CA2275411A1 - Apparatus and method for rapid 3d image parametrization - Google Patents
Apparatus and method for rapid 3d image parametrization Download PDFInfo
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- CA2275411A1 CA2275411A1 CA002275411A CA2275411A CA2275411A1 CA 2275411 A1 CA2275411 A1 CA 2275411A1 CA 002275411 A CA002275411 A CA 002275411A CA 2275411 A CA2275411 A CA 2275411A CA 2275411 A1 CA2275411 A1 CA 2275411A1
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- Prior art keywords
- dimensional
- speckle pattern
- digital images
- speckle
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2545—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with one projection direction and several detection directions, e.g. stereo
Abstract
A method and apparatus for rapid three-dimensional geometry parametrization of a three-dimensional surface. A random speckle pattern is projected upon the surface and imaged to obtain a plurality of two-dimensional digital images.
The two-dimensional images are processed to obtain a three-dimensional characterization of the surface. The illuminated surface may be modeled to obtain a parameter set characterizing the surface based upon the two-dimensional digital images.
The two-dimensional images are processed to obtain a three-dimensional characterization of the surface. The illuminated surface may be modeled to obtain a parameter set characterizing the surface based upon the two-dimensional digital images.
Description
Apparatus and Method for Rapid 3D Image Parametrization Field of the Invention This invention relates to the measurement and modeling of a three dimensional surface. More particularly, this invention relates to measuring and modeling a three dimensional surface by projecting a speckle pattern upon the three dimensional surface, imaging the speckle pattern with a plurality of cameras to obtain a plurality of two dimensional digital images, and obtaining from the plurality of two dimensional digital images a three dimensional digital image and a model parameter set representing the three dimensional illuminated surface.
Background of the Invention Speckle techniques, both photographic and interferometric, are known to produce images of surfaces containing a rich set of spatial frequencies thereby providing spatial information on a wide range of spatial scales.A survey of speckle techniques is provided in Jones, Robert, Holographic and speckle interferometry: a discaession of the theory, practice, and application of the techniques, 2nd ed., Cambridge University Press (1989), which is herein incorporated by reference.
Summary of the Invention A preferred embodiment of the present invention provides a method for measuring and modeling a three dimensional surface. This method has the steps of: (i) illuminating the three dimensional surface with a speckle pattern; (ii) imaging the speckle pattern to obtain a plurality of two dimensional digital images; and (iii) processing the plurality of two dimensional digital images to obtain a three dimensional digital characterization of the illuminated three dimensional surface. A further embodiment includes the step of modeling the illuminated surface, based upon the plurality of two dimensional digital images, to obtain a parameter set characterizing the illuminated surface. In addition, the embodiment includes performing steps (i)-(iii) as outlined above more than once to provide an ensemble of speckle patterns and an ensemble of two dimensional digital images, wherein the ensemble of speckle patterns contains at least two distinct speckle patterns. In accordance with an alternate embodiment of the invention, the method also has the step of modeling the illuminated surface to obtain a parameter set characterizing the illuminated surface, wherein the modeling is based upon the ensemble of two dimensional digital images.
In accordance with a further aspect of the present invention in one of its embodiments, there is provided an apparatus for rapid three dimensional image parametrization of a three dimensional surface. The apparatus has a speckle pattern generator for providing a speckle pattern upon the three dimensional surface;
a plurality of cameras for imaging the speckle pattern to provide a plurality of two dimensional digital images; and a processor in communication with the plurality of cameras for processing the plurality of two dimensional digital images to obtain a three dimensional digital characterization of the three dimensional surface. The processor may further provides a parameter set characterizing the three dimensional surface. The speckle pattern generator may have a source of optical radiation coupled through an optical fiber, as well as a speckle pattern shifter for varying the speckle pattern projected upon the three dimensional surface as a function of time. The speckle pattern shifter may be a mechanical strain inducer for applying strain to the optical C ber, and the mechanical strain inducer may be a piezoelectric element.
Yet another embodiment of the present invention is an apparatus for rapid three dimensional image parametrization of a three dimensional surface, where the apparatus comprises a speckle pattern generator for providing a speckle pattern upon the three dimensional surface; a plurality of cameras for imaging the speckle pattern to provide a plurality of two dimensional digital images; a memory in communication with the plurality of cameras for storing the plurality of two dimensional digital images; and a processor in communication with the memory for processing the plurality of two dimensional digital images to obtain a three dimensional digital characterization of the three dimensional surface.
