CN100507612C - Phase diaphragm for 4f phase coherence imaging system - Google Patents
Phase diaphragm for 4f phase coherence imaging system Download PDFInfo
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- CN100507612C CN100507612C CNB2007101354304A CN200710135430A CN100507612C CN 100507612 C CN100507612 C CN 100507612C CN B2007101354304 A CNB2007101354304 A CN B2007101354304A CN 200710135430 A CN200710135430 A CN 200710135430A CN 100507612 C CN100507612 C CN 100507612C
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Abstract
The invention relates to a phase aperture which is used for a 4f phase coherence imaging system. The aperture body is composed of an annular light penetrating strip which is at the periphery side and a phase object which is at the center part. The invention is characterized in that the phase object is divided into two parts. The phase difference between one part of the phase object and the annular light penetrating strip is 2mPi plus Pi/2, and the phase difference between the other part of the phase object and the annular light penetrating strip is 2nPi-Pi/2. In the formula, m and n are integers. The measuring precision of the system can be increased in the range of a nonlinear phase shift of |PsiNL| being less than Pi by an improved phase aperture. For a positive nonlinear phase shift, the improvement of the sensitivity can be reached 1.72 times at the most degree. But for a negative nonlinear phase shift, the improvement of the sensitivity is especially obvious. When the formula PsiNL being equal to minus Pi is valid, the improvement of the sensitivity can be enhanced by 7.26 times.
Description
Technical field
The present invention relates to a kind of optical element, especially a kind of phase diaphragm that can improve 4f phase coherence imaging system measuring accuracy.
Background technology
Along with the develop rapidly of art such as optical communication and optical information processing, non-linear photon is learned investigation of materials and is become more and more important.The realization of functions such as optical logic, optics memory, optical transistor, photoswitch and phase place complex conjugate mainly depends on the progress that non-linear photon is learned material.The optical nonlinearity measuring technique is that the non-linear photon of research is learned one of gordian technique of material.4f phase coherence imaging system (G.Boudebs and S.Cherukulappurath wherein, " Nonlinear optical measurements using a 4f coherentimaging system with phase object ", Phys.Rev.A, 69,053813 (1996)) be exactly a kind of new method of measuring nonlinear refraction coefficient of materials that proposes in recent years.
4f phase coherent imaging method is a kind of measuring method of beam aberration, this method is to place a phase diaphragm on 4f system object plane, non-linear object to be measured is placed on the Fourier plane, and on exit facet, uses the CCD camera to receive the method for shoot laser pulse diagram picture.This method can utilize monopulse to measure the size and the symbol of nonlinear refraction coefficient simultaneously.In the prior art, the phase diaphragm of employing is to make the more phase object of small circular of an area at the center of a circular iris, and the phase delay of a pi/2 is arranged by other local light of light ratio of phase object.When the nonlinear refractive index of measured material when being positive, the nonlinear images that CCD receives since positive phase contrast around the strength ratio of the position of phase object, strengthen.Opposite, when non-linear this refractive index of measured material for negative the time, a little less than wanting around the strength ratio of the position of the phase object of nonlinear images.
Though 4f phase coherent imaging method utilizes phase diaphragm to realize the size of nonlinear refractive index and the measurement of symbol dexterously, still has the problem of detection sensitivity.How under same incident intensity, increasing the sensitivity that detects, is that the technical matters that solves is badly in need of in this area.
Summary of the invention
The objective of the invention is, a kind of improved phase diaphragm is provided, be used for the 4f phase coherence imaging system,, make measuring accuracy be improved by the improvement of structure.
For achieving the above object, the technical solution used in the present invention is: a kind of phase diaphragm that is used for the 4f phase coherence imaging system, the diaphragm body is made of the ring-type euphotic zone of periphery and the phase object of central authorities, described phase object separated into two parts, wherein a part is 2m π+pi/2 with the phase differential of ring-type euphotic zone, and the phase differential of another part and ring-type euphotic zone is 2n π-pi/2, in the formula, m, n are integer.
