CH528086A - Circuit arrangement for measuring small changes in capacitance of a plate capacitor, and using the same - Google Patents

Circuit arrangement for measuring small changes in capacitance of a plate capacitor, and using the same

Info

Publication number
CH528086A
CH528086A CH242471A CH242471A CH528086A CH 528086 A CH528086 A CH 528086A CH 242471 A CH242471 A CH 242471A CH 242471 A CH242471 A CH 242471A CH 528086 A CH528086 A CH 528086A
Authority
CH
Switzerland
Prior art keywords
capacitance
same
circuit arrangement
small changes
plate capacitor
Prior art date
Application number
CH242471A
Other languages
German (de)
Inventor
Aeppli Kurt
Original Assignee
Zellweger Uster Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zellweger Uster Ag filed Critical Zellweger Uster Ag
Priority to CH242471A priority Critical patent/CH528086A/en
Priority to DE2143567A priority patent/DE2143567C3/en
Priority to JP1606572A priority patent/JPS4721183A/ja
Publication of CH528086A publication Critical patent/CH528086A/en
Priority to JP1978114698U priority patent/JPS5458077U/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
CH242471A 1971-02-19 1971-02-19 Circuit arrangement for measuring small changes in capacitance of a plate capacitor, and using the same CH528086A (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
CH242471A CH528086A (en) 1971-02-19 1971-02-19 Circuit arrangement for measuring small changes in capacitance of a plate capacitor, and using the same
DE2143567A DE2143567C3 (en) 1971-02-19 1971-08-31 Circuit arrangement for measuring small changes in capacitance
JP1606572A JPS4721183A (en) 1971-02-19 1972-02-17
JP1978114698U JPS5458077U (en) 1971-02-19 1978-08-23

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH242471A CH528086A (en) 1971-02-19 1971-02-19 Circuit arrangement for measuring small changes in capacitance of a plate capacitor, and using the same

Publications (1)

Publication Number Publication Date
CH528086A true CH528086A (en) 1972-09-15

Family

ID=4233482

Family Applications (1)

Application Number Title Priority Date Filing Date
CH242471A CH528086A (en) 1971-02-19 1971-02-19 Circuit arrangement for measuring small changes in capacitance of a plate capacitor, and using the same

Country Status (3)

Country Link
JP (2) JPS4721183A (en)
CH (1) CH528086A (en)
DE (1) DE2143567C3 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0269013A (en) * 1988-09-02 1990-03-08 Clarion Co Ltd Convolver optimizing bias circuit

Also Published As

Publication number Publication date
JPS5458077U (en) 1979-04-21
DE2143567C3 (en) 1979-06-07
DE2143567A1 (en) 1972-08-24
DE2143567B2 (en) 1978-10-12
JPS4721183A (en) 1972-10-03

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Legal Events

Date Code Title Description
PL Patent ceased