CH482301A - Semiconductor component with controllable recombination of electrons and defect electrons present in an intrinsic area - Google Patents
Semiconductor component with controllable recombination of electrons and defect electrons present in an intrinsic areaInfo
- Publication number
- CH482301A CH482301A CH899368A CH899368A CH482301A CH 482301 A CH482301 A CH 482301A CH 899368 A CH899368 A CH 899368A CH 899368 A CH899368 A CH 899368A CH 482301 A CH482301 A CH 482301A
- Authority
- CH
- Switzerland
- Prior art keywords
- electrons
- semiconductor component
- defect
- intrinsic area
- present
- Prior art date
Links
- 230000007547 defect Effects 0.000 title 1
- 230000006798 recombination Effects 0.000 title 1
- 238000005215 recombination Methods 0.000 title 1
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/482—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/02—Bonding areas ; Manufacturing methods related thereto
- H01L24/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L24/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/04042—Bonding areas specifically adapted for wire connectors, e.g. wirebond pads
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/484—Connecting portions
- H01L2224/48463—Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1203—Rectifying Diode
- H01L2924/12036—PN diode
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Ceramic Engineering (AREA)
- Hall/Mr Elements (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CH899368A CH482301A (en) | 1968-06-17 | 1968-06-17 | Semiconductor component with controllable recombination of electrons and defect electrons present in an intrinsic area |
DE19691916873 DE1916873A1 (en) | 1968-06-17 | 1969-04-02 | Semiconductor component with control of the recombination of electrons and defect electrons present in an intrinsic area |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CH899368A CH482301A (en) | 1968-06-17 | 1968-06-17 | Semiconductor component with controllable recombination of electrons and defect electrons present in an intrinsic area |
Publications (1)
Publication Number | Publication Date |
---|---|
CH482301A true CH482301A (en) | 1969-11-30 |
Family
ID=4347142
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CH899368A CH482301A (en) | 1968-06-17 | 1968-06-17 | Semiconductor component with controllable recombination of electrons and defect electrons present in an intrinsic area |
Country Status (2)
Country | Link |
---|---|
CH (1) | CH482301A (en) |
DE (1) | DE1916873A1 (en) |
-
1968
- 1968-06-17 CH CH899368A patent/CH482301A/en not_active IP Right Cessation
-
1969
- 1969-04-02 DE DE19691916873 patent/DE1916873A1/en active Pending
Also Published As
Publication number | Publication date |
---|---|
DE1916873A1 (en) | 1969-12-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PL | Patent ceased |