CN101063706A - Multichannel precision secondary batteries testing system - Google Patents
Multichannel precision secondary batteries testing system Download PDFInfo
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- CN101063706A CN101063706A CN 200710035047 CN200710035047A CN101063706A CN 101063706 A CN101063706 A CN 101063706A CN 200710035047 CN200710035047 CN 200710035047 CN 200710035047 A CN200710035047 A CN 200710035047A CN 101063706 A CN101063706 A CN 101063706A
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Abstract
This invention discloses one multi-channel fine secondary battery test system, which comprises watchdog circuit connected to single machine circuit and single control circuit formed by series communication circuit, DAC control circuit, charge switch circuit, voltage and current test circuit and over voltage protection circuit, wherein the single machine control circuit sends control order to send DAC control circuit to charge switch circuit and the voltage and current measurement circuit amplifies the secondary battery and current signals; through voltage and current collection circuit reading secondary battery voltage and current signals outputting single machine control circuit to upper machine for data process and to draw property curve.
Description
Technical field
The present invention relates to a kind of battery test circuit, particularly be applicable to the test macro of secondary cells such as lithium ion, ni-mh, NI-G.
Background technology
When the charge-discharge characteristic of test secondary cell, voltage and current signal in the time of must measuring charging/discharging of secondary cell, because secondary cell is when discharging and recharging, the pace of change of its voltage and current signal is relatively slow, therefore these two signals are monitored and need accurate, high-precision adc (ADC), but, in current secondary cell tester, normally adopt the ADC below 16.As the disclosed a kind of digital accumulator detector of Chinese patent CN200520060665.8, comprise accumulator, power circuit, shell, clip, it is characterized in that: also have micro-processor interface circuit, pulse generating circuit, the AC sampling amplifying circuit, the A/D change-over circuit, display circuit, operation keyboard, the micro-processor interface circuit control pulse generation circuit produces the stream signal, deliver on the accumulator, the AC sampling amplifying circuit amplifies AC signal sampling faint on the accumulator, read ac voltage on the accumulator by the A/D change-over circuit, micro-processor interface circuit is sent in the output of A/D change-over circuit back to, and display circuit is delivered in the output of micro-processor interface circuit.This digital accumulator detector is when current signal will be converted to voltage signal, and its enlargement factor is a determined value, and then measuring error is just quite big.It is bigger that existing other detector also exists temperature to float coefficient, and longer in the working time, when temperature variation was big, the precision and the accuracy of test were lower, and error is bigger.
Summary of the invention
The objective of the invention is to overcome the weak point of above-mentioned cell tester, a kind of degree of accuracy and accuracy that can improve measurement greatly is provided, reduce hyperchannel, high precision, the intelligentized secondary batteries testing system that temperature is floated coefficient greatly.
Technical scheme of the present invention is: comprise the single chip machine controlling circuit that is made of watchdog circuit that is connected with single chip circuit and serial communication circuit, the DAC control circuit, discharge and recharge commutation circuit, voltage and current metering circuit and over-voltage over-current protection circuit, it is characterized in that, described DAC control circuit comprises D/A change-over circuit, reference voltage power circuit, logic with shift control circuit and the sampling hold circuit that has several test channel, and each sampling hold circuit is connected with charge-discharge circuit respectively; Described voltage and current Acquisition Circuit comprises A/D change-over circuit and two buffer circuits that are connected with the A/D change-over circuit respectively, and the single chip circuit in the described single chip machine controlling circuit is connected with the A/D change-over circuit with the D/A change-over circuit respectively; The described commutation circuit that discharges and recharges is connected with voltage, current measurement circuit and over-voltage over-current protection circuit; described commutation circuit, voltage, current measurement circuit and the over-voltage over-current protection circuit of discharging and recharging all links to each other with mesuring battary; described voltage, current measurement circuit are connected with the A/D change-over circuit, and described reference voltage source circuit is connected with the A/D change-over circuit with the D/A change-over circuit.
Described D/A change-over circuit comprises D/A conversion chip U6 and operational amplifier U8, and D/A conversion chip U6 selects 16 bit pads for use; DIN, the SCLK of D/A conversion chip U6 is connected with P14 with P11, the P16 of singlechip chip U1 respectively with the CS pin, and 1 pin of D/A conversion chip U6 is connected with 3 pin of operational amplifier U8.
