CN101079284B - Optical disc recording apparatus and method for determining optimum write power thereof - Google Patents

Abstract

A method for determining optimum write power for an optical disc in an optical disc recording apparatus includes, test writing the optical disc as a recording medium at a first position where a write sensitivity is higher than an average write sensitivity of the optical disc and at a second position where the write sensitivity is lower than the average write sensitivity by the same amount of difference as the difference between the write sensitivity at the first position and the average write sensitivity, using the same write power to the both of the first position and the second position, and obtaining an optimum write power for the optical disc from an average of a write characteristics of the test written positions.

Description

Be used for determining the optical disc recording apparatus and the method for optimum write power

Technical field

The present invention relates to a kind of by using laser on CD, to carry out the optical disc recording apparatus that writes.The invention particularly relates to and a kind ofly write the optical disc recording apparatus of having set optimum write power on CD, carrying out, and a kind of method that is used in this optical disc recording apparatus, determining optimum write power.

Background technology

In video disc recording, determine and the method for control optimum write power in (after this, optimum write power is abbreviated as Po, optimal power control is abbreviated as OPC), usually Po is calculated by arithmetically handling write diagnostics, such as the degree of depth of asymmetric, the amplitude after writing the fluctuation of fashionable reflection coefficient, writing, modulation and by being fit to obtain near the Writing power of Po (after this, be abbreviated as Pm) write the shake that (test writing) obtains (after this, these a series of processing abbreviate Po as operate) by examination on several points of selecting.

Yet up to carrying out OPC, the explicit value of Pm is only available.For this reason, carry out examination with the Writing power of the enough wide scope that can estimate and write, on the basis of thus obtained write diagnostics, select Pm, and use near the write diagnostics of the point the Pm that selects thus to carry out the Po operation.

In OPC, when CD when rotated, in the continuous track record of CD, carry out examination and write.Carrying out examination with reformed Writing power writes.Yet, in the prior art, Writing power simply from minimum change to the highest, perhaps opposite.The problem that causes thus is that Writing power depends on the position on CD.

Fig. 1 has schematically showed OPC method of the prior art.For the ease of explaining, example in this case comprise frequency be θ t sinusoidal wave form write sensitivity fluctuation.The number of carrying out the power (after this, number is abbreviated as N) that examination writes in this embodiment is 6, but can change for this number of each actual conditions.P (i) is that power is write in a series of examinations, and E (i) is a series of by writing the write diagnostics that obtains with P (i) execution examination.For the easy understanding of explaining, examination is write Writing power in the power Series P (i) and is set to along with the increase of value i and increases in this embodiment, and still the present invention is not limited thereto.

P (i) i:0 is to N-1 ... (1)

P(i)＜P(i+1) ...(2)

Usually, in OPC, with reformed examination write power on the specific continuous position of rotary CD, carry out the examination write.Fig. 1 has showed that writing reference position execution examination from the examination that is expressed as θ s writes, and Writing power is that P (0) is to P (5).Then, use thus obtained write diagnostics E (i) to carry out the Po operation.This example has showed that { P (1)+P (2) }/2 are selected as Pm, and near the write diagnostics E (1) Pm and E (2) are selected for the Po operation.By this sensitivity fluctuation that writes as shown in the figure, the Po value will be the value corresponding to state, in this state, write sensitivity for high by what the Po operation obtained, in this Po operation because the write diagnostics E (1) and the E (2) that use write the value of measuring on the position of sensitivity at height.

Each when carrying out examination and writing, write sensitivity fluctuation and examination and write phase relation difference between the reference position θ s.Fig. 2 has showed such example.When carrying out OPC under such phase relation, the Po value that is obtained is the value corresponding with state, and in this state, it is low writing sensitivity, because write diagnostics E (1) and E (2) are in the low value of measuring on the sensitivity position that writes.

The example of Fig. 1 and Fig. 2 has been showed the problem that OPC had in the prior art.Especially, the change of the Po value that is obtained is to write phase relation decision between the reference position by writing sensitivity fluctuation and examination, and this will cause having lower correctness among the OPC.

Fig. 23 has showed OPC method of the prior art.Showed that at the camber line arrow of the circle of arranging with the essentially concentric form on the CD 1 how carrying out examination on the spiral record track that forms on the CD 1 writes.In the position of indicating respectively near the numeral of placing on the position at center on the CD 1.P (i) is a Writing power, carries out examination with it in each part shown in the circular camber line arrow of correspondence and writes.For the ease of explaining that the number of the Writing power in Writing power series (N) is set to 8 in this figure, but can change for this number of each actual conditions.Equally for the ease of explaining that th writing power P (i) is set to along with the increase of value i and increases.

Figure 24 has showed the relation between the position on the CD, Writing power and write diagnostics that obtains by OPC.Here, E (i) is the write diagnostics when carrying out examination with of the correspondence of th writing power P (i) and write.As mentioned above, in OPC, select to be suitable for obtaining the th writing power P m of Po, select near the several points of Po then, carry out the Po operation then.Example among Figure 24 has showed that P (3) is chosen as Pm, near the th writing power P selected Pm (2), P (3) and P (4), and selected write diagnostics E (2), E (3) and E (4).

Incidentally, because the sensitivity that writes of inhomogeneous (uneven) takes place in a variety of causes in CD.Like this inhomogeneous comprises because that the characteristic of recording film itself causes is inhomogeneous, because that the characteristic of coverlay and reflectance coating causes is inhomogeneous, and because that the pollution of fingerprint generation causes is inhomogeneous.Focus on the influence on the OPC, also comprise because the outward appearance inhomogeneous (apparent unevenness) that CD mismatch crooked and relative position that is connected CD that error causes and optical lens and relative angle causes.

Most of so inhomogeneous positions that depend in CD.For this reason, in the examination that prior art is carried out is write, promptly, carry out the zone that writes with near the Writing power the Pm and can become closer to each other changing to from maximum simply with Writing power minimum or opposite examination write.Consequent problem is that Writing power and inhomogeneous some combinations that write the position of sensitivity cause the number of measurement point to change a lot, and described measurement point has been subjected to writing uneven influence in the sensitivity.

Figure 25 has showed the inhomogeneous example that writes the distribution of sensitivity on the CD.Figure 26 has showed the relation between position, Writing power and the write diagnostics in the CD, and all are above-mentioned all to be to obtain by the OPC that carries out on CD, and this CD has the inhomogeneous distribution that writes sensitivity shown in Fig. 25.Figure 25 has showed in the zone and has had the inhomogeneous sensitivity that writes in 11.In this case, be subjected to inhomogeneously writing all write diagnostics E (2), E (3) and the E (4) that uses in the Po operation of sensitivity influence, and using the correctness of the Po of these values calculating significantly to reduce.

Figure 40 has schematically showed OPC method of the prior art.Herein, the Writing power that examination is write is carried out in P (i) expression.The camber line arrow of the circle of arranging in the essentially concentric mode on CD 1 has showed that how carrying out examination on track record writes, and is being illustrated respectively in the position on the CD 1 near the numeral of placing on the position at center (0,1,2,3,4,5...).As shown in the figure, it is to carry out in the continuum of rotary CD 1 that the examination in OPC is write, and Writing power is variable.For the ease of explaining, be shown below, th writing power P (i) is set to dull the increasing along with the increase of value i.In this case, the number of the Writing power in the Writing power series (N) is set to 6, but can use different numbers in the actual conditions of OPC.

P (i) i:0 is to N-1

P (i)＜P (i+1) wherein

When the execution examination was write, write diagnostics fluctuateed according to the writing sensitivity of dish.Figure 41 has showed how fluctuation takes place.The transverse axis of each figure in three curve maps (1), (2) and (3) has been showed the position on the CD among Figure 40.Z-axis in curve map (1), (2) and (3) is respectively th writing power P from top to down, write sensitivity S and write diagnostics E.Shuo the 3rd curve map (3) showed an example from top to bottom, and wherein write diagnostics is displaced to the actual value of being represented by solid line from the theoretical value that is illustrated by the broken lines, and this is owing to inhomogeneously write sensitivity and influenced write diagnostics.Because be to use these write diagnostics to calculate Po in OPC, the problem of Chan Shenging is the inhomogeneous low correctness that sensitivity causes Po that writes in the prior art.

This is inhomogeneous to write sensitivity and not only comprises the inhomogeneous of recording film and tectal characteristic in the CD, comprises that also outward appearance is inhomogeneous, such as owing to pollute and Writing power that the mispairing of optical axis causes loses.

Propose the whole bag of tricks and be used for compensating such write sensitivity fluctuation and the inhomogeneous influence that writes sensitivity.Yet, in these methods, in will carrying out the zone write of examination the measurement of write diagnostics before compensating operation (for example, check disclosed Japanese patent application No.2004-253016 and disclosed Japanese patent application No.2002-319135), or the regional stabilization that goes up write diagnostics (for example, was checked disclosed Japanese patent application No.2000-251254) before compensating operation.The shortcoming of these methods is that owing to repeat a series of comprise feature measurement and the operations that write, it is complicated that the process of OPC will be tending towards as a whole.Another problem is to be included in examination to write the method preceding writing that is performed as in the pretreated zone and be not suitable for the CD that can not rewrite, for example CD-R (can write down CD).

Summary of the invention

Especially, according to the OPC of prior art, the problem of existence is to write the Po value variation of the phase relation decision between the reference position by writing sensitivity fluctuation and examination in the CD, causes the lower correctness in OPC.Another problem is inhomogeneously to write the sensitivity influence write diagnostics is changed owing to what be subjected to CD, can only obtain Po with limited correctness.Also have a problem to be, the measurement of write diagnostics and/or in the zone in the method for stabilization before compensating operation of write diagnostics in carrying out the zone that examination writes, a series of action needs that comprise feature measurement and write repeat, and make that whole OPC process is complicated.In addition, be included in to carry out in the zone that examination writes and be not suitable for the CD that can not rewrite, for example CD-R in the method that preceding writes as pretreated.

