CN1008830B - Semiconductor devices outer lead anticorrosion stress-resistant detection method - Google Patents
Semiconductor devices outer lead anticorrosion stress-resistant detection methodInfo
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- CN1008830B CN1008830B CN 88101440 CN88101440A CN1008830B CN 1008830 B CN1008830 B CN 1008830B CN 88101440 CN88101440 CN 88101440 CN 88101440 A CN88101440 A CN 88101440A CN 1008830 B CN1008830 B CN 1008830B
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Abstract
Though present domestic and international semiconductor devices that adopts and integrated circuit flat package draw dimension anticorrosion stress-resistant detection method outward and device respectively has characteristics.But all exist the test period long, efficient is low, go strand far away and be difficult to quantitative deficiency mutually with the actual user mode of outer lead.The present invention adopts an axle year knot that occurs bending and deformation in the real abrasion of the hinge outer lead medium to lack the test period, under same test conditions, simultaneously the outer knot that draws of n * h is detected (n sits number≤20 in the end, and h is outer lead number≤10 of each end seat) and improved detection efficiency; By writing down outer lead fracture failure time and accumulative total crash rate and carrying out the purpose that the Weibull statistical treatment can reach detection by quantitative with this.
Description
The invention belongs to semiconductor devices environmental test technology.
Semiconductor devices and integrated circuit outer lead rupture because of environmental corrosion, are the one of the main reasons that influences its reliability, and wherein most of fracture is relevant with stress corrosion.But still there is not a kind of fast quantification method of evaluating outer lead anticorrosion stress-resistant performance so far.Already by 1EC(International Electrotechnical Commission) the environmental test method of approval such as the effect that the suffered stress of outer lead is not considered in the test of salt fog and hectic fever; And outer lead tensile strength and bending test are not considered the environmental corrosion performance.More external in recent years researchers have carried out some outer lead anticorrosion stress-resistants tests in the laboratory, though characteristics are respectively arranged, all exist the test period long, efficient is low, go mutually far with the actual user mode of outer lead and be difficult to deficiencies such as quantitative.Wrapping test as Bel (Bell) phone laboratory Bai Ke people such as (Baker) (is seen RGBaker, etal " Electro-Technology " Vol.72. № 4(1963) be that outer lead is wrapped on the gold-plated copper binding post of square 11), in circulating twice hectic fever environment every day, tested for 12 weeks, judge whether to occur stress corrosion with metallographic examination.The auspicious bending test of can (Weirick) setting up (seeing LJWeirick " Solid State fechnology " Vol.18. № 3(1975) 25 of (Sandia) laboratory, mulberry ground prestige) be to be immersed in a week in the NaCl solution of 1M after 90 ° of the positive contraflexures of outer lead, still to have or not stress corrosion cracking (SCC) with the inspection of metallographic method.The direct stretching static load test (seeing MJElkindetal " Physics of Failure in Electrorics " 5(1967) 477 that the breadboard Ai Erkende of Bel (Bell) phone people such as (ELKind) sets up) in the hectic fever environment, determined fracture percentage every ten days, take altogether more than 60 days.This method greatly differs from each other with the actual stress of using.The influence of the external wire stress corrosion of artificial research solder flux such as Tang (Dunn) of Europe Center For Space Research, use 2 bending methods that the flat package outer lead is carried out permanent deformation test, hectic fever environmental test 56 days, also use its stress corrosion fracture of metallographic examination (seeing BD.Dunn, etal " WeldJ " 59.(1980) 10).
For overcoming the deficiency of existing method, the present invention adopts and makes outer lead diastrophic loading in corrosive medium, (n is the semiconductor device number of packages to detect n * h outer lead under the experiment condition same case simultaneously, h is the outer lead number of each device), general n≤20, h≤10, and by outer lead fracture failure time t and accumulative total crash rate F(t) carry out the Weibull statistical treatment, promptly by with t and F(t) data map on Weibull probability paper, the configuration regression straight line, utilize figure to estimate method and determine form parameter m, mean lifetime μ, characteristics life η, standard deviation δ, location parameter γ is to realize (general≤10 days) fast to outer lead anticorrosion stress-resistant ability, efficiently, quantitatively reach the testing goal of approaching the actual user mode of outer lead as far as possible.When detecting, whether the present invention also can be coated with the envelope antiseptic by the outer lead root, detects outer lead root and other position anticorrosion stress-resistant situations respectively as vaseline etc.; By detect sintering, behind the sintering plating Ni, the outer lead of plating Au behind the sintering plating Ni, outer lead is implemented pre-indentation or prebuckling can be simulated outer lead impaired or manufacturing process imperfection and the anticorrosion stress-resistant ability of different production phases.Utilize the present invention to be convenient to realize that the semiconductor devices outer lead different in batches to different manufacturers or same producer, that the different preparatory phases of same batch are produced and the anticorrosion stress-resistant ability of integrated circuit flat package outer lead carry out quantitative comparison.
