CN100504408C - Radio data card radiation stray frequency point test method - Google Patents

Abstract

The method comprises: 1) placing the laptop computer with a data card under test into the shielded room; starting up the data card under test; 2) using a combination tool to establish communication connection with the data card under test; 3) using a spectrum analyzer to connect a near-field electric wave receiving probe; said near-field electric wave receiving probe is placed in location closed to the data card under test; 4) said the spectrum analyzer receives the radiation stray energy through said near-field electric wave probe.

Description

Radio data card radiation stray frequency point test method

Technical field

The present invention relates to a kind of radio data card radiation stray frequency point test method.

Background technology

At present, global digital mobile user has reached 1,300,000,000, and this numeral is expected to double in the coming years.It is predicted that global communications industry will present the great market up to 2,000,000,000 number of mobile users in 2008.

The mobile service in the whole world and application are just used these three main directions towards voice, multimedia and enterprise and are increased.Mobile data services will have increasing share in mobile market.By in September, 2003, global mobile data services user reaches 100,000,000 people, accounts for the whole world 12.9 hundred million mobile subscribers' 7.7%, compares with the statistics in June, 2003 to have increased by 14%.By 2007, the mobile data services proportion will from 2002 10% rise to 30%, itself will become 600,000,000,000 Euros market mobile service market.

The data income of present many operators has accounted for 15% of its gross income.Use the carrier of data service as the user---the demand of wireless data card is very big.Now large quantities of data cards will pass through various authentication tests before coming into the market, wherein have one to be exactly that radiation dispersion to product has clear and definite index to limit.And this index is very high to the requirement of test environment when doing the radiation dispersion test---must arrive the very high microwave no reflection events darkroom of technical requirement and do as shown in Figure 1.

In microwave dark room, with tested wireless data card be inserted into be put on the turntable in the notebook after, close the door in darkroom, shield fully with the environment in the external world and to separate, anolog base station---comprehensive test instrument output port is connected to calls out antenna (being called for short antenna B), B makes a call to measured piece by antenna, behind the access success, radiation dispersion is accepted system and is connected to and accepts antenna (be called for short antenna A), begin to accept the spurious signal that measured piece (being called for short EUT) sends by antenna A, antenna A can receive all electromagnetic signals of 30MHz-1000MHz, and all signals that it will receive are passed to radiation dispersion and accepted system's rearmost end---frequency spectrograph, can keep by peak value on the frequency spectrograph.After receiving antenna was started working, the turntable at measured piece place was just started working, and antenna A and keeps peak value constantly with the Refresh Data that receives in the turntable rotating process.After measured piece rotates a circle, antenna A will raise 1 meter and test one time again, because the position when just beginning is and measured piece the same high (1 meter apart from ground) on the turntable, total at last the peak value after twice rotation is shown, is exactly the final radiation dispersion test result of measured data card.

For most data card manufacturer, to build a microwave dark room and add testing tool, its appropriate litigation fees is high, reaches ten million Renminbi, and is unrealistic.At present the method taked of data card manufacturing firm is: 1. the darkroom and the instrument of leasing other party to unit with good conditionsi tested.2. arrive the mechanism for testing test of specialty.Run into the defective product (the most of products once probability by test are very little) that needs debugging of index test.The slip-stick artist of producer often will take the darkroom for a long time and test while debugging, and its process of producer length consuming time is made in blocking for data, and efficient is low, the expense height.

Summary of the invention

Defective and deficiency at the prior art existence, the invention provides a kind of radio data card radiation stray frequency point test method, can finish the radio data card radiation stray frequency point test that needs expensive microwave dark room environment just can finish originally by screened room environment cheaply.

In order to reach the foregoing invention purpose, radio data card radiation stray frequency point test method of the present invention may further comprise the steps:

(1) notebook computer that will be inserted with the testing data card is put into screened room, starts the testing data card;

(2) establish a communications link with a comprehensive tester and described testing data card;

(3) connect a near field electric wave with spectrum analyzer and accept little probe, described near field electric wave is accepted little probe and is close to the placement of testing data card;

(4) described spectrum analyzer is accepted the radiation dispersion energy that little probe receives the testing data card by the near field electric wave.

