CN100334459C - Organic luminescent display pixel testing method and apparatus - Google Patents
Organic luminescent display pixel testing method and apparatus Download PDFInfo
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- CN100334459C CN100334459C CNB031411282A CN03141128A CN100334459C CN 100334459 C CN100334459 C CN 100334459C CN B031411282 A CNB031411282 A CN B031411282A CN 03141128 A CN03141128 A CN 03141128A CN 100334459 C CN100334459 C CN 100334459C
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Abstract
The present invention provides a method and a device. Before an organic LED is embedded, drive circuits of a plurality of pixels of an organic luminous display device (OLED) are tested. The method and the device of the present invention first select a drive circuit to be tested, a metal flat plate is arranged on a plurality of groups of array glass to form a capacitor, and simultaneously, data lines, write scan lines and power lines of the OLED are used for inputting and extracting signals in order accomplish the test work.
Description
Technical field
The invention provides a kind of method of testing and device, before implanting (implantation) Organic Light Emitting Diode, test the driving circuit of the pixel of an organic light emitting display.
Background technology
Along with the progress of science and technology, screen display technology is also and then maked rapid progress.After secondary optical diode (LED) display technique, occurred a kind of brand-new plane display technique on the market, this new technology is called Organic Light Emitting Diode (organic light emitting diode) display technique.Organic Light Emitting Diode needs a driving circuit to drive.With organic light emitting display technology (organic light emittingdisplay is called for short OLED) is example, and it is luminous to drive Organic Light Emitting Diode that driving circuit produces an electric current, and the light of sending out can be monochromes such as red, green, blue, even can reach full-color effect.Organic Light Emitting Diode not only can roll and be with, and does not also have the visual angle problem fully.Life-span reaches thousands of hours simultaneously, and power consumption is very low.Because Organic Light Emitting Diode has above-mentioned advantage, therefore very likely replace traditional light emitting diode, become the main flow of display technique of future generation.
When utilizing Organic Light Emitting Diode to make display, each pixel (pixel) needs an Organic Light Emitting Diode, and just each pixel needs a driving circuit.Therefore display has the driving circuit of ten hundreds of even 1,000,000.How testing these driving circuits effectively is very large-engineerings.Fig. 1 is the normal at present driving circuit that uses.As shown in Figure 1, the method for existing test driving circuit is after implanting Organic Light Emitting Diode D1, by writing the single driving circuit of sweep trace WSL startup out of the ordinary, imports a voltage level by data line DL again.This voltage level is converted to current signal I through driving circuit thus, and this current signal I drives Organic Light Emitting Diode D1 and makes it luminous.Just according to the voltage level of input, whether the luminosity of range estimation Organic Light Emitting Diode D1 is normal, judges that this driving circuit could operate as normal for the tester.This existing method can cause the test result out of true because of the difference of tester's subjective mind.More serious problem is, if some driving circuits can't operate as normal, the related Organic Light Emitting Diode D1 that is implanted in this driving circuit that makes also and then scraps, and can't reclaim, and cause the raising of cost.Therefore, just need a kind of method of testing, can before implanting Organic Light Emitting Diode D1, effectively also test each driving circuit exactly.
Summary of the invention
The invention provides a kind of method and device, before implanting Organic Light Emitting Diode, test the driving circuit on the organic light-emitting display device picture element.Organic light emitting display comprises one and writes sweep trace, a data line, a power lead and a multiple substrate (array glass), and driving circuit comprises a first transistor, a transistor seconds and one first electric capacity.
Method of testing provided by the present invention is as follows: repeat following steps, up to the test signal of all driving circuits all extracted finish till.Via writing sweep trace, select the next one drive circuit that will test.Via the first transistor,, and extract one first signal from data line to first capacitor charge and discharge.Place a metal plate in the multiple substrate top, make metal plate and multiple substrate form one second electric capacity.Via transistor seconds,, and extract a secondary signal from power lead to second capacitor charge and discharge.
After storing all first and second signals, try to achieve a mean value with regard to first and second signal respectively, according to this mean value, analyze first and second signal of being extracted whether in normal range, judge that thus this driving circuit could operate as normal.
Proving installation provided by the present invention comprises pixel selection device (pixel selection device), dector (signal extractor) and signal analyzer (signal analyzer).The pixel selection device is imported a signal, with the driving circuit of selecting to test.Dector is used for extracting first and second signal.Signal analyzer is connected with dector, is used for storing and analyzing first and second signal that is extracted, could operate as normal to judge this driving circuit.
