BE762775A - Detecteur de defauts pour produits - Google Patents

Detecteur de defauts pour produits

Info

Publication number
BE762775A
BE762775A BE762775A BE762775A BE762775A BE 762775 A BE762775 A BE 762775A BE 762775 A BE762775 A BE 762775A BE 762775 A BE762775 A BE 762775A BE 762775 A BE762775 A BE 762775A
Authority
BE
Belgium
Prior art keywords
fault detector
product fault
product
detector
fault
Prior art date
Application number
BE762775A
Other languages
English (en)
Inventor
R D Johnson
Original Assignee
Eastman Kodak Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Eastman Kodak Co filed Critical Eastman Kodak Co
Publication of BE762775A publication Critical patent/BE762775A/fr

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Textile Engineering (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
BE762775A 1970-02-11 1971-02-10 Detecteur de defauts pour produits BE762775A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US1036070A 1970-02-11 1970-02-11

Publications (1)

Publication Number Publication Date
BE762775A true BE762775A (fr) 1971-07-16

Family

ID=21745388

Family Applications (1)

Application Number Title Priority Date Filing Date
BE762775A BE762775A (fr) 1970-02-11 1971-02-10 Detecteur de defauts pour produits

Country Status (5)

Country Link
US (1) US3618063A (fr)
BE (1) BE762775A (fr)
DE (1) DE2106345A1 (fr)
FR (1) FR2080446A5 (fr)
GB (1) GB1342914A (fr)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2241263C3 (de) * 1971-08-25 1975-05-07 Hitachi Electronics Co., Ltd. überwachungsvorrichtung zur Erfassung eines Fehlers auf der Oberfläche eines sich bewegenden bandförmigen Gegenstandes
US3917414A (en) * 1973-10-11 1975-11-04 Geisco Associates Optical inspection system
DE2404972A1 (de) * 1974-02-01 1975-08-07 Ciba Geigy Ag Vorrichtung zur ermittlung von fehlstellen auf der oberflaeche eines bewegten reflektierenden materials
JPS5248031B2 (fr) * 1974-05-13 1977-12-07
CA1082811A (fr) * 1976-04-05 1980-07-29 Greenwood Mills, Inc. Analyse d'amplitude dans un diagramme de diffraction pour l'inspection des tissus
US4173441A (en) * 1977-03-28 1979-11-06 E. I. Du Pont De Nemours And Company Web inspection system and method therefor
DE2800351B2 (de) * 1978-01-04 1979-11-15 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Optische Vorrichtung zur Bestimmung des Lichtaustrittswinkels bei einer mit einem Lichtfleck abgetasteten Materialbahn
US4219277A (en) * 1978-08-09 1980-08-26 Westinghouse Electric Corp. Method of detecting flaws on surfaces
JPS5587907A (en) * 1978-12-27 1980-07-03 Fuji Photo Film Co Ltd Device for continuously inspecting surface of object
IE47919B1 (en) * 1979-02-26 1984-07-25 Udaras Na Gaeltachta Apparatus for inspecting translucent articles for faults
US4493554A (en) * 1979-02-27 1985-01-15 Diffracto Method and apparatus for determining physical characteristics of objects and object surfaces
US4348114A (en) * 1979-12-07 1982-09-07 Ciba-Geigy Ag Method of inspecting coated web material to detect the presence of downlines thereon
JPS63182554A (ja) * 1987-01-23 1988-07-27 Fuji Photo Film Co Ltd 表面検査装置
DE3736293A1 (de) * 1987-10-27 1989-05-11 Feldmuehle Ag Verfahren und vorrichtung zum pruefen einer noch feuchten beschichtung auf laufenden bahnen
JPH01239439A (ja) * 1988-03-18 1989-09-25 Fuji Photo Film Co Ltd 表面検査装置
US5196715A (en) * 1991-10-31 1993-03-23 Abb Process Automation Inc. Optical surface inspection of web with streak signal generating means
US5696591A (en) * 1996-01-05 1997-12-09 Eastman Kodak Company Apparatus and method for detecting longitudinally oriented flaws in a moving web
US6170747B1 (en) 1997-08-29 2001-01-09 Jacob P. Meyer Apparatus for inspecting print quality of barcodes on a high speed moving web
US5847834A (en) * 1997-09-11 1998-12-08 Webview, Inc. Expandable, continuous illumination source for a web inspection assembly and method
US5854683A (en) * 1997-10-24 1998-12-29 Keane; Barry P. Optical web defect detection system
US6236429B1 (en) 1998-01-23 2001-05-22 Webview, Inc. Visualization system and method for a web inspection assembly
US6226088B1 (en) * 1999-01-29 2001-05-01 Barry P. Keane Optical web defect detection system

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3467325A (en) * 1966-11-03 1969-09-16 Owens Corning Fiberglass Corp Frequency measuring apparatus

Also Published As

Publication number Publication date
FR2080446A5 (fr) 1971-11-12
US3618063A (en) 1971-11-02
GB1342914A (en) 1974-01-10
DE2106345A1 (de) 1971-08-26

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