CA2409435C - Conception et methode de technique a radiofrequence sans fil permettant l'essai de circuits integres et de plaquettes - Google Patents
Conception et methode de technique a radiofrequence sans fil permettant l'essai de circuits integres et de plaquettes Download PDFInfo
- Publication number
- CA2409435C CA2409435C CA2409435A CA2409435A CA2409435C CA 2409435 C CA2409435 C CA 2409435C CA 2409435 A CA2409435 A CA 2409435A CA 2409435 A CA2409435 A CA 2409435A CA 2409435 C CA2409435 C CA 2409435C
- Authority
- CA
- Canada
- Prior art keywords
- circuit
- test
- ring oscillator
- sub
- antenna
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
- H01L22/34—Circuits for electrically characterising or monitoring manufacturing processes, e. g. whole test die, wafers filled with test structures, on-board-devices incorporated on each die, process control monitors or pad structures thereof, devices in scribe line
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2831—Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
- G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/3011—Impedance
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Automation & Control Theory (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Semiconductor Integrated Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
La présente invention concerne un appareil et un procédé d'essai sans fil de circuits intégrés et de plaquettes. L'appareil comprend une unité d'essai à l'extérieur de la plaquette et au moins un circuit d'essai fabriqué sur la plaquette contenant le circuit intégré. L'unité d'essai transmet un signal RF pour alimenter le circuit d'essai. Le circuit d'essai qui comprend un oscillateur en anneau variable effectue une série d'essais paramétriques à la fréquence d'exploitation normale du circuit intégré et transmet les résultats d'essai à l'unité d'essai pour analyse.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CA2409435A CA2409435C (fr) | 2000-05-15 | 2001-05-15 | Conception et methode de technique a radiofrequence sans fil permettant l'essai de circuits integres et de plaquettes |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CA2,308,820 | 2000-05-15 | ||
CA002308820A CA2308820A1 (fr) | 2000-05-15 | 2000-05-15 | Conception d'une technique sans fil a frequences radioelectriques et methode d'essai de circuits integres et de tranches |
PCT/CA2001/000688 WO2001088976A2 (fr) | 2000-05-15 | 2001-05-15 | Conception d'une technique radio frequence sans fil et procede d'essai de circuits integres et de plaquettes |
CA2409435A CA2409435C (fr) | 2000-05-15 | 2001-05-15 | Conception et methode de technique a radiofrequence sans fil permettant l'essai de circuits integres et de plaquettes |
Publications (2)
Publication Number | Publication Date |
---|---|
CA2409435A1 CA2409435A1 (fr) | 2001-11-22 |
CA2409435C true CA2409435C (fr) | 2010-07-20 |
Family
ID=25681815
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA2409435A Expired - Fee Related CA2409435C (fr) | 2000-05-15 | 2001-05-15 | Conception et methode de technique a radiofrequence sans fil permettant l'essai de circuits integres et de plaquettes |
Country Status (1)
Country | Link |
---|---|
CA (1) | CA2409435C (fr) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102014222203B3 (de) * | 2014-10-30 | 2016-03-10 | Infineon Technologies Ag | Überprüfung von Randschäden |
CN117785590B (zh) * | 2024-02-27 | 2024-05-28 | 深圳市纽创信安科技开发有限公司 | 芯片及芯片数据保护方法 |
-
2001
- 2001-05-15 CA CA2409435A patent/CA2409435C/fr not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
CA2409435A1 (fr) | 2001-11-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EEER | Examination request | ||
MKLA | Lapsed |
Effective date: 20160516 |