CA2466552A1 - Mass spectrometer - Google Patents

Mass spectrometer Download PDF

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Publication number
CA2466552A1
CA2466552A1 CA 2466552 CA2466552A CA2466552A1 CA 2466552 A1 CA2466552 A1 CA 2466552A1 CA 2466552 CA2466552 CA 2466552 CA 2466552 A CA2466552 A CA 2466552A CA 2466552 A1 CA2466552 A1 CA 2466552A1
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Canada
Prior art keywords
ion source
discharge device
ion
mode
vii
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CA 2466552
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French (fr)
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CA2466552C (en
Inventor
Steve Bajic
Robert Harold Bateman
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Micromass UK Ltd
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Individual
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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

An Atmospheric Pressure Chemical Ionisation ion source is disclosed wherein the current applied to a corona needle 2 is repeatedly varied between two or more settings during a single experimental run or acquisition. Two or more separate sets of mass spectral or mass analysed data are obtained. The ion source in one embodiment comprises a heated tube 1 arranged to discharge gas and analyte into a housing 7 enclosing corona needle 2. The housing 7 comprises a gas outlet port 3 via which analyte ions exit. According to another embodiment the corona needle does not have to be enclosed within a housing.

Claims (60)

1. An ion source for a mass spectrometer comprising a discharge device, wherein in use the current or voltage applied to said discharge device is switched between a first mode and a second mode at least n times during a single experimental run or acquisition, wherein n >= 1.
2. An ion source as claimed in claim 1, wherein said ion source comprises an Atmospheric Pressure Ionisation ion source.
3. An ion source as claimed in claim 1 or 2, wherein said ion source comprises an Atmospheric Pressure Chemical Ionisation source.
4. An ion source as claimed in claim 1, 2 or 3, wherein said discharge device comprises a corona discharge device.
5. An ion source as claimed in claim 4, wherein said corona discharge device comprises a corona needle or pin.
6. An ion source as claimed in any preceding claim, wherein n is selected from the group consisting of: (i) 1; (ii) 2-10; (iii) 10-50; (iv) 50-100; (v) 100-200;
(vi) 200-400; (vii) 400-600; (viii) 600-800; (ix) 800-1000; (x) 1000-2000; (xi) 2000-3000; (xii) 3000-4000;
(xiii) 4000-5000; (xiv) 5000-6000; (xv) 6000-7000; (xvi) 7000-8000; (xvii) 8000-9000; (xviii) 9000-10000; (xix) 10000-15000; (xx) 15000-20000; (xxi) 20000-25000; and (xxii) > 25000.
7. An ion source as claimed in any preceding claim, wherein said discharge device is switched between said first mode and said second mode at least x times per minute.
8. An ion source as claimed in claim 7, wherein x is selected from the group consisting of: (i) 1-10; (ii) 10-20; (iii) 20-30; (iv) 30-40; (v) 40-50; (vi) 50-60;
(vii) 60-70; (viii) 70-80; (ix) 80-90; (x) 90-100; (xi) 100-120; (xii) 120-140; (xiii) 140-160; (xiv) 160-180;
(xv) 180-200; (xvi) 200-250; (xvii) 250-300; (xviii) 300-350; (xix) 350-400; (xx) 400-450; (xxi) 450-500;
(xxii) 500-600; (xxiii) 600-700; (xxiv) 700-800; (xxv) 800-900; (xxvi) 900-1000; (xxvii) 1000-2000; (xxviii) 2000-3000; (xxix) 3000-4000; (xxx) 4000-5000; and (xxxi) > 5000.
9. An ion source as claimed in any preceding claim, wherein when said discharge device is in said first mode a first current or a first voltage is applied to said discharge device.
10. An ion source as claimed in claim 9, wherein said first current is selected from the group consisting of:
(i) < 0.1 µA; (ii) 0.1-0.2 µA; (iii) 0.2-0.3 µA; (iv) 0.3-0.4 µA; (v) 0.4-0.5 µA; (vi) 0.5-0.6 µA; (vii) 0.6-0.7 µA; (viii) 0.7-0.8 µA; (ix) 0.8-0.9 µA; (x) 0.9-1.0 µA; and (xi) > 1 µA.