Consider noted earlierly, expectation provides a kind of optical disc recording apparatus and method that is used for determining optimum write power, and what it can reduce CD writes sensitivity fluctuation influence, and then improves the correctness in the control Writing power.

According to one embodiment of present invention, can provide a kind of and determine the method for optimum write power for optical disc recording apparatus, reducing the influence that writes sensitivity fluctuation of CD, and improve the correctness in the control Writing power.

In addition, according to one embodiment of present invention, can provide a kind of method of optimum write power of definite optical disc recording apparatus, reducing the inhomogeneous influence that writes sensitivity of CD, and improve correctness in the control Writing power.

In order to realize above-mentioned target, the method of determining the optimum write power of CD in optical disc recording apparatus comprises: write this CD as recording medium in primary importance with in second place examination, writing of this primary importance highly sensitively on average writes sensitivity in this CD, the sensitivity that writes of this second place is lower than and on average writes sensitivity, writing sensitivity and on average writing the quantity of the difference between the sensitivity of the quantity that writes sensitivity and the difference that on average writes sensitivity of this second place and this primary importance is identical, use same Writing power in primary importance and the second place, and from the mean value of the write diagnostics of tested writing position, obtain the optimum write power of this CD.

According to the present invention, can obtain optimum write power, wherein CD writes the influence of the cycle of fluctuation of sensitivity and has been minimized, and can improve the correctness when the control Writing power.Along with the raising of the correctness in the Writing power control, hold surplus CD even have little performance for the error in the Writing power, also can obtain the record performance of predetermined quality.In addition, in the present invention, the examination that will be performed is write has only twice, and this is more effective to minimize departing from of Po than the method that repeats the control of CD power in the prior art.Can also more easily use another kind to be used to compensate the method that writes sensitivity fluctuation.

In addition, in order to realize above-mentioned target, being included on the CD examination according to the method for definite optimum write power of the present invention writes, this examination is write use and is write power series with the examination that arrange and that rearrange of intensity order, make Writing power not arrange in turn, measure the Writing power characteristic of execution examination writing position and calculate optimum write power based on measured write diagnostics with intensity adjacent one another are.

According to the present invention, the write diagnostics less position that depends on CD that becomes, thus prevent the minimizing of the correctness in the control Writing power that causes by the inhomogeneous sensitivity in the CD.

In addition, in order to realize above-mentioned target, method according to definite optimum write power of the present invention comprises: be used for monitoring in series on CD and tried to write by the Writing power that writes sensitivity fluctuation of dispersed arrangement, measure the Writing power characteristic of carrying out the examination writing position, calculate the quantity that writes sensitivity fluctuation of CD based on measured write diagnostics, and proofread and correct the variable that is used for calculating optimum write power based on calculated quantity that writes sensitivity fluctuation.

According to the present invention, can obtain optimum write power, wherein the CD uneven influence that writes sensitivity has been minimized, and can improve the correctness in the control Writing power.Along with the raising of the correctness in the Writing power control, hold surplus CD even have little performance for the error in the Writing power, also can obtain the record performance of predetermined quality.In addition, the method according to this invention can easily be used in combination with other existing method.Can expect because the unfavorable effect that causes of inhomogeneous sensitivity can be reduced, even also be like this for the use that combines with other method.

Simultaneously, the Writing power among the present invention represents to be used for the Laser emission power that for example writes at light picker, yet the present invention is not limited thereto.

Simultaneously, the variable that uses in the calculating of optimum write power according to the present invention represents to be used for the Laser emission power that writes at for example light picker, yet the present invention is not limited thereto.

According to the present invention, the primary importance and the second place can be determined based on the cycle of fluctuation that writes sensitivity.If obtain sinusoidal wave cycle of fluctuation,, can obtain the write diagnostics of average sensitivity no matter initial position is write in examination.In addition, if be given in advance about the information that writes the sensitivity fluctuation cycle, even for the CD that can not rewrite, for example CD-R also can use the present invention effectively.

As the concrete grammar of determining the primary importance and the second place based on the fluctuation that writes sensitivity of CD, can use such as with constant Writing power examination writing optical disk and obtain the fluctuation of write diagnostics, methods such as information on the home position that in CD, before had been written into based on servo error information acquisition position, regeneration.

Based on fluctuation by the write diagnostics that obtains with constant Writing power examination writing optical disk, the method that is used for obtaining the cycle of fluctuation that writes sensitivity of CD can be implemented by using a wavelength, as long as its correctness can be guaranteed that this wavelength can be short to and cover 1/4th of cycle of fluctuation.The advantage that this had is to reduce the zone that needs examination to write.

According to the present invention, the examination of regular length writes that power series can repeatedly be used so that the primary importance and the second place are write by same Writing power examination.In this case, write power series and second in first round examination and take turns examination and write between the power series gap is provided, so that both phase places of first and second positions and position can both be mated.In addition, the length that power series is write in examination can be adjusted, so that when power series was write in the examination of reusing regular length, the primary importance and the second place were write with same Writing power.

According to the present invention, the primary importance and the second place can be determined based on home position, and at this home position place, the sensitivity that writes of CD becomes average.As concrete grammar, can use such as with constant Writing power examination writing optical disk and obtain write diagnostics fluctuation, obtain the position based on servo error information, the methods such as information on the home position that regeneration formerly writes in CD.

In addition, can repeatedly use the examination of regular length to write power series, so that the primary importance and the second place are write with same Writing power.Yet, in this case, can use and write second of power series reversed in order with first round examination and take turns examination and write power series, so that the primary importance and the second place can be write with same Writing power.

And the present invention also comprises step: form the Writing power series that rearranges, make by using random number that Writing power adjacent one another are on intensity is not arranged in turn.In this case, when the Writing power of arrangement adjacent one another are is accidental when transferring to the intensity order, for addressing this problem, in two Writing powers one can be changed into other any one or order will be rearranged again.

Write in the step in examination, can also use the Writing power series examination writing optical disk that rearranges, make intensity Writing power adjacent one another are not to be arranged in turn based on the uneven fluctuation of CD medium sensitivity.

Because the inhomogeneous factors such as swing circle that depend on such as CD of sensitivity of CD, the uneven influence of the sensitivity of CD can be reduced even surpass to has based on the uneven fluctuation of sensitivity and the order of definite Writing power series, and this causes the raising of the correctness in the control Writing power.

As the test writing method that makes that intensity Writing power adjacent one another are is not arranged in turn, for example use the method for Writing power series, it is write with the examination of second reference position by the examination that will be assigned to first start bit with the Writing power of intensity order arrangement adjacent one another are and put and writes.First start bit is put with second reference position that first start bit is and then put and is calculated based on the information that the relevant CD that is obtained writes the sensitivity fluctuation cycle.By using random number, can be rearranged by the order of the Writing power series of first and second reference positions use respectively.

In addition, can calculate the cycle of fluctuation that writes sensitivity of CD, and put and second reference position based on the cycle acquisition first start bit of being calculated.

Write in the step in examination, can also use the Writing power series examination writing optical disk that rearranges, make intensity Writing power adjacent one another are do not arranged in turn based on the difference that writes sensitivity between the track of the track of inner circumferential side and outer circumferential sides.

In other words, in the CD, the sensitivity that writes between the track of the track of inner circumferential side and outer circumferential sides there are differences.In this case, using the Writing power series examination writing optical disk rearrange is effectively, makes intensity Writing power adjacent one another are do not arranged in turn based on the difference that writes sensitivity between the track of the track of inner circumferential side and outer circumferential sides like this.

The Writing power series examination writing optical disk that rearranges as use makes the concrete grammar that intensity Writing power adjacent one another are is not arranged in turn based on the difference that writes sensitivity between the track of the track of inner circumferential side and outer circumferential sides, for such as using Writing power with the arrangement adjacent one another are of intensity order to be assigned to the method for Writing power series of the track of the track of inner circumferential side and outer circumferential sides respectively.

In addition, the order of the Writing power series of using in inner circumferential side and outer circumferential sides can also be rearranged by using random number.

In addition, according to the present invention, in aligning step, the correction of Writing power series can convert the fluctuation of the amount of Writing power in the Writing power series by the amount that writes sensitivity fluctuation that will calculate to and carry out.In addition, in aligning step, the correction of write diagnostics can convert the fluctuation of the amount of write diagnostics by the amount that writes sensitivity fluctuation that will calculate to and carry out.Yet in the present invention, Writing power and/or write diagnostics are not only the variable that is used for adapting to correction.

Any Writing power in the Writing power series can be adapted to monitor the power that writes sensitivity fluctuation.By this method, be used for monitoring the power that writes sensitivity fluctuation and the write diagnostics that is written into can also be used to calculate optimum write power, this is efficient, and causes saving the zone that is used for trying writing optical disk.

According to the present invention, but in the method for the optimum write power of determining the record type CD, the influence of the cycle of fluctuation that writes sensitivity of CD is minimized, and the correctness in the control Writing power can be enhanced.

In addition, according to the present invention, but in the method for the optimum write power of determining the record type CD, the uneven influence that writes sensitivity of CD is minimized, and the correctness in the control Writing power can be enhanced.

Description of drawings

Fig. 1 is a synoptic diagram of explaining OPC method of the prior art.

Fig. 2 is a synoptic diagram of explaining the problem of OPC method in the prior art.

Fig. 3 shows the block scheme of the configuration of optical disc recording apparatus according to an embodiment of the invention.

