CH572280A5 - - Google Patents

Info

Publication number
CH572280A5
CH572280A5 CH595273A CH595273A CH572280A5 CH 572280 A5 CH572280 A5 CH 572280A5 CH 595273 A CH595273 A CH 595273A CH 595273 A CH595273 A CH 595273A CH 572280 A5 CH572280 A5 CH 572280A5
Authority
CH
Switzerland
Application number
CH595273A
Original Assignee
Commissariat Energie Atomique
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat Energie Atomique filed Critical Commissariat Energie Atomique
Publication of CH572280A5 publication Critical patent/CH572280A5/xx

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914Measurement of spatial distribution of radiation
    • G01T1/2921Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Light Receiving Elements (AREA)
  • Measurement Of Radiation (AREA)
CH595273A 1972-05-19 1973-04-26 CH572280A5 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7218205A FR2184535B1 (fr) 1972-05-19 1972-05-19

Publications (1)

Publication Number Publication Date
CH572280A5 true CH572280A5 (fr) 1976-01-30

Family

ID=9098894

Family Applications (1)

Application Number Title Priority Date Filing Date
CH595273A CH572280A5 (fr) 1972-05-19 1973-04-26

Country Status (8)

Country Link
US (1) US3863072A (fr)
BE (1) BE798769A (fr)
CA (1) CA987034A (fr)
CH (1) CH572280A5 (fr)
DE (1) DE2325102C2 (fr)
FR (1) FR2184535B1 (fr)
GB (1) GB1429231A (fr)
IT (1) IT991587B (fr)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52131485A (en) * 1976-04-28 1977-11-04 Nippon Toki Kk Element for measuring quantity of radiation
US5125016B1 (en) * 1983-09-22 1998-02-24 Outokumpu Oy Procedure and measuring apparatus based on x-ray diffraction for measuring stresses
US4688067A (en) * 1984-02-24 1987-08-18 The United States Of America As Represented By The Department Of Energy Carrier transport and collection in fully depleted semiconductors by a combined action of the space charge field and the field due to electrode voltages
DE3436800A1 (de) * 1984-10-06 1986-04-10 Kernforschungsanlage Jülich GmbH, 5170 Jülich Vorrichtung zur erfassung von ausfilterbaren gaskontaminationen
IT1213233B (it) * 1984-10-25 1989-12-14 Sgs Thomson Microelectronics Dispositivo, apparecchiatura eprocedimento per la rivelazione di neutroni termici.
NL8501501A (nl) * 1985-05-24 1986-12-16 Tno Foto-elektrische omzetter.
EP0271440A3 (fr) * 1986-12-05 1990-05-02 Genofit S.A. procédé et dispositif pour l'analyse séquentielle de molécules très complexes, telles que des acides nucléiques
GB2234060A (en) * 1989-07-01 1991-01-23 Plessey Co Plc A radiation detector

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3110806A (en) * 1959-05-29 1963-11-12 Hughes Aircraft Co Solid state radiation detector with wide depletion region
US3225198A (en) * 1961-05-16 1965-12-21 Hughes Aircraft Co Method of measuring nuclear radiation utilizing a semiconductor crystal having a lithium compensated intrinsic region
US3524985A (en) * 1967-08-08 1970-08-18 Princeton Gamma Tech Inc Composite solid state radiation detector
GB1289740A (fr) * 1969-12-24 1972-09-20

Also Published As

Publication number Publication date
DE2325102A1 (de) 1973-11-29
IT991587B (it) 1975-08-30
CA987034A (en) 1976-04-06
GB1429231A (en) 1976-03-24
BE798769A (fr) 1973-08-16
US3863072A (en) 1975-01-28
DE2325102C2 (de) 1985-05-15
FR2184535A1 (fr) 1973-12-28
FR2184535B1 (fr) 1980-03-21

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Legal Events

Date Code Title Description
PL Patent ceased