CA2392346A1 - Gamma-ray imaging - Google Patents

Gamma-ray imaging Download PDF

Info

Publication number
CA2392346A1
CA2392346A1 CA002392346A CA2392346A CA2392346A1 CA 2392346 A1 CA2392346 A1 CA 2392346A1 CA 002392346 A CA002392346 A CA 002392346A CA 2392346 A CA2392346 A CA 2392346A CA 2392346 A1 CA2392346 A1 CA 2392346A1
Authority
CA
Canada
Prior art keywords
gamma
rays
detector
ray imaging
arrival
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA002392346A
Other languages
French (fr)
Other versions
CA2392346C (en
Inventor
James Richard Tickner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commonwealth Scientific and Industrial Research Organization CSIRO
Original Assignee
Commonwealth Scientific And Industrial Research Organisation
James Richard Tickner
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from AUPQ4142A external-priority patent/AUPQ414299A0/en
Priority claimed from AUPQ4156A external-priority patent/AUPQ415699A0/en
Application filed by Commonwealth Scientific And Industrial Research Organisation, James Richard Tickner filed Critical Commonwealth Scientific And Industrial Research Organisation
Publication of CA2392346A1 publication Critical patent/CA2392346A1/en
Application granted granted Critical
Publication of CA2392346C publication Critical patent/CA2392346C/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector
    • G01T1/172—Circuit arrangements not adapted to a particular type of detector with coincidence circuit arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2985—In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)

Abstract

The specification describes an instru-ment and a method for determining information about an object (J), only one side of which is available for examination. The method involves exposing the ob-ject to gamma-rays and measuring the position and/or time of arrival of gamma-rays at a detector (D). The instrument includes a source of gamma-rays (S) lo-cated so that at least some gamma-rays impact upon the object, and a detector surrounded by a shield (C) having an aperture (A) for facing at the object to be studied. The detector is capable of measuring the po-sition and/or time of arrival at the detector of gamma-rays passing through the aperture.
CA002392346A 1999-11-18 2000-11-14 Gamma-ray imaging Expired - Fee Related CA2392346C (en)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
AUPQ4142 1999-11-18
AUPQ4142A AUPQ414299A0 (en) 1999-11-18 1999-11-18 Gamma ray imaging
AUPQ4156 1999-11-19
AUPQ4156A AUPQ415699A0 (en) 1999-11-19 1999-11-19 Gamma ray imaging
PCT/AU2000/001393 WO2001036997A1 (en) 1999-11-18 2000-11-14 Gamma-ray imaging

Publications (2)

Publication Number Publication Date
CA2392346A1 true CA2392346A1 (en) 2001-05-25
CA2392346C CA2392346C (en) 2009-04-14

Family

ID=25646206

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002392346A Expired - Fee Related CA2392346C (en) 1999-11-18 2000-11-14 Gamma-ray imaging

Country Status (3)

Country Link
EP (1) EP1257848A4 (en)
CA (1) CA2392346C (en)
WO (1) WO2001036997A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0124424D0 (en) * 2001-10-11 2001-12-05 Secr Defence A single sided imaging system
EP2482102B1 (en) * 2011-02-01 2014-06-18 GSI Helmholtzzentrum für Schwerionenforschung GmbH Gamma-ray imaging device
US9535016B2 (en) 2013-02-28 2017-01-03 William Beaumont Hospital Compton coincident volumetric imaging

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4124804A (en) * 1976-12-17 1978-11-07 Stuart Mirell Compton scatter scintillation camera system
US4638158A (en) * 1984-01-18 1987-01-20 Halliburton Company Gamma ray measurement of earth formation properties using a position sensitive scintillation detector
US5430787A (en) * 1992-12-03 1995-07-04 The United States Of America As Represented By The Secretary Of Commerce Compton scattering tomography
US5763886A (en) * 1996-08-07 1998-06-09 Northrop Grumman Corporation Two-dimensional imaging backscatter probe

Also Published As

Publication number Publication date
WO2001036997A1 (en) 2001-05-25
EP1257848A1 (en) 2002-11-20
CA2392346C (en) 2009-04-14
EP1257848A4 (en) 2007-01-24

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