Background of the Invention Speckle techniques, both photographic and interferometric, are known to produce images of surfaces containing a rich set of spatial frequencies thereby providing spatial information on a wide range of spatial scales.A survey of speckle techniques is provided in Jones, Robert, Holographic and speckle interferometry: a discaession of the theory, practice, and application of the techniques, 2nd ed., Cambridge University Press (1989), which is herein incorporated by reference.
Summary of the Invention A preferred embodiment of the present invention provides a method for measuring and modeling a three dimensional surface. This method has the steps of: (i) illuminating the three dimensional surface with a speckle pattern; (ii) imaging the speckle pattern to obtain a plurality of two dimensional digital images; and (iii) processing the plurality of two dimensional digital images to obtain a three dimensional digital characterization of the illuminated three dimensional surface. A further embodiment includes the step of modeling the illuminated surface, based upon the plurality of two dimensional digital images, to obtain a parameter set characterizing the illuminated surface. In addition, the embodiment includes performing steps (i)-(iii) as outlined above more than once to provide an ensemble of speckle patterns and an ensemble of two dimensional digital images, wherein the ensemble of speckle patterns contains at least two distinct speckle patterns. In accordance with an alternate embodiment of the invention, the method also has the step of modeling the illuminated surface to obtain a parameter set characterizing the illuminated surface, wherein the modeling is based upon the ensemble of two dimensional digital images.
In accordance with a further aspect of the present invention in one of its embodiments, there is provided an apparatus for rapid three dimensional image parametrization of a three dimensional surface. The apparatus has a speckle pattern generator for providing a speckle pattern upon the three dimensional surface;
a plurality of cameras for imaging the speckle pattern to provide a plurality of two dimensional digital images; and a processor in communication with the plurality of cameras for processing the plurality of two dimensional digital images to obtain a three dimensional digital characterization of the three dimensional surface. The processor may further provides a parameter set characterizing the three dimensional surface. The speckle pattern generator may have a source of optical radiation coupled through an optical fiber, as well as a speckle pattern shifter for varying the speckle pattern projected upon the three dimensional surface as a function of time. The speckle pattern shifter may be a mechanical strain inducer for applying strain to the optical C ber, and the mechanical strain inducer may be a piezoelectric element.
Yet another embodiment of the present invention is an apparatus for rapid three dimensional image parametrization of a three dimensional surface, where the apparatus comprises a speckle pattern generator for providing a speckle pattern upon the three dimensional surface; a plurality of cameras for imaging the speckle pattern to provide a plurality of two dimensional digital images; a memory in communication with the plurality of cameras for storing the plurality of two dimensional digital images; and a processor in communication with the memory for processing the plurality of two dimensional digital images to obtain a three dimensional digital characterization of the three dimensional surface.
Brief Description of the Drawing Fig. 1 illustrates a flow diagram for a preferred embodiment of the invention.
Detailed Description of Specific Embodiments An embodiment of a method for measuring and modeling a three dimensional surface of an object is illustrated in Fig. 1. An object 10 is illuminated by a laser speckle generator 20. The techniques of the present invention are broadly applicable to various optical inspection modalities known in the art, and the application of these techniques to any of such modalities is considered within the scope of the invention and of the appended claims.
In a preferred embodiment, laser speckle generator 20 is a laser coupled to one end of an optical fiber, using optical coupling techniques known to persons of ordinary skill in the art. The end of the optical fiber distal to the laser is used to illuminate the object. The laser speckle generator projects a speckle pattern upon object 1 (1. A speckle pattern is a I S pattern of illumination in which the intensity profile of the illumination appears as a realization of a random illumination pattern. A laser coupled to an inexpensive, low quality optical fiber may provide a speckle pattern, and it is this combination which serves as a speckle generator in a preferred embodiment. The speckle may be diffraction limited thereby providing a random pattern including the highest spatial frequencies attainable.
