CN101106596B - Electronic device and its user circuit plate fin - Google Patents
Electronic device and its user circuit plate fin Download PDFInfo
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- CN101106596B CN101106596B CN2007101301059A CN200710130105A CN101106596B CN 101106596 B CN101106596 B CN 101106596B CN 2007101301059 A CN2007101301059 A CN 2007101301059A CN 200710130105 A CN200710130105 A CN 200710130105A CN 101106596 B CN101106596 B CN 101106596B
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Abstract
The invention discloses an electronic device and the subscriber circuit nest plate, as well as the test method thereof. The electronic device includes a subscriber circuit nest plate with the function of integrated circuit test and a first switch unit. The subscriber circuit nest plate with the function of integrated circuit test is connected with subscriber lines TIP and RING. The first switch unit includes a first end and a second end, which are in connection with the subscriber lines TIP and RING respectively and used to connect or cut off the circuit between two subscriber lines TIP and RING. The invention can realize circuit and loop test with simple and low cost, with high system reliability.
Description
Technical field
The present invention relates to electronic technology field, particularly relate to electronic installation and user circuit suite slice thereof, method of testing.
Background technology
Access device generally all provides outside line and Internal Line Test function at present, and convenient line circuit interface and outside line to equipment carries out failure diagnosis and fault management.
Consulting Fig. 1, is a kind of system of existing techniques in realizing subscriber line circuit test.Described system comprises the subscribers feeder TIP that is connected to Subscriber Line Interface Circuit, RING, the Loop test bus that is used to connect test module and Internal Line Test bus, the outside line that connects outside line and the outer survey relay that described outside line is switched between subscribers feeder and Loop test bus, also comprise the interior survey relay that the Internal Line Test bus is connected to described subscribers feeder, an end of surveying relay in described is connected with input control signal, and the other end is connected with the Internal Line Test bus with subscribers feeder respectively.
Described test module is visited certain user interface circuit by interior survey bus and the corresponding interior survey relay of switching and is realized Internal Line Test; Realize Loop test by the outside line that outer survey bus and the corresponding outer survey relay of switching are visited certain user.
In carrying out the invention process, the inventor finds that there is following problem at least in above-mentioned prior art test macro: system's relative complex, cost height.
Former because: this scheme needs the test bus of design specialized system in and the test module that independently can realize Internal Line Test function and Loop test function with the realization test function, and, also need two relays to cooperate with described test module realizing circuit test and loop line test, system complex, cost height, reliability are low.
Consult Fig. 2, the voltage of the inner integrated circuit of another kind of prior art chip nest plate and the test function of loop current, cooperate peripheral a spot of discrete devices, can realize the test of the physical electrical characteristics such as voltage, resistance, electric capacity of outside line, realize the Loop test function.But integrated test function can't be tested the business (as business such as dislodging machine testing, section bell, feed voltage, feed currents) of self, therefore can't realize Internal Line Test.
Summary of the invention
The technical problem that embodiment of the present invention will solve provides a kind of electronic installation and user circuit suite slice thereof, method of testing, can realize the function of test interior lines simply, at low cost.
A kind of electronic installation is provided, comprises the user circuit suite slice and first switch element of integrated circuit test function, the user circuit suite slice of described integrated circuit test function connects subscribers feeder TIP and RING; Described first switch element comprises first end and second end, connect described subscribers feeder TIP and RING respectively, be used to be switched on or switched off described subscribers feeder TIP and RING, first switch element is the controlled load circuit, and input control signal is to control switching on and off between described subscribers feeder TIP and the RING; Second switch unit and the 3rd switch element are arranged at respectively on subscribers feeder TIP and the RING, and are positioned at outside the loop of described first switch element and user circuit suite slice composition.
