BE719998A - - Google Patents
Info
- Publication number
- BE719998A BE719998A BE719998DA BE719998A BE 719998 A BE719998 A BE 719998A BE 719998D A BE719998D A BE 719998DA BE 719998 A BE719998 A BE 719998A
- Authority
- BE
- Belgium
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US505479A US3417243A (en) | 1965-10-28 | 1965-10-28 | Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base |
| GB40962/68A GB1239797A (en) | 1965-10-28 | 1968-08-27 | Method and apparatus for x-ray fluorescence gauging of a higher atomic number selected element in a coating on a base. |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| BE719998A true BE719998A (US07922777-20110412-C00004.png) | 1969-02-27 |
Family
ID=26264550
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| BE719998D BE719998A (US07922777-20110412-C00004.png) | 1965-10-28 | 1968-08-27 |
Country Status (5)
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3525863A (en) * | 1967-12-28 | 1970-08-25 | Minnesota Mining & Mfg | Differential emission x-ray gauging apparatus and method using two monochromatic x-ray beams of balanced intensity |
| JPS5847659B2 (ja) * | 1975-08-12 | 1983-10-24 | 日新製鋼株式会社 | ゴウキンカアエンテツバンノ ゴウキンカドノ ソクテイホウホウ |
| US4085329A (en) * | 1976-05-03 | 1978-04-18 | Hughes Aircraft Company | Hard X-ray and fluorescent X-ray detection of alignment marks for precision mask alignment |
| FI59489C (fi) * | 1978-11-21 | 1981-08-10 | Enso Gutzeit Oy | Foerfarande foer maetning av belaeggningsmaengder |
| DE10034747A1 (de) * | 2000-07-18 | 2002-02-07 | Manfred Liphardt | Verfahren und Vorrichtung zur Feststellung der Dicke eines Beschichtungswerkstoffs auf einem Trägerwerkstoff |
| US7963695B2 (en) | 2002-07-23 | 2011-06-21 | Rapiscan Systems, Inc. | Rotatable boom cargo scanning system |
| CN100593116C (zh) * | 2006-04-10 | 2010-03-03 | 上海爱斯特电子有限公司 | X荧光多元素分析仪 |
| WO2011017475A1 (en) * | 2009-08-04 | 2011-02-10 | Rapiscan Laboratories, Inc. | Method and system for extracting spectroscopic information from images and waveforms |
| US9218933B2 (en) | 2011-06-09 | 2015-12-22 | Rapidscan Systems, Inc. | Low-dose radiographic imaging system |
| US9224573B2 (en) | 2011-06-09 | 2015-12-29 | Rapiscan Systems, Inc. | System and method for X-ray source weight reduction |
| CN108508052B (zh) * | 2018-06-11 | 2023-10-20 | 西北核技术研究所 | 基于参考元素的x射线荧光薄层质量厚度测量系统及方法 |
| WO2020160106A1 (en) * | 2019-01-30 | 2020-08-06 | Ndc Technologies Inc. | Radiation-based thickness gauge |
| EP4157093A4 (en) * | 2020-06-01 | 2024-01-24 | American Science and Engineering, Inc. | SYSTEMS AND METHODS FOR CONTROLLING IMAGE CONTRAST IN AN X-RAY SYSTEM |
| US11193898B1 (en) | 2020-06-01 | 2021-12-07 | American Science And Engineering, Inc. | Systems and methods for controlling image contrast in an X-ray system |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2926257A (en) * | 1955-05-16 | 1960-02-23 | Friedman Herbert | Method of measuring the thickness of thin coatings |
-
1965
- 1965-10-28 US US505479A patent/US3417243A/en not_active Expired - Lifetime
-
1968
- 1968-08-21 AU AU42375/68A patent/AU408547B2/en not_active Expired
- 1968-08-27 BE BE719998D patent/BE719998A/xx unknown
- 1968-08-27 GB GB40962/68A patent/GB1239797A/en not_active Expired
- 1968-08-27 DE DE19681798125 patent/DE1798125A1/de active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| GB1239797A (en) | 1971-07-21 |
| AU4237568A (en) | 1970-02-26 |
| AU408547B2 (en) | 1970-11-27 |
| DE1798125A1 (de) | 1972-01-20 |
| US3417243A (en) | 1968-12-17 |