Description of drawings
Fig. 1 is the circuit diagram of existing test OLED pixel;
Fig. 2 utilizes method of the present invention to extract the circuit diagram of first signal;
Fig. 3 is the process flow diagram of method of testing of the present invention;
Fig. 4 utilizes method of the present invention to extract the circuit diagram of secondary signal;
Fig. 5 extracts the synoptic diagram of first signal for proving installation of the present invention;
Fig. 6 extracts the synoptic diagram of secondary signal for proving installation of the present invention.
Embodiment
Reference numeral among the present invention at first is described: 1 organic light emitting display, 3 first joints, 5 second joints, 7 the 3rd joints, 9 metal plates, 11 driving circuits, 13 input liners, 15 signals, 17 first signals, 19 secondary signals, 21 pixel selection devices, 23 dectors, 25 signal analyzers, 31 connectors.
The invention provides a kind of before implanting Organic Light Emitting Diode, the method for testing the driving circuit on the organic light-emitting display device picture element.Suppose that this organic light emitting display has a plurality of driving circuits, be used for driving a plurality of Organic Light Emitting Diodes, also comprise one and write sweep trace, a data line, a power lead and a multiple substrate.Write sweep trace and can transmit a signal, be used for starting (enable) or stopping (disable) a certain specific driving circuit to each driving circuit.Data line can transmit another signal to this specific driving circuit, and after implanting Organic Light Emitting Diode, it is luminous to be used for driving Organic Light Emitting Diode.Power lead is used for supplying with the driving circuit power supply after implanting Organic Light Emitting Diode.Multiple substrate is the flat board of semiconductor material, be used for driving circuit be produced on it above.
Fig. 2 is a driving circuit (not implanting Organic Light Emitting Diode as yet) commonly used.As shown in Figure 2, driving circuit comprises a first transistor M1, a transistor seconds M2 and one first capacitor C 1.The first transistor M1 and transistor seconds M2 respectively comprise one source pole (source) S, a grid (gate) G and drain electrode (drain) D.First capacitor C 1 comprises one first end n1 and one second end n2.Wherein, the source S of the first transistor M1 (or drain electrode) is connected to the data line DL of organic light emitting display, what the grid G of the first transistor M1 was connected to organic light emitting display writes sweep trace WSL, the first end n1 of first capacitor C 1 and the power lead POWER of organic light emitting display are connected to the source S (or drain electrode) of transistor seconds M2, the second end n2 of first capacitor C 1 is connected to the grid G of transistor seconds M2, the drain D of transistor seconds M2 (or source electrode) is connected to the multiple substrate of organic light emitting display, after implanting Organic Light Emitting Diode, then be connected to Organic Light Emitting Diode.
Method of testing provided by the present invention as shown in Figure 3.When execution in step 301, check whether the test signal of all driving circuits has all been extracted to finish.If not, then execution in step 303, import a voltage level to writing sweep trace WSL, with the driving circuit of selecting (startup) next one to test.Driving circuit with Fig. 2 is an example, because the first transistor M1 is a P channel thin film transistors (P-channel TFT).Therefore when execution in step 303, write sweep trace WSL and can transmit the grid G of a low level voltage, make the first transistor M1 conducting to the first transistor M1.When execution in step 305, shown in dotted arrow among Fig. 2, first capacitor C 1 is discharged and recharged, and extract first signal that 1 discharge is produced from first capacitor C from data line DL.
In the time of will charging to first capacitor C 1, data line DL provide high voltage, makes that the voltage on the power lead POWER is low-voltage comparatively speaking, with form electronic loop (data line DL-〉the first transistor M1-〉the first capacitor C 1-power lead POWER).Since the first transistor M1 conducting when step 303, thus have an electric current via the first transistor M1, to 1 charging of first capacitor C.After one section appropriate time charges first capacitor C 1 fully, voltage on the data line DL is reduced to low-voltage, make the voltage on the power lead POWER be high voltage comparatively speaking, therefore, form again another electronic loop (power lead POWER-〉the first capacitor C 1-〉the first transistor M1-data line DL), first capacitor C 1 is just discharged to data line DL via the first transistor M1.In the process of discharge, go up extraction first signal that 1 discharge is produced from first capacitor C from data line DL.
When execution in step 307,, place a metal plate, and this metal plate is connected to earth terminal in the multiple substrate top.This arrangement can make multiple substrate and metal plate form a parallel plate capacitor.As shown in Figure 4, the i.e. parallel plate capacitor that produced of a step for this reason of second capacitor C 2 among the figure.When execution in step 309, shown in dotted arrow among Fig. 4,, second capacitor C 2 is discharged and recharged, and extract the secondary signal that 2 discharges are produced from second capacitor C from power lead POWER via transistor seconds M2.