Wherein, the testing data cartoon is crossed in the PCMCIA slot that the PCMCIA-PCMCIA card extender is connected notebook computer in the step (1).

In the above-mentioned radio data card radiation stray frequency point test method, it is magnetic flux loop or electric current loop that described near field electric wave is accepted little probe.

In the above-mentioned radio data card radiation stray frequency point test method, described near field electric wave is accepted little probe front end and is connected with partiting dc capacitor.

In the above-mentioned radio data card radiation stray frequency point test method, step (4) intermediate frequency spectrum analyser receives before the radiation dispersion energy of testing data card, be provided with and measure bandwidth for beginning frequency 30Mhz, cutoff frequency 1000Mhz, the RBW of described spectrum analyzer, VBW, decay, datum are set to automatically.

The present invention can avoid before formal radiation dispersion authentication test producer frequent lease microwave dark room and meter specially goes test, debugging radiation dispersion index, save up to ten million this part fund of building microwave dark room of cost. test, the debugging enironment of a practicality are provided, reduce expenses to enterprise, provide convenience to the slip-stick artist, shorten product development cycle.

Description of drawings

Fig. 1 is a radiation dispersion test environment synoptic diagram in the microwave no reflection events darkroom;

Fig. 2 connects the helical antenna synoptic diagram for comprehensive tester;

Fig. 3 is connected to the notebook synoptic diagram for data card by the PCMCIA-PCMCIA card extender;

Fig. 4 is that comprehensive tester links synoptic diagram with data card foundation calling;

Fig. 5 accepts little probe for the near field electric wave and connects high precision spectrum analyzer synoptic diagram;

Fig. 6 accepts little scanning probe data card synoptic diagram for the near field electric wave;

Fig. 7 is for accepting the radiation dispersion system schematic that little probe connects high precision spectrum analyzer test data card with the near field electric wave in the screened room;

Fig. 8 current element coordinate system.

Embodiment

The present invention is described in further detail below in conjunction with accompanying drawing:

Before providing concrete test procedure, the electromagnetic field equation that at first provides current element is done aid illustration:

Current element is that one of basic radiating element (also claims electric Hertz antenna or electric dipole, it is the short lead that one section two ends that are loaded with high-frequency current has equivalent heterocharge, diameter of wire d＜＜l (l is a conductor length), l＜＜λ, electric current flows along axis on the line, constant amplitude homophase along the line, the relation of electric charge and electric current satisfies continuity equation).The coordinate system of current element is as shown in Figure 8:

The magnetic field and the electric field equation of current element are as follows:

$\left\{\begin{array}{c}{H}_r=0\\ H_{\mathrm{\θ}}=0\\ H_{\mathrm{\φ}}=j\frac{\mathrm{Il}}{2\mathrm{\λr}}\sin \mathrm{\θ}(1+\frac{1}{\mathrm{jkr}})e^{-\mathrm{jkr}}\end{array}\right.$ (formula 1)

$\left\{\begin{array}{c}{E}_r=\frac{\mathrm{WIl}}{{2\mathrm{\πr}}^2}\cos \mathrm{\θ}(1+\frac{1}{\mathrm{jkr}})e^{-\mathrm{jkr}}\\ E_{\mathrm{\θ}}=j\frac{\mathrm{WIl}}{{2\mathrm{\πr}}^2}\sin \mathrm{\θ}[1+\frac{1}{\mathrm{jkr}}+\frac{1}{{\left(\mathrm{jkr}\right)}^2}]e^{-\mathrm{jkr}}\\ E_{\mathrm{\φ}}=0\end{array}\right.$ (formula 2)

In the formula $W=\sqrt{\mathrm{\μ}/\mathrm{\ϵ}}$ ---the wave impedance of medium.The magnetic permeability of μ---medium, the specific inductive capacity of ε---medium; $k=2\frac{\mathrm{\π}}{\mathrm{\λ}}$ K---electromagnetic phase constant; I---strength of current; λ---electromagnetic wavelength;

Each component of electromagnetic field all reduces with the increase of r, and the every speed that reduces with the increase of r in each component is inequality, if carry out subregion by the size of r, then the electromagnetic field in each district can have different approximate expressions.

