BE653103A - - Google Patents
Info
- Publication number
- BE653103A BE653103A BE653103DA BE653103A BE 653103 A BE653103 A BE 653103A BE 653103D A BE653103D A BE 653103DA BE 653103 A BE653103 A BE 653103A
- Authority
- BE
- Belgium
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2204—Specimen supports therefor; Sample conveying means therefore
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US82439A US3027456A (en) | 1961-01-13 | 1961-01-13 | X-ray fluorescent analysis sample presenting means |
Publications (1)
Publication Number | Publication Date |
---|---|
BE653103A true BE653103A (US08066781-20111129-C00013.png) |
Family
ID=22171225
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
BE653103D BE653103A (US08066781-20111129-C00013.png) | 1961-01-13 |
Country Status (2)
Country | Link |
---|---|
US (1) | US3027456A (US08066781-20111129-C00013.png) |
BE (1) | BE653103A (US08066781-20111129-C00013.png) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3148275A (en) * | 1962-02-08 | 1964-09-08 | Philips Corp | Specimen holder for X-ray powder analysis |
DE1267443B (de) * | 1962-11-03 | 1968-05-02 | Basf Ag | Probenwechseleinrichtung fuer Roentgenstrahlen-Analysengeraete, insbesondere fuer reihenmaessig ausgefuehrte Roentgen-Fluoreszenz-Analysen |
US8374673B2 (en) * | 2007-01-25 | 2013-02-12 | Warsaw Orthopedic, Inc. | Integrated surgical navigational and neuromonitoring system having automated surgical assistance and control |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2500926A (en) * | 1947-07-11 | 1950-03-21 | Thomas F Boyd | X-ray spectrometer holder and method |
US2829261A (en) * | 1953-12-31 | 1958-04-01 | Philips Corp | Rotating flat specimen device for the geiger counter x-ray spectrometer |
US2837656A (en) * | 1956-01-31 | 1958-06-03 | Philips Corp | X-ray analysis system and radiation detector for use in such system |
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0
- BE BE653103D patent/BE653103A/xx unknown
-
1961
- 1961-01-13 US US82439A patent/US3027456A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US3027456A (en) | 1962-03-27 |