Above technical scheme as can be seen, because in being built-in with the user circuit suite slice of test cell, the simple switch element of cross-over configurations between subscribers feeder TIP and RING, conducting by this switch element or end, the impedance of controlling between this two subscriber lines changes between high resistant and low-resistance, the signal that utilizes two users' line TIP and RING that test is obtained again passes to this user circuit suite slice, utilize the integrated line test function of user circuit suite slice itself to test interior lines, avoid the relay of prior art employing special test bus and complexity and cause system complex, the technical problem that reliability is low, thereby realize simple low-cost purpose of carrying out Internal Line Test down, and system reliability height.
Description of drawings
Fig. 1 is a kind of structure chart of system of existing techniques in realizing subscriber line circuit test;
Fig. 2 is the structure chart of the system of another kind of existing techniques in realizing subscriber line circuit test;
Fig. 3 is the schematic diagram of electronic installation execution mode of the present invention;
Fig. 4 is the schematic diagram of another execution mode of electronic installation of the present invention;
Fig. 5 is a kind of physical circuit figure of electronic installation among Fig. 4;
Fig. 6 is the another kind of physical circuit figure of electronic installation among Fig. 4;
Fig. 7 is another physical circuit figure of electronic installation among Fig. 4.
Embodiment
This invention provides the multiple execution mode that the electronic installation that is built-in with test cell is carried out Internal Line Test, mainly is to go up at subscribers feeder two lines (TIP/RING) to connect the controlled load modular circuit, with this electronic installation of formal testing of fictitious load.
For make purpose of the present invention, technical scheme, and advantage clearer, below with reference to the accompanying drawing execution mode that develops simultaneously, the present invention is described in more detail.
Consulting Fig. 3, is the theory diagram of electronic installation execution mode of the present invention.This electronic installation comprises:
The user circuit suite slice of integrated circuit test function, described user circuit suite slice comprise the Subscriber Line Interface Circuit (SLIC, Subscriber Line Interface Circuit) of integrated circuit test function;
First switch element comprises first end and second end, connects this two users' line TIP and RING respectively, is used to be switched on or switched off the circuit between this two users' line TIP and the RING.
This Subscriber Line Interface Circuit is applied in the phone, comprises functions such as feed, ring, also comprises electric current and voltage detecting function.
This first switch element is the controlled load module of band outside line isolation features, is connected on the two line TIP and RING of subscribers feeder.This first switch element can equivalence be the switch S 1 among Fig. 3, and its first end is two end points that are connected this two lines TIP and RING with second end.This equivalence resistance R is the equivalent resistance of switch S 1.Control signal C1 is used for opening or closing of control switch S1.Switch S 2 and S3 lay respectively on two users' line TIP and the RING, be positioned at outside the loop of switch S 1 and test cell composition, be used to block or conducting two users line TIP and RING comprise being connected between switch S 1 loop with this, realize that outside line isolates when blocking state being in.
On concrete, an end of this switch S 1 connects an end of switch S 2 and the subscriber lines of SLIC, and the other end of S1 connects load resistance R; The end of load resistance R connects switch S 1, and the other end connects an end of switch S 3 and another subscribers feeder of SLIC; One end of switch S 2 connects a subscriber lines and the switch S 1 of SLIC, and the other end connects wherein of external user circuit; One end of switch S 3 connects another subscriber lines and the resistance R of SLIC, and the other end connects wherein another root of external user circuit.C1 is a control signal, and the conducting by control switch S1 or end is controlled the impedance of this switch S 1 between two subscriber lines of SLIC and changed between high resistant and low-resistance.C2 is another control signal, can control switch S2 and the conducting of S3 or end, when needed subscribers feeder outside line and SLIC are disconnected.When resistance R is the conducting of S1 closure, the equivalent resistance of this switch S 1 between subscribers feeder.
When the SLIC operate as normal, C1 control S1 disconnects, and makes line-to-line be in high-impedance state; C2 control S2 and S3 conducting do not influence the regular traffic operation, can test outside line simultaneously; In the time will carrying out Internal Line Test, C2 control S2 and S3 disconnect, and isolate with outside line; C1 ends or conducting according to corresponding test event demand control S1's, makes first switch element be in high resistant or low resistive state respectively, and the on-hook of analog station/off-hook action utilizes the integrated electric current of SLIC itself, voltage detecting function to carry out Internal Line Test.The electric current of SLIC, voltage detecting function can send electric current and the information of voltage that records to counting circuit, calculate final test result.S2 and S3 can also can increase a control signal with same control signal control, control respectively.This controlled load module can be built by discrete devices, also can be integrated in the IC device inside, as makes integrated IC, constitutes the IC device of standalone feature, perhaps directly is integrated into SLIC inside.