Furthermore, in a preferred embodiment a mechanical strain may be applied to the optical fiber so that an entire ensemble of uncorrelated speckle patterns can be generated by changing the mechanical strain. This can be accomplished by wrapping the optical fiber around a piezoelectric material, so that a voltage applied to the piezoelectric material causes it to apply a mechanical stress to the optical fiber. In a preferred embodiment, object 10 is illuminated with an ensemble of laser speckle patterns, as indicated in Fig. 1 by the index n = 1,2, 3, . . ..
A plurality of cameras 30 is used to image the speckle patterns illuminated on object 10. In a preferred embodiment, cameras 30 provide digital images. Due to parallax, the images obtained from cameras 30 will be different from each other. From the differences in the digital images obtained from cameras 30, and from knowledge of the relative positions of the cameras to each other, three dimensional coordinates describing the three dimensional surface of object 10 may be obtained for each speckle illumination. Use is made of the random nature of the speckle illumination pattern in determining the differences in the digital images due to parallax. If the speckle pattern is sufficiently random, then small portions of the speckle pattern will be sufficiently different from other small portions of the speckle pattern, and determining the relative shifts of the digital images will be facilitated by making comparisons among these uniquely identifiable small portions.
Parameters of a model may be chosen to fit the digital images obtained from cameras 30 according to a model parameter fitting algorithm, as indicated in step 40 of Fig. 1. Finite element modeling of a surface is the subject of P. Charette et al., "Large deformation mechanical testing of biological membranes using speckle interferometry in transmission. II. Finite element modeling," Applied Optics, vol. 36( 10), pp.
(1997), which is incorporated herein by reference. The parameters may be obtained by a least squares fit using the finite element method in which the basis functions are cubic-Hermite functions. The parameters obtained from model parameter fitting step 40 are used in 50 to obtain a model of the three dimensional surface of object 10. These parameters may be used to display the three dimensional surface of object 10, or they may be used to fabricate or synthesize new three dimensional surfaces which characterize the three dimensional surface of object 10.
As indicated by flow control lines 60 and 70, the illumination and imaging process may be repeated a number of times with or without changing the speckle pattern. For example, the surface of object 10 may be changing as a function of time, in which case the process must be repeated to obtain parameter sets indexed by time. This is indicated by temporal bandwidth control line 60. There is also the spatial frequency aspects of the three dimensional surface which must be properly captured. This is indicated by the spatial bandwidth control line 70, in which object 10 is repeatedly illuminated with different speckle patterns generated by laser speckle generator 20 for each illumination step. By using different speckle patterns which are statistically uncorrelated from each other, it is possible to capture features of the surface of object 10 that might otherwise be missed if the same speckle pattern was used throughout the measurement and modeling process.
Statistical averaging may be employed over the ensemble of digital images obtained by illuminating object 10 with different speckle patterns, so that a single parameter set is obtained in which the spatial features of the surface of object 10 are properly captured.
Numerous modifications may be made to the embodiments described above without departing from the spirit and scope of the invention.
Detailed Description of Specific Embodiments An embodiment of a method for measuring and modeling a three dimensional surface of an object is illustrated in Fig. 1. An object 10 is illuminated by a laser speckle generator 20. The techniques of the present invention are broadly applicable to various optical inspection modalities known in the art, and the application of these techniques to any of such modalities is considered within the scope of the invention and of the appended claims.
In a preferred embodiment, laser speckle generator 20 is a laser coupled to one end of an optical fiber, using optical coupling techniques known to persons of ordinary skill in the art. The end of the optical fiber distal to the laser is used to illuminate the object. The laser speckle generator projects a speckle pattern upon object 1 (1. A speckle pattern is a I S pattern of illumination in which the intensity profile of the illumination appears as a realization of a random illumination pattern. A laser coupled to an inexpensive, low quality optical fiber may provide a speckle pattern, and it is this combination which serves as a speckle generator in a preferred embodiment. The speckle may be diffraction limited thereby providing a random pattern including the highest spatial frequencies attainable.
Furthermore, in a preferred embodiment a mechanical strain may be applied to the optical fiber so that an entire ensemble of uncorrelated speckle patterns can be generated by changing the mechanical strain. This can be accomplished by wrapping the optical fiber around a piezoelectric material, so that a voltage applied to the piezoelectric material causes it to apply a mechanical stress to the optical fiber. In a preferred embodiment, object 10 is illuminated with an ensemble of laser speckle patterns, as indicated in Fig. 1 by the index n = 1,2, 3, . . ..