1, near field (induction field) district

When kr＜＜1, electromagnetic field is mainly by r ^-2Or r ^-3Higher order term decision, again because e ^-jkr≈ 1, and formula (1) and formula (2) become:

$\left\{\begin{array}{c}{E}_r\≈-j\frac{\mathrm{Il}}{{4\mathrm{\πr}}^3}\frac{2}{\mathrm{\ω\ϵ}}\cos \mathrm{\θ}\\ E_{\mathrm{\θ}}\≈-j\frac{\mathrm{Il}}{{4\mathrm{\πr}}^3}\frac{1}{\mathrm{\ω\ϵ}}\sin \mathrm{\θ}\\ H_{\mathrm{\φ}}\≈\frac{\mathrm{Il}}{{4\mathrm{\πr}}^2}\sin \mathrm{\θ}\end{array}\right.$ (formula 3)

2, far field (radiation field) district

As kr〉〉 1 the time, the electromagnetic field of current element is mainly by r ^-1The item decision, so:

$\left\{\begin{array}{c}{E}_{\mathrm{\θ}}\≈j\frac{\mathrm{WIl}}{2\mathrm{\λr}}\sin \left(\mathrm{\θ}\right)e^{-\mathrm{jkr}}\\ H_{\mathrm{\φ}}\≈j\frac{\mathrm{Il}}{2\mathrm{\λr}}\sin \left(\mathrm{\θ}\right)e^{-\mathrm{jkr}}\end{array}\right.$ (formula 4)

From top formula (1), (2), (3), (4) as can be seen, whole electromagnetic field near/the far field transfer process in the middle of, variation be electromagnetic amplitude and phase place, and the electromagnetic frequency of being propagated is constant, according to this principle, if the far field accept frequency f is arranged on the antenna plane, then at radiation source point place frequency must be arranged is the oscillating electromagnetic wave of f.

So the present invention will accept far field, the antenna surface place induction level of measured data card radiation dispersion value according to the mutual transformational relation equivalence of the near-field of following formula one-tenth near field induction level, so just avoided at ordinary times at the antenna surface place far field induced electricity of testing measured data card radiation dispersion value, must use the problem in microwave no reflection events darkroom, can in common screened room, accept little probe and approach the measured data card to accept the near field induction level of measured data card radiation dispersion value with a near field electric wave, again the high-frequency current component of sensing on the little probe is transferred on the high precision spectrum analyzer, the equivalent analysis data card is in the radiation stray frequency point distribution situation in far field from the spectrum analyzer, give product in formal authentication test prerequisite for believable assessment test.

With embodiment the present invention is described in further detail with reference to the accompanying drawings below:

As shown in Figure 2, will couple together with the corresponding to helical antenna of data card working frequency range with radio-frequency cable at the output/inbound port of comprehensive tester and constitute a virtual base station, in order to carry out analogue communication with the data card that is connected on the notebook computer.

The concrete method of attachment of notebook and data card as shown in Figure 3, be connected to the data card that is prepared for doing test in the PCMCIA slot of notebook by a PCMCIA-PCMCIA card extender, during concrete the connection, can earlier data card be inserted into PCMCIA slot one end of card extender, again card extender and data card be inserted in the associated socket of notebook together; Also can be inserted into card extender in the notebook earlier, again data card be inserted.The order of plug does not influence final test result.Data card is inserted in the PCMCIA slot of notebook (rather than directly being inserted in the PCMCIA slot of notebook) by the PCMCIA-PCMCIA card extender, mainly is to consider to accept the spuious energy usefulness of little probe coupling received radiation for two big planes up and down of data card are exposed to the open air out for the near field electric wave.

Anolog base station-comprehensive tester and measured data card are set up the mode that links as shown in Figure 4, comprehensive tester, measured data card are placed in certain position, stationkeeping is not well just moved later on again, can have influence on the setting of comprehensive tester space Insertion Loss like this, rational Insertion Loss value is set on comprehensive tester, allow the program run of data card then, data card is set up with comprehensive tester and is linked, and comprehensive tester order data card is with maximum transmission power work.

