CA2582243A1 - Low noise hybrid active-passive pixel for different sensor applications - Google Patents

Low noise hybrid active-passive pixel for different sensor applications Download PDF

Info

Publication number
CA2582243A1
CA2582243A1 CA002582243A CA2582243A CA2582243A1 CA 2582243 A1 CA2582243 A1 CA 2582243A1 CA 002582243 A CA002582243 A CA 002582243A CA 2582243 A CA2582243 A CA 2582243A CA 2582243 A1 CA2582243 A1 CA 2582243A1
Authority
CA
Canada
Prior art keywords
low noise
different sensor
sensor applications
hybrid active
passive pixel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA002582243A
Other languages
French (fr)
Inventor
G. Reza Chaji
Arokia Nathan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to CA002582243A priority Critical patent/CA2582243A1/en
Priority to EP20070855520 priority patent/EP2126526A1/en
Priority to PCT/CA2007/002238 priority patent/WO2008106764A1/en
Priority to US12/530,151 priority patent/US8487231B2/en
Priority to CA 2680043 priority patent/CA2680043A1/en
Publication of CA2582243A1 publication Critical patent/CA2582243A1/en
Priority to US13/942,285 priority patent/US20130299680A1/en
Priority to US14/096,572 priority patent/US8872095B2/en
Priority to US14/499,144 priority patent/US9281330B2/en
Abandoned legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60Noise processing, e.g. detecting, correcting, reducing or removing noise
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70SSIS architectures; Circuits associated therewith
    • H04N25/76Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Thin Film Transistor (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)

Abstract

Disclosed is a technique for reducing the noise in active matrix sensor pixel circuits and to improve the lifetime at the same time.

Description

FIELD OF THE INVENTION

The present invention generally relates to active matrix sensor arrays for applications ranging from medical to bio-molecular imaging.

SUMMARY OF INVENTION
Disclosed technique reduces the low frequency noise by using switch biasing technique.
It is also able to control the effect of leakage current by reducing the drain-source voltage to zero.

ADVANTAGES
This driving scheme provides low noise, high sensitivity, and low power detection.

FIG. 1 shows a 3-TFT sensor pixel circuit. The pixel circuit composes a two amplifying transistors, Tl and T2, a switch transistor, T3, a storage capacitor, Cs, and a sensor, SI.
The transistor can be fabricated in any technology including CMOS, NMOS, amorphous silicon, nano/micro crystalline silicon, poly crystalline, and liquid-printed and vacuum deposited organic technology. Moreover, the NMOS transistors can be replaced with a PMOS transistor using the concept of complementary circuit design.

The operating cycles of the pixel circuit depicted in FIG. 1 are demonstrated in FIG. 2.
During the first operating cycle, the storage capacitor is charged to a biasing voltage (VP). During the second cycle, the sensor signal is integrated by the storage capacitor.
During the readout cycle, Tl and T2 turn on sequentially. Thus, the output signal is not affected by the sync filter induced by switched biasing and it is essentially equivalent to a single TFT with a DC bias. However, one can use one TFT (Tl or T2) to improve the aperture ratio and use a higher bias voltage to compensate for the gain lost by the switch biasing technique. On the other hand, the noise is reduced significantly due to the reduction of carrier trapping/de-trapping phenomena intrinsic to most transistors.
Moreover, the lifetime of the pixel is improved as well.

The pixel can work in hybrid mode which means it can be passive or active. For passive operation, VB1 and VB2 are chosen to be the voltage applied to Idata and so they are OFF. Therefore, the integrated signal can be read back through Vdata.

FIG. 3 shows a 3-TFT sensor pixel circuit. The pixel circuit composes of two amplifying transistors, T2 and T2, a switch transistor, T3, a storage capacitor, Cs, and a sensor, Sl.
The transistor can be fabricated in any technology including CMOS, NMOS, amorphous silicon, nano/micro crystalline silicon, poly crystalline, and liquid-printed and vacuum-deposited organic technology. Moreover, the NMOS transistors can be replaced with a PMOS transistor using the concept of complementary circuit design.

The operating cycles of the pixel circuit depicted in FIG. 3 are demonstrated in FIG. 4.
During the first operating cycle, the storage capacitor is charged to a biasing voltage (VP) by applying a voltage or current to the data [iJ. When using cunent as the biasing signal, VBl and VB2 should be zero during the first operating cycle while for voltage biasing, they can be as the voltage of data[iJ to reduce power consumption. During the second cycle, the sensor signal is integrated by the storage capacitor. During the readout cycle, Tl and T2 turn on sequentially. Thus, the output signal is not affected by the sync filter induced by the switched biasing and it is essentially equivalent to a single TFT with a DC
bias. However, one can use one TFT (Tl or T2) to improve the aperture ratio and use a higher bias voltage to compensate for the gain lost by switch biasing technique. On the other hand, the noise is reduced significantly due to the reduction of carrier trapping/de-trapping phenomena intrinsic to most transistors. Moreover, the lifetime of the pixel is improved as well.

