CA2910977A1 - Program testing service - Google Patents

Program testing service

Info

Publication number
CA2910977A1
CA2910977A1 CA2910977A CA2910977A CA2910977A1 CA 2910977 A1 CA2910977 A1 CA 2910977A1 CA 2910977 A CA2910977 A CA 2910977A CA 2910977 A CA2910977 A CA 2910977A CA 2910977 A1 CA2910977 A1 CA 2910977A1
Authority
CA
Canada
Prior art keywords
program
computer
test
computing devices
testing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA2910977A
Other languages
English (en)
French (fr)
Inventor
Lokendra Singh
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Amazon Technologies Inc
Original Assignee
Amazon Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US13/875,945 external-priority patent/US20140331209A1/en
Priority claimed from US13/875,955 external-priority patent/US20140331205A1/en
Application filed by Amazon Technologies Inc filed Critical Amazon Technologies Inc
Publication of CA2910977A1 publication Critical patent/CA2910977A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G06F11/3664—Environments for testing or debugging software
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/36—Preventing errors by testing or debugging software
    • G06F11/3668—Software testing
    • G06F11/3672—Test management
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F8/00—Arrangements for software engineering
    • G06F8/30—Creation or generation of source code

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Software Systems (AREA)
  • Debugging And Monitoring (AREA)
CA2910977A 2013-05-02 2014-05-02 Program testing service Abandoned CA2910977A1 (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US13/875,945 US20140331209A1 (en) 2013-05-02 2013-05-02 Program Testing Service
US13/875,955 2013-05-02
US13/875,945 2013-05-02
US13/875,955 US20140331205A1 (en) 2013-05-02 2013-05-02 Program Testing Service
PCT/US2014/036640 WO2014179731A1 (en) 2013-05-02 2014-05-02 Program testing service

Publications (1)

Publication Number Publication Date
CA2910977A1 true CA2910977A1 (en) 2014-11-06

Family

ID=51843991

Family Applications (1)

Application Number Title Priority Date Filing Date
CA2910977A Abandoned CA2910977A1 (en) 2013-05-02 2014-05-02 Program testing service

Country Status (5)

Country Link
EP (1) EP2992419A4 (de)
JP (1) JP6283096B2 (de)
CN (1) CN105453033A (de)
CA (1) CA2910977A1 (de)
WO (1) WO2014179731A1 (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10606737B2 (en) * 2017-03-01 2020-03-31 Wipro Limited System and method for testing a resource constrained device
CN107291616A (zh) * 2017-06-05 2017-10-24 广州诚予国际市场信息研究有限公司 一种项目报告在线生成平台
JP6914901B2 (ja) * 2018-09-21 2021-08-04 Kddi株式会社 オープン化設備の検証装置、検証方法、およびプログラム
CN110618944A (zh) * 2019-09-20 2019-12-27 百度在线网络技术（北京）有限公司 设备模拟方法、装置、电子设备及存储介质
CN111414309B (zh) * 2020-03-27 2022-03-01 武汉联影医疗科技有限公司 应用程序的自动化测试方法、计算机设备和存储介质
CN111506508A (zh) * 2020-04-17 2020-08-07 北京百度网讯科技有限公司 边缘计算测试方法、装置、设备和可读存储介质

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7334162B1 (en) * 2003-01-29 2008-02-19 Sun Microsystems, Inc. Dynamic distribution of test execution
US20070005281A1 (en) * 2005-05-31 2007-01-04 David Haggerty Systems and Methods Providing Reusable Test Logic
WO2008144692A1 (en) * 2007-05-21 2008-11-27 W2Bi, Inc Mobile device throughput testing
JP5646650B2 (ja) * 2010-01-08 2014-12-24 ソース ラブズ, インコーポレイテッドSauce Labs, Inc. ウェブアプリケーションのリアルタイム検証
WO2012027886A1 (en) * 2010-08-31 2012-03-08 Google Inc. Platform specific application test
US8566648B2 (en) * 2011-02-02 2013-10-22 Salesforce, Inc. Automated testing on devices
CN202795345U (zh) * 2012-10-08 2013-03-13 北京云测信息技术有限公司 应用软件测试系统

Also Published As

Publication number Publication date
CN105453033A (zh) 2016-03-30
JP2016525731A (ja) 2016-08-25
WO2014179731A1 (en) 2014-11-06
JP6283096B2 (ja) 2018-02-21
EP2992419A1 (de) 2016-03-09
EP2992419A4 (de) 2016-11-23

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Legal Events

Date Code Title Description
EEER Examination request

Effective date: 20151029

FZDE Dead

Effective date: 20190502