A plurality of cameras 30 is used to image the speckle patterns illuminated on object 10. In a preferred embodiment, cameras 30 provide digital images. Due to parallax, the images obtained from cameras 30 will be different from each other. From the differences in the digital images obtained from cameras 30, and from knowledge of the relative positions of the cameras to each other, three dimensional coordinates describing the three dimensional surface of object 10 may be obtained for each speckle illumination. Use is made of the random nature of the speckle illumination pattern in determining the differences in the digital images due to parallax. If the speckle pattern is sufficiently random, then small portions of the speckle pattern will be sufficiently different from other small portions of the speckle pattern, and determining the relative shifts of the digital images will be facilitated by making comparisons among these uniquely identifiable small portions.
Parameters of a model may be chosen to fit the digital images obtained from cameras 30 according to a model parameter fitting algorithm, as indicated in step 40 of Fig. 1. Finite element modeling of a surface is the subject of P. Charette et al., "Large deformation mechanical testing of biological membranes using speckle interferometry in transmission. II. Finite element modeling," Applied Optics, vol. 36( 10), pp.
(1997), which is incorporated herein by reference. The parameters may be obtained by a least squares fit using the finite element method in which the basis functions are cubic-Hermite functions. The parameters obtained from model parameter fitting step 40 are used in 50 to obtain a model of the three dimensional surface of object 10. These parameters may be used to display the three dimensional surface of object 10, or they may be used to fabricate or synthesize new three dimensional surfaces which characterize the three dimensional surface of object 10.
As indicated by flow control lines 60 and 70, the illumination and imaging process may be repeated a number of times with or without changing the speckle pattern. For example, the surface of object 10 may be changing as a function of time, in which case the process must be repeated to obtain parameter sets indexed by time. This is indicated by temporal bandwidth control line 60. There is also the spatial frequency aspects of the three dimensional surface which must be properly captured. This is indicated by the spatial bandwidth control line 70, in which object 10 is repeatedly illuminated with different speckle patterns generated by laser speckle generator 20 for each illumination step. By using different speckle patterns which are statistically uncorrelated from each other, it is possible to capture features of the surface of object 10 that might otherwise be missed if the same speckle pattern was used throughout the measurement and modeling process.
Statistical averaging may be employed over the ensemble of digital images obtained by illuminating object 10 with different speckle patterns, so that a single parameter set is obtained in which the spatial features of the surface of object 10 are properly captured.
Numerous modifications may be made to the embodiments described above without departing from the spirit and scope of the invention.
Claims (12)
1. A method for measuring and modeling a three dimensional surface, the method comprising:
a. illuminating the three dimensional surface with a speckle pattern;
b. imaging the speckle pattern to obtain a plurality of two dimensional digital images;
c. processing the plurality of two dimensional digital images to obtain a three dimensional characterization of the illuminated three dimensional surface.
a. illuminating the three dimensional surface with a speckle pattern;
b. imaging the speckle pattern to obtain a plurality of two dimensional digital images;
c. processing the plurality of two dimensional digital images to obtain a three dimensional characterization of the illuminated three dimensional surface.
2. The method as set forth in claim 1, further comprising:
d. modeling the illuminated surface, based upon the plurality of two dimensional digital images, to obtain a parameter set characterizing the illuminated surface.
d. modeling the illuminated surface, based upon the plurality of two dimensional digital images, to obtain a parameter set characterizing the illuminated surface.
3. The method as set forth in claim 1, further comprising:
performing steps (a)-(c) more than once to provide an ensemble of speckle patterns and an ensemble of two dimensional digital images, wherein the ensemble of speckle patterns contains at least two distinct speckle patterns.
performing steps (a)-(c) more than once to provide an ensemble of speckle patterns and an ensemble of two dimensional digital images, wherein the ensemble of speckle patterns contains at least two distinct speckle patterns.
4. The method as set forth in claim 3, further comprising:
modeling the illuminated surface to obtain a parameter set characterizing the illuminated surface, wherein the modeling is based upon the ensemble of two dimensional digital images.
modeling the illuminated surface to obtain a parameter set characterizing the illuminated surface, wherein the modeling is based upon the ensemble of two dimensional digital images.
