CN100494986C - Specular gloss predication device, specular gloss predication method, control program for specular gloss predication device and medium - Google Patents

Abstract

The present invention realizes a specular gloss simulation device which can accurately simulate, by using a Bidirectional Reflectance Distribution Function, specular glossiness of an image even if the image has a low density and low gloss. A specular gloss simulation device according to the present invention is for simulating specular glossiness by simulating a specular reflection light amount in each (other) geometry from a luminance measured in a given geometry of a sample having a base material and a colorant material layer formed on the base material. A specular gloss simulation device 100 is provided with a lower layer reflection light component calculating section 111 for calculating a lower layer reflection light component, which is reflected on a base material and travels through and out of a color layer, an internal reflection light component creating section 112 for creating an internal reflection light component, which is reflected from an interior of the colorant material layer, a surface reflection light component creating section 113 for creating a surface reflection light component, which is reflected on a surface of the colorant material layer, and a specular reflection light amount calculating section 114 for obtaining a specular reflection light amount of the sample by adding up the components thus created by each section.

Description

Bright luster prediction unit, bright luster Forecasting Methodology, control program and medium

Technical field

The present invention relates to the control program of bright luster prediction unit, bright luster Forecasting Methodology, bright luster prediction unit and the recording medium that has write down this control program, to passing through mode of printings such as electronic photo mode, ink-jetting style, perhaps the mirror surface luster of the image of mode of printing such as hectographic printing, letterpress formation is predicted.

Background technology

As one of texture assessment item of the image pattern of making by the whole bag of tricks, glossy.Generally, this gloss geometric system (geometry of environment according to the observation; The position relation of light source, sample (following the simple note of image pattern is made sample), optical receiver) differs widely, along with the zenith angle angle 1 of as shown in Figure 2 light source incident direction and the zenith angle angle 2 of light-receiving direction increase, the people feels reflecting feel strongly.For reflecting feel is estimated as quantitative glossiness, at present, in the mirror surface luster meter, as combination, use the limited structure (JIS Z 8741) of multiple classes such as 45 ° or 60 ° to the zenith angle angle 2 of the zenith angle angle 1 of the light source incident direction of sample 3 and light-receiving direction.This structure in JIS (Japanese Industrial Standards, Japanese Industrial Standards) etc. by standardization.

But, in the method,, can't obtain being used to estimate the sufficient quantitative data of drift angle reflection characteristic though can obtain becoming the glossiness of a standard index.In order to address this problem,, can obtain the quantitative data of drift angle reflection characteristic in drift angle spectral photometric colour measuring system (goniophotospectrometer, angle measurement spectrometer) that paint industry etc. uses etc.But, use the minute of quantitative mensuration of this drift angle spectral photometric colour measuring system very long, sample shape also is defined, therefore can not be practical.

In addition, in recent years, in remote sensing (remote sensing) field, extensively carry out bidirectional reflectance angle dependence characteristic (BRDF:Bidirectional Reflectance Distribution Function, the amphicheirality is reflected distribution function) research, they all are based on the thinking that the bitintability reflection model theory (reference literature 1) of Shafer is carried out.In bitintability reflection model theory, as shown in Figure 3, constitute by two components that are called surface reflection (surface reflection light component) 4 and internal reflected light (internal reflection light component) 5 from the reflected light of body surface.Surface reflection 4 be because the refractive index of sample 3 and air is different at the light of the surface reflection of sample 3, have the color of light source 6.The light that enters sample 3 inside repeats refraction, absorption, scattering between pigment particles 3A.At this moment, depend on wavelength, light is absorbed by pigment particles 3A, therefore as having the color of sample 3 from the catoptrical internal reflected light 5 of sample 3.BRDF divides into various suggestion models according to purpose and uses.

As the method for estimating the drift angle reflection characteristic, in document 2, use BRDF prediction direct reflection light quantity, also can have geometric system (geometry) glossiness prediction in addition now.

But in said method, the direct reflection light quantity that Grossmeters receives only is thought of as the surface reflection light component of the sample of bitintability reflection model theory, and calculates mirror surface luster according to BRDF.Therefore, in the image that generates the high glaze that constitutes by the high concentration colorant, can ignore the internal reflection light component of bitintability reflection model theory or from the reflected light component of the substrate of colorant layer, but under the situation of the light image of colorant concentration, can not ignore lower floor's reflected light component, in addition, under the situation of the image of low gloss, the internal reflection light component can not be ignored, correct value can not be calculated.

(document 1) COLOR Research and application, Vol.10, No.4, pp.210-218,1985

(document 2) Japanese publication communique spy opened the 2003-329586 communique (open day: on November 19th, 2003)

Summary of the invention

The present invention puts in view of the above problems and finishes, its purpose is, even in the image of light image of concentration or low gloss, also can realize predicting exactly bright luster prediction unit, the bright luster Forecasting Methodology of mirror surface luster by the bitintability reflection model.

In order to solve above-mentioned problem, bright luster prediction unit of the present invention is measured the brightness value in the geometric system of regulation of the test portion that is made of base material and the colorant layer that forms on above-mentioned base material, and predict direct reflection light quantity in other the geometric system according to this measurement result, thereby prediction mirror surface luster, it is characterized in that, it comprises: lower floor's reflected light component generating unit, only, calculate the lower floor's reflected light component that reflects and reflect by above-mentioned base material through above-mentioned colorant layer based on the brightness value of above-mentioned base material determined in a plurality of geometric systems; Internal reflection light component generating unit is measured the brightness value of test portion in the geometric system of regulation, and the internal reflection light component that is created on the internal reflection of above-mentioned colorant layer based on the brightness value of measuring and above-mentioned lower floor reflected light component; Surface reflection light component generating unit, in the regulation geometric system different, measure the brightness value of test portion, and generate surface reflection light component by the surface reflection of above-mentioned colorant layer based on brightness value, above-mentioned lower floor reflected light component and the above-mentioned internal reflection light component measured with above-mentioned geometric system; And direct reflection light quantity calculating part, based on the direct reflection light quantity of asking test portion by each component of above-mentioned lower floor reflected light component generating unit, above-mentioned internal reflection light component generating unit and the generation of above-mentioned surface reflection light component generating unit.

In addition, in order to solve above-mentioned problem, other bright luster prediction unit of the present invention is predicted the direct reflection light quantity in other the geometric system based on the brightness value of measuring in the geometric system of the regulation of the test portion that is made of base material and the colorant layer that forms on above-mentioned base material, thereby prediction mirror surface luster, it is characterized in that, it comprises: lower floor's reflected light component generating unit, only, calculate the lower floor's reflected light component that reflects and reflect by above-mentioned base material through above-mentioned colorant layer based on the brightness value of above-mentioned base material determined in a plurality of geometric systems; Internal reflection light component generating unit based on brightness value and the above-mentioned lower floor reflected light component of measuring test portion in the geometric system of regulation, is created on the internal reflection light component of the internal reflection of above-mentioned colorant layer; Surface reflection light component generating unit is based on the brightness value of measuring test portion in the geometric system of regulation, above-mentioned lower floor reflected light component and the generation of the above-mentioned internal reflection light component surface reflection light component by the surface reflection of above-mentioned colorant layer; And direct reflection light quantity calculating part, based on the direct reflection light quantity of asking test portion by each component of above-mentioned lower floor reflected light component generating unit, above-mentioned internal reflection light component generating unit and the generation of above-mentioned surface reflection light component generating unit.

According to said structure, not only consider the surface reflection light component, also consider lower floor's reflected light component and internal reflection light component, more effectively make full use of the bitintability reflection model and ask the direct reflection light quantity of test portion, thereby prediction mirror surface luster, therefore even in the image pattern of image pattern that can not calculate the low concentration of value accurately and low gloss, also can estimate mirror surface luster accurately in the past.

In order to solve above-mentioned problem, bright luster prediction unit of the present invention, the brightness value of in the geometric system of the regulation of the test portion that constitutes by base material and the colorant layer that comprises pigment particles that on above-mentioned base material, forms, measuring, predict the direct reflection light quantity of the test portion in other the geometric system, thereby prediction mirror surface luster, it is characterized in that, it comprises: lower floor's reflected light component generating unit, only calculate in the geometric system of afore mentioned rules and above-mentioned other the geometric system based on the brightness value of above-mentioned base material determined in a plurality of geometric systems, reflect and see through lower floor's reflected light component of above-mentioned colorant layer reflection by above-mentioned base material; Upper strata reflected light component generating unit, lower floor's reflected light component in the geometric system of the afore mentioned rules that calculates based on the brightness value of the test portion of in the geometric system of afore mentioned rules, measuring and above-mentioned lower floor reflected light component generating unit, calculates in above-mentioned other the geometric system, in above-mentioned colorant layer, comprise scattering between pigment particles and the pigment particles reflected light component that reflects by the scattered reflection light component of radiation, by above-mentioned pigment particles and by the surface reflection light component of the surface reflection of above-mentioned colorant layer; And direct reflection light quantity calculating part, based on each component in above-mentioned other the geometric system that calculates by above-mentioned lower floor reflected light component generating unit and above-mentioned upper strata reflected light component generating unit, calculate the direct reflection light quantity of the test portion in above-mentioned other the geometric system.

According to said structure, not only consider the surface reflection light component in the colorant layer, also consider lower floor's reflected light component and scattered reflection light component in the colorant layer and pigment particles reflected light component in the base material, more effectively make full use of the bitintability reflection model and ask the direct reflection light quantity of test portion, thus the prediction mirror surface luster.Therefore, even in the image pattern of image pattern that can not calculate the low concentration of value accurately and low gloss, also can estimate mirror surface luster accurately in the past.

In order to solve above-mentioned problem, bright luster Forecasting Methodology of the present invention, thereby the direct reflection light quantity prediction mirror surface luster of the test portion that constitutes by base material and the colorant layer that on above-mentioned base material, forms by prediction, it is characterized in that, this method comprises: lower floor's reflected light component generates step, make light source incident angle and light-receiving angle in a plurality of geometric systems of certain angle change, only measure the brightness value of above-mentioned base material, and calculate above-mentioned base material reflection and see through lower floor's reflected light component that above-mentioned colorant layer reflects based on the brightness value of measuring; The internal reflection light component generates step, in a non-mirror reflection geometric system, measure the brightness value of test portion, after the internal reflection light component that calculates based on the brightness value of having measured and above-mentioned lower floor reflected light component in the internal reflection of above-mentioned colorant layer, use the bitintability reflection model to predict internal reflection light component in other the geometric system; The surface reflection light component generates step, in a direct reflection geometric system, measure the brightness value of test portion, after the surface reflection light component that calculates based on brightness value, above-mentioned lower floor reflected light component and the above-mentioned internal reflection light component measured by the surface reflection of above-mentioned colorant layer, use the bitintability reflection model to predict surface reflection light component in other the direct reflection geometric system; And direct reflection light quantity calculation procedure, ask the direct reflection light quantity of test portion based on the lower floor's reflected light component that obtains by above steps, internal reflection light component and surface reflection light component.

Bright luster Forecasting Methodology of the present invention uses the bitintability reflection model to predict on base materials such as paper or OHP film the bright luster component of whole geometric systems that has formed the test portion of the colorant layer that comprises toner, paint ink, dye ink etc. as sample image.

According to said method, not only consider the surface reflection light component, also consider lower floor's reflected light component and internal reflection light component, use the bitintability reflection model to ask the bright luster component of test portion, therefore even in the image pattern of image pattern that can not calculate the low concentration of value accurately and low gloss, also can calculate the bright luster component accurately in the past.

In order to solve above-mentioned problem, the brightness value that bright luster Forecasting Methodology of the present invention is measured in the geometric system of the regulation of the test portion that is made of base material and the colorant layer that comprises pigment particles that forms on above-mentioned base material is predicted the direct reflection light quantity of the test portion in other the geometric system, thereby prediction mirror surface luster, it is characterized in that, this method comprises: lower floor's reflected light component generates step, only based on the brightness value of above-mentioned base material determined in a plurality of geometric systems, respectively in the geometric system of computational rules and above-mentioned other the geometric system, reflect and see through lower floor's reflected light component of above-mentioned colorant layer reflection by above-mentioned base material; The upper strata reflected light component generates step, generate above-mentioned lower floor reflected light component in the geometric system of the afore mentioned rules that calculates in the step based on the brightness value of the test portion of in the geometric system of afore mentioned rules, measuring and in above-mentioned lower floor reflected light component, calculates in above-mentioned other the geometric system, in above-mentioned colorant layer, comprise scattering between pigment particles and the pigment particles reflected light component that reflects by the scattered reflection light component of radiation, by above-mentioned pigment particles and by the surface reflection light component of the surface reflection of above-mentioned colorant layer; And direct reflection light quantity calculation procedure, based on generating the lower floor's reflected light component in above-mentioned other the geometric system that calculates in the step in above-mentioned lower floor reflected light component and generating each component that calculates in the step, calculate the direct reflection light quantity of the test portion in above-mentioned other the geometric system in above-mentioned upper strata reflected light component.

According to said method, not only consider the surface reflection light component in the colorant layer, also consider lower floor's reflected light component and scattered reflection light component in the colorant layer and pigment particles reflected light component in the base material, more effectively make full use of the bright luster component that the bitintability reflection model is asked test portion.Therefore, even in the image pattern of image pattern that can not calculate the low concentration of value accurately and low gloss, also can estimate the bright luster component accurately in the past.

Other purpose of the present invention, feature and advantage can be fully clear by record shown below.In addition, advantage of the present invention can be understood by the following explanation with reference to accompanying drawing.

Description of drawings

Fig. 1 is the block scheme of structure of the bright luster prediction unit of expression embodiments of the present invention 1.

Fig. 2 is the synoptic diagram of expression direct reflection geometric system.

Fig. 3 is the synoptic diagram that is used to illustrate bitintability reflection model theory.

Fig. 4 is the synoptic diagram that is illustrated in the dividing method of the reflected light component that has double-deck test portion in the embodiment 1.

Fig. 5 is the synoptic diagram of the geometry configuration in the expression BRDF model.

Fig. 6 is the synoptic diagram of the geometric definition of the body surface in the expression BRDF model.

Fig. 7 is concept nature is illustrated in the embodiment 1 decay of the refraction effect of the light of considering and light quantity when calculating lower floor's reflected light component a synoptic diagram.

Fig. 8 is the process flow diagram of flow process of the processing of the measured value of the brightness in the geometric system that is illustrated in the embodiment 1 according to the rules direct reflection light component that calculates all geometric systems.

Fig. 9 is the synoptic diagram that is illustrated in a routine input picture data that shows in the display part of bright luster prediction unit shown in Figure 1.

Figure 10 is another the routine synoptic diagram that is illustrated in data presented input picture in the display part of bright luster prediction unit shown in Figure 1.

Figure 11 is the synoptic diagram that is illustrated in the picture of a routine measurement result that shows in the display part of bright luster prediction unit shown in Figure 1.

Figure 12 is the block scheme of structure of the computer system of the function of expression with bright luster prediction unit shown in Figure 1.

Figure 13 is the process flow diagram of the treatment scheme of the measured value of the brightness in the geometric system that is illustrated in the embodiment 2 according to the rules direct reflection light component that calculates all direct reflection geometric systems.

Figure 14 is the synoptic diagram that is illustrated in the dividing method of the reflected light component that has double-deck test portion in the embodiment 2.

Figure 15 is concept nature is illustrated in the embodiment 2 decay of the refraction effect of the light of considering and light quantity when calculating lower floor's reflected light component a synoptic diagram.

Figure 16 is the block scheme of structure of the bright luster prediction unit of expression embodiments of the present invention 2.

Figure 17 is the synoptic diagram of the routine input picture data that shows in the display part of expression bright luster prediction unit shown in Figure 16.

Figure 18 is another routine synoptic diagram of data presented input picture in the display part of expression bright luster prediction unit shown in Figure 16.

Figure 19 is the synoptic diagram of example of the picture of the measurement result that shows in the display part of expression bright luster prediction unit shown in Figure 16.

Figure 20 (a) is the result's of expression embodiment 1 (using the bright luster prediction of high concentration toner sample) a curve map, and Figure 20 (b) is the result's of expression embodiment 2 (using the bright luster prediction of low concentration toner sample) a curve map.

Figure 21 (a) and Figure 21 (b) are the result's of expression embodiment 3 curve maps.

Figure 22 (a) is the result's of expression embodiment 4 (using the bright luster prediction of high concentration toner sample) a curve map, and Figure 22 (b) is the result's of expression embodiment 5 (using the bright luster prediction of low concentration toner sample) a curve map.

Figure 23 (a) and Figure 23 (b) are the result's of expression embodiment 6 curve maps.

Figure 24 is illustrated in the embodiment 3, and the measured value of the brightness in the geometric system is according to the rules calculated the process flow diagram of flow process of processing of the direct reflection light component of all geometric systems.

Figure 25 is the block scheme of structure of the bright luster prediction unit of expression embodiments of the present invention 3.

Figure 26 is the synoptic diagram of the routine input picture data that shows in the display part of expression bright luster prediction unit shown in Figure 25.

Figure 27 is another routine synoptic diagram of data presented input picture in the display part of expression bright luster prediction unit shown in Figure 25.

Figure 28 is the synoptic diagram of example of the picture of the measurement result that shows in the display part of expression bright luster prediction unit shown in Figure 25.

Figure 29 (a) is the result's of expression embodiment 7 (using the bright luster prediction of high concentration toner sample) a curve map, and Figure 29 (b) is the result's of expression embodiment 8 (using the bright luster prediction of low concentration toner sample) a curve map.

Figure 30 (a) and Figure 30 (b) are the result's of expression embodiment 9 curve maps.

Embodiment

[embodiment 1]

Based on Fig. 1 to Figure 12 first embodiment of the present invention is described as follows.In the present embodiment, illustrate to measure and on paper (base material), formed (in the incident angle of regulation and the light-receiving angle) brightness value in the geometric system of regulation of sample (test portion) of toner image (colorant layer) by the electronic photo mode, predict the direct reflection light quantity in other the geometric system according to this measurement result, thus the bright luster prediction unit of prediction mirror surface luster.In addition,,, select a direct reflection geometric system and a non-mirror reflection geometric system, measure their drift angle brightness value as above-mentioned specific geometric system in present embodiment.

Bitintability reflection (BRDF) model theory of using in the prediction of the mirror surface luster of sample at first, is described in the bright luster prediction unit of present embodiment.In addition,, the method for using above-mentioned BRDF model under calculating has the situation of reflected light component of double-deck test portion of base material and colorant layer is described here.

Fig. 4 schematically represents to have the dividing method of the reflected light component of double-deck test portion.As shown in Figure 4, sample 3 comprises by the top section 13 of toner image (colorant layer) formation with by seeing through the underclad portion 12 that film base materials such as (film) constitutes.According to bitintability reflection (BRDF) model theory, as each reflected light component from light source 6, enumerate from the surface reflection light component (Lrs) 7 of top section 13 and internal reflection light component (Lri) 8, from the surface reflection light component 9 and the internal reflection light component 10 of underclad portion 12, these complex light are the reflected light from sample 3.For by each reflected light component 7～10 of BRDF Model Calculation, need to estimate a plurality of as undeterminable parameter (parameter).

But, owing to be difficult to measure internal reflection component 10 from underclad portion 12, therefore among the present invention, will consider as compound and reflected light component from the surface reflection light component 9 and the internal reflection light component 10 of underclad portion 12, and handle as lower floor's reflected light component (Lru) 11.By calculating this lower floor's reflected light component 11, thereby realize by the light quantity of direct reflection accurately in the various image patterns of BRDF Model Calculation based on the measured data of underclad portion 12 only.Thus, if calculating then can obtain direct reflection light quantity accurately from surface reflection light component 7, internal reflection light component 8 and lower floor's reflected light component 11 of top section 13.

In the present invention, can enumerate the model shown in following (1)～(4) etc. as the effective BRDF pattern of calculating formula model that is used to calculate each reflected light component.

(1) Ward model

List of references: Ward G.J., Measuring and modeling anisotropic reflection, Computer Graphics Vol.26, No.2, pp.265-272,1992.

(2) Phong model

List of references: B.Phong, Illumination for computer-generated pictures, Communications of the ACM, Vol.18, No.6, pp.311-317,1975.

(3) Oren-Nayar model

List of references: Michael Oren and Shree K.Nayer, Generlization of theLambertian Model and Implications for Machine Vision, International Journal ofComputerVision, Vol.14, pp.227-251,1995.

(4) Torrance-Sparrow model

List of references: K.E.Torrance and E.M.Sparrow, Theory for Off-SpecularReflection From Roughened Surfaces, J.Opt.Soc.Am.Vol.57, No.9, pp.1105-1114,1967.

In above-mentioned each calculating formula model, be that the model that prerequisite is advised is Ward model, Phong model with the isotropic scatterning of light, what be that prerequisite carried out motion with the non-isotropy scattering of light is Oren-Nayar model, Torrance-Sparrow model.Though calculating formula complexity, but can calculate value accurately owing to comprise the method for the non-isotropy scattering of light, therefore in present embodiment, use the Torrance-Sparrow model as the calculating formula model that is used for gauging surface reflected light component 7, use the Open-Nayar model as the calculating formula model that is used to calculate internal reflection light component 8.

In addition, Fig. 5 represents the geometry configuration in the BRDF model, in Fig. 6, and the geometric definition of the body surface in the expression BRDF model.In addition, only illustrate direct reflection geometric system (in Fig. 5, θ i=θ r, r=180 ° of φ i+ φ) for Fig. 2, Fig. 5 diagram is from multi-angle geometric system (the multi-angle geometry of the three-dimensional of xyz axle performance; The general geometric system that comprises the direct reflection geometric system).The approximate model of the sample surface that proposes when in addition, Fig. 6 is illustrated in Oren-Nayar model and Torrance-Sparrow model with the non-isotropy scattering model of light.Here, think that the test portion air spots is smooth, concavo-convexly constitute by small.As the set on so small plane, consider that relief effect and steric hindrance show reflecting brightness.

Under the situation with Oren-Nayar Model Calculation internal reflection light component Lri, at first, calculate Oren-Nayar Model Calculation value LrON by following formula (1).

