BR7908579A - Dispositivo de teste de um elemento indicador inscrito em uma memoria - Google Patents

Dispositivo de teste de um elemento indicador inscrito em uma memoria

Info

Publication number
BR7908579A
BR7908579A BR7908579A BR7908579A BR7908579A BR 7908579 A BR7908579 A BR 7908579A BR 7908579 A BR7908579 A BR 7908579A BR 7908579 A BR7908579 A BR 7908579A BR 7908579 A BR7908579 A BR 7908579A
Authority
BR
Brazil
Prior art keywords
memory
test device
indicator element
element inscribed
inscribed
Prior art date
Application number
BR7908579A
Other languages
English (en)
Inventor
J Mollier
Original Assignee
Cii Honeywell Bull
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cii Honeywell Bull filed Critical Cii Honeywell Bull
Publication of BR7908579A publication Critical patent/BR7908579A/pt

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/22Safety or protection circuits preventing unauthorised or accidental access to memory cells
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0751Error or fault detection not based on redundancy
    • G06F11/0763Error or fault detection not based on redundancy by bit configuration check, e.g. of formats or tags
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/406Management or control of the refreshing or charge-regeneration cycles
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/4078Safety or protection circuits, e.g. for preventing inadvertent or unauthorised reading or writing; Status cells; Test cells

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Security & Cryptography (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Read Only Memory (AREA)
  • Storage Device Security (AREA)
BR7908579A 1978-12-27 1979-12-27 Dispositivo de teste de um elemento indicador inscrito em uma memoria BR7908579A (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR7836545A FR2445587A1 (fr) 1978-12-27 1978-12-27 Dispositif de test d'un caractere temoin inscrit dans une memoire

Publications (1)

Publication Number Publication Date
BR7908579A true BR7908579A (pt) 1980-07-08

Family

ID=9216599

Family Applications (1)

Application Number Title Priority Date Filing Date
BR7908579A BR7908579A (pt) 1978-12-27 1979-12-27 Dispositivo de teste de um elemento indicador inscrito em uma memoria

Country Status (5)

Country Link
EP (1) EP0016295A1 (pt)
JP (1) JPS5595154A (pt)
BR (1) BR7908579A (pt)
ES (1) ES487298A1 (pt)
FR (1) FR2445587A1 (pt)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2455320B1 (fr) * 1979-04-25 1986-01-24 Cii Honeywell Bull Dispositif de recyclage de supports d'enregistrement identifiables a l'aide de donnees d'identification et composes de memoires monolithiques non volatiles effacables
JPS5764397A (en) * 1980-10-03 1982-04-19 Olympus Optical Co Ltd Memory device
US4438512A (en) * 1981-09-08 1984-03-20 International Business Machines Corporation Method and apparatus for verifying storage apparatus addressing
DE3133304A1 (de) * 1981-08-22 1983-03-03 Robert Bosch Gmbh, 7000 Stuttgart Verfahren zur erhoehung der zuverlaessigkeit von halbleiterspeichern in kraftfahrzeugen

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5277993A (en) * 1975-12-24 1977-06-30 Toshiba Corp Numeric controller
JPS52112243A (en) * 1976-03-17 1977-09-20 Nippon Signal Co Ltd:The Error detection system for exclusive reading memory
JPS5346235A (en) * 1976-10-08 1978-04-25 Hitachi Ltd Memory check system

Also Published As

Publication number Publication date
JPS5595154A (en) 1980-07-19
ES487298A1 (es) 1980-09-16
JPS6258021B2 (pt) 1987-12-03
FR2445587A1 (fr) 1980-07-25
FR2445587B1 (pt) 1982-09-17
EP0016295A1 (fr) 1980-10-01

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Legal Events

Date Code Title Description
MK Patent expired

Effective date: 19941227