CA2582243A1 - Low noise hybrid active-passive pixel for different sensor applications - Google Patents
Low noise hybrid active-passive pixel for different sensor applications Download PDFInfo
- Publication number
- CA2582243A1 CA2582243A1 CA002582243A CA2582243A CA2582243A1 CA 2582243 A1 CA2582243 A1 CA 2582243A1 CA 002582243 A CA002582243 A CA 002582243A CA 2582243 A CA2582243 A CA 2582243A CA 2582243 A1 CA2582243 A1 CA 2582243A1
- Authority
- CA
- Canada
- Prior art keywords
- low noise
- different sensor
- sensor applications
- hybrid active
- passive pixel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 238000000034 method Methods 0.000 abstract description 6
- 239000011159 matrix material Substances 0.000 abstract description 2
- 239000003990 capacitor Substances 0.000 description 6
- 229910021417 amorphous silicon Inorganic materials 0.000 description 3
- 230000000295 complement effect Effects 0.000 description 3
- 229910021424 microcrystalline silicon Inorganic materials 0.000 description 3
- 229910021423 nanocrystalline silicon Inorganic materials 0.000 description 3
- 238000003491 array Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
- H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Thin Film Transistor (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Solid State Image Pick-Up Elements (AREA)
Abstract
Disclosed is a technique for reducing the noise in active matrix sensor pixel circuits and to improve the lifetime at the same time.
Description
FIELD OF THE INVENTION
The present invention generally relates to active matrix sensor arrays for applications ranging from medical to bio-molecular imaging.
SUMMARY OF INVENTION
Disclosed technique reduces the low frequency noise by using switch biasing technique.
It is also able to control the effect of leakage current by reducing the drain-source voltage to zero.
ADVANTAGES
This driving scheme provides low noise, high sensitivity, and low power detection.
FIG. 1 shows a 3-TFT sensor pixel circuit. The pixel circuit composes a two amplifying transistors, Tl and T2, a switch transistor, T3, a storage capacitor, Cs, and a sensor, SI.
The transistor can be fabricated in any technology including CMOS, NMOS, amorphous silicon, nano/micro crystalline silicon, poly crystalline, and liquid-printed and vacuum deposited organic technology. Moreover, the NMOS transistors can be replaced with a PMOS transistor using the concept of complementary circuit design.
The operating cycles of the pixel circuit depicted in FIG. 1 are demonstrated in FIG. 2.
During the first operating cycle, the storage capacitor is charged to a biasing voltage (VP). During the second cycle, the sensor signal is integrated by the storage capacitor.
During the readout cycle, Tl and T2 turn on sequentially. Thus, the output signal is not affected by the sync filter induced by switched biasing and it is essentially equivalent to a single TFT with a DC bias. However, one can use one TFT (Tl or T2) to improve the aperture ratio and use a higher bias voltage to compensate for the gain lost by the switch biasing technique. On the other hand, the noise is reduced significantly due to the reduction of carrier trapping/de-trapping phenomena intrinsic to most transistors.
Moreover, the lifetime of the pixel is improved as well.
The pixel can work in hybrid mode which means it can be passive or active. For passive operation, VB1 and VB2 are chosen to be the voltage applied to Idata and so they are OFF. Therefore, the integrated signal can be read back through Vdata.
FIG. 3 shows a 3-TFT sensor pixel circuit. The pixel circuit composes of two amplifying transistors, T2 and T2, a switch transistor, T3, a storage capacitor, Cs, and a sensor, Sl.
The transistor can be fabricated in any technology including CMOS, NMOS, amorphous silicon, nano/micro crystalline silicon, poly crystalline, and liquid-printed and vacuum-deposited organic technology. Moreover, the NMOS transistors can be replaced with a PMOS transistor using the concept of complementary circuit design.
The operating cycles of the pixel circuit depicted in FIG. 3 are demonstrated in FIG. 4.
