CA2113295A1 - Lens markings viewer - Google Patents

Lens markings viewer

Info

Publication number
CA2113295A1
CA2113295A1 CA 2113295 CA2113295A CA2113295A1 CA 2113295 A1 CA2113295 A1 CA 2113295A1 CA 2113295 CA2113295 CA 2113295 CA 2113295 A CA2113295 A CA 2113295A CA 2113295 A1 CA2113295 A1 CA 2113295A1
Authority
CA
Canada
Prior art keywords
markings
light
lenses
ophtalmic
surface imperfections
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA 2113295
Other languages
French (fr)
Inventor
Roger Dore
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to CA 2113295 priority Critical patent/CA2113295A1/en
Priority to EP95905006A priority patent/EP0688425A1/en
Priority to PCT/CA1995/000008 priority patent/WO1995019558A1/en
Priority to AU13796/95A priority patent/AU1379695A/en
Publication of CA2113295A1 publication Critical patent/CA2113295A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0207Details of measuring devices

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Eye Examination Apparatus (AREA)

Abstract

In the process for producing ophtalmic progressive lenses, it is common practice to inspect lenses using a lamp and the effects of ambiant light refraction to detect surface imperfections as well as for retreiving manufacturers markings. Such markings containing key process information are mandatory for further finishing and cutting processes of the ophtalmic progressive lenses. In this invention, light is generated by a coherent light source at a given wavelenght that may range between 620 and 670 nanometer and collimated prior to being difused over the surface of the lens under inspection. The lens under inspection may be moved at an angle .beta. in the path of the difused light to enhance light refraction occuring onto the markings and other surface imperfections. The light is thus refracted to a projection surface for viewing by the human eye (operator) to clearly examine the markings as well as the surface imperfections before and after coatings and other treatments. In this invention, the optical aparatus is contained into an instrument which encompasses all of the necessary mechanism to enable the examination of most types of ophtalmic lenses.The angle .beta. may be modified by the operator to adapt to different lenses curvature.
This is achieved by manipulation of a controller arm until optimum viewing is achieved.
The light source intensity as well as focus may be adjusted during the process of examining lenses.

Description

SPECIFICATION
-This invention relates to an instnument containing an optical aparatus and mechanisms for inspecting ophtalmic progressive lenses for the viewing of markings and imperfections.

It is common in processes for inspecting lenses or for retreiving markings on ophtalmic lenses to use such optical aparatus as lamps or ambiant light to create superficial refraction in order to view engraved markings on progressive lenses or to inspect surface quality of semi-finished or finished ophtalmic lenses using same. Such methods are, however, inefficient because of the lens manipulations that the method require as well as improper retreival of markings often due to insuffi~ient lighting and incorrect refraction angles. Manually applied processes cause instability and operator fatigue which are also causes of human error as well as potential permanent degradation of the operators vision if such individual is assign this duty for long periods of time.

I have found that these disadvantages may be overcome by providing an integratedinstrument incorporating sufficient lighting, reflection angle selection capability and magnified projection capability. Such an aparatus reduces manipulation to the simple placing of the lenses onto the examination surface area. Controls provided for the adjustements of light intensity and selection of refraction angle provide for accuracy and greater stability while examining the lenses. The magnified projection of refracted light offers reduced human eye fatigue and provide better efficiency of the process.

In the drawings which illustrate embodiments of the invention, Figure 1 is a side view of the optical assemblies and Figure 2 is a front view of the instrument with all controls.

The instrument illustrated comprises a coherent light source 1 which is mounted into an optical body 2 toward a collimator 3 and emits light of intensity one to fourmiliwatts and wavelenght 620 to 670 nanometer when activated by the power supply4. An HeNe lamp may be used as a coherent light source as shown in figure 1 but a laser diode emiting within the same wavelenght may be used if desired. Light emitted through the collimator 3 is directed onto a difuser 5 which provides for a three inch diameter illumination of the examination surface area 6. The examination surface area 6 is mounted onto a controlable inclination plateform 7 which may be inclined in both X and Y axis within a range of + and - 30 degrees using the control lever 8 to provide for the refraction angle 13. The difused light refracted onto the examination surface area 6 is then projected onto a projection area 9. The imperfections and markings which refract light at different angles are seen on the projection area 9 as darker patterns that are very clearly visible. The coherent light source 1 intensity may be adjusted using the intensity control 10 to overcome the effect of ambiant light. Focus ~ 2113295 adjustment 18 may be used to accentuate the sharpness of the projected markings as well as surface imperfections.

The adjustment of the refraction angle B is achieved by control motors 11 located to provide inclination in both X and Y axis through a gear mechanism 12. The degree of inclination and its direction within the span of + and - 30 degrees in both axis is obtained by the activation of the control lever 8 in the direction and axis desired. The operation of the control lever 8 is similar to that of a joystick and is directly inputed to the electronic circuit 13. The electronic circuit 13 is used to provide the control motors 12 with the required voltage as inputed by means of the control lever.

An additional function of the electronic circuit 13 is to control the intensity of the coherent light source 1 by supplying the necessary voltage as selected by the operator using the intensity switch 14. Selection of light intensity level as displayed on level meter 16 is achieved by pressing the light intensity swicth 14. Each time the light intensity switch 14 is pressed, the light source 1 intensity will increment by a factor of 1 on a scale of 0 to 9. The electronic circuit 13 will output to the coherent light source 1 a corresponding power value. The power supply 4 contains a voltage transformer which reduces standard 110 AC voltage required to supply the instrument to 5 volts DC
required by the electronic circuit 13. Power may be interupted using switch 17.
The electronic circuit 13 contains a self test routine that is initiated on power up of the instrument. The condition of the instrument upon self test is shown on the front panel using " fault and function " LEDs (light emiting diode).

