CA2284602A1 - Interferometer tunable in a non-mechanical manner by a pancharatnam phase - Google Patents

Interferometer tunable in a non-mechanical manner by a pancharatnam phase Download PDF

Info

Publication number
CA2284602A1
CA2284602A1 CA002284602A CA2284602A CA2284602A1 CA 2284602 A1 CA2284602 A1 CA 2284602A1 CA 002284602 A CA002284602 A CA 002284602A CA 2284602 A CA2284602 A CA 2284602A CA 2284602 A1 CA2284602 A1 CA 2284602A1
Authority
CA
Canada
Prior art keywords
interferometer
analyzer
mechanical manner
polarization
test specimen
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA002284602A
Other languages
French (fr)
Other versions
CA2284602C (en
Inventor
Wolfgang Dultz
Leonid Beresnev
Bernhard Hils
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Deutsche Telekom AG
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of CA2284602A1 publication Critical patent/CA2284602A1/en
Application granted granted Critical
Publication of CA2284602C publication Critical patent/CA2284602C/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02056—Passive reduction of errors
    • G01B9/02057—Passive reduction of errors by using common path configuration, i.e. reference and object path almost entirely overlapping
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02011—Interferometers characterised by controlling or generating intrinsic radiation properties using temporal polarization variation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70—Using polarization in the interferometer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)

Abstract

The object of the invention is to create an improved interferometer which does not require a drive mechanism for moving a reference surface or test specimen in order to tune the interferometer and which can be tuned in virtually vibration-free manner, thereby preventing measuring errors. For this purpose, the interferometer (10) comprises at least one light source, a reference surface (40), a test specimen (50) and at least one beam splitter (30). For vibration-free tuning, the interferometer (10) further contains an apparatus (60, 70) for the polarization of the.interference beams such that, at the output of the interferometer (10), they have different polarization states with respect to each other; and an analyzer (80), disposed at the output of the interferometer (10), with a polarization state variable in predetermined manner, said analyzer (80) - depending on its polarization state - introducing a defined Pancharatnam phase into the interference beams for tuning the interferometer (10).
CA002284602A 1997-05-15 1998-04-28 Interferometer tunable in a non-mechanical manner by a pancharatnam phase Expired - Fee Related CA2284602C (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE19720246A DE19720246C2 (en) 1997-05-15 1997-05-15 Tunable interferometer
DE19720246.2 1997-05-15
PCT/EP1998/002494 WO1998051992A1 (en) 1997-05-15 1998-04-28 Interferometer tunable in a non-mechanical manner by a pancharatnam phase

Publications (2)

Publication Number Publication Date
CA2284602A1 true CA2284602A1 (en) 1998-11-19
CA2284602C CA2284602C (en) 2006-11-07

Family

ID=7829453

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002284602A Expired - Fee Related CA2284602C (en) 1997-05-15 1998-04-28 Interferometer tunable in a non-mechanical manner by a pancharatnam phase

Country Status (6)

Country Link
EP (1) EP0981717B1 (en)
AT (1) ATE246341T1 (en)
AU (1) AU736850B2 (en)
CA (1) CA2284602C (en)
DE (2) DE19720246C2 (en)
WO (1) WO1998051992A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10037652A1 (en) * 2000-07-31 2002-02-14 Deutsche Telekom Ag Process for transferring moment of momentum to double refracting object made of mercury halide and/or Kevlar comprises changing polarizing state of light as polarized light passes through object

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3635552A (en) * 1970-04-14 1972-01-18 Philips Corp Optical interferometer
US3873207A (en) * 1973-03-09 1975-03-25 Xerox Corp Polarizing interferometer
JPH03195907A (en) * 1989-12-25 1991-08-27 Matsushita Electric Works Ltd Fizeau interferometer for polarized light
IL100655A (en) * 1991-02-08 1994-11-28 Hughes Aircraft Co Interferometric laser profilometer
DE69206654T2 (en) * 1991-03-26 1996-07-11 Hamamatsu Photonics Kk Optical voltage detector
US5627666A (en) * 1994-07-27 1997-05-06 Board Of Regents Of The University Of Colorado Liquid crystal phase modulator using cholesteric circular polarizers

Also Published As

Publication number Publication date
DE19720246A1 (en) 1998-11-19
EP0981717B1 (en) 2003-07-30
AU736850B2 (en) 2001-08-02
WO1998051992A1 (en) 1998-11-19
ATE246341T1 (en) 2003-08-15
AU7649998A (en) 1998-12-08
DE19720246C2 (en) 1999-04-15
DE59809161D1 (en) 2003-09-04
CA2284602C (en) 2006-11-07
EP0981717A1 (en) 2000-03-01

Similar Documents

Publication Publication Date Title
US4320973A (en) Device for interferential spectrometry with selective modulation
US20080137084A1 (en) Method and apparatus for reducing fringe interference of light
EP0389240A3 (en) Polarizing beam splitter apparatus and light valve image projection system
US5734473A (en) Method of determining polarization profiles for polychromatic sources
FI114045B (en) Method and a dichrograph for measuring circular dichroism, optical rotation and absorption spectrum
US7317519B2 (en) Swept-angle SPR measurement system
DE3404963A1 (en) Interferometer having an integrated length standard
KR950006483A (en) Assembly method and measurement method of optical isolator
CA2284602A1 (en) Interferometer tunable in a non-mechanical manner by a pancharatnam phase
JPH03504768A (en) Interferometer system for measuring distance and shift movements, especially of moving components
US4897843A (en) Frequency-agile laser systems
CA2187597A1 (en) Acousto-Optical Tunable Waveguide Switch Having Balanced Optical Paths
EP0354298A3 (en) Interferometric measurement arrangement for gas components with small molecules
EP0599361A1 (en) Method of inspecting phase shift masks employing phase-error enhancing
SU1083146A1 (en) Depolarizer
US5751419A (en) Optical delay apparatus
US5028864A (en) Optically stable, large time bandwidth acousto-optic heterodyne spectrum analyzer with fixed non-zero heterodyne output
JPH01167603A (en) Interference measuring instrument
US6298185B1 (en) Distributed fiber grating sensing systems using birefringence fiber interferometers for detecting wavelength shifts
US20050053328A1 (en) Optical monitor and a method for improved optical monitoring
JP2000146525A (en) Light wave interference measuring instrument and projection aligner using same instrument
AU5655399A (en) Achromatic phase shift device and interferometer using achromatic phase shift device
RU2062977C1 (en) Diffraction interferometer
SU1172356A1 (en) Method of producing interference pattern
US20040105142A1 (en) Wavelength switching devices

Legal Events

Date Code Title Description
EEER Examination request
MKLA Lapsed