Above execution mode as can be seen, because in being built-in with the electronic installation of test cell, the simple switch element of cross-over configurations between two users' line TIP and RING, conducting by this switch element or end, the impedance of controlling between this two subscriber lines changes between high resistant and low-resistance, the signal that utilizes two users' line TIP and RING that test is obtained again passes to the SLIC of this integrated circuit test function, utilize ready-made SLIC to measure interior lines, avoid the relay of prior art employing special test bus and complexity and cause system complex, the technical problem that reliability is low, thereby realize simple low-cost purpose of carrying out Internal Line Test down, and system reliability height.
Consult Fig. 4, provide electronic installation of the present invention another execution mode, this electronic installation comprises:
The user circuit suite slice of integrated circuit test function, described user circuit suite slice comprises the SLIC of integrated circuit test function;
First switch element comprises first end and second end, connects this two users' line TIP and RING respectively, is used to be switched on or switched off the circuit between this two users' line TIP and the RING.
This first switch element is the controlled load module, is not with the outside line isolation features, is connected on two users' line TIP and the RING.This first switch element can equivalence be the switch S 1 among Fig. 4, and its first end is two end points that are connected this two lines TIP and RING with second end.This equivalence resistance R is the equivalent resistance of switch S 1.Control signal C1 is used for opening or closing of control switch S1.
On concrete, this controlled load module is not with the outside line isolation features, directly is connected across on the two line TIP and RING of subscribers feeder.This controlled load inside modules equivalence is the cascaded structure of a switch S 1 and resistance R, and an end of switch S 1 is connected the subscriber lines of SLIC, and the other end of S1 connects load resistance R; The end of load resistance R connects switch S 1, and the other end is connected another subscribers feeder of SLIC.C1 is a control signal, conducting that can control switch S1 or end; R is the equiva lent impedance of this module.C1 ends or conducting by control S1's, controls the impedance of this module between two subscriber lines of SLIC and changes between high resistant and low-resistance.When resistance R is the conducting of S1 closure, the equivalent resistance of this module between subscribers feeder.When the SLIC operate as normal, C1 control S1 disconnects, and makes line-to-line be in high-impedance state, does not influence the regular traffic operation; In the time will carrying out Internal Line Test, C1 ends or conducting according to corresponding test event demand control S1's, make module be in high resistant or low resistive state respectively, the on-hook of analog station/off-hook action utilizes the test function of the state-detection of SLIC itself and line voltage distribution, electric current to carry out Internal Line Test.This controlled load module can be built by discrete devices, also can be integrated in the IC device inside, as makes integrated IC, constitutes the IC device of standalone feature, perhaps directly is integrated into SLIC inside.
Above execution mode as can be seen, because in being built-in with the electronic installation of test cell, the simple switch element of cross-over configurations between two users' line TIP and RING, conducting by this switch element or end, the impedance of controlling between this two subscriber lines changes between high resistant and low-resistance, the signal that utilizes two users' line TIP and RING that test is obtained again passes to the test cell of this integrated circuit test function, avoid the relay of prior art employing special test bus and complexity and cause system complex, the technical problem that reliability is low, thereby realize simple low-cost purpose of carrying out Internal Line Test down, and system reliability height.
Consulting Fig. 5, is a kind of physical circuit figure of electronic installation shown in Figure 4.
On concrete, this comprises that the controlled load circuit of switch S 1 is a kind of ambipolar controlled load circuit.Promptly comprise rectification circuit, its input meets one of this two users' line TIP and RING, after output connects first end of this first switch element, connects remaining this two users' line TIP or RING.Like this, no matter SLIC is for positive polarity state or reversed polarity state, and the impedance of this module between TIP line and RING line can be subjected to C1 control to be in high-impedance state or low resistance state.