The pixel can work in hybrid mode which means it can be passive or active. For passive operation, VBl and VB2 are chosen to be the voltage applied to data [i] and so they are OFF. Therefore, the integrated signal can be read back through data [i].

FIG. 5 shows a 2-TFT sensor pixel circuit based on photo TFTs. The pixel circuit composes a two amplifying photo transistors, Tl and T2. The transistor can be fabricated in any technology including CMOS, NMOS, amorphous silicon, nano/micro crystalline silicon, poly crystalline, and liquid-printed and vacuum-deposited organic technology.
Moreover, the NMOS transistors can be replaced with a PMOS transistor using the concept of complementary circuit design.

The operating cycles of the pixel circuit depicted in FIG. 5 are demonstrated in FIG. 6.
During the first integration cycle, TI and T2 turn on sequentially while their channel conductance is modulated as a result of optical interaction. Thus, the output signal is not affected by the sync filter induced by switched biasing and it is essentially equivalent to a single TFT with a DC bias. However, one can use one TFT (Tl or T2) to improve the aperture ratio and use a higher bias voltage to compensate for the gain lost by the switch biasing technique. On the other hand, the noise is reduced significantly due to the reduction of carrier trapping/de-trapping phenomena intrinsic to most transistors.
Moreover, the lifetime of the pixel is improved as well.

Claims

CA002582243A 2007-03-05 2007-03-05 Low noise hybrid active-passive pixel for different sensor applications Abandoned CA2582243A1 (en)

Priority Applications (8)

Application Number Priority Date Filing Date Title
CA002582243A CA2582243A1 (en) 2007-03-05 2007-03-05 Low noise hybrid active-passive pixel for different sensor applications
EP20070855520 EP2126526A1 (en) 2007-03-05 2007-12-17 Sensor pixels, arrays and array systems and methods therefor
PCT/CA2007/002238 WO2008106764A1 (en) 2007-03-05 2007-12-17 Sensor pixels, arrays and array systems and methods therefor
US12/530,151 US8487231B2 (en) 2007-03-05 2007-12-17 Sensor pixels, arrays and array systems and methods therefor
CA 2680043 CA2680043A1 (en) 2007-03-05 2007-12-17 Sensor pixels, arrays and array systems and methods therefor
US13/942,285 US20130299680A1 (en) 2007-03-05 2013-07-15 Sensor pixels, arrays and array systems and methods therefor
US14/096,572 US8872095B2 (en) 2007-03-05 2013-12-04 Sensor pixels, arrays and array systems and methods therefor
US14/499,144 US9281330B2 (en) 2007-03-05 2014-09-27 Sensor pixels, arrays and array systems and methods therefor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CA002582243A CA2582243A1 (en) 2007-03-05 2007-03-05 Low noise hybrid active-passive pixel for different sensor applications

Publications (1)

Publication Number Publication Date
CA2582243A1 true CA2582243A1 (en) 2008-09-05

Family

ID=39731948

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002582243A Abandoned CA2582243A1 (en) 2007-03-05 2007-03-05 Low noise hybrid active-passive pixel for different sensor applications

Country Status (1)

Country Link
CA (1) CA2582243A1 (en)

Similar Documents

Publication Publication Date Title
US7750958B1 (en) Pixel structure
US7361899B2 (en) Infrared sensor, infrared camera, method of driving infrared sensor, and method of driving infrared camera
US8947571B2 (en) Gain adjustable sensor pixels, arrays and array systems and methods therefor
US8872095B2 (en) Sensor pixels, arrays and array systems and methods therefor
US8203111B2 (en) CMOS image sensor pixel with an NMOS charge amplifier
US7663088B2 (en) Bolometer-type infrared imaging apparatus including a one or two dimensional sensor array semiconductor device
US8736730B2 (en) Solid-state image pickup device and method for driving the same
EP2560373B1 (en) Image pickup unit and image-pickup and display system
US6580063B1 (en) Solid state imaging device having high output signal pain
GB2360870A (en) Driver circuit for organic electroluminescent device
CN113892133B (en) Pixel circuit and pixel control method
JP2009159611A (en) Transistor output circuit and method
CA2582243A1 (en) Low noise hybrid active-passive pixel for different sensor applications
JPH07203319A (en) Solid state image pickup element
US7696792B2 (en) Track and hold circuit
US6717616B1 (en) Amplifier assisted active pixel read out structure
US7965132B2 (en) Transistor output circuit and method
Rankov et al. A novel correlated double sampling poly-Si circuit for readout systems in large area X-ray sensors
JP7562371B2 (en) Ramp signal output circuit, photoelectric conversion device, and imaging system
EP3761632B1 (en) Correlated double sampling circuit and method
CA2564239A1 (en) Low noist active pixel sensor
JPH03149955A (en) Line sensor
Safavian et al. Transient response of a 3-TFT hybrid active-passive pixel with correlated double sampling CMOS readout circuit for real-time medical X-ray imaging
US20040080651A1 (en) Substrate electrical bounce compensation circuitry for digital cinematography image capture cameras
JP2018125738A (en) Radiation detector, and switch control method

Legal Events

Date Code Title Description
FZDE Discontinued