Described A/D change-over circuit comprises A/D conversion chip U61, A/D conversion chip U61 selects 24 delta sigma ADC LTC2498 type converters for use, the CHO of A/D conversion chip U61 meets the output terminal CH1CM of the operational amplifier U46 in the voltage and current metering circuit, and CH1 meets the output terminal CH1VM of operational amplifier U45; 1,2,3,4,5,6,7,30,31,32, the 32 pin ground connection of A/D conversion chip U61, the P10 of the SDO pin order sheet machine chip U1 of A/D conversion chip U61, power supply VCC+5V inserts the SDO pin by resistance R 61, connect 20pF electric capacity between SDO pin and the Fo pin, Fo pin ground connection, P16, P17, the P11 pin of SCLK, the CS of A/D conversion chip U61, SDI pin order sheet machine chip U1.
Described reference voltage source circuit comprises reference voltage power supply chip U7, reference voltage source chip U7 selects low temperature drift, low noise reference voltage source MAX6033 type for use, the input end IN of reference voltage source chip U7 is connected with power supply VCC5, and by 104 capacity earths, 5,6 pins are connected, 2 pin ground connection are inserted decoupling capacitor 0.1uF and 10uF between 5,6 pins and simulation ground.
Described voltage and current metering circuit comprises operational amplifier U45 and operational amplifier U46, operational amplifier U45 and operational amplifier U46 select low drifting operating amplifier LTC1012 type for use, operational amplifier U45 is linked into the mesuring battary two ends by resistance R 110 and resistance R 112,3 pin of operational amplifier U46 are received sampling resistor R103 by resistance R 132, sampling resistor R103 ground connection.
Single chip machine controlling circuit of the present invention, over-voltage over-current protection circuit, logic with shift control circuit are all identical with prior art.
During work by the single chip machine controlling circuit transmitting control commands, be sent to by the DAC control circuit and discharge and recharge commutation circuit, the control secondary cell is at constant-current discharge, constant-current charge, constant-voltage charge or leave standstill four kinds of duties, the voltage and current measurement circuit amplifies the voltage and current signal on the secondary cell, read voltage and current signal on the secondary cell by the voltage and current Acquisition Circuit, single chip machine controlling circuit is sent in the output of voltage and current Acquisition Circuit back to, host computer is delivered in the output of single chip machine controlling circuit, is carried out data processing and is drawn the charge-discharge characteristic curve by host computer.
The present invention has the following advantages: can improve the degree of accuracy and the accuracy of measurement greatly, reduce temperature greatly and float coefficient, even longer in the working time, when temperature variation is big, also can guarantee precision and the accuracy tested to have reduced measuring error greatly.
Description of drawings
Fig. 1 is a block diagram of the present invention;
Fig. 2 is DAC control circuit figure;
Fig. 3 is voltage and current Acquisition Circuit figure;
Fig. 4 is charge-discharge circuit, voltage and current metering circuit figure;
Fig. 5 is a single-chip microcomputer workflow diagram of the present invention.
Embodiment
The invention will be further described below in conjunction with drawings and Examples.
With reference to accompanying drawing 1:
Present embodiment comprises single chip machine controlling circuit, DAC control circuit, charge-discharge circuit, voltage, current measurement circuit and over-voltage over-current protection circuit and voltage, current acquisition circuit.Wherein single chip machine controlling circuit comprises watchdog circuit 1-1 and the serial communication circuit 1-3 that is connected with single chip circuit 1-2.The DAC control circuit comprises in turn the D/A change-over circuit 2-1 that connects, reference voltage source circuit 2-2, the sampling hold circuit of logic with shift control circuit 2-3 and 8 test channel (2-4-1,------2-4-8).Wherein the D/A converter in the D/A change-over circuit is selected 16 MAX541 for use; Reference voltage source is selected superhigh precision, series-type voltage benchmark MAX6033 for use, and it has 7ppm/ ℃ low temperature and floats coefficient and low pressure reduction (200mV, maximal value) characteristic.Described charge-discharge circuit 3-1, voltage and current metering circuit and over-voltage over-current protection circuit 5-1 all link to each other with mesuring battary, and described voltage and current metering circuit and over-voltage over-current protection circuit 5-1 feed back to charge-discharge circuit 3-1, form closed-loop control system; Described voltage and current Acquisition Circuit comprises A/D change-over circuit 6-1 and two buffer circuit 6-2 and 6-3, and the circuit structure of two buffer circuits is identical, and all is connected with A/D change-over circuit 6-1.A/D converter in the A/D change-over circuit is selected 16 passage delta sigma ADC (24) LTC2498 for use.Single chip circuit 1-2 is connected with A/D change-over circuit 6-1 with D/A change-over circuit 2-1 respectively; Sampling hold circuit 2-4-1,------2-4-8 is connected with charge-discharge circuit 3-1,3-2----3-8 respectively; Each voltage and current metering circuit all is connected with A/D change-over circuit 6-1.