(formula 1)

$\mathrm{LrON}=\frac{\mathrm{\&sigma;}}{\mathrm{\&pi;}}\mathrm{<figure-callout\; id="0"\; label="E"\; filenames="C200510118742E00811.png,C200510118742E00821.png"\; state="\{\{state\}\}">E</figure-callout>}0\cos \mathrm{\&theta;i}[C1\left(\mathrm{\&sigma;}\right)+\cos (\mathrm{\&phi;r}-\mathrm{\&phi;i})C2(\mathrm{\&alpha;};\mathrm{\&beta;};\mathrm{\&phi;r}-\mathrm{\&phi;i};\mathrm{\&sigma;})\tan \mathrm{\&beta;})$

$+(1-\left|\cos (\mathrm{\&phi;r}-\mathrm{\&phi;i})\right|)C3(\mathrm{\&alpha;};\mathrm{\&beta;};\mathrm{\&sigma;})\tan \left(\frac{\mathrm{\&alpha;}+\mathrm{\&beta;}}{2}\right)$

$+0.17\frac{{\mathrm{\&rho;}}^2}{\mathrm{\&pi;}}\mathrm{<figure-callout\; id="0"\; label="E"\; filenames="C200510118742E00811.png,C200510118742E00821.png"\; state="\{\{state\}\}">E</figure-callout>}0\cos \mathrm{\&theta;i}\frac{{\mathrm{\&sigma;}}^2}{{\mathrm{\&sigma;}}^2+0.13}[1-\cos (\mathrm{\&phi;r}-\mathrm{\&phi;i}){\left(\frac{2\mathrm{\&beta;}}{\mathrm{\&pi;}}\right)}^2]$

$\mathrm{<figure-callout\; id="1"\; label="C"\; filenames="C200510118742E00701.png,C200510118742E00731.png"\; state="\{\{state\}\}">C</figure-callout>}1=1-0.5\frac{{\mathrm{\&sigma;}}^2}{{\mathrm{\&sigma;}}^2+0.33}\&CenterDot;\&CenterDot;\&CenterDot;\&CenterDot;\left(1\right)$

$\mathrm{<figure-callout\; id="3"\; label="C"\; filenames="C200510118742E00692.png,C200510118742E00701.png"\; state="\{\{state\}\}">C</figure-callout>}3=0.125\left(\frac{{\mathrm{\&sigma;}}^2}{{\mathrm{\&sigma;}}^2+0.09}\right){\left(\frac{4\mathrm{\&alpha;\&beta;}}{{\mathrm{\&pi;}}^2}\right)}^2$

In above-mentioned formula, θ i is the zenith angle of light source direction, and φ i is the position angle of light source direction, and θ r is the zenith angle of light-receiving direction, φ r is the position angle of light-receiving direction, σ is the roughness variable of surface configuration, and E0 is the radiant illumination to sample incident, and ρ is small a reflectivity of sample surface, α=max[θ r, θ i], β=min[θ r, θ i] (with reference to Fig. 5, Fig. 6).

In addition, under the situation of using Torrance-Sparrow Model Calculation surface reflection light component Lrs, at first calculate Torrance-Sparrow Model Calculation value LrTS by following formula (2).

(formula 2)

$\mathrm{LrTS}=E0\frac{\mathrm{F\; GAF}}{\cos \mathrm{\&theta;}r\cos \mathrm{\&theta;a}}c{e}^{-\frac{{\mathrm{\&theta;a}}^2}{{2\mathrm{\&sigma;}}^2}}$

$\mathrm{GAF}=\max [0,\mathrm{Min}[1,\frac{2<s,n><a,n>}{<s,a>},\frac{2<v,n><a,n>}{<v,n>}]]\&CenterDot;\&CenterDot;\&CenterDot;\&CenterDot;\left(2\right)$

$c={\&Integral;}_{\mathrm{\&theta;a}=0}^{\frac{\mathrm{\&pi;}}{2}}{\&Integral;}_{\mathrm{\&phi;a}=0}^{2\mathrm{\&pi;}}{e}^{-\frac{{\mathrm{\&theta;a}}^2}{{2\mathrm{\&sigma;}}^2}}\sin \mathrm{\&theta;ad\&phi;ad\&theta;a}$

In above-mentioned formula, F is Fresnel (Fresnel) reflectivity, n is the normal vector of sample 3, and S is the light source direction vector, and v is the light-receiving direction vector, a is the bisection vector of s and v, θ r is the zenith angle of light-receiving direction, and θ a is the zenith angle of vector a, and φ a is the position angle of vector a, σ is the roughness variable of surface configuration, and E0 is the radiant illumination that incides sample.In addition, in above-mentioned formula,＜x, y〉inner product (with reference to Fig. 5, Fig. 6) of (x, y are several arbitrarily) expression vector.

Then, calculate the method for the direct reflection light quantity of all geometric systems with the measured value of the brightness in the said method geometric system according to the rules based on the flowchart text of Fig. 8.

At first, in order to calculate the reflected light component Lru of lower floor, only calculate the transmitance (step S1) of the top section (toner image) 13 of the sample that will calculate the direct reflection light component.The mensuration geometric system here disposes light source, sample, optical receiver point-blank.In such geometric system, directly over sample, inject light source, by be configured in sample under the light that receives of optical receiver, come instrumentation as the light that sees through sample by the penetrating concentration meter.And, by obtaining the sample that formed toner image (samples that top section 13 and underclad portion 12 constitute) and the difference of the sample of underclad portion (paper) 12 only, can obtain the only penetrating concentration Dt of top section 13, only the transmitance Tt of top section 13 (that is toner image) can pass through Tt=10^ (Dt) calculating.

In addition, for the refractive index of the top section of using in following step (toner image) 13, use is as the refractive index (literature value) of the resin of the major component of toner.Therefore in addition, in current mensuration theory, can not be determined at the refractive index of the toner layer that forms on the paper, not measure in the present embodiment, use the refractive index (literature value) that contains in the toner as the resin of principal ingredient.Even carry out practical measurement, also consider to be roughly identical value.

Then, mensuration is with top section 13 non-existent samples, the i.e. sample of underclad portion 12 only, under the situation of present embodiment, preparation is printed the paper before the toner image or is seen through film, and only the light source incident direction and the light-receiving direction of the sample of underclad portion 12 are made as high-resolution drift angle brightness value (step S2) for these.In addition,, the measured value space is made as CIE1976L here ^*a ^*b ^*(CIE:CommissionInternational de l ' Eclairage: International Commission on Illumination.L ^*: lightness, a ^*, b ^*: colourity) space, therefore adopt L ^*Value as above-mentioned drift angle brightness value.

According to the reflected light component Lru of these data computation lower floors (step S3).Fig. 7 is the synoptic diagram of the decay of the refraction effect of the light considered when representing to calculate the reflected light component Lru of lower floor of concept nature and light quantity.The light that incides sample with the angle of θ i produces refraction effect on the interface of air layer 15 and top section 13.This refraction effect is according to the Fresnel theory, and the angle θ t after the refraction finds the solution according to Fresnel rule (refractive index of medium before the incident is made as n1, when the refractive index of medium after the incident is made as n2, n1 * sin θ i=n2 * sin θ t).Because refraction effect is decayed at the interface by the light of toner layer, this Fresnel transmitance Tn is by formula (3) expression.

(formula 3)

$\mathrm{Tn}=[\left(\frac{n2\cos \mathrm{\&theta;<figure-callout\; id="1"\; label="t\; n"\; filenames="C200510118742E00701.png,C200510118742E00731.png"\; state="\{\{state\}\}">t</figure-callout>}}{n}\right){\left(\frac{2\mathrm{<figure-callout\; id="1"\; label="n"\; filenames="C200510118742E00701.png,C200510118742E00731.png"\; state="\{\{state\}\}">n</figure-callout>}1\cos \mathrm{\&theta;i}}{n2\cos \mathrm{\&theta;i}+\mathrm{<figure-callout\; id="1"\; label="n"\; filenames="C200510118742E00701.png,C200510118742E00731.png"\; state="\{\{state\}\}">n</figure-callout>}1\cos \mathrm{\&theta;t}}\right)}^2+\left(\frac{n2\cos \mathrm{\&theta;<figure-callout\; id="1"\; label="t\; n"\; filenames="C200510118742E00701.png,C200510118742E00731.png"\; state="\{\{state\}\}">t</figure-callout>}}{n}\right){\left(\frac{2\mathrm{<figure-callout\; id="1"\; label="n"\; filenames="C200510118742E00701.png,C200510118742E00731.png"\; state="\{\{state\}\}">n</figure-callout>}1\cos \mathrm{\&theta;i}}{n1\cos \mathrm{\&theta;i}+n2\cos \mathrm{\&theta;t}}\right)}^2]/2$

····(3)

In addition, when light passed through in the top section 13, light arrived underclad portion 12 then by top section 13 decay.This attenuation effect defer to the Beer-Lambert rule (absorption coefficient of colorant layer is made as a, the thickness of colorant layer is made as d, when transmitance is made as T ,-logT=a * d).Because incident angle changes, light arrives till the underclad portion 12, and light is by the optical path length variation of top section 13.Therefore,, then be-logTt '=a * (d/cos θ i) to estimate the decay of light by this lip-deep transmitance as calculating the lip-deep transmitance Tt ' corresponding with this optical path length variation.

From more than, on the basis that the incident angle to the light of underclad portion 12 changes because of refraction effect, use the lip-deep transmitance Tt ' corresponding, estimate the decay of light quantity, thereby can calculate the incident light quantity of the light that arrives underclad portion 12 with Fresnel transmitance Tn and optical path length variation.Such optical phenomena is radiated at the reflected light from underclad portion 12 under the situation of air layer and produces too.Thereby, drift angle brightness value to the sample that only constitutes by underclad portion (paper) in S2, measured, consideration is as the refraction effect of the light of above-mentioned secondary and the attenuating (with reference to Fig. 7) of light, calculate with whole incident angles and light-receiving angle, thereby can calculate the reflected light component Lru of lower floor.Here, have under the situation of the value below the radix point at the incident angle θ t after the refraction, the value of the angle before and after it is carried out proportional distribution, thereby carries out interpolation.The resolution of the angle of this moment is restriction especially not, but because the angular resolution ultimate value of determinator is 1 °, therefore is made as 1 ° here.In addition, in order to carry out the calculating of direct reflection light component more accurately, preferably the resolution of this angle is smaller or equal to 1 °.

As above such, can ask light to incide the direction of top section according to refractive index.In addition, because light is absorbed and decays in top section, so estimate this attenuation degree according to transmitance.That is, ask in the light path of refraction of air layer and top section and incident and from underclad portion (paper) reflection and once more in the light path of upper layer part and air layer refraction based on refractive index, and, estimate the decay of light by transmitance according to this light path.And, when the drift angle brightness value of the sample that will be only be made of underclad portion (paper) carries out computing (multiplying) to this value, can obtain the reflected light component Lru of lower floor.

Then, in order to calculate the internal reflection light component, in comprising a certain geometric system of surface reflection light component hardly, measure the brightness value L ra (CIE1976L of sample ^*a ^*b ^*L ^*) (step S4).This geometric system is called the non-mirror reflection geometric system.In general, because then the surface reflection light component is more little away from the geometric system of direct reflection more, therefore preferably the light source incident angle is big for the non-mirror reflection geometric system of selecting here, and the approaching geometric system of light source incoming position and light-receiving position.

In present embodiment, as an example of the geometric system of selecting here, selecting light source incident angle θ i is 45 ° (φ i is 0 °), and light-receiving angle θ r is the geometric system of-60 ° (φ r is 0 °).Remove the reflected light component Lru of lower floor that in this geometric system, calculates, and then surface reflection light component Lrs is approximately 0 remaining reflected light component as internal reflection light component Lri.For the internal reflection light component Lri that obtains like this, use the Oren-Nayar model to carry out match (fitting) (step S5).Here, ' match (fitting) ' expression is calculated unknown parameter to the internal reflection light component that calculates according to the brightness value L ra that measures in above-mentioned selecteed non-mirror reflection geometric system, so that it can use the performance of Oren-Nayar model, and ask the internal reflection light component in all geometric systems.

The roughness variable σ (with reference to Fig. 5) of the surface configuration that use this moment is on physical model, the reason of the parameter that defines owing to expansion to reflected light component, and in this case, do not have special significance, so can be constant (for example, 1 or 0.5 etc.) arbitrarily.E0 (with reference to Fig. 5) is the radiant illumination that incides sample, the measured value space is made as CIE1976L here ^*a ^*b ^*The space is owing to adopt L ^*, therefore be made as 100 π.Small reflectivity ρ according to these value sample estimates surfaces.Small reflectivity ρ of sample surface does not get negative value on physical model, thus only adopt on the occasion of.

By with these each numerical applications in above-mentioned formula (1), can estimate the parameter of Oren-Nayar model requirement, so Oren-Nayar Model Calculation value LrON is determined.The parameter estimation of small reflectivity ρ by sample surface, the size of Oren-Nayar Model Calculation value LrON is also by match, do not adjust so do not carry out the special numerical range (scale) of Oren-Nayar Model Calculation value LrON, just can calculate the internal reflection light component Lri of all geometric systems.That is the LrON that, calculates here is equivalent to internal reflection light component Lri.(Lri＝LrON)。

For gauging surface reflected light component Lrs, measure the brightness value L rb (step S6) of a certain direct reflection geometric system at last.This geometric system is called the direct reflection geometric system.Here the direct reflection geometric system selection light source incident angle of selecting is 45 ° (φ i is 0 °), and the light-receiving angle is the geometric system of 45 ° (φ r is 180 °).In addition, be not limited to this angle in the present invention.According to the brightness value L rb (CIE1976L that in this geometric system, measures ^*a ^*b ^*L ^*), will remove the remaining reflected light component of the reflected light component Lru of lower floor that in identical geometric system, calculates and internal reflection light component Lri as surface reflection light component Lrs.Use the Torrance-Sparrow model to carry out match (step S7) to the surface reflection light component Lrs that obtains like this.Here, the surface reflection light component that ' match ' expression calculates according to the brightness value L rb that measures from above-mentioned selected direct reflection geometric system and the reflected light component of pigment particles, use the Torrance-Sparrow model, ask the surface reflection light component in all direct reflection geometric system and the reflected light component of pigment particles.Do not have estimated parameter in the Torrance-Sparrow model,, then determine Torrance-Sparrow Model Calculation value LrTS if input requires parameter.

But, only with this Torrance-Sparrow Model Calculation value LrTS itself can't show surface reflection light component Lrs (=Lrb), must carry out the numerical range adjustment to Torrance-Sparrow Model Calculation value LrTS.Therefore, calculate the value of the form parameter k that satisfies Lrs=Lrb=k * LrTS, thereby adjust the size of the Torrance-Sparrow Model Calculation value LrTS that can show surface reflection light component Lrs.At this moment, for the surface reflection of asking the direct reflection system F is made as 1.According to more than, can calculate the surface reflection light component Lrs of all direct reflection geometric systems.

By above step, can calculate the reflected light component Lru of other lower floor, an internal reflection light component Lri and surface reflection light component Lrs.And the calculated value addition by in will this identical direct reflection geometric system can obtain direct reflection light component (direct reflection light quantity) Lr (step S8).

In addition, in above-mentioned bright luster Forecasting Methodology, S1～S3 is that lower floor's reflected light component generates step, and S4～S5 is an internal reflection photogenerated step, and S6～S7 is a surface reflection photogenerated step, and S8 is a direct reflection light quantity calculation procedure.

The structure of the bright luster prediction unit of present embodiment then, is described.The bright luster prediction unit of present embodiment by carrying out the processing shown in the process flow diagram shown in Fig. 8, calculates the direct reflection light component of all direct reflection geometric systems, and according to the mirror surface luster of the direct reflection light component forecast sample that obtains.Fig. 1 represents the structure of the bright luster prediction unit 100 of present embodiment.

As shown in Figure 1, bright luster prediction unit 100 has as main component parts: operational part 101, operation inputting part 102, storage part 103, drift angle brightness measuring portion 104.The drift angle brightness value of the sample that operational part 101 is measured based on non-mirror reflection geometric system/direct reflection geometric system of setting from the data of the refractive index of the top section (toner image) 13 of operation inputting part 102 input and transmitance, by operation inputting part 102 and by drift angle brightness measuring portion 104 calculates the direct reflection light component of sample.

Comprise in the operational part 101: lower floor's reflected light component calculating part (lower floor's reflected light component generating unit) 111, calculate the lower floor's reflected light component (Lru) in all geometric systems; Internal reflection light component generating unit 112, calculate internal reflection light component (Lri) according to the measurement result of the drift angle brightness value in the non-mirror reflection geometric system, and derive internal reflection light component in all geometric systems by the match of using the Oren-Nayar model; Surface reflection light component generating unit 113, measurement result gauging surface reflected light component (Lrs) according to the drift angle brightness value in the direct reflection geometric system, and, derive the surface reflection light component in all direct reflection geometric systems by using the match of Torrance-Sparrow model; And direct reflection light component calculating part (direct reflection light quantity calculating part) 114, by lower floor's reflected light component (Lru), internal reflection light component (Lri), surface reflection light component (Lrs) addition that will obtain by above-mentioned each one, thereby calculate direct reflection light component (direct reflection light quantity) (Lr).At direct reflection light quantity calculating part 114,, calculate the direct reflection light component in all direct reflection geometric systems by each reflected light component addition with identical direct reflection geometric system.

In addition, internal reflection light component generating unit 112 has: Lri calculating part 141, calculate internal reflection light component (Lri) according to the measurement result of the drift angle brightness value in the non-mirror reflection geometric system; And the suitable portion 142 of Lri, by using the match of Oren-Nayar model, derive the internal reflection light component in all geometric systems.

In addition, surface reflection light component generating unit 113 has: Lrs calculating part 131, according to the measurement result gauging surface reflected light component (Lrs) of the drift angle brightness value in the direct reflection geometric system; And the suitable portion 142 of Lri, by using the match of Torrance-Sparrow model, derive the surface reflection light component in all direct reflection geometric systems.

Each required numerical value of direct reflection light component is asked in operation inputting part 102 inputs, and expression is by the result of operational part 101 computings.This operation inputting part 102 comprises: carry out the input of numerical value etc. action button 121, show display part 122 by the information exclusive disjunction result of action button 121 inputs.

Measurement result in the storage part 103 storage drift angle brightness measuring portions 104 and the operation result in the operational part 101.The inside of storage part 103 comprises: the drift angle brightness value of the sample that only is made of underclad portion (paper) 12 that first memory (LUT1) 151, storage are measured by drift angle brightness measuring portion 104; And second memory (LUT2) 152, the value of each reflected light component of calculating in the storage operational part 101.

Drift angle brightness measuring portion 104 measures the sample that only is made of underclad portion (paper) 12, and the drift angle brightness with double-deck sample of underclad portion 12 and top section (toner image) 13.In addition, the resolution of the angle of drift angle brightness measuring portion 104 is 1 °, can measure drift angle brightness with 1 ° of increment.But, use under the situation of bright luster prediction unit 100 prediction mirror surface lusters, the sample that only is made of underclad portion (paper) 12 is measured drift angle brightness with 1 ° of increment, but, only a direct reflection geometric system and the drift angle brightness of a non-mirror reflection geometric system mensuration just can for the sample that constitutes by underclad portion 12 and top section 13.

Then, with reference to Fig. 1 and Fig. 8 method with the mirror surface luster in all direct reflection geometric systems of above-mentioned bright luster prediction unit 100 forecast samples is described.

At first, measure the transmitance and the refractive index (S1 of Fig. 8) of the top section of the sample (toner image) of importing bright luster prediction unit 100 in order to measure the bright luster component.Use the penetrating concentration meter to the sample that forms toner image (sample that constitutes by top section 13 and underclad portion 12) and the sample mensuration penetrating concentration of underclad portion (paper) 12 only, by obtaining their difference, after measuring the penetrating concentration Dt of top section 13 only, (formula Dt) calculates transmitance Tt by Tt=10^.The mensuration of penetrating concentration, the penetrating concentration meter X-rite820 that for example can use X-rite company to make.

In addition, for the refractive index of the top section of using in the following step (toner image) 13, use is as the refractive index (literature value) of the resin of the principal ingredient of toner.

Then, utilize transmitance and the refractive index of action button 121 inputs of operation inputting part 102 by the top section 13 of the sample of said method mensuration.Fig. 9 represents an example of data presented input picture in the display part 122 of bright luster prediction unit 100.Show the cuit 20 of the refractive index of the top section of measuring target sample, cuit 21, OK button 22 and the cancel button 23 of transmitance in the input picture data shown in Figure 9.OK button 22 and cancel button 23 are touch plate type.The for example cuit 20 of the refractive index of action button 121 transmitance that will obtain by said method and refractive index input display part shown in Figure 9 and the cuit 21 of transmitance.In addition, in this input picture data, under the situation of having pushed cancel button 23, withdraw from this input picture data and force to finish mode determination.

Then, in the drift angle brightness measuring portion 104 in device setting by with the base material (the only sample of underclad portion) of the identical material of base material that constitutes sample, push OK button 22.Thus, in drift angle brightness measuring portion 104, measure the only drift angle brightness (CIE1976L of the sample of underclad portion ^*a ^*b ^*L ^*) (S2 of Fig. 8).Here the drift angle brightness of Ce Dinging is kept in the first memory 151 in the storage part 103.

As drift angle brightness measuring portion 104, for example can use angle measurement spectrometer GP-2S (color corporate system in the village).In addition, only the light source incident angle in the drift angle brightness measuring of the sample of this underclad portion and the angular resolution of light acceptance angle are 1 °.Therefore, in the first memory 151, will be with the light source incident angle of 1 ° of increment and drift angle brightness value and each incident angle and the light-receiving angle corresponding stored of light acceptance angle mensuration.

Then, lower floor's reflected light component calculating part 111 is based on refractive index and the transmitance and the drift angle brightness value that is stored in the first memory 151 of the top section of importing from operation inputting part 102, calculate (situation with 1 ° of resolution is made as all geometric systems) lower floor's reflected light component (Lru) (S3 of Fig. 8) in all geometric systems here, according to above-mentioned refraction theory and attenuation theory.The lower floor's reflected light component (Lru) that calculates is stored in the second memory 152 in the storage part 103.

Then, select the non-mirror reflection geometric system, import these non-mirror reflection geometric systems, and judge the drift angle brightness value (S4 of Fig. 8) in this non-mirror reflection geometric system from operation inputting part 102.Drift angle brightness value according to measuring calculates the internal reflection light component (Lri) in the non-mirror reflection geometric system.Then, according to the internal reflection light component (Lri) in the non-mirror reflection geometric system that calculates,, ask the internal reflection light component (Lri) (S5 of Fig. 8) in all geometric systems here by using the match of Oren-Nayar model.

And then, select the direct reflection geometric system, from operating portion 102 these direct reflection geometric systems of input, and the drift angle brightness value (S6 of Fig. 8) in the mensuration direct reflection geometric system.According to the surface reflection light component (Lrs) in direct reflection geometric system of drift angle brightness value calculating of measuring.Then, according to the surface reflection light component (Lrs) in the direct reflection geometrical system that calculates, ask surface reflection light component (Lrs) (S7 of Fig. 8) in all direct reflection geometric system here by the match of using the Torrance-Sparrow model.

Figure 10 represents in order to import selecteed non-mirror reflection geometric system and direct reflection geometric system one routine input picture data of demonstration in display part 122.Here, import non-mirror reflection geometric system and direct reflection geometric system simultaneously, but not necessarily be defined in this among the present invention.In the input picture data shown in Figure 10, the cuit 32 of the incident angle of the cuit 30 of the incident angle of demonstration non-mirror reflection geometric system and the cuit 31 of light-receiving angle, direct reflection geometric system, project 33, OK button 34, cancel button 35 and the return push-button 36 of light-receiving angle.Here, OK button 34, cancel button 35 and return push-button 36 are touch plate type.In addition, under the situation of having pushed cancel button 35, withdraw from this input picture data and force and finish mode determination, under the situation of having pushed return push-button 36, return input picture data shown in Figure 9.