The thinking that produces technique scheme mainly is: if the bit phase delay of the phase object in the phase diaphragm is become-pi/2, so for material with positive nonlinear refraction, to produce a negative phase contrast in the experiment, promptly the intensity of the position of phase object will reduce in the nonlinear images; And for the material of bearing nonlinear refractive index, the intensity of phase object position will increase in the nonlinear images.If can realize the both positive and negative phase contrast simultaneously for same nonlinear material, sensitivity will increase so.Thus, in order to give full play to the phase contrast effect of phase object, consider to design a kind of phase diaphragm, this phase diaphragm can produce positive phase contrast and negative phase-contrast simultaneously to nonlinear sample to be measured, makes measuring accuracy be improved.
Optimized technical scheme is that two parts of described phase object are two adjacent semicircle phase objects.
Further technical scheme, described diaphragm body is a circular iris, its center is coated with circular transparent dielectric film, constitute described phase object, wherein, circular transparent dielectric film is made of the semicircle that two thickness do not wait, and its thickness setting satisfies the requirement of phase differential of the ring-type euphotic zone of semicircle and described periphery.
Usually, the phase differential of described two parts phase object be respectively pi/2 and-pi/2.Because the position of light wave is the cycle with 2 π mutually, therefore, the integral multiple that increases or reduce 2 π can't influence experimental result.
In the technique scheme, two semicircle phase objects have been modified into by phase object with the unified phase delay pi/2 of original circle, make one of them semicircle phase object produce pi/2 phase and postpone, and the phase delay of the semicircle phase object generation-pi/2 of another one.For nonlinear refractive index is positive sample, in nonlinear images phase delay be the zone of pi/2 because positive phase contrast strength-enhanced, and phase delay for the zone of-pi/2 since negative phase-contrast intensity reduce.The enhancing of the intensity in phase diaphragm zone or reduce almost equal in the increase of the intensity in the nonlinear images that produces with two after improving semicircle phase diaphragms and the nonlinear images that reduces under the situation of same intensity incident light, to produce with the phase diaphragm that improves preceding circle.Like this just make the measuring accuracy of system be improved.
The measurement that utilizes the 4f phase coherence imaging system to carry out nonlinear refractive index divides two parts to carry out, i.e. nonlinear measurement and energy calibration.The concrete steps of nonlinear measurement are:
(1) takes testing sample away, gather a pulse diagram picture, be called image without image with the CCD camera.
(2) testing sample is placed on the Fourier plane, neutral attenuator is placed on before the nonlinear sample, make the light intensity that shines on the sample be reduced to the range of linearity, gather a pulse diagram picture, be called linear image with the CCD camera.
(3) testing sample is placed on the Fourier plane, moved on to after the sample, gather a pulse diagram picture, be called nonlinear images with the CCD camera with before gathering neutral attenuator that linear image is to use.
Energy calibration is that nonlinear sample is taken away, and a certain position that energy meter is placed between two convex lens of 4f system makes laser facula can all get on the energy meter probe.Launch a laser pulse, measure the energy of pulse, gather the reference hot spot of reference path simultaneously with the CCD camera with energy meter.Because all devices all are linear units in the light path at this moment, so just can know the size of incident pulse energy according to the power of reference hot spot.The energy that incides the pulse on the testing sample in the nonlinear measurement process just can calculate by the reference hot spot that same laser pulse produces like this.
After measurement finishes, obtain the value of nonlinear refractive index by the non-linear hot spot of numerical fitting as input with linear beam spot.The sensitivity of experiment is that the strength difference by non-linear diaphragm decides.For the common phase diaphragm that has circular object, the mean intensity in phase object zone and phase object are Δ T with the difference of the mean intensity of exterior domain in the later nonlinear images of definition normalization.The phase diaphragm that has the different semicircle phase object of two phase delay after improving for us, the mean intensity difference that can define the semicircle zone of the mean intensity in the semicircle zone of phase delay pi/2 in the later nonlinear images of normalization and phase delay-pi/2 is Δ T '.
Numerical simulation shows, under the situation of identical incident intensity, in the nonlinear images with the phase diaphragm of two semicircle phase objects after the improvement, the mean intensity in the semicircle zone of phase delay pi/2 is with almost equal with the mean intensity in phase object zone in the nonlinear images of the phase diaphragm of circular phase object.But in the nonlinear images of the phase diaphragm after improvement, the mean intensity in the semicircle zone of phase delay-pi/2 will weaken, so Δ T '〉Δ T, the phase diaphragm after promptly improving makes the sensitivity of measuring system increase.
