BR0106118A - Detecção elétrica de largura de ranhura em v - Google Patents

Detecção elétrica de largura de ranhura em v

Info

Publication number
BR0106118A
BR0106118A BR0106118-6A BR0106118A BR0106118A BR 0106118 A BR0106118 A BR 0106118A BR 0106118 A BR0106118 A BR 0106118A BR 0106118 A BR0106118 A BR 0106118A
Authority
BR
Brazil
Prior art keywords
slot width
electrical
width detection
detection
verified
Prior art date
Application number
BR0106118-6A
Other languages
English (en)
Inventor
Paul A Hosier
Paul W Browne
Scott L Tewinkle
Original Assignee
Xerox Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Xerox Corp filed Critical Xerox Corp
Publication of BR0106118A publication Critical patent/BR0106118A/pt

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10—Measuring as part of the manufacturing process
    • H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

"DETECçãO ELéTRICA DE LARGURA DE RANHURA EM V". A presente invenção genericamente refere-se a detecção elétrica de largura de ranhura em V durante a fabricação de chips fotossensíveis, que criam sinais elétricos de uma imagem original, como seria verificado, Por exemplo, em um scanner digital ou máquina de fac-símile.
BR0106118-6A 2000-12-14 2001-12-13 Detecção elétrica de largura de ranhura em v BR0106118A (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/736,739 US6342403B1 (en) 2000-12-14 2000-12-14 Electrical detection of V-groove width

Publications (1)

Publication Number Publication Date
BR0106118A true BR0106118A (pt) 2002-08-13

Family

ID=24961106

Family Applications (1)

Application Number Title Priority Date Filing Date
BR0106118-6A BR0106118A (pt) 2000-12-14 2001-12-13 Detecção elétrica de largura de ranhura em v

Country Status (2)

Country Link
US (2) US6342403B1 (pt)
BR (1) BR0106118A (pt)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6342403B1 (en) * 2000-12-14 2002-01-29 Xerox Corporation Electrical detection of V-groove width
US6972444B1 (en) * 2003-08-06 2005-12-06 National Semiconductor Corporation Wafer with saw street guide

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4199774A (en) * 1978-09-18 1980-04-22 The Board Of Trustees Of The Leland Stanford Junior University Monolithic semiconductor switching device
US4735914A (en) * 1979-03-28 1988-04-05 Honeywell Inc. FET for high reverse bias voltage and geometrical design for low on resistance
US4814296A (en) 1987-08-28 1989-03-21 Xerox Corporation Method of fabricating image sensor dies for use in assembling arrays
US5086322A (en) * 1988-10-19 1992-02-04 Mitsubishi Denki Kabushiki Kaisha Input protection circuit and output driver circuit comprising mis semiconductor device
US5036337A (en) * 1990-06-22 1991-07-30 Xerox Corporation Thermal ink jet printhead with droplet volume control
US5219796A (en) 1991-11-04 1993-06-15 Xerox Corporation Method of fabricating image sensor dies and the like for use in assembling arrays
US5521125A (en) 1994-10-28 1996-05-28 Xerox Corporation Precision dicing of silicon chips from a wafer
US5691760A (en) 1995-10-12 1997-11-25 Xerox Corporation Photosensitive silicon chip having photosites spaced at varying pitches
US6237399B1 (en) * 1998-01-16 2001-05-29 Bellave S. Shivaram Cantilever having sensor system for independent measurement of force and torque
US6066883A (en) 1998-03-16 2000-05-23 Xerox Corporation Guarding for a CMOS photosensor chip
US6157019A (en) * 1999-03-31 2000-12-05 Xerox Corporation Edge photosite definition by opaque filter layer
US6396297B1 (en) * 2000-12-14 2002-05-28 Xerox Corporation Electrical detection of V-groove width
US6342403B1 (en) * 2000-12-14 2002-01-29 Xerox Corporation Electrical detection of V-groove width

Also Published As

Publication number Publication date
US6558974B2 (en) 2003-05-06
US6342403B1 (en) 2002-01-29
US20020079918A1 (en) 2002-06-27

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Legal Events

Date Code Title Description
B06A Notification to applicant to reply to the report for non-patentability or inadequacy of the application [chapter 6.1 patent gazette]
B09A Decision: intention to grant [chapter 9.1 patent gazette]
B11D Dismissal acc. art. 38, par 2 of ipl - failure to pay fee after grant in time