2700	163	1375	0.94	1463	1.50	4.50	15.0	45.0	150	450
Nd 463.4 **	2700	103	770		0.93	828	0.80	2.40	8.00	240	80.0												240
				Sm 429.7 **								2700	281	281	0.96	299	0.30	0.90	3.00	9.00	30.0	90.0
Eu 459.4	2600	12.2	14.3		0.80	14.9	15.0	45.0	15.0	450	1500												4500
				Gd 407.9 **								2700	428	1678	0.88	2098	2.00	6.00	20.0	60.0	200	600
Tb 432.6 **	2700	42.6	303		0.89	344	0.35	1.05	3.50	10.5	35.0												105
				Dy 421.2								2700	9.43	35.6	0.96	40.0	40	120	400	1200	4000	12000
Ho 410.4	2700	10.3	37.5		0.96	39.1	40	120	400	1200	4000												12000
				Er 400.8								2700	8.44	39.4	0.96	41.0	40	120	400	1200	4000	12000
Tm 371.8	2600	7.37	8.53		0.96	8.89	9.0	27.00	90	270	900												2700
				Y 6398.8								2500	2.47	2.88	0.96	3.00	3.00	9.00	30.0	90.0	300	900
Lu 336.0 **	2700	257	688		0.96	717	0.70	2.10	7.00	21.0	70.0												210
				U 358.5 **								2700	1940	2700	0.92	2935	3.0	9.0	30.0	90.0	300	900
Ti 365.4	2700	61.9	67.2		0.96	70.0	70.0	210	700	2100	7000												21000
				V 318.5								2700	36.6	36.6	0.92	39.8	40.0	120	400	1200	4000	12000
Mo 313.3	2700	10.6	12.0		0.98	12.2	12.0	36.0	120	360	1200												36000

Claims (6)

1. the patent No. of using the present inventor to propose is ZL96103243X, because of deciding Patent classificating number G01N21/31, and " " establishment is used to not have fixed metal tungsten tungsten (or tantalum) platform-graphite tube (the being called for short WTaPGT) atomic absorption spectrophotometer (AAS) of standard analysis because of deciding tungsten tungsten (or tantalum) platform madreporic canal pipe and fixing means thereof.1986 and nineteen ninety L ' vov propose with theory characteristic amount m _oCal is a standard, and being used for commodity graphite-pipe atomic absorption spectrophotometry degree meter (being called for short GTAAS) does not have standard analysis, uses the behaviour's integration that proposed in 1978 to absorb (Q _AValue) and steady temperature platform stone is Manifold technology (STPF) and two end water-cooleds vertically heat graphite furnace (HGA type).But when analyzing actual sample with commodity GFAAS, the actual experiment amount of the levying m that most of elements obtain under most atomization temperature condition ₀The exp value greater than, even much larger than m ₀Ca1 value, i.e. atomization efficiency e _A'=m ₀Ca1/m ₀Exp ∠ 1 or ∠ 1 far away.Therefore can not use m ₀Ca1 does not have the standard of standard analysis as the commodity graphite furnace.

