CA700060A - Method of determining the thickness of monocrystalline layer of silicon or germanium - Google Patents

Method of determining the thickness of monocrystalline layer of silicon or germanium

Info

Publication number
CA700060A
CA700060A CA700060A CA700060DA CA700060A CA 700060 A CA700060 A CA 700060A CA 700060 A CA700060 A CA 700060A CA 700060D A CA700060D A CA 700060DA CA 700060 A CA700060 A CA 700060A
Authority
CA
Canada
Prior art keywords
germanium
silicon
determining
thickness
monocrystalline layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA700060A
Inventor
Dorendorf Heinz
Walther Albert
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens and Halske AG
Original Assignee
Siemens and Halske AG
Publication date
Application granted granted Critical
Publication of CA700060A publication Critical patent/CA700060A/en
Expired legal-status Critical Current

Links

CA700060A Method of determining the thickness of monocrystalline layer of silicon or germanium Expired CA700060A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CA700060T

Publications (1)

Publication Number Publication Date
CA700060A true CA700060A (en) 1964-12-15

Family

ID=36013712

Family Applications (1)

Application Number Title Priority Date Filing Date
CA700060A Expired CA700060A (en) Method of determining the thickness of monocrystalline layer of silicon or germanium

Country Status (1)

Country Link
CA (1) CA700060A (en)

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