CN100403047C - Memory output power test device - Google Patents
Memory output power test device Download PDFInfo
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- CN100403047C CN100403047C CNB2005100045431A CN200510004543A CN100403047C CN 100403047 C CN100403047 C CN 100403047C CN B2005100045431 A CNB2005100045431 A CN B2005100045431A CN 200510004543 A CN200510004543 A CN 200510004543A CN 100403047 C CN100403047 C CN 100403047C
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Abstract
The present invention relates to a memory output power test device which comprises a signal control device and a voltage regulating circuit, wherein the signal control device is connected with the voltage regulating circuit, and the voltage regulating circuit can regulate output voltage according to a group of test signals from the signal control device, namely the high level or the low level of the test signals is regulated by the signal control device so that the voltage regulating circuit respectively outputs high level voltage or low level voltage according to the high level or the low level of the test signals.
Description
Technical field
The present invention is about the output power test device of a kind of power supply testing device, particularly a kind of storer.
Background technology
No matter be finished product or half-finished electronic installation, in the electronic installation production run, the test link all is absolutely necessary.If when the development new architecture, more need just can guarantee the quality of the electronic installation of this new architecture through testing repeatedly and improving.Even the type in the volume production also is just can sell seriatim through after the test before each shipment.And,, still need just can sell again through after testing every part and function repeatedly even if only be the function that in the electronic installation of the type of volume production, increases by an assembly or increase by an assembly.General next, in the test process that dispatches from the factory, basically can repertoire, assembly and the device that be comprised in the electronic installation be detected, during therefore as if many increase by one functions or a device, can increase its required test duration relatively, be one of main method that increases production capacity so how to obtain complete certain test result in the short test duration.
In the test process that dispatches from the factory, in memory test, need to observe the stability of its power supply output, in general memory power output (output power) need be maintained at a fixed value--2.5V, yet can only be a fixed voltage near 2.5V because of influences such as circuit design and composition assemblies itself when reality is exported.And if output voltage when excessive or too small, easily cause system's instability, even causes whole electronic device failure.Therefore, in the test process that dispatches from the factory, need carry out the test of memory power, to guarantee the stability of system.
Previous test mode replaces the divider resistance of original output terminal by an adjustable resistance, then, makes the variation (being 1.9V～3.1V voltage range) of output voltage generation ± 0.6V and the stability of observing system by the resistance of adjusting adjustable resistance.Yet, this way needs earlier divider resistance to be taken off by network iron, and then adjustable resistance is welded in the position of original divider resistance, just can test, therefore quite inconvenient, and the method damages other peripheral electronic package possibly in the process of taking off divider resistance and welding adjustable resistance.In addition, need quite stable when adjusting the resistance of adjustable resistance again, otherwise have a little change promptly can cause output voltage values to change slightly, thereby have influence on test result.
Summary of the invention
Fundamental purpose of the present invention is to provide a kind of output power test device of storer, to solve existing many restrictions of prior art and shortcoming.
In order to achieve the above object, the invention provides a kind of output power test device of storer, comprising: a signal control device, in order to produce a plurality of test signals; And a regulating circuit, be connected to this signal control device, in order to according to this test signal and the modulation output voltage.
According to design of the present invention, this signal control device comprises: a connector has a plurality of slots, to produce this test signal; And more than one jumper, in order to insert in this slot, to change this test signal.
According to design of the present invention, this test signal changes according to the number of this jumper and the position of this slot of insertion.
According to design of the present invention, the output power test device of this storer also comprises: a filtering circuit connects this regulating circuit, to carry out the filtering of this regulating circuit output voltage; And a divider resistance, in parallel with this filtering circuit.
According to design of the present invention, this filtering circuit comprises: a plurality of electric capacity parallel with one another.
According to design of the present invention, this regulating circuit is an integrated circuit.
The output power test device of disclosed storer, (IC) changes output voltage values by a control integrated circuit, with the stability of test output voltage system when the variation of ± 0.6V.
That is to say that the output power test device of disclosed storer includes a signal control device and a regulating circuit.Signal control device and regulating circuit are connected, and wherein, regulating circuit can be adjusted output voltage according to one group of test signal from signal control device.Just, the high level or the low level of signal control device modulation test signal, and then make regulating circuit export high level or low level voltage respectively according to the high level or the low level of test signal.
In this, regulating circuit can be an integrated circuit.And signal control device can be a connector, has a plurality of slots on it.Slot position by jumper (JUMP) number of planting on the slot and plant produces different test signal combinations.
In addition, the output power test device of disclosed storer includes a filtering circuit and a divider resistance.Wherein divider resistance links to each other with filtering circuit in parallel.Filtering circuit is in order to carrying out the filter action of output voltage, and divider resistance is in order to dividing potential drop.In this, filtering circuit can be formed in parallel by a plurality of identical or different electric capacity.
Description of drawings
Fig. 1 is the summary structural drawing for the output circuit that known storer is described;
Fig. 2 is the summary structural drawing for the test circuit that known storer output voltage is described;
Fig. 3 is the summary structural drawing of explanation according to the output power test device of the storer of one embodiment of the invention; And
Fig. 4 forms relation table with output voltage V o for being illustrated among Fig. 3 each test signal.
Wherein, description of reference numerals is as follows:
The VCC-input voltage; V-voltage; The Vo-output voltage; The U-integrated circuit;
The Cs-filtering circuit; The R-divider resistance; The VR-variable resistor; The VU-regulating circuit;
The SC-signal control device; S1～S5 test signal.