In the phase diaphragm after the improvement and do not require phase delay be respectively pi/2 and-zone of pi/2 must be strict semicircle.The variation that numerical simulation proves two-part relative size is to the sensitivity influence of system very little (being that change of sensitivity is less than 3.5% under 0.3 the situation for the ratio of common phase object radius and phase diaphragm radius).Consider that the influence that the more little conversion diffraction of phase object brings is big more, choosing two parts phase object is that semicircle is proper.
The raising of the sensitivity of the phase diaphragm after the improvement is different along with the variation of sample nonlinear phase shift.The variation of sensitivity is defined as Δ T '/Δ T, then the nonlinear phase shift that in sample, produces | Φ
NL| under the situation of＜π, sensitivity can be improved.Little phase shift (Φ
NL≈ 0) under the situation, Δ T '/Δ T=1.72 is negative situation for nonlinear phase shift, the increase of sensitivity is very obvious, works as Φ
NLDuring=-π, the increase of sensitivity can reach Δ T '/Δ T=7.26.
Because the employing of technique scheme, the present invention compared with prior art has following advantage:
The present invention has effectively improved the detection sensitivity of 4f phase coherent imaging method by the architecture advances to phase diaphragm.
Description of drawings
Fig. 1 is the 4f phase coherence imaging system schematic diagram in the embodiment of the invention one;
Fig. 2 is with the phase diaphragm synoptic diagram of circular phase object in the prior art;
Fig. 3 is with the phase diaphragm synoptic diagram of two semicircle phase objects among the embodiment one;
Fig. 4 is the nonlinear images and the sectional view thereof of the phase diaphragm numerical simulation of the circular phase object of the band that is used to contrast among the embodiment one;
Fig. 5 is with the nonlinear images and the sectional view thereof of the phase diaphragm numerical simulation of two semicircle phase objects in the embodiment of the invention one;
Fig. 6 is the size of two semicircle phase objects in the embodiment of the invention one and the graph of a relation of experimental precision;
Fig. 7 is with the Δ T of circular phase object phase diaphragm with the Δ T ' of the phase diaphragm of two semicircle phase objects and the graph of a relation of nonlinear phase shift in the embodiment of the invention one;
Fig. 8 is the graph of a relation that nonlinear phase shift and experimental precision increase in the embodiment of the invention one;
Fig. 9 is the partial enlarged drawing of accompanying drawing 7 in the embodiment of the invention one.
Wherein: 1, laser instrument; 2, phase diaphragm; 3, convex lens; 4, testing sample; 5, convex lens; 6, neutral attenuator; 7, CCD camera; 8, beam splitter; 9, catoptron; 10, convex lens; 11, catoptron; 12, beam splitter; 13, circular phase object; 14, semicircle phase object; 15, semicircle phase object.
Embodiment
Below in conjunction with drawings and Examples the present invention is further described:
Embodiment one: accompanying drawing 1 is the Experimental equipment of 4f phase coherence imaging system.Experimental provision can be divided into measuring system and energy frame of reference two parts.Measuring system is made up of laser instrument 1, phase diaphragm 2, convex lens 3, testing sample 4, convex lens 5, light-balancing filter 6 and CCD camera 7.Wherein convex lens 3 and convex lens 5 constitute the 4f system, and phase diaphragm 2 is placed on the object plane of 4f system, and testing sample 4 is on the Fourier plane, and CCD camera 7 received pulse image on the picture plane of 4f system.At first this part has omitted among Fig. 1 the laser that sends from laser instrument through expanding bundle, the laser pulse that expands after restrainting forms nearly top-hat light through phase diaphragm, the Fourier transform of light beam planoconvex lens 3 converges on the testing sample that is placed on the Fourier plane, because the nonlinear refraction character of testing sample makes the phase place of pulse of incident change.The inverse Fourier transform of passing through convex lens 5 from the pulse of sample rear surface outgoing is received by CCD camera 7, is called main spot.
The energy frame of reference is made up of beam splitter 8, catoptron 9, convex lens 10, catoptron 11 and beam splitter 12.The laser that comes out from phase diaphragm 2 is divided into two bundles by beam splitter 8, is wherein a branch ofly received by CCD camera 7 at last through catoptron 9, convex lens 10, catoptron 11 and beam splitter 12, is called with reference to hot spot.
