CH391462A - Method and device for exposure measurement in vacuum cinematography in an electron microscope - Google Patents

Method and device for exposure measurement in vacuum cinematography in an electron microscope

Info

Publication number
CH391462A
CH391462A CH1359861A CH1359861A CH391462A CH 391462 A CH391462 A CH 391462A CH 1359861 A CH1359861 A CH 1359861A CH 1359861 A CH1359861 A CH 1359861A CH 391462 A CH391462 A CH 391462A
Authority
CH
Switzerland
Prior art keywords
cinematography
vacuum
electron microscope
exposure measurement
exposure
Prior art date
Application number
CH1359861A
Other languages
German (de)
Inventor
Heinrich Dr Dueker
Original Assignee
Trueb Taeuber & Co Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Trueb Taeuber & Co Ag filed Critical Trueb Taeuber & Co Ag
Priority to CH1359861A priority Critical patent/CH391462A/en
Priority to DET22970A priority patent/DE1215273B/en
Publication of CH391462A publication Critical patent/CH391462A/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/22Optical or photographic arrangements associated with the tube
    • H01J37/224Luminescent screens or photographic plates for imaging ; Apparatus specially adapted therefor, e.g. cameras, TV-cameras, photographic equipment, exposure control; Optical subsystems specially adapted therefor, e.g. microscopes for observing image on luminescent screen
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03BAPPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
    • G03B7/00Control of exposure by setting shutters, diaphragms or filters, separately or conjointly
    • G03B7/08Control effected solely on the basis of the response, to the intensity of the light received by the camera, of a built-in light-sensitive device
    • G03B7/099Arrangement of photoelectric elements in or on the camera

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electron Sources, Ion Sources (AREA)
CH1359861A 1961-11-22 1961-11-22 Method and device for exposure measurement in vacuum cinematography in an electron microscope CH391462A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CH1359861A CH391462A (en) 1961-11-22 1961-11-22 Method and device for exposure measurement in vacuum cinematography in an electron microscope
DET22970A DE1215273B (en) 1961-11-22 1962-11-05 Device for measuring exposure in vacuum kinematography in an electron microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH1359861A CH391462A (en) 1961-11-22 1961-11-22 Method and device for exposure measurement in vacuum cinematography in an electron microscope

Publications (1)

Publication Number Publication Date
CH391462A true CH391462A (en) 1965-04-30

Family

ID=4393751

Family Applications (1)

Application Number Title Priority Date Filing Date
CH1359861A CH391462A (en) 1961-11-22 1961-11-22 Method and device for exposure measurement in vacuum cinematography in an electron microscope

Country Status (2)

Country Link
CH (1) CH391462A (en)
DE (1) DE1215273B (en)

Also Published As

Publication number Publication date
DE1215273B (en) 1966-04-28

Similar Documents

Publication Publication Date Title
CH396624A (en) Method and device for exposure control for microphotographic recordings
CH400405A (en) Method and device for the automatic focusing of the charge carrier beam in devices for material processing by means of a charge carrier beam
AT279214B (en) Method and device for ultrasonic material testing
CH466590A (en) Method and device for determining a closed curve of a given shape from an actual curve
AT253932B (en) Method and device for photographic reproduction
CH388663A (en) Method and device for performing chromatographic analyzes
CH518575A (en) Method and device for three-dimensional imaging of an object
AT255982B (en) Method and device for handling a natural gas-hydrocarbon mixture
CH464567A (en) Method and device for testing a test object
CH419671A (en) Method and device for determining the melting point
CH408649A (en) Method and device for compacting powdery substances
AT288833B (en) Method and device for making cheese
CH439511A (en) Method and apparatus for manufacturing magnetic recording materials
CH414321A (en) Method and apparatus for forming objects
CH394629A (en) Method and device for recording and calibrating electron diffraction diagrams
AT255808B (en) Method and device for checking the numbering of notes of value
CH444826A (en) Method and apparatus for manufacturing a semiconductor device
CH391462A (en) Method and device for exposure measurement in vacuum cinematography in an electron microscope
CH442559A (en) Method and device for determining the electrode position in an electrical apparatus
AT245826B (en) Method and device for determining interest
CH377115A (en) Method and device for recording successive measured values
AT243050B (en) Method and device for processing conductive workpieces
DE1947749B2 (en) METHOD AND DEVICE FOR THICKNESS MEASUREMENT ON ANY PROFILES
CH394511A (en) Method and device for removing glass objects from a mold
CH488183A (en) Method and device for ultrasonic testing of metal walls