Characteristics of the present invention propose with best test feature amount m ₀Exp does not have the standard of standard analytical process as the commodity graphite furnace.m ₀Exp ^*Definition is near m ₀The m that the ca1 value records ₀Exp, i.e. e _A'=1 or near 1.62 ms of element under different atomization temperatures ₀Exp ^*Value is to have used Q by the present inventor since 1978 _AMeasure and the STPF technology, patent WTaPGT, general matrix modifier, non-ferrous metal research institute patent LOWE type high-intensity lamp, develop the WFD-Y3 of (1975) jointly with present inventor and Beijing second optics, instrument plant, WFX-1E waits 1: 5 pulse power supply hollow cathode lamp of the employed dutycycle of commodity GFAAS (accounting for 62 element overwhelming majority).With reference to commodity in use GFAAS on the 1978-2006 document, STPF technology and Q _AMeasuring data determines.The m that we determine _oExp ^*Value can be from e with regard to property _A' near or equal 1.00 and judge.To the low temperature element at relative broad range e _AGentle high temperature element only just can have e at higher temperature in '=1.00 _A'=1.00.To some high temperature elements even T ℃=T (K)-200 up to 3000 ℃ (3200K) e still _A' ∠ 1.00 even much smaller than 1.00.This is because HGA graphite furnace two ends are cold, causes analytical element and matrix condensation in the water-cooled two ends, causes e _A' when ∠ 1.00 is serious even very strong memory effect arranged.Frech in 1993 or L ' vov propose graphite-pipe two end band caps (end cap) and laterally heat graphite furnace (THGA) and be used for vertical alternating magnetic field Zeeman deduction background GFAAS and measure high temperature elements Mo, V.T, Os, elements such as B can be measured under the condition less than 8 seconds at 2500 ℃ (2700K) with hot Jie's coating graphite-pipe (PGT)+hot Jie's graphite platform (PL).And still have memory effect up to 3000 ℃ (3200k) 20 seconds conditions in the use of HGA graphite-pipe.Because matrix can not be condensate in two ends in the HGA graphite furnace, background absorption is too high when causing mensuration high concentration salts solution and solid sample, Zeeman deduction GFAAS still can not deduct to apply, matrix is condensate in the HGA two ends and causes matrix effect and matrix interference increasing in addition, even still can't overcome with matrix modifier.But after using the THGA graphite furnace, solid sample may be measured directly and background absorption still can the deduction scope at Zeeman GFAAS instrument.Matrix effect and matrix disturb and can solve with general improver.Therefore a large amount of the appearance saved time-consuming, loaded down with trivial details molten sample step with the direct analysing solid sample of end cap THGA graphite furnace since 1993.But determine that 62 elements are at the m of different atomization temperatures at the THGA graphite furnace _oCal and m _oExp ^*It is very difficult that value makes it to be used to not have standard analysis.1986 and nineteen ninety L ' vov point out to calculate the m of HGA graphite furnace _oCal formula and obtain the m of 39 elements at a certain best atomization temperature _oCal value and m _oExp ^*Value.But L ' vov pointed out to calculate HGA graphite furnace m in 1996 _oThe cal formula not necessarily is suitable for end cap THGA.M as for end cap THGA _oExp ^*Work, that also carries out is insufficient, determines that difficulty is bigger.Therefore another emphasis of the present invention is to obtain the m of end cap THGA at the different atomization temperatures of 62 elements _oCal and m _oExp ^*Value.It is internal diameter 5.9mm that HGA graphite furnace and THGA graphite furnace use same internal diameter PGT, but the different HGA of length are with the long graphite-pipe of 28mm, and THGA 18mm graphite-pipe is pressed HGA graphite furnace m _oThe cal computing formula then has [(m _oCal) THGA/ (m _oCal) HGA]=(28 ²/ 18 ²)=2.42 times.We utilize the interval m of the higher atomization temperature of above-mentioned HGA graphite furnace _oCal/m _oExp ^*=1.00, under this temperature, m is arranged too with the THGA graphite furnace _oCal/m _oExp=1.00.Summing up 62 element m that all end cap THGA graphite furnaces of 1993-2006 are delivered _oExp ^*Value is found [(m _oExp ^*) THGA/ (m _oExp ^*) HGA]=2.75 times, error is no more than 10%, therefore [(m _oCal) THGA/ (m _oCal) HGA]=[(m _oExp ^*) THGA/ (m _oExp ^*) HGA]=2.75 times, prove that L ' vov prophesy HGA graphite furnace calculates m _oIt is correct that the cal formula can not be used for end cap THGA.The present invention (m _oCal) THGA=2.75 (m _oCal) the HGA formula obtains 62 ms of element under different atomization temperatures of end cap THGA graphite furnace _oThe cal value.The m that end cap THGA has been arranged _oThe cal value is as benchmark, because THGA is to low temperature, and middle temperature, all easier m that obtains of high temperature element _oCal/m _oExp ^*=1.00 or near 1.00.Than HGA graphite furnace, easier from summing up all m that use end cap THGA graphite furnace to obtain that 1993-2006 delivers _oThe exp value is determined the m at 62 elements of end cap THGA graphite furnace _oExp ^*Value.

No standard analytical process fundamental formular is that 1. formula is

m＝(Q _A，0/K)×(m _oexp ^*/0.0044) ①

When using alternating magnetic field (AM) Zeeman deduction background instrument ZGFAAS, Z, AM, 2. the fundamental formular of GFAAS is

m＝(Q _A，0/K)×(m _oexp ^*/0.0044R _Z，AM) ②

Use permanent magnetic field (PM) Rochon prism rotatory polarization light to buckle background instrument Z, PM, the fundamental formular of GFAAS is 3.

m＝(Q _A，0/K)×(m _oexp ^*/0.0044R _Z，PM) ③

Formula 1. 2. and 3. in m be the content of element to be measured, unit is pg.

R _{Z, AM}Be permanent magnetic field ZGFAAS absorptance, i.e. R _{Z, AM}=m _oExp/m _zExp (AM).

R _{Z, PM}Be permanent magnetic field ZGFAAS absorptance, i.e. R _{Z, PM}=m _oExp/m _zExp (PM).