Be the phase diaphragm of prior art shown in the accompanying drawing 2, phase object 13 is circular, the light beam bit phase delay pi/2 of the optical beam ratio other parts by phase object 13.Shown in the accompanying drawing 3 is the phase diaphragm of present embodiment, is made of the phase object of a circle jointly semicircle phase object 14 and semicircle phase object 15.Wherein semicircle phase object 14 produces the phase delay pi/2, and semicircle phase object 15 produces phase delay-pi/2.
The measurement that utilizes the 4f phase coherence imaging system to carry out nonlinear refractive index divides two parts to carry out, i.e. nonlinear measurement and energy calibration.The concrete steps of nonlinear measurement are:
The first step: take testing sample 4 away, gather a pulse diagram picture, be called image without image with CCD camera 7.
Second step: testing sample 4 is placed on the Fourier plane, neutral attenuator 6 is placed on before the testing sample 4, make the light intensity that shines on the testing sample 4 be reduced to the range of linearity, gather a pulse diagram picture, be called linear image with CCD camera 7.
The 3rd step: testing sample 4 is placed on the Fourier plane, moved on to after the testing sample 4, gather a pulse diagram picture, be called nonlinear images with CCD camera 7 with before gathering neutral attenuator 6 that linear image is to use.
Energy calibration is that nonlinear sample 4 is taken away, and a certain position that energy meter is placed between convex lens 3 and the convex lens 5 makes laser facula can all get on the energy meter probe.Launch a laser pulse, measure the energy of pulse, gather the reference hot spot of reference path with CCD camera 7 simultaneously with energy meter.Because all devices all are linear units in the light path at this moment, so just can know the size of incident pulse energy according to the power of reference hot spot.The energy that incides the pulse on the testing sample 4 in the nonlinear measurement process just can calculate by the reference hot spot that same laser pulse produces like this.
Accompanying drawing 4 (a) is the nonlinear images that the phase diaphragm by the circular phase object of common band obtains, and accompanying drawing 4 (b) then is the sectional view of accompanying drawing 4 (a) along y=0.The used major parameter of numerical simulation is the phase object radius and the ratio ρ=L of diaphragm radius
p/ R
a=0.5mm/1.7mm ≈ 0.3, testing sample nonlinear phase shift Φ
NL=1.Accompanying drawing 5 (a) is to obtain nonlinear images with the phase diaphragm with two semicircle phase objects after improving, and accompanying drawing 5 (b) then is the sectional view of accompanying drawing 5 (a) along y=0.In the simulation ratio of used phase object radius and diaphragm radius and sample nonlinear phase shift all with Fig. 4 in identical.Definition is Δ T with the mean intensity of phase diaphragm position and the difference of the mean intensity outside the phase object in the nonlinear images of the phase diaphragm generation of circular phase object.And, with bit phase delay being that the mean intensity of position of the semicircle phase object of pi/2 with bit phase delay is for the nonlinear images that produces with the phase diaphragm of two semicircle phase objects-difference of the mean intensity of the semicircle phase object position of pi/2 is defined as Δ T '.Can see that from accompanying drawing 4 (b) and accompanying drawing 5 (b) bit phase delay in Δ T in the accompanying drawing 4 (b) and the accompanying drawing 5 (b) is that the difference of the mean intensity of position of semicircle phase object of pi/2 and the mean intensity outside the phase object is almost equal, thereby Δ T '〉Δ T, the phase diaphragm after promptly improving is that the measurement sensitivity of system is improved.
Might not require for the different two parts phase object of the bit phase delay in the improved phase diaphragm is strict semicircle.We define H and are parallel to the distance and phase object radius L of the axial separatrix of y to x=0 for two parts phase object
pRatio, H=x/L
pAs shown in Figure 6, the sensitivity of numerical simulation display system and the relation of H are little, change less than 3.5%.Consider that phase object is more little, the edge diffraction that is subjected in the experiment can be serious more, and therefore selecting two parts phase object all is that semicircle is very suitable.