Present embodiment single chip circuit 1-2 is identical with prior art, and the instrument numbering of battery test system and the calibration factor storage of 8 test channel are placed in the watchdog circuit.The test parameter that single chip machine controlling circuit mainly is responsible for transmitting from host computer worker's test parameters such as (comprise constant-current discharge, constant-current charge, constant-voltage charge) leaving standstill, data processing also send test instruction.When working on power, each channel status of initialization serial ports and initialization, and monitor serial ports no datat is arranged if data are arranged then handle serial data, otherwise is controlled the duty of each passage.
With reference to accompanying drawing 2:
Present embodiment D/A change-over circuit 2-1 comprises D/A conversion chip U6 and impact damper U8, D/A conversion chip U6 adopts the MAX541 type, D/A conversion chip U6 is low-power consumption, serial input, voltage output, serial 16 figure place weighted-voltage D/A converters with list+5V power work, DIN, the SCLK of D/A conversion chip U6 is connected with P14 with P11, the P16 of singlechip chip U1 respectively with the CS pin, 1 pin of D/A conversion chip U6 is connected with 3 pin of impact damper U8, and operational amplifier U8 is used to increase the driving force of D/A.
Present embodiment reference voltage source circuit 2-2 comprises reference voltage source chip U7, and reference voltage source chip U7 adopts accurate reference voltage MAX6033 type, and reference voltage source chip U7 is used to produce high-precision+2.5V voltage source.The input end IN of reference voltage source chip U7 is connected with power supply VCC5, and by 104 capacity earths, 5,6 pins are connected, and 2 pin ground connection in order to eliminate high frequency or low-frequency disturbance, are inserted decoupling capacitor 0.1uF and 10uF between 5,6 pins and simulation ground.During work, reference voltage source chip U7 provides high-precision+2.5V voltage for D/A conversion chip U6; The CS of D/A conversion chip U6 is a sheet choosing end, is used to start the D/A conversion, and SCLK is a serial clock, is used to control the serial input that D/A changes chip U6, and DIN is the serial data input, is used to import the input controlling value of D/A conversion chip U6.
With reference to accompanying drawing 3:
Present embodiment A/D change-over circuit 6-1 comprises A/D conversion chip U61, and A/D conversion chip U61 adopts the LTC2498 type.LTC2498 is 24 delta sigma ADC, can measure 16 single ended channels, 8 differential paths or both combinations.Present embodiment provides the battery test system of 8 test channel, each passage all needs to measure cell voltage and charging and discharging currents, so 16 single ended channels that use A/D conversion chip U61 do not need external multi-way switch as measuring 16 signal input channels.The CHO of A/D conversion chip U61 meets the output terminal CH1CM of the operational amplifier U46 in the voltage and current metering circuit, and CH1 meets the output terminal CH1VM of operational amplifier U45, and other passages are identical with the syndeton of A/D conversion chip U61.1,2,3,4,5,6,7,30,31,32, the 32 pin ground connection of A/D conversion chip U61, the P10 pin of singlechip chip U1 connects the SDO pin of A/D conversion chip U61, power supply VCC+5V inserts the SDO pin by resistance R 61, connect 20pF electric capacity between SDO pin and the Fo pin, Fo pin ground connection, the P16 of singlechip chip U1, P17, P11 pin connect SCLK, CS, the SDI pin of A/D conversion chip U61 respectively;
The MUXOUTN pin of A/D conversion chip U61 inserts ADCINN by buffer circuit U62, and MUXOUTP inserts ADCINP by buffer circuit U63, REF+ connect reference voltage source chip U7+the 2.5V output terminal.The SCLK of A/D conversion chip U61 is a system clock, is used to control sampling rate and the internal work sequential of A/D conversion chip U61, and sampling rate can be up to 7.5Hz or 15Hz.SCLK is a serial clock, is used to control the serial output of A/D conversion chip U61.Singlechip chip U1 can realize data read to A/D conversion chip U61 by control SCLK.
