CH7232A - New aneroid barometer - Google Patents

New aneroid barometer

Info

Publication number
CH7232A
CH7232A CH7232A CH7232DA CH7232A CH 7232 A CH7232 A CH 7232A CH 7232 A CH7232 A CH 7232A CH 7232D A CH7232D A CH 7232DA CH 7232 A CH7232 A CH 7232A
Authority
CH
Switzerland
Prior art keywords
new
aneroid barometer
aneroid
barometer
new aneroid
Prior art date
Application number
CH7232A
Other languages
French (fr)
Inventor
Constant Dutoit
Original Assignee
Constant Dutoit
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Constant Dutoit filed Critical Constant Dutoit
Publication of CH7232A publication Critical patent/CH7232A/en

Links

CH7232A 1893-08-20 1893-08-20 New aneroid barometer CH7232A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH7232T 1893-08-20

Publications (1)

Publication Number Publication Date
CH7232A true CH7232A (en) 1894-02-15

Family

ID=4193667

Family Applications (1)

Application Number Title Priority Date Filing Date
CH7232A CH7232A (en) 1893-08-20 1893-08-20 New aneroid barometer

Country Status (1)

Country Link
CH (1) CH7232A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2591666A (en) * 1948-10-20 1952-04-08 Walter H Barkas Interferometer gauge
US2629283A (en) * 1951-03-13 1953-02-24 Theodor W Zobel Interference schlieren apparatus of unusually large dimensions, having means for improving the interference quality by selective one point deformation of the reflecting elements of the device
US2743645A (en) * 1952-08-20 1956-05-01 Johansson Ab C E Interferometric apparatus for examining the structure of reflecting surfaces
US2995923A (en) * 1951-12-20 1961-08-15 Leitz Ernst Gmbh Method and apparatus for measuring the thickness of adsorption layers of liquid formed between two glass surfaces

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2591666A (en) * 1948-10-20 1952-04-08 Walter H Barkas Interferometer gauge
US2629283A (en) * 1951-03-13 1953-02-24 Theodor W Zobel Interference schlieren apparatus of unusually large dimensions, having means for improving the interference quality by selective one point deformation of the reflecting elements of the device
US2995923A (en) * 1951-12-20 1961-08-15 Leitz Ernst Gmbh Method and apparatus for measuring the thickness of adsorption layers of liquid formed between two glass surfaces
US2743645A (en) * 1952-08-20 1956-05-01 Johansson Ab C E Interferometric apparatus for examining the structure of reflecting surfaces

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