The cuit relevant with the non-mirror reflection geometric system, appointment is used for geometric system that inner reflected light component (Lri) is carried out match, the cuit relevant with the direct reflection geometric system specified the geometric system that is used for fit surface reflected light component (Lrs).The incident angle of non-mirror reflection geometric system and light-receiving angle need indivedual the appointment, but because the incident angle of direct reflection geometric system and light-receiving angle equate, if therefore only incident angle is imported the cuit 32 of incident angle, then in the project 33 of light-receiving angle, show identical value.

Input non-mirror reflection geometric system and direct reflection geometric system, and in drift angle brightness measuring portion 104, be provided with after the sample that forms toner image, OK button 34 pushed.So, carry out the processing of above-mentioned S4～S7, and calculate lower floor's reflected light component (Lru), internal reflection light component (Lri), surface reflection light component (Lrs) in all geometric systems, these values are stored in the second memory 152 with the state corresponding to each identical geometric system.

Here, the method for the internal reflection light component (Lri) in all geometric systems of deriving more specifically describes.

At first, in the display part 122 that has shown input picture data as shown in figure 10, after the incident angle of the non-mirror reflection geometric system that is transfused to and the data of light-receiving angle are sent to Lri calculating part 141 temporarily, be sent to drift angle brightness measuring portion 104.In drift angle brightness measuring portion 104, measure the drift angle brightness (Lra) in the geometric system that is transfused to, and the data of measured value are sent to Lri calculating part 141.

At Lri calculating part 141, select the data in being stored in second memory 152 and obtain the data of the lower floor's reflected light component (Lru) that in identical geometric system, calculates, remove above-mentioned lower floor reflected light component (Lru) from above-mentioned drift angle brightness (Lra).And then,, make the surface reflection light component be approximately 0 here, remaining reflected light component is made as internal reflection light component (Lri).

Like this, the data of the internal reflection light component (Lri) that is calculated by Lri calculating part 141 are sent to Lri and are fit to portion 142.Lri is fit to portion 142 for the internal reflection light component (Lri) that transmits, and uses the Oren-Nayar model to carry out match.Thus, the internal reflection light component (Lri) in all geometric systems is derived, and these data are stored in the second memory 152.

Then, carry out more specific description for the method that derives the surface reflection light component (Lrs) in all direct reflection geometric systems.

At first, in as shown in figure 10 demonstration in the display part 122 of input picture data, the incident angle and the light acceptance angle degrees of data of the direct reflection geometric system of input are sent to after the Lrs calculating part 131 temporarily, are sent to drift angle brightness measuring portion 104.In drift angle brightness measuring portion 104, measure the drift angle brightness (Lrb) in the geometric system that is transfused to, and the data of measured value are sent to Lrs calculating part 131.

At Lrs calculating part 131, select the data in being stored in second memory 152 and obtain the data of the lower floor's reflected light component (Lru) that in identical geometric system, calculates and the data of the internal reflection light component (Lri) in identical geometric system, measured, remove above-mentioned lower floor reflected light component (Lru) and above-mentioned internal reflection light component (Lri) from above-mentioned drift angle brightness (Lrb).

Like this, the data of the surface reflection light component (Lrs) that is calculated by Lrs calculating part 131 are sent to Lrs and are fit to portion 132.Lrs is fit to portion 132 for the surface reflection light component (Lrs) that transmits, and uses the Torrance-Sparrow model to carry out match.Thus, the surface reflection light component (Lrs) in all direct reflection geometric systems is derived, and these data are stored in the second memory 152.

By carrying out above such processing, the lower floor's reflected light component (Lru) in all direct reflection geometric systems, internal reflection light component (Lri), surface reflection light component (Lrs) are set up corresponding with each geometric system and are stored in the second memory 152.Therefore, direct reflection light component calculating part 114 is with each the reflected light component addition in the identical direct reflection geometric system.Thus, can obtain direct reflection light component Lr (S8 of Fig. 8) in all direct reflection geometric systems.

Then, the data of the measurement result of the direct reflection light component Lr that obtains here are sent to operation inputting part 102, and are shown by display part 122.Figure 11 represents an example of the picture of the measurement result that show this moment in display part 122.

As shown in figure 11, after having measured direct reflection light component Lr, the cuit 41 of curve Figure 40 of display mirror reflected light component Lr, direct reflection geometric system in the display part 122, be input to result of calculation 47, OK button 43, cancel button 44 and the return push-button 45 of the geometric system of the threshold value of input in the cuit 46, expression cuit 46 of result of calculation 42, glossiness threshold value of direct reflection light component Lr of geometric system of cuit 41.In curve Figure 40 of direct reflection light component Lr, show the curve map that to have a guide look of all direct reflection light component Lr when making incident angle from 10 °～80 ° variations.Therefore, can know the angle dependence characteristic of the direct reflection light component of sample from this curve Figure 40.This curve result shown in Figure 40 will be kept at the reflected light component Lru of lower floor, the internal reflection light component Lri of all direct reflection geometric systems in the second memory 152, the result of surface reflection light component Lrs addition by direct reflection light component calculating part 114.

In addition, at above-mentioned bright luster prediction unit 100, by the cuit 41 of direct reflection geometric system shown in Figure 11 is imported angle arbitrarily, and push OK button 43, also the value of the direct reflection light component of the angle that can obtain to be transfused to.Here 1 of curve Figure 40 of the calculated value of this moment that obtains and direct reflection light component Lr equates.

On the other hand,, and push OK button 43, be displayed in the result of calculation 47 as the angle of the direct reflection light component of input by the direct reflection light component (, being equivalent to brightness value here) of input expectation in the cuit 46 of glossiness threshold value.According to this result of calculation, the above angle of the angle that obtains here as can be known is equivalent to have the above angle of direct reflection light component that is transfused to.In other words, bright luster prediction unit 100 according to present embodiment, can calculate direct reflection light component, therefore the specular light component value more than can confirming whether represent necessarily under the situation that has adopted which kind of direct reflection geometric system (incident and light-receiving angle) for all direct reflection geometric systems.This value is effective as the new metewand of glossiness.

In addition, in result screen shown in Figure 11, under the situation of having pushed cancel button 44, withdraw from and force to finish mode determination, under the situation when having pushed return push-button 45, turn back to input picture data shown in Figure 10 from this result screen.

In addition, under the situation of the glossiness that will be transformed to the JIS standard, ask relative value, calculate glossiness and get final product based on value as the on-gauge plate (glass plate of refractive index 1.567) of master sample appointment by the specular light component value of said method prediction.

In addition, above-mentioned mirror surface luster prediction unit 100 system that also can use a computer realizes.Figure 12 represents to have the structure of computer system 300 of the function of bright luster prediction unit 100.

This computer system 300 comprises: flat bed scanner (flatbed scanner)/image-input devices such as Film scanner/digital camera 301, by being written into the image output devices such as printer 305 that regulated procedure (application software 303) is carried out the image display devices such as CRT monitor/LCD 304 of the result of the computing machine 302 of various processing such as image processing method, expression computing machine 302, the result of computing machine 302 outputed to paper etc.Also comprise: as be used for via network be connected to the network interface card of communication component 306 of server etc. or modulator-demodular unit, as the keyboard/mouse 308 of the angle measurement spectrometer of the drift angle brightness measuring device 307 that is used to measure the drift angle brightness value, the input of the information of carrying out, as the external memory 309 of the memory unit of the outside of stored programme/data etc. etc. in order to make computing machine 302 carry out the processing of target.

In aforementioned calculation machine system 300, under the situation of implementing bright luster prediction of the present invention, the function that computing machine 302 is carried out as operational part 101, the function that drift angle brightness measuring device 307 is carried out as drift angle brightness measuring portion 104, the function that keyboard/mouse 308 is carried out as action button 121, the function that image display device 304 is carried out as display part 122.In addition,, can be arranged in the external memory 309, also can be arranged in the computing machine 302 for storage part 103.

In addition, arithmetic units such as CPU are carried out program stored in the memory units such as ROM (Read Only Memory) or RAM, and communication component such as output block such as input block, display such as supervisory keyboard or interface circuit, thereby can realize the various processes that each one 11～114 that comprises in the operational part 101 of bright luster prediction unit 100 of above-mentioned embodiment and operational part 101 carry out.Thereby, the computing machine with these parts only by reading and recording the recording medium of said procedure, and carry out this program, just can realize the various functions and the various processing of the bright luster prediction unit 100 of present embodiment.In addition, by said procedure being recorded in movably in the recording medium, can realize various functions and various processing on the computing machine arbitrarily.

As this recording medium, because of on microcomputer, handle not shown storer, the such storer of for example ROM can be a program medium, perhaps also can be used as external memory 309 setting program reading devices, by it is inserted the program medium that recording medium can read.

In addition, under any situation, all preferred microprocessor access program stored and the structure of carrying out.And then the preferred fetch program, the program that reads is downloaded to the program storage area of microcomputer, the mode that this program is performed.In addition, this download is stored in the body apparatus in advance with program.

In addition, as the said procedure medium, it is the recording medium that can constitute discretely with body, it also can be the dish class of CDs such as disk such as band such as tape or cassette tape class, floppy disk or hard disks or CD/MO/MD/DVD, IC-cards (comprising memory card) etc. block class, perhaps comprise the medium of the program of carrying regularly of semiconductor memories such as mask rom, EPROM (ErasableProgrammable Read Only Memory), EEPROM (Electrically ErasableProgrammable Read Only Memory), flash ROM.

In addition, if can connect the system architecture of the communication network that has comprised the Internet, then preferably so fluidly carry the recording medium of program from the downloaded program.

And then like this under the situation of downloaded program, the program that preferably will download usefulness is stored in the body apparatus in advance, perhaps installs from other recording medium.

[embodiment 2]

Illustrate that based on Figure 13 to Figure 19 second embodiment of the present invention is as follows.In above-mentioned embodiment 1, illustrated that the colorant layer that constitutes sample does not limit the size of pigment particles such as dye ink, paint ink, toner and adaptable bright luster Forecasting Methodology especially, but in present embodiment, illustrate under the bigger situation of the diameter of the pigment particles that comprises in the colorant layer (promptly, pigment particles is under the situation of pigment such as paint ink or toner), calculate the bright luster Forecasting Methodology and the bright luster prediction unit of the bright luster component of test portion more accurately.As above-mentioned pigment, can enumerate paint ink, toner etc.

At first, in the bright luster prediction unit of present embodiment, the employed bitintability reflection of prediction (BRDF) model theory of the mirror surface luster of sample is described.In addition, here the method for using above-mentioned BRDF model under the situation of the reflected light component of calculating test portion is described, this test portion has as pigment particles and comprises base material and as the double-decker of the colorant layer of the toner of pigment.

Figure 14 schematically represents to have the dividing method of the reflected light component of double-deck test portion.As shown in figure 14, sample 23 comprises the top section 34 that is made of toner image (colorant layer) and by paper or see through the underclad portion 33 that base material such as film constitutes.According to bitintability reflection (BRDF) model theory, as each reflected light component from light source 6, enumerate from the surface reflection light component (Lrss) 27 of top section 34 and internal reflected light component 35, from the surface reflection component 30 and the internal reflected light component 31 of underclad portion 33, these complex light are the reflected light from sample 23.And then, in present embodiment, can be divided into from pigment particles directly reflected light component (Lrsp) 28 of reflection and the scattered reflection light component (Lrd) 29 that the scattering between pigment particles causes from the internal reflected light component 35 of top section 34.For by each reflected light component 27～31 of BRDF Model Calculation, need to estimate a plurality of as undeterminable parameter (parameter).

But, owing to be difficult to measure internal reflected light component 31 from underclad portion 33, therefore in the present invention, will consider as compound and reflected light component from the surface reflection component 30 and the internal reflected light component 31 of underclad portion 33, and handle as lower floor's reflected light component (Lru) 32.By calculating this lower floor's reflected light component 32, thereby realize by the light quantity of direct reflection accurately in the various image patterns of BRDF Model Calculation based on the measured data of underclad portion 33 only.Thus, if calculate, then can obtain direct reflection light quantity accurately from the surface reflection light component 27 of top section 34, reflected light component 28, scattered reflection light component 29 and lower floor's reflected light component 32 of pigment particles.

In the present invention, can enumerate each model shown in (1) the Ward model shown in the above-mentioned embodiment 1, (2) Phong model, (3) Oren-Nayar model, (4) Torrance-Sparrow model as the effective BRDF pattern of calculating formula model that is used to calculate each reflected light component.

In above-mentioned each formula model, being that the model that prerequisite is advised is Ward model, Phong model with the isotropic scatterning of light, is that the model that prerequisite is advised is Oren-Nayar model, Torrance-Sparrow model with the non-isotropy scattering of light.Though calculating formula is complicated, but can calculate value accurately owing to comprise the method for the non-isotropy scattering of light, thereby in present embodiment, use the Torrance-Sparrow model as the calculating formula model that is used for the reflected light component 28 of gauging surface reflected light component 27 and pigment particles, use the Open-Nayar model as the calculating formula model that is used to calculate the scattered reflection light component 29 that the scattering between pigment particles causes.

In addition, Fig. 5 represents the geometry configuration in the BRDF model, and Fig. 6 represents the geometric definition of the body surface in the BRDF model.

Use under the situation of Oren-Nayar Model Calculation scattered reflection light component Lrd, at first, calculate Oren-Nayar Model Calculation value LrON by following formula (4).

(formula 4)

$\mathrm{LrON}=\frac{\mathrm{\&sigma;}}{\mathrm{\&pi;}}\mathrm{<figure-callout\; id="0"\; label="E"\; filenames="C200510118742E00811.png,C200510118742E00821.png"\; state="\{\{state\}\}">E</figure-callout>}0\cos \mathrm{\&theta;i}[C1\left(\mathrm{\&sigma;}\right)+\cos (\mathrm{\&phi;r}-\mathrm{\&phi;i})C2(\mathrm{\&alpha;};\mathrm{\&beta;};\mathrm{\&phi;r}-\mathrm{\&phi;i};\mathrm{\&sigma;})\tan \mathrm{\&beta;})$

$+(1-\left|\cos (\mathrm{\&phi;r}-\mathrm{\&phi;i})\right|)C3(\mathrm{\&alpha;};\mathrm{\&beta;};\mathrm{\&sigma;})\tan \left(\frac{\mathrm{\&alpha;}+\mathrm{\&beta;}}{2}\right)$

$+0.17\frac{{\mathrm{\&rho;}}^2}{\mathrm{\&pi;}}\mathrm{<figure-callout\; id="0"\; label="E"\; filenames="C200510118742E00811.png,C200510118742E00821.png"\; state="\{\{state\}\}">E</figure-callout>}0\cos \mathrm{\&theta;i}\frac{{\mathrm{\&sigma;}}^2}{{\mathrm{\&sigma;}}^2+0.13}[1-\cos (\mathrm{\&phi;r}-\mathrm{\&phi;i}){\left(\frac{2\mathrm{\&beta;}}{\mathrm{\&pi;}}\right)}^2]$

$\mathrm{<figure-callout\; id="1"\; label="C"\; filenames="C200510118742E00701.png,C200510118742E00731.png"\; state="\{\{state\}\}">C</figure-callout>}1=1-0.5\frac{{\mathrm{\&sigma;}}^2}{{\mathrm{\&sigma;}}^2+0.33}\&CenterDot;\&CenterDot;\&CenterDot;\&CenterDot;\left(4\right)$

$\mathrm{<figure-callout\; id="3"\; label="C"\; filenames="C200510118742E00692.png,C200510118742E00701.png"\; state="\{\{state\}\}">C</figure-callout>}3=0.125\left(\frac{{\mathrm{\&sigma;}}^2}{{\mathrm{\&sigma;}}^2+0.09}\right){\left(\frac{4\mathrm{\&alpha;\&beta;}}{{\mathrm{\&pi;}}^2}\right)}^2$

In above-mentioned formula, θ i is the zenith angle (zenith angle) of light source direction, and φ i is the position angle of light source direction, and θ r is the zenith angle of light-receiving direction, φ r is the position angle of light-receiving direction, σ is the roughness variable of surface configuration, and E0 is the radiant illumination to sample incident, and ρ is small a reflectivity of sample surface, α=max[θ r, θ i], β=min[θ r, θ i] (with reference to Fig. 5, Fig. 6).In addition, the calculating formula of this LrON is identical with the calculating formula of use in the embodiment 1.

In addition, use the Torrance-Sparrow model, according to the reflected light component Lrsp of following formula (5) gauging surface reflected light component Lrss and pigment particles, as each Torrance-Sparrow Model Calculation value LrTS (that is, LrTSs and LrTSp).

(formula 5)

$\mathrm{LrTS}=E0\frac{\mathrm{F\; GAF}}{\cos \mathrm{\&theta;}r\cos \mathrm{\&theta;a}}c{e}^{-\frac{{\mathrm{\&theta;a}}^2}{{2\mathrm{\&sigma;}}^2}}$

$\mathrm{GAF}=\max [0,\mathrm{Min}[1,\frac{2<s,n><a,n>}{<s,a>},\frac{2<v,n><a,n>}{<v,n>}]]\&CenterDot;\&CenterDot;\&CenterDot;\&CenterDot;\left(5\right)$

$c={\&Integral;}_{\mathrm{\&theta;a}=0}^{\frac{\mathrm{\&pi;}}{2}}{\&Integral;}_{\mathrm{\&phi;a}=0}^{2\mathrm{\&pi;}}{e}^{-\frac{{\mathrm{\&theta;a}}^2}{{2\mathrm{\&sigma;}}^2}}\sin \mathrm{\&theta;ad\&phi;ad\&theta;a}$

In above-mentioned formula, F is the Fresnel reflection rate, n is the normal vector of sample 3, and S is the light source direction vector, and v is the light-receiving direction vector, a is the bisection vector of s and v, θ r is the zenith angle of light-receiving direction, and θ a is the zenith angle of vector a, and φ a is the position angle of vector a, σ is the roughness variable of surface configuration, and E0 is the radiant illumination that incides sample.In addition, in above-mentioned formula,＜x, y〉inner product (with reference to Fig. 5, Fig. 6) of (x, y are several arbitrarily) expression vector.In addition, the calculating formula of this LrTS is identical with the calculating formula of use in the embodiment 1.

Then, based on the flowchart text said method of Figure 13, the measured value of the brightness in the geometric system is according to the rules calculated the method for the direct reflection light quantity of all geometric systems.

At first, in order to calculate the reflected light component Lru of lower floor, only calculate the transmitance (step S11) of the top section (toner image) 34 of the sample that will calculate the direct reflection light component.The mensuration geometric system here disposes light source, sample, optical receiver point-blank.In such geometric system, directly over sample, inject light source, by be configured in sample under the light that receives of optical receiver, come instrumentation as the light that sees through sample by the penetrating concentration meter.And, by obtaining the sample that formed toner image (samples that top section 34 and underclad portion 33 constitute) and the difference of the sample of underclad portion (paper) 33 only, can obtain the only penetrating concentration Dt of top section 34, only the transmitance Tt of top section 34 (that is toner image) can (Dt) calculate according to Tt=10^.

In addition, for the refractive index of the top section of using in following step (toner image) 34, use is as the refractive index (literature value) of the resin of the major component of toner.

Then, at the sample that does not have top section 34, promptly only have a sample of underclad portion 33, under the situation of present embodiment, prepare the paper before the printing toner image or see through film, only from the light source incident direction of the sample of this underclad portion 33 and light-receiving direction detection as high-resolution drift angle brightness value (step S12).In addition,, the measured value space is made as CIE1976L here ^*a ^*b ^*(CIE:Commission International de l ' Eclairage: International Commission on Illumination.L ^*: lightness, a ^*, b ^*: colourity) space, therefore adopt L ^*Value as above-mentioned drift angle brightness value.

According to the reflected light component Lru of these data computation lower floors (step S13).Figure 15 is the synoptic diagram of the decay of the refraction effect of the light considered when representing to calculate the reflected light component Lru of lower floor of concept nature and light quantity.The light that incides sample with the angle of θ i produces refraction effect on the interface of air layer 36 and top section 34.This refraction effect is deferred to the Fresnel theory, and the angle θ t after the refraction finds the solution according to Fresnel rule (refractive index of medium before the incident is made as n1, when the refractive index of medium after the incident is made as n2, n1 * sin θ i=n2 * sin θ t).Light by toner layer is decayed at the interface owing to refraction effect, and this Fresnel transmitance Tn is by formula (6) expression.

(formula 6)

$\mathrm{Tn}=[\left(\frac{n2\cos \mathrm{\&theta;<figure-callout\; id="1"\; label="t\; n"\; filenames="C200510118742E00701.png,C200510118742E00731.png"\; state="\{\{state\}\}">t</figure-callout>}}{n}\right){\left(\frac{2\mathrm{<figure-callout\; id="1"\; label="n"\; filenames="C200510118742E00701.png,C200510118742E00731.png"\; state="\{\{state\}\}">n</figure-callout>}1\cos \mathrm{\&theta;i}}{n2\cos \mathrm{\&theta;i}+\mathrm{<figure-callout\; id="1"\; label="n"\; filenames="C200510118742E00701.png,C200510118742E00731.png"\; state="\{\{state\}\}">n</figure-callout>}1\cos \mathrm{\&theta;t}}\right)}^2+\left(\frac{n2\cos \mathrm{\&theta;<figure-callout\; id="1"\; label="t\; n"\; filenames="C200510118742E00701.png,C200510118742E00731.png"\; state="\{\{state\}\}">t</figure-callout>}}{n}\right){\left(\frac{2\mathrm{<figure-callout\; id="1"\; label="n"\; filenames="C200510118742E00701.png,C200510118742E00731.png"\; state="\{\{state\}\}">n</figure-callout>}1\cos \mathrm{\&theta;i}}{n1\cos \mathrm{\&theta;i}+n2\cos \mathrm{\&theta;t}}\right)}^2]/2$

····(6)

In addition, when light passed through in the top section 34, light arrived underclad portion 33 then by top section 34 decay.This attenuation effect defer to the Beer-Lambert rule (absorption coefficient of colorant layer is made as a, the thickness of colorant layer is made as d, when transmitance is made as T ,-logT=a * d).Because incident angle changes, light arrives till the underclad portion 33, and light is by the optical path length variation of top section 34.Therefore,, then be-logTt '=a * (d/cos θ i) to estimate the decay of light by this lip-deep transmitance as calculating the lip-deep transmitance Tt ' corresponding with this optical path length variation.

By more than, on the basis that the incident angle to the light of underclad portion 33 changes because of refraction effect, use the lip-deep transmitance Tt ' corresponding, estimate the decay of light quantity, thereby can calculate the incident light quantity of the light that arrives underclad portion 33 with Fresnel transmitance Tn and optical path length variation.Such optical phenomena is radiated at the reflected light from underclad portion 33 under the situation of air layer and produces too.Thereby, drift angle brightness value to the sample that only constitutes by underclad portion (paper) in S12, measured, consideration is as the refraction effect of the light of above-mentioned secondary and the attenuating (with reference to Figure 15) of light, calculate with whole incident angles and light-receiving angle, thereby can calculate the reflected light component Lru of lower floor.Here, have under the situation of the value below the radix point at the incident angle θ t after the refraction, the value of the angle before and after it is carried out proportional distribution and is carried out interpolation.The resolution of the angle of this moment is restriction especially not, but because the angular resolution ultimate value of determinator is 1 °, therefore is made as 1 ° here.In addition, in order to carry out the calculating of direct reflection light component more accurately, preferably the resolution of this angle is smaller or equal to 1 °.