Comprise by the detection method embodiment that the present invention set up:
One, static outer lead stress corrosion (cracking) test embodiment
1. the permanent load of semiconductor devices outer lead semi-girder loading stress etch embodiment
This method is to immerse in the NaCl solution of room temperature through acetone or dried 2/3rds outer leads of alcohol wash, the outer lead pipe cap is fixed, end straight up, the external force counterweight flatly acts on the outer lead end by filament through pulley, make its be the overarm stress (seeing Fig. 1 or Fig. 3).By the mechanics of materials as can be known, the suffered everywhere tension stress of outer lead is σ=32PL/ π d
3D-outer lead diameter in the formula, P-external force counterweight, outer point of force application to the outer lead of 1-is surveyed stress place distance.By formula as can be known, stress is linear distribution, and end is zero, root σ
Max=32PL/ π d
3Maximum (L is that outer point of force application is to outer lead root distance).For avoiding outer lead generation permanent strain, σ
MaxShould be less than the yield limit of outer lead material.When detecting the outer lead corrosion resistance, can pass through general 6～12 hours observed and recordeds of record outer lead fracture failure time t(once) and fracture failure radical △ Nf(t), calculate accumulative total fracture failure rate F(t), and with t and F(t) data carry out the Weibull statistical treatment with quantitative assessment outer lead anticorrosion stress-resistant ability.
Be to improve detection efficiency, this law can detect n * h outer lead simultaneously under identical condition, but when h≤4,2≤n≤20, as shown in Figure 1: when 5≤h≤10, n=1, as shown in Figure 3.
When h≤4,2≤n≤20 o'clock, the semiconductor devices base is fixed along the center line of specimen mounting (8).Pulley (7) is installed in the terminal both sides (see figure 1) of outer lead (6); When 5≤h≤10, during n=1, semiconductor devices outer lead base is fixed in the central small cylindrical tank (27) of NaCl solution tank (25).Pulley (22) is placed in the terminal (see figure 3) on every side of outer lead (24) radially.
Chinese scholars is consistent thinks that chlorion is the main cause that causes the outer lead stress corrosion fracture.The inventor confirms that further in chlorine ion concentration higher neutrality or weakly acidic solution, the stress corrosion of outer lead is especially responsive.So corrosive medium of the present invention is the 5%NaCl solution of pH value=6.2～7.2.
Concrete certain B1-E of factory transistor npn npn n=20 that detects, h=3, totally 60 outer leads, P=20g, L=25mm, d=0.42mm, testing result sees Table 1.
Get through the Weibull statistical treatment: form parameter m=1.5, mean lifetime μ=81.6 hour, characteristics life η=86.4 hour, standard deviation δ=67.8 hour, location parameter γ=36 hour.
2. the permanent load of the external beam of semiconductor devices outer lead loading stress etch embodiment
This law is compared with semi-girder loading stress etch, and the one, the load mode difference is that external force (34) is to act on outer lead (39) end by external beam (38), makes outer lead be external beam stress state (see figure 5).Calculate as can be known by the mechanics of materials, the suffered everywhere stress of this kind situation outer lead be σ=
(kg/mm
2), P-external force load in the formula, the external beam length of D, the Young modulus of E-outer lead material, the I-moments of inertia, d-outer lead diameter, the L-outer lead is long, and the x-check point is to outer lead root distance.When x=0, i.e. root tension stress σ
Max=PDd/21cos(
) maximum.For avoiding outer lead generation permanent strain, σ
MaxAlso should be lower than the yield limit of outer lead material; The 2nd, the corrosive medium difference, promptly external beam loading stress corrosion is detected in salt fog or hectic fever gas.The salt fog or the hectic fever gas that charge in the case are prepared by the regulation of International Electrotechnical Commission.
The inventor is to certain B1-E of factory transistor npn npn n=20, h=3, and totally 60 outer leads are tested in the salt fog medium.P=10g, D=38mm, E=13400kg/mm
2, d=0.42mm, L=25mm, test findings sees Table 2.