11. An ion source as claimed in claim 9 or 10, wherein said first voltage is selected from the group consisting of: (i) < 1 kV; (ii) 1-2 kV; (iii) 2-3 kV; (iv) 3-4 kV;
(v) 4-5 kV; (vi) 5-6 kV; (vii) 6-7 kV; (viii) 7-8 kV;
(ix) 8-9 kV; (x) 9-10 kV; and (xi) > 10 kV.
12. An ion source as claimed in any preceding claim, wherein when said discharge device is in said second mode a second current or a second voltage is applied to said discharge device.
13. An ion source as claimed in claim 12, wherein said second current is selected from the group consisting of:
(i) < 0.1 µA; (ii) 0.1-0.2 µA; (iii) 0.2-0.3 µA; (iv) 0.3-0.4 µA; (v) 0.4-0.5 µA; (vi) 0.5-0.6 µA; (vii) 0.6-0.7 µA; (viii) 0.7-0.8 µA; (ix) 0.8-0.9 µA; (x) 0.9-1.0 µA; and (xi) > 1 µA.
14. An ion source as claimed in claim 12 or 13, wherein said second voltage is selected from the group consisting of : (i) < 1 kV; (ii) 1-2 kV; (iii) 2-3 kV;
(iv) 3-4 kV; (v) 4-5 kV; (vi) 5-6 kV; (vii) 6-7 kV;
(viii) 7-8 kV; (ix) 8-9 kV; (x) 9-10 kV; and (xi) > 10 kV.
15. An ion source as claimed in any preceding claim, wherein there is an interscan delay between or whilst switching said discharge device from said first mode to said second mode during which time mass analysed data is either substantially not obtained or is not substantially used to provide at least one final mass spectrum.
16. An ion source as claimed in claim 15, wherein said interscan delay is selected from the group consisting of: (i) < 1 ms; (ii) 1-10 ms; (iii) 10-20 ms; (iv) 20-30 ms; (v) 30-40 ms; (vi) 40-50 ms; (vii) 50-60 ms; (viii) 60-70 ms; (ix) 70-80 ms; (x) 80-90 ms; (xi) 90-100 ms;
(xii) 100-150 ms; (xiii) 150-200 ms; (xiv) 200-250 ms;
(xv) 250-300 ms; (xvi) 300-350 ms; (xvii) 350-400 ms;
(xviii) 400-450 ms; (xix) 450-500 ms; (xx) 500-600 ms;
(xxi) 600-700 ms; (xxii) 700-800 ms; (xxiii) 800-900 ms;
(xxiv) 900-1000 ms; (xxv) 1-2 s; (xxvi) 2-3 s; (xxvii) 3-4 s; (xxviii) 4-5 s; (xxix) 5-6 s; (xxx) 6-7 s; (xxxi) 7-8 s; (xxxii) 8-9 s; (xxxiii) 9-10 s; and (xxxiv) > 10 s.
17. An ion source as claimed in any preceding claim, further comprising a spray device for spraying a sample and causing said sample to form droplets.
18. An ion source as claimed in claim 17, further comprising a heated tube upon which said droplets impinge.
19. An ion source as claimed in claim 17 or 18, wherein a nebulising gas is supplied in use to nebulise said droplets.
20. An ion source as claimed in claim 18 or 19, further comprising a housing at least partially enclosing said discharge device, wherein said heated tube discharges, in use, analyte molecules and/or analyte ions into said housing.
21. An ion source as claimed in claim 20, wherein said housing further comprises a gas exit port.
22. An ion source as claimed in claim 20 or 21, wherein said heated tube is received within or is substantially integral with said housing.
23. A mass spectrometer comprising an ion source as claimed in any preceding claim.
24. A mass spectrometer as claimed in claim 23, further comprising an ion sampling orifice.
25. A mass spectrometer as claimed in claim 24, wherein ions in the vicinity of said ion sampling orifice are substantially shielded from an electric field generated by said discharge device.
26. A mass spectrometer as claimed in claim 24, wherein ions in the vicinity of said ion sampling orifice are substantially shielded from an electric field generated by said discharge device by a housing surrounding at least part of said discharge device.
27. A mass spectrometer as claimed in claim 24, 25 or 26, further comprising at least one electrode arranged opposite said ion sampling orifice so as to deflect, direct or repel at least some ions towards said ion sampling orifice.
28. A mass spectrometer as claimed in any of claims 23-27, wherein said ion source is connected, in use, to a gas chromatograph.