Then, in order to calculate scattered reflection light component Lrd, in comprising a certain geometric system of surface reflection light component hardly, measure the brightness value L ra (CIE1976L of sample ^*a ^*b ^*L ^*) (step S14).This geometric system is called the non-mirror reflection geometric system.General because then the surface reflection light component is more little away from the geometric system of direct reflection more, therefore preferably the light source incident angle is big for the non-mirror reflection geometric system of selecting here, and the approaching geometric system of light source incoming position and light-receiving position.In present embodiment, as an example of the geometric system of selecting here, selecting light source incident angle θ i is 45 ° (φ i is 0 °), and light-receiving angle θ r is the geometric system of-60 ° (φ r is 0 °).

Then, measure the CONCENTRATION DISTRIBUTION of the toner image of geometric system, calculate its roughness variable σ p (step S15) according to measured value.The concrete computing method of back narration roughness variable σ p.

Then, from the brightness value L ra that S14 measures, remove the reflected light component Lru of lower floor that in identical geometric system, calculates, and then the reflected light component Lrsp of surface reflection light component Lrss and pigment particles is approximately 0 remaining reflected light component as scattered reflection light component Lrd.For the scattered reflection light component Lrd that obtains like this, use the Oren-Nayar model to carry out match (step S16).Here, ' match ' expression is calculated unknown parameter to the internal reflection light component that calculates according to the brightness value L ra that measures in above-mentioned selecteed non-mirror reflection geometric system, so that its available Oren-Nayar model performance, and ask internal reflection light component in all geometric systems.

In addition, the roughness variable σ (with reference to Fig. 5) of the CONCENTRATION DISTRIBUTION of using this moment adopts the roughness variable σ p that calculates based on the CONCENTRATION DISTRIBUTION of the sample of measuring at above-mentioned S15.E0 (with reference to Fig. 5) is the radiant illumination that incides sample, the measured value space is made as CIE1976L here ^*a ^*b ^*The space is owing to adopt L ^*, therefore be made as 100 π.Small reflectivity ρ according to these value sample estimates surfaces.Small reflectivity ρ of sample surface does not get negative value on physical model, thus only adopt on the occasion of.

By with in these above-mentioned formulas of each numerical value substitution (1), can estimate the parameter of Oren-Nayar model requirement, so Oren-Nayar Model Calculation value LrON is determined.The parameter estimation of small reflectivity ρ by sample surface, the size of Oren-Nayar Model Calculation value LrON is also by match, therefore do not carry out the special numerical range adjustment of Oren-Nayar Model Calculation value LrON, just can calculate the scattered reflection light component Lrd of all geometric systems.That is the LrON that, calculates here is equivalent to scattered reflection light component Lrd.(Lrd＝LrON)。

Then, for the reflected light component of gauging surface reflected light component Lrss and pigment particles, measure the brightness value L rb (step S17) of a certain direct reflection geometric system.This geometric system is called the direct reflection geometric system.Here the direct reflection geometric system selection light source incident angle of selecting is 45 ° (φ i is 0 °), and the light-receiving angle is the geometric system of 45 ° (φ r is 180 °).In addition, be not limited to this angle in the present invention.

Then, measure the CONCENTRATION DISTRIBUTION of the toner image of sample, and calculate its roughness variable σ p according to measured value.In addition, measure the surface configuration of sample, and calculate roughness variable σ s (step S18) according to measured value.In addition, the roughness variable σ p for CONCENTRATION DISTRIBUTION also can use the variable that calculates at S15.The concrete computing method of the roughness variable σ s of back narration surface configuration.

Then, according to the brightness value L rb (CIE1976L that measures among the S17 ^*a ^*b ^*L ^*), will remove the compound component of the remaining reflected light component of the reflected light component Lru of lower floor that in identical geometric system, calculates and scattered reflection light component Lrd as the reflected light component Lrsp of surface reflection light component Lrss and pigment particles.

Then, the reflected light component Lrsp to surperficial reflected light component Lrss and pigment particles uses the Torrance-Sparrow model to come computation model calculated value LrTS (step S19) respectively.

In addition, the roughness variable σ of the Torrance-Sparrow model that use this moment is the parameter of the expansion of reflected light component on the definition physical model, under the situation of surface reflection light component Lrss, the roughness variable σ s of the surface configuration that employing is obtained in S18, under the situation of the reflected light component Lrsp of pigment particles, adopt the roughness variable σ of the CONCENTRATION DISTRIBUTION of in S18, obtaining.E0 (with reference to Fig. 5) is similarly 100 π with Oren-Nayar model model.For the surface reflection of asking the direct reflection system F is made as 1.There is not estimated parameter in the Torrance-Sparrow model, if input requires parameter, then Torrance-Sparrow Model Calculation value LrTS (that is the Torrance-Sparrow Model Calculation value LrTSp of the reflected light component Lrsp of the Torrance-Sparrow Model Calculation value LrTSs of surface reflection light component Lrss and pigment particles) is determined.

Then, ask each distribution according to above-mentioned Model Calculation value LrTSs and LrTSp, and carry out match, so that become the brightness value of having measured (step S20).In other words, calculate and satisfy the form parameter k of Lrb=k * LrTSs+ (1-k) * LrTSp, thereby determine the allocation proportion of the reflected light component Lrsp of surperficial reflected light component Lrss and pigment particles.Thus, can calculate the surface reflection light component Lrss of all direct reflection geometric systems and the reflected light component Lrsp of pigment particles.

By above step, can calculate the reflected light component Lrsp of a reflected light component Lru of other lower floor, scattered reflection light component Lrd, surface reflection light component Lrss and pigment particles.Then, the calculated value addition by in the direct reflection geometric system that these are identical can obtain direct reflection light component (direct reflection light quantity) Lr (step S21).

Above-mentioned bright luster Forecasting Methodology owing to supposed all images (low gloss image, low concentration image etc.), is that top section and underclad portion are prerequisite will measure sample separation therefore.But, (sample of high concentration and high glaze) is not limited to this under the situation of special mensuration sample, only uses reflected light component (the reflected light component Lrsp of surface reflection light component Lrss, pigment particles and scattered reflection light component Lrd) the calculating direct reflection light component Lr of top section also passable.This is because in this case, because the reflected light component Lru of lower floor is few, therefore the influence to direct reflection light component Lr reduces.

In addition, in above-mentioned bright luster Forecasting Methodology, S11～S13 is that lower floor's reflected light component generates step, S14～S16 is that the internal reflection light component generates step, S17～S19 is that the surface reflection light component generates step, S19 is the form parameter calculation procedure, and S20 is a direct reflection light component calculation procedure.

The structure of the bright luster prediction unit of present embodiment then, is described.The bright luster prediction unit of present embodiment calculates the direct reflection light component of all direct reflection geometric systems by carrying out the processing shown in the process flow diagram shown in Figure 13, and according to the mirror surface luster of the direct reflection light component forecast sample that obtains.Figure 16 represents the structure of the bright luster prediction unit 200 of present embodiment.

As shown in figure 16, bright luster prediction unit 200 has as main component parts: operational part 201, operation inputting part 202, storage part 203, drift angle brightness measuring portion 204.

The drift angle brightness value of the sample that operational part 201 is measured based on non-mirror reflection geometric system/direct reflection geometric system of setting from the data of the roughness variable of the surface configuration of the roughness variable of the CONCENTRATION DISTRIBUTION of the refractive index of the top section (toner image) 34 of operation inputting part 202 input and transmitance, sample, sample, by operation inputting part 202 and by drift angle brightness measuring portion 204 calculates the direct reflection light component of sample.

Comprise in the operational part 201: lower floor's reflected light component calculating part (lower floor's reflected light component generating unit) 211, calculate the lower floor's reflected light component (Lru) in all geometric systems; Scattered reflection light component generating unit (internal reflection light component generating unit) 262, calculate the internal reflection light component according to the measurement result of the drift angle brightness value in the non-mirror reflection geometric system, and derive the scattered reflection light component (Lrd) of one of internal reflection light component in all geometric systems by the match of using the Oren-Nayar model; Surface reflection light component generating unit 213, according to the measurement result gauging surface reflected light component (Lrss) of the drift angle brightness value in the direct reflection geometric system, and derive surface reflection light component in all direct reflection geometric systems by the match of using the Torrance-Sparrow model; And direct reflection light component calculating part (direct reflection light quantity calculating part) 214, by each reflected light component addition that will obtain by above-mentioned each one, thereby calculate direct reflection light component (Lr).In direct reflection light quantity calculating part 214, the direct reflection light component in all direct reflection geometric systems is calculated in logical each reflected light component addition with identical direct reflection geometric system.

In present embodiment, consider that internal reflected light component 35 is divided into the reflected light component (Lrsp) 28 and the scattered reflection light component (Lrd) 29 of pigment particles, the reflected light component of pigment particles (Lrsp) is calculated by the reflected light component (Lrsp) of pigment particles according to the measurement result of the drift angle brightness value in the direct reflection geometric system.Therefore, also comprise pigment particles reflected light component generating unit 261 in the operational part 201, be used for calculating the reflected light component (Lrsp) of pigment particles according to the measurement result of the drift angle brightness value of a direct reflection geometric system, by using the match of Torrance-Sparrow model, generate the reflected light component (Lrsp) of the pigment particles in all direct reflection geometric systems.

In addition, though not shown, pigment particles reflected light component generating unit 261 comprises: the Lrsp calculating part that calculates the reflected light component of pigment particles according to the measurement result of the drift angle brightness value in the direct reflection geometric system; And the Lrsp that derives the reflected light component of the pigment particles in all direct reflection geometric systems by the match of using the Torrance-Sparrow model is fit to portion.In addition, though not shown, scattered reflection light component generating unit 262 comprises: the Lrd calculating part that calculates the scattered reflection light component according to the measurement result of the drift angle brightness value in the non-mirror reflection geometric system; And the suitable portion of Lrd of deriving the scattered reflection light component in all geometric systems by the match of using the Oren-Nayar model.

In addition, though not shown, surface reflection light component generating unit 113 comprises: according to the Lrss calculating part of the measurement result gauging surface reflected light component (Lrss) of the drift angle brightness value in the direct reflection geometric system; And by using the match of Torrance-Sparrow model, the Lrss that derives the surface reflection light component in all direct reflection geometric systems is fit to portion.

In present embodiment, the measured value of the drift angle brightness value in the direct reflection geometric system is assigned as surface reflection light component (Lrss) and pigment particles reflected light component (Lrsp).Therefore, also be provided with the form parameter calculating part 215 of the allocation proportion of decision surperficial reflected light component (Lrss) and pigment particles reflected light component (Lrsp) in the operational part 201.

Operation inputting part 202 input is used to each numerical value of asking the direct reflection light component required, and expression is by the result of operational part 201 computings.This operation inputting part 202 comprises: carry out the input of numerical value etc. action button 221, show display part 222 by the information exclusive disjunction result of action button 221 inputs.

Measurement result in the storage part 203 storage drift angle brightness measuring portions 204 and the operation result in the operational part 201.The inside of storage part 203 comprises: the drift angle brightness value of the sample that only is made of underclad portion (paper) 33 that first memory (LUT1) 251, storage are measured by drift angle brightness measuring portion 204; And second memory (LUT2) 252, be stored in the various reflected light component that calculate in the operational part 201.

Drift angle brightness measuring portion 204 measures the sample that only is made of underclad portion (paper) 33, and the drift angle brightness with double-deck sample of underclad portion 33 and top section (toner image) 34.In addition, the resolution of the angle of drift angle brightness measuring portion 204 is 1 °, can measure drift angle brightness with 1 ° of increment.But, use under the situation of bright luster prediction unit 200 prediction mirror surface lusters, the sample that only is made of underclad portion (paper) 33 is measured drift angle brightness with 1 ° of increment, but, only a direct reflection geometric system and the drift angle brightness of a non-mirror reflection geometric system mensuration just can for the sample that constitutes by underclad portion 33 and top section 34.

The method of the mirror surface luster in all direct reflection geometric systems that use above-mentioned bright luster prediction unit 200 forecast samples then, is described with reference to Figure 13 and Figure 16.

At first, measure the transmitance and the refractive index (S1 of Figure 11) of the top section of the sample (toner image) of importing bright luster prediction unit 200 in order to measure the bright luster component.Use the penetrating concentration meter to the sample that forms toner image (sample that constitutes by top section 34 and underclad portion 33) and the sample mensuration penetrating concentration of underclad portion (paper) 33 only, by obtaining their difference, after measuring the penetrating concentration Dt of top section 33 only, (formula Dt) calculates transmitance Tt according to Tt=10^.The mensuration of penetrating concentration for example can be used the penetrating concentration meter X-rite820 of X-rite corporate system.

In addition, for the refractive index of the top section of using in the following step (toner image) 13, use is as the refractive index (literature value) of the resin of the principal ingredient of toner.

Then, use the measuring shape microscope VK-9500 (KEYENCE corporate system) to carry out the measuring shape on toner layer surface, and carry out the calculating of the roughness variable of toner surface based on the elevation information of having obtained (sample being made as the data of the Z-direction under the situation on XY plane).According to calculating small the slope on toner layer surface with the elevation information of pixel adjacent, after the histogram that generates this efficient of small, in the scope of 2 σ (about 95.5% data), ask the standard deviation of small area slope, as the roughness variable σ s of the surface configuration of colorant layer.

On the other hand, use the image that sees through of obtaining sample with light source that sees through of CCD camera C S-3910 (industrial group of TEL system) and light quantity output 200W, and carry out the calculating of the roughness variable of CONCENTRATION DISTRIBUTION through view data according to this.Sample (the CCD camera is set on the Z-direction under the situation that sample is made as the XY plane and sees through and use light source) is set at the CCD camera with between seeing through with light source, and obtains through image.After the concentration according to each pixel that sees through image that obtains generates histogram, in the scope of 2 σ (about 95.5% data), ask the standard deviation of penetrating concentration, as the roughness variable σ p of CONCENTRATION DISTRIBUTION.

In addition, in the process flow diagram of Figure 13, the mensuration of the roughness variable σ s of the roughness variable σ p of the CONCENTRATION DISTRIBUTION of this sample of execution and surface configuration in S15, S17, but in this bright luster prediction unit 200, carry out under the situation of evaluation of bright luster, measure with other device in advance as described above, import simultaneously with transmitance and refractive index.

And, utilize transmitance, each roughness variable σ p and σ s, the refractive index of action button 221 inputs of operation inputting part 202 by the top section 34 of the sample of said method mensuration.Figure 17 represents an example of data presented input picture in the display part 222 of bright luster prediction unit 200.Show the cuit 50 of the refractive index of the top section of measuring target sample, cuit 51, OK button 54 and the cancel button 55 of transmitance in the input picture data shown in Figure 17.OK button 54 and cancel button 55 are touch plate type.The cuit 53 of the cuit 52 of the roughness variable of the cuit 50 of the refractive index of the display part that refractive index, transmitance, each roughness variable σ p and the σ s input that utilizes action button 221 to be obtained by said method is shown in Figure 17, the cuit 51 of transmitance, surface configuration and the roughness variable of CONCENTRATION DISTRIBUTION.In addition, in this input picture data, pushed under the situation of cancel button 55, withdrawed from this input picture data and force to finish mode determination.

And the base material (the only sample of underclad portion) that will be made of the material identical with the base material that constitutes sample is arranged in the interior drift angle brightness measuring portion 204 of device, pushes OK button 54.Thus, in drift angle brightness measuring portion 204, measure the only drift angle brightness (CIE1976L of the sample of underclad portion ^*a ^*b ^*L ^*) (S12 of Figure 13).Here the drift angle brightness of Ce Dinging is stored in the first memory 251 in the storage part 203.

As drift angle brightness measuring portion 204, for example can use angle measurement spectrometer GP-2S (color corporate system in the village).In addition, only the light source incident angle in the drift angle brightness measuring of the sample of this underclad portion and the angular resolution of light acceptance angle are 1 °.Therefore, in first memory 151, will be with the light source incident angle of 1 ° of increment and drift angle brightness value and each incident angle and the light-receiving angle corresponding stored of light acceptance angle mensuration.

Then, lower floor's reflected light component calculating part 211 is based on refractive index and the transmitance and the drift angle brightness value that is stored in the first memory 251 of the top section of importing from operation inputting part 202, calculate (situation with 1 ° of resolution is made as all geometric systems) lower floor's reflected light component (Lru) (S13 of Figure 13) in all geometric systems here, according to above-mentioned refraction theory and attenuation theory.The lower floor's reflected light component (Lru) that calculates is stored in the second memory 252 in the storage part 203.

Then, select the non-mirror reflection geometric system, import these non-mirror reflection geometric systems, and judge the drift angle brightness value (S14 of Figure 13) in this non-mirror reflection geometric system from operation inputting part 202.According to the scattered reflection light component (Lrd) in non-mirror reflection geometric system of drift angle brightness value calculating of measuring.Then, according to the scattered reflection light component (Lrd) in the non-mirror reflection geometric system that calculates here, by ask the scattered reflection light component (Lre) (S16 of Figure 13) in all geometric systems with the match of Oren-Nayar model.In addition, the roughness variable σ of the employed CONCENTRATION DISTRIBUTION of calculating of the scattered reflection light component (Lrd) here is the roughness variable σ p of the CONCENTRATION DISTRIBUTION of the sample imported in advance from operation inputting part 299.

And then, select the direct reflection geometric system, from operating portion 202 these direct reflection geometric systems of input, measure the drift angle brightness value (S17 of Figure 13) in the direct reflection geometric system.According to the surface reflection light component (Lrs) in direct reflection geometric system of drift angle brightness value calculating of measuring and the reflected light component (Lrsp) (S19 of Figure 13) of pigment particles.That is the Torrance-Sparrow Model Calculation value LrTSp of the reflected light component Lrsp of the Torrance-Sparrow Model Calculation value LrTSs of gauging surface reflected light component Lrss and pigment particles.In addition, the roughness variable σ of the employed CONCENTRATION DISTRIBUTION of calculating of the reflected light component of the pigment particles here (Lrsp) is the roughness variable σ p of the CONCENTRATION DISTRIBUTION of the sample imported in advance from operation inputting part 202.In addition, the roughness variable σ of the employed surface configuration of calculating of the surface reflection light component (Lrss) here is the roughness variable σ s of the surface configuration of the sample imported in advance from operation inputting part 202.

And, reflected light component (Lrsp) according to surface reflection light component (Lrs) in the direct reflection geometric system of calculating here and pigment particles, by using the match of Torrance-Sparrow model, ask the surface reflection light component (Lrs) in all direct reflection geometric system and the reflected light component (Lrsp) (S20 of Figure 13) of pigment particles.That is, form parameter calculating part 215 is asked each distribution according to above-mentioned Model Calculation value LrTSs and LrTSp, distributes based on this, calculates the surface reflection light component Lrss of all direct reflection geometric systems and the reflected light component Lrsp of pigment particles.

Figure 18 represents in order to import selecteed non-mirror reflection geometric system and direct reflection geometric system one example of data presented input picture in display board 222.Here, import non-mirror reflection geometric system and direct reflection geometric system simultaneously, but the present invention not necessarily is defined in this.Show in the input picture data shown in Figure 180: the cuit 62 of the incident angle of non-mirror reflection geometric system, the project 63 of light-receiving angle, OK button 64, cancel button 65 and return push-button 66.Here, OK button 64, cancel button 65 and return push-button 66 are touch plate type.In addition, under the situation of having pushed cancel button 65, withdraw from this input picture data and force and finish mode determination, under the situation of having pushed return push-button 66, turn back to input picture data shown in Figure 17.

Cuit appointment about the non-mirror reflection geometric system is used for match scattered reflection light component (Lrd) geometric system, specifies the geometric system that is used for fit surface reflected light component (Lrss) about the cuit of direct reflection geometric system.Need indivedual incident angle and light-receiving angles of specifying the non-mirror reflection geometric system, but the incident angle of direct reflection geometric system and light-receiving angle equate, if therefore only incident angle is input to the cuit 62 of incident angle, then in the project 63 of light-receiving angle, show identical value.

Input non-mirror reflection geometric system and direct reflection geometric system are arranged on the sample that has formed toner image after the drift angle brightness measuring portion 204, push OK button 64.So, carry out above-mentioned S14～S20 (wherein, S15, S17 are owing to undertaken by external device (ED) in advance, therefore remove) processing, calculate the reflected light component (Lrsp) of lower floor's reflected light component (Lru), scattered reflection light component (Lrd), surface reflection light component (Lrss) and pigment particles in all geometric systems, these values are to set up corresponding state storage in second memory 252 with each of identical geometric system.

Here, be described more specifically the method that derives the scattered reflection light component (Lrd) in all geometric systems.

At first, in the display part 222 that has shown input picture data as shown in figure 18, after the incident angle of the non-mirror reflection geometric system of input and the data of light-receiving angle are sent to Lrd calculating part (not shown) temporarily, be imported into drift angle brightness measuring portion 204.In drift angle brightness measuring portion 204, measure the drift angle brightness (Lra) in the geometric system that is transfused to, and the data of measured value are sent to the Lrd calculating part.

At the Lrd calculating part, select the data in being stored in second memory 252 and obtain the data of the lower floor's reflected light component (Lru) that in identical geometric system, calculates, remove above-mentioned lower floor reflected light component (Lru) from above-mentioned drift angle brightness (Lra).And then,, make surface reflection light component Lrd be approximately 0 here, remaining reflected light component is made as scattered reflection light component (Lrd).

Like this, the data of the scattered reflection light component (Lrd) that is calculated by the Lrd calculating part are sent to Lrd and are fit to portion (not shown).Lrd is fit to portion for the scattered reflection light component (Lrd) that transmits, and uses the Oren-Nayar model to carry out match.Thus, the scattered reflection light component (Lrd) in all geometric systems is derived, and these data are stored in the second memory 252.

Then, carry out more specific description for the method for the reflected light component (Lrsp) that derives surface reflection light component (Lrss) in all direct reflection geometric systems and pigment particles.

At first, in as shown in figure 18 demonstration in the display part 222 of input picture data, the incident angle of direct reflection geometric system of input and the data of light-receiving angle are sent to Lrss calculating part (not shown) and Lrsp calculating part (not shown) afterwards temporarily, are imported into drift angle brightness measuring portion 204.In drift angle brightness measuring portion 204, measure the drift angle brightness (Lrb) in the geometric system that is transfused to, and the data of measured value are sent to Lrss calculating part and Lrsp calculating part.

