CA3043161A1 - Material erosion monitoring system and method - Google Patents
Material erosion monitoring system and method Download PDFInfo
- Publication number
- CA3043161A1 CA3043161A1 CA3043161A CA3043161A CA3043161A1 CA 3043161 A1 CA3043161 A1 CA 3043161A1 CA 3043161 A CA3043161 A CA 3043161A CA 3043161 A CA3043161 A CA 3043161A CA 3043161 A1 CA3043161 A1 CA 3043161A1
- Authority
- CA
- Canada
- Prior art keywords
- electromagnetic wave
- interest
- reflected
- wave launcher
- launcher
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000463 material Substances 0.000 title claims abstract description 243
- 238000000034 method Methods 0.000 title claims abstract description 54
- 230000003628 erosive effect Effects 0.000 title abstract description 10
- 238000012544 monitoring process Methods 0.000 title description 2
- 238000012545 processing Methods 0.000 claims abstract description 17
- 238000001514 detection method Methods 0.000 claims abstract description 9
- 230000007246 mechanism Effects 0.000 claims abstract description 6
- 238000002955 isolation Methods 0.000 claims abstract description 5
- 230000001902 propagating effect Effects 0.000 claims description 42
- 230000007704 transition Effects 0.000 claims description 39
- 239000003989 dielectric material Substances 0.000 claims description 23
- 238000005259 measurement Methods 0.000 claims description 15
- 238000003672 processing method Methods 0.000 claims description 9
- 230000005540 biological transmission Effects 0.000 claims description 6
- 239000000523 sample Substances 0.000 claims description 3
- 230000002123 temporal effect Effects 0.000 claims 2
- 239000011819 refractory material Substances 0.000 abstract description 86
- 238000011156 evaluation Methods 0.000 abstract description 74
- 230000000694 effects Effects 0.000 abstract description 21
- 230000001976 improved effect Effects 0.000 abstract description 2
- 239000004020 conductor Substances 0.000 description 26
- 239000000758 substrate Substances 0.000 description 19
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- 239000012768 molten material Substances 0.000 description 8
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- 239000003570 air Substances 0.000 description 4
- 230000005684 electric field Effects 0.000 description 4
- 239000011521 glass Substances 0.000 description 4
- 239000006060 molten glass Substances 0.000 description 4
- 239000004033 plastic Substances 0.000 description 4
- 230000010287 polarization Effects 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000002844 melting Methods 0.000 description 3
- 230000008018 melting Effects 0.000 description 3
- 230000005855 radiation Effects 0.000 description 3
- 238000000926 separation method Methods 0.000 description 3
- 229910000831 Steel Inorganic materials 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 239000004568 cement Substances 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
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- 230000002829 reductive effect Effects 0.000 description 2
- 239000010959 steel Substances 0.000 description 2
- 230000001131 transforming effect Effects 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 230000003213 activating effect Effects 0.000 description 1
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- 238000000429 assembly Methods 0.000 description 1
- 230000002238 attenuated effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 239000008187 granular material Substances 0.000 description 1
- 230000036541 health Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
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- 238000011426 transformation method Methods 0.000 description 1
Classifications
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F27—FURNACES; KILNS; OVENS; RETORTS
- F27D—DETAILS OR ACCESSORIES OF FURNACES, KILNS, OVENS, OR RETORTS, IN SO FAR AS THEY ARE OF KINDS OCCURRING IN MORE THAN ONE KIND OF FURNACE
- F27D21/00—Arrangements of monitoring devices; Arrangements of safety devices
- F27D21/0021—Devices for monitoring linings for wear
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/04—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/28—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US15/346,161 US9880110B2 (en) | 2014-03-26 | 2016-11-08 | Material erosion monitoring system and method |
| US15/346,161 | 2016-11-08 | ||
| PCT/US2017/029309 WO2018089044A1 (en) | 2016-11-08 | 2017-04-25 | Material erosion monitoring system and method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA3043161A1 true CA3043161A1 (en) | 2018-05-17 |
Family
ID=62110683
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA3043161A Pending CA3043161A1 (en) | 2016-11-08 | 2017-04-25 | Material erosion monitoring system and method |
Country Status (4)
| Country | Link |
|---|---|
| EP (1) | EP3538841A4 (ja) |
| JP (1) | JP7026125B2 (ja) |
| CA (1) | CA3043161A1 (ja) |
| WO (1) | WO2018089044A1 (ja) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10816436B2 (en) | 2018-07-06 | 2020-10-27 | The Boeing Company | System for temperature insensitive damage detection |
| WO2021105758A1 (en) * | 2019-11-29 | 2021-06-03 | Arcelormittal | System and method for estimating both thickness and wear state of refractory material of a metallurgical furnace |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006153845A (ja) | 2004-11-02 | 2006-06-15 | Nippon Steel Corp | 耐火物厚み測定方法及び耐火物厚み測定装置 |
| EP1860458A1 (en) * | 2006-05-22 | 2007-11-28 | Interuniversitair Microelektronica Centrum | Detection of resonant tags by UWB radar |
| KR101778329B1 (ko) * | 2010-04-26 | 2017-09-26 | 해치 리미티드 | 야금로 내의 차지 뱅크 레벨 측정 |
| JP5764008B2 (ja) * | 2010-08-31 | 2015-08-12 | 電源開発株式会社 | 炉内温度測定装置 |
| US9488601B2 (en) * | 2014-03-26 | 2016-11-08 | Paneratech, Inc. | Material erosion monitoring system and method |
-
2017
- 2017-04-25 WO PCT/US2017/029309 patent/WO2018089044A1/en unknown
- 2017-04-25 JP JP2019545877A patent/JP7026125B2/ja active Active
- 2017-04-25 CA CA3043161A patent/CA3043161A1/en active Pending
- 2017-04-25 EP EP17869485.7A patent/EP3538841A4/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| EP3538841A1 (en) | 2019-09-18 |
| JP7026125B2 (ja) | 2022-02-25 |
| EP3538841A4 (en) | 2020-03-25 |
| JP2019534466A (ja) | 2019-11-28 |
| WO2018089044A1 (en) | 2018-05-17 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EEER | Examination request |
Effective date: 20220201 |
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| EEER | Examination request |
Effective date: 20220201 |
|
| EEER | Examination request |
Effective date: 20220201 |
|
| EEER | Examination request |
Effective date: 20220201 |
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| EEER | Examination request |
Effective date: 20220201 |