CH583460A5 - - Google Patents

Info

Publication number
CH583460A5
CH583460A5 CH1313974A CH1313974A CH583460A5 CH 583460 A5 CH583460 A5 CH 583460A5 CH 1313974 A CH1313974 A CH 1313974A CH 1313974 A CH1313974 A CH 1313974A CH 583460 A5 CH583460 A5 CH 583460A5
Authority
CH
Switzerland
Application number
CH1313974A
Original Assignee
Balzers Patent Beteilig Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Balzers Patent Beteilig Ag filed Critical Balzers Patent Beteilig Ag
Priority to CH1313974A priority Critical patent/CH583460A5/xx
Priority to NL7416698.A priority patent/NL161918B/xx
Priority to DE19752538123 priority patent/DE2538123A1/de
Priority to GB3655775A priority patent/GB1473054A/en
Priority to FR7528199A priority patent/FR2286501A1/fr
Priority to US05/616,267 priority patent/US4047030A/en
Publication of CH583460A5 publication Critical patent/CH583460A5/xx

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/08—Deviation, concentration or focusing of the beam by electric or magnetic means
    • G21K1/087—Deviation, concentration or focusing of the beam by electric or magnetic means by electrical means

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
CH1313974A 1974-09-30 1974-09-30 CH583460A5 (fr)

Priority Applications (6)

Application Number Priority Date Filing Date Title
CH1313974A CH583460A5 (fr) 1974-09-30 1974-09-30
NL7416698.A NL161918B (nl) 1974-09-30 1974-12-20 Inrichting voor het op massaspectrometrische wijze aantonen van ionen.
DE19752538123 DE2538123A1 (de) 1974-09-30 1975-08-27 Anordnung zum massenspektrometrischen nachweis von ionen
GB3655775A GB1473054A (en) 1974-09-30 1975-09-05 Detection of ions by mass spectrometry
FR7528199A FR2286501A1 (fr) 1974-09-30 1975-09-15 Installation de detection d'ions par spectrometrie de masse
US05/616,267 US4047030A (en) 1974-09-30 1975-09-24 Arrangement for the mass-spectrometric detection of ions

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH1313974A CH583460A5 (fr) 1974-09-30 1974-09-30

Publications (1)

Publication Number Publication Date
CH583460A5 true CH583460A5 (fr) 1976-12-31

Family

ID=4389658

Family Applications (1)

Application Number Title Priority Date Filing Date
CH1313974A CH583460A5 (fr) 1974-09-30 1974-09-30

Country Status (6)

Country Link
US (1) US4047030A (fr)
CH (1) CH583460A5 (fr)
DE (1) DE2538123A1 (fr)
FR (1) FR2286501A1 (fr)
GB (1) GB1473054A (fr)
NL (1) NL161918B (fr)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3997846A (en) * 1975-06-30 1976-12-14 International Business Machines Corporation Method and apparatus for electrostatic deflection of high current ion beams in scanning apparatus
DE3037258A1 (de) * 1980-10-02 1982-05-19 Leybold-Heraeus GmbH, 5000 Köln Energie- oder massendispersiver analysator fuer elektrisch geladene teilchen
EP0107320A3 (fr) * 1982-09-17 1986-11-20 Dubilier Scientific Limited Appareils à faisceau d'ions
US4719349A (en) * 1986-05-27 1988-01-12 The United States Of America As Represented By The Department Of Health And Human Services Electrochemical sample probe for use in fast-atom bombardment mass spectrometry
SE461549B (sv) * 1988-06-13 1990-02-26 Sefors Ab Anordning vid ett straalningsdetekteringssystem med ett gasurladdningsroer
US5605798A (en) 1993-01-07 1997-02-25 Sequenom, Inc. DNA diagnostic based on mass spectrometry
US5464975A (en) * 1993-12-14 1995-11-07 Massively Parallel Instruments Method and apparatus for charged particle collection, conversion, fragmentation or detection
US5495107A (en) * 1994-04-06 1996-02-27 Thermo Jarrell Ash Corporation Analysis
JP3189652B2 (ja) * 1995-12-01 2001-07-16 株式会社日立製作所 質量分析装置
JP3355270B2 (ja) * 1996-02-05 2002-12-09 アルプス電気株式会社 発光モジュール
US5864137A (en) * 1996-10-01 1999-01-26 Genetrace Systems, Inc. Mass spectrometer
US20030129589A1 (en) 1996-11-06 2003-07-10 Hubert Koster Dna diagnostics based on mass spectrometry
CA2274587A1 (fr) 1996-12-10 1998-06-18 Genetrace Systems Inc. Molecules d'etiquetage massique, non volatiles et liberables
US6043488A (en) * 1997-08-18 2000-03-28 The Perkin-Elmer Corporation Carrier gas separator for mass spectroscopy
JP2000067807A (ja) * 1998-08-25 2000-03-03 Perkin Elmer Corp:The イオンビームからイオンを分離するための方法及び装置
EP1373561B1 (fr) 2000-06-13 2009-02-18 The Trustees of Boston University Utilisation de mass-matched nucleotidiques dans l'analyse de melanges d'oligonucleotides et le sequen age hautement multiplexe d'acides nucleiques
US7465919B1 (en) * 2006-03-22 2008-12-16 Itt Manufacturing Enterprises, Inc. Ion detection system with neutral noise suppression
GB0612503D0 (en) * 2006-06-23 2006-08-02 Micromass Ltd Mass spectrometer
CA2828967C (fr) 2011-03-04 2018-07-10 Perkinelmer Health Sciences, Inc. Lentilles electrostatiques et systemes les comprenant
KR101633978B1 (ko) 2014-06-20 2016-06-28 한국표준과학연구원 모노크로메이터 및 이를 구비한 하전입자빔 장치

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2255302C3 (de) * 1972-11-11 1980-09-11 Leybold-Heraeus Gmbh, 5000 Koeln Einrichtung für die Sekundär-Ionen-Massenspektroskopie

Also Published As

Publication number Publication date
US4047030A (en) 1977-09-06
DE2538123A1 (de) 1976-04-08
GB1473054A (en) 1977-05-11
FR2286501B1 (fr) 1980-01-11
FR2286501A1 (fr) 1976-04-23
NL161918B (nl) 1979-10-15
NL7416698A (nl) 1976-04-01

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Legal Events

Date Code Title Description
PL Patent ceased