Fig. 4 has showed first principle of method that is used for determining optimum write power according to the first to the 11 embodiment, and it has utilized the sine-shaped cycle.

Fig. 5 has showed the relation that writes between sensitivity and the write diagnostics in first principle.

Fig. 6 has showed that it has utilized sine-shaped symmetry according to second principle of the method that is used for definite optimum write power of the first to the 11 embodiment.

Fig. 7 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the first embodiment of the present invention.

Fig. 8 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the second embodiment of the present invention.

Fig. 9 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the third embodiment of the present invention.

Figure 10 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the fourth embodiment of the present invention.

Figure 11 writes relevant figure with examination among first embodiment when k=1.

Figure 12 writes relevant figure with examination among first embodiment when k=3.

Figure 13 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the fifth embodiment of the present invention.

Figure 14 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the sixth embodiment of the present invention.

Figure 15 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the seventh embodiment of the present invention.

Figure 16 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the eighth embodiment of the present invention.

Figure 17 writes relevant figure with examination among the 5th embodiment when k=1.

Figure 18 writes relevant figure with examination among the 5th embodiment when k=3.

Figure 19 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the ninth embodiment of the present invention.

Figure 20 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the tenth embodiment of the present invention.

Figure 21 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the 11st embodiment of the present invention.

Figure 22 has showed that how carrying out examination in the 9th embodiment writes.

Figure 23 is a synoptic diagram of explaining OPC method of the prior art.

Figure 24 has showed the relation of passing through the OPC acquisition between position, Writing power and the write diagnostics in CD.

Figure 25 has showed the example that writes the uneven distribution of sensitivity in the CD.

Figure 26 has showed by OPC to have the inhomogeneous relation between position, Writing power and the write diagnostics in CD that obtains on the CD of sensitivity profile that writes shown in Figure 25.

Figure 27 has showed the method that is used for determining optimum write power according to embodiments of the invention, the relation in CD between position, Writing power and the write diagnostics.

Figure 28 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the 12nd embodiment of the present invention.

Figure 29 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the 13rd embodiment of the present invention.

Figure 30 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the 14th embodiment of the present invention.

Figure 31 has showed the method that is used for determining optimum write power of the 14 embodiment, the relation in CD between position, Writing power and the write diagnostics.

Figure 32 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the 15th embodiment of the present invention.

Figure 33 has showed the method that is used for determining optimum write power of the 15 embodiment, the relation in CD between position, Writing power and the write diagnostics.

Figure 34 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the 16th embodiment of the present invention.

Figure 35 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the 17th embodiment of the present invention.

Figure 36 has showed the method that is used for determining optimum write power according to the 17 embodiment, the order of the Writing power of CD inner circumferential side and outer circumferential sides.

Figure 37 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the 18th embodiment of the present invention.

Figure 38 has showed the method that is used for determining optimum write power according to the 18 embodiment, the order of the Writing power of CD inner circumferential side and outer circumferential sides.

Figure 39 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the 19th embodiment of the present invention.

Figure 40 is the figure that explains OPC method in the prior art.

Figure 41 is the figure that explains the problem of OPC method in the prior art.

Figure 42 is the synoptic diagram of test writing method of method that is used for determining optimum write power that is illustrated in according to the 20th embodiment of the present invention.

Figure 43 is the process flow diagram of showing according to the method that is used for definite optimum write power of the 20 embodiment.

Figure 44 has schematically showed according to the relation between the method variable that is used for definite optimum write power of the 20 embodiment.

Figure 45 is the relevant synoptic diagram of computing method with ratio Δ E/ Δ P, i.e. variation of write diagnostics and the ratio that is used to monitor near the Writing power the th writing power P t that writes the sensitivity fluctuation cycle.

Figure 46 handles relevant synoptic diagram with the insertion that is used for the Writing power penalty coefficient.

Figure 47 is the synoptic diagram how influence of showing the cycle of fluctuation write sensitivity suppresses by the Writing power series of proofreading and correct.

Figure 48 has showed the example according to the correction of the method write diagnostics that is used for definite optimum write power of the 21st embodiment of the present invention.

Figure 49 is a process flow diagram of showing the method that is used for definite optimum write power of the 21 embodiment.

Figure 50 is the synoptic diagram that is illustrated in according to the method test writing method that is used for definite optimum write power of the 22nd embodiment of the present invention.

Figure 51 has showed that schematically the 22 embodiment's is used for determining relation between the method variable of optimum write power.

Figure 52 is the process flow diagram of showing according to the method that is used for definite optimum write power of the 22 embodiment.

Figure 53 is the process flow diagram of showing according to the method that is used for definite optimum write power of the 23 embodiment.

Embodiment

Below, will be described in detail with reference to the attached drawings embodiments of the invention.

[first embodiment]

Fig. 3 is the block scheme of displaying according to the configuration of the optical disc recording apparatus of embodiments of the invention.In the drawings, reference number 1 is a CD.Spindle Motor 2 rotary CDs 1.Light picker 3 comprises for example optical element part, such as semiconductor laser, drives the driving circuit of semiconductor laser, lens and actuator etc.Sledge motor 4 is along the tangential mobile light picker 3 of CD 1.Reproducing unit 7 is data, positional information and the synchronous sequence of regenerative recording on CD 1 from the signal that is obtained by light picker 3.The synchronous sequence that obtains according to the information on the various errors that monitor by light picker 3, from reproducing unit 7 etc., the actuator of servo 5 control Spindle Motor 2, sledge motor 4 and light picker 3.At expectation state, the rotation number of servo 5 control CD 1; The position of light picker 3; With from the position of the laser beam of light picker 3 output, optical axis, inclination, focusing etc.Automated power control (APC) portion 6 is in expectation value according to the information Control Laser emission power that is monitored by light picker 3 etc.Write diagnostics measurement section 8 is based on the information measurement write diagnostics from light picker 3, such as degree of modulation, asymmetric, β value, shake etc.Writing power modulation portion 9 is according to the information that will the be written into Laser emission power of light modulated pick-up 3 suitably.Control part 10 each parts of control, and comprise sequencer, CPU (central processing unit), storer etc.

For the data of regenerating in CD 1, suitable hot spot projects on the CD 1 from light picker 3.In addition, servo 5 rotary CD suitably, and light picker 3 is moved to the position of expectation.In addition, by controlling actuator etc., hot spot is made into the track record scanning along CD 1.At this state, the data of reproducing unit 7 regenerative recordings in CD 1.

In order to write data in CD 1, Writing power modulation portion 9 is the waveform of the light of light modulated pick-up 3 suitably, and this waveform is from the waveform of the light of data reproduction state, and therefore data are written in the CD 1.The information of the relevant Writing power that use this moment obtains by the OPC that carried out before writing.

Comprise the distinctive fluctuation of recording film the cycle of fluctuation that writes the sensitivity factor that influences OPC, and the outward appearance fluctuation that produces for the mispairing of track record by the relative tilt of for example writing light inlet and hot spot, this mispairing is because the inclination and the distortion of CD 1 cause.Depend on the physical location in the CD 1 these cycle of fluctuation that write sensitivity.Therefore, when hot spot scanning rotary CD 1 surperficial, can observe depend on physical relation in the CD 1 periodically write sensitivity fluctuation.The sensitivity fluctuation that writes like this comprises for example having the cycle of fluctuation that writes sensitivity that equates the cycle with CD 1 swing circle, the cycle relevant with the shape of the guide groove that forms in the track record that has with CD 1 or swing write sensitivity fluctuation.Comprise also that wherein each has the sensitivity fluctuation that writes that divides exactly cycle of obtaining by with in the above-mentioned cycle.

These great majority that write in the sensitivity fluctuation can be similar to single sine wave or a plurality of sine wave.The cycle of each fluctuation can and calculate from the data of measuring in advance from the control information that obtains by servo 5.

In the first to the 11 embodiment of the present invention, the fact of concern be that these write sensitivity fluctuation each have the cycle of sine wave pattern.When examination is write, write in primary importance and second place execution with same Writing power, this primary importance has the sensitivity higher than the average sensitivity of object optical disc 1, this second place has the sensitivity lower than average sensitivity, and the difference of itself and average sensitivity equals the difference that writes sensitivity and average sensitivity at primary importance place.In order to reduce the influence that writes sensitivity fluctuation of CD 1, the average write diagnostics from carry out the position of trying to write obtains Po.

Be used for determining carrying out on each position therein the example that examination writes with the method for two ad-hoc locations obtaining average write diagnostics and comprise the method for utilizing the cycle and the method for utilizing sinusoidal wave symmetry.

Fig. 4 has showed first principle of the method that is used for determining optimum write power, and this method has been utilized the sine-shaped cycle.Here, for the ease of explaining, provide the example that writes sensitivity fluctuation with single sine wave pattern.Be similar to writing sensitivity fluctuation and can being regarded as it each all has the combination that writes sensitivity fluctuation of single sine wave pattern of a plurality of sinusoidal wave combinations.

In Fig. 4, Z-axis is the sensitivity that writes of CD 1, and transverse axis is the angle that the direction (at circumferencial direction) at track record goes up the polar coordinate representation of position.Here, suppose that writing sensitivity S (θ) can be similar to and be expressed from the next, this S (θ) is the sensitivity that writes at position θ place.

S(θ)＝A·sin(2·π·θ/θt)+Sv ...(3)

A wherein, Sv and θ t are respectively amplitude, average and the cycles that writes sensitivity fluctuation.

In the scheme of first principle, all carry out to write with specific th writing power P at position θ a and position θ b, the θ b distance of putting θ a of offing normal in position equals k θ t/2 (wherein k is an odd number).As long as have suitable distance between two positions to be selected, then any position can both be selected as two positions.

