BE875722A - METHOD AND DEVICE FOR DETERMINING TECHNOLOGICAL CHARACTERISTICS - Google Patents

METHOD AND DEVICE FOR DETERMINING TECHNOLOGICAL CHARACTERISTICS

Info

Publication number
BE875722A
BE875722A BE0/194724A BE194724A BE875722A BE 875722 A BE875722 A BE 875722A BE 0/194724 A BE0/194724 A BE 0/194724A BE 194724 A BE194724 A BE 194724A BE 875722 A BE875722 A BE 875722A
Authority
BE
Belgium
Prior art keywords
technological characteristics
determining technological
determining
technological
Prior art date
Application number
BE0/194724A
Other languages
French (fr)
Original Assignee
Hoesch Werke Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hoesch Werke Ag filed Critical Hoesch Werke Ag
Publication of BE875722A publication Critical patent/BE875722A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20091—Measuring the energy-dispersion spectrum [EDS] of diffracted radiation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
BE0/194724A 1978-04-22 1979-04-20 METHOD AND DEVICE FOR DETERMINING TECHNOLOGICAL CHARACTERISTICS BE875722A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2817742A DE2817742C2 (en) 1978-04-22 1978-04-22 Method and device for determining technological parameters

Publications (1)

Publication Number Publication Date
BE875722A true BE875722A (en) 1979-10-22

Family

ID=6037775

Family Applications (1)

Application Number Title Priority Date Filing Date
BE0/194724A BE875722A (en) 1978-04-22 1979-04-20 METHOD AND DEVICE FOR DETERMINING TECHNOLOGICAL CHARACTERISTICS

Country Status (8)

Country Link
JP (1) JPS54141695A (en)
AT (1) AT381394B (en)
BE (1) BE875722A (en)
DE (1) DE2817742C2 (en)
FR (1) FR2423774A1 (en)
GB (1) GB2019559B (en)
IT (1) IT1114999B (en)
LU (1) LU81170A1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3825830A1 (en) * 1988-07-29 1990-02-01 Hoesch Stahl Ag METHOD AND DEVICE FOR TEXTURE ANALYSIS
US5381458A (en) * 1993-02-23 1995-01-10 The United States Of America As Represented By The Secretary Of Commerce Method and apparatus for precisely measuring accelerating voltages applied to x-ray sources
FR2833081B1 (en) * 2001-11-30 2004-05-07 Centre Nat Rech Scient METHOD FOR X-RAY VOLUME ANALYSIS OF CRYSTALLOGRAPHIC CHARACTERISTICS OF PARTS
DE102016222644A1 (en) 2016-03-14 2017-09-28 Sms Group Gmbh Process for rolling and / or heat treating a metallic product
DE102017208576A1 (en) 2016-05-25 2017-11-30 Sms Group Gmbh Apparatus and method for determining a microstructure of a metal product and metallurgical plant

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1329695A (en) * 1970-09-09 1973-09-12 Nutter J C Diffractometry
JPS5332789A (en) * 1976-09-08 1978-03-28 Hitachi Ltd Method and apparatus for measuring of stress of white color x-ray

Also Published As

Publication number Publication date
AT381394B (en) 1986-10-10
ATA149679A (en) 1986-02-15
JPS54141695A (en) 1979-11-05
DE2817742C2 (en) 1980-07-24
GB2019559B (en) 1983-01-06
GB2019559A (en) 1979-10-31
DE2817742B1 (en) 1979-10-31
FR2423774A1 (en) 1979-11-16
JPH0237539B2 (en) 1990-08-24
LU81170A1 (en) 1979-11-07
IT1114999B (en) 1986-02-03
IT7948613A0 (en) 1979-04-04
FR2423774B1 (en) 1984-05-04

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Legal Events

Date Code Title Description
RE Patent lapsed

Owner name: HOESCH-WERKE A.G.

Effective date: 19950430