BE668106A - - Google Patents

Info

Publication number
BE668106A
BE668106A BE668106DA BE668106A BE 668106 A BE668106 A BE 668106A BE 668106D A BE668106D A BE 668106DA BE 668106 A BE668106 A BE 668106A
Authority
BE
Belgium
Application number
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Publication of BE668106A publication Critical patent/BE668106A/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2204Specimen supports therefor; Sample conveying means therefore
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
BE668106D 1964-09-28 BE668106A (US07655688-20100202-C00086.png)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR989619A FR1435801A (fr) 1964-09-28 1964-09-28 Distributeur automatique de porte-échantillons pour spectromètre à fluorescence chi

Publications (1)

Publication Number Publication Date
BE668106A true BE668106A (US07655688-20100202-C00086.png)

Family

ID=8839254

Family Applications (1)

Application Number Title Priority Date Filing Date
BE668106D BE668106A (US07655688-20100202-C00086.png) 1964-09-28

Country Status (10)

Country Link
US (1) US3415987A (US07655688-20100202-C00086.png)
AT (1) AT261268B (US07655688-20100202-C00086.png)
BE (1) BE668106A (US07655688-20100202-C00086.png)
CH (1) CH445156A (US07655688-20100202-C00086.png)
DE (1) DE1623007C3 (US07655688-20100202-C00086.png)
FR (1) FR1435801A (US07655688-20100202-C00086.png)
GB (1) GB1098040A (US07655688-20100202-C00086.png)
LU (1) LU49317A1 (US07655688-20100202-C00086.png)
NL (1) NL6511452A (US07655688-20100202-C00086.png)
OA (1) OA02029A (US07655688-20100202-C00086.png)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
LU54494A1 (US07655688-20100202-C00086.png) * 1967-09-18 1969-06-24
US3527942A (en) * 1967-11-09 1970-09-08 Atlantic Richfield Co Automatic sample changer for positioning a plurality of pellets in an x-ray analyzer
US3624394A (en) * 1969-05-02 1971-11-30 Atlantic Richfield Co Automatic sample changer for x-ray fluorescence spectrometer
CN106658930B (zh) * 2017-01-23 2018-04-10 中国工程物理研究院激光聚变研究中心 可调x射线源

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3047124A (en) * 1960-05-05 1962-07-31 Mandell S Wexler Examining apparatus
US3263079A (en) * 1962-11-26 1966-07-26 Block Engineering Method for forming an image of an invisible radiation pattern and apparatus for copying the image
US3342992A (en) * 1964-06-30 1967-09-19 Zeiss Jena Veb Carl Sample changing devices for electron microscopes and electron diffraction apparatus

Also Published As

Publication number Publication date
LU49317A1 (US07655688-20100202-C00086.png) 1965-10-12
FR1435801A (fr) 1966-04-22
DE1623007C3 (de) 1975-03-20
NL6511452A (US07655688-20100202-C00086.png) 1966-03-29
US3415987A (en) 1968-12-10
DE1623007B2 (de) 1974-08-08
DE1623007A1 (de) 1972-02-24
OA02029A (fr) 1970-05-05
CH445156A (fr) 1967-10-15
GB1098040A (en) 1968-01-03
AT261268B (de) 1968-04-10

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