BE570532A - - Google Patents
Info
- Publication number
- BE570532A BE570532A BE570532DA BE570532A BE 570532 A BE570532 A BE 570532A BE 570532D A BE570532D A BE 570532DA BE 570532 A BE570532 A BE 570532A
- Authority
- BE
- Belgium
- Prior art keywords
- voltage
- piercing
- resistance
- measuring
- transistor
- Prior art date
Links
- 239000000523 sample Substances 0.000 claims description 52
- 239000004065 semiconductor Substances 0.000 claims description 29
- 239000000463 material Substances 0.000 claims description 11
- 238000005259 measurement Methods 0.000 claims description 8
- 235000012431 wafers Nutrition 0.000 description 8
- 238000004519 manufacturing process Methods 0.000 description 7
- 239000011521 glass Substances 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- 230000035939 shock Effects 0.000 description 5
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 4
- 238000004347 surface barrier Methods 0.000 description 4
- 239000000969 carrier Substances 0.000 description 3
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 3
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 2
- 229910052742 iron Inorganic materials 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 230000009897 systematic effect Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 239000002699 waste material Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 239000002178 crystalline material Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000010348 incorporation Methods 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 210000003813 thumb Anatomy 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2608—Circuits therefor for testing bipolar transistors
- G01R31/261—Circuits therefor for testing bipolar transistors for measuring break-down voltage or punch through voltage therefor
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Publications (1)
| Publication Number | Publication Date |
|---|---|
| BE570532A true BE570532A (enrdf_load_stackoverflow) |
Family
ID=189054
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| BE570532D BE570532A (enrdf_load_stackoverflow) |
Country Status (1)
| Country | Link |
|---|---|
| BE (1) | BE570532A (enrdf_load_stackoverflow) |
-
0
- BE BE570532D patent/BE570532A/fr unknown
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| EP2368125B1 (fr) | Dispositif de regulation d'un anemometre à fil | |
| US20080017609A1 (en) | Probe Head Manufacturing Method | |
| EP2158494B1 (fr) | Dispositif pour determiner une repartition de charges dans un element dielectrique | |
| FR2578323A1 (fr) | Capteur integre de grandeurs mecaniques a effet capacitif et procede de fabrication. | |
| BE570532A (enrdf_load_stackoverflow) | ||
| EP0136238B1 (fr) | Dispositif pour mesurer la proximite d'une surface metallique conductrice | |
| FR2471601A1 (fr) | Procede et dispositif de controle non destructif des soudures par points | |
| FR2622020A1 (fr) | Dispositif magnetometrique supraconducteur | |
| EP0454578B1 (fr) | Procédé pour vérifier l'efficacité du blindage électromagnétique d'un cordon conducteur, et dispositif pour la mise en oeuvre du procédé | |
| FR2726691A1 (fr) | Photodetecteur de grande dimension et procede de realisation d'un tel photodetecteur | |
| EP0694786A1 (fr) | Sonde de mesure de résistance surfacique | |
| Munakata | An electron beam method of measuring resistivity distribution in semiconductors | |
| FR2792076A1 (fr) | Dispositif de test d'un reseau d'electrodes et procede associe | |
| EP4238216A1 (fr) | Dispositif de détection du couplage capacitif entre un objet et une surface de détection | |
| WO2024256788A1 (fr) | Procede de mesure de la resistance et de la capacitance de films minces en cours de depot | |
| EP3627103B1 (fr) | Dispositif de mesure comportant un fil semiconducteur suspendu | |
| FR2458806A1 (fr) | Perfectionnements aux procedes et dispositifs de detection d'inhomogeneites dans une feuille de materiau dielectrique | |
| WO2023104735A1 (fr) | Dispositif et procédé de test de mémoire | |
| FR2755224A1 (fr) | Capteur a effet tunnel, notamment pour relever la topographie d'une surface | |
| JPH11352185A (ja) | 電子素子評価装置 | |
| FR2519467A1 (fr) | Procede de fabrication en continu de condensateurs du type empiles, comportant une etape de controle electrique | |
| EP0526287B1 (fr) | Balai de mise au même potentiel électrique d'un rotor et d'un stator d'un enregisteur magnétique | |
| FR3156533A1 (fr) | Procédé d’evaluation d’une propriété électrique. | |
| Yun et al. | Electrochemically grown single-nanowire sensors | |
| FR2940452A1 (fr) | Sonde anemometrique et son procede de realisation |