This controlled load circuit and SLIC are altogether.Wherein C1 is the control signal input, with the return flow path of GND zone network composition control signal.Resistance R 3 one end connection control signal C1, the other end connects the emitter-base bandgap grading of PNP triode Q2; The emitter-base bandgap grading of PNP triode Q2 connects the end of R3, and base stage connects zone network, and collector electrode connects an end of resistance R 2 and the base stage of NPN triode Q1; Resistance R 2 one ends connect the collector electrode of Q2 and the base stage of Q1, and the other end connects emitter-base bandgap grading, the anode of diode D1 and the anode of diode D2 of Q1; The base stage of NPN triode Q1 connects the end of R2 and the collector electrode of Q2, and emitter-base bandgap grading connects the other end, the anode of D1 and the anode of D2 of R2, and collector electrode connects an end of resistance R 1; Resistance R 1 one ends connect the collector electrode of Q1, and the other end connects the negative electrode of diode D3 and the negative electrode of diode D4; The anode of diode D1 connects emitter-base bandgap grading, the end of R2 and the anode of diode D2 of Q1, and negative electrode connects the anode of subscribers feeder TIP and D4; The anode of diode D2 connects emitter-base bandgap grading, the end of R2 and the anode of diode D1 of Q1, and negative electrode connects the anode of subscribers feeder RING and D3; The anode of diode D3 connects the negative electrode of subscribers feeder RING and D2, and negative electrode connects the end of R1 and the negative electrode of D4; The anode of diode D4 connects the negative electrode of subscribers feeder TIP and D1, and negative electrode connects the end of R1 and the negative electrode of D3.
When C1 was low level, Q2 ended, and Q1 ends, and this module presents high resistant in line-to-line; When C1 is high level, the Q2 conducting, the Q1 conducting, this module presents low-resistance in line-to-line, and resistance is about the resistance of R1.Diode D1, D2, D3 and D4 can replace with a diode bridge heap.Resistance R 1 can be selected suitable power and resistance, also can remove resistance R 1, and the negative electrode of D3 and D4 directly is connected the collector electrode of NPN triode Q1, reduces to consume the power on this controlled load circuit.
Consulting Fig. 6, is the another kind of physical circuit figure of electronic installation shown in Figure 4.This physical circuit is with the above-mentioned physical circuit main distinction: the emitter-base bandgap grading of PNP triode Q2 is connected the VCC electric power network by resistance R 3; The base stage connection control signal C1 of PNP triode Q2.
This circuit is a kind of ambipolar controlled load circuit.No matter SLIC is for positive polarity state or reversed polarity state, and the impedance of this module between TIP line and RING line can be subjected to C1 control to be in high-impedance state or low resistance state.This circuit and SLIC are altogether.Wherein C1 is the control signal input, with the return flow path of VCC electric power network composition control signal.Resistance R 3 one ends connect the VCC electric power network, and the other end connects the emitter-base bandgap grading of PNP triode Q2; The emitter-base bandgap grading of PNP triode Q2 connects the end of R3, base stage connection control signal C1, and collector electrode connects an end of resistance R 2 and the base stage of NPN triode Q1; Resistance R 2 one ends connect the collector electrode of Q2 and the base stage of Q1, and the other end connects emitter-base bandgap grading, the anode of diode D1 and the anode of diode D2 of Q1; The base stage of NPN triode Q1 connects the end of R2 and the collector electrode of Q2, and emitter-base bandgap grading connects the other end, the anode of D1 and the anode of D2 of R2, and collector electrode connects an end of resistance R 1; Resistance R 1 one ends connect the collector electrode of Q1, and the other end connects the negative electrode of diode D3 and the negative electrode of diode D4; The anode of diode D1 connects emitter-base bandgap grading, the end of R2 and the anode of diode D2 of Q1, and negative electrode connects the anode of subscribers feeder TIP and D4; The anode of diode D2 connects emitter-base bandgap grading, the end of R2 and the anode of diode D1 of Q1, and negative electrode connects the anode of subscribers feeder RING and D3; The anode of diode D3 connects the negative electrode of subscribers feeder RING and D2, and negative electrode connects the end of R1 and the negative electrode of D4; The anode of diode D4 connects the negative electrode of subscribers feeder TIP and D1, and negative electrode connects the end of R1 and the negative electrode of D3.