29. A mass spectrometer as claimed in any of claims 23-27, wherein said ion source is connected, in use, to a liquid chromatograph.
30. A mass spectrometer as claimed in any of claims 23-29, further comprising a mass analyser selected from the group consisting of: (i) a Time of Flight mass analyser;
(ii) a quadrupole mass analyser; (iii) a Penning mass analyser; (iv) a Fourier Transform Ion Cyclotron Resonance ("FTICR") mass analyser; (v) a 2D or linear quadrupole ion trap; (vi) a Paul or 3D quadrupole ion trap; and (vii) a magnetic sector mass analyser.
31. A method of mass spectrometry comprising:
providing an ion source comprising a discharge device;
switching the current or voltage applied to said discharge device between a first mode and a second mode at least n times during an experimental run or acquisition, wherein n >= 1; and obtaining mass analysed data in both said first mode and said second mode.
32. A method as claimed in claim 31, wherein said ion source comprises an Atmospheric Pressure Ionisation ion source.
33. A method as claimed in claim 31 or 32, wherein said ion source comprises an Atmospheric Pressure Chemical Ionisation source.
34. A method as claimed in claim 31, 32 or 33, wherein said discharge device comprises a corona discharge device.
35. A method as claimed in claim 34, wherein said corona discharge device comprises a corona needle or pin.
36. A method as claimed in any of claims 31-35, wherein n is selected from the group consisting of: (i) 1; (ii) 2-10; (iii) 10-50; (iv) 50-100; (v) 100-200; (vi) 200-400; (vii) 400-600; (viii) 600-800; (ix) 800-1000; (x) 1000-2000; (xi) 2000-3000; (xii) 3000-4000; (xiii) 4000-5000; (xiv) 5000-6000; (xv) 6000-7000; (xvi) 7000-8000;
(xvii) 8000-9000; (xviii) 9000-10000; (xix) 10000-15000;
(xx) 15000-20000; (xxi) 20000-25000; and (xxii) > 25000.
37. A method as claimed in any of claims 31-36, further comprising switching said discharge device between said first mode and said second mode at least x times per minute.
38. A method as claimed in claim 37, wherein x is selected from the group consisting of: (i) 1-10; (ii) 10-20; (iii) 20-30; (iv) 30-40; (v) 40-50; (vi) 50-60;
(vii) 60-70; (viii) 70-80; (ix) 80-90; (x) 90-100; (xi) 100-120; (xii) 120-140; (xiii) 140-160; (xiv) 160-180;
(xv) 180-200; (xvi) 200-250; (xvii) 250-300; (xviii) 300-350; (xix) 350-400; (xx) 400-450; (xxi) 450-500;
(xxii) 500-600; (xxiii) 600-700; (xxiv) 700-800; (xxv) 800-900; (xxvi) 900-1000; (xxvii) 1000-2000; (xxviii) 2000-3000; (xxix) 3000-4000; (xxx) 4000-5000; and (xxxi) > 5000.
39. A method as claimed in any of claims 31-38, wherein when said discharge device is in said first mode a first current or a first voltage is applied to said discharge device.
40. A method as claimed in claim 39, wherein said first current is selected from the group consisting of: (i) <
0.1 µA; (ii) 0.1-0.2 µA; (iii) 0.2-0.3 µA; (iv) 0.3-0.4 µA; (v) 0.4-0.5 µA; (vi) 0.5-0.6 µA; (vii) 0.6-0.7 µA;
(viii) 0.7-0.8 µA; (ix) 0.8-0.9 µA; (x) 0.9-1.0 µA; and (xi) > 1 µA.
41. A method as claimed in claim 39 or 40, wherein said first voltage is selected from the group consisting of:
(i) < 1 kV; (ii) 1-2 kV; (iii) 2-3 kV; (iv) 3-4 kV; (v) 4-5 kV; (vi) 5-6 kV; (vii) 6-7 kV; (viii) 7-8 kV; (ix) 8-9 kV; (x) 9-10 kV; and (xi) > 10 kV.
42. A method as claimed in any of claims 31-41, wherein when said discharge device is in said second mode a second current or a second voltage is applied to said discharge device.
43. A method as claimed in claim 42, wherein said second current is selected from the group consisting of:
(i) < 0.1 µA; (ii) 0.1-0.2 µA; (iii) 0.2-0.3 µA; (iv) 0.3-0.4 µA; (v) 0.4-0.5 µA; (vi) 0.5-0.6 µA; (vii) 0.6-0.7 µA; (viii) 0.7-0.8 µA; (ix) 0.8-0.9 µA; (x) 0.9-1.0 µA; and (xi) > 1 µA.
44. A method as claimed in claim 42 or 43, wherein said second voltage is selected from the group consisting of:

(i) < 1 kV; (ii) 1-2 kV; (iii) 2-3 kV; (iv) 3-4 kV; (v) 4-5 kV; (vi)5-6 kV; (vii) 6-7 kV; (viii) 7-8 kV; (ix) 8-9 kV; (x) 9-10 kV; and (xi) > 10 kV.
45. A method as claimed in any of claims 31-44, further comprising providing an interscan delay between or whilst switching said discharge device from said first mode to said second mode during which time mass analysed data is either substantially not obtained or is not substantially used to provide at least one final mass spectrum.
46. A method as claimed in claim 45, wherein said interscan delay is selected from the group consisting of: (i) < 1 ms; (ii) 1-to ms; (iii) 10-20 ms; (iv) 20-30 ms; (v) 30-40 ms; (vi) 40-50 ms; (vii) 50-60 ms; (viii) 60-70 ms; (ix) 70-80 ms; (x) 80-90 ms; (xi) 90-100 ms;
(xii) 100-150 ms; (xiii) 150-200 ms; (xiv) 200-250 ms;
(xv) 250-300 ms; (xvi) 300-350 ms; (xvii) 350-400 ms;
(xviii) 400-450 ms; (xix) 450-500 ms; (xx) 500-600 ms;
(xxi) 600-700 ms; (xxii) 700-800 ms; (xxiii) 800-900 ms;
(xxiv) 900-1000 ms; (xxv) 1-2 s; (xxvi) 2-3 s; (xxvii) 3-4 s; (xxviii) 4-5 s; (xxix) 5-6 s; (xxx) 6-7 s; (xxxi) 7-8 s; (xxxii) 8-9 s; (xxxiii) 9-10 s; and (xxxiv) > to s.
47. A method as claimed in any of claims 31-46, further comprising providing a spray device for spraying a sample and causing said sample to form droplets.
48. A method as claimed in claim 47, further comprising arranging for said droplets to impinge upon a heated tube.
49. A method as claimed in claim 47 or 48, further comprising supplying a nebulising gas to nebulise said droplets.
50. A method as claimed in claim 48 or 49, further comprising providing a housing at least partially enclosing said discharge device, wherein said heated tube discharges analyte molecules and/or analyte ions into said housing.
51. A method as claimed in claim 50, wherein said housing further comprises a gas exit port.
52. A method as claimed in claim 50 or 51, wherein said heated tube is received within or is substantially integral with said housing.
53. A method as claimed in any of claims 31-52, further comprising providing a mass spectrometer.
54. A method as claimed in claim 53, wherein said mass spectrometer further comprises an ion sampling orifice.
55. A method as claimed in claim 54, further comprising the step of substantially shielding ions in the vicinity of said ion sampling orifice from an electric field generated by said discharge device.
56. A method as claimed in claim 54, further comprising the step of substantially shielding ions in the vicinity of said ion sampling orifice from an electric field generated by said discharge device by providing a housing surrounding at least part of said discharge device.
57. A method as claimed in claim 54, 55 or 56, further comprising providing at least one electrode arranged opposite said ion sampling orifice so as to deflect, direct or repel at least some ions towards said ion sampling orifice.
58. A method as claimed in any of claims 31-57, further comprising coupling said ion source to a gas chromatograph.
59. A method as claimed in any of claims 31-57, further comprising coupling said ion source to a liquid chromatograph.
60. A method as claimed in any of claims 31-59, further comprising providing a mass analyser selected from the group consisting of: (i) a Time of Flight mass analyser;
(ii) a quadrupole mass analyser; (iii) a Penning mass analyser; (iv) a Fourier Transform Ion Cyclotron Resonance ("FTICR") mass analyser; (v) a 2D or linear quadrupole ion trap; (vi) a Paul or 3D quadrupole ion trap; and (vii) a magnetic sector mass analyser.
CA2466552A 2003-05-09 2004-05-07 Mass spectrometer Expired - Lifetime CA2466552C (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB0310696.0 2003-05-09
GB0310696A GB0310696D0 (en) 2003-05-09 2003-05-09 Mass spectrometer

