CH391462A - Method and device for exposure measurement in vacuum cinematography in an electron microscope - Google Patents
Method and device for exposure measurement in vacuum cinematography in an electron microscopeInfo
- Publication number
- CH391462A CH391462A CH1359861A CH1359861A CH391462A CH 391462 A CH391462 A CH 391462A CH 1359861 A CH1359861 A CH 1359861A CH 1359861 A CH1359861 A CH 1359861A CH 391462 A CH391462 A CH 391462A
- Authority
- CH
- Switzerland
- Prior art keywords
- cinematography
- vacuum
- electron microscope
- exposure measurement
- exposure
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/22—Optical or photographic arrangements associated with the tube
- H01J37/224—Luminescent screens or photographic plates for imaging ; Apparatus specially adapted therefor, e.g. cameras, TV-cameras, photographic equipment, exposure control; Optical subsystems specially adapted therefor, e.g. microscopes for observing image on luminescent screen
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B7/00—Control of exposure by setting shutters, diaphragms or filters, separately or conjointly
- G03B7/08—Control effected solely on the basis of the response, to the intensity of the light received by the camera, of a built-in light-sensitive device
- G03B7/099—Arrangement of photoelectric elements in or on the camera
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electron Sources, Ion Sources (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CH1359861A CH391462A (en) | 1961-11-22 | 1961-11-22 | Method and device for exposure measurement in vacuum cinematography in an electron microscope |
DET22970A DE1215273B (en) | 1961-11-22 | 1962-11-05 | Device for measuring exposure in vacuum kinematography in an electron microscope |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CH1359861A CH391462A (en) | 1961-11-22 | 1961-11-22 | Method and device for exposure measurement in vacuum cinematography in an electron microscope |
Publications (1)
Publication Number | Publication Date |
---|---|
CH391462A true CH391462A (en) | 1965-04-30 |
Family
ID=4393751
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CH1359861A CH391462A (en) | 1961-11-22 | 1961-11-22 | Method and device for exposure measurement in vacuum cinematography in an electron microscope |
Country Status (2)
Country | Link |
---|---|
CH (1) | CH391462A (en) |
DE (1) | DE1215273B (en) |
-
1961
- 1961-11-22 CH CH1359861A patent/CH391462A/en unknown
-
1962
- 1962-11-05 DE DET22970A patent/DE1215273B/en active Pending
Also Published As
Publication number | Publication date |
---|---|
DE1215273B (en) | 1966-04-28 |
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