CH572607A5 - - Google Patents

Info

Publication number
CH572607A5
CH572607A5 CH846873A CH846873A CH572607A5 CH 572607 A5 CH572607 A5 CH 572607A5 CH 846873 A CH846873 A CH 846873A CH 846873 A CH846873 A CH 846873A CH 572607 A5 CH572607 A5 CH 572607A5
Authority
CH
Switzerland
Application number
CH846873A
Original Assignee
Scott Richard Nelson
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Scott Richard Nelson filed Critical Scott Richard Nelson
Publication of CH572607A5 publication Critical patent/CH572607A5/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Optical Transform (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CH846873A 1972-06-09 1973-06-12 CH572607A5 (sv)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB2694272 1972-06-09
GB1871873*[A GB1428372A (en) 1972-06-09 1973-04-18 Optical apparatus for determining deviations from a predeter mined form of a surface

Publications (1)

Publication Number Publication Date
CH572607A5 true CH572607A5 (sv) 1976-02-13

Family

ID=26253570

Family Applications (1)

Application Number Title Priority Date Filing Date
CH846873A CH572607A5 (sv) 1972-06-09 1973-06-12

Country Status (9)

Country Link
US (1) US3871771A (sv)
JP (1) JPS5423820B2 (sv)
CH (1) CH572607A5 (sv)
DE (1) DE2329483C2 (sv)
FR (1) FR2188141B1 (sv)
GB (1) GB1428372A (sv)
IT (1) IT984670B (sv)
NL (1) NL7308165A (sv)
SE (1) SE411486B (sv)