Publications (2)

Publication Number Publication Date
CA2466552A1 true CA2466552A1 (en) 2004-11-09
CA2466552C CA2466552C (en) 2012-12-04

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CA2466552A Expired - Lifetime CA2466552C (en) 2003-05-09 2004-05-07 Mass spectrometer

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DE (2) DE202004007329U1 (en)
GB (2) GB0310696D0 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7417226B2 (en) 2003-07-16 2008-08-26 Micromass Uk Limited Mass spectrometer
GB2415290B (en) * 2003-07-16 2006-03-22 Micromass Ltd Mass spectrometer

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3600573A (en) * 1968-10-09 1971-08-17 Jeol Ltd Ion beam intensity control with pulsed beam deflection and synchronized ion source blanking
JPS5843863B2 (en) * 1978-09-27 1983-09-29 株式会社日立製作所 mass spectrometer
JP2545528B2 (en) * 1987-01-29 1996-10-23 株式会社日立製作所 Atmospheric pressure ionization mass spectrometry method and mass spectrometer
JP2834136B2 (en) * 1988-04-27 1998-12-09 株式会社日立製作所 Mass spectrometer
GB8826966D0 (en) * 1988-11-18 1988-12-21 Vg Instr Group Plc Gas analyzer
US6462337B1 (en) * 2000-04-20 2002-10-08 Agilent Technologies, Inc. Mass spectrometer electrospray ionization
GB9304462D0 (en) * 1993-03-04 1993-04-21 Kore Tech Ltd Mass spectrometer
GB9525507D0 (en) * 1995-12-14 1996-02-14 Fisons Plc Electrospray and atmospheric pressure chemical ionization mass spectrometer and ion source
GB2358280B (en) * 1999-04-15 2002-02-13 Hitachi Ltd Mass analysis apparatus and method for mass analysis

Also Published As

Publication number Publication date
DE202004007329U1 (en) 2004-09-23
GB0410257D0 (en) 2004-06-09
GB0310696D0 (en) 2003-06-11
GB2401990B (en) 2005-04-06
GB2401990A (en) 2004-11-24
DE102004022561B4 (en) 2008-06-26
CA2466552C (en) 2012-12-04
DE102004022561A1 (en) 2005-01-13
DE102004022561A9 (en) 2007-12-27

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