When C1 is low level, the Q2 conducting, the Q1 conducting, this module presents low-resistance in line-to-line, and resistance is about the resistance value of R1; When C1 was high level, Q2 ended, and Q1 ends, and this module presents high resistant in line-to-line.Diode D1, D2, D3 and D4 can replace with a diode bridge heap.Resistance R 1 can be selected suitable power and resistance, also can remove resistance R 1, and the negative electrode of D3 and D4 directly is connected the collector electrode of NPN triode Q1, reduces to consume the power on this controlled load circuit.
Consulting Fig. 7, is another physical circuit figure of electronic installation second execution mode shown in Figure 4.This physical circuit is with the above-mentioned physical circuit main distinction: triode switch S1 is replaced with the photosensitive switch triode.
In this physical circuit, this first switch element is the photosensitive switch triode, and this photosensitive switch triode comprises phototriode and luminescence unit, and the collector electrode of this phototriode and emitter-base bandgap grading are respectively as first end and second end of this first switch element.This luminescence unit comprises light-emitting diode, resistance R 2, resistance R 3 and NPN triode Q1, the anode of this light-emitting diode connects power supply by this resistance R 2, negative electrode connects the collector electrode of this triode Q1, and the base stage of this triode Q1 connects control signal C1, emitter grounding by this resistance R 3.Utilize the conducting of phototriode and by realizing switching function.
On concrete, this circuit is a kind of ambipolar controlled load circuit.No matter SLIC is for positive polarity state or reversed polarity state, and the impedance of this module between TIP line and RING line can be subjected to C1 control to be in high-impedance state or low resistance state.The control section of this circuit can with SLIC altogether, also can be not altogether.Wherein C1 is the control signal input, with the return flow path of VCC electric power network composition control signal.Resistance R 3 one end connection control signal C1, the other end connects the base stage of NPN triode Q1; The base stage of NPN triode Q1 connects the end of R3, and emitter-base bandgap grading connects the control zone network, and collector electrode connects the negative electrode of the light-emitting diode of optocoupler U2; Resistance R 2 one ends connect the VCC network, and the other end connects the anode of the light-emitting diode of optocoupler U2; The anode of the light-emitting diode of optocoupler U2 connects an end of resistance R 2, the negative electrode of light-emitting diode connects the collector electrode of triode Q1, the emitter-base bandgap grading of phototriode connects the anode of diode D1 and the anode of diode D2, and the collector electrode of phototriode connects an end of resistance R 1; One end of resistance R 1 connects the negative electrode of diode D3 and the negative electrode of diode D4, and the other end connects the collector electrode of the phototriode of optocoupler U2; The emitter-base bandgap grading of the phototriode of the anode connection optocoupler U2 of diode D1 and the anode of diode D2, negative electrode connects the anode of subscribers feeder TIP and D4; The emitter-base bandgap grading of the phototriode of the anode connection optocoupler U2 of diode D2 and the anode of diode D1, negative electrode connects the anode of subscribers feeder RING and D3; The anode of diode D3 connects the negative electrode of subscribers feeder RING and D2, and negative electrode connects the end of R1 and the negative electrode of D4; The anode of diode D4 connects the negative electrode of subscribers feeder TIP and D1, and negative electrode connects the end of R1 and the negative electrode of D3.