Suppose that the sensitivity that writes at position θ a and θ b is respectively Sa and Sb, and, can set up the relation that formula (5) and (6) are represented based on the character of the sine wave of formula (4) expression.

Sin (θ)=-sin (θ+k π) (wherein k is an odd number) ... (4)

Sb＝A·sin(2·π·θb/θt)+Sv

＝A·sin(2·π·θa/θt+k·π)+Sv

So Sa-Sv=-(Sb-Sv) ... (5)

So Sv=(Sa+Sb)/2 ... (6)

In Fig. 4, suppose k=1, and position θ a and θ b all place single sine wave.Yet, each of two position θ a and θ b can by use equal 3 or bigger odd number k place on a plurality of sine waves.

Here, writing fashionable write diagnostics, promptly write the function of sensitivity with th writing power P with function Es (S) expression.Usually, enough little by the variation that writes the Es (S) that sensitivity fluctuation causes so that the variation in Es (S) is approximately the linear change about S.Fig. 5 has showed this situation.Here, Es (Sa) and Es (Sb) are respectively the write diagnostics at position θ a and θ b place on the track record, and Es (Sv) is the write diagnostics with position of average sensitivity Sv.The write diagnostics Es (Sv) that the write diagnostics that will use in OPC preferably obtains with average sensitivity Sv.In this scheme, the following formula that is drawn by formula (6) easily provides so preferred write diagnostics.

Es(Sv)≈{Es(Sa)+Es(Sb)}/2 ...(7)

This scheme has advantage and no matter is when available the cycle that writes sensitivity fluctuation of sine wave pattern is, can obtain to carry out the write diagnostics that writes on average to write sensitivity, and the reference position of writing with examination is irrelevant.

On the other hand, there is another kind of method, in the method, can obtains to write the phase place of sensitivity fluctuation and utilize sinusoidal wave symmetry.Fig. 6 has showed second principle of utilizing symmetry therein.Position θ v is the home position in this scheme, and at θ v place, position, S (θ)=Sv.In Fig. 6, suppose θ v=θ t/2, but θ v can or be θ t for 0.Other symbolic representation identical with the symbol that uses among Fig. 5 with as the identical content of the preceding content of releasing.

In this scheme, θ a and θ b are arranged on two positions, and one of them is positioned at before the central θ v, and another is after θ v, and each of θ a and θ b is from the same distance of θ v.

By such arrangement, sinusoidal wave symmetry has provided the relation shown in formula (5) and (6).As a result of, formula (7) has provided with average sensitivity Sv and has write fashionable write diagnostics Es (Sv).

This scheme has advantage, and to be no matter to write sensitivity fluctuation be when available the position of average sensitivity is, can obtain to carry out the write diagnostics that writes on average to write sensitivity, and irrelevant with the cycle that writes sensitivity fluctuation.

Described above is is used for determining writing two kinds of methods that on average write two ad-hoc locations that sensitivity uses to find out carrying out examination.Especially, the example of utilizing the cycle and utilizing symmetry has been described.This embodiment is not limited to these examples.For example, can carry out examination in the following manner writes.Before writing, examination carries out with the writing of specific Writing power, then the position of on the basis of write diagnostics fluctuation, determining to have highly sensitive position especially and having muting sensitivity.Carrying out examination afterwards writes.

Fig. 7 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of first embodiment of the invention, and this method is utilized sinusoidal wave period.Figure 11 writes relevant figure with examination among first embodiment when k=1, Figure 12 writes relevant figure with examination among first embodiment when k=3.Here, Lb is the distance on the track record of CD 1, wherein carries out examination with th writing power P (i) and writes (after this this distance is known as block length).In addition, Lg is used for aiming at the spacing distance (after this this distance is known as the gap) that the serial position phase place with second P that takes turns (i) series of first round P (i) is provided.At Figure 11 and Figure 12, the number N of P (i) series is made as 6, but the present invention is not limited to this situation.

In first embodiment, obtain the cycle θ t that writes sensitivity fluctuation of each CD 1 in advance by modes such as measurements, then in the storer of optical disc recording apparatus as database storing.

The process of the method that is used for definite optimum write power of foundation first embodiment will at length be introduced.

(step S1101) beginning, control part 10 obtains to be used for the cycle θ t that writes sensitivity fluctuation of object optical disc 1 from the database that the storer of control part 10 is stored.

(step S1102) on the basis of the number N of the sensitivity cycle θ t, the block length Lb that are obtained and P (i) series, control part 10 determined value k make and satisfy following condition.

Condition 1:k is a positive odd number, and

Condition 2:k θ t/2 〉=NLb ... (8)

Notice that although k can get very big value, it makes the track length that uses longer in examination is write, yet common preferably k gets the minimum value that all can satisfy above-mentioned condition.

(step S1103) next, control part 10 comes calculated gap length L g to aim at first round examination and write and second to take turns the position phase place that examination is write by using following formula.

Lg＝k·θt/2-N·Lb ...(9)

(step S1104) based on the condition that is obtained so far, control part 10 is carried out examination and is write, for example as Figure 11 and shown in Figure 12.In gap portion, write with suitable Writing power execution, or execution writes.In addition, the first round writes and second takes turns to write and can be used as continuous process and carry out, or carries out as two separating process.

(step S1105) control part 10 is being carried out measurement write diagnostics Ea (i) and Eb (i) on the position of trying to write.

(step S1106) control part 10 use formulas (7) are on average to write Calculation of Sensitivity write diagnostics E (i).

(step S1107) control part 10 executable operations are to obtain optimum write power Po.Proposed to be used for the whole bag of tricks of this operation, the present invention is not limited to specific method.

(step S1108) when the influence that writes sensitivity fluctuation is reduced, obtains optimum write power Po like this.

[second embodiment]

As previously mentioned, there are the various sensitivity fluctuation factors that write.When a part of factor relevant with cyclic swing promptly such as the relative tilt of hot spot, with the mistake row of track record (after this, such mistake row is known as inclined to one side rail) and the mistake row that focuses on is (after this, such mistake row is known as inclined to one side Jiao) this part factor when being reduced, the correctness among the OPC can be enhanced.The control information of these factors can obtain from servo 5.

Fig. 8 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the second embodiment of the present invention, and it uses the relevant information that writes sensitivity fluctuation that obtains from servo 5.

(step S1201) control part 10 passes through from the control information of servo 5 each factor of acquisition, measures the sensitivity fluctuation that writes that comprises such as factors such as inclination, inclined to one side rail and inclined to one side Jiao.Be used to measure longer the time chien shih improve for the measurement correctness of θ t, but as long as correctness is maintained specific level, the shorter time that for example only covers for four/one-period can allow.

(step S1202) control part 10 calculates from the information that obtains at step S1201 and writes sensitivity fluctuation cycle θ t.Subsequent processes is step S1102 to step S1108, and is identical with step among first embodiment.

[the 3rd embodiment]

In making the process of CD 1, can know usually, obtain writing sensitivity fluctuation by the characteristics fluctuation of the recording film of CD 1 and the characteristic of reflectance coating or coverlay.Usually, in recordable CD 1, be the purpose (after this, such position is known as the address) of indication physical location, groove structure is subjected to wobble modulations, or pit is provided.Carry out these and handle so that address information is embedded in the CD 1, and the method that wherein will for example here be embedded in these pits about the information that writes the sensitivity fluctuation cycle of CD 1 also is favourable.

Fig. 9 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the third embodiment of the present invention.This method is used the relevant information that writes the cycle of sensitivity fluctuation that is embedded in the CD 1.

(step S1301) control part 10 writes sensitivity cycle θ t from the information acquisition that is embedded into CD 1.It is identical with step among first embodiment to step S1108 that subsequent processes is step S1102.

[the 4th embodiment]

When in CD 1, writing direct, can from observed write diagnostics fluctuation, obtain to write the cycle of sensitivity fluctuation.Writing direct like this can be short length, even is short to and only covers about four/one-period, as long as correctness is maintained specific level.This embodiment has been to save than the advantage of other embodiment and has been used to the zone of trying to write.In addition, owing to an acquisition cycle in this embodiment of the present invention, therefore also can use the CD 1 that can not rewrite, for example CD-R.Carrying out examination in the zone that non-examination writes will not being performed of the CD 1 that can not rewrite writes.Under the situation of rewritable CD 1, can in will carrying out the same area that non-examination writes, carry out examination and write.

Figure 10 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the fourth embodiment of the present invention, in the method by carry out the cycle that obtains the write diagnostics fluctuation that writes with constant Writing power in CD 1.

(step S1401) begins, and carries out writing on CD 1 with constant th writing power P.

(step S1402) control part 10 is measured the cycle θ t that write diagnostics obtains to write sensitivity fluctuation by carry out the position that writes at step S1401.It is identical with step among first embodiment to step S1108 that subsequent processes is step S1102.

[the 5th embodiment]

In first embodiment to the, four embodiment,, make the serial position phase place and second of first round P (i) take turns the position phase alignment of P (i) by the gap is provided.Can come excute phase to aim at by changing write-in block length.Especially, adjust block length, it is θ t/2 that the length and second that makes first round examination write is taken turns the length of trying to write.Yet, notice that usually, short write-in block length has reduced the correctness of write diagnostics, make in this case suitably adjusted value k.

Figure 13 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the fifth embodiment of the present invention, in the method, by changing write-in block length, make the position phase place and second of first round P (i) series take turns the serial position phase alignment of P (i).Figure 17 writes relevant figure with the examination of execution among the 5th embodiment when k=1.Figure 18 writes relevant figure with the examination of execution among the 5th embodiment when k=3.

(step S1501) beginning, control part 10 obtains the cycle θ t that writes sensitivity fluctuation of object optical disc 1 from the database that the storer of control part 10 is stored.