In the time of will be to the charging of second capacitor C 2, power lead POWER provides a high voltage, with form electronic loop (power lead POWER-〉transistor seconds M2-〉the second capacitor C 2-earth terminal).Therefore, electric current can be via transistor seconds M2, to 2 chargings of second capacitor C.After one section appropriate time charged second capacitor C 2 fully, the voltage on the power lead POWER was reduced to a low-voltage, made that earth terminal is a high voltage comparatively speaking.Form another electronic loop (earth terminal-second capacitor C 2-〉transistor seconds M2-〉power lead POWER) this moment again, and second capacitor C 2 is just discharged to power lead POWER via transistor seconds M2.In the process of discharge, go up the extraction secondary signal that 2 discharges are produced from second capacitor C from power lead POWER.
After the execution of step 309, just get back to step 301, repeat above-mentioned flow process, all driving circuits are extracted its first and second signal, execution in step 311 afterwards.When execution in step 311, all first and second signals are done analysis, to judge that driving circuit could operate as normal.
First signal and secondary signal can be charge value, magnitude of voltage or current value.In this embodiment, judge as reference whether the function of driving circuit is normal with charge value.At first, all first and second signals are averaged respectively, compare with each first and second signal again.If the charge value of a certain first signal is positioned at about 0.25 to the 1.75 times scope of mean value, but then look the first transistor M1 and first capacitor C, 1 operate as normal in its driving circuit.For example first signal averaging is 5pC, and its normal range should drop between 1.25pC and the 8.75pC, therefore, if first signal that has one drive circuit to extract is 3pC, but the first transistor M1 and first capacitor C, 1 operate as normal in this driving circuit then.In like manner, if the charge value of a certain secondary signal is positioned at about 0.25 to the 1.75 times scope of mean value, but then look the transistor seconds M2 operate as normal in its driving circuit.
Test the driving circuit of OLED with method of testing of the present invention, can be accurately and finish whole testing process effectively.Can be because of the difference of tester's subjectivity, and produce the shortcoming that test result varies with each individual.
Though the driving circuit of OLED has many different structures, drive Organic Light Emitting Diode, the first transistor M1 among Fig. 2, transistor seconds M2 and first capacitor C 1 are indispensable, also are most important assemblies.If but these three assembly operate as normal can guarantee that just the function of this driving circuit is normal.Therefore, method of testing of the present invention is not only applicable to driving circuit shown in Figure 2, applicable to other similar driving circuit yet.
The present invention discloses a kind of device simultaneously, is used for carrying out above-mentioned method of testing.Fig. 5 is the device synoptic diagram when utilizing method of the present invention to extract first signal.As shown in Figure 5, organic light emitting display 1 has an input liner (input panel) 13, data line DL among Fig. 2, write sweep trace WSL and power lead POWER and all be connected to input liner 13, and via first joint 3 on the connector 31, second joint 5 and the 3rd joint 7 for input and output signals.This device comprises a pixel selection device 21, a dector 23 and a signal analyzer 25.Pixel selection device 21 sees through first joint 3 and is connected with the sweep trace WSL that writes of organic light emitting display 1, when step 303, is used for importing a signal 15, with the driving circuit of selecting to test 11.Dector 23 is connected with the data line DL of organic light emitting display 1 through the 3rd joint 7, when step 305, provides a high voltage to 1 charging of first capacitor C, and when 1 discharge of first capacitor C, extracts first signal 17.Signal analyzer 25 is connected with dector 23, is used for storing first signal 17 that all extract, and when step 311, analysis also judges that the first transistor M1 and first capacitor C 1 could operate as normal.Second joint 5 is connected with the power lead POWER of organic light emitting display 1, for convenient test, is connected to earth terminal.
Fig. 6 is the device synoptic diagram when utilizing method of the present invention to extract secondary signal.As shown in Figure 6, a metal plate 9 is positioned over the multiple substrate top, to form second capacitor C 2 among Fig. 4.Dector 23 is connected with the power lead POWER of organic light emitting display 1 through second joint 5, when step 309, provides a high voltage to 2 chargings of second capacitor C, and when 2 discharges of second capacitor C, extracts secondary signal 19.Signal analyzer 25 is connected with dector 23, is used for storing all secondary signals of extracting 19, and when step 311, analysis also judges that transistor seconds M2 could operate as normal.
Above narration only is explanation spirit of the present invention, should be with this as restriction.Those skilled in the art can do suitable variation to the present invention under the situation that does not break away from the spirit and scope of the present invention.