Because the m that most of commercial apparatuss obtain _oExp departs from best test feature amount m _oExp ^*, therefore introduce coefficient of deviation K=m _oExp ^*/ m ₀Exp proofreaies and correct.For example account for PE company instrument over half in commodity graphite furnace instrument market, owing to use the twin-beam apparatus structure, too much use the reflection from lens mirror, semi-permeable mirror, cause the hollow cathode lamp energy loss serious, the user often uses big lamp current so that the baseline noise that obtains is low, instrument is made an uproar than height, detection limit is good, but lamp current increases and causes that lamp emission line self-priming broadens, and the atomic absorption line is had complicated fine structure (hfs) element, influences bigger, Cu 324.7nm for example, different characteristic of a navigation light amounts cause m with different lamp currents _oExp, and m _zIt is K ∠ 0.5 that exp (to the Z.AM.GFAAS instrument) changes greater than 1 times.To accounting for deputy Hitachi, Ltd instrument in the commodity graphite furnace instrument market, because that the graphite furnace body structure is pressed is big, thermal capacity is big, and graphite-pipe heats up slow, so the centering temperature K ∠ 1 that obtains of high temperature element especially, even much smaller than 1.It is necessary introducing coefficient of deviation K in no standard analysis for this reason, otherwise directly uses m _oExp ^*Do not have standard analysis in commodity graphite furnace instrument, error is too big, does not have actual application value.

Formula 1. 2. 3. in, Q _{A, 0}Be the Q that measures _AObtain after the value process linearization process.Gilmudinov pointed out in 1992: the analytic curve peaceful coexistence working curve that all graphite furnace instruments obtain all is crooked, bending causes 1. analytical line hfs structure by three factors, lamp emission line self-priming, and the radiant light aI of non-atomic absorption line in the slit bandwidth ₀(I ₀Be the lamp emitted luminescence intensity) interact.2. cross section, garden, graphite sample holes center atomic concentration skewness.3. graphite-pipe 28mm length atomic concentration skewness.How from Q _AObtain Q through linearization process _{A, 0}Be very difficult work.It also is another emphasis of the present invention.The present inventor is early than being engaged in this work and derivation formula in 1978 4.

a ^*＝(10 ^Ar+0.01-1)-1 ④

The Q of Ar value during for the typical curve counter-rotating that obtains for permanent magnetic field or changeable magnetic field Zeeman deduction background GFAAS _AValue.To single beam or D ₂Lamp is buckled background instrument a=(10 ^Ar+0.01-1) ^-15. aI ₀Be empty anode radiant light or the adjacent threads that the slit bandwidth enters, this moment do not occur the curve counter-rotating, and curve platform Ar value occurs.0.01 introduce is to prevent to cause easily and calculate uncertainty near the calculating of Ar value the time, but when practical application, Q _AAt this moment range of application should also can be reduced to less than the 0.9Ar value

a ^*＝(10 ^Ar-1) ^-1 ⑥

But curved does not singly just enter the lamp radiant light in the slit bandwidth and adjacent threads causes, also has Gilmudinov to propose three and causes crooked factors.L ' vov in 1996 introduces tortuosity factor β and derives formula 7.

$Q_A=\log \frac{1+{\mathrm{\α}}^{*}}{10-\frac{(1+{\mathrm{\α}}^{*})Q_{A,0}}{(1-\mathrm{\β}{Q}_{A,0})+{\mathrm{\α}}^{*}}}$ ⑦

(1+a ^*) be normalization coefficient, purpose makes different a ^*Value is at Q _ACan obtain Q below the value 0.1 or 0.2 _A=Q _{A, 0}, promptly normalizing becomes same Q _{A, 0}Value.Vast analytical work person directly with formula 6. with 7. with Q _AObtain Q through propertyization _{A, 0}Being very difficult, also is infeasible.6. and 7. the present invention calculates each Q by formula _AValue is at different A _rThe process linearization process that value (from 0.8 to 7.0) and different beta value (from 0.39 to-0.40) correspondence obtain obtains Q _{A, 0}Value.List in table 2.Limited by length, the Ar value is only listed 0.8 to 7.0 value interval 0.10 or 0.20.Ar value from 4.0 to 7.0, Q _ABe converted into Q _{A, 0}Error is less than 1%.Because the Ar value error obtained of typical curve is bigger, tests and record Ar value round off principle and get nearby Ar value.Q _AThe value value all adopts 0.100 at interval from Ar=0.80 to 2.10, just begins to adopt interval 0.100 and 0.200 and deposit from Ar=2.2 to 7.00.Limited by length, it is the most frequently used-0.40 ,-0.27 ,-0.14 ,-0.07,0.00,0.10 that the β value is fixed as, 0.24 and 0.39 seven β value.Therefore work as Q _A(x) value is three figure place (Q _A＜1.000) or four figures (Q _A＞1.000) time, β (y) value does not drop on seven fixing Beta values for one digit number (| β (y)＜0.10) or two figure places (| β (y)＞0.10).8., 9. and 10. available formula is calculated by interpolation method.