At the Lrss calculating part, select the data in being stored in second memory 252 and obtain the data of the lower floor's reflected light component (Lru) that in identical geometric system, calculates and the data of the scattered reflection light component (Lrd) that in identical geometric system, calculates, remove above-mentioned lower floor reflected light component (Lru) and above-mentioned scattered reflection light component (Lrd) from above-mentioned drift angle brightness (Lrb), use the Torrance-Sparrow model, computation model calculated value (LrTSs).

In addition, in the Lrsp calculating part, also select the data in being stored in second memory 252 and obtain the data of the lower floor's reflected light component (Lru) that in identical geometric system, calculates and the data of the scattered reflection light component (Lrd) that in identical geometric system, calculates, remove above-mentioned lower floor reflected light component (Lru) and above-mentioned scattered reflection light component (Lrd) from above-mentioned drift angle brightness (Lrb), use the Torrance-Sparrow model, computation model calculated value (LrTSp).

And then, at form parameter calculating part 215, according to the above-mentioned Model Calculation value (LrTSs) that calculates and (LrTSp), drift angle brightness (Lrb) is calculated and is satisfied the form parameter k of Lrb=k * LrTSs+ (1-k) * LrTSp, thereby determines the allocation proportion of the reflected light component Lrsp of surperficial reflected light component Lrss and pigment particles.Thus, determine one in the direct reflection geometric system surface reflection light component (Lrss) and the reflected light component (Lrsp) of pigment particles.

The data of the surface reflection light component (Lrss) that as above calculates and the reflected light component (Lrsp) of pigment particles are sent to respectively, and Lrss is fit to portion (not shown) or Lrsp is fit to portion (not shown).Be fit to use the Torrance-Sparrow model to carry out match for the reflected light component (Lrsp) of surface reflection light component (Lrss) that transmits or pigment particles in portion and the suitable portion of Lrsp at Lrss.Thus, derive the surface reflection light component (Lrss) in all direct reflection geometric systems and the reflected light component (Lrsp) of pigment particles, these data are stored in the second memory 252.

By carrying out processing as above, in second memory 252, the reflected light component (Lrsp) of the lower floor's reflected light component (Lru) in all direct reflection geometric systems, scattered reflection light component (Lrd), surface reflection light component (Lrss) and pigment particles and each geometric system association store.Therefore, direct reflection light component calculating part 214 is with each the reflected light component addition in the identical direct reflection geometric system.Thus, can obtain direct reflection light component Lr (S21 of Figure 13) in all direct reflection geometric systems.

Then, the data of the measurement result of the direct reflection light component Lr that obtains here are sent to operation inputting part 202, and are shown by display part 222.Figure 19 represents the picture of the routine measurement result that show this moment in display part 222.

As shown in figure 19, after having measured direct reflection light component Lr, curve Figure 70 of display part 222 display mirror reflected light component Lr, the cuit 71 of direct reflection geometrical system, be input to result of calculation 74, OK button 75, cancel button 76 and the return push-button 77 of direct reflection geometric system of cuit 73, threshold value that expression is input to cuit 73 of result of calculation 72, glossiness threshold value of direct reflection light component Lr of the geometric system of cuit 71.In curve Figure 70 of direct reflection light component Lr, demonstration can be with the curve map of the guide look of all direct reflection light component Lr of incident angle when 10 °～80 ° change.Therefore, can know the angle dependence characteristic of the direct reflection light component of sample from this curve Figure 70.Result shown in this curve Figure 70 is the result of reflected light component Lrsp addition that will be kept at the reflected light component Lru of lower floor, scattered reflection light component Lrd, surface reflection light component Lrss and the pigment particles of all direct reflection geometric systems in the second memory 252 by direct reflection light component calculating part 214.

In addition,, the cuit 71 of direct reflection geometric system shown in Figure 19 is imported angle arbitrarily, and push OK button 75 at above-mentioned bright luster prediction unit 200, thus the value of the direct reflection light component of the angle that also can obtain importing.Here 1 of curve Figure 70 of the calculated value of this moment that obtains and direct reflection light component Lr equates.

On the other hand, the cuit 73 of glossiness threshold value is imported the direct reflection light component (, being equivalent to brightness value here) that requires, and push OK button 75, thereby in result of calculation 74, show the angle of the direct reflection light component that becomes input.According to this result of calculation, the above angle of the angle that obtains here as can be known is equivalent to have the above angle of direct reflection light component that is transfused to.In other words, bright luster prediction unit 200 according to present embodiment, can calculate direct reflection light component, therefore the specular light component value more than can confirming whether represent necessarily under the situation that has adopted which kind of direct reflection geometric system (incident and light-receiving angle) for all direct reflection geometric systems.This value is effective as the new metewand of glossiness.

In addition, in result screen shown in Figure 19, under the situation of having pushed cancel button 76, withdraw from and force to finish mode determination, under the situation when having pushed return push-button 77, turn back to input picture data shown in Figure 180 from this result screen.

In addition, under the situation of the glossiness that will be transformed to the JIS standard, ask relative value, calculate glossiness and get final product based on value as the on-gauge plate (glass plate of refractive index 1.567) of master sample appointment by the specular light component value of said method prediction.

In addition, above-mentioned mirror surface luster prediction unit 200 system that also can use a computer realizes.As this computer system, adopt with embodiment 1 for example in the same structure of computer system 300 (with reference to Figure 12) of explanation.

In addition, various processes and embodiment 1 that each several part 21～215 exclusive disjunction portions 201 that comprise in the operational part 201 of the bright luster prediction unit 200 of above-mentioned embodiment carry out are same, arithmetic units such as CPU are carried out program stored in the memory units such as ROM (Read Only Memory) or RAM, can realize by communication components such as display unit such as input blocks such as supervisory keyboard, display or interface circuits.Thereby, the computing machine with these parts only by reading and recording said procedure recording medium and carry out this program, just can realize the various functions and the various processing of the bright luster prediction unit 200 of embodiment.In addition, by said procedure being recorded in movably in the recording medium, can realize above-mentioned various functions and various processing on the computing machine arbitrarily.

[embodiment 3]

Based on illustrating that from Figure 24 to Figure 28 the 3rd embodiment of the present invention is as follows.At above-mentioned embodiment 1, illustrated that the colorant layer that constitutes sample does not limit the size of pigment particles such as dye ink, paint ink, toner and adaptable bright luster Forecasting Methodology especially, but in the present embodiment, same with second embodiment, illustrate under the bigger situation of the diameter of the pigment particles that comprises in the colorant layer (promptly, pigment particles is under the situation of pigment such as paint ink or toner), calculate the bright luster Forecasting Methodology and the bright luster prediction unit of the bright luster component of test portion more accurately.As above-mentioned pigment, can enumerate pigment pattern, toner etc.In addition, in the present embodiment,, select a direct reflection geometric system and two non-mirror reflection geometric systems as the geometric system of afore mentioned rules, but different aspect the drift angle brightness value in measuring these geometric systems with above-mentioned embodiment 1 and 2.

At first, in the bright luster prediction unit of present embodiment, the employed bitintability reflection of prediction (BRDF) model theory of the mirror surface luster of sample is described.In addition, the method for using above-mentioned BRDF model under the situation of the reflected light component of calculating test portion is described, this test portion has as pigment particles and comprises base material and as the double-decker of the colorant layer of the toner of pigment.

Figure 14 schematically represents to have the dividing method of the reflected light component of double-deck test portion.As shown in figure 14, sample 23 comprises the top section 34 that is made of toner image (colorant layer) and by paper or see through the underclad portion 33 that base material such as film constitutes.According to bitintability reflection (BRDF) model theory, as each reflected light component from light source 6, enumerate from the surface reflection light component (Lrss) 27 of top section 34 and internal reflected light component 35, from the surface reflection component 30 and the internal reflected light component 31 of underclad portion 33, these complex light are the reflected light from sample 23.And then, in the present embodiment, can be divided into from the pigment particles directly reflected light component (Lrsp) 28 of reflection and the scattered reflection light component (Lrd) 29 by the scattering between pigment particles from the internal reflected light component 35 of top section 34.For by each reflected light component 27～31 of BRDF Model Calculation, need to estimate a plurality of as undeterminable parameter (parameter).

But, owing to be difficult to measure internal reflected light component 31 from underclad portion 33, therefore the present invention will consider as compound and reflected light component from the surface reflection component 30 and the internal reflected light component 31 of underclad portion 33, and handle as lower floor's reflected light component (Lru) 32.By calculating this lower floor's reflected light component 32, thereby realize by the light quantity of direct reflection accurately in the various image patterns of BRDF Model Calculation based on the measured data of underclad portion 33 only.Thus, if calculate, then can obtain direct reflection light quantity accurately from the surface reflection light component 27 of top section 34, reflected light component 28, scattered reflection light component 29 and lower floor's reflected light component 32 of pigment particles.

In the present invention, as the effective BRDF pattern of the calculating formula model that is used to calculate each reflected light component, can enumerate each model shown in (1) the Ward model shown in the above-mentioned embodiment 1, (2) Phong model, (3) Oren-Nayar model, (4) Torrance-Sparrow model.

In above-mentioned each formula model, being that the model that prerequisite is advised is Ward model, Phong model with the isotropic scatterning of light, is that the model that prerequisite is advised is Oren-Nayar model, Torrance-Sparrow model with the non-isotropy scattering of light.Though calculating formula is complicated, but can calculate value accurately owing to comprise the non-isotropy scattering of light, therefore in the present embodiment, use the Torrance-Sparrow model as the calculating formula model that is used for the reflected light component 28 of gauging surface reflected light component 27 and pigment particles, use the Open-Nayar model as the calculating formula model that is used to calculate the scattered reflection light component 29 that the scattering between pigment particles causes.

In addition, Fig. 5 represents the geometry configuration in the BRDF model, and Fig. 6 represents the geometric definition of the body surface in the BRDF model.

Use under the situation of Oren-Nayar Model Calculation scattered reflection light component Lrd, at first, calculate Oren-Nayar Model Calculation value LrON by following formula (7).

(formula 7)

$\mathrm{LrON}=\frac{\mathrm{\&sigma;}}{\mathrm{\&pi;}}\mathrm{<figure-callout\; id="0"\; label="E"\; filenames="C200510118742E00811.png,C200510118742E00821.png"\; state="\{\{state\}\}">E</figure-callout>}0\cos \mathrm{\&theta;i}[C1\left(\mathrm{\&sigma;}\right)+\cos (\mathrm{\&phi;r}-\mathrm{\&phi;i})C2(\mathrm{\&alpha;};\mathrm{\&beta;};\mathrm{\&phi;r}-\mathrm{\&phi;i};\mathrm{\&sigma;})\tan \mathrm{\&beta;})$

$+(1-\left|\cos (\mathrm{\&phi;r}-\mathrm{\&phi;i})\right|)C3(\mathrm{\&alpha;};\mathrm{\&beta;};\mathrm{\&sigma;})\tan \left(\frac{\mathrm{\&alpha;}+\mathrm{\&beta;}}{2}\right)$

$+0.17\frac{{\mathrm{\&rho;}}^2}{\mathrm{\&pi;}}\mathrm{<figure-callout\; id="0"\; label="E"\; filenames="C200510118742E00811.png,C200510118742E00821.png"\; state="\{\{state\}\}">E</figure-callout>}0\cos \mathrm{\&theta;i}\frac{{\mathrm{\&sigma;}}^2}{{\mathrm{\&sigma;}}^2+0.13}[1-\cos (\mathrm{\&phi;r}-\mathrm{\&phi;i}){\left(\frac{2\mathrm{\&beta;}}{\mathrm{\&pi;}}\right)}^2]$

$\mathrm{<figure-callout\; id="1"\; label="C"\; filenames="C200510118742E00701.png,C200510118742E00731.png"\; state="\{\{state\}\}">C</figure-callout>}1=1-0.5\frac{{\mathrm{\&sigma;}}^2}{{\mathrm{\&sigma;}}^2+0.33}\&CenterDot;\&CenterDot;\&CenterDot;\&CenterDot;\left(7\right)$

$\mathrm{<figure-callout\; id="3"\; label="C"\; filenames="C200510118742E00692.png,C200510118742E00701.png"\; state="\{\{state\}\}">C</figure-callout>}3=0.125\left(\frac{{\mathrm{\&sigma;}}^2}{{\mathrm{\&sigma;}}^2+0.09}\right){\left(\frac{4\mathrm{\&alpha;\&beta;}}{{\mathrm{\&pi;}}^2}\right)}^2$

In above-mentioned formula, θ i is the zenith angle of light source direction, and φ i is the position angle of light source direction, and θ r is the zenith angle of light-receiving direction, φ r is the position angle of light-receiving direction, σ is the roughness variable of surface configuration, and E0 is the radiant illumination to sample incident, and ρ is small a reflectivity of sample surface, α=max[θ r, θ i], β=min[θ r, θ i] (with reference to Fig. 5, Fig. 6).In addition, the calculating formula of this LrON is identical with the calculating formula of use in the embodiment 1,2.

In addition, use the Torrance-Sparrow model, according to the reflected light component Lrsp of following formula (8) gauging surface reflected light component Lrss and pigment particles as each Torrance-Sparrow Model Calculation value LrTS (that is, LrTSs and LrTSp).

(formula 8)

$\mathrm{LrTS}=E0\frac{\mathrm{F\; GAF}}{\cos \mathrm{\&theta;}r\cos \mathrm{\&theta;a}}c{e}^{-\frac{{\mathrm{\&theta;a}}^2}{{2\mathrm{\&sigma;}}^2}}$

$\mathrm{GAF}=\max [0,\mathrm{Min}[1,\frac{2<s,n><a,n>}{<s,a>},\frac{2<v,n><a,n>}{<v,n>}]]\&CenterDot;\&CenterDot;\&CenterDot;\&CenterDot;\left(8\right)$

$c={\&Integral;}_{\mathrm{\&theta;a}=0}^{\frac{\mathrm{\&pi;}}{2}}{\&Integral;}_{\mathrm{\&phi;a}=0}^{2\mathrm{\&pi;}}{e}^{-\frac{{\mathrm{\&theta;a}}^2}{{2\mathrm{\&sigma;}}^2}}\sin \mathrm{\&theta;ad\&phi;ad\&theta;a}$

In above-mentioned formula, F is the Fresnel reflection rate, n is the normal vector of sample 23, and S is the light source direction vector, and v is the light-receiving direction vector, a is the bisection vector of s and v, θ r is the zenith angle of light-receiving direction, and θ a is the zenith angle of vector a, and φ a is the position angle of vector a, σ is the roughness variable of surface configuration, and E0 is the radiant illumination that incides sample.In addition, in above-mentioned formula,＜x, y〉inner product (with reference to Fig. 5, Fig. 6) of (x, y are several arbitrarily) expression vector.In addition, the calculating formula of this LrTS is identical with the calculating formula of use in the embodiment 1.

Then, based on the flowchart text said method of Figure 24, the measured value of the brightness in the geometric system is according to the rules calculated the method for the direct reflection light quantity of all geometric systems.

At first, in order to calculate the reflected light component Lru of lower floor, only calculate the transmitance (step S21) of the top section (toner image) 34 of the sample that will calculate the direct reflection light component.The mensuration geometric system here disposes light source, sample, optical receiver point-blank.In such geometric system, directly over sample, inject light source, be configured in sample under the light that receives of optical receiver as light through sample, come instrumentation by the penetrating concentration meter.Here, only measure the sample (samples that top section 34 and underclad portion 33 constitutes) of toner image and the sample of underclad portion (paper) 33, obtain the former and the latter's difference, thereby can obtain the only penetrating concentration Dt of top section 34 by the penetrating concentration meter.Have, only the transmitance Tt of top section 34 (that is toner image) can pass through Tt=10^ (Dt) calculating again.

In addition, for the refractive index of the top section of in following step, using (toner image) 34, be used as the refractive index (literature value) of resin of the major component of toner.

Then, mensuration is with top section 34 non-existent samples, the i.e. sample of underclad portion 33 only, under the situation of present embodiment, preparation is printed the paper before the toner image or is seen through film, and only the light source incident direction and the light-receiving direction of the sample of underclad portion 33 are made as high-resolution drift angle brightness value (step S22) for these.In addition,, the measured value space is made as CIE1976L here ^*a ^*b ^*(CIE:CommissionInternational de l ' Eclairage: International Commission on Illumination.L ^*: lightness, a ^*, b ^*: colourity) space, therefore adopt L ^*Value as above-mentioned drift angle brightness value.The resolution of the angle of this moment is restriction especially not, but because the angular resolution limit of general determinator is 1 °, so be made as 1 ° in the present embodiment.That is, in the present embodiment, measure the drift angle brightness value for the whole geometric systems that each angle shown in Figure 5 departed from 1 ° at every turn.In addition, in order more correctly to carry out the calculating of direct reflection light component, preferably the resolution of its angle is smaller or equal to 1 °.

And, according to the reflected light component Lru of lower floor (step S23) in all geometric systems of these data computation.Figure 15 is the synoptic diagram of the decay of the refraction effect of the light considered when conceptually representing to calculate the reflected light component Lru of lower floor and light quantity.The light that incides sample with the angle of θ i produces refraction effect on the interface of air layer 36 and top section 34.This refraction effect is according to the Fresnel theory, and the angle θ t after the refraction defers to Fresnel rule (refractive index of medium before the incident is made as n1, when the refractive index of medium after the incident is made as n2, n1 * sin θ i=n2 * sin θ t) and finds the solution.Light by toner layer is decayed at the interface owing to refraction effect, and this Fresnel transmitance Tn is by formula (9) expression.

(formula 9)

$\mathrm{Tn}=[\left(\frac{n2\cos \mathrm{\&theta;<figure-callout\; id="1"\; label="t\; n"\; filenames="C200510118742E00701.png,C200510118742E00731.png"\; state="\{\{state\}\}">t</figure-callout>}}{n}\right){\left(\frac{2\mathrm{<figure-callout\; id="1"\; label="n"\; filenames="C200510118742E00701.png,C200510118742E00731.png"\; state="\{\{state\}\}">n</figure-callout>}1\cos \mathrm{\&theta;i}}{n2\cos \mathrm{\&theta;i}+\mathrm{<figure-callout\; id="1"\; label="n"\; filenames="C200510118742E00701.png,C200510118742E00731.png"\; state="\{\{state\}\}">n</figure-callout>}1\cos \mathrm{\&theta;t}}\right)}^2+\left(\frac{n2\cos \mathrm{\&theta;<figure-callout\; id="1"\; label="t\; n"\; filenames="C200510118742E00701.png,C200510118742E00731.png"\; state="\{\{state\}\}">t</figure-callout>}}{n}\right){\left(\frac{2\mathrm{<figure-callout\; id="1"\; label="n"\; filenames="C200510118742E00701.png,C200510118742E00731.png"\; state="\{\{state\}\}">n</figure-callout>}1\cos \mathrm{\&theta;i}}{n1\cos \mathrm{\&theta;i}+n2\cos \mathrm{\&theta;t}}\right)}^2]/2$

····(9)

In addition, when light passed through in the top section 34, light arrived underclad portion 33 then by top section 34 decay.This attenuation effect according to the Beer-Lambert rule (absorption coefficient of colorant layer is made as a, the thickness of colorant layer is made as d, when transmitance is made as T ,-logT=a * d).Because incident angle changes, till light arrived underclad portion 33, light was by the optical path length variation of top section 34.Therefore,, then be-logTt '=a * (d/cos θ i) to estimate the decay of light by this lip-deep transmitance as calculating the lip-deep transmitance Tt ' corresponding with this optical path length variation.

By more than, on the basis that the incident angle to the light of underclad portion 33 changes because of refraction effect, use the lip-deep transmitance Tt ' corresponding, estimate the decay of light quantity, thereby can calculate the incident light quantity of the light that arrives underclad portion 33 with Fresnel transmitance Tn and optical path length variation.Such optical phenomena is radiated at the reflected light from underclad portion 33 under the situation of air layer and produces too.Thereby, drift angle brightness value to the sample that only constitutes by underclad portion (paper) in S22, measured, consideration is as the refraction effect of the light of above-mentioned secondary and the attenuating (with reference to Figure 15) of light, calculate with whole incident angles and light-receiving angle, thereby can calculate the reflected light component Lru of lower floor.Here, have under the situation of the value below the radix point at the incident angle θ t after the refraction, the value of the angle before and after it is carried out proportional distribution, thereby carries out interpolation.The resolution of the angle of this moment is restriction especially not, but because the angular resolution ultimate value of determinator is 1 °, therefore is made as 1 ° here.In addition, in order to carry out the calculating of direct reflection light component more accurately, preferably the resolution of this angle is smaller or equal to 1 °.

Then, in comprising a certain geometric system of surface reflection light component hardly, measure the brightness value L ra (CIE1976L of sample ^*a ^*b ^*L ^*) (step S24).This geometric system is called the non-mirror reflection geometric system.Usually, because then the surface reflection light component is more little away from the geometric system of direct reflection more, therefore preferably the light source incident angle is big for the non-mirror reflection geometric system of selecting here, and the approaching geometric system of light source incoming position and light-receiving position.In present embodiment, as an example of the first non-mirror reflection geometric system, selecting light source incident angle θ i is 45 ° (φ i is 0 °), and light-receiving angle θ r is the geometric system of-60 ° (φ r is 0 °).

Then, in comprising a certain geometric system of surface reflection light component a little, measure the brightness value L rc (CIE1976L of sample ^*a ^*b ^*L ^*) (step S25).This geometric system is called the second non-mirror reflection geometric system.Here the second non-mirror reflection geometric system of Xuan Zeing is between the first non-mirror reflection geometric system and direct reflection geometric system, and preferably keep clear of any geometric system roughly in the middle of geometric system.In present embodiment, as an example of the second non-mirror reflection geometric system, selecting light source incident angle θ i is 45 ° (φ i is 0 °), and light-receiving angle θ r is the geometric system of 0 ° (φ r is 0 °).

Then, in a certain direct reflection geometric system, measure the brightness value L rb (CIE1976L of sample ^*a ^*b ^*L ^*) (step S26).This geometric system is called the direct reflection geometric system.Here the direct reflection geometric system of Xuan Zeing is that light source incident angle θ i is 45 ° (φ i is 0 °), and light-receiving angle θ r is the geometric system of 45 ° (φ r is 180 °).In addition, be not limited to this angle among the present invention.

Below, the CONCENTRATION DISTRIBUTION of the toner image of mensuration sample, and according to measured value calculating roughness variable σ p (step S27).Then, in addition, measure the surface configuration of sample, and calculate its roughness variable σ s (step S28) according to measured value.The concrete computing method of the roughness variable σ s of back narration roughness variable σ p and surface configuration.

Then, the brightness value L rc that measures to the brightness value L ra that measures at S24, at S25 and use Torrance-Sparrow model and Oren-Nayar model to carry out match (step S29) at the brightness value L rb that S26 measures.Below be described in detail this fit procedure.

Above-mentioned Lra, Lrb, Lrc are surface reflection light component Lrss, pigment particles reflected light component Lrsp, scattered reflection light component Lrd, the reflected light component Lru of lower floor sum.Thereby the component of having removed Lru from Lra, Lrb or Lrc all is equivalent to Lrss, Lrsp and Lrd's and (being the upper strata reflected light component).