Get through the Weibull statistical treatment: m=1.95, μ=128.4 hour, η=137.2 hour, δ=93.1 hour, γ=78 hour.
3. the permanent load of integrated circuit flat package outer lead semi-girder loading stress etch embodiment
This method detects the outer lead anticorrosion stress-resistant in salt fog or hectic fever gas.Before detecting outer lead is cut the shape that curves as shown in Figure 6.Subsequently outer lead base (48) is fixed between specimen mounting (45) and the sample pressing plate (46), outer lead to be measured is the level of state, external force (42) by filament (43) vertical act on outer lead (44) end, make it be the semi-girder stress.By the mechanics of materials as can be known, the suffered stress σ of outer lead root
Max=6PL/ba
2(kg/cm
2) maximum, P-external force counterweight in the formula, L-outer lead root be to the load(ing) point distance, b-outer lead width, a-outer lead thickness.Note σ during detection
MaxShould be lower than the yield limit of outer lead material.
The inventor detects in the salt fog medium 109 outer leads of certain JBB-14A of factory type integrated circuit flat package.P＝5g，L＝6mm，b＝0.4mm，a＝0.18mm，
Testing result sees Table 3.
Get through the Weibull statistical treatment: m=1.03, μ=214.8 hour, η=214.8 hour, δ=214.8 hour, γ=84 hour.
Two, dynamic outer lead stress corrosion (cracking) test embodiment
Dynamically the outer lead stress corrosion (cracking) test can be simulated motion and the STRESS VARIATION situation of outer lead in actual user mode.Make outer lead alternating bending under the stress corrosion state can reach above-mentioned purpose.
When h≤4,2≤n≤20 o'clock, the outer lead alternating bending can make specimen mounting (8) swing the (see figure 2) that is achieved repeatedly around its center line by servomotor (17).For guaranteeing that fatigue break does not take place outer lead, the alternating bending cycle can not be too little, generally should be about 10～30 minutes, and the alternating bending angular region is difficult for excessive, generally is not more than 30 °, is not more than σ to guarantee tensile stress variations
Max10%.
When 5≤h≤10, during n=1, the alternating bending of outer lead (24) can move up and down the (see figure 4) that is achieved by NaCl solution tank (25).The alternating bending cycle is identical with above-mentioned requirements with angular region.
Concrete certain semiconductor devices n=20 of factory that detects, h=3, flexure cycles 30 minutes, 30 ° of angular regions, experimental result sees Table 4.
Get through the Weibull statistical treatment: m=3.2, μ=76.5 hour, η=82 hour, δ=48.7 hour, γ=35 hour.Compare with static method, form parameter m increases, and standard deviation δ diminishes, and more convergence normal distribution of dynamic method is described.
The pick-up unit that the present invention set up comprises:
One, the permanent bearing strength test corrosion of the static outer lead semi-girder of many devices of h≤4 (n≤20) pick-up unit
This device as shown in Figure 1.Among the figure: 1-device base plate, 2-external force counterweight, 3-NaCl liquor box, 4-filament, 5-screw, 6-outer lead, 7-pulley, 8-specimen mounting, 9-support, 10-pulley spindle, 11-NaCl solution, 12-circular hole, 13-sample pressing plate.
This device ties up to and puts a corrosive medium storer on the device base plate (1) is rectangle NaCl liquor box (3), to embed the two ends of liquor box (3) along the specimen mounting (8) that center line uniformly-spaced dig row's circular hole (12), treat that device base inserts specimen mounting circular hole (12) back and give gland with the smaller sample pressing plate (13) of the corresponding circular hole of specimen mounting (8) and diameter and fixed by screw (5) to dig on it.Both sides at liquor box (3) are corresponding with specimen mounting circular hole position, in mode uniformly-spaced the pulleys (7) of two rows shown in Fig. 1 (7) are installed by support (9) and pulley spindle (10).During detection, external force counterweight (2) acts on the end of outer lead (6) by filament (4) by pulley (7), makes outer lead be the permanent bearing strength test etch state of static semi-girder.Liquor box (3), specimen mounting (8) and sample pressing plate is corrosion-resistant material such as organic glass is made.
Two, the permanent bearing strength test corrosion of the dynamic outer lead semi-girder of many devices of h≤4 (n≤20) pick-up unit.