During the first operating cycle, the storage capacitor is charged to a biasing voltage (VP) by applying a voltage or current to the data [iJ. When using cunent as the biasing signal, VBl and VB2 should be zero during the first operating cycle while for voltage biasing, they can be as the voltage of data[iJ to reduce power consumption. During the second cycle, the sensor signal is integrated by the storage capacitor. During the readout cycle, Tl and T2 turn on sequentially. Thus, the output signal is not affected by the sync filter induced by the switched biasing and it is essentially equivalent to a single TFT with a DC
bias. However, one can use one TFT (Tl or T2) to improve the aperture ratio and use a higher bias voltage to compensate for the gain lost by switch biasing technique. On the other hand, the noise is reduced significantly due to the reduction of carrier trapping/de-trapping phenomena intrinsic to most transistors. Moreover, the lifetime of the pixel is improved as well.
The pixel can work in hybrid mode which means it can be passive or active. For passive operation, VBl and VB2 are chosen to be the voltage applied to data [i] and so they are OFF. Therefore, the integrated signal can be read back through data [i].
FIG. 5 shows a 2-TFT sensor pixel circuit based on photo TFTs. The pixel circuit composes a two amplifying photo transistors, Tl and T2. The transistor can be fabricated in any technology including CMOS, NMOS, amorphous silicon, nano/micro crystalline silicon, poly crystalline, and liquid-printed and vacuum-deposited organic technology.
Moreover, the NMOS transistors can be replaced with a PMOS transistor using the concept of complementary circuit design.
The operating cycles of the pixel circuit depicted in FIG. 5 are demonstrated in FIG. 6.
During the first integration cycle, TI and T2 turn on sequentially while their channel conductance is modulated as a result of optical interaction. Thus, the output signal is not affected by the sync filter induced by switched biasing and it is essentially equivalent to a single TFT with a DC bias. However, one can use one TFT (Tl or T2) to improve the aperture ratio and use a higher bias voltage to compensate for the gain lost by the switch biasing technique. On the other hand, the noise is reduced significantly due to the reduction of carrier trapping/de-trapping phenomena intrinsic to most transistors.
Moreover, the lifetime of the pixel is improved as well.
The present invention generally relates to active matrix sensor arrays for applications ranging from medical to bio-molecular imaging.
SUMMARY OF INVENTION
Disclosed technique reduces the low frequency noise by using switch biasing technique.
It is also able to control the effect of leakage current by reducing the drain-source voltage to zero.
ADVANTAGES
This driving scheme provides low noise, high sensitivity, and low power detection.
FIG. 1 shows a 3-TFT sensor pixel circuit. The pixel circuit composes a two amplifying transistors, Tl and T2, a switch transistor, T3, a storage capacitor, Cs, and a sensor, SI.
The transistor can be fabricated in any technology including CMOS, NMOS, amorphous silicon, nano/micro crystalline silicon, poly crystalline, and liquid-printed and vacuum deposited organic technology. Moreover, the NMOS transistors can be replaced with a PMOS transistor using the concept of complementary circuit design.
The operating cycles of the pixel circuit depicted in FIG. 1 are demonstrated in FIG. 2.
During the first operating cycle, the storage capacitor is charged to a biasing voltage (VP). During the second cycle, the sensor signal is integrated by the storage capacitor.
During the readout cycle, Tl and T2 turn on sequentially. Thus, the output signal is not affected by the sync filter induced by switched biasing and it is essentially equivalent to a single TFT with a DC bias. However, one can use one TFT (Tl or T2) to improve the aperture ratio and use a higher bias voltage to compensate for the gain lost by the switch biasing technique. On the other hand, the noise is reduced significantly due to the reduction of carrier trapping/de-trapping phenomena intrinsic to most transistors.
Moreover, the lifetime of the pixel is improved as well.
The pixel can work in hybrid mode which means it can be passive or active. For passive operation, VB1 and VB2 are chosen to be the voltage applied to Idata and so they are OFF. Therefore, the integrated signal can be read back through Vdata.
FIG. 3 shows a 3-TFT sensor pixel circuit. The pixel circuit composes of two amplifying transistors, T2 and T2, a switch transistor, T3, a storage capacitor, Cs, and a sensor, Sl.
The transistor can be fabricated in any technology including CMOS, NMOS, amorphous silicon, nano/micro crystalline silicon, poly crystalline, and liquid-printed and vacuum-deposited organic technology. Moreover, the NMOS transistors can be replaced with a PMOS transistor using the concept of complementary circuit design.