(step S1502) next, control part 10 determines to satisfy the value k of following condition from the number N of the cycle θ t, the block length Lb that write sensitivity fluctuation that are obtained and P (i) series.

Lb＝{k·θt/2}/N ...(10)

Wherein k is a positive odd number.

Value k can be 1, but when block length Lb for the correctness of desired write diagnostics too in short-term, can suitably select bigger positive odd number.

(step S1503) next, based on the information that is obtained so far, control part 10 for example carries out that Figure 17 and examination shown in Figure 180 write.Such gap that do not use in first embodiment this moment.It is identical with step among first embodiment to step S1108 that subsequent processes is step S1105.

[the 6th embodiment], [the 7th embodiment], [the 8th embodiment]

As second embodiment to the, four embodiment, the example that is used for obtaining at step S1501 the method for cycle θ t comprises from for example servo 5 control information, embeds the method for information in CD 1, the method that writes with execution such as firm power P etc.As the 6th embodiment, the 7th embodiment and the 8th embodiment be used for determine that the method for optimum write power of each embodiment shows at Figure 14, Figure 15 and Figure 16 respectively.Identical among the process of after obtaining cycle θ t, carrying out and the 5th embodiment.

[the 9th embodiment]

Figure 19 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the ninth embodiment of the present invention, and this method utilization writes the symmetry of sensitivity fluctuation.Figure 22 has showed that how carrying out examination in the 9th embodiment writes.Here, θ v is the home position in will carrying out the zone of trying to write, and at this home position, writes sensitivity S (θ) and equal average sensitivity Sv.

(step S1901) based on from servo 5 control information, control part 10 measure such as tilt, rail and Jiao's fluctuation partially partially.The correctness that the longer time chien shih that is used to measure is measured for θ t improves, but as long as correctness is maintained specific level, the shorter time can allow, and for example only covers the time of four/one-period.

(step S1902) control part 10 estimates to write sensitivity fluctuation from the information that obtains at step S1901, and obtains home position θ v, and on this home position, the sensitivity that writes of estimation equals on average to write sensitivity S v.Home position can be to comprise 0, and as long as any position of θ t/2 and θ t is S (θ)=Sv.

(step S1903) control part 10 calculates the reference position θ s that examination is write by using following formula.

θs＝θv-Lb·N ...(11)

Wherein Lb is the length of write-in block, and N is the number of P (i) series.

(step S1904) control part 10 is carried out examination and is write, so that the order that the order and second in first round P (i) series is taken turns in P (i) series is axisymmetric about home position θ v.In other words, as shown in figure 22, Writing power is to arrange at second order of taking turns in P (i) series, and this order is the reversed sequence of the order in first round P (i) series.

It is identical with step among first embodiment to step S1108 that subsequent processes is step S1105.

[the tenth embodiment], [the 11 embodiment]

As the 3rd embodiment to the four embodiment, the example that is used for obtaining at step S1901 and step S1902 the method for home position θ v comprises: for example information is embedded into the method for CD 1, carries out the method that writes etc. with constant th writing power P.The method that is used for definite each embodiment optimum write power as the tenth embodiment and the 11 embodiment is showed at Figure 20 and Figure 21 respectively.

In the tenth embodiment, the relation between information in the CD 1 on the writing position (after this, this information is known as address information) and the θ v can be advanced database by compiling, is calculated from address information when carrying out OPC then.

The 11 embodiment has the advantage similar to the 4th embodiment, and its advantage is to obtain θ v from the writing of about four/one-period, and even is can obtain θ v under the situation of type that can not overwriting data at CD 1.Identical among the process of after obtaining home position θ v, carrying out and the 9th embodiment.

In the first to the 11 embodiment, notice that each writes the cycle that sensitivity fluctuation has sine wave pattern.What describe in above-mentioned each embodiment in other words, is as follows.When examination is write, write with identical Writing power execution with the second place in primary importance, this primary importance has the sensitivity higher than the average sensitivity of object optical disc 1, this second place have than average sensitivity lower write sensitivity, and its difference that writes between sensitivity and the average sensitivity with the difference of average sensitivity and this primary importance is identical.For reducing the influence that writes sensitivity fluctuation of CD 1, can from the average write diagnostics of the position that the execution examination is write, obtain Po.

At follow-up embodiment, promptly among the 12 to the 19 embodiment, notice that the inhomogeneous great majority that write in the sensitivity depend on the position in the dish, thereby examination is write and is not by using Writing power wherein to be performed with the Writing power series of arranging from the downward order of maximum.In these embodiments, but carry out examination and write by change order according to suitable method.

Especially, examination is write and is carried out with such Writing power series, rearranges Writing power so that the adjacent Writing power of intensity is not arranged in turn in this Writing power series.Like this, eliminated dependence, and alleviated the inhomogeneous influence that writes sensitivity position in the dish.

Figure 27 has showed the principle of the 12 to the 19 embodiment.Shown in Figure 27 is example of the present invention, and it is applied to the inhomogeneous situation that writes sensitivity that exists shown in Figure 26.Here, be rearranged with the order of the th writing power P (i) that the position is relevant in the dish, so that the adjacent Writing power of intensity is not arranged in turn.Write by carrying out examination with such Writing power series, write diagnostics E (i) becomes and still less depends on position in the dish.Especially, in the scheme of the correlation technique shown in Fig. 26, write diagnostics E (2), E (3) that all use in Po operation and E (4) are write sensitivity and influence by inhomogeneous.Yet, in example, have only E (2) to be write the sensitivity influence by inhomogeneous based on Figure 27 of the principle of the 12 to the 19 embodiment.Therefore, the correctness of the Po that so obtains significantly improves.

For easy to understand is explained, each in the employed so far example all has only local take place inhomogeneous and writes sensitivity.Yet, in the great majority of actual conditions, writes the inhomogeneous of sensitivity and be dispersed in extensively on the CD 1, and the expectation value of the Po that obtains by OPC is the value that on average writes sensitivity of reflection CD 1.The 12 to the 19 embodiment has the effect of the dispersion distribution write diagnostics that uses in the Po operation about position in the dish, and has Po that advantage is that thus obtained Po obtains than the method according to prior art more near mean value.

Below, embodiments of the invention will be described especially.

[the 12 embodiment]

Figure 28 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the 12nd embodiment of the present invention.This embodiment adopts and wherein uses random number to rearrange the scheme of the order of the th writing power P (i) in the Writing power series.

(step S2101) beginning, control part 10 rearranges the order of the th writing power P (i) in the Writing power series given in advance by using random number, be created in the new Writing power series that intensity Writing power adjacent one another are is not wherein arranged in turn, and new range be stored in the storer of control part 10.Here, described given Writing power series is the Writing power series of arranging with the intensity order therein.After using the rearranging of random number, under the situation that intensity two Writing powers adjacent one another are have been arranged by chance in turn, then in these two Writing powers is replaced by another Writing power, or carries out another time and rearrange to solve such problem.

(step S2102) control part 10 is carried out control, and is stored in Writing power series in the storer by use and causes that examination in the CD 1 is write and be performed.

(step S2103) next, control part 10 causes that write diagnostics measurement section 8 removes to measure the write diagnostics of carrying out the position that examination writes.

(step S2104) next, control part 10 causes that by using the write diagnostics of being measured by write diagnostics measurement section 8 the Po operation is performed.

(step S2105) is subjected to the inhomogeneous sensitivity influence that writes by the value of the Po that obtains according to above-mentioned process is less.

[the 13 embodiment]

In the 12 to the 19 embodiment, the order that is used to the Writing power that tries to write tends to less to rely on CD 1 inhomogeneously writes sensitivity.For this reason, in each OPC, can write by using the Writing power series that before is stored in the storer to carry out examination.When the information on the Writing power series was stored, the Writing power series that provides at first was rearranged by using random number, so that intensity Writing power adjacent one another are is not arranged in turn.The mode that this execution examination is write has the optimal alignment that advantage is to obtain Writing power.Especially, distributed on CD 1 with specific range each other equably with specific th writing power P (i) with the mutual position adjacent of the corresponding Writing power of another th writing power P (h).

Figure 29 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the 13rd embodiment of the present invention, uses the mode that above-mentioned execution examination is write on this method.

(step S2201) beginning, control part 10 is carried out control, and be performed by using information on the Writing power series that before is stored in the storer to cause that examination is write, this series has the Writing power that has been rearranged so that intensity Writing power adjacent one another are is not arranged in turn.Have only single Writing power series to be stored in the storer.Replacedly, having a plurality of Writing power series that different Writing power arranges can be stored in the storer, and in the series of being stored one can suitably be selected to write to carry out examination.Subsequent processes is identical with the step S2103 to S2105 of the 12 embodiment.

[the 14 embodiment]

What influence OPC inhomogeneously writes sensitivity and comprises that also the outward appearance that writes in the sensitivity is inhomogeneous, and it is by the distortion of CD 1 or connect that error is that cause to be produced with the mispairing of relative position optical lens or angle.When the track record on the CD 1 that scanning is being rotated, that observes the type inhomogeneously writes sensitivity as writing sensitivity fluctuation, this write sensitivity fluctuation have the CD 1 that equals rotating cycle cycle or have by dividing exactly the cycle of the resulting value of this swing circle.When carrying out the rearranging of Writing power, can take the Po operation of carrying out higher correctness into account by the cycle that this is write sensitivity fluctuation.

Figure 30 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the 14th embodiment of the present invention, uses the above-mentioned mode that rearranges on this method.Figure 31 has showed that this rearranges under the situation of mode the relation between the position in CD, th writing power P (i) and the write diagnostics E (i) in employing.