This device as shown in Figure 2.Remove the 14-relay among the figure, the 15-clinometer rule, the 16-travel switch, the 17-servomotor, 18-motor backing plate and specimen mounting (8) link to each other with motor shaft, the center line of specimen mounting (8) must be harmonious with electrical axis, specimen mounting (8) and liquor box two ends are for being slidingly connected, by travel switch (16) and relay (14) with the control motor positive and inverse to and slewing area so that specimen mounting (8) outside its center line is swung with the purpose that reaches the outer lead alternating bending repeatedly, the implication of remaining part is all identical with static detection device Fig. 1 with function.
Three, the permanent bearing strength test corrosion of the static outer lead semi-girder of the single device of the multioutlet of n=1 (5≤h≤10) pick-up unit
This device as shown in Figure 3.Among the figure: 19-device base plate, 20-external force counterweight, 21-filament, 22-pulley, 23-support, 24-outer lead, 25-NaCl solution tank, 26-screw, 27-small cylindrical tank, 28-sample pressing plate.
This device ties up on the device base plate (19) and lays-and the corrosive medium storer is a cylindricality NaCl solution tank (25), dug small cylindrical tank (27) to lay device base in solution tank (25) bottom center, base gives gland by sample pressing plate (28) and is fixed by screw (26).To wait angular distance radial to go up a series of pulleys (22) are installed in the top of solution tank (25) at support (23), when external force counterweight (20) acts on outer lead (24) end by filament (21) by pulley (22) static semi-girder shape.
Four, the permanent bearing strength test corrosion of the single device dynamic outer lead semi-girder of multioutlet (5≤h≤10) pick-up unit
This device as shown in Figure 4.Remove the 29-motor among the figure, the 30-scroll bar, the 31-turbine, the 32-cam, 33-solution tank overcoat and solution tank overcoat (33) are fixedlyed connected with device base plate (19), pulley (22) is installed in solution tank overcoat (33) top by support (23) with the radial angular distance that waits, when rotating, passes through by motor (29) scroll bar (30) turbine (31) speed change, drive cam rotation and make solution tank (25) oscilaltion to reach outside the outer lead alternating bending, the remaining part implication is all identical with device shown in Figure 3 with function.Scroll bar, turbine and cam design require to be as the criterion to satisfy outer lead alternating bending cycle and angular region.
Five, the permanent bearing strength test corrosion of the external beam of the static outer lead of the many devices of multioutlet (h≤10) (n≤20) pick-up unit
This kind device is used for salt fog or hectic fever gas medium as shown in Figure 5.Among the figure: 34-external force counterweight, 35-specimen mounting, 36-sample pressing plate, 37-screw, the external beam of 38-, 39-outer lead, 40-device base, 41-filament.Mask placement device base (40) dug the equidistant circular groove of a row along specimen mounting (35) center line in, by digging corresponding circle hole but the smaller sample pressing plate (36) of diameter give gland and fix by screw (37).The terminal aperture that embeds external beam (38) one ends of outer lead (39), it is interior and be external beam stress state by external beam effect in the outer lead end that external force counterweight (34) hangs over the groove of the external beam other end by filament (41).During detection device is as shown in Figure 5 placed corrosive medium reservoir salt fog or hectic fever case.
Six, the permanent bearing strength test corrosion of integrated circuit flat package outer lead semi-girder pick-up unit
This device is used among salt fog and the hectic fever gas medium as shown in Figure 6.It is n≤20 that each measurable set becomes the channel base number, and base outer lead number is h≤10.Among the figure: 42-external force counterweight, 43-filament, 44-outer lead, 45-specimen mounting, 46-sample pressing plate, 47-screw, 48-integrated circuit base.
Dug a series of equidistant square grooves on the specimen mounting of this device (45) so that integrated circuit base (48) to be installed, given gland and fixing by screw (47) with the sample pressing plate (46) that digs identical square groove.Non-detection outer lead is upwards bent up, make outer lead to be measured (44) maintenance level, external force counterweight (42) acts on outer lead (44) end through filament (43), makes it become the semi-girder stress.During test, place salt fog or hectic fever case to be detected in as shown in Figure 6 device.