Q _A，0(x，β(L))＝Q _A，0(L，β(L))+【Q _A(x)-Q _A(L)/Q _A(H)-Q _A(L)】[Q _A，0(H，β(L))-Q _A，0(L，β(L))] ⑧

Q _A，0(x，β(H))＝Q _A，0(L，β(H))+【Q _A(x)-Q _A(L)/Q _A(H)-Q _A(L)】[Q _A，0(H，β(H))-Q _A，0(L，β(H))] ⑨

Q _A，0(x，β(y))＝Q _A，0(x，β(L))+【β(y)-β(L)/β(H)-β(L)】[Q _A，0(x，β(H))-Q _A，0(x，β(L))] ⑩

The 8. 9. 10. middle L of formula represents low value, and H represents high value.

Table 3 is listed the present inventor and 8. 9. and is 10. calculated from 1978-2006 invention with table 2 and formula and obtain looking for typical curve and diplomatic typical curve in person, and data are listed in table 3.62 element D ₂Lamp is buckled background or single beam instrument (HGA (D ₂)) be with the ZGFAAS (HGA (z)) of HGA graphite furnace and be with Ar value and the β of the ZGFAAS (THGA (z)) of THGA graphite furnace all to list in table 3.From table 3 data, find out, the Ar=0.80-7.0 that table 2 is listed, β from-0.40 to+0.39 scope is suitable.Ar is different with instrument with the β value, uses the difference of lamp, and the Ar of identity element and β value change quite greatly, therefore at Q _ATry to achieve Q through linearization process _{A, 0}Essential Ar value and the β value of accurately demarcating during value.

Another emphasis of the present invention is accurately to demarcate K, β and Ar value.Accurately measure K, β and Ar value need the standard solution of 62 element individual element content of a cover, and the standard solution of identity element must be available from different two units, the Q that obtains _AThe value unanimity can think that just standard solution is reliable.

Use general improver, its composition is that 1mg/mlZr+0.5mg/mlPd+10mg/ml tartrate is in 1%v/vHNO ₃To some at high element such as the Cd of general improver empty value, Zn, Cu, Mn, Pb, Ag, Na, K, elements such as Mg should be used permanent improver instead, 5mg/mlZr+4mg/mlIr+10mg/ml tartrate is in 1%v/vHNO ₃At 160 ℃ of 40s, 1300 ℃ of 25s, atomization under 2400 ℃ of 10s conditions.Graphite-pipe includes Zr250mg+Ir200mg.At this moment include Cd, Zn, Cu, Mn, Pb, Ag, Na, K, the whole atomization of the blank value of elements such as Mg are removed, and can directly measure complex fluid or complicated solid sample.

Table 4 and table 5 are listed the concentration of standard solution (ng/ml) of permanent magnetic field and the use of alternating magnetic field Zeeman button background HGA graphite furnace respectively, and table 6 is listed the concentration of standard solution (ng/ml) that the black stove of alternating magnetic field Zeeman button background THGA stone uses.Table 4,5,6 is also listed 62 elements and is used atomization temperature T (k)=T ℃+200 in standard.When using the 10ml sample introduction,

1. the corresponding Q of number solution _{A, 0}=0.044 ± 10%, 2. number solution correspondence 0.132 ± 10%, 9. number solution correspondence 0.44 ± 10%, 4. number solution correspondence 1.32 ± 10%, 5. number solution correspondence 4.4 ± 10%, 6. number solution correspondence 13.2 ± 10%, 1. number and 2. number solution is mainly used in and measures monitoring k value.3. 4. 5. solution be mainly used in and measure the β value.5. and 6. number solution is used to measure the Ar value.

Demarcated k, after Ar and the β value, it is just fairly simple directly to measure in complex fluid or the fixed sample concentration of element C to be measured with no standard analytical process.

1. directly with complex fluid sample feeding amount V _In(ml) or complicated solid sample sample size m _In(mg) enter graphite-pipe.2. utilize table 1 to obtain m by T (k)=T ℃+200 ₀Exp ^*Value.

3. in advance with table 4,5 or 6 1. arrive the 6. K of number standardization of solution, Ar and β value.