Here, for the allocation proportion of the surface reflection light component, pigment particles reflected light component and the scattered reflection light component that determine to comprise in the upper strata reflected light component (be Lrss, Lrsp and Lrd's and), derived parameter kss, ksp and kd.Wherein,

kss+ksp+kd＝1......(4)

。In this case, the upper strata reflected light component is used the formula (5) that Torrance-Sparrow model and Oren-Nayar model can be expressed as

Lrss+Lrsp+Lrd＝kss×LrTSs+ksp×LrTSp+kd×LrON......(5)

。Wherein, in the formula (5), LrTSs is the Torrance-Sparrow Model Calculation value of surface reflection light component Lrss, and LrTSp is the Torrance-Sparrow Model Calculation value of pigment particles reflected light component Lrsp, and LrON is the Oren-Nayar Model Calculation value of scattered reflection light component Lrd.

In addition, the roughness variable σ of the Torrance-Sparrow model that use this moment is the parameter of the expansion of reflected light component on the definition physical model, so under the situation of surface reflection light component Lrss, adopt the roughness variable σ s of the surface configuration of obtaining among the step S28, under the situation of the reflected light component Lrsp of pigment particles, adopt the roughness variable σ p of the CONCENTRATION DISTRIBUTION of in step S27, obtaining.In addition, adopt the roughness variable σ p of the CONCENTRATION DISTRIBUTION of in step S27, obtaining at the roughness variable σ of Oren-Nayar model.E0 (with reference to Fig. 5) is the radiant illumination that incides sample, but, the measured value space is made as CIE1976L here ^*a ^*b ^*The space is owing to adopt L ^*, therefore be made as 100 π.For the surface reflection of asking the direct reflection geometric system F is made as 1.

And, the left side in formula (5), substitution has been removed the Lru in the first non-specular surface geometric system that calculates according to the Lra that measures in step S23 component (promptly, Lra-Lru), to each modular form substitution on the right θ i corresponding, θ r, φ i, φ r, thereby set up formula (6) with the first non-specular surface geometric system.

Equally, the left side substitution of formula (5) has been removed the Lru in the second non-specular surface geometric system that calculates according to the Lrc that measures in step S23 component (promptly, Lrc-Lru), in each modular form on the right, θ i, θ r, φ i, φ r that substitution is corresponding with the second non-specular surface geometric system, thus formula (7) set up.

And then, the left side in formula (5), the Lru in the minute surface geometric system that calculates according to the Lrb that measures has been removed in substitution in step S23 component (promptly, Lrb-Lru), in each modular form on the right, θ i, θ r, φ i, φ r that substitution is corresponding with the minute surface geometric system, thus formula (8) set up.

Then, by separating formula (6)～(8) and formula (4), determine the parameter ρ of the unknown in the Oren-Nayar model and parameter kss, ksp, the kd (step S29) of expression allocation proportion.In addition, small reflectivity ρ of sample surface does not get negative value on physical model, so only adopt on the occasion of (ρ〉0).

By using Oren-Nayar Model parameter ρ that as above determines and parameter kss, ksp, the kd that represents allocation proportion, calculate surface reflection light component Lrss, pigment particles reflected light component Lrsp and scattered reflection light component Lrd (step S30) in all geometric systems.

In more detail, for

Lrss＝kss×LrTSs

Lrsp＝ksp×LrTSp

Lrd=kd * LrON, by to above-mentioned Model Calculation formula substitution θ i, θ r, φ i, the φ r corresponding that comprises in various, calculate upper surface reflected light component Lrss, pigment particles reflected light component Lrsp and scattered reflection light component Lrd in all geometric systems with all geometric systems.

And, by the reflected light component Lru of lower floor that will in the step S23 in the same geometric system, obtain and the upper surface reflected light component Lrss, the pigment particles reflected light component Lrsp that in step S30, obtain and scattered reflection light component Lrd addition, can obtain direct reflection light component (direct reflection light component) Lr.All geometric systems are asked this direct reflection light component Lr (step S31).

In addition,, when the calculating (step S16) of scattered reflection light component Lrd, Lrss and Lrsp are approximately 0, and do not use such being similar in the present embodiment at above-mentioned embodiment 2.Thus, in present embodiment, can ask each reflected light component and direct reflection light quantity more accurately.

Above-mentioned bright luster Forecasting Methodology owing to supposed all images (low gloss image, low concentration image etc.), is that top section and underclad portion are prerequisite will measure sample separation therefore.But, (sample of high concentration and high glaze) is not limited to this under the situation of special mensuration sample, only uses reflected light component (the reflected light component Lrsp of surface reflection light component Lrss, pigment particles and scattered reflection light component Lrd) the calculating direct reflection light component Lr of top section also passable.This is because in this case, because the reflected light component Lru of lower floor is few, therefore the influence to direct reflection light component Lr reduces.

In addition, in present embodiment,, in step S22, measured the drift angle brightness value in all geometric systems, but the present invention is not limited to this in order in step S31, to calculate the direct reflection light component Lr in all geometric systems.For example, under the situation of the direct reflection light component in the geometric system that only will calculate some requirements, in step S22, as long as the drift angle brightness value in each pairing each geometric system of geometric system, the first non-mirror reflection geometric system, the second non-mirror reflection geometric system and direct reflection geometric system that mensuration requires is just enough.In addition, ' the geometric system of requirement, the first non-mirror reflection geometric system, the second non-mirror reflection geometric system, and each corresponding respectively geometric system of direct reflection geometric system ' be the geometric system of having considered the refractive index in the top section 34, in more detail, be meant the geometric system that is requiring, the first non-mirror reflection geometric system, the second non-mirror reflection geometric system, and make light incident test portion in each of direct reflection geometric system, and when measuring the light of reflection by light receiver, by the actual incident angle that incides underclad portion 33 of light, and inject the geometric system that reflection angle that the light of light receiver reflects constitutes in underclad portion 33.In addition, in this case, in step S30, S31 also as long as each reflected light component in the geometric system of calculation requirement just can.This for above-mentioned embodiment 1 and 2 too.

In addition, in above-mentioned bright luster Forecasting Methodology, step S21～S23 is that lower floor's reflected light component generates step, and step S24～S30 is that the upper strata reflected light component generates step, and step S31 is a direct reflection light component calculation procedure.

The structure of the bright luster prediction unit of present embodiment then, is described.The bright luster prediction unit of present embodiment calculates the direct reflection light component of all direct reflection geometric systems by carrying out the processing shown in the process flow diagram shown in Figure 24, and according to the mirror surface luster of the direct reflection light component forecast sample that obtains.Figure 25 represents the structure of the bright luster prediction unit 400 of present embodiment.

As shown in figure 25, bright luster prediction unit 400 has as main component parts: operational part 401, operation inputting part 402, storage part 403, drift angle brightness measuring portion 404.

The drift angle brightness value of the sample that operational part 401 is measured based on the first non-mirror reflection geometric system/second non-mirror reflection geometric system/direct reflection geometric system of setting from the data of the roughness variable of the surface configuration of the roughness variable of the CONCENTRATION DISTRIBUTION of the refractive index of the top section (toner image) 34 of operation inputting part 402 input and transmitance, sample, sample, by operation inputting part 402 and by drift angle brightness measuring portion 404 calculates the direct reflection light component of sample.

In more detail, in operational part 401, comprise: lower floor's reflected light component calculating part (lower floor's reflected light component generating unit) 411, calculate lower floor's reflected light component (Lru); Upper strata reflected light component calculating part (upper strata reflected light component generating unit) 412, the reflected light component (Lrsp) of calculating scattered reflection light component (Lrd), surface reflection light component (Lrss) and pigment particles; And direct reflection light component calculating part (direct reflection light quantity calculating part) 414, calculate direct reflection light component (Lr).

Lower floor's reflected light component calculating part 411 calculates the lower floor's reflected light component (Lru) in all geometric systems based on the drift angle brightness value of the only underclad portion of measuring from the various data of operation inputting part 402 input and by drift angle brightness measuring portion 404.

In addition, direct reflection light component calculating part 414 each reflected light component by being calculated by lower floor's reflected light component calculating part 411 and upper strata reflected light component calculating part 412 for same geometric system is calculated the direct reflection light component (Lr) in this geometric system.In addition, in the present embodiment, the direct reflection light component that direct reflection light component calculating part 414 calculates in all geometric systems.

Upper strata reflected light component calculating part 412 calculates the reflected light component (Lrsp) of scattered reflection light component (Lrd), surface reflection light component (Lrss) and pigment particles based on the measurement result of the drift angle brightness value of the only underclad portion in a minute surface geometrical system and two the non-specular surface geometrical system to all geometrical system.In more detail, upper strata reflected light component calculating part 412 comprises form parameter calculating part (calculation of parameter portion) 415 and reflected light component calculating part 416, form parameter calculating part 415 is according to the measurement result of the drift angle brightness value in a direct reflection geometrical system and two the non-mirror reflection geometrical system, calculate the parameter ρ of the unknown in the above-mentioned Oren-Nayar model, and the scattered reflection light component that comprises in the reflected light component of expression upper strata, the surface reflection light component, the kss of the allocation proportion of the reflected light component of pigment particles, ksp, kd, reflected light component calculating part operation parameter ρ, kss, ksp, kd calculates the scattered reflection light component (Lrd) in all geometric systems, surface reflection light component (Lrss), and the reflected light component of pigment particles (Lrsp).

Operation inputting part 402 input is used to each numerical value of asking the direct reflection light component required, and expression is by the result of operational part 401 computings.This operation inputting part 402 comprises: carry out the input of numerical value etc. action button 421, show display part 422 by the information exclusive disjunction result of action button 421 inputs.

Measurement result in the storage part 403 storage drift angle brightness measuring portions 404 and the operation result in the operational part 401.The inside of storage part 403 comprises: the drift angle brightness value of the sample that only is made of underclad portion (paper) 33 that first memory (LUT1) 451, storage are measured by drift angle brightness measuring portion 404; And second memory (LUT2) 452, be stored in the value of each reflected light component that calculates in the operational part 401.

Drift angle brightness measuring portion 404 measures the sample that only is made of underclad portion (paper) 33, and the drift angle brightness with double-deck sample of underclad portion 33 and top section (toner image) 34.In addition, the resolution of the angle of drift angle brightness measuring portion 404 is 1 °, can measure drift angle brightness with 1 ° of increment.But, use under the situation of bright luster prediction unit 400 prediction mirror surface lusters, the sample that only is made of underclad portion (paper) 33 is measured drift angle brightness with 1 ° of increment, but, only a direct reflection geometric system and the drift angle brightness of two non-mirror reflection geometric systems mensuration just can for the sample that constitutes by underclad portion 33 and top section 34.

Then, with reference to Figure 24 and Figure 25 method with the mirror surface luster in all direct reflection geometric systems of above-mentioned bright luster prediction unit 400 forecast samples is described.

Be decided to be the transmitance (S1 of Figure 24) of top section of measuring the bright luster component and importing the sample (toner image) of bright luster prediction unit 400 by the penetrating concentration instrumentation at first, in advance.Use the penetrating concentration meter to the sample that forms toner image (sample that constitutes by top section 34 and underclad portion 33) and the sample mensuration penetrating concentration of underclad portion (paper) 33 only, by obtaining their difference, only measure the penetrating concentration Dt of top section 34, then, (formula Dt) calculates transmitance Tt by Tt=10^.With regard to the mensuration of penetrating concentration, for example can use the penetrating concentration meter X-rite820 of X-rite corporate system.

In addition, the calculating of the transmitance of top section 34 is carried out in S21 in the process flow diagram of Figure 24, but carries out in this bright luster prediction unit 400 under the situation of evaluation of bright luster, as mentioned above, measure by other device in advance, and from operation inputting part 402 inputs.

Then, use the measuring shape microscope VK-9500 (KEYENCE corporate system) etc. to carry out the measuring shape on toner layer surface, and carry out the calculating of the roughness variable of toner surface based on the elevation information of having obtained (sample being made as the data of the Z-direction under the situation on XY plane).According to calculating small the slope on toner layer surface with the elevation information of pixel adjacent, after the histogram that generates this slope of small, in the scope of 2 σ (data about 95.5%), ask the standard deviation of small area slope, as the roughness variable σ s of the surface configuration of colorant layer.

On the other hand, use seeing through of CCD camera C S-3910 (industrial group of TEL system) and light quantity output 200W to obtain the image that sees through of sample, and see through view data according to this and carry out the calculating of the roughness variable of CONCENTRATION DISTRIBUTION with light source etc.Sample (the CCD camera is set on the Z-direction under the situation that sample is made as the XY plane and sees through and use light source) is set at the CCD camera with between seeing through with light source, and obtains through image.After the concentration according to each pixel that sees through image that obtains generates histogram, in the scope of 2 σ (data about 95.5%), ask the standard deviation of penetrating concentration, as the roughness variable σ p of CONCENTRATION DISTRIBUTION.

In addition, the mensuration of the roughness variable σ s of the roughness variable σ p of the CONCENTRATION DISTRIBUTION of this sample and surface configuration, in the process flow diagram of Figure 24, in S27, S28, carry out, but in this bright luster prediction unit 400, carry out under the situation of evaluation of bright luster, as mentioned above, measure by other device in advance, and import simultaneously with transmitance and refractive index.

And, utilize transmitance, each roughness variable σ p and σ s, the refractive index of action button 421 inputs of operation inputting part 402 by the top section 34 of the sample of said method mensuration.Figure 26 represents an example of data presented input picture in the display part 422 of bright luster prediction unit 400.In the input picture data shown in Figure 27, cuit R23, OK button R24 and the cancel button R25 of the cuit R22 of the roughness variable (σ s) of the cuit 20 of the refractive index of the top section of demonstration mensuration target sample, the cuit R21 of transmitance (Tt), surface configuration, the roughness variable (σ p) of CONCENTRATION DISTRIBUTION.OK button R24 and cancel button R25 are the touch pad mode.Utilize action button 421 will be input to the cuit R23 of the roughness variable of the cuit R22 of roughness variable of cuit R21, surface configuration of cuit R20, the transmitance of the refractive index of display part shown in Figure 26 and CONCENTRATION DISTRIBUTION by refractive index, transmitance Tt, each roughness variable σ p and the σ s that said method obtains.In addition, in this input picture data, under the situation of having pushed cancel button R25, withdraw from and force to finish mode determination from this input picture data.

And the base material (the only sample of underclad portion) that will be made of the material identical with the base material that constitutes sample is arranged in the interior drift angle brightness measuring portion 404 of device, pushes OK button R24.Thus, in drift angle brightness measuring portion 404, measure the only drift angle brightness (CIE1976L of the sample of underclad portion ^*a ^*b ^*L ^*) (S22 of Figure 24).Here the drift angle brightness of Ce Dinging is kept in the first memory 451 in the storage part 403.

As drift angle brightness measuring portion 404, for example can use angle measurement spectrometer GP-2S (color corporate system in the village).In addition, only the light source incident angle in the drift angle brightness measuring of the sample of this underclad portion and the angular resolution of light acceptance angle are 1 °.Therefore, in the first memory 451, will be with the light source incident angle of 1 ° of increment and drift angle brightness value and each incident angle and the light-receiving angle corresponding stored of light acceptance angle mensuration.

Then, lower floor's reflected light component calculating part 411 is based on refractive index and the transmitance and the drift angle brightness value that is stored in the first memory 451 of the top section of importing from operation inputting part 402, calculate (situation with 1 ° of resolution is made as all geometric systems) lower floor's reflected light component (Lru) (S23 of Fig. 8) in all geometric systems here, according to above-mentioned refraction theory and attenuation theory.The lower floor's reflected light component (Lru) that calculates is stored in the second memory 452 in the storage part 403.

Then, select the first non-mirror reflection geometric system, from the incident angle and the light-receiving angle of the operation inputting part 402 inputs first non-mirror reflection geometric system.Its result, the drift angle brightness value L ra (S24 of Figure 24) that drift angle brightness measuring portion 404 measures in the first non-mirror reflection geometric system.Then, select the second non-mirror reflection geometric system,, measure the drift angle brightness value L rc (S25 of Figure 24) in this non-mirror reflection geometric system from the incident angle and the light-receiving angle of the operation inputting part 402 inputs second non-mirror reflection geometric system.Then, further select the direct reflection geometric system,, measure the drift angle brightness value L rb (S26 of Figure 24) in the direct reflection geometric system from the incident angle and the light-receiving angle of operation inputting part 402 these direct reflection geometric systems of input.

Figure 27 represents to be presented in order to import the selecteed first non-mirror reflection geometric system, the second non-mirror reflection geometric system and direct reflection geometric system the routine input picture data in the display part 422.Here, import the first non-mirror reflection geometric system, the second non-mirror reflection geometric system and direct reflection geometric system simultaneously, but needn't be defined in this in the present invention.Cuit R32, project R33, OK button R34, cancel button R35 and the return push-button R36 of light-receiving angle of the incident angle of the cuit R38 of the cuit R37 of the incident angle of the cuit R31 of the cuit R30 of the incident angle of the demonstration first non-mirror reflection geometric system and light-receiving angle, the second non-mirror reflection geometric system and light-receiving angle, direct reflection geometric system in the input picture data shown in Figure 27.Here, OK button R34, cancel button R35 and return push-button R36 are touch plate type.In addition, under the situation of having pushed cancel button R35, withdraw from this input picture data and force and finish mode determination, under the situation of having pushed return push-button R36, return input picture data shown in Figure 27.

In addition, the incident angle of the first non-mirror reflection geometric system and the second non-mirror reflection geometric system and light-receiving angle need to specify separately, the incident angle of direct reflection geometric system and light-receiving angle equate, therefore as long as only incident angle is imported the cuit R32 of incident angle, then in the project R33 of light-receiving angle, show, set identical value.

Like this, at the input first non-mirror reflection geometric system, the second non-mirror reflection geometric system and direct reflection geometric system, and the sample that will form toner image is arranged on after the drift angle brightness measuring portion 404, when pushing OK button R34, carry out the drift angle brightness value L ra in above-mentioned each geometric system, the mensuration of Lrb, Lrc.

And drift angle brightness value L ra, Lrb, Lrc in each geometric system of having measured are sent to upper strata reflected light component calculating part 412.Upper strata reflected light component calculating part 412 uses the match of Oren-Nayar model and Torrance-Sparrow model based on the drift angle brightness value L ra, Lrb, the Lrc that obtain, and calculates the reflected light component (Lrsp) (step S29, S30) of scattered reflection light component (Lrd), surface reflection light component (Lrs) and pigment particles in all geometric systems.

Following in more detail explanation.At first, the drift angle brightness value of being measured by drift angle brightness measuring value 404 is sent to the form parameter calculating part 415 of upper strata reflected light component calculating part 412.In addition, form parameter calculating part 415 is obtained the reflected light component Lru of lower floor the first non-mirror reflection geometric system, the second non-mirror reflection geometric system, the direct reflection geometric system from second memory 452.In addition, transmit roughness variable σ p and σ s from 402 pairs of form parameter calculating parts of operation inputting part 415.And, form parameter calculating part 415 carries out match by said method, calculates parameter kss, ksp, the kd (step S29) of match ratio of the reflected light component of the parameter ρ of small reflectivity being used for representing the Oren-Nayar model and expression scattered reflection light component, surface reflection light component and pigment particles.

The ρ that obtains, kss, ksp, kd are sent to reflected light component calculating part 416 from form parameter calculating part 415, reflected light component calculating part 416 calculates the reflected light component (Lrsp) (step S30) of scattered reflection light component (Lrd), surface reflection light component (Lrs) and pigment particles for all geometric systems by said method.And each reflected light component that reflected light component calculating part 416 will be obtained is set up corresponding with each of geometric system and is stored in the second memory 452.

Then, direct reflection light component calculating part 414 is to each geometric system, obtain the reflected light component (Lrsp) of lower floor's reflected light component (Lru), scattered reflection light component (Lrd), surface reflection light component (Lrs) and pigment particles from second memory 452, and with these each component additions, thereby calculate direct reflection light component (Lr) (step S31).In addition, in the present embodiment, all geometric systems are calculated direct reflection light component (Lr).And the direct reflection light component (Lr) in all geometric systems that calculate is sent to the display part 422 of operation inputting part 402, by display part to the user notification result.Figure 28 represents the picture of the routine measurement result that show this moment in display part 422.

As shown in figure 28, after calculating direct reflection light component Lr, the cuit R41 of the curve map R40 of display mirror reflected light component Lr, direct reflection geometric system in the display part 422, be input to result of calculation R47, OK button R43, cancel button R44 and the return push-button R45 of direct reflection geometric system of cuit R46, threshold value that expression is input to cuit R46 of result of calculation R42, glossiness threshold value of direct reflection light component Lr of the geometric system of cuit R41.In the curve map R40 of direct reflection light component Lr, show the curve map that to have a guide look of all direct reflection light component Lr when making incident angle from 10 °～80 ° variations.Therefore, the user can know the angle dependence characteristic of the direct reflection light component of sample from this curve map R40.Result shown in this curve map R40 is the result of reflected light component Lrsp addition that will be kept at the reflected light component Lru of lower floor, scattered reflection light component Lrd, surface reflection light component Lrss and the pigment particles of all direct reflection geometric systems in the second memory 452 by direct reflection light component calculating part 414.

In addition, in above-mentioned bright luster prediction unit 400, the cuit R41 of direct reflection geometric system shown in Figure 28 is imported angle arbitrarily, and push OK button 43, thus the value of the direct reflection light component of the angle that can obtain being transfused to.Here 1 data on the curve map R40 of the calculated value of this moment that obtains and direct reflection light component Lr equate.

On the other hand, the cuit R46 of glossiness threshold value is imported the direct reflection light component (, being equivalent to brightness value here) of requirement, and push OK button R43, thereby the angle that becomes the direct reflection light component that is transfused to is presented among the result of calculation R47.According to this result of calculation, the above angle of the angle that obtains here as can be known is equivalent to have the above angle of direct reflection light component that is transfused to.In other words, bright luster prediction unit 400 according to present embodiment, can calculate direct reflection light component, therefore the specular light component value more than can confirming whether represent necessarily under the situation that has adopted which kind of direct reflection geometric system (incident and light-receiving angle) for all direct reflection geometric systems.This value is effective as the new metewand of glossiness.

In addition, in result screen shown in Figure 28, under the situation of having pushed cancel button R44, withdraw from and force to finish mode determination, under the situation when having pushed the situation of return push-button R45, turn back to input picture data shown in Figure 27 from this result screen.

In addition, under the situation of the glossiness that will be transformed to the JIS standard, ask relative value, calculate glossiness and get final product based on value as the on-gauge plate (glass plate of refractive index 1.567) of master sample appointment by the specular light component value of said method prediction.

In addition, above-mentioned mirror surface luster prediction unit 400 system that also can use a computer realizes.As this computer system, for example can adopt with embodiment 1 in the explanation the same structure of computer system 300 (with reference to Figure 12).