As will be appreciated, an instrument as illustrated by figure 1 and 2 and as described in the specification above has numerous applications throughout the industry of optics for the purpose of inspecting and/or examining lenses at various stages of the making.
Exemples of such applications are for inspection of surface quality after treatments and coatings, inspection of semi-finished and finished lenses used for telescopes, binoculars and other similar products.

Those skilled in the art will recognise that the embodiments disclosed herein are unique in nature and that various changes can be made therein without departing from the scope and sperit of the invention. In this regard, and as was previously mentioned, the invention is readily embodied with various light source configurations which will provide similar results. Other mecanisms may be applied for producing the necessary refraction angle and magnification all aiming at the same principle described herein.

Claims (7)

1. An instrument for the examination of markings used in the fabrication of ophtalmic lenses comprising: an optical apparatus for generating said refraction of light to produce said projection of markings.
2. The instrument of claim 1, wherein said optical apparatus is used for generating said refraction of light to produce said projection of surface imperfections of ophtalmic lenses.
3. An optical apparatus for generating said refraction of light for examining ophtalmic lenses comprising: a light source, a collimator and a diffuser for examining said markings and said surface imperfections.
4. The instrument of claim 1, wherein said optical apparatus for generating saidrefraction of light comprises: a two axis controllable inclination plateform to create said refraction angle .beta..
5. A method of detecting ophtalmic lens markings and surface imperfections comprising: an optical apparatus for generating said refraction of light to produce said projection onto the said projection area.
6. The instrument of claim 1, wherein said optical apparatus comprises: a light source and adjustment of same used to enhance said examination of markings and said surface imperfections.
7. The instrument of claim 1, wherein said optical apparatus comprises: a focus adjustment used to enhance said examination of markings and said surface imperfections.
CA 2113295 1994-01-12 1994-01-12 Lens markings viewer Abandoned CA2113295A1 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
CA 2113295 CA2113295A1 (en) 1994-01-12 1994-01-12 Lens markings viewer
EP95905006A EP0688425A1 (en) 1994-01-12 1995-01-11 Lens markings viewer
PCT/CA1995/000008 WO1995019558A1 (en) 1994-01-12 1995-01-11 Lens markings viewer
AU13796/95A AU1379695A (en) 1994-01-12 1995-01-11 Lens markings viewer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CA 2113295 CA2113295A1 (en) 1994-01-12 1994-01-12 Lens markings viewer

Publications (1)

Publication Number Publication Date
CA2113295A1 true CA2113295A1 (en) 1995-07-13

Family

ID=4152726

Family Applications (1)

Application Number Title Priority Date Filing Date
CA 2113295 Abandoned CA2113295A1 (en) 1994-01-12 1994-01-12 Lens markings viewer

Country Status (4)

Country Link
EP (1) EP0688425A1 (en)
AU (1) AU1379695A (en)
CA (1) CA2113295A1 (en)
WO (1) WO1995019558A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106124171A (en) * 2016-06-16 2016-11-16 中国科学院上海光学精密机械研究所 Three-dimensional platform for the detection of optical elements of large caliber optical property

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2984500B1 (en) 2011-12-15 2014-01-10 Essilor Int SYSTEM AND METHOD FOR OPTICALLY READING PRINTED MARKS ON A FACE OF AN OPHTHALMIC LENS
CN104006949A (en) * 2013-02-26 2014-08-27 北京京东方光电科技有限公司 Transmittance detection device
TWI742687B (en) * 2020-05-22 2021-10-11 大立光電股份有限公司 Plastic lens element and imaging lens assembly

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2267961A (en) * 1938-10-22 1941-12-30 American Optical Corp Means of testing lenses
JPS5687836A (en) * 1979-12-19 1981-07-16 Tokyo Optical Co Ltd Projection type lens meter
JPS6029634A (en) * 1983-07-27 1985-02-15 Nippon Kogaku Kk <Nikon> Optical characteristic measuring device
DE3620129A1 (en) * 1986-06-14 1987-12-17 Zeiss Carl Fa DEVICE FOR TESTING TRANSPARENT MATERIAL COMPONENTS FOR SURFACE DEFECTS AND INCLUDES
DE4003699A1 (en) * 1990-02-07 1991-08-22 Wild Heerbrugg Ag METHOD AND ARRANGEMENT FOR TESTING OPTICAL COMPONENTS OR SYSTEMS
US5100232A (en) * 1990-11-05 1992-03-31 American Optical Corporation Apparatus and method for detecting hidden marks on progressive aspheric ophthalmic lenses

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106124171A (en) * 2016-06-16 2016-11-16 中国科学院上海光学精密机械研究所 Three-dimensional platform for the detection of optical elements of large caliber optical property
CN106124171B (en) * 2016-06-16 2018-05-08 中国科学院上海光学精密机械研究所 Three-dimensional platform for the detection of optical elements of large caliber optical property

Also Published As

Publication number Publication date
AU1379695A (en) 1995-08-01
EP0688425A1 (en) 1995-12-27
WO1995019558A1 (en) 1995-07-20

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Legal Events

Date Code Title Description
EEER Examination request
FZDE Dead