With reference to accompanying drawing 4:
In the present embodiment voltage and current metering circuit discharge and recharge control mode and circuit is identical with prior art, different is, and operational amplifier U44, operational amplifier U45 and operational amplifier U46 adopt the LTC1012 type.Operational amplifier U45 is linked into the mesuring battary two ends by resistance R 110 and resistance R 112, is used to measure the battery both end voltage.3 pin of operational amplifier U46 are received sampling resistor R103 by resistance R 132, and sampling resistor R103 ground connection is used to measure the electric current of battery charging and discharging.
Over-voltage over-current protection circuit of the present invention is identical with prior art.
Present embodiment logic with shift control circuit is identical with prior art.During work, can write control word to displacement memory bus register by singlechip chip U1, opening or closing of control channel relay indicating light realizes that the control sampling keeps the sampling or the hold mode of chip; And to voltage or current measurement value FEEDBACK CONTROL, and charging and discharging state switched control.
Present embodiment is because the A/D converter in the A/D change-over circuit uses 24 delta sigma ADC accurately, can produce best effect, be very suitable for measuring the fine variation in using such as battery charge, the present invention is provided with a plurality of battery testing passages, 16 single ended channels can selecting LTC2498 are as signal input channel, LTC2498 comprises a pin-point accuracy, the internal temperature sensor of 1/30 ℃ of resolution of tool and 2 ℃ of absolute accuracies makes the compensation of cold junction point simple and accurate, reading by temperature sensor, can write down thermograde, to guarantee the unlikely generation superheating phenomenon of tester.Adopted 16 D/A converters in the DAC change-over circuit, had only the low drift error of low supply current and the 1LSB of 0.3mA, output area is 0V to V
REF, can guarantee the high resolving power and the high precision of the constant voltage output valve of the constant current output valve of constant current charge-discharge and constant-voltage charge; For making LTC2498 and MAX541 obtain high resolving power and high precision, the present invention also provides high-precision+2.5V reference voltage source has only 7ppm/ ℃ low temperature to float coefficient and low pressure reduction.
With reference to accompanying drawing 5:
Present embodiment single-chip microcomputer workflow is as follows:
(1) powers on after 1, carry out initialization 2 to A/D, serial communication etc., for test is prepared.
(2) monitor whether interruption 3 is arranged,, then enter interrupt service routine 9 if having; If no, then enter master routine.
When (3) entering master routine, an array DAdata[8 that 8 elements are arranged is set], the D/A input value that is used to preserve 8 passages is provided with parameters C Hn=0.
(4) start the D/A conversion, refresh the D/A output valve of channel C Hn, the value of parameters C Hn is 0 ~ 7, represents 1 ~ 8 passage.
(5) whether parameters C Hn detects CHn greater than 7 from increasing 1, if do not have, (4) step is carried out in circulation, carries out (3), (4) step if CHn greater than 7, then circulates.
(6) if there is serial ports to interrupt, what detect the serial ports reception is data acquisition command 11, or control command 19; If data acquisition command 11 then enters data acquisition program; If control command 19, then refresh the duty of respective channel.
(7) if data acquisition command 11, it is 0 that parameters C Hi is set, and selects sampling channel CHi, and the value of parameters C hi is 0 ~ 15, represents CH0 ~ CH15 of A/D conversion chip U61.
(8) whether CHi detects CHi greater than 15 from increasing 1, if do not have, then (7) step is carried out in circulation; If greater than 15, then send 16 sampled datas to host computer, and return master routine (3).
(9) if control command 19, refresh the duty of respective channel CHn, the feedback states of channel C Hn then is set, write the control word of displacement memory bus register U55; The input value of D/A is set, changes array DAdata[CHn] value; The charging and discharging state of channel C Hn is set, writes the control word of displacement memory bus register U53; After end is set, return master routine.