For the ease of explaining, suppose that here the number of the data in the Writing power series is set as 10 (N=10), and this writes sensitivity fluctuation and has the sine wave pattern that the cycle is θ t.Figure 31 has showed that in state, { P (5)+P (6) }/2 are chosen as Pm when the state of the write diagnostics that uses during as E (4), E (5), E (6) and E (7) in Po operation.

According to sinusoidal wave characteristic, in the sensitivity of ad-hoc location θ a with leaving θ a distance approximates whole CD 1 for the mean value of the sensitivity of the position θ b of θ t/2 * k (k is an odd number) average sensitivity.For this reason, be arranged in position θ a and θ b respectively by th writing power P that intensity is adjacent one another are (i) and th writing power P (i+1), thus obtained value Po becomes more near average sensitivity.

In the example of Figure 31, begin examination from position θ a and write A, begin next examination from position θ b and write B, this position θ b and position θ a are at a distance of θ t/2.Write among the A in examination, carry out examination with th writing power P (i) and write, wherein i is an even number, and writes among the B in examination, carries out examination with th writing power P (i+1) and writes, and wherein, the corresponding i that examination is write among the A adds 1, and promptly i is an odd number.Write by carrying out examination by this way, equaling θ t/2 all the time with the writing position of th writing power P (i) with the distance between the writing position of th writing power P (i+1).

Following is the process of method that is used for determining optimum write power of foundation the 14 embodiment that describes with reference to Figure 30, and this method has been utilized above-mentioned characteristic.

(step S2301) is because by servo 5 rotational speed that obtains CD 1, from the information of the inclination of optical axis etc., control part 10 is observed these information, calculates then and writes sensitivity cycle θ t.Here, can measure measured value θ t by several cycles are carried out.Alternately, as long as can obtain enough correctness, just can be from for the value of calculating θ t the observation measurement result of approximate four/one-period.

(step S2302) next, based on the reference position θ a that examination is write, control part 10 calculates next reference position θ b by using following formula.

θ b=θ a+ θ t/2 * k (k is an odd number) ... (12)

Here, the length that will be used to the track record that tries to write is taken into account, and the expectation value of k is 1, because more little value is efficient more.Yet, writing the situation that overlaps onto position θ b in the examination that begins from position θ a, value k can suitably be bigger value.

(step S2303) next, control part 10 is carried out control, and the examination that begins from the position θ a with th writing power P (i) is write be performed, wherein i is an even number.For the order of the Writing power in the Writing power series, use following formula.

i＝0，2，4，...，N-2 ...(13)

(step S2304) next, control part 10 is carried out control, and the examination that begins from the position θ a with th writing power P (i) is write be performed, wherein i is an odd number.For the order of the Writing power in the Writing power series, use following formula.

i＝1，3，5，...，N-1 ...(14)

Notice that step S2303 and step S2304 can be the continuous serieses of write operation.

Step S2103's to S2105 among subsequent processes and the 12 embodiment is identical.

[the 15 embodiment]

In the 14 embodiment, the th writing power P of using the examination that begins from position θ a or position θ b is write (i) is arranged with the intensity order.Yet, can be as among the 12 embodiment, rearranging order by the use random number.

Figure 32 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the 15th embodiment of the present invention, and the above-mentioned mode that rearranges is applied in this method.Figure 33 has showed and has adopted under this situation that rearranges mode the relation between the position in CD, th writing power P (i) and the write diagnostics E (i).

(step S2401) is because by servo 5 rotational speed that obtains CD 1, from the information of the inclination of optical axis etc., so control part 10 these information of observation, calculates then and writes sensitivity cycle θ t.Here, can measure measured value θ t by several cycles are carried out.Alternately, as long as can obtain enough correctness, just can be from for the value of calculating θ t the observation measurement result of approximate four/one-period.

The reference position θ a that (step S2402) writes based on examination, control part 10 calculates next reference position θ b by use formula (12).

Here, the length that will be used to the track record that tries to write is taken into account, and the expectation value of k is 1, because more little value is efficient more.Yet, writing the situation that overlaps onto position θ b in the examination that begins from position θ a, value k can suitably be bigger value.

(step S2403) control part 10 produces has different elements 0,1,2 ... with the array Mj of N/2-1, rearrange the order of element then.

Mj＝{0，1，2，...，N/2-1} ...(15)

(j＝0，1，2，...，N/2-1)

(step S2404) next, control part is carried out control, and the examination that begins from position θ a is write be performed.For the order of the th writing power P (i) in the Writing power series of using this moment, use following formula.

i＝Mj×2 (j＝0，1，2，...，N/2-1) ...(16)

(step S2405) next, control part 10 is carried out control, and causes and will write and will be performed from the examination that position θ b begins.For the order of the th writing power P (i) in the Writing power series of using this moment, use following formula.

i＝Mj×2+1 (j＝0，1，2，...，N/2-1) ...(17)

Step S2103's to S2105 among subsequent operation and the 12 embodiment is identical.

[the 16 embodiment]

Because even the information in cycle of guestimate all has certain effect, the cycle θ t that writes sensitivity is in advance from the shape and the property calculation of CD 1, and takes the order that obtains Writing power into account by the sensitivity that writes that will so be calculated.For example, as shown in figure 33, after rearranging Writing power, the order of Writing power is stored in the storer of control part 10, is not arranged in turn so that have the Writing power of intensity.Then, in each OPC, write by using this standby order to carry out examination.This method has advantage and be that the order of Writing power is continued to optimize as the 13 embodiment.

Figure 34 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the 16th embodiment of the present invention, the mode that adopts above-mentioned examination to write therein.

(step S2501) beginning, control part 10 reads the information in the cycle that writes sensitivity θ t of the CD 1 that presupposes from storer.

(step S2502) next, the reference position that control part 10 is write examination is located at θ a, calculates next position θ b by use formula (12) then.

(step S2503) next, control part 10 reads the order of the Writing power that the examination that begins from position θ a writes from storer, and causes that the examination that begins from position θ a writes A.Here, have only one group of single Writing power order to be stored in the storer.Alternately, the order of organizing Writing power can be stored in the storer more, and selects one group of suitable order from the order of these storages.

(step S2504) next, control part 10 reads the order of the Writing power that the examination that begins from position θ b writes from storer, and causes that the examination that begins from position θ b writes B.Equally in this case, the order of organizing Writing power can be stored in the storer more, and selects one group of suitable order from the order of these storages.

Step S2103's to S2105 among subsequent operation and the 12 embodiment is identical.

For convenience of explanation, step S2501, S2502, S2503 and S2504 are separated to describe.Yet in fact, these processes can be merged to form a series of continued operations that examination is write.

[the 17 embodiment]

In CD 1, write the sensitivity difference between the track (after this being called outer rail) of outer circumferential sides being positioned at the track of inner circumferential side (after this being called rail) and being positioned at.In this case, write, so that when the interior rail of CD 1 and the difference that writes sensitivity between the outer rail were taken into account, intensity Writing power adjacent one another are was not arranged in turn by using the Writing power series be rearranged to carry out effective examination.

Figure 35 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the 17th embodiment of the present invention, and the above-mentioned mode that rearranges is applied to this method.Figure 36 has showed the Writing power Series P (i) of the position of the inner circumferential side that is positioned at CD 1 and outer circumferential sides.Figure 36 has showed in this embodiment by using th writing power P (i) to try to write in the execution of the position of the inner circumferential side that is positioned at CD 1, wherein i is an even number, and by using th writing power P (i) to try to write in the execution of the position of the outer circumferential sides that is positioned at CD 1, wherein i is an odd number.

Following is with reference to the operation among this embodiment of the flow chart description of Figure 35.

(step S2601) beginning, control part 10 is carried out control, and writes by using th writing power P (i) to carry out examination in the position of the inner circumferential side that is positioned at CD 1, and wherein i is an even number.

(step S2602) next, control part 10 cause write diagnostics measurement section 8 measure be positioned at inner circumferential side and carry out the locational write diagnostics that examination is write.

(step S2603) next, control part 10 is write by using th writing power P (i) to carry out examination in the position of the outer circumferential sides that is positioned at CD 1, wherein i is an odd number.

(step S2604) next, control part 10 cause write diagnostics measurement section 8 measure be positioned at outer circumferential sides and carry out the locational write diagnostics that examination is write.

Step S2104's to S2105 among subsequent operation and the 12 embodiment is identical.

[the 18 embodiment]

By use as the 13 embodiment in random number can rearrange the order of the Writing power that each the examination of internal and external circumference side uses in writing.

Figure 37 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the 18th embodiment of the present invention, uses the above-mentioned mode that rearranges in this method.Figure 38 has showed the order of the th writing power P (i) of the inner circumferential side of CD 1 and outer circumferential sides.

(step S2701) beginning, control part 10 produces the array Mj by formula (15) definition, and it has different element 0,1,2 ... N/2-1.Control part 10 rearranges the order of element then.

(step S2702) next, control part 10 is carried out control, and causes in the inner circumferential side of CD 1 that examination is write and be performed.At this moment, formula (16) is applied to the order of Writing power.

(step S2703) next, control part 10 cause write diagnostics measurement section 8 measure be positioned at inner circumferential side and carry out the locational write diagnostics that examination is write.

(step S2704) next, control part 10 is carried out control, and causes in the outer circumferential sides of CD 1 that examination is write and be performed.At this moment, formula (17) is applied to the order of Writing power.

(step S2705) next, control part 10 cause write diagnostics measurement section 8 measure be positioned at outer circumferential sides and carry out the locational write diagnostics that examination is write.

Step S2104's to S2105 among subsequent operation and the 12 embodiment is identical.

[the 19 embodiment]

As in the 13 embodiment, being used for carrying out on the position of the inner circumferential side that is positioned at CD 1 and outer circumferential sides position the Writing power order that tries to write can be determined in advance, and is stored in then in the storer of control part 10.