Embodiment
Below enumerate specific embodiment describing content of the present invention in detail, and with accompanying drawing as aid illustration.The symbol of mentioning in the explanation is with reference to reference numeral.
On the circuit design of storer, comprise an integrated circuit U, a filtering circuit Cs and a divider resistance R in storer outlet end part major part, wherein the three links to each other in regular turn, as shown in Figure 1.Therefore, the output voltage of storer can be integrated through integrated circuit U earlier, exports after by divider resistance R dividing potential drop by filtering circuit Cs then.And general filtering circuit can be formed in parallel by a plurality of identical or different electric capacity.Wherein, divider resistance links to each other with filtering circuit with parallel way.
In known method of testing, as shown in Figure 2, be the structural drawing of known memory power test circuit, the position that replaces original divider resistance with a variable resistor VR, therefore, via the resistance of tester, to change output voltage values by manual adjustment variable resistor VR.
With reference to Fig. 3, be the output power test device of the storer of one embodiment of the invention.In this, a regulating circuit VU, a filtering circuit Cs link to each other in regular turn with a divider resistance, and have a signal control device SC to be connected to regulating circuit VU.Wherein, regulating circuit VU can adjust output voltage according to one group of test signal S1～S5, just the high level of the test signal S1 of basis～S5 or low level and export high level or low level voltage respectively.And these test signals S1～S5 adjusts its signal composition by signal control device SC.In this, filtering circuit can be formed in parallel by a plurality of identical or different electric capacity.And this regulating circuit VU can be an integrated circuit, for example: the integrated circuit of model HIP6311 etc.Signal control device SC can be a connector (connecter), has a plurality of slots on it.When more than one jumper (JUMP) when combining, can produce one group of test signal with slot.Just, produce different test signal combinations by the slot number of insertion jumper and the change of slot position.
For instance, with reference to Fig. 3, suppose that the regulating circuit VU in the output power test device of storer of one embodiment of the invention is an integrated circuit, and signal control device SC is a connector.When being applied to the output power test device of this storer on one memory circuitry, when the tester carries out the out-put supply test of storer, can increase the jumper number of inserting connector in regular turn and change the slot that inserts in regular turn, thereby the test signal group S1 of varying level～S5 inputs to integrated circuit in regular turn.At this moment, integrated circuit is according to each test signal group modulation output voltage V o in regular turn, and wherein, each test signal is formed the relation with output voltage V o, be illustrated in fig. 4 shown below, wherein, the signal of " 1 " expression high level, and " 0 " represents low level signal.Thereby output voltage can produce ± variation of 0.6V, and then the tester can carry out the observation of total system stability by this change in voltage.
Though the present invention discloses as above with aforesaid preferred embodiment; right its is not in order to limit the present invention; any familiar alike operator; without departing from the spirit and scope of the present invention; when can doing a little change and retouching, therefore scope of patent protection of the present invention must be looked being as the criterion that this instructions appending claims defined.
Claims (5)
1. the output power test device of a storer, comprising:
One signal control device is in order to produce a plurality of test signals; And
One regulating circuit is connected to this signal control device, in order to according to this test signal and the modulation output voltage;
Wherein this signal control device comprises: a connector has a plurality of slots, to produce this test signal; And
More than one jumper is in order to insert in this slot, to change this test signal.
2. the output power test device of storer as claimed in claim 1 is characterized in that this test signal changes according to the number of this jumper and the position of this slot of insertion.
3. the output power test device of storer as claimed in claim 1 is characterized in that also comprising:
One filtering circuit connects this regulating circuit, to carry out the filtering of this regulating circuit output voltage; And
One divider resistance, in parallel with this filtering circuit.
4. the output power test device of storer as claimed in claim 3 is characterized in that this filtering circuit comprises: a plurality of electric capacity parallel with one another.
5. the output power test device of storer as claimed in claim 1 is characterized in that this regulating circuit is an integrated circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2005100045431A CN100403047C (en) | 2005-01-18 | 2005-01-18 | Memory output power test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2005100045431A CN100403047C (en) | 2005-01-18 | 2005-01-18 | Memory output power test device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1808166A CN1808166A (en) | 2006-07-26 |
| CN100403047C true CN100403047C (en) | 2008-07-16 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2005100045431A Expired - Fee Related CN100403047C (en) | 2005-01-18 | 2005-01-18 | Memory output power test device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN100403047C (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6756805B2 (en) * | 1997-08-21 | 2004-06-29 | Micron Technology, Inc. | System for testing integrated circuit devices |
| CN1530788A (en) * | 2003-03-14 | 2004-09-22 | 联想(北京)有限公司 | Apparatus for regulating stabilized circuit outputting voltage |
-
2005
- 2005-01-18 CN CNB2005100045431A patent/CN100403047C/en not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6756805B2 (en) * | 1997-08-21 | 2004-06-29 | Micron Technology, Inc. | System for testing integrated circuit devices |
| CN1530788A (en) * | 2003-03-14 | 2004-09-22 | 联想(北京)有限公司 | Apparatus for regulating stabilized circuit outputting voltage |
Non-Patent Citations (2)
| Title |
|---|
| 模拟电子线路基础. 吴运昌，352-353，华南理工大学出版社. 1998 |
| 模拟电子线路基础. 吴运昌，352-353，华南理工大学出版社. 1998 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN1808166A (en) | 2006-07-26 |
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| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20080716 Termination date: 20120118 |