Accompanying drawing 7 be with the Δ T of the phase diaphragm of circular phase object with the Δ T ' of the phase diaphragm of two semicircle phase objects and the relation curve of nonlinear phase shift.Therefrom find out | Φ
NL| in the scope of＜π, Δ T in positive nonlinear phase shift scope sensitivity obviously greater than corresponding negative nonlinear phase shift.And Δ T ' is about Φ
NL=0 is centrosymmetric image, and | Φ
NL| the sensitivity of Δ T ' all is higher than Δ T in the scope of＜π, and is particularly evident for the increase of negative nonlinear phase shift sensitivity.The Δ T '/ratio of Δ T and the mapping of the relation curve of nonlinear phase shift are presented in the accompanying drawing 8.In accompanying drawing 8, work as Φ
NLOwing to an abnormal point appears in Δ T=0, this abnormal point value makes that too greatly the increase situation of sensitivity does not see Chu under the smaller situation of nonlinear phase shift, so we are with in the accompanying drawing 8 during=1.26 π | Φ
NL| the scope of＜π is shown enlarged in the accompanying drawing 9, uses 4f phase coherence imaging system measuring-signal Δ T vibration can occur for bigger nonlinear phase shift, and it is uncommon to reach the situation of so big phase shift in the reality, so we do not consider.We can see whole from accompanying drawing 9 | Φ
NL| the phase diaphragm after improving in the scope of＜π can make system sensitivity improve.The raising of sensitivity is very tangible in negative nonlinear phase shift scope, and the multiple that improves along with the increase sensitivity of nonlinear phase shift is constantly reducing, when nonlinear phase shift increases to π, the phase diaphragm after the improvement with improve before sensitivity much at one.See table shown in 1, can be clear that improving back phase diaphragm sensitivity is significantly improved.
The raising of the pairing system sensitivity of the different nonlinear phase shifts of table 1
| Φ NL | -π | -1 | 0 | 1 | π |
| ΔT′/ΔT | 7.26 | 2.21 | 1.72 | 1.41 | 0.96 |
Claims (2)
1. phase diaphragm that is used for the 4f phase coherence imaging system, the diaphragm body is made of the ring-type euphotic zone of periphery and the phase object of central authorities, it is characterized in that: described phase object separated into two parts, wherein a part is 2m π+pi/2 with the phase differential of ring-type euphotic zone, the phase differential of another part and ring-type euphotic zone is 2n π-pi/2, in the formula, m, n are integer; Two parts of described phase object are two adjacent semicircle phase objects.
2. the phase diaphragm that is used for the 4f phase coherence imaging system according to claim 1, it is characterized in that: described diaphragm body is a circular iris, its center is coated with circular transparent dielectric film, constitute described phase object, wherein, circular transparent dielectric film is made of the semicircle that two thickness do not wait, and its thickness setting satisfies the requirement of phase differential of the ring-type euphotic zone of semicircle and described periphery.
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Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN102385093A (en) * | 2011-11-01 | 2012-03-21 | 常熟微纳激光光子技术有限公司 | Phase diaphragm capable of measuring optical nonlinearity of material |
| CN102621605A (en) * | 2012-03-30 | 2012-08-01 | 常熟微纳激光光子技术有限公司 | Phase diaphragm for measuring material optical nonlinearity |
| CN102608682A (en) * | 2012-03-30 | 2012-07-25 | 常熟微纳激光光子技术有限公司 | Phase diaphragm applied to 4f phase coherent imaging systems |
| CN102692382A (en) * | 2012-03-30 | 2012-09-26 | 常熟微纳激光光子技术有限公司 | High-sensitivity frequency domain filtering baffle plate Z-scan method for measuring material nonlinearity |
| CN102707365A (en) * | 2012-06-25 | 2012-10-03 | 哈尔滨工业大学 | Positive and negative strip-shaped phase diaphragm, 4f phase-coherent nonlinear imaging system employing same and nonlinear refractivity measurement method |
| JP2014102394A (en) * | 2012-11-20 | 2014-06-05 | Toshiba Corp | Display device |
| CN103760629A (en) * | 2014-01-07 | 2014-04-30 | 苏州大学 | Phase position diaphragm for 4f phase-coherent imaging system |
| CN111221119B (en) * | 2020-03-16 | 2021-11-30 | 苏州大学 | Artificial microstructure construction method and optical system comprising artificial microstructure |
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Non-Patent Citations (2)
| Title |
|---|
| 4f相位相干成像技术时间相关特性分析. 王煜，宋瑛林，李云波.红外与激光工程，第36卷. 2007 |
| 4f相位相干成像技术时间相关特性分析. 王煜，宋瑛林，李云波.红外与激光工程，第36卷. 2007 * |
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