Table 1
T(hour fracture failure time) 12 24 36 48 60 72 84
Fracture failure radical △ Nf(t) 000 12 7 10 12
Accumulative total crash rate F(t) (%) 0.0 0.0 0.0 20.0 31.7 48.3 68.3
t 96 108 120 132 144 156
△Nf（t） 9 4 1 0 3 2
F（t） 83.3 90.0 91.7 91.7 96.7 100
Table 2
T(hour fracture failure time) 84 96 108 120 132 144
Fracture failure radical △ Nf(t) 0568 16 17
Accumulative total crash rate F(t) (%) 0.0 8.33 18.3 31.7 58.3 86.7
t 156 168 180 192 204
△Nf（t） 0 1 1 0 0
F（t） 86.7 88.3 90.0 90.0 90.0
Table 3
T(hour fracture failure time) 24 48 72 96 110 134 158 182 216
Fracture failure radical △ Nf(t) 0009 15 18 16 74
Accumulative total crash rate F(t) (%) 0.0 0.0 0.0 8.28 22.0 38.5 53.2 59.6 63.3
t 240 264 288 312 336 360 384 408
△Nf（t） 8 5 6 4 0 3 2 1
F（t） 70.6 75.2 80.7 84.4 84.4 87.2 89.0 96.0
Table 4
T(hour fracture failure time) 36 46 47 55 60 69 75
Fracture failure radical △ Nf(t) 05 14 8773
Accumulative total crash rate F(t) (%) 0.0 8.33 31.7 45.0 56.7 68.3 73.3
t 79 81 84 94 101 105 107
△Nf（t） 3 1 1 3 2 2 4
F（t） 78.3 80.0 81.7 86.7 90.0 93.0 100
Claims (13)
1, a kind of semiconductor devices outer lead stress corrosion fast quantification detection method, it is to be in the corrosive medium at outer lead, lead terminal effect outside is with external force, and the wire breaking failure conditions is described its anticorrosion stress-resistant ability in addition, it is characterized in that:
A) said external force is the loading of instigating outer lead to occur bending and deformation,
B) said fracture failure is fracture directly perceived,
C) can detect n * h outer lead simultaneously under the same conditions, wherein n is a device count, and h is the outer lead number of each device, n≤20, and h≤10,
D) wire breaking out-of-service time t and accumulative total crash rate F (t) carried out the Weibull statistical treatment beyond said outer lead fracture failure situation meant.
2, the method for claim 1 is characterized in that:
A) the outer lead end straight up, external force counterweight (2) flatly acts on the end of outer lead (6), root maximum tensional stress σ max=32PL/ π d by pulley (7)
3Should be lower than the yield limit of outer lead material,
B) when h≤4,2≤n≤20, when 5≤h≤10, n=1,
C) said corrosive medium is a concentration 5%, and the pH value is 6.2～7.2 NaCl solution.
3, method as claimed in claim 2 is characterized in that outer lead can alternating bending, and flexure cycles was generally about 10～30 minutes, and the bending angle scope is generally greater than 30 °.
4, the method for claim 1 is characterized in that:
A) said external force (34) is to act on straight up outer lead (39) end by external beam (38), makes outer lead (39) become external beam stress state, outer lead root maximum tensional stress σ max=PDd/2Icos(
L) should be lower than the yield limit of outer lead material,
B) said corrosive medium is salt fog or hectic fever gas.
5, as claim 1,2,3 or 4 described methods is characterized in that the outer lead root is sealed with antiseptic such as vaseline to be coated with.
6, as claim 1,2,3 or 4 described methods is characterized in that outer lead can be a sintering, behind the sintering plating Ni, plating Au behind the sintering plating Ni, can also give indentation or give crooked.
7, method as claimed in claim 5 is characterized in that outer lead can be a sintering, behind the sintering plating Ni, plating Au behind the sintering plating Ni, can also give indentation or give crooked.
8, a kind of semiconductor devices outer lead stress corrosion fast quantification pick-up unit, it comprises specimen holder, corrosive medium storer and external force, it is characterized in that n outer lead base of specimen holder clamping simultaneously, each base can have h outer lead effect simultaneously with external force, n≤20, h≤10.
9, device as claimed in claim 8 is characterized in that:
A) said specimen holder is made of the specimen mounting (Fig. 1) (8) and the sample pressing plate (13) corresponding therewith but that the aperture is smaller that dig the equidistant circular hole of a row along center line, and both are fixed by screw (5),
B) said corrosive medium storer means rectangle NaCl liquor box (Fig. 1) (3), and two row's pulleys (7) are equipped with by support (9) and pulley spindle (10) in both sides above liquor box, and pulley position and semiconductor base installation site adapt,
C) described external force assembly system by (2), (pulley (7) and prick at straight up the terminal screw (4) of outer lead (6) by the pulley jar is constituted.