5. An apparatus for rapid three dimensional image parametrization of a three dimensional surface, the apparatus comprising:
a speckle pattern generator for providing a speckle pattern upon the three dimensional surface;
a plurality of cameras for imaging the speckle pattern to provide a plurality of two dimensional digital images; and a processor in communication with the plurality of cameras for processing the plurality of two dimensional digital images to obtain a three dimensional digital characterization of the three dimensional surface.
a speckle pattern generator for providing a speckle pattern upon the three dimensional surface;
a plurality of cameras for imaging the speckle pattern to provide a plurality of two dimensional digital images; and a processor in communication with the plurality of cameras for processing the plurality of two dimensional digital images to obtain a three dimensional digital characterization of the three dimensional surface.
6. The apparatus as set forth in claim 5, wherein the speckle pattern generator comprises a source of optical radiation coupled through an optical fiber.
7. The apparatus as set forth in claim 5, further comprising a speckle pattern shifter for varying the speckle pattern projected upon the three dimensional surface as a function of time.
8. The apparatus as set forth in claim 6, further comprising a speckle pattern shifter for varying the speckle pattern projected upon the three dimensional surface as a function of time.
9. The apparatus as set forth in claim 8, wherein the speckle pattern shifter is a mechanical strain inducer for applying strain to the optical fiber.
10. The apparatus as set forth in claim 9, wherein the mechanical strain inducer is a piezoelectric element.
11. The apparatus as set forth in claim 5, wherein the processor further provides a parameter set characterizing the three dimensional surface.
12. An apparatus for rapid three dimensional image parametrization of a three dimensional surface, the apparatus comprising:
a. a speckle pattern generator for providing a speckle pattern upon the three dimensional surface;
b. a plurality of cameras for imaging the speckle pattern to provide a plurality of two dimensional digital images;
c. a memory in communication with the plurality of cameras for storing the plurality of two dimensional digital images; and d. a processor in communication with the memory for processing the plurality of two dimensional digital images to obtain a three dimensional digital characterization of the three dimensional surface.
a. a speckle pattern generator for providing a speckle pattern upon the three dimensional surface;
b. a plurality of cameras for imaging the speckle pattern to provide a plurality of two dimensional digital images;
c. a memory in communication with the plurality of cameras for storing the plurality of two dimensional digital images; and d. a processor in communication with the memory for processing the plurality of two dimensional digital images to obtain a three dimensional digital characterization of the three dimensional surface.
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US3389396P | 1996-12-20 | 1996-12-20 | |
| US60/033,893 | 1996-12-20 | ||
| PCT/US1997/023626 WO1998028593A1 (en) | 1996-12-20 | 1997-12-19 | Apparatus and method for rapid 3d image parametrization |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA2275411A1 true CA2275411A1 (en) | 1998-07-02 |
Family
ID=21873072
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA002275411A Abandoned CA2275411A1 (en) | 1996-12-20 | 1997-12-19 | Apparatus and method for rapid 3d image parametrization |
Country Status (4)
| Country | Link |
|---|---|
| EP (1) | EP0946856A1 (en) |
| JP (1) | JP2001507133A (en) |
| CA (1) | CA2275411A1 (en) |
| WO (1) | WO1998028593A1 (en) |
Families Citing this family (26)
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| US8390821B2 (en) | 2005-10-11 | 2013-03-05 | Primesense Ltd. | Three-dimensional sensing using speckle patterns |
| US9330324B2 (en) | 2005-10-11 | 2016-05-03 | Apple Inc. | Error compensation in three-dimensional mapping |