The connected mode that the near field electric wave is accepted little probe and high precision spectrum analyzer as shown in Figure 5.In this device, the near field electric wave is accepted little probe and is used for the data of image data card, and the high precision spectrum analyzer is used for handling the near field electric wave and accepts the data card signal that little probe is gathered.The kind that the near field electric wave receives little probe can be little magnetic flux loop, also can be that little electric current loop (doing coupling reception data uses) receives data as the method with conduction, and the front end of then little probe also will weld a partiting dc capacitor, with the protection frequency spectrograph).Don't work, which kind of does not influence final testing result. be connected by radio-frequency cable between frequency spectrograph and the little probe. open high precision spectrum analyzer FSQ, the measurement bandwidth is set to be set to automatically for beginning frequency 30MHz, the RBW by frequency 1000MHz, frequency spectrograph, VBW, decay, datum, frequency spectrograph is set to peak value and keeps preparation for acquiring, deal with data.

Fig. 7 is the proving installation overall schematic among the present invention.Accept the radiation stray frequency point that little probe connects high precision spectrum analyzer test data card with the near field electric wave in the screened room.In whole device, the effect of screened room is quite important, and it can all mask the interference frequency in the external world, guarantees the correctness of test data.

As shown in Figure 6, after the test beginning, accepting pro and con that little probe is close to the measured data card with the near field electric wave lines by line scan respectively according to the direction that the minor face of data card external form geometric surface parallels, probe passes through the spuious high-frequency energy of mode received radiation of coupling/conduction, until affirmation the All Ranges of pros and cons is all swept and is gone over.Test result is shown on the frequency spectrograph the most at last.The whole tests of radiation stray frequency point that so just this measured data are stuck on the 30-1000MHz frequency range finish.

Adopt the method for the invention, compare with existing result in the test of microwave no reflection events darkroom, the result who records under two kinds of environment is very identical, what record is spuious consistent, very favourable to the defective situation of debugging that needs of the radiation dispersion index of data card, the slip-stick artist can (most data card manufacturing firm all be furnished with the screened room of oneself at the screened room of own enterprise, the expense of generally building screened room is about 200,000 Renminbi, be significantly less than the cost of building microwave dark room 10,000,000 Renminbi) in the radiation dispersion index of data card carried out index know the real situation, debugging, and need not do debugging to the microwave dark room or the testing agency of specialty to product again.Improved work efficiency, for enterprise has saved debugging cost.

Method described in the present invention also is suitable for the test with radiation continuous disturbance index.

Claims (5)

1, a kind of radio data card radiation stray frequency point test method is characterized in that: may further comprise the steps:

Step 1, the notebook computer that will be inserted with the testing data card are put into screened room, start the testing data card;

Step 2, establish a communications link with a comprehensive tester and described testing data card;

Step 3, connect a near field electric wave with spectrum analyzer and accept little probe, described near field electric wave is accepted little probe and is close to the testing data card and places;

Step 4, described spectrum analyzer are accepted the radiation dispersion energy that little probe receives the testing data card by the near field electric wave.

2, radio data card radiation stray frequency point test method according to claim 1 is characterized in that: the testing data cartoon is crossed in the PCMCIA slot that the PCMCIA-PCMCIA card extender is connected notebook computer in the step 1.

3, radio data card radiation stray frequency point test method according to claim 1 is characterized in that: it is magnetic flux loop or electric current loop that described near field electric wave is accepted little probe.

4, radio data card radiation stray frequency point test method according to claim 3 is characterized in that: described near field electric wave is accepted little probe front end and is connected with partiting dc capacitor.

5, radio data card radiation stray frequency point test method according to claim 1, it is characterized in that: step 4 intermediate frequency spectrum analyser receives before the radiation dispersion energy of testing data card, be provided with and measure bandwidth for beginning frequency 30Mhz, cutoff frequency 1000Mhz, the analysis bandwidth RBW of described spectrum analyzer, demonstration bandwidth VBW, decay, datum are set to automatically.

Images