In addition, various processes and embodiment 1 that the lower floor's reflected light component calculating part 411 that comprises in the operational part 401 of the bright luster prediction unit 400 of above-mentioned embodiment, upper strata reflected light component calculating part 412, direct reflection light component calculating part 414, operational part 401 carry out are same, can carry out the program that is stored in the memory units such as ROM (Read Only Memory) or RAM by arithmetic unit such as control CPU etc., communication components such as output block such as input blocks such as keyboard, display or interface circuit are realized.Thereby, the computing machine with these parts only by reading and recording the recording medium of said procedure, and carry out this program, can realize the various functions and the various processing of the bright luster prediction unit 400 of present embodiment.In addition, by said procedure being recorded in movably in the recording medium, can realize above-mentioned various functions and various processing on the computing machine arbitrarily.

The present invention is not limited to the respective embodiments described above, in the scope shown in the claim, can carry out various changes, for by in different embodiments, making up the embodiment that disclosed technological means obtains respectively, also be contained in the technical scope of the present invention.

[embodiment 1]

At present embodiment,, use the bright luster prediction unit 100 of embodiment 1 to carry out the evaluation of bright luster for the sample of the colorant layer that on coating (coat) paper, has formed the toner that uses high concentration as base material.

At first, to refractive index cuit 20 inputs 1.55 of input picture data shown in Figure 9, cuit 21 inputs 6.4% to transmitance are provided with the only sample of coated paper simultaneously, and carry out the drift angle brightness measuring in drift angle brightness measuring portion 104.Then, to 45 ° of cuit 30 inputs of the incident angle of the non-mirror reflection geometric system of input picture data shown in Figure 10, cuit 31 to the light-receiving angle is imported-60 °, to 45 ° of cuit 32 inputs of the incident angle of direct reflection geometric system, the sample that will form toner image simultaneously is arranged on drift angle brightness measuring portion 104, and carries out the drift angle brightness measuring.

Its result, the curve map that shows among curve Figure 40 of Figure 20 (a) expression Figure 11.In the curve map shown in Figure 20 (a), transverse axis is the incident and the light-receiving angle of direct reflection geometric system, and the longitudinal axis is brightness value (CIE1976L with the specular light representation in components ^*a ^*b ^*L ^*).In addition, in the present embodiment, use the angle measurement spectrometer to survey the direct reflection light component of all direct reflection geometric systems for identical sample, and compare.In the curve map of Figure 20 (a), use method result calculated of the present invention to represent that with solid line results measured dots.As shown in the figure, these two results represent roughly the same variation, as can be known the precision height of method of the present invention.

[embodiment 2]

At present embodiment,, use the bright luster prediction unit 100 of embodiment 1 to carry out the evaluation of bright luster for the sample of the colorant layer that on coated paper, has formed the toner that uses low concentration as base material.

At first, to refractive index cuit 20 inputs 1.55 of input picture data shown in Figure 9, cuit 21 inputs 15% to transmitance are provided with the only sample of coated paper simultaneously, and carry out the drift angle brightness measuring in drift angle brightness measuring portion 104.Then, to 45 ° of cuit 30 inputs of the incident angle of the non-mirror reflection geometric system of input picture data shown in Figure 10, cuit 31 to the light-receiving angle is imported-60 °, to 45 ° of cuit 32 inputs of the incident angle of direct reflection geometric system, the sample that will form toner image simultaneously is arranged on drift angle brightness measuring portion 104, and carries out the drift angle brightness measuring.

Its result, the curve map that shows among curve Figure 40 of Figure 20 (b) expression Figure 11.In the curve map shown in Figure 20 (b), transverse axis is the incident and the light-receiving angle of direct reflection geometric system, and the longitudinal axis is brightness value (CIE1976L with the specular light representation in components ^*a ^*b ^*L ^*).In addition, in the present embodiment, use the angle measurement spectrometer to survey the direct reflection light component of all direct reflection geometric systems for identical sample, and compare.In the curve map of Figure 20 (b), use method result calculated of the present invention to represent that with solid line results measured dots.As shown in the figure, these two results represent roughly the same variation.Hence one can see that, even reduce at toner concentration, the influence of the reflecting brightness component of paper becomes under the big situation, the precision of method of the present invention is also high.

[embodiment 3]

At present embodiment, use 67g/m as base material ²Paper, perhaps 128g/m ²Paper, for the sample of the colorant layer that on these paper, has formed the toner that uses high concentration, use the bright luster prediction unit 100 of embodiment 1 to carry out the evaluation of bright luster.

Here, carried out the evaluation of bright luster, but used 67g/m with the step identical with the foregoing description 1,2 ²The situation of paper under, to cuit 21 inputs 7.5% of transmitance shown in Figure 9, using 128g/m ²The situation of paper under, to cuit 21 inputs 7.2% of transmitance shown in Figure 9.67g/m has been used in Figure 21 (a) expression ²The situation result of paper, 128g/m has been used in Figure 21 (b) expression ²The situation result of paper.In addition, even present embodiment also also uses the angle measurement spectrometer to survey the direct reflection light component of all direct reflection geometric systems for identical sample, and compares.

As shown in the drawing, in the present embodiment, in all angles, result of calculation is also represented identical variation with measured value.In addition, compare with the situation of having used coated paper, it is few that the result is that angle changes the variable quantity of the brightness value cause.This is because the concavo-convex roughening on toner layer surface, so surface reflection light component Lrs disperses widely, and the influence of internal reflection light component Lri as a result increases.Like this, under the situation that the influence of internal reflection light component Lri has increased, the precision of prediction of this method is also high as can be known.

[embodiment 4]

At present embodiment,, use the bright luster prediction unit 200 of embodiment 2 to carry out the evaluation of bright luster for the sample of the colorant layer that on coated paper, has formed the toner that uses high concentration as base material.

At first, refractive index cuit 20 inputs 1.55 to input picture data shown in Figure 17, cuit 21 inputs 6.4% to transmitance, in the cuit 52 of surfaceness, import 0.205, in the roughness cuit 53 of concentration, import 0.037, simultaneously the sample of coated paper only is set in drift angle brightness measuring portion 204, and carries out the drift angle brightness measuring.

Then, to 45 ° of cuit 30 inputs of the incident angle of the non-mirror reflection geometric system of input picture data shown in Figure 180, cuit 31 to the light-receiving angle is imported-60 °, to 45 ° of cuit 32 inputs of the incident angle of direct reflection geometric system, the sample that will form toner image simultaneously is arranged on drift angle brightness measuring portion 204, and carries out the drift angle brightness measuring.

Its result, the curve map that shows among curve Figure 70 of Figure 22 (a) expression Figure 19.In the curve map shown in Figure 22 (a), transverse axis is the incident and the light-receiving angle of direct reflection geometric system, and the longitudinal axis is brightness value (CIE1976L with the specular light representation in components ^*a ^*b ^*L ^*).In addition, in the present embodiment, use the angle measurement spectrometer to survey the direct reflection light component of all direct reflection geometric systems for identical sample, and compare.In the curve map of Figure 22 (a), use method result calculated of the present invention to represent that with solid line results measured dots.As shown in the figure, these two results represent roughly the same variation, and the precision of method of the present invention is also high as can be known.

In addition, if relatively Figure 20 (a) and Figure 22 (a) then as can be known, under the same conditions, the embodiment 1 that has estimated bright luster with the bright luster prediction unit 100 of use embodiment 1 compares, the result in the present embodiment can calculate more the value near measured value.In other words, from this result, can confirm ratio of precision embodiment 1 height of the method for present embodiment.

[embodiment 5]

At present embodiment,, use the bright luster prediction unit 200 of embodiment 2 to carry out the evaluation of bright luster for the sample of the colorant layer that on coated paper, has formed the toner that uses low concentration as base material.

At first, refractive index cuit 50 inputs 1.55 to input picture data shown in Figure 17, cuit 51 inputs 15% to transmitance, in the cuit 52 of surfaceness, import 0.222, in the roughness cuit 53 of concentration, import 0.047, simultaneously the sample of coated paper only is set in drift angle brightness measuring portion 204, and carries out the drift angle brightness measuring.

Then, to 45 ° of cuit 60 inputs of the incident angle of the non-mirror reflection geometric system of input picture data shown in Figure 180, cuit 61 to the light-receiving angle is imported-60 °, to 45 ° of cuit 62 inputs of the incident angle of direct reflection geometric system, the sample that will form toner image simultaneously is arranged on drift angle brightness measuring portion 204, and carries out the drift angle brightness measuring.

Its result, the curve map that shows among curve Figure 70 of Figure 22 (b) expression Figure 19.In the curve map shown in Figure 22 (b), transverse axis is the incident and the light-receiving angle of direct reflection geometric system, and the longitudinal axis is brightness value (CIE1976L with the specular light representation in components ^*a ^*b ^*L ^*).In addition, in the present embodiment, use the angle measurement spectrometer to survey the direct reflection light component of all direct reflection geometric systems for identical sample, and compare.In the curve map of Figure 22 (b), use method result calculated of the present invention to represent that with solid line results measured dots.As shown in the figure, these two results represent roughly the same variation.Hence one can see that, even reduce at toner concentration, under the situation that the influence of the reflecting brightness component of paper increases, the precision of method of the present invention is also high.

In addition, if relatively Figure 20 (b) and Figure 22 (b) then as can be known, under the same conditions, the embodiment 2 that has estimated bright luster with the bright luster prediction unit 100 of use embodiment 1 compares, the result in the present embodiment can calculate more the value near measured value.In other words, from this result, can confirm ratio of precision embodiment 2 height of the method for present embodiment.

[embodiment 6]

At present embodiment, use 67g/m as base material ²Paper, perhaps 128g/m ²Paper, for the sample of the colorant layer that on these paper, has formed the toner that uses high concentration, use the bright luster prediction unit 200 of embodiment 2 to carry out the evaluation of bright luster.

Here, carried out the evaluation of bright luster, but used 67g/m with the step identical with the foregoing description 4,5 ²The situation of paper under, to cuit 51 inputs 7.5% of transmitance shown in Figure 17, using 128g/m ²The situation of paper under, to cuit 51 inputs 7.2% of transmitance shown in Figure 17.67g/m has been used in Figure 23 (a) expression ²The situation result of paper, 128g/m has been used in Figure 23 (b) expression ²The situation result of paper.In addition, in the present embodiment, also use the angle measurement spectrometer to survey the direct reflection light component of all direct reflection geometric systems for identical sample, and compare.

As shown in the drawing, in the present embodiment, in all angles, result of calculation is also represented identical variation with measured value.In addition, compare with the situation of having used coated paper, the result is few for the variable quantity that angle changes the brightness value that causes.This is because the concavo-convex roughening on toner layer surface, so the reflected light component Lrsp of surface reflection light component Lrss and pigment particles disperses widely, and the influence of scattered reflection light component Lri as a result increases.Like this, under the situation that the influence of scattered reflection light component Lrd has increased, the precision of prediction of this method is also high as can be known.

In addition, if relatively Figure 21 and Figure 23 then as can be known, under the same conditions, the embodiment 3 that has estimated bright luster with the bright luster prediction unit 100 that uses embodiment 1 compares, the result in the present embodiment can calculate more the value near measured value.In other words, from this result, can confirm ratio of precision embodiment 3 height of the method for present embodiment.

[embodiment 7]

At present embodiment,, use the bright luster prediction unit 400 of embodiment 3 to carry out the evaluation of bright luster for the sample of the colorant layer that on coated paper, has formed the toner that uses high concentration as base material.

At first, refractive index cuit R20 input 1.55 to input picture data shown in Figure 26, cuit R21 input 6.4% to transmitance, in the cuit R22 of surfaceness, import 0.205, in the roughness cuit R23 of concentration, import 0.037, simultaneously the sample of coated paper only is set in drift angle brightness measuring portion 404, and carries out the drift angle brightness measuring.

Then, to 45 ° of the cuit R30 inputs of the incident angle of the first non-mirror reflection geometric system of input picture data shown in Figure 27, cuit R31 to the light-receiving angle imports-60 °, to 45 ° of the cuit R37 inputs of the incident angle of the second non-mirror reflection geometric system, cuit R38 to the light-receiving angle imports 0 °, to 45 ° of the cuit R32 inputs of the incident angle of direct reflection geometric system, the sample that will form toner image simultaneously is arranged on drift angle brightness measuring portion 404, and carries out the drift angle brightness measuring.

Its result, the curve map that shows among curve Figure 40 of Figure 29 (a) expression Figure 28.The result of the situation of high concentration toner sample is used in Figure 29 (a) expression.In the curve map shown in Figure 29 (a), transverse axis is the incident and the light-receiving angle of direct reflection geometric system, and the longitudinal axis is brightness value (CIE1976L with the specular light representation in components ^*a ^*b ^*L ^*).In addition, in the present embodiment, use the angle measurement spectrometer to survey the direct reflection light component of all direct reflection geometric systems for identical sample, and compare.In the curve map of Figure 29 (a), use method result calculated of the present invention to represent that with solid line results measured dots.As shown in the figure, these two results represent roughly the same variation, as can be known the precision height of method of the present invention.

[embodiment 8]

At present embodiment,, use the bright luster prediction unit 400 of embodiment 3 to carry out the evaluation of bright luster for the sample of the colorant layer that on coated paper, has formed the toner that uses low concentration as base material.

At first, refractive index cuit R20 input 1.55 to input picture data shown in Figure 26, cuit R21 input 15% to transmitance, in the cuit R22 of surfaceness, import 0.222, in the roughness cuit R23 of concentration, import 0.047, simultaneously the only sample of coated paper is set in drift angle brightness measuring portion 404, and carries out the drift angle brightness measuring.

Then, to 45 ° of the cuit R30 inputs of the incident angle of the first non-mirror reflection geometric system of input picture data shown in Figure 27, cuit R31 to the light-receiving angle imports-60 °, to 45 ° of the cuit R37 inputs of the incident angle of the second non-mirror reflection geometric system, cuit R38 to the light-receiving angle imports 0 °, to 45 ° of the cuit R32 inputs of the incident angle of direct reflection geometric system, the sample that will form toner image simultaneously is arranged on drift angle brightness measuring portion 404, and carries out the drift angle brightness measuring.

Its result, the curve map that shows among curve Figure 40 of Figure 29 (b) expression Figure 28.The result of the situation of using low concentration toner sample is compared in Figure 29 (b) expression with embodiment 7.In the curve map shown in Figure 29 (b), transverse axis is the incident and the light-receiving angle of direct reflection geometric system, and the longitudinal axis is brightness value (CIE1976L with the specular light representation in components ^*a ^*b ^*L ^*).In addition, in the present embodiment, use the angle measurement spectrometer to survey the direct reflection light component of all direct reflection geometric systems for identical sample, and compare.In the curve map of Figure 29 (b), use method result calculated of the present invention to represent that with solid line results measured dots.As shown in the figure, these two results represent roughly the same variation.Hence one can see that, even reduce at toner concentration, under the situation that the influence of the reflecting brightness component of paper increases, the precision of method of the present invention is also high.

[embodiment 9]

At present embodiment, use 67g/m as base material ²Paper, perhaps 128g/m ²Paper, for the sample of the colorant layer that on these paper, has formed the toner that uses high concentration, use the bright luster prediction unit 400 of embodiment 3 to carry out the evaluation of bright luster.

Here, carried out the evaluation of bright luster, but used 67g/m with the step identical with the foregoing description 7,8 ²The situation of paper under, to the cuit R21 input 7.5% of transmitance shown in Figure 26, using 128g/m ²The situation of paper under, to the cuit R21 input 7.2% of transmitance shown in Figure 26.67g/m has been used in Figure 23 (a) expression ²The situation result of paper, 128g/m has been used in Figure 23 (b) expression ²The situation result of paper.In addition, in the present embodiment, also use the angle measurement spectrometer to survey the direct reflection light component of all direct reflection geometric systems for identical sample, and compare.

As shown in the drawing, in the present embodiment, in all angles, result of calculation is also represented identical variation with measured value.In addition, compare with the situation of having used coated paper, the result is few for the variable quantity that angle changes the brightness value that causes.This is because the concavo-convex roughening on toner layer surface, so the reflected light component Lrsp of surface reflection light component Lrss and pigment particles disperses widely, and the influence of scattered reflection light component Lrd as a result increases.Like this, under the situation that the influence of scattered reflection light component Lrd has increased, the precision of prediction of this method is also high as can be known.

[other]

Therefore the present invention can be applied to the evaluation of picture quality owing to can estimate the mirror surface luster of the image of making by the whole bag of tricks accurately.

As mentioned above, bright luster prediction unit of the present invention comprises: lower floor's reflected light component generating unit, only based on the brightness value of above-mentioned base material determined in a plurality of geometric systems, calculating is by above-mentioned base material reflection and see through above-mentioned colorant layer and lower floor's reflected light component of radiation; Internal reflection light component generating unit is measured the brightness value of test portion in the geometric system of regulation, and the internal reflection light component that is created on the internal reflection of above-mentioned colorant layer based on the brightness value of measuring and above-mentioned lower floor reflected light component; Surface reflection light component generating unit, in the regulation geometric system different, measure the brightness value of test portion, and generate surface reflection light component by the surface reflection of above-mentioned colorant layer based on brightness value, above-mentioned lower floor reflected light component and the above-mentioned internal reflection light component measured with above-mentioned geometric system; And direct reflection light quantity calculating part, based on the direct reflection light quantity of asking test portion by each component of above-mentioned lower floor reflected light component generating unit, above-mentioned internal reflection light component generating unit and the generation of above-mentioned surface reflection light component generating unit.

Therefore, according to said structure, has following effect: not only consider the surface reflection light component, also consider lower floor's reflected light component and internal reflection light component, more effectively make full use of the bitintability reflection model and ask the direct reflection light quantity of test portion, therefore thereby the prediction mirror surface luster even in the image pattern of image pattern that can not calculate the low concentration of value accurately and low gloss in the past, also can be estimated mirror surface luster accurately.

In bright luster prediction unit of the present invention, the brightness value of preferred above-mentioned lower floor reflected light component generating unit determined only above-mentioned base material in a plurality of geometric systems, and calculate by above-mentioned base material reflection and see through above-mentioned colorant layer and lower floor's reflected light component of radiation based on the brightness value of having measured, above-mentioned internal reflection light component generating unit is measured the brightness value of test portion in the non-mirror reflection geometric system, and calculate after the internal reflection light component of the internal reflection of above-mentioned colorant layer based on the brightness value of having measured and above-mentioned lower floor reflected light component, use the bitintability reflection model to predict internal reflection light component in other the geometric system, above-mentioned surface reflection light component generating unit is measured the brightness value of test portion in the direct reflection geometric system, and based on the brightness value of having measured, above-mentioned lower floor reflected light component, and above-mentioned internal reflection light component calculates after the surface reflection light component by the surface reflection of above-mentioned colorant layer, uses the bitintability reflection model to predict surface reflection light component in other the direct reflection geometric system.

Bright luster prediction unit of the present invention, use the prediction of bitintability reflection model on base materials such as paper or OHP film, to form and comprise the direct reflection light quantity of such as the colorant layer of toner, paint ink, dye ink etc. as all geometric systems of the test portion of sample image, and according to the mirror surface luster of this direct reflection light quantity pretest material.In above-mentioned mirror surface luster prediction unit, not only consider surface reflection light component by the surface reflection of colorant layer, and consideration is at the internal reflection light component of the internal reflection of colorant layer, and, ask the direct reflection light component of test portion based on the surface reflection light component that calculates, internal reflection light component and lower floor's reflected light component by lower floor's reflected light component that base material reflects.

Here, above-mentioned ' geometric system ' is to measure the position relation of the light source that uses under the situation of reflection light quantity, image pattern, optical receiver from image pattern in order to estimate bright luster etc.In particular, expression incident angle 1 and light-receiving angle 2 shown in Figure 2.Here, above-mentioned incident angle is by from inciding the angle that normal vector constituted on the test portion plane of the position on the test portion plane to the light of the light source of test portion incident with from this light, and above-mentioned light-receiving angle is the angle that the light that reflects on the test portion plane and above-mentioned normal vector constitute.Thereby above-mentioned ' geometric system of regulation ' is that incident angle 1 and light-receiving angle 2 are set at the geometric system of angle arbitrarily.

In addition, have the incident angle of light minute surface reflex time on sample of incident and the geometric system of light-receiving angle in the geometric system that above-mentioned ' direct reflection geometric system ' is afore mentioned rules, be meant that as shown in Figure 2 incident angle 1 and light-receiving angle 2 are the geometric system of equal angular.

In addition, above-mentioned ' non-mirror reflection geometric system ' is meant all geometric systems beyond the direct reflection geometric system in the geometric system of afore mentioned rules.

In the present invention, can select to satisfy ' direct reflection geometric system ' arbitrarily and ' non-mirror reflection geometric system ' as above-mentioned condition.In addition, in embodiment,, select i=45 ° of light source incident angle θ, r=-60 ° of light-receiving angle θ (with reference to Fig. 5) as the non-mirror reflection geometric system, as the direct reflection geometric system, select i=45 ° of light source incident angle θ, r=45 ° of light-receiving angle θ (with reference to Fig. 5).

And, only measure a plurality of geometric systems of the brightness value of base material in order to calculate lower floor's reflected light component, be meant in order not comprise all positions of measuring in the environment with omitting and change a plurality of geometric systems of obtaining under the situation of light source incident angle and light-receiving angle every certain angle respectively.As these a plurality of geometric systems, specifically can enumerate represent in the embodiment changed all geometric systems of the situation of light source incident angle and light-receiving angle with 1 ° of angular resolution.

In addition, in this manual, ' all geometric systems ' is as literal meaning, all geometric systems in the environment are measured in expression, even but be meant ' a plurality of geometric systems that change light source incident angle and light-receiving angle in order not comprise all positions of measuring in the environment every certain angle ' with omitting, also use in this manual.As this ' all geometric systems ', specifically can enumerate represent in the embodiment changed all geometric systems of the situation of light source incident angle and light-receiving angle with 1 ° of angular resolution.In addition, ' all direct reflection geometric systems ' are even also mean the geometric system that is defined in the direct reflection geometric system especially in ' all geometric systems '.

According to said structure, the internal reflection light component and the surface reflection light component of all geometric systems are not surveyed, see through and to use (promptly every a plurality of geometric systems of certain angle change light source incident angle and light-receiving angle, all geometric systems) measure the reflected light component (being lower floor's reflected light component) of the only underclad portion (being base material) that can survey, thereby can calculate the direct reflection light component of test portion accurately.And then, according to said structure, not only consider the surface reflection light component, also consider lower floor's reflected light component and internal reflection light component, more effectively make full use of the bitintability reflection model and ask the direct reflection light quantity of test portion, therefore thereby the prediction mirror surface luster even in the image pattern of image pattern that can not calculate the low concentration of value accurately and low gloss in the past, also can be estimated mirror surface luster accurately.

In bright luster prediction unit of the present invention, above-mentioned surface reflection light component generating unit preferably uses the Torrance-Sparrow model to predict the surface reflection light component of other direct reflection geometric system as above-mentioned bitintability reflection model.

According to said structure, by using the Torrance-Sparrow model of advising as prerequisite, can predict the surface reflection light component of all direct reflection geometric systems accurately based on the measurement result in the predetermined direct reflection geometric system with the non-isotropy scattering of light.In addition, therefore the Torrance-Sparrow model can easily utilize because the parameter that needs is few.

