BRPI0906029A2 - "aparelho e método para detecção de estresse mecânico local em dispositivos integrados" - Google Patents

"aparelho e método para detecção de estresse mecânico local em dispositivos integrados"

Info

Publication number
BRPI0906029A2
BRPI0906029A2 BRPI0906029-4A BRPI0906029A BRPI0906029A2 BR PI0906029 A2 BRPI0906029 A2 BR PI0906029A2 BR PI0906029 A BRPI0906029 A BR PI0906029A BR PI0906029 A2 BRPI0906029 A2 BR PI0906029A2
Authority
BR
Brazil
Prior art keywords
mechanical stress
integrated devices
local mechanical
detecting local
detecting
Prior art date
Application number
BRPI0906029-4A
Other languages
English (en)
Inventor
Lloyd Bumm
Daminda Dahayanaka
Philip A Kaszuba
Leon Moszkowicz
James A Slinkman
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Publication of BRPI0906029A2 publication Critical patent/BRPI0906029A2/pt
Publication of BRPI0906029B1 publication Critical patent/BRPI0906029B1/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/32—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring the deformation in a solid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/30—Scanning potential microscopy

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Force Measurement Appropriate To Specific Purposes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
BRPI0906029-4A 2008-02-29 2009-02-18 Aparelho e método para detecção de estresse mecânico local em dispositivos integrados BRPI0906029B1 (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/039,830 2008-02-29
US12/039,830 US7944550B2 (en) 2008-02-29 2008-02-29 System and method for detecting local mechanical stress in integreated devices
PCT/US2009/034350 WO2009111163A2 (en) 2008-02-29 2009-02-18 System and method for detecting local mechanical stress in integrated devices

Publications (2)

Publication Number Publication Date
BRPI0906029A2 true BRPI0906029A2 (pt) 2015-06-30
BRPI0906029B1 BRPI0906029B1 (pt) 2019-04-24

Family

ID=41012937

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0906029-4A BRPI0906029B1 (pt) 2008-02-29 2009-02-18 Aparelho e método para detecção de estresse mecânico local em dispositivos integrados

Country Status (5)

Country Link
US (1) US7944550B2 (pt)
BR (1) BRPI0906029B1 (pt)
RU (1) RU2466381C2 (pt)
TW (1) TWI447347B (pt)
WO (1) WO2009111163A2 (pt)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104296656B (zh) * 2014-09-30 2017-04-12 苏州天准科技股份有限公司 一种被测物的测量基准面定位设备与装置及其方法
WO2018209099A1 (en) * 2017-05-10 2018-11-15 Cornell University Atomic force microscopy apparatus, methods, and applications
RU2679760C1 (ru) * 2017-10-06 2019-02-12 Федеральное государственное автономное образовательное учреждение высшего образования "Национальный исследовательский университет "Московский институт электронной техники" Способ и устройство для определения локального механического напряжения в пленке на подложке
US11175307B1 (en) 2020-08-28 2021-11-16 Globalfoundries U.S. Inc. Conductive atomic force microscopy system with enhanced sensitivity and methods of using such a system
CN117169246A (zh) * 2023-09-01 2023-12-05 深圳市索亿电子有限公司 一种pcba电路板的故障检测方法及装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5065103A (en) * 1990-03-27 1991-11-12 International Business Machines Corporation Scanning capacitance - voltage microscopy
US6175416B1 (en) * 1996-08-06 2001-01-16 Brown University Research Foundation Optical stress generator and detector
US6538462B1 (en) * 1999-11-30 2003-03-25 Semiconductor Diagnostics, Inc. Method for measuring stress induced leakage current and gate dielectric integrity using corona discharge
US7084661B2 (en) * 2000-05-24 2006-08-01 Sensorchem International Corporation Scanning kelvin microprobe system and process for analyzing a surface
TWI221922B (en) * 2001-02-19 2004-10-11 Nihon Densan Read Kabushiki Ka A circuit board testing apparatus and method for testing a circuit board
US7107158B2 (en) * 2003-02-03 2006-09-12 Qcept Technologies, Inc. Inspection system and apparatus
US7202691B2 (en) * 2005-05-31 2007-04-10 Semiconductor Diagnostics, Inc. Non-contact method for acquiring charge-voltage data on miniature test areas of semiconductor product wafers
US7659734B2 (en) * 2007-03-07 2010-02-09 Qcept Technologies, Inc. Semiconductor inspection system and apparatus utilizing a non-vibrating contact potential difference sensor and controlled illumination
US7900526B2 (en) * 2007-11-30 2011-03-08 Qcept Technologies, Inc. Defect classification utilizing data from a non-vibrating contact potential difference sensor

Also Published As

Publication number Publication date
TWI447347B (zh) 2014-08-01
WO2009111163A2 (en) 2009-09-11
WO2009111163A3 (en) 2010-01-21
US7944550B2 (en) 2011-05-17
US20090219508A1 (en) 2009-09-03
RU2466381C2 (ru) 2012-11-10
RU2010139750A (ru) 2012-04-10
BRPI0906029B1 (pt) 2019-04-24
TW200949194A (en) 2009-12-01

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Legal Events

Date Code Title Description
B07A Technical examination (opinion): publication of technical examination (opinion) [chapter 7.1 patent gazette]
B09A Decision: intention to grant [chapter 9.1 patent gazette]
B16A Patent or certificate of addition of invention granted

Free format text: PRAZO DE VALIDADE: 10 (DEZ) ANOS CONTADOS A PARTIR DE 24/04/2019, OBSERVADAS AS CONDICOES LEGAIS. (CO) 10 (DEZ) ANOS CONTADOS A PARTIR DE 24/04/2019, OBSERVADAS AS CONDICOES LEGAIS