When C1 is high level, the Q1 conducting, the U2 conducting, this module presents low-resistance in line-to-line, and resistance is about the resistance value of R1; When C1 was low level, Q1 ended, and U2 ends, and this module presents high resistant in line-to-line.Diode D1, D2, D3 and D4 can replace with a diode bridge heap.The selection that will note power, resistance of resistance R 1 also can be removed resistance R 1, and the negative electrode of D3 and D4 directly is connected the collector electrode of NPN triode Q1, reduces to consume the power on this controlled load circuit.Optocoupler U2 can select suitable withstand voltage, to bear the maximum voltage difference on two users' line.
In the above-mentioned execution mode, the SLIC integrated current in the user circuit suite slice and the measuring ability of voltage, in other embodiments, the user circuit suite slice of this integrated current measuring ability also can adopt following structure to realize: this user circuit suite slice comprises any other suitable circuit in the nest plate of the Subscriber Line Interface Circuit of integrated current measuring ability and integrated voltage detecting function, such as: the codec of the Subscriber Line Interface Circuit of integrated current measuring ability and integrated voltage detecting function.Carry out Internal Line Test because of these execution modes can utilize ready-made user circuit suite slice equally, do not need other custom-designed line test module, thereby have low cost, technique effect simple in structure equally.
The present invention also provides a kind of subscriber's line nest plate, and as shown in Figure 3, described subscriber's line nest plate comprises the Subscriber Line Interface Circuit of integrated circuit test function, connects subscribers feeder TIP and RING; Also comprise first switch element, comprise first end and second end, connect described subscribers feeder TIP and RING respectively, be used to be switched on or switched off described subscribers feeder TIP and RING.Present embodiment can adopt switch element to be overlapped on the Subscriber Line Interface Circuit of existing integrated circuit test function easily, realizes the Internal Line Test function simply at low cost.Described first switch element can be first switch element as described in Figure 4.The physical circuit of described first switch element can be referring to Fig. 5 to circuit shown in Figure 7.
The present invention also provides a kind of circuit testing method, comprises step:
A, be switched on or switched off subscribers feeder TIP and RING;
B, employing Subscriber Line Interface Circuit are tested the curtage that is switched on or switched off generation between described subscribers feeder TIP and the RING;
C, obtain described test result.
In the said method, steps A is to adopt all available means to be switched on or switched off subscribers feeder TIP and RING, comprises the form that adopts the switching circuit that connects subscribers feeder TIP and RING.
Be to adopt the integrated test function of Subscriber Line Interface Circuit to come curtage is tested among the step B.
After obtaining test result, can report described result to control desk/server.
To sum up, the embodiment of the invention can produce following technique effect at least:
1, simple in structure, do not need to adopt special test bus and relay;
2, effectively realize the Internal Line Test function, the controlled load module of increase can cooperate the test cell in the electronic installation to realize the Internal Line Test function;
3, cost is low, does not need change to have now and utilizes the electronic installation internal structure, and also not needing increases complicated external circuit, only needs to increase simple controlled load module, utilizes existing subscribers feeder can effectively realize the Internal Line Test function.
More than a kind of electronic installation provided by the present invention and user circuit suite slice thereof, method of testing are described in detail by specific embodiment, the explanation of above embodiment just is used for helping to understand method of the present invention and thought thereof; Simultaneously, for one of ordinary skill in the art, according to thought of the present invention, the part that all can change in specific embodiments and applications, in sum, this description should not be construed as limitation of the present invention.
Claims (7)
1. an electronic installation is characterized in that, comprising:
The user circuit suite slice of integrated circuit test function connects subscribers feeder TIP and RING;
First switch element, comprise first end and second end, connect described subscribers feeder TIP and RING respectively, be used to be switched on or switched off described subscribers feeder TIP and RING, described first switch element is the controlled load circuit, and input control signal is to control switching on and off between described subscribers feeder TIP and the RING;
Second switch unit and the 3rd switch element are arranged at respectively on subscribers feeder TIP and the RING, and are positioned at outside the loop of described first switch element and user circuit suite slice composition;
Rectification circuit, described rectification circuit comprises:
First diode, its negative electrode meet described subscribers feeder TIP, and anode connects described first switch element, first end;
Second diode, its negative electrode meet described subscribers feeder RING, and anode connects described first switch element, first end;
The 3rd diode, its negative electrode connect described first switch element, second end, and anode meets described subscribers feeder RING;
The 4th diode, its negative electrode connect described first switch element, second end, and anode meets described subscribers feeder TIP.