Claims (5)
1. multichannel precision secondary batteries testing system, it is characterized in that comprising the single chip machine controlling circuit that constitutes by watchdog circuit that is connected with single chip circuit and serial communication circuit, the DAC control circuit, discharge and recharge commutation circuit, voltage and current metering circuit and over-voltage over-current protection circuit, it is characterized in that, described DAC control circuit comprises D/A change-over circuit, reference voltage power circuit, logic with shift control circuit and the sampling hold circuit that has several test channel, and each sampling hold circuit is connected with charge-discharge circuit respectively; Described voltage and current Acquisition Circuit comprises A/D change-over circuit and two buffer circuits that are connected with the A/D change-over circuit respectively, and the single chip circuit in the described single chip machine controlling circuit is connected with the A/D change-over circuit with the D/A change-over circuit respectively; The described commutation circuit that discharges and recharges is connected with voltage, current measurement circuit and over-voltage over-current protection circuit; described commutation circuit, voltage, current measurement circuit and the over-voltage over-current protection circuit of discharging and recharging all links to each other with mesuring battary; described voltage, current measurement circuit are connected with the A/D change-over circuit, and described reference voltage source circuit is connected with the A/D change-over circuit with the D/A change-over circuit.
2. multichannel precision secondary batteries testing system according to claim 1 is characterized in that described D/A change-over circuit comprises D/A conversion chip U6 and impact damper U8, and D/A conversion chip U6 selects 16 bit pads for use; DIN, the SCLK of D/A conversion chip U6 is connected with P14 with P11, the P16 of singlechip chip U1 respectively with the CS pin, and 1 pin of D/A conversion chip U6 is connected with 3 pin of impact damper U8.
3. multichannel precision secondary batteries testing system according to claim 1, it is characterized in that described A/D change-over circuit comprises A/D conversion chip U61, A/D conversion chip U61 selects 24 delta sigma ADCLTC2498 type converters for use, the CH0 of A/D conversion chip U61 meets the output terminal CH1CM of the operational amplifier U46 in the voltage and current metering circuit, and CH1 meets the output terminal CH1VM of operational amplifier U45; 1,2,3,4,5,6,7,30,31,32, the 32 pin ground connection of A/D conversion chip U61, the P10 pin of the SDO pin order sheet machine chip U1 of A/D conversion chip U61, power supply VCC+5V inserts the SDO pin by resistance R 61, connect 20pF electric capacity between SDO pin and the Fo pin, Fo pin ground connection, P16, P17, the P11 pin of SCLK, the CS of A/D conversion chip U61, SDI pin order sheet machine chip U1.
4. multichannel precision secondary batteries testing system according to claim 1, it is characterized in that described reference voltage source circuit comprises reference voltage power supply chip U7, reference voltage source chip U7 selects low temperature drift, low noise reference voltage source MAX6033 type for use, the input end IN of reference voltage source chip U7 is connected with power supply VCC+5V, and by 104 capacity earths, 5,6 pins are connected, and 2 pin ground connection are inserted decoupling capacitor 0.1uF and 10uF between 5,6 pins and simulation ground.
5. multichannel precision secondary batteries testing system according to claim 1, it is characterized in that described voltage and current metering circuit comprises operational amplifier U45 and operational amplifier U46, operational amplifier U45 and operational amplifier U46 select low drifting operating amplifier LTC1012 type for use, operational amplifier U45 is linked into the mesuring battary two ends by resistance R 110 and resistance R 112,3 pin of operational amplifier U46 are received sampling resistor R103 by resistance R 132, sampling resistor R103 ground connection.
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CN103138243A (en) * | 2011-11-29 | 2013-06-05 | 海洋王(东莞)照明科技有限公司 | Charging circuit and charging device used for portable lamps |
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US5774733A (en) * | 1995-10-03 | 1998-06-30 | Microchip Technology Incorporated | Microcontroller with analog front-end for providing intelligent battery management |
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CN101865979A (en) * | 2010-06-28 | 2010-10-20 | 惠州市亿能电子有限公司 | Circuit for detecting voltage of batteries |
CN103138243A (en) * | 2011-11-29 | 2013-06-05 | 海洋王(东莞)照明科技有限公司 | Charging circuit and charging device used for portable lamps |
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CN104614682A (en) * | 2015-02-04 | 2015-05-13 | 福建实达电脑设备有限公司 | Instrument and method for testing ageing of battery |
CN112363066A (en) * | 2020-09-16 | 2021-02-12 | 武汉市蓝电电子股份有限公司 | Battery testing method and device capable of automatically switching measuring ranges |
CN112363066B (en) * | 2020-09-16 | 2024-02-23 | 武汉市蓝电电子股份有限公司 | Battery testing method and device capable of automatically switching measuring ranges |
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