D) when h≤4,2≤n≤20.
10, device as claimed in claim 9 is characterized in that:
A) end of said liquor box (Fig. 2) (3) is clinometer rule (15), and two travel switches (16) are housed on it, when servomotor (17) rotates, can pass through travel switch (16) and relay (14) control motor steering and scope.
B) said specimen mounting (Fig. 2) (8) and liquor box two ends are for being slidingly connected, and specimen mounting links to each other with motor shaft, and specimen mounting center line and electrical axis are harmonious, and when the forward and reverse rotation of motor, specimen mounting is swung repeatedly, makes the outer lead alternating bending.
11, device as claimed in claim 8 is characterized in that:
A) said specimen holder system is with holes with central authorities by solution tank (25) bottom center circular groove, and the smaller sample pressing plate (28) in aperture constitutes, give by screw (26) between the two fastening,
B) said corrosive medium storer bitt shape NaCl solution tank (Fig. 3) (25) is installed with a series of pulleys (Fig. 3) (22) by support (Fig. 3) (23) with the angular distance such as grade on every side radially above solution tank,
C) said external force assembly system is by counterweight (20), pulley (22) and constitute at straight up the terminal filament (21) of outer lead (24) by the pulley ligation,
D) when 5≤h≤10, n=1.
12, device as claimed in claim 11 is characterized in that:
A) described solution tank (Fig. 4) (25) places solution tank overcoat (33) slidably, by support (Fig. 4) (23) a series of pulleys (Fig. 4) (22) is installed radially with the angular distance such as grade around overcoat (33) top.
B) contact with cam (32) at the bottom of the solution tank, when motor (29) rotates, rotate, make solution tank oscilaltion in overcoat (33), to realize the outer lead alternating bending by driving cam (32) after scroll bar (30) and turbine (31) speed change.
13, device as claimed in claim 8 is characterized in that:
A) described specimen holder system by the specimen mounting (35) that digs the equidistant circular groove of a row along the center with have corresponding circle hole, and the smaller sample pressing plate (36) in aperture constitutes, give with screw (37) therebetween fastening,
B) said external force assembly system by counterweight or the filament (41) that waits heavy object (34) in right amount, embeds the external beam (38) of outer lead (39) end straight up and connect external beam and counterweight constituted.
C) said corrosive medium storer is salt fog cabinet or hectic fever case.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 88101440 CN1008830B (en) | 1988-03-25 | 1988-03-25 | Semiconductor devices outer lead anticorrosion stress-resistant detection method |
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|---|---|---|---|
| CN 88101440 CN1008830B (en) | 1988-03-25 | 1988-03-25 | Semiconductor devices outer lead anticorrosion stress-resistant detection method |
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| CN1036264A CN1036264A (en) | 1989-10-11 |
| CN1008830B true CN1008830B (en) | 1990-07-18 |
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| CN101109691B (en) * | 2007-07-30 | 2011-04-27 | 山东省交通厅公路局 | Device and method for metallic rod body material stress corrosion test |
| CN103149097B (en) * | 2013-03-07 | 2015-05-13 | 中国空间技术研究院 | Tension testing device of pin lead wire of electronic component |
| CN104181055A (en) * | 2013-05-27 | 2014-12-03 | 深圳市海洋王照明工程有限公司 | Stress testing device for cable insulating sheath |
| CN103983559B (en) * | 2014-04-16 | 2016-07-13 | 深圳大学 | Reinforcing bar plays suggestion device and the reminding method of rust and chlorine ion concentration limit state |
| CN104198672B (en) * | 2014-09-01 | 2016-03-02 | 北京科技大学 | Based on the bridge cable corrosion monitoring method that plane stress state stress is concentrated |
| CN104777038B (en) * | 2015-04-03 | 2017-11-17 | 山东大学 | A kind of single-point otch dead load tensile stress split test device and method |
| CN110376120B (en) * | 2019-07-23 | 2022-06-21 | 杭州青云新材料股份有限公司 | Method and device for testing chlorine resistance of spandex filament for clothing industry |
| CN110779859A (en) * | 2019-10-15 | 2020-02-11 | 河海大学 | Auxiliary device and method for detecting corrosion resistance of steel bar under pure bending action |
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1988
- 1988-03-25 CN CN 88101440 patent/CN1008830B/en not_active Expired
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| CN1036264A (en) | 1989-10-11 |
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