2. electronic installation according to claim 1, it is characterized in that described controlled load circuit comprises first triode, the base stage connection control signal of described first triode, collector electrode is as first end of described first switch element, and emitter-base bandgap grading is as second end of described first switch element.
3. electronic installation according to claim 2, it is characterized in that, further comprise second triode between described first transistor base and control signal, the emitter-base bandgap grading of described second triode connects described control signal by first resistance, base stage and described electronic installation are altogether, collector electrode connects the base stage of described first triode, and connects the emitter-base bandgap grading of described first triode by second resistance.
4. electronic installation according to claim 2, it is characterized in that, further comprise second triode between described first transistor base and control signal, the emitter-base bandgap grading of described second triode connects power supply by first resistance, base stage connects described control signal, collector electrode connects the base stage of described first triode, and connects the emitter-base bandgap grading of described first triode by second resistance.
5. electronic installation according to claim 1 is characterized in that, described controlled load circuit is the photosensitive switch triode.
6. electronic installation according to claim 5, it is characterized in that, described photosensitive switch triode comprises phototriode and luminescence unit, the collector electrode of described phototriode and emitter-base bandgap grading are respectively as first end and second end of described first switch element, described luminescence unit comprises light-emitting diode, first resistance, second resistance and triode, the anode of described light-emitting diode connects power supply by described first resistance, negative electrode connects the collector electrode of described triode, the base stage of described triode connects control signal, emitter grounding by described second resistance.
7. according to each described electronic installation of claim 1 to 6, it is characterized in that the user circuit suite slice of described integrated circuit test function comprises:
The Subscriber Line Interface Circuit of integrated current and voltage detecting function; Or
The codec of the Subscriber Line Interface Circuit of integrated current measuring ability and integrated voltage detecting function.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2007101301059A CN101106596B (en) | 2007-07-20 | 2007-07-20 | Electronic device and its user circuit plate fin |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2007101301059A CN101106596B (en) | 2007-07-20 | 2007-07-20 | Electronic device and its user circuit plate fin |
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| Publication Number | Publication Date |
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| CN101106596A CN101106596A (en) | 2008-01-16 |
| CN101106596B true CN101106596B (en) | 2011-05-04 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN2007101301059A Active CN101106596B (en) | 2007-07-20 | 2007-07-20 | Electronic device and its user circuit plate fin |
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Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN102932057B (en) * | 2012-10-10 | 2016-08-24 | 烽火通信科技股份有限公司 | The line testing process of voice terminal device |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1043417A (en) * | 1988-12-08 | 1990-06-27 | 北方电信有限公司 | Telephone protection circuit |
| CN1202769A (en) * | 1997-05-19 | 1998-12-23 | 哈里公司 | Testing system of telecommunication subscriber line circuit and its method |
| CN1375157A (en) * | 1999-10-26 | 2002-10-16 | 电力革新有限公司 | Overvoltage protection circuitry |
| CN1852350A (en) * | 2005-09-12 | 2006-10-25 | 华为技术有限公司 | System for realizing user circuit internal line side test |
-
2007
- 2007-07-20 CN CN2007101301059A patent/CN101106596B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1043417A (en) * | 1988-12-08 | 1990-06-27 | 北方电信有限公司 | Telephone protection circuit |
| CN1202769A (en) * | 1997-05-19 | 1998-12-23 | 哈里公司 | Testing system of telecommunication subscriber line circuit and its method |
| CN1375157A (en) * | 1999-10-26 | 2002-10-16 | 电力革新有限公司 | Overvoltage protection circuitry |
| CN1852350A (en) * | 2005-09-12 | 2006-10-25 | 华为技术有限公司 | System for realizing user circuit internal line side test |
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| CN101106596A (en) | 2008-01-16 |
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