In bright luster prediction unit of the present invention, preferred above-mentioned internal reflection light component generating unit uses the Oren-Nayar model as above-mentioned bitintability reflection model, thereby predicts the internal reflection light component of other geometric system.

According to said structure, by using the Oren-Nayar model of advising as prerequisite, can predict the internal reflection light component of all geometric systems accurately based on the measurement result in the predetermined non-mirror reflection geometric system with the non-isotropy scattering of light.In addition, therefore the Oren-Nayar model can easily utilize because the parameter that needs is few.

In bright luster prediction unit of the present invention, above-mentioned lower floor reflected light component generating unit is preferably calculated lower floor's reflected light component with the measurement result of the brightness value of above-mentioned base material, the transmitance and the refractive index of above-mentioned colorant layer.

According to said structure, arrive the incident angle of light of base material part of test portion and light quantity, correctly reproduced from the reflection light quantity of base material part refraction and decay, can calculate the reflected light component of underclad portion more accurately.

In bright luster prediction unit of the present invention, above-mentioned internal reflection light component generating unit is to scattering between the pigment particles that comprises at above-mentioned colorant layer and the scattered reflection light component generating unit predicted by the scattered reflection light component of radiation, also comprise simultaneously: pigment particles reflected light component generating unit, in an above-mentioned direct reflection geometric system, measure the brightness value of test portion, and based on the brightness value of measuring, above-mentioned lower floor reflected light component, and above-mentioned scattered reflection light component calculates after the pigment particles reflected light component that is reflected by above-mentioned pigment particles, use the bitintability reflection model, predict the pigment particles reflected light component in other the geometric system; And form parameter calculating part, result of calculation based on above-mentioned pigment particles reflected light component generating unit, the result of calculation of above-mentioned surface reflection light component generating unit, the measurement result of the brightness value of the above-mentioned test portion in the above-mentioned direct reflection geometric system, determine the allocation proportion of above-mentioned pigment particles reflected light component and above-mentioned surface reflection light component, above-mentioned direct reflection light quantity calculating part will be by above-mentioned lower floor reflected light component generating unit, each component that above-mentioned scattered reflection light component generating unit generates, and by above-mentioned pigment particles reflected light component generating unit and the generation of above-mentioned surface reflection light component generating unit, and determined each component addition of allocation proportion, thereby ask the direct reflection light quantity of test portion by above-mentioned form parameter calculating part.

According to said structure, can predict the bright luster of the test portion of (that is, pigment particles is under the situation of pigment etc.) under the bigger situation of the pigment particle size that in the colorant layer, comprises accurately.In addition, according to said structure, even in the big geometrical system of the zenith angle angle that also can not get glossiness rising in the image enough precision of predictions, under the situation of having considered lower floor's reflected light component or internal reflection light component in low gloss, also can be with the bright luster of sufficient accuracy prediction test portion.

In above-mentioned bright luster prediction unit, above-mentioned surface reflection light component generating unit is used the Torrance-Sparrow model as above-mentioned bitintability reflection model, simultaneously in above-mentioned Torrance-Sparrow model, as the parameter of the expansion that defines reflected light component, preferably use the roughness variable of the surface configuration of above-mentioned test portion.

Here, ' the roughness variable of the surface configuration of test portion ' specifically is meant small slope of elevation information according to the most surperficial (interface of colorant layer top layer and air layer) of test portion (disposed under the situation of test portion and be the length of Z-direction) gauging surface in XYZ coordinate space (with reference to Fig. 5), and after generating the histogram of this slope of small, the grid deviation (dispersion of distribution) of small the slope that in the scope of 2 σ (data about 95.5%), calculates.

Therefore according to said structure, the Torrance-Sparrow model is that prerequisite proposes with the non-isotropy scattering of light, gauging surface reflected light component more accurately.In addition, therefore the Torrance-Sparrow model can easily utilize because other parameter that needs is few.And then, use the roughness variable of the surface configuration of test portion as the parameter of the expansion that defines reflected light component, thereby can utilize the Torrance-Sparrow model accurately.

In above-mentioned bright luster prediction unit, above-mentioned pigment particles reflected light component generating unit is used the Torrance-Sparrow model as above-mentioned bitintability reflection model, and the roughness variable of while CONCENTRATION DISTRIBUTION of the above-mentioned test portion of use in above-mentioned Torrance-Sparrow model is as the parameter of the expansion of definition reflected light component.

Here, ' the roughness variable of the CONCENTRATION DISTRIBUTION of test portion ' is meant that specifically the image that sees through according to test portion (has disposed under the situation of test portion in XYZ coordinate space (with reference to Fig. 5), for example disposed camera in Z axle+side, when a side has disposed light source, the concentration of each pixel image by camera observation) generates after the histogram, the standard deviation (dispersion of distribution) of the penetrating concentration that calculates in the scope of 2 σ (data about 95.5%).

According to said structure, the Torrance-Sparrow model is that prerequisite proposes with the non-isotropy scattering of light, therefore can calculate the pigment particles reflected light component more accurately.In addition, therefore the Torrance-Sparrow model can easily utilize because other parameter that needs is few.And then, use the roughness variable of the CONCENTRATION DISTRIBUTION of test portion as the parameter of the expansion that defines reflected light component, thereby can utilize the Torrance-Sparrow model accurately.

In addition, as mentioned above, other bright luster prediction unit of the present invention comprises: lower floor's reflected light component generating unit, only based on the brightness value of above-mentioned base material determined in a plurality of geometric systems, calculate in the geometric system of afore mentioned rules and above-mentioned other the geometric system, by above-mentioned base material reflection and see through above-mentioned colorant layer by lower floor's reflected light component of radiation; Upper strata reflected light component generating unit, lower floor's reflected light component in the geometric system of the afore mentioned rules that calculates based on the brightness value of the test portion of measuring in the geometric system of afore mentioned rules and by above-mentioned lower floor reflected light component generating unit generates scattering between the pigment particles in above-mentioned other the geometric system, that comprise in the above-mentioned colorant layer and by the scattered reflection light component of radiation, by the pigment particles reflected light component of above-mentioned pigment particles reflection and by the surface reflection light component of the surface reflection of above-mentioned colorant layer; And direct reflection light quantity calculating part, each component in above-mentioned other the geometric system that is generated by above-mentioned lower floor reflected light component generating unit and above-mentioned upper strata reflected light component generating unit is asked the direct reflection light quantity of the test portion in above-mentioned other the geometric system.

Therefore, according to said structure, play following effect: not only consider the surface reflection light component, also consider lower floor's reflected light component and internal reflection light component, more effectively make full use of the bitintability reflection model and ask the direct reflection light quantity of test portion, therefore thereby the prediction mirror surface luster even in the image pattern of image pattern that can not calculate the low concentration of value accurately and low gloss in the past, also can be estimated mirror surface luster accurately.

In bright luster prediction unit of the present invention, preferred above-mentioned upper strata reflected light component generating unit is by using the bitintability reflection model, calculates above-mentioned scattered reflection light component, above-mentioned pigment particles reflected light component and above-mentioned surface reflection light component in above-mentioned other the geometric system.

By using the bitintability reflection model, upper strata reflected light component generating unit can be asked scattered reflection light component, pigment particles reflected light component and surface reflection light component exactly, and then can estimate mirror surface luster accurately.

In bright luster prediction unit of the present invention, above-mentioned lower floor reflected light component generating unit is calculated the geometric system of three kinds of regulations and the above-mentioned lower floor reflected light component in above-mentioned other the geometric system at least, above-mentioned upper strata reflected light component generating unit preferably comprises: calculation of parameter portion, lower floor's reflected light component in the geometric system of above-mentioned at least three kinds of regulations of calculating based on the concentration value of the test portion of measuring in the geometric system of above-mentioned at least three kinds of regulations and by above-mentioned lower floor reflected light component generating unit is asked (a) Oren-Nayar Model parameter and (b) above-mentioned scattered reflection light component, the allocation proportion of above-mentioned pigment particles reflected light component and above-mentioned surface reflection light component; And reflected light component calculating part, use above-mentioned allocation proportion to calculate above-mentioned pigment particles reflected light component and above-mentioned surface reflection light component in above-mentioned other the geometric system, use above-mentioned allocation proportion, above-mentioned parameter and Oren-Nayar model simultaneously, calculate the above-mentioned scattered reflection light component in above-mentioned other the geometric system.

The allocation proportion of the scattered reflection light component that comprises in the above-mentioned reflected light component, pigment particles reflected light component, surface reflection light component had been made as integral body 1 o'clock, can be by two parametric representations.In addition, in order to use Oren-Nayar Model Calculation scattered reflection light component, need ask the parameter of the unknown of the reflectivity of representing small.Here, according to said structure, during calculation of parameter portion each reflected light component in asking the upper strata reflected light, use the lower floor's reflected light component in the geometric system of regulation of the concentration value of the test portion of in the geometric system of at least three kinds of regulations, measuring and these three kinds.Here, the upper strata reflected light component is the component that has deducted lower floor's reflected light component from the direct reflection light quantity.Thereby, can generate three conditionals for the geometric system of at least three kinds of regulations.Thus, can ask two parameters whole of the parameter and the expression allocation proportion of the unknown in the Oren-Nayar model according to three conditionals.In other words, can not ask each component that comprises in the reflected light component of upper strata approx.Thereby, can ask the scattered reflection light component, pigment particles reflected light component and the surface reflection light component that comprise in the reflected light component of upper strata exactly, and then can estimate mirror surface luster accurately.

In bright luster prediction unit of the present invention, above-mentioned reflected light component calculating part preferably uses above-mentioned allocation proportion and Torrance-Sparrow model, calculates above-mentioned pigment particles reflected light component and above-mentioned surface reflection light component in above-mentioned other the geometric system.

By using the Torrance-Sparrow model, can ask the pigment particles reflected light component and the surface reflection light component that comprise in the reflected light component of upper strata exactly, and then can estimate mirror surface luster accurately.

In addition, the control of above-mentioned bright luster prediction unit also can be by computer realization, in this case, by making computing machine as the action of above-mentioned each, thereby the recording medium that has write down the embodied on computer readable of the control program that makes the above-mentioned bright luster prediction unit of computer realization also belongs to category of the present invention.

That is, control program of the present invention is used to make calculated value to realize the control function of the bright luster prediction unit that is made of above-mentioned any structure.In addition, recording medium of the present invention is the recording medium that has write down the embodied on computer readable of above-mentioned control program.Its result can provide with freely carrying and write down the recording medium that carries out the program of bright luster Forecasting Methodology of the present invention.

The concrete embodiment or the embodiment that carry out in detailed descriptive item of the present invention just are used to make technology contents of the present invention to become clear, should not be defined in such concrete example and explained, in spirit of the present invention and claim scope, can carry out various changes and implement by narrow sense ground.

Claims (15)

1. bright luster prediction unit, brightness value in the geometric system of the regulation by measuring the test portion that constitutes by base material and the colorant layer that on above-mentioned base material, forms, and predict direct reflection light quantity in other the geometric system according to this measurement result, thereby prediction mirror surface luster, it is characterized in that described bright luster prediction unit comprises:

Lower floor's reflected light component generating unit only based on the brightness value of above-mentioned base material determined in a plurality of geometric systems, is calculated by above-mentioned base material reflection, is seen through above-mentioned colorant layer and lower floor's reflected light component of radiation;

Internal reflection light component generating unit is measured the brightness value of test portion, and based on brightness value and the above-mentioned lower floor reflected light component measured, is created on the internal reflection light component of the internal reflection of above-mentioned colorant layer in the geometric system of regulation;

Surface reflection light component generating unit, in the geometric system of regulation, measure the brightness value of test portion, and based on the brightness value of measuring, above-mentioned lower floor reflected light component and the generation of the above-mentioned internal reflection light component surface reflection light component by the surface reflection of above-mentioned colorant layer; And

Direct reflection light quantity calculating part is based on the direct reflection light quantity of being asked test portion by each component of above-mentioned lower floor reflected light component generating unit, above-mentioned internal reflection light component generating unit and the generation of above-mentioned surface reflection light component generating unit.

2. bright luster prediction unit as claimed in claim 1 is characterized in that,

In above-mentioned bright luster prediction unit,

Above-mentioned lower floor reflected light component generating unit is only measured the brightness value of above-mentioned base material in a plurality of geometric systems, and calculates by above-mentioned base material reflection, sees through above-mentioned colorant layer and lower floor's reflected light component of radiation based on the brightness value of measuring,

Above-mentioned internal reflection light component generating unit is measured the brightness value of test portion in the non-mirror reflection geometric system, and calculate after the internal reflection light component of the internal reflection of above-mentioned colorant layer based on the brightness value of measuring and above-mentioned lower floor reflected light component, use the bitintability reflection model to predict internal reflection light component in other the geometric system

Above-mentioned surface reflection light component generating unit is measured the brightness value of test portion in the direct reflection geometric system, and calculate after the surface reflection light component by the surface reflection of above-mentioned colorant layer based on brightness value, above-mentioned lower floor reflected light component and the above-mentioned internal reflection light component measured, use the bitintability reflection model to predict surface reflection light component in other the direct reflection geometric system.

3. bright luster prediction unit as claimed in claim 2 is characterized in that,

Above-mentioned surface reflection light component generating unit uses the Torrance-Sparrow model to predict the surface reflection light component of other geometric system as above-mentioned bitintability reflection model.

4. bright luster prediction unit as claimed in claim 2 is characterized in that,

Above-mentioned internal reflection light component generating unit uses the Oren-Nayar model to predict the internal reflection light component of other geometric system as above-mentioned bitintability reflection model.

5. bright luster prediction unit as claimed in claim 2 is characterized in that,

Above-mentioned lower floor reflected light component generating unit is used the measurement result of the brightness value of above-mentioned base material, the transmitance and the refractive index of above-mentioned colorant layer, calculates lower floor's reflected light component.

6. bright luster prediction unit as claimed in claim 2 is characterized in that,

Above-mentioned internal reflection light component generating unit is to scattering between the pigment particles that comprises at above-mentioned colorant layer and by the scattered reflection light component generating unit that the scattered reflection light component of radiation is predicted, also comprises simultaneously:

Pigment particles reflected light component generating unit, in an above-mentioned direct reflection geometric system, measure the brightness value of test portion, and based on brightness value, above-mentioned lower floor reflected light component and the above-mentioned scattered reflection light component measured, calculate after the pigment particles reflected light component by the reflection of above-mentioned pigment particles, use the bitintability reflection model to predict pigment particles reflected light component in other the geometric system; And

The form parameter calculating part, based on the result of calculation of the result of calculation of above-mentioned pigment particles reflected light component generating unit, above-mentioned surface reflection light component generating unit, the measurement result of brightness value of above-mentioned test portion in the above-mentioned direct reflection geometric system, determine the allocation proportion of above-mentioned pigment particles reflected light component and above-mentioned surface reflection light component

Above-mentioned direct reflection light quantity calculating part generates and has determined each component addition of allocation proportion by above-mentioned form parameter calculating part by each component that will be generated by above-mentioned lower floor reflected light component generating unit, above-mentioned scattered reflection light component generating unit and by above-mentioned pigment particles reflected light component generating unit and above-mentioned surface reflection light component generating unit, asks the direct reflection light quantity of test portion.

7. bright luster prediction unit as claimed in claim 6 is characterized in that,

Above-mentioned surface reflection light component generating unit uses the Torrance-Sparrow model as above-mentioned bitintability reflection model, simultaneously in above-mentioned Torrance-Sparrow model, the roughness variable of surface configuration that uses above-mentioned test portion is as the parameter of the expansion of definition reflected light component.

8. bright luster prediction unit as claimed in claim 6 is characterized in that,

Above-mentioned pigment particles reflected light component generating unit uses the Torrance-Sparrow model as above-mentioned bitintability reflection model, simultaneously in above-mentioned Torrance-Sparrow model, the roughness variable of CONCENTRATION DISTRIBUTION that uses above-mentioned test portion is as the parameter of the expansion of definition reflected light component.

9. bright luster prediction unit, based on determined brightness value in the geometric system of the regulation of the test portion that constitutes by base material and the colorant layer that on above-mentioned base material, forms, predict the direct reflection light quantity in other the geometric system, thereby prediction mirror surface luster, it is characterized in that described bright luster prediction unit comprises:

Lower floor's reflected light component generating unit is only calculated by above-mentioned base material reflection based on the brightness value of above-mentioned base material determined in a plurality of geometric systems and is seen through above-mentioned colorant layer and lower floor's reflected light component of radiation;

Internal reflection light component generating unit based on the brightness value and the above-mentioned lower floor reflected light component of determined test portion in the geometric system of regulation, is created on the internal reflection light component of the internal reflection of above-mentioned colorant layer;

Surface reflection light component generating unit generates surface reflection light component by the surface reflection of above-mentioned colorant layer based on brightness value, above-mentioned lower floor reflected light component and the above-mentioned internal reflection light component of determined test portion in the geometric system of regulation; And

Direct reflection light quantity calculating part based on each component that is generated by above-mentioned lower floor reflected light component generating unit, above-mentioned internal reflection light component generating unit and above-mentioned surface reflection light component generating unit, is asked the direct reflection light quantity of test portion.

10. bright luster prediction unit, based on determined brightness value in the geometric system of the regulation of the test portion that constitutes by base material and the colorant layer that comprises pigment particles that on above-mentioned base material, forms, predict the direct reflection light quantity of the test portion in other the geometric system, thereby prediction mirror surface luster, it is characterized in that described bright luster prediction unit comprises:

Lower floor's reflected light component generating unit, only based on the brightness value of above-mentioned base material determined in a plurality of geometric systems, calculate in the geometric system of afore mentioned rules and above-mentioned other the geometric system, by above-mentioned base material reflection and see through lower floor's reflected light component of above-mentioned colorant layer radiation;

Upper strata reflected light component generating unit, lower floor's reflected light component in the geometric system of the afore mentioned rules that calculates based on the brightness value of test portion determined in the geometric system of afore mentioned rules and above-mentioned lower floor reflected light component generating unit, calculates in above-mentioned other the geometric system, in above-mentioned colorant layer, comprise scattering between pigment particles and the pigment particles reflected light component that reflects by the scattered reflection light component of radiation, by above-mentioned pigment particles and by the surface reflection light component of the surface reflection of above-mentioned colorant layer; And

Direct reflection light quantity calculating part based on each component in above-mentioned other the geometric system that is calculated by above-mentioned lower floor reflected light component generating unit and above-mentioned upper strata reflected light component generating unit, calculates the direct reflection light quantity of the test portion in above-mentioned other the geometric system.

11. bright luster prediction unit as claimed in claim 10 is characterized in that,

Above-mentioned upper strata reflected light component generating unit is by using the bitintability reflection model, calculates upper strata scattered reflection light component, above-mentioned pigment particles reflected light component and above-mentioned surface reflection light component in above-mentioned other the geometric system.

12. bright luster prediction unit as claimed in claim 11 is characterized in that,

Above-mentioned lower floor reflected light component generating unit is calculated the geometric system of three kinds of regulations and the above-mentioned lower floor reflected light component in above-mentioned other the geometric system at least,

Above-mentioned upper strata reflected light component generating unit comprises:

Calculation of parameter portion, lower floor's reflected light component in the geometric system of above-mentioned at least three kinds of regulations of calculating based on the concentration value of the test portion of measuring in the geometric system of above-mentioned at least three kinds of regulations and by above-mentioned lower floor reflected light component generating unit is asked (a) the Oren-Nayar Model parameter and (b) allocation proportion of above-mentioned scattered reflection light component, above-mentioned pigment particles reflected light component and above-mentioned surface reflection light component; And

The reflected light component calculating part, use above-mentioned allocation proportion, calculate above-mentioned pigment particles reflected light component and above-mentioned surface reflection light component in above-mentioned other the geometric system, use the above-mentioned scattered reflection light component in above-mentioned other the geometric system of above-mentioned allocation proportion, above-mentioned parameter and Oren-Nayar Model Calculation simultaneously.

13. bright luster prediction unit as claimed in claim 12 is characterized in that,

Above-mentioned reflected light component calculating part uses above-mentioned allocation proportion and Torrance-Sparrow model, calculates above-mentioned pigment particles reflected light component and above-mentioned surface reflection light component in above-mentioned other the geometric system.

14. a bright luster Forecasting Methodology, the direct reflection light quantity of the test portion that is made of base material and the colorant layer that forms on above-mentioned base material by prediction is predicted mirror surface luster, it is characterized in that described bright luster Forecasting Methodology comprises:

Lower floor's reflected light component generates step, make light source incident angle and light-receiving angle in a plurality of geometric systems of certain angle change, only measure the brightness value of above-mentioned base material, and calculate lower floor's reflected light component that above-mentioned base material reflects and see through the radiation of above-mentioned colorant layer based on the brightness value of measuring;

The internal reflection light component generates step, in a non-mirror reflection geometric system, measure the brightness value of test portion, and calculate after the internal reflection light component of the internal reflection of above-mentioned colorant layer based on the brightness value of having measured and above-mentioned lower floor reflected light component, use the bitintability reflection model, predict the internal reflection light component in other the geometric system;

The surface reflection light component generates step, in a direct reflection geometric system, measure the brightness value of test portion, and calculate after the surface reflection light component by the surface reflection of above-mentioned colorant layer based on brightness value, above-mentioned lower floor reflected light component and the above-mentioned internal reflection light component measured, use the bitintability reflection model, predict the surface reflection light component in other the direct reflection geometric system; And

Direct reflection light quantity calculation procedure based on the lower floor's reflected light component that is obtained by above steps, internal reflection light component and surface reflection light component, is asked the direct reflection light quantity of test portion.

15. bright luster Forecasting Methodology, by based on the brightness value of in the geometric system of the regulation of the test portion that constitutes by base material and the colorant layer that comprises pigment particles that on above-mentioned base material, forms, measuring, predict the direct reflection light quantity of the test portion in other the geometric system, thereby prediction mirror surface luster, it is characterized in that described bright luster Forecasting Methodology comprises:

The lower floor reflected light component generates step, only based on the brightness value of above-mentioned base material determined in a plurality of geometric systems respectively in the geometric system and above-mentioned other geometric system of computational rules, by above-mentioned base material reflection and see through lower floor's reflected light component of above-mentioned colorant layer radiation;

The upper strata reflected light component generates step, generate above-mentioned lower floor reflected light component in the geometric system of the afore mentioned rules that calculates in the step based on the brightness value of the test portion of in the geometric system of afore mentioned rules, measuring and in above-mentioned lower floor reflected light component, calculates in above-mentioned other the geometric system, in above-mentioned colorant layer, comprise scattering between pigment particles and the pigment particles reflected light component that reflects by the scattered reflection light component of radiation, by above-mentioned pigment particles and by the surface reflection light component of the surface reflection of above-mentioned colorant layer; And

Direct reflection light quantity calculation procedure, based on generating the lower floor's reflected light component in above-mentioned other the geometric system that calculates in the step in above-mentioned lower floor reflected light component and generating each component that calculates in the step, calculate the direct reflection light quantity of the test portion in above-mentioned other the geometric system in above-mentioned upper strata reflected light component.

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