CA2098852A1 - Structural examination using holographic interferometry - Google Patents

Structural examination using holographic interferometry

Info

Publication number
CA2098852A1
CA2098852A1 CA002098852A CA2098852A CA2098852A1 CA 2098852 A1 CA2098852 A1 CA 2098852A1 CA 002098852 A CA002098852 A CA 002098852A CA 2098852 A CA2098852 A CA 2098852A CA 2098852 A1 CA2098852 A1 CA 2098852A1
Authority
CA
Canada
Prior art keywords
region
film
join
photographic
plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
CA002098852A
Other languages
English (en)
French (fr)
Inventor
John Patrick Baird
Robert Keith Clark
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Unisearch Ltd
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of CA2098852A1 publication Critical patent/CA2098852A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
    • G01B11/164—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by holographic interferometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/021—Interferometers using holographic techniques

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Holo Graphy (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
CA002098852A 1990-12-20 1991-12-20 Structural examination using holographic interferometry Abandoned CA2098852A1 (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
AUPK403490 1990-12-20
AUPK4034 1990-12-20
AUPK777991 1991-08-16
AUPK7779 1991-08-16

Publications (1)

Publication Number Publication Date
CA2098852A1 true CA2098852A1 (en) 1992-06-21

Family

ID=25643992

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002098852A Abandoned CA2098852A1 (en) 1990-12-20 1991-12-20 Structural examination using holographic interferometry

Country Status (7)

Country Link
US (1) US5519486A (OSRAM)
EP (1) EP0563196A1 (OSRAM)
JP (1) JPH06504121A (OSRAM)
KR (1) KR930703585A (OSRAM)
AU (1) AU646124B2 (OSRAM)
CA (1) CA2098852A1 (OSRAM)
WO (1) WO1992011506A1 (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN119164315A (zh) * 2024-11-25 2024-12-20 成都思越智能装备股份有限公司 一种板状产品载具变形检测装置及检测方法

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US6101884A (en) * 1997-04-10 2000-08-15 Mcdonnell Douglas Corporation Fastener equipped with an untethered fiber-optic strain gauge and related method of using the same
GB2326470B (en) * 1997-06-10 1999-06-09 British Aerospace Improvements in structural deflection measurement
US6094260A (en) * 1998-08-12 2000-07-25 General Electric Company Holographic interferometry for monitoring and controlling laser shock peening
US5948293A (en) * 1998-12-03 1999-09-07 General Electric Company Laser shock peening quality assurance by volumetric analysis of laser shock peened dimple
JP3709430B2 (ja) * 2000-02-02 2005-10-26 独立行政法人産業技術総合研究所 応力発光材料を用いた応力または応力分布の測定方法
US6580053B1 (en) * 2000-08-31 2003-06-17 Sharp Laboratories Of America, Inc. Apparatus to control the amount of oxygen incorporated into polycrystalline silicon film during excimer laser processing of silicon films
US20050092111A1 (en) * 2003-11-04 2005-05-05 Schmaling David N. Non-destructive diagnostic apparatus for identifying defect type in core composite structures
JP4568883B2 (ja) * 2006-01-20 2010-10-27 独立行政法人産業技術総合研究所 応力・歪みの解析方法及び装置
EP2018546A1 (en) * 2006-05-10 2009-01-28 National Research Council of Canada Method of assessing bond integrity in bonded structures
US7765853B2 (en) 2007-06-04 2010-08-03 The Boeing Company Determining seal feature integrity by testing for deformation upon air pressure excitation
US8928316B2 (en) * 2010-11-16 2015-01-06 Jentek Sensors, Inc. Method and apparatus for non-destructive evaluation of materials
US9488620B2 (en) 2011-03-15 2016-11-08 Purdue Research Foundation Weak bond detection
US10160163B2 (en) 2011-08-11 2018-12-25 The Boeing Company Heating system for composite rework of aircraft
US10137651B2 (en) 2011-08-11 2018-11-27 The Boeing Company Heating system for composite rework of aircraft
CN102679923B (zh) * 2012-05-09 2014-05-07 南京航空航天大学 航空铝合金壁板铆接结构干涉量非破坏性检测方法
DE102014202598B4 (de) * 2014-02-13 2024-04-11 Bayerische Motoren Werke Aktiengesellschaft Verfahren zur qualitativen Analsyse von Verbindungen von Fügepartnern
US10328530B2 (en) * 2016-09-27 2019-06-25 The Boeing Company Flexible and local laser shroud

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3587301A (en) * 1968-12-19 1971-06-28 Atomic Energy Commission Holographic interferometer for isopachic stress analysis
US3860346A (en) * 1970-02-18 1975-01-14 Gco Method of compensating for gross object motion in real time holographic interferometry
US3822107A (en) * 1970-11-20 1974-07-02 Engel Kg L Improvements in or relating to an injection mold
US3828126A (en) * 1973-04-13 1974-08-06 American Express Invest Real time interferometry
US3911733A (en) * 1974-04-01 1975-10-14 Trw Inc Optical signature method and apparatus for structural integrity verification
US4139302A (en) * 1977-02-17 1979-02-13 Dr. Ralph M. Grant Engineering Consultants, Inc. Method and apparatus for interferometric deformation analysis
JPS54148082A (en) * 1978-05-12 1979-11-19 Asahi Chem Ind Co Ltd Shaped laminate and its production
US4302416A (en) * 1979-09-25 1981-11-24 Guy Rudolf Method and apparatus for molding polyurethane soles for footwear
US4464052A (en) * 1981-05-04 1984-08-07 Neumann Don B Differential holographic interferometry
US5065331A (en) * 1981-05-18 1991-11-12 Vachon Reginald I Apparatus and method for determining the stress and strain in pipes, pressure vessels, structural members and other deformable bodies
US4425039A (en) * 1982-05-07 1984-01-10 Industrial Holographics, Inc. Apparatus for the practice of double exposure interferometric non-destructive testing
JPH01192551A (ja) * 1988-01-29 1989-08-02 Agency Of Ind Science & Technol 多層複合射出成形品
US5257088A (en) * 1992-03-27 1993-10-26 Laser Technology, Inc. Apparatus and method for nondestructive inspection of a vehicle

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN119164315A (zh) * 2024-11-25 2024-12-20 成都思越智能装备股份有限公司 一种板状产品载具变形检测装置及检测方法
CN119164315B (zh) * 2024-11-25 2025-02-25 成都思越智能装备股份有限公司 一种板状产品载具变形检测装置及检测方法

Also Published As

Publication number Publication date
KR930703585A (ko) 1993-11-30
JPH06504121A (ja) 1994-05-12
EP0563196A1 (en) 1993-10-06
US5519486A (en) 1996-05-21
WO1992011506A1 (en) 1992-07-09
EP0563196A4 (OSRAM) 1994-04-13
AU9107291A (en) 1992-07-22
AU646124B2 (en) 1994-02-10

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Legal Events

Date Code Title Description
FZDE Discontinued