Classifications

• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
  • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
  • G01B5/26—Measuring arrangements characterised by the use of mechanical techniques for measuring areas, e.g. planimeters
• • G—PHYSICS
  • G01—MEASURING; TESTING
  • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
  • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
  • G01B7/32—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring areas

Landscapes

• Physics & Mathematics (AREA)
• General Physics & Mathematics (AREA)
• Electroplating Methods And Accessories (AREA)
• ing And Chemical Polishing (AREA)

Applications Claiming Priority (1)

Publications (1)

Family

ID=5864924

Family Applications (1)

Country Status (2)

Families Citing this family (1)

• 1972
  • 1972-12-20 DE DE19722262300 patent/DE2262300C3/de not_active Expired
• 1973
  • 1973-01-12 CH CH42373A patent/CH545959A/xx not_active IP Right Cessation

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