Figure 39 is the process flow diagram of displaying according to the process of the method that is used for definite optimum write power of the 19th embodiment of the present invention, uses the mode of storage to be applied in this method.

(step S2801) beginning, control part 10 is write by using the Writing power series that is used for inner circumferential side that before is stored in the storer to cause to carry out examination on the position of the inner circumferential side of CD 1.The order of single one type Writing power is stored in the storer.Alternately, the order of eurypalynous Writing power can be stored in the storer, and selects a suitable order from the order of these storages.

(step S2802) next, control part 10 cause write diagnostics measurement section 8 measure be positioned at inner circumferential side and carry out the locational write diagnostics that examination is write.

(step S2803) next, control part 10 causes that according to the order that before had been stored in the Writing power in the storer carrying out examination on the position of the outer circumferential sides of CD 1 writes.Have only the order of single Writing power to be stored in the storer.Alternately, the order of eurypalynous Writing power can be stored in the storer, and can select a suitable order from the order of these storages.

(step S2804) next, control part 10 cause write diagnostics measurement section 8 measure be positioned at outer circumferential sides and carry out the locational write diagnostics that examination is write.

Step S2104, S2105's among subsequent operation and the 12 embodiment is identical.

Explained so far be with by using Writing power series to carry out some relevant embodiment of method of the calculating Po that examination writes, this Writing power series has been rearranged so that intensity Writing power adjacent one another are is not arranged in turn.The present invention who comprises the notion of the 12 to the 19 embodiment is not limited to that these embodiment show.Other method also can be used, and still less depends on relative position in CD 1 as long as the intensity of Writing power becomes.

According to previously described the 12 to the 19 embodiment, the inhomogeneous influence that writes sensitivity can easily be reduced among the OPC.Use more accurate OPC, even hold in the surplus CD 1 only having very little performance for the Writing power error, the also write performance that can obtain to expect.

In the prior art, the example that is used to alleviate the measure that the inhomogeneous influence that writes sensitivity takes is included in the pre-service of examination before writing, repeats repeatedly OPC and the physical length write of the examination of elongation.Yet in the 12 to the 19 embodiment, test writing method itself has the effect that reduces to write inhomogeneous sensitivity.Therefore, do not have pre-service or do not have OPC to repeat be necessary, this will cause being used to carry out the shorter time of OPC.The physical length that is used to try to write can be done shortlyer, so that the posting field of CD 1 is not wasted.

In addition, the 12 to the 19 embodiment can easily use with method of the prior art together, so that further alleviate the inhomogeneous effect of sensitivity that writes in expectation.

That describes in the 12 to the 19 embodiment is as follows.Notice that the inhomogeneous great majority that write sensitivity depend on the position in the dish, thereby examination is write and is not by using Writing power wherein to be performed with the Writing power series of arranging from the downward order of maximum.In these embodiments, but carry out examination and write by change order according to suitable method.Especially, examination is write and is carried out with such Writing power series, in this Writing power series, rearranges Writing power so that the adjacent Writing power of intensity is not arranged in turn.Like this, eliminated dependence, and alleviated the inhomogeneous influence that writes sensitivity position in the CD.

Below, other embodiments of the invention (the 20 to the 23 embodiment) also will be described.

In the 20 to the 23 embodiment, carry out examination and write by arranging specific power P t discretely, this certain power Pt is used for monitoring the sensitivity fluctuation that writes among the Writing power series be used to test P (i).Then, calculate the sensitivity fluctuation that writes of CD 1 from the write diagnostics of the position that the execution examination is write.In addition, in the 20 to the 23 embodiment, the quantity by will fluctuation converts the varied number of the variable that is used to calculate optimum write power to and does correction, and the varied number of this variable for example is the varied number in Writing power or the write diagnostics.Then, by using the result who proofreaies and correct to calculate Po.Like this, more accurate OPC becomes possibility.

After this, with the description that provides according to the method that is used for definite optimum write power of the 20 to the 23 embodiment.

[the 20 embodiment]

Figure 42 is the synoptic diagram of test writing method of method that is used for determining optimum write power that is illustrated in according to the 20th embodiment of the present invention.Here, each circular camber line arrow is represented track record, carries out examination along this track with specific Writing power and writes.The circular series representative of arrow how to carry out examination by the reformed Writing power of OPC is write.Number from 0 to 9, each is placed in the inboard of each arrow, represents the position j on the CD.Each is carried out the Writing power that tries to write along track record and is indicated by the arrow of correspondence, and this Writing power is by Pt and P (i) representative.When Pt representative was used to monitor the firm power that writes sensitivity fluctuation, P (i) representative was used to the Writing power series trying to write.

For the ease of explaining, in this embodiment, the number N that is used to the Writing power that tries to write in Writing power Series P (i) is set as 6, but the present invention is not limited thereto.In addition, in the present embodiment, to be used for monitoring that the power P t that writes sensitivity fluctuation carries out examination in CD even number position at interval and writes, especially in the position 0,3,6 and 9.As long as such position is arranged by discrete, just can not be spaced the position at even number.

Figure 43 is a process flow diagram of showing the method that is used for definite optimum write power, adopts the method for the value of proofreading and correct Writing power in this case, and this method is used as the method for proofreading and correct the influence that writes sensitivity fluctuation.Figure 44 has showed that schematically this embodiment's is used for determining relation between the method variable of optimum write power.In Fig. 44, the write diagnostics that E (i) representative is measured in the corresponding position of writing with Writing power Series P (i) execution examination.Et (j) representative is to be used for monitoring that the power P t that writes sensitivity fluctuation carries out the write diagnostics of corresponding j place, the position measurement of CD that examination writes.Correction coefficient A (j) is used to position j correction corresponding in CD and writes sensitivity.Pc (i) represents Writing power series, and this Writing power series converts Writing power to and is corrected by writing the quantity that fluctuates in the sensitivity.

Be the specific process of method that is used for determining the optimum write power of this embodiment below.

(step S3101) beginning shown in Fig. 42, is carried out examination with Writing power Series P (i) and is write in CD 1, wherein process is arranged by discrete to be used to monitor the position that the power P t that writes sensitivity fluctuation tries to write.

(step S3102) carrying out position measurement write diagnostics E (i) and the Et (j) that examination is write.

(step S3103) is corresponding to be used to monitor that the mean value Etav that the power P t that writes sensitivity fluctuation carries out the write diagnostics (Et (0), Et (3), Et (6) and Et (9)) of the position that examination writes is calculated according to following formula.

Etav＝{Et(0)+Et(3)+Et(6)+Et(9)}/4 ...(18)

(step S3104) as shown in figure 45, calculating ratio Δ E/ Δ P, i.e. variation of write diagnostics and the ratio of variation that is used to monitor near the Writing power the power P t that writes sensitivity fluctuation.Based on being used to monitor the power P t that writes sensitivity fluctuation and corresponding write diagnostics Et (j), and be used near examination is write power P t power P (i) and the write diagnostics E (i) of correspondence carries out this calculating.

Difference between (step S3105) write diagnostics Et (j) and the mean value Etav has reflected the quantity that writes change of sensitivity.In this embodiment, the quantity that writes change of sensitivity is converted into the quantity of carrying out the variation in the Writing power of proofreading and correct.For this purpose, calculate conversion coefficient (correction coefficient) Aj for each to be used for monitoring the position (0,3,6 and 9) that the power P t that writes sensitivity fluctuation carries out the CD that examination writes.Carry out calculating by using following formula.

A(j)＝{(Et(j)-Etav)·ΔP/ΔE}/Pt ...(19)

(step S3106) based on Writing power conversion coefficient (correction coefficient) A (j) that obtains at step S3105, handles by interpolation for conversion coefficient (correction coefficient) A (j) of other position in the CD and to calculate as shown in figure 46.

Method as interpolation is handled can adopt simple linear interpolation method, but the present invention is not limited to this method.

The varied number that (step S3107) writes sensitivity is converted into the variation of the Writing power of equivalent, uses the varied number of this Writing power to do correction then.In other words, corrected th writing power P c (i) series is calculated according to following formula.

Pc(i)＝{1+A(j)}·P(i) ...(20)

(step S3108) use write diagnostics E (i) and the Writing power Series P c (i) that is corrected for the variation that writes sensitivity carry out the Po operation.Proposed different Po method of operating, and the present invention is not limited to above-mentioned method.

Fig. 47 has showed the influence that reduces to write sensitivity fluctuation by the Writing power Series P (i) that will be used to try to write with corrected power series Pc (i) replacement.The write diagnostics that the dotted line representative obtains by uncorrected th writing power P (i), and the write diagnostics of solid line representative by obtaining with the corrected Writing power Series P of the variation c (i) that writes sensitivity.By using Pc (i) to replace P (i), be corrected into the value of the correspondence of indicating by the measured value of black circle indication by white circle.In other words, suppressed the influence that writes sensitivity fluctuation of CD 1.

The Po that (step S3109) proofreaies and correct for the variation that writes sensitivity by above-described process acquisition.

[the 21 embodiment]

Next, the 21st embodiment of the present invention will be described.

In the 20 embodiment, for correction has been done in the influence that writes sensitivity fluctuation.For the correction of the variation that writes sensitivity is to convert the quantity that changes in the Writing power to by the variation that will write sensitivity to carry out.Yet, write the variation that the influence of sensitivity fluctuation can convert in the write diagnostics by the variation that will write in the sensitivity and proofread and correct.For example, when write diagnostics was approximately linearity in the scope of the Writing power that the execution examination is write, it was simpler than using the quantity that changes in the Writing power to carry out treatment for correcting by the variation in the use write diagnostics.