4. the Q that obtains of atomization _AValue with table 2 and formula 8., 9., 10. obtain Q through linearization _{A, 0}

5. 1., 2., 3. to try to achieve element to be measured with formula be m (pg) value to the visual equipment difference.6. constituent content C presses formula (11) in the complex fluid

C=[m/V _In] ([pg/ μ l] [ng/ml] or [mg/l])

Constituent content is by formula (12) in the complicated solid sample

C=[m/m _In] ([pg/mg] [ng/g] or [μ g/kg])

2. described by claim 1:

Using present inventor's patent WTaPGT is basis of the present invention, and this is that biology, geology and environmental sample all use nitric acid and perchloric acid (contain silicon sample and need HF acid) to carry out molten sample because of various organic and inorganic material, but nitric acid and perchloric acid corrosion PGT+PL make m ₀The exp value constantly descends, and uses 50～100 times m ₀Exp drops to half that have only when beginning and is less than, and in this case, can not use no standard analytical process fully.Have only the WTaPGT of use containing high concentration nitric acid and perchloric acid, in serviceable life, promptly the low temperature element is 500～2000 times, middle temperature 200～500 times, 100～300 m of high temperature ₀The exp value remains unchanged.So just may use no standard analytical process directly to measure complex fluid and solid sample.Have in the periodic table in addition twenties kinds of elements (particularly Sr, Ba, U, B and 15 rare earth element) can and graphite-pipe generate carbonide, produce serious matrix effect and memory effect, make analyze take place difficult.These elements of use WTaPGT post analysis are the same with other tens elements to use similar analysis condition to analyze various complex samples, has enlarged the ultimate analysis scope of GFAAS.

3. described by claim 1:

The general improver that the use present inventor invents out in no standard analysis is at Analysis of Complex liquid and solid sample and correction K, and B is absolutely necessary during Ar.It consists of 0.5mg/ml Pd+1mg/mlZr+10mg/ml tartrate 1%v/vHNO ₃Partly at higher element such as the Cd of the blank content of general improver, Zn, Mn, Pb, Ag, Na, K, elements such as Mg, blank is too high can not be used, and should use permanent improver 5mg/mlZr+4mg/mlIr+10mg/ml tartrate 1%v/vHNO instead ₃Sample introduction 50 μ l, at 160 ℃ of 40s, 1300 ℃ of 25s, atomization under 2400 ℃ of 10s conditions, at this moment the whole atomization of blank element are removed, and have only Zr250mg+Ir200mg forever to stay in the graphite-pipe, and complex fluid or solid sample can directly enter graphite-pipe analysis.

4. described by claim 1:

In no standard analysis, to keep K=1.00 or use the non-ferrous metal tungsten patent Lowe of total institute type high strength commodity lamp, the Sullivan type commodity high-intensity lamp of PE company commodity electrodeless discharge lamp (EDL lamp) and the production of 1980 Australian Photron companies by nearly 1.00 needs.The present inventor thinks simpler and is common to use dutycycle pulse control in 1: the 5 electric pulse hollow cathode lamp of all common hollow cathode lamps.This is that the coact commodity WFD-Y3 of development of present inventor and second optical instrument factory, Beijing at first uses (1973), the WFX that northern subsequently two photoproduction are produced, and 1A, 1B, 1C, 1D, 1E, 1F, 1G, 1E2,1E3,1F2B2,100,120,130 types continue to use.

5. described by claim 1:

62 elements are at HGA graphite furnace and the end cap THGA graphite furnace m at different temperatures T (K) _oCal, e ' _A=m _oExp ^*Value is listed in table 1.Listing in table is to also have 62 element R _{Z, PM}And R _{Z, AM}Value.

6. the described atomic absorption spectrophotometer (AAS) be used to not have standard analysis of setting up with patent WTa ' PGT of claim 1-5, need not to set up typical curve directly assay determination complex fluid or solid constituent content to be measured and concentration, break away from usefulness that common no sample analysis often uses not the time, the molten sample that difficulty is loaded down with trivial details, separate formality and determination step, also can break away from molten sample, separate the loaded down with trivial details step not time of the need of reagent blank that formality and determination step bring into and purification reagent.Use the m of table 1 _oExp ^*With demarcate K, β, Ar method and fundamental formular 1. 2. with 3. look different commercial apparatuss.

Each Tianwan businessman's product instrument also can be simultaneously with being the standard metering instrument, as balance in the gravimetric method, and various capacity measuring instruments in the volumetric method.The function that the numerous and diverse standard model of similar quantity kind is also arranged simultaneously is as the standard tool for transmitting.