| CN101288105B (en) | 2005-10-11 | 2016-05-25 | 苹果公司 | For the method and system of object reconstruction |
| JP4917615B2 (en) * | 2006-02-27 | 2012-04-18 | プライム センス リミティド | Range mapping using uncorrelated speckle |
| WO2007105215A2 (en) * | 2006-03-14 | 2007-09-20 | Prime Sense Ltd. | Depth-varying light fields for three dimensional sensing |
| CN101957994B (en) | 2006-03-14 | 2014-03-19 | 普莱姆传感有限公司 | Depth-varying light fields for three dimensional sensing |
| US8350847B2 (en) | 2007-01-21 | 2013-01-08 | Primesense Ltd | Depth mapping using multi-beam illumination |
| US8150142B2 (en) | 2007-04-02 | 2012-04-03 | Prime Sense Ltd. | Depth mapping using projected patterns |
| TWI433052B (en) | 2007-04-02 | 2014-04-01 | Primesense Ltd | Depth mapping using projected patterns |
| WO2008155770A2 (en) | 2007-06-19 | 2008-12-24 | Prime Sense Ltd. | Distance-varying illumination and imaging techniques for depth mapping |
| US8456517B2 (en) | 2008-07-09 | 2013-06-04 | Primesense Ltd. | Integrated processor for 3D mapping |
| US8462207B2 (en) | 2009-02-12 | 2013-06-11 | Primesense Ltd. | Depth ranging with Moiré patterns |
| US8786682B2 (en) | 2009-03-05 | 2014-07-22 | Primesense Ltd. | Reference image techniques for three-dimensional sensing |
| US8717417B2 (en) | 2009-04-16 | 2014-05-06 | Primesense Ltd. | Three-dimensional mapping and imaging |
| US9582889B2 (en) | 2009-07-30 | 2017-02-28 | Apple Inc. | Depth mapping based on pattern matching and stereoscopic information |
| US8830227B2 (en) | 2009-12-06 | 2014-09-09 | Primesense Ltd. | Depth-based gain control |
| US8982182B2 (en) | 2010-03-01 | 2015-03-17 | Apple Inc. | Non-uniform spatial resource allocation for depth mapping |
| JP2012002780A (en) * | 2010-06-21 | 2012-01-05 | Shinko Electric Ind Co Ltd | Shape measurement instrument, shape measurement method, and semiconductor package manufacturing method |
| US9098931B2 (en) | 2010-08-11 | 2015-08-04 | Apple Inc. | Scanning projectors and image capture modules for 3D mapping |
| EP2643659B1 (en) | 2010-11-19 | 2019-12-25 | Apple Inc. | Depth mapping using time-coded illumination |
| US9131136B2 (en) | 2010-12-06 | 2015-09-08 | Apple Inc. | Lens arrays for pattern projection and imaging |
| US9030528B2 (en) | 2011-04-04 | 2015-05-12 | Apple Inc. | Multi-zone imaging sensor and lens array |
| US9157790B2 (en) | 2012-02-15 | 2015-10-13 | Apple Inc. | Integrated optoelectronic modules with transmitter, receiver and beam-combining optics for aligning a beam axis with a collection axis |
| KR102159996B1 (en) * | 2013-12-16 | 2020-09-25 | 삼성전자주식회사 | Event filtering device and motion recognition device thereof |
| US10547830B2 (en) | 2015-11-16 | 2020-01-28 | Samsung Electronics Co., Ltd | Apparatus for and method of illumination control for acquiring image information and depth information simultaneously |
| CN109635539B (en) * | 2018-10-30 | 2022-10-14 | 荣耀终端有限公司 | Face recognition method and electronic equipment |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4148587A (en) * | 1977-10-03 | 1979-04-10 | The Boeing Company | Laser gauge for measuring changes in the surface contour of a moving part |
| JPH0914914A (en) * | 1994-06-06 | 1997-01-17 | Kishimoto Sangyo Kk | Laser light projection method and apparatus therefor in device measuring for moving value by laser speckle pattern |
| US5627363A (en) * | 1995-02-16 | 1997-05-06 | Environmental Research Institute Of Michigan | System and method for three-dimensional imaging of opaque objects using frequency diversity and an opacity constraint |
-
1997
- 1997-12-19 CA CA002275411A patent/CA2275411A1/en not_active Abandoned
- 1997-12-19 EP EP97952572A patent/EP0946856A1/en not_active Withdrawn
- 1997-12-19 JP JP52900598A patent/JP2001507133A/en active Pending
- 1997-12-19 WO PCT/US1997/023626 patent/WO1998028593A1/en not_active Application Discontinuation
Also Published As
| Publication number | Publication date |
|---|---|
| JP2001507133A (en) | 2001-05-29 |
| EP0946856A1 (en) | 1999-10-06 |
| WO1998028593A1 (en) | 1998-07-02 |
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