Figure 48 has showed the example by using write diagnostics to proofread and correct.Here, solid line indication does not have write diagnostics under the uneven situation writing sensitivity.E (m) representative position j in CD carries out the write diagnostics under the situation about writing with power P (m).Here, be in the inhomogeneous sensitivity influence E (m) down that writes not on solid line, this solid line is represented the write diagnostics that does not have under the uneven situation.At this moment, as Figure 48 clearly shown in, do not having the inhomogeneous write diagnostics Ec (m) that writes under the sensitivity situation to be expressed from the next.

Ec(m)＝E(m)-A(j)·P(m)·ΔE/ΔP ...(21)

By with formula (19) substitution formula (21), obtain following formula.

Ec(m)＝E(m)+{Etav-Et(j)}P(m)/Pt ...(22)

From following formula as seen, Et on duty (j)---position j carries out the write diagnostics under the situation about writing to be used to monitor the power P t that writes sensitivity fluctuation in CD---is when being obtained, and can calculate Δ E/ Δ P and obtains Ec (m).In addition, as P (m)/when Pt can be approximated to be 1, can use following formula.

Ec(m)≈E(m)+{Etav-Et(j)} ...(23)

Because the use of following formula has been eliminated and taken advantage of and remove, then the advantage that has of this use is will significantly to be reduced by the quantity of software operation.

Figure 49 is a process flow diagram of showing the process of the method be used for determining optimum write power, in this case, by utilizing above-described characteristic, adopts the method for wherein the proofreading and correct write diagnostics method as the correction that is used to write the sensitivity fluctuation influence.

(step S3101) beginning shown in Fig. 42, is carried out examination with the Writing power Series P (i) that is used for writing in CD 1 pilot scale and is write, and is used to wherein monitor that the power P t that writes sensitivity fluctuation is arranged dispersedly.

(step S3102) is to carrying out position measurement write diagnostics E (j), the Et (j) that examination is write.

(step S3103) calculates corresponding to be used to monitor that the power P t that writes sensitivity fluctuation carries out the mean value Etav of the write diagnostics (Et (0), Et (3), Et (6) and Et (9)) of the position that examination writes according to formula (18).Above-mentioned process is identical to the process of S3103 with the step S3101 of the 20 embodiment.

(step S3201) wherein writes to be used to monitor that the power P t that writes sensitivity fluctuation carries out based on the write diagnostics Et (j) of position j in the CD (0,3,6 and 9), and the write diagnostics Et (j) of other position handles by interpolation and calculates in the CD.

(step S3202) will be as being that write diagnostics Ec (i) is calculated according to formula (22) or formula (23) by writing the write diagnostics that quantity that variation in the sensitivity converts the variation in the write diagnostics to is corrected.

(step S3203) use Writing power Series P (i) and the write diagnostics Ec (i) that proofreaies and correct for the variation that writes sensitivity carry out the Po operation.

(step S3204) is by obtaining to writing the value Po that sensitivity fluctuation is corrected according to above-mentioned process.

[the 22 embodiment]

Any value that is used for the Writing power Series P (i) trying to write can be used as and be used to monitor the power P t that writes sensitivity fluctuation.Like this, by to be used to monitor that the power P t that writes sensitivity fluctuation writes the write diagnostics that obtains and also can be used for Po operation effectively.In addition, the zone is write in the examination that reduced on the CD 1 of such use.

Figure 50 is the synoptic diagram that the method that is used for determining optimum write power of showing this embodiment is carried out the mode that examination writes.Figure 51 has showed that schematically this embodiment's is used for determining relation between the method variable of optimum write power.

In this embodiment, the th writing power P (3) that is used for the Writing power Series P (i) trying to write is used as and is used to monitor the power P t that writes sensitivity fluctuation.As shown in figure 50, be used for the zone of trying to write until the position 8 of CD, this means that the zone that is used to try to write is compared with the 21 embodiment with the 20 embodiment to be reduced.On the other hand, in Figure 51, there is not write diagnostics E (3).Here, E (3) can be defined as any one among write diagnostics Et (0), Et (3), Et (5) and the Et (8), corresponding to carrying out the position that writes with th writing power P (3) in the CD.Alternately, write diagnostics E (3) can be defined as by carry out the mean value that writes all write diagnostics that obtain with th writing power P (3).

[the 23 embodiment]

Figure 52 is that the mode that is illustrated in definition power P t is applied to the process flow diagram that process is write in examination under the situation of the 20 embodiment.At step S3301, be used for monitoring that the power P t that writes sensitivity fluctuation selects from the Writing power Series P (i) that is used to try to write.Then, be used for the Writing power Series P (i) trying to write by use and carry out the examination of CD 1 and write, and be used to monitor that the selected power P t that writes sensitivity fluctuation is arranged by discrete.Identical among the later process of step S3302 and the 20 embodiment.

Figure 53 is that the mode that is illustrated in definition power P t is applied under the situation of the 21 embodiment, and the process flow diagram of process is write in examination.At step S3401, be used for monitoring that the power P t that writes sensitivity fluctuation selects from the Writing power Series P (i) that is used to try to write.Then, be used for the Writing power Series P (i) trying to write by use and carry out the examination of CD 1 and write, and be used to monitor that the power P t that chooses that writes sensitivity fluctuation is arranged by discrete.Identical among the later process of step S3402 and the 21 embodiment.

Described above proofread and correct the example of the influence that writes sensitivity fluctuation, but the present invention is not limited thereto by th writing power P (i) or by write diagnostics E (i).

Should be noted that the present invention is not limited to the above embodiments, and can make various variations within the scope of the invention.

It will be appreciated by those skilled in the art that in the protection domain of claims or analog, can make various variations, combination, sub-portfolio according to the needs of design and other factors and substitute.

The cross reference of related application

The application comprises the JP2006-117366 of the Japanese patent application JP2006-152477 that applies in Jap.P. office with on May 31st, 2006, application on April 21st, 2006 and the relevant theme of JP2006-108971 of application on April 11st, 2006, and its full content is incorporated into as a reference at this.

Claims (13)

1. one kind is used at optical disc recording apparatus CD being determined to comprise the method for optimum write power:

Write CD in primary importance with in second place examination as recording medium, writing of this primary importance highly sensitively on average writes sensitivity in this CD, the sensitivity that writes of this second place is lower than and on average writes sensitivity, the quantity that writes sensitivity and the difference that on average writes sensitivity of this second place and this primary importance to write sensitivity identical with the quantity of the difference that on average writes sensitivity, use same Writing power in the primary importance and the second place; And

From the mean value of write diagnostics of examination writing position, obtain the optimum write power of this CD.

2. as claimed in claim 1 being used for determined the method for optimum write power at optical disc recording apparatus to CD,

Wherein, based on determining the primary importance and the second place cycle of fluctuation that writes sensitivity of CD.

3. as claimed in claim 2 being used for determined the method for optimum write power at optical disc recording apparatus to CD,

Wherein, obtain the cycle of fluctuation that writes sensitivity of CD based on the fluctuation of write diagnostics, this write diagnostics obtains by writing this CD with constant Writing power examination.

4. as claimed in claim 2 being used for determined the method for optimum write power at optical disc recording apparatus to CD,

Wherein, based on the cycle of fluctuation that writes sensitivity of servo error information acquisition CD.

5. as claimed in claim 2 being used for determined the method for optimum write power at optical disc recording apparatus to CD,

Wherein, the information of the cycle of fluctuation that writes sensitivity of the information acquisition CD by reproducing the cycle of fluctuation that writes sensitivity that before is written into CD.

6. as claimed in claim 2 being used for determined the method for optimum write power at optical disc recording apparatus to CD,

Wherein, write power series and second in first round examination and take turns examination and write between the power series gap is provided, make and write power when serial when the examination of reusing regular length, primary importance is write with identical Writing power with the second place.

7. as claimed in claim 2 being used for determined the method for optimum write power at optical disc recording apparatus to CD,

Wherein, the length that power series is write in examination is adjusted, so that when power series was write in the examination of reusing this length, primary importance was write with identical Writing power with the second place.

8. as claimed in claim 1 being used for determined the method for optimum write power at optical disc recording apparatus to CD,

Wherein, determine the primary importance and the second place,, become mean value the cycle of fluctuation that writes sensitivity at this home position based on home position.

9. as claimed in claim 8 being used for determined the method for optimum write power at optical disc recording apparatus to CD,

Wherein, obtain this home position based on the fluctuation of write diagnostics, this write diagnostics obtains by writing this CD with constant Writing power examination.

10. as claimed in claim 8 being used for determined the method for optimum write power at optical disc recording apparatus to CD,

Wherein, based on the home position that writes sensitivity of this CD of servo error information acquisition.

11. as claimed in claim 8 being used for determined the method for optimum write power at optical disc recording apparatus to CD,

Wherein, obtain the information of home position by the information of reproducing the home position that before is written into CD.

12. as claimed in claim 8 being used for determined the method for optimum write power at optical disc recording apparatus to CD,

Wherein, use and to write second of power series reversed in order order with first round examination and take turns examination and write power series, make and write power when serial when the examination of reusing regular length, primary importance is write with identical Writing power with the second place.

13. an optical disc recording apparatus comprises:

Light picker, it can change Writing power;

The write diagnostics measurement section, it measures write diagnostics from the information that is obtained by light picker;

Control part, its control is write as the examination of the CD of recording medium, make the primary importance and the second place write and from the mean value of the write diagnostics of this first and second position measurement, obtain the optimum write power of this light picker by the write diagnostics measurement section so that same Writing power is tested, wherein writing of this primary importance highly sensitively on average writes sensitivity in this CD, the sensitivity that writes of this second place is lower than and on average writes sensitivity, and the quantity that writes sensitivity and the difference that on average writes sensitivity of this second place and this primary importance to write sensitivity identical with the quantity of the difference that on average writes sensitivity.

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