The operating cycles of the pixel circuit depicted in FIG. 3 are demonstrated in FIG. 4.
During the first operating cycle, the storage capacitor is charged to a biasing voltage (VP) by applying a voltage or current to the data [iJ. When using cunent as the biasing signal, VBl and VB2 should be zero during the first operating cycle while for voltage biasing, they can be as the voltage of data[iJ to reduce power consumption. During the second cycle, the sensor signal is integrated by the storage capacitor. During the readout cycle, Tl and T2 turn on sequentially. Thus, the output signal is not affected by the sync filter induced by the switched biasing and it is essentially equivalent to a single TFT with a DC
bias. However, one can use one TFT (Tl or T2) to improve the aperture ratio and use a higher bias voltage to compensate for the gain lost by switch biasing technique. On the other hand, the noise is reduced significantly due to the reduction of carrier trapping/de-trapping phenomena intrinsic to most transistors. Moreover, the lifetime of the pixel is improved as well.
The pixel can work in hybrid mode which means it can be passive or active. For passive operation, VBl and VB2 are chosen to be the voltage applied to data [i] and so they are OFF. Therefore, the integrated signal can be read back through data [i].
FIG. 5 shows a 2-TFT sensor pixel circuit based on photo TFTs. The pixel circuit composes a two amplifying photo transistors, Tl and T2. The transistor can be fabricated in any technology including CMOS, NMOS, amorphous silicon, nano/micro crystalline silicon, poly crystalline, and liquid-printed and vacuum-deposited organic technology.
Moreover, the NMOS transistors can be replaced with a PMOS transistor using the concept of complementary circuit design.
The operating cycles of the pixel circuit depicted in FIG. 5 are demonstrated in FIG. 6.
During the first integration cycle, TI and T2 turn on sequentially while their channel conductance is modulated as a result of optical interaction. Thus, the output signal is not affected by the sync filter induced by switched biasing and it is essentially equivalent to a single TFT with a DC bias. However, one can use one TFT (Tl or T2) to improve the aperture ratio and use a higher bias voltage to compensate for the gain lost by the switch biasing technique. On the other hand, the noise is reduced significantly due to the reduction of carrier trapping/de-trapping phenomena intrinsic to most transistors.
Moreover, the lifetime of the pixel is improved as well.
Claims
Priority Applications (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CA002582243A CA2582243A1 (en) | 2007-03-05 | 2007-03-05 | Low noise hybrid active-passive pixel for different sensor applications |
EP20070855520 EP2126526A1 (en) | 2007-03-05 | 2007-12-17 | Sensor pixels, arrays and array systems and methods therefor |
PCT/CA2007/002238 WO2008106764A1 (en) | 2007-03-05 | 2007-12-17 | Sensor pixels, arrays and array systems and methods therefor |
US12/530,151 US8487231B2 (en) | 2007-03-05 | 2007-12-17 | Sensor pixels, arrays and array systems and methods therefor |
CA 2680043 CA2680043A1 (en) | 2007-03-05 | 2007-12-17 | Sensor pixels, arrays and array systems and methods therefor |
US13/942,285 US20130299680A1 (en) | 2007-03-05 | 2013-07-15 | Sensor pixels, arrays and array systems and methods therefor |
US14/096,572 US8872095B2 (en) | 2007-03-05 | 2013-12-04 | Sensor pixels, arrays and array systems and methods therefor |
US14/499,144 US9281330B2 (en) | 2007-03-05 | 2014-09-27 | Sensor pixels, arrays and array systems and methods therefor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CA002582243A CA2582243A1 (en) | 2007-03-05 | 2007-03-05 | Low noise hybrid active-passive pixel for different sensor applications |
Publications (1)
Publication Number | Publication Date |
---|---|
CA2582243A1 true CA2582243A1 (en) | 2008-09-05 |
Family
ID=39731948
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA002582243A Abandoned CA2582243A1 (en) | 2007-03-05 | 2007-03-05 | Low noise hybrid active-passive pixel for different sensor applications |
Country Status (1)
Country | Link |
---|---|
CA (1) | CA2582243A1 (en) |
-
2007
- 2007-03-05 CA CA002582243A patent/CA2582243A1/en not_active Abandoned
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FZDE | Discontinued |