Families Citing this family (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5190829A (sv) * 1975-02-07 1976-08-09
US4208129A (en) * 1978-06-30 1980-06-17 The United States Of America As Represented By The Secretary Of The Air Force Sensitive laser spectroscopy measurement system
FR2487077A1 (fr) * 1980-07-18 1982-01-22 Trt Telecom Radio Electr Dispositif de determination a distance de la position dans l'espace d'un objet effectuant des mouvements de rotation
US4390277A (en) * 1980-07-31 1983-06-28 Mcdonnell Douglas Corporation Flat sheet scatterometer
US4560272A (en) * 1980-12-10 1985-12-24 The Perkin-Elmer Corporation Three-axis angle sensor
FI63835C (fi) * 1981-02-10 1983-08-10 Altim Control Ky Foerfarande foer identifiering av ett virkes ytegenskaper
DD156287B1 (de) * 1981-02-18 1986-07-09 Salewski Klaus Dieter Optoelektrische anordnung zur praezisionsfluchtung und geradheitsmessung
GB2125539B (en) * 1982-08-10 1985-12-18 Standard Telephones Cables Ltd Optical transponder system
DE3322713C2 (de) * 1983-06-24 1986-11-27 Daimler-Benz Ag, 7000 Stuttgart Verfahren und Vorrichtung zur laufenden Messung des Rollwinkels eines beweglichen Maschinenteiles
US4920385A (en) * 1984-02-14 1990-04-24 Diffracto Ltd. Panel surface flaw inspection
US4629319A (en) * 1984-02-14 1986-12-16 Diffracto Ltd. Panel surface flaw inspection
DE3405886C2 (de) * 1984-02-18 1987-02-05 Daimler-Benz Ag, 7000 Stuttgart Verfahren und Vorrichtung zum polarimetrischen Messen des Rollwinkels eines beweglichen Maschinenteiles
DE3573018D1 (en) * 1984-09-25 1989-10-19 Richard Distl Measurement arrangement for analysing electromagnetic radiation
JPS61124834A (ja) * 1984-11-21 1986-06-12 Sharp Corp 光応用センサ
US5206700A (en) * 1985-03-14 1993-04-27 Diffracto, Ltd. Methods and apparatus for retroreflective surface inspection and distortion measurement
DE3543632A1 (de) * 1985-12-11 1987-06-19 Hoechst Ag Verfahren und vorrichtung zur bestimmung von dicken- und/oder orientierungsaenderungen innerhalb einer optisch aktiven materialbahn
DE3643723A1 (de) * 1986-12-20 1988-07-07 Leitz Ernst Gmbh Verfahren und anordnung zur optischen messung des rollwinkels eines bewegten maschinenteils
US4774405A (en) * 1987-05-26 1988-09-27 The United States Of America As Represented By The Secretary Of The Air Force Real time autocollimator device for aligning two surfaces in parallel
GB8718803D0 (en) * 1987-08-07 1987-09-16 Renishaw Plc Optical detection system
US5543608A (en) * 1990-12-17 1996-08-06 Rantalainen; Erkki Method and the system for identifying a visual object with a polarizing marker
RU2069839C1 (ru) * 1991-05-07 1996-11-27 Михайлин Юрий Сергеевич Устройство для определения поперечных смещений
US5168322A (en) * 1991-08-19 1992-12-01 Diffracto Ltd. Surface inspection using retro-reflective light field
US5225890A (en) * 1991-10-28 1993-07-06 Gencorp Inc. Surface inspection apparatus and method
US5410410A (en) * 1992-12-29 1995-04-25 Mitutoyo Corporation Non-contact type measuring device for measuring three-dimensional shape using optical probe
CN1105297C (zh) * 1996-08-16 2003-04-09 K·C·刘 五轴/六轴激光测量系统和物体位置及滚动位移确定方法
JP2005526229A (ja) * 2001-08-22 2005-09-02 オートメイティッド プレシジョン インコーポレイテッド ６次元レーザトラッキングシステム及び方法
CN1166914C (zh) * 2002-05-31 2004-09-15 清华大学 频率分裂氦-氖激光回馈自混合非接触测微仪
TWI252301B (en) * 2004-07-30 2006-04-01 Delta Electronics Inc Deposition system and film thickness monitoring device thereof
HK1095987A2 (en) * 2006-02-03 2007-05-18 Univ Hong Kong Polytechnic Methods and apparatus of aligning surfaces
GB0706821D0 (en) 2007-04-10 2007-05-16 Renishaw Plc Rotation detection kit
CN102706809B (zh) * 2012-06-12 2014-10-15 中国科学院上海光学精密机械研究所 线性双折射测量装置和测量方法
WO2014061079A1 (ja) * 2012-10-15 2014-04-24 富士通株式会社 方向検知装置、方向検知方法、方向検知制御プログラム
GB201313751D0 (en) 2013-08-01 2013-09-18 Renishaw Plc Rotation Detection Apparatus
CN109870120A (zh) * 2019-03-09 2019-06-11 中国人民解放军国防科技大学 一种基于激光偏振测量的转体微小角位移高灵敏监测系统
CN117029645B (zh) * 2023-10-09 2023-12-08 常州好力持五金有限公司 一种五金套筒工具的同轴度自动检测装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US1978434A (en) * 1931-06-13 1934-10-30 Harry B Maris Optical apparatus for measuring the thickness of piezo electric crystals
GB772505A (en) * 1954-10-15 1957-04-17 Optical Measuring Tools Ltd Improvements in or relating to optical projection measuring apparatus
DE1110909B (de) * 1960-03-24 1961-07-13 Zeiss Carl Fa Lichtelektrisches Polarimeter
GB1140678A (en) * 1965-05-14 1969-01-22 Nat Res Dev A method of and apparatus for detecting and/or measuring small displacements
US3612689A (en) * 1967-04-10 1971-10-12 American Standard Inc Suspended particle concentration determination using polarized light
DE1911956A1 (de) * 1969-03-10 1970-09-24 Leitz Ernst Gmbh Fotoelektrische Einrichtung zum beruehrungslosen Bestimmen kleiner Lage- oder Winkelaenderungen von Objekten
US3623814A (en) * 1969-04-01 1971-11-30 Gen Telephone & Elect Light beam deflection sensor

Also Published As

Publication number Publication date
GB1428372A (en) 1976-03-17
FR2188141B1 (sv) 1978-12-01
JPS5423820B2 (sv) 1979-08-16
US3871771A (en) 1975-03-18
IT984670B (it) 1974-11-20
DE2329483A1 (de) 1973-12-20
NL7308165A (sv) 1973-12-11
FR2188141A1 (sv) 1974-01-18
DE2329483C2 (de) 1985-10-10
JPS4952690A (sv) 1974-05-22
SE411486B (sv) 1979-12-27

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Legal Events

Date Code Title Description
PL Patent ceased