Claims (6)
1. implant the method for testing a plurality of driving circuits of organic light emitting display (OLED) before the Organic Light Emitting Diode for one kind, this organic light emitting display comprises:
One writes sweep trace, in order to start the one drive circuit that will test;
One data line;
One power lead; And
One multiple substrate is in order to making thereon by a plurality of driving circuits;
This driving circuit comprises:
One the first transistor and a transistor seconds comprise one source pole, a grid and a drain electrode respectively; And
One first electric capacity comprises one first end and one second end;
This method comprises the following step:
(a) repeating step (b) is to step (e), up to one first and one secondary signal of these a plurality of driving circuits all extracted finish till;
(b) write sweep trace via this, the one drive circuit that startup will be tested;
(c),, and extract this first signal from this data line to this first capacitor charge and discharge via this first transistor;
(d) place a metal plate in this multiple substrate top, make this metal plate and this multiple substrate form one second electric capacity;
(e),, and extract this secondary signal from this power lead to this second capacitor charge and discharge via this transistor seconds; And
(f) analyze this first and second signal, could operate as normal to judge this driving circuit.
2. the method for claim 1, wherein step (c) also comprises:
(g) provide a high voltage by this data line, through this first transistor, to this first electric capacity charging;
(h) provide a low-voltage by this data line, make this first electric capacity, this data line discharge through this first transistor; And
(i) in the process of this first capacitor discharge, extract this first signal from this data line.
3. the method for claim 1, wherein step (e) also comprises:
(j) provide a high voltage by this power lead, through this transistor seconds, to this second electric capacity charging;
(k) provide a low-voltage by this power lead, make this second electric capacity, this power lead discharge through this transistor seconds; And
(l) in the process of this second capacitor discharge, extract this secondary signal from this power lead.
4. the method for claim 1, wherein this first and second signal be a charge value, magnitude of voltage or current value one of them.
5. the method for claim 1, wherein step (f) also comprises:
(m) this first and second signal to these a plurality of driving circuits calculates a mean value respectively;
(n), but promptly represent this first transistor and this first electric capacity operate as normal when this first signal during between the scope of 0.25 times to 1.75 times of this mean value of this first signal; And
(o), but promptly represent this transistor seconds operate as normal when this secondary signal during between the scope of 0.25 times to 1.75 times of this mean value of this secondary signal.
6. the device of a plurality of driving circuits of test organic light emitting display before implanting Organic Light Emitting Diode, this organic light emitting display comprises:
One writes sweep trace, in order to start the one drive circuit that will test; And
One data line;
One power lead; And
One multiple substrate is in order to making thereon by a plurality of driving circuits;
This driving circuit comprises:
One the first transistor and a transistor seconds comprise one source pole, a grid and a drain electrode respectively; And
One first electric capacity comprises one first end and one second end;
One second electric capacity is placed a metal plate in this multiple substrate top, makes this metal plate and this multiple substrate form second electric capacity;
This device comprises:
One pixel selection device is in order to the one drive circuit of selecting to test;
One dector is in order to extract a signal; And
One signal analyzer is connected to this dector, in order to store and to analyze this signal, to judge that this driving circuit that will test could operate as normal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB031411282A CN100334459C (en) | 2003-06-09 | 2003-06-09 | Organic luminescent display pixel testing method and apparatus |
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| Application Number | Priority Date | Filing Date | Title |
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| CNB031411282A CN100334459C (en) | 2003-06-09 | 2003-06-09 | Organic luminescent display pixel testing method and apparatus |
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| CN1566979A CN1566979A (en) | 2005-01-19 |
| CN100334459C true CN100334459C (en) | 2007-08-29 |
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| CNB031411282A Expired - Fee Related CN100334459C (en) | 2003-06-09 | 2003-06-09 | Organic luminescent display pixel testing method and apparatus |
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Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN100405068C (en) * | 2006-01-13 | 2008-07-23 | 友达光电股份有限公司 | Apparatus and method for testing organic electroluminescence display panel |
| CN113447858B (en) * | 2020-11-11 | 2022-11-11 | 重庆康佳光电技术研究院有限公司 | Circuit backboard detection device and detection method |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4137523A (en) * | 1975-05-20 | 1979-01-30 | Kabushiki Kaisha Suwa Seikosha | Digital display driving circuit |
| CN1200528A (en) * | 1997-05-22 | 1998-12-02 | 合泰半导体股份有限公司 | Method and device for enhancing multi-functional selection with liquid crystal displaying driver |
| CN1402218A (en) * | 2002-08-26 | 2003-03-12 | 统宝光电股份有限公司 | LCD driving device and method |
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4137523A (en) * | 1975-05-20 | 1979-01-30 | Kabushiki Kaisha Suwa Seikosha | Digital display driving circuit |
| CN1200528A (en) * | 1997-05-22 | 1998-12-02 | 合泰半导体股份有限公司 | Method and device for enhancing multi-functional selection with liquid crystal displaying driver |
| CN1402218A (en) * | 2002-08-26 | 2003-03-12 | 